Inspection apparatus, inspection unit, and detection device

Abstract

Provided is an inspection device that can be made smaller. The inspection device includes a housing having at least three receiving portions inside, and a first power supply terminal, a signal terminal, and a second power supply terminal that are respectively received in the receiving portions with both end portions of an extending direction exposed to the outside of the housing. The first power supply terminal, the signal terminal, and the second power supply terminal are respectively formed of at least one plate-shaped probe that is stretchable and contractible in the extending direction, and the probes are arranged in series in a plate thickness direction with their plate surfaces facing each other. In addition, the signal terminal is arranged between the first power supply terminal and the second power supply terminal in the plate thickness direction of the probes.

Description

[0001] This application is a divisional application of the China Invention Patent Application No. 201910332549.3, filed on April 24, 2019, entitled "Inspection Apparatus, Inspection Unit, and Inspection Device", and the applicant is Omron Corporation. TECHNICAL FIELD

[0002] The present application relates to an inspection apparatus capable of inspecting an inspection target (for example, an electronic component module such as a battery module), an inspection unit provided with the inspection apparatus, and an inspection device provided with the inspection unit. BACKGROUND

[0003] In an electronic component module such as a battery module, conduction inspection and operation characteristic inspection are generally performed in a manufacturing process thereof. These inspections are usually performed by using an inspection apparatus that houses a plurality of probes and connecting an inspection device and the electronic component module.

[0004] As such a probe, there is a pogo pin type probe described in Patent Literature 1. The probe is provided with a plunger portion having a contact terminal and a plunger main body portion coaxially provided with the contact terminal, and a cylinder portion provided on an outer peripheral side of the plunger portion.

[0005] Patent Literature

[0006] Patent Literature 1: Japanese Patent Application Publication No. 2016-142644

[0007] In recent years, miniaturization of electronic component modules is progressing, and inspection apparatuses for performing inspection of electronic component modules are also required to cope with the miniaturization.

[0008] Generally, the lower the rigidity of a pogo pin type probe like the above-described probe, the more likely it is to be damaged as miniaturization progresses. Therefore, in an inspection apparatus using the above-described probe, it can not be possible to cope with the miniaturization. SUMMARY

[0009] An object of the present application is to provide an inspection apparatus, an inspection unit, and an inspection device that can cope with miniaturization.

[0010] An example of the inspection device of the present application includes: a housing having at least three receiving portions inside; a first power supply terminal, a signal terminal, and a second power supply terminal each received in the receiving portions with both end portions in an extending direction exposed to the outside of the housing, the first power supply terminal, the signal terminal, and the second power supply terminal each composed of at least one plate-shaped probe that is stretchable in the extending direction, the probes of the first power supply terminal, the signal terminal, and the second power supply terminal each arranged in series in a plate thickness direction with plate surfaces of the probes facing each other, the signal terminal arranged between the first power supply terminal and the second power supply terminal in the plate thickness direction.

[0011] In addition, an example of the inspection unit of the present application includes at least one of the inspection device.

[0012] In addition, an example of the inspection device of the present application includes at least one of the inspection unit.

[0013] According to the inspection device, the first power supply terminal, the signal terminal, and the second power supply terminal are each composed of at least one plate-shaped probe that is stretchable in the extending direction. Thus, the inspection device can be made smaller.

[0014] According to the inspection unit, the inspection unit that can perform inspection of a smaller electronic component module by the inspection device can be achieved.

[0015] According to the inspection device, the inspection device that can perform inspection of a smaller electronic component module by the inspection unit can be achieved. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 FIG. 1 is a perspective view showing an inspection device according to an embodiment of the present application;

[0017] Figure 2 FIG. 2 is a perspective view showing a state in which a terminal connecting portion of the inspection device of FIG. 1 is detached; Figure 1

[0018] Figure 3 FIG. 4 is a sectional view taken along the line III-III of FIG. 3; Figure 1

[0019] Figure 4 FIG. 5 is a sectional view taken along the line IV-IV of FIG. 3; Figure 1

[0020] Figure 5 ​​​is Figure 1 An enlarged plan view of a terminal connection portion of the inspection tool of

[0021] Figure 6 is a plan view of a terminal connection portion of the inspection tool of Figure 1

[0022] Figure 7 is a plan view of a terminal connection portion of the inspection tool of Figure 1

[0023] BRIEF DESCRIPTION OF DRAWINGS

[0024] 1 inspection tool

[0025] 10 housing

[0026] 11 base housing

[0027] 111 connection surface

[0028] 12 core housing

[0029] 13 recess

[0030] 14 opening portion

[0031] 15 receiving groove

[0032] 16 receiving space

[0033] 17 receiving portion

[0034] 21 first power terminal

[0035] 211 probe laminated body

[0036] 22 signal terminal

[0037] 23 second power terminal

[0038] 231 probe laminated body

[0039] 30 probe

[0040] 31 first contact portion

[0041] 32 second contact portion

[0042] 33 elastic portion

[0043] 34 first contact portion

[0044] 35 second contact portion

[0045] 36, 37 support portion

[0046] 40 terminal connection portion

[0047] 41 connection plate portion​​

[0048] 411 Outer surface

[0049] 42 Connecting wall portion

[0050] 43 Connecting holes

[0051] 431 concavity

[0052] 432 Through Hole

[0053] 44 First Storage Area

[0054] 45 Second storage area

[0055] 46 Positioning recess

[0056] 47 Flange portion

[0057] 48 Insulating wall

[0058] 50 helical spring

[0059] 100 connector

[0060] X, Y, Z directions

[0061] P1 Initial position

[0062] P2 Connection Location Detailed Implementation

[0063] Hereinafter, an example of the present invention will be described with reference to the accompanying drawings. Furthermore, in the following description, terms indicating specific directions or positions (e.g., terms including "up," "down," "right," and "left") are used as needed; however, these terms are used to facilitate understanding of the invention with reference to the accompanying drawings and are not intended to limit the technical scope of the invention. Moreover, the following description is merely exemplary in nature and is not intended to limit the invention, its applicability, or its uses. Additionally, the accompanying drawings are schematic, and the ratios of the dimensions, etc., may not necessarily correspond to actual dimensions.

[0064] like Figure 1 As shown, an inspection device 1 according to one embodiment of the present invention includes: an insulating housing 10, a conductive first power terminal 21, a signal terminal 22, and a second power terminal 23 housed inside the housing 10. Additionally, Figure 1 Only the first power terminal 21 and the signal terminal 22 are shown.

[0065] like Figure 2 and Figure 3As shown, the housing 10 has at least three receiving portions 17 in its interior. In each of the receiving portions 17, a first power terminal 21, a signal terminal 22, and a second power terminal 23 are respectively housed. The first power terminal 21, the signal terminal 22, and the second power terminal 23 are each constituted by at least one plate-like probe 30.

[0066] In detail, as shown Figure 2 The housing 10 has a substantially rectangular parallelepiped-shaped base housing 11 and a core housing 12 housed in the interior of the base housing 11.

[0067] As shown Figure 2 The base housing 11 has a substantially rectangular connecting surface 111 constituting one of its outer surfaces, and as shown Figure 3 In the substantially central portion of the length direction of the connecting surface 111, a recessed portion 13 having a substantially rectangular opening portion 14 is provided. As shown Figure 2 The recessed portion 13 is arranged so that the long side direction of the opening portion 14 is substantially parallel to the short side direction of the base housing 11, and the substantially rectangular parallelepiped-shaped core housing 12 is housed in the interior thereof.

[0068] In the following description, the short side direction of the connecting surface 111 is set as the X direction, the long side direction of the connecting surface 111 is set as the Y direction, and the direction intersecting the connecting surface 111 is set as the Z direction.

[0069] As shown Figure 3 The core housing 12 has at least three receiving portions 17 capable of housing the probes 30 in its interior. Specifically, in the interior of the core housing 12, two rows of columns of five receiving portions 17 arranged in series in the length direction of the opening portion 14 (i.e., the X direction) and extending in the orthogonal direction of the connecting surface 111 (i.e., the Z direction) in an electrically independent state from each other are arranged at intervals in the short side direction of the opening portion 14 (i.e., the Y direction). That is, in this embodiment, the core housing 12 has ten receiving portions 17.

[0070] In the receiving portions 17 at both ends of each of the columns of receiving portions 17, the first power terminals 21 and the second power terminals 23 are respectively housed, and in the receiving portions 17 in the middle of each of the columns of receiving portions 17, the signal terminals 22 are housed. In each of the columns of receiving portions 17, the probes 30 constituting the first power terminals 21, the signal terminals 22, and the second power terminals 23 are arranged in series in the plate thickness direction with the plate surfaces facing each other in a state in which both end portions in the extending direction are exposed to the exterior of the housing. That is, the first power terminals 21, the signal terminals 22, and the second power terminals 23 are each housed in the receiving portions 17 in a state in which both end portions in the extending direction are exposed to the exterior of the housing.

[0071] The first power supply terminal 21 and the second power supply terminal 23 are each composed of a plurality of probes 30. In detail, as shown in Figure 3 , the first power supply terminal 21 and the second power supply terminal 23 are each composed of a probe stack 211, 231 stacked in the plate thickness direction in a state in which five probes 30 are in contact with each other. In addition, the signal terminal 22 is composed of a plurality of probes 30 arranged independently of each other at intervals in the plate thickness direction. In detail, as shown in Figure 3 , the signal terminal 22 is composed of three probes 30 each of which is accommodated in one of three receiving portions 17 in the middle of the row of receiving portions 17.

[0072] In addition, in this embodiment, the probes 30 that compose each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 have the same shape.

[0073] In addition, as shown in Figure 1 , the housing 10 has a terminal connection portion 40 of insulating property that can be connected to a connector 100 (shown in Figure 5 ) of an inspection object or an inspection device. The terminal connection portion 40 is supported in a state in which it can swing with respect to the housing 10 in the direction of extension of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 (i.e., the Z direction, hereinafter referred to as the terminal extension direction) on a connection surface 111 that intersects (e.g., is orthogonal to) the terminal extension direction.

[0074] In detail, as shown in Figure 4 , the terminal connection portion 40 has a connection plate portion 41 of substantially rectangular plate shape arranged in opposition to the connection surface 111, and a pair of connection wall portions 42 extending from opposite edge portions of the connection plate portion 41 in a direction that intersects (e.g., is orthogonal to) the connection plate portion 41.

[0075] As shown in Figure 5 and Figure 6 , the connection plate portion 41 has a connection hole 43 that penetrates in the terminal extension direction and can simultaneously accommodate the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23. The connection hole 43 has a first receiving region 44 and a second receiving region 45.

[0076] Viewed in the terminal extension direction, the first receiving region 44 is disposed substantially in the center in a direction (i.e., the Y direction) that intersects the arrangement direction (i.e., the X direction. Hereinafter referred to as the terminal arrangement direction) of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 of the connection hole 43, and is provided with the first contact portions 31 of the respective probes 30 described later. The first receiving region 44 is configured to be able to accommodate the connector 100 (shown in Figure 5 ) of the inspection object or the inspection device that can simultaneously contact the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23.

[0077] The second housing region 45 is arranged in at least one of the directions (both the Y directions in this embodiment) intersecting the terminal arrangement direction with respect to the first housing region 44, as viewed in the terminal extension direction. The second housing region 45 is configured to be able to house a part of the first power terminal 21, the signal terminal 22, and the second power terminal 23.

[0078] In addition, as shown in Figure 3 and Figure 4 The connection hole 43 is composed of a recessed portion 431 opening on the outer surface 411 side of the connection plate portion 41 described later, and a plurality of through holes 432 opening on the bottom surface of the recessed portion 431. As shown in Figure 6 each of the through holes 432 corresponds to the housing portion 17 of each of the core housings 12 in the terminal extension direction. That is, in this embodiment, 10 through holes 432 are formed on the bottom surface of the recessed portion 431.

[0079] In addition, the connection hole 43 has two insulating walls 48 in the second housing region 45 that separate the first power terminal 21, the signal terminal 22, and the second power terminal 23 from each other. Each of the insulating walls 48 is provided between the first power terminal 21 and the signal terminal 22, and between the signal terminal 22 and the second power terminal 23 of the second housing region 45, and extends in a direction intersecting the terminal arrangement direction, as viewed in the terminal extension direction.

[0080] In addition, the connection plate portion 41 has a positioning recessed portion 46 provided on the outer surface 411 on the opposite side of the surface opposite the connection surface 111 in the terminal extension direction and around the connection hole 43. The positioning recessed portion 46 is configured to house a part of the inspection object or the inspection device when connecting the connector 100 of the inspection object or the inspection device to the first power terminal 21, the signal terminal 22, and the second power terminal 23, in a manner to determine the position of the connector 100 of the inspection object or the inspection device with respect to the terminal connection portion 40.

[0081] As shown in Figure 4As shown, the front end portion of each connection wall portion 42 on the side away from the connection plate portion 41 in the extending direction is housed in a housing groove 15 provided around the recess 13 of the connection surface 111. A flange portion 47 extending in a direction away from each connection wall portion 42 is provided at the front end portion of each connection wall portion 42. Each flange portion 47 is housed in a housing space 16 connected to the housing groove 15 and provided inside the base housing 11, together with a coil spring 50 that applies a force to each flange portion 47 in the direction of the connection surface 111. Through the housing space 16, movement of each flange portion 47 is limited only between an initial position PI and a connection position P2 in the direction (i.e., the Z direction) intersecting the connection surface 111. The initial position PI is the position of the terminal connection portion 40 in a state in which the connector 100 of the inspection object or the inspection device is not connected, and the connection position P2 is the position of the terminal connection portion 40 in a state in which the connector 100 of the inspection object or the inspection device is connected.

[0082] As shown in Figs. 1 and 2, the terminal connection portion 40 is provided with a connection plate portion 41 and a plurality of connection wall portions 42 extending in the direction intersecting the connection surface 111 from the connection plate portion 41. The connection plate portion 41 is provided with a plurality of connection holes 43, each of which is a through-hole extending in the direction intersecting the connection surface 111. The connection wall portions 42 are provided with a plurality of connection holes 44, each of which is a through-hole extending in the direction intersecting the connection surface 111. Figure 3 Figure 4 As shown in Figs. 1 and 2, the terminal connection portion 40 is provided with a connection plate portion 41 and a plurality of connection wall portions 42 extending in the direction intersecting the connection surface 111 from the connection plate portion 41. The connection plate portion 41 is provided with a plurality of connection holes 43, each of which is a through-hole extending in the direction intersecting the connection surface 111. The connection wall portions 42 are provided with a plurality of connection holes 44, each of which is a through-hole extending in the direction intersecting the connection surface 111.

[0083] As shown in Figs. 1 and 2, the terminal connection portion 40 is provided with a connection plate portion 41 and a plurality of connection wall portions 42 extending in the direction intersecting the connection surface 111 from the connection plate portion 41. The connection plate portion 41 is provided with a plurality of connection holes 43, each of which is a through-hole extending in the direction intersecting the connection surface 111. The connection wall portions 42 are provided with a plurality of connection holes 44, each of which is a through-hole extending in the direction intersecting the connection surface 111. Figure 7 Figure 7 As shown in Figs. 1 and 2, the terminal connection portion 40 is provided with a connection plate portion 41 and a plurality of connection wall portions 42 extending in the direction intersecting the connection surface 111 from the connection plate portion 41. The connection plate portion 41 is provided with a plurality of connection holes 43, each of which is a through-hole extending in the direction intersecting the connection surface 111. The connection wall portions 42 are provided with a plurality of connection holes 44, each of which is a through-hole extending in the direction intersecting the connection surface 111.

[0084] As shown in Figs. 1 and 2, the terminal connection portion 40 is provided with a connection plate portion 41 and a plurality of connection wall portions 42 extending in the direction intersecting the connection surface 111 from the connection plate portion 41. The connection plate portion 41 is provided with a plurality of connection holes 43, each of which is a through-hole extending in the direction intersecting the connection surface 111. The connection wall portions 42 are provided with a plurality of connection holes 44, each of which is a through-hole extending in the direction intersecting the connection surface 111.

[0085] ​​A support portion 36 is provided on the elastic portion 33 side of the middle portion in the extending direction of the first contact portion 34, and contacts the core case 12 to support the probe 30 when the probe 30 is housed in the housing portion 17. In addition, a support portion 37 is provided on the elastic portion 33 side of the middle portion in the extending direction of the second contact portion 35, and contacts the base case 11 to support the probe 30 when the probe 30 is housed in the housing portion 17.

[0086] In addition, each probe 30 is formed by an electroforming method, and the elastic portion 33, the first contact portion 34, and the second contact portion 35 are integrally formed, for example.

[0087] In the above-described inspection tool 1, the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are housed in the at least three housing portions 17 in a state in which the both end portions in the extending direction are exposed to the outside of the case 10, and each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 is composed of at least one plate-shaped probe 30. That is, each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 is composed of the plate-shaped probe 30 in which the rigidity does not easily decrease even if the size is reduced, and thus, an inspection tool 1 that can cope with size reduction can be realized.

[0088] In addition, the probes 30 that constitute each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 have the same shape. According to such a structure, for example, by composing the first power supply terminal 21 or the second power supply terminal 23 with a plurality of probes, the first power supply terminal 21 or the second power supply terminal 23 that has a uniform cross-sectional shape as a whole can be easily obtained.

[0089] In addition, the first power supply terminal 21 and the second power supply terminal 23 are each composed of a probe stack 211, 231 in which a plurality of probes 30 are stacked in the plate thickness direction in a state in which the probes 30 contact each other, and the signal terminal 22 is composed of a plurality of probes 30 that are independently arranged at intervals in the plate thickness direction. With such a structure, each terminal 21, 22, 23 in which the magnitude of the current that flows is different can be easily formed using a plurality of probes 30.

[0090] Further, the terminal connecting portion 40 is supported on the housing 10 in a state of being swingable in the terminal extension direction on the connecting surface 111 of the housing 10 intersecting the terminal extension direction and connectable to the inspection object or the inspection device, and has a connecting hole 43 through which the first power terminal 21, the signal terminal 22, and the second power terminal 23 are simultaneously receivable in the terminal extension direction. With this terminal connecting portion 40, for example, in a case where only the inspection tool 1 is connected to the inspection object or the inspection device, one end portion of each terminal 21, 22, 23 in the terminal extension direction can be exposed to the outside of the inspection tool 1, and thus, the occurrence of damage to each terminal 21, 22, 23 can be reduced.

[0091] Further, the terminal connecting portion 40 has a positioning recess 46 provided on the outer surface 411 on the opposite side from the connecting surface 111 in the terminal extension direction and around the connecting hole 43, and positions the inspection object or the inspection device with respect to the terminal connecting portion 40. With this positioning recess 46, the inspection tool 1 can be more accurately connected to the inspection object or the inspection device.

[0092] Further, the connecting hole 43 has a first receiving region 44 in which the connector 100 of the inspection object or the inspection device is receivable, and a second receiving region 45 which, viewed in the terminal extension direction, is disposed in at least one of directions intersecting the terminal arrangement direction with respect to the first receiving region 44 and in which a portion of the first power terminal 21, the signal terminal 22, and the second power terminal 23 is disposable. According to such a structure, each probe 30 constituting each terminal 21, 22, 23 can be disposed across the first receiving region 44 to the second receiving region 45. As a result, for example, in a case where one end portion in the width direction of each probe 30 (i.e., a direction intersecting the terminal extension direction and the terminal arrangement direction) is provided with the first contact portion 31, the first contact portion 31 of each probe 30 is disposed in the first receiving region 44, and thus, the miniaturization of the connector 100 of the inspection object or the inspection device can be dealt with while the size of each terminal 21, 22, 23 can be sufficiently ensured.

[0093] Further, the connecting hole 43 is provided between the first power terminal 21 and the signal terminal 22 and between the signal terminal 22 and the second power terminal 23 of the second receiving region 45, respectively, and has two insulating walls 48 extending in directions intersecting the terminal arrangement direction, respectively, viewed in the terminal extension direction. With this insulating wall 48, the insulation between each terminal 21, 22, 23 can be more reliably ensured.

[0094] The above-described inspection tool 1 can be used for an inspection unit. With the above-described inspection tool 1, an inspection unit which can perform inspection of a smaller electronic component module can be realized.

[0095] In addition, the above-described inspection unit can be used for an inspection device. With the inspection unit, an inspection device that can perform inspection of a smaller electronic component module can be realized.

[0096] In addition, each probe 30 can be appropriately changed in shape and the like according to the design and the like of the inspection tool 1. For example, the shape of each probe 30 that constitutes each terminal 21, 22, 23 can be changed, and one probe 30 can constitute one of the first power terminal 21 and the second power terminal 23, and the other can be constituted by the probe stack 211, 231.

[0097] In addition, the shape and position and the like of each of the first contact portion 31 and the second contact portion 32 can be appropriately changed according to various modes of the inspection device or the inspection object.

[0098] The base housing 11 and the core housing 12 can be appropriately changed in structure according to various modes of the inspection device or the inspection object. That is, the base housing 11 and the core housing 12 can be made common, and the productivity of the inspection tool 1 (and further, the inspection unit and the inspection device) can be improved.

[0099] The terminal connection portion 40 can be omitted according to the design and the like of the inspection tool 1. That is, the inspection tool 1 can have only the housing 10 having at least three accommodation portions 17 inside, the first power terminal 21, the signal terminal 22, and the second power terminal 23 each accommodated in each accommodation portion 17.

[0100] Each of the positioning recess 46 and the insulating wall 48 can be omitted according to the design and the like of the inspection tool 1.

[0101] The connection hole 43 can have only the first accommodation region 44 that can accommodate the connector 100 of the inspection object or the inspection device, and the second accommodation region 45 can be omitted.

[0102] The various modes of the present application are described in detail above with reference to the drawings, and finally, the various modes of the present application are described. In addition, in the following description, reference signs are additionally described by way of example with reference to the drawings.

[0103] The inspection device 1 of the first aspect of the present application includes a housing 10 having at least three receiving portions 17, and a first power terminal 21, a signal terminal 22, and a second power terminal 23 received in the receiving portions 17, respectively, the first power terminal 21, the signal terminal 22, and the second power terminal 23 each being composed of at least one plate-shaped probe 30 that is stretchable and contractible in an extension direction, the probes 30 that compose the first power terminal 21, the signal terminal 22, and the second power terminal 23 being arranged in series in a plate thickness direction with their plate surfaces facing each other, and the signal terminal 22 being arranged between the first power terminal 21 and the second power terminal 23 in the plate thickness direction.

[0104] According to the inspection device 1 of the first aspect, the first power terminal 21, the signal terminal 22, and the second power terminal 23 are each composed of a plate-shaped probe 30 that does not easily decrease in rigidity even if it is miniaturized, and thus a miniaturized inspection device 1 can be realized.

[0105] According to the inspection device 1 of the second aspect, the probes 30 that compose the first power terminal 21, the signal terminal 22, and the second power terminal 23 have the same shape.

[0106] According to the inspection device 1 of the second aspect, for example, by composing the first power terminal 21 or the second power terminal 23 with a plurality of probes, a first power terminal 21 or a second power terminal 23 having a uniform cross-sectional shape as a whole can be easily obtained.

[0107] According to the inspection device 1 of the third aspect, the first power terminal 21 and the second power terminal 23 are each composed of a probe stack 211, 231 in which a plurality of probes 30 are stacked in the plate thickness direction in a state in which the probes 30 contact each other, and the signal terminal 22 is composed of a plurality of probes 30 that are arranged independently of each other in the plate thickness direction with a space therebetween.

[0108] According to the inspection device 1 of the third aspect, a plurality of probes 30 can be used to easily form each terminal 21, 22, 23 through which a current of different magnitude flows.

[0109] According to the inspection device 1 of the fourth aspect, a terminal connection portion 40 is provided on a connection surface 111 of the housing 10 that intersects the extension direction, the terminal connection portion 40 being supported on the housing 10 in a state in which it is swingable in the extension direction and being connectable to an object to be inspected or an inspection device, and the terminal connection portion 40 has a connection hole 43 that penetrates in the extension direction and can simultaneously receive the first power terminal 21, the signal terminal 22, and the second power terminal 23.

[0110] According to the inspection tool 1 of the fourth aspect, only in the case where the inspection tool 1 is connected to the inspection object or the inspection device through the terminal connection portion 40, for example, since one end portion of the extension direction of each terminal 21, 22, 23 is exposed to the outside of the inspection tool 1, the occurrence of damage to each terminal 21, 22, 23 can be reduced.

[0111] The inspection tool 1 of the fifth aspect of the present application, the terminal connection portion 40 is provided on the outer surface 411 of the side opposite to the side of the connection surface 111 in the extension direction and around the connection hole 43, and has a positioning recess 46 for positioning the position of the inspection object or the inspection device with respect to the terminal connection portion 40.

[0112] According to the inspection tool 1 of the fifth aspect, by the positioning recess 46, the inspection tool 1 can be connected to the inspection object or the inspection device more accurately.

[0113] The inspection tool 1 of the sixth aspect of the present application, the connection hole 43 has a first receiving region 44 capable of receiving the connector 100 of the inspection object or the inspection device capable of simultaneously contacting the first power terminal 21, the signal terminal 22, and the second power terminal 23, and a second receiving region 45 disposed in at least one of the directions intersecting the arrangement direction of the first power terminal 21, the signal terminal 22, and the second power terminal 23 with respect to the first receiving region 44 in the extension direction, and capable of disposing a part of the first power terminal 21, the signal terminal 22, and the second power terminal 23.

[0114] According to the inspection tool 1 of the sixth aspect, each probe 30 constituting each terminal 21, 22, 23 can be disposed across the first receiving region 44 to the second receiving region 45. As a result, for example, in the case where the contact portion 31 is provided at one end portion in the width direction of each probe 30 (i.e., the direction intersecting the extension direction and the arrangement direction of the first power terminal 21, the signal terminal 22, and the second power terminal 23), the contact portion 31 of each probe 30 can be disposed in the first receiving region 44 to cope with the miniaturization of the connector 100 of the inspection object or the inspection device, while the size of each terminal 21, 22, 23 can be sufficiently ensured.

[0115] The inspection device 1 according to the seventh aspect of the present application, the connection hole 43 has two insulating walls 48, which are respectively provided between the first power terminal 21 and the signal terminal 22, and between the signal terminal 22 and the second power terminal 23 of the second housing region 45, and which respectively extend in a direction intersecting the arrangement direction as viewed from the extension direction.

[0116] According to the inspection device 1 according to the seventh aspect of the present application, the insulating walls 48 make it possible to more reliably ensure the insulation between the terminals 21, 22, 23.

[0117] The inspection unit according to the eighth aspect of the present application is provided with at least one inspection device 1 according to any of the above aspects.

[0118] According to the inspection unit according to the eighth aspect of the present application, it is possible to realize an inspection unit that makes it possible to perform inspection of a smaller electronic component module by the above inspection device 1.

[0119] The inspection device according to the ninth aspect of the present application is provided with at least one inspection unit according to any of the above aspects.

[0120] According to the inspection device according to the ninth aspect of the present application, it is possible to realize an inspection device that makes it possible to perform inspection of a smaller electronic component module by the above inspection unit.

[0121] In addition, by appropriately combining any of the above various embodiments or modifications, it is possible to realize the effects possessed by each. In addition, combinations of embodiments with each other, combinations of embodiments with each other, or combinations of embodiments and modifications are possible, and combinations of features in different embodiments or modifications with each other are possible.

[0122] Industrial applicability

[0123] The inspection device according to the present application can be applied to, for example, an inspection unit of a battery module as an inspection target.

[0124] The inspection unit according to the present application can be applied to, for example, an inspection device of a battery module as an inspection target.

[0125] The inspection device according to the present application can be used for inspection of, for example, a battery module as an inspection target.

Claims

1. An inspection instrument, characterized in that, have: case; The first power terminal, the signal terminal, and the second power terminal are respectively housed inside the housing with their two ends protruding outside the housing in the extending direction. The first power terminal, the signal terminal, and the second power terminal are each composed of at least one plate-shaped probe that is retractable in the extending direction. The probes constituting the first power terminal, the signal terminal, and the second power terminal are arranged sequentially along the thickness direction intersecting the extension direction with their plate surfaces facing each other. The probe constituting the first power terminal is located on the outermost side in the board thickness direction, the probe constituting the second power terminal is located on the other outermost side in the board thickness direction, and the probe constituting the signal terminal is located between the first power terminal and the second power terminal. A group having at least one first power terminal, at least one signal terminal, and one second power terminal arranged sequentially along the thickness direction of the plate.

2. The inspection apparatus as described in claim 1, characterized in that, The first power terminal and the second power terminal have dimensions that are larger than those of the signal terminal in the thickness direction of the plate.

3. The inspection apparatus as described in claim 1 or 2, characterized in that, The probes constituting the first power terminal, the signal terminal, and the second power terminal each have the same shape.

4. The inspection apparatus as described in claim 1 or 2, characterized in that, The first power terminal and the second power terminal are each composed of a probe stack in the thickness direction of the plate, wherein a plurality of the probes are in contact with each other. The signal terminal is composed of a plurality of probes that are spaced apart and arranged independently of each other in the thickness direction of the plate.

5. The inspection apparatus as described in claim 1 or 2, characterized in that, The housing has a terminal connection portion on its connecting surface intersecting the extending direction. This terminal connection portion is supported on the housing in a swingable state along the extending direction and can be connected to an object to be inspected or an inspection device. The terminal connection portion has a connection hole that extends along the extension direction and can simultaneously accommodate the first power terminal, the signal terminal, and the second power terminal.

6. The inspection apparatus as described in claim 5, characterized in that, The terminal connection portion is disposed on the outer surface opposite to the surface opposite to the connection surface in the extending direction and around the connection hole, and has a positioning recess for positioning the inspection object or the inspection device relative to the terminal connection portion.

7. The inspection apparatus as described in claim 5, characterized in that, The connecting hole has: The first storage area can store the inspection object or the connector of the inspection device that can simultaneously contact the first power terminal, the signal terminal and the second power terminal. The second storage area, viewed from the extending direction, is disposed in at least one of the directions intersecting the arrangement directions of the first power terminal, the signal terminal, and the second power terminal relative to the first storage area, and may contain a portion of the first power terminal, the signal terminal, and the second power terminal.

8. The inspection apparatus as described in claim 7, characterized in that, The connection hole has two insulating walls, which are respectively disposed between the first power terminal and the signal terminal in the second storage area, and between the signal terminal and the second power terminal. When viewed from the extension direction, the two insulating walls extend in a direction that intersects the arrangement direction.

9. An inspection instrument, characterized in that, have: case; The first power terminal, the signal terminal, and the second power terminal are respectively housed inside the housing with their two ends protruding outside the housing in the extending direction. The first power terminal, the signal terminal, and the second power terminal are each composed of at least one plate-shaped probe that is retractable in the extending direction. The probes constituting the first power terminal, the signal terminal, and the second power terminal are arranged in series in the thickness direction intersecting the extension direction, with their plate surfaces facing each other. The probe constituting the first power terminal is located on the outermost side in the board thickness direction, the probe constituting the second power terminal is located on the other outermost side in the board thickness direction, and the probe constituting the signal terminal is located between the first power terminal and the second power terminal. The housing has a terminal connection portion on its connecting surface intersecting the extending direction. This terminal connection portion is supported on the housing in a swingable state along the extending direction and can be connected to an object to be inspected or an inspection device. The terminal connection portion has a connection hole that extends along the extending direction and can simultaneously accommodate the first power terminal, the signal terminal, and the second power terminal. The connecting hole has: The first storage area can store the inspection object or the connector of the inspection device that can simultaneously contact the first power terminal, the signal terminal and the second power terminal. The second storage area, viewed from the extending direction, is disposed in at least one of the directions intersecting the arrangement directions of the first power terminal, the signal terminal, and the second power terminal relative to the first storage area, and may contain a portion of the first power terminal, the signal terminal, and the second power terminal.

10. The inspection apparatus as described in claim 9, characterized in that, The connection hole has two insulating walls, which are respectively disposed between the first power terminal and the signal terminal in the second storage area, and between the signal terminal and the second power terminal. When viewed from the extension direction, the two insulating walls extend in a direction that intersects the arrangement direction.

11. An inspection unit, characterized in that, It has at least one inspection device according to any one of claims 1 to 10.

12. An inspection device, characterized in that, It has at least one inspection unit as described in claim 11.

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