Port disturbance voltage feature extraction method, device and storage medium

Abstract

The present invention discloses a method, device and storage medium for extracting characteristics of port disturbance voltage. The method comprises: obtaining a measurement waveform of the full-time-domain port disturbance voltage; decomposing the measurement waveform into a series of micro-pulse sequences; extracting characteristics of each micro-pulse sequence in the series of micro-pulse sequences to obtain at least one characteristic parameter, wherein the characteristic parameters include micro-pulse duration and micro-pulse oscillation period; generating port disturbance voltage evaluation information according to the characteristic parameters, and analyzing the port disturbance voltage. The present invention can greatly reduce the amount of data, fully mine the information included in the test data, and more comprehensively reflect the test results of the tested product by dividing the port disturbance voltage measurement waveform into a series of micro-pulse sequences and then extracting characteristics of each micro-pulse sequence.

Description

Technical Field

[0001] The present invention relates to the technical field of testing and analysis, and in particular to a method, a device and a storage medium for extracting characteristics of a port disturbance voltage. Background Art

[0002] With the development of intelligent sensing technology, a large number of primary and secondary fusion sensing devices with intelligent perception, judgment and execution functions are applied to substations. However, this strong connection structure of primary and secondary fusion has exposed serious electromagnetic compatibility problems in the secondary intelligent unit under switch operation. Taking the application of electronic transformer engineering as an example, a large number of electronic transformers that have passed type tests according to traditional electromagnetic compatibility standards still frequently fail under the operation of disconnectors, resulting in their inability to operate normally in substations.

[0003] Taking the operation of GIS disconnector as an example, in order to analyze the impact of transient disturbance generated by switch operation on the intelligent unit of electronic transformer, it is necessary to measure the transient disturbance of the port of relevant intelligent unit during the switch operation. After the test, it is necessary to perform statistical analysis on the obtained test data to obtain the transient disturbance characteristic distribution of the port of the intelligent unit of the electronic transformer, so as to provide a basis for the port protection and test assessment of the electronic transformer under strong transient electromagnetic disturbance.

[0004] However, the existing technology for processing and analyzing the test data obtained from the above tests is limited to conventional statistical processing methods, and it is difficult to deeply mine the rich information in the test data. Summary of the invention

[0005] Based on this, it is necessary to provide a method, device and storage medium for extracting port disturbance voltage characteristics in order to solve the above problems.

[0006] The embodiment of the present invention is implemented as follows: a port disturbance voltage analysis method, the method comprising:

[0007] Obtain the measurement waveform of the full-time-domain port disturbance voltage;

[0008] Decomposing the measurement waveform into a series of micro-pulse sequences;

[0009] Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period;

[0010] Port disturbance voltage evaluation information is generated according to the characteristic parameters, and the port disturbance voltage is analyzed.

[0011] Optionally, the measurement waveform is decomposed into a series of micro-pulse sequences, including:

[0012] The measured waveform is decomposed into a series of micro-pulse sequences by using local maximum and global maximum rules.

[0013] Optionally, decomposing the measured waveform into a series of micro-pulse sequences further comprises:

[0014] Dividing the measured waveform into a plurality of local sequences of equal length;

[0015] Searching for the maximum absolute value of the disturbance voltage and its corresponding time sequence in each local sequence, and recording the maximum value and its corresponding time sequence into the group column M1;

[0016] Searching for a maximum disturbance voltage in the group M1, if the maximum disturbance voltage found is greater than a preset threshold TH1, determining an interval with the maximum disturbance voltage found as an upper limit;

[0017] The disturbance voltage falling within the interval and its corresponding time sequence are saved as a new sequence to obtain a series of micro-pulse sequences.

[0018] Optionally, the method further comprises:

[0019] A number of local maximum values ​​before and after the maximum value of the disturbance voltage in the group M1 are set to 0, and micro pulses are extracted again until the maximum value of the disturbance voltage in M1 is not greater than the threshold TH1.

[0020] Optionally, performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises:

[0021] Reading a single micropulse train;

[0022] Performing a global search on the second column of data of the single micro-pulse sequence to extract a maximum value DATAmax of the global absolute value of the second column of data of the single micro-pulse sequence;

[0023] Determine the slope change rate determination threshold TH2 and the waveform change rate determination threshold TH3 according to the maximum value DATAmax of the global absolute value;

[0024] Calculate the change rate of each row in the second column of data of the single micropulse sequence according to the slope change rate determination threshold TH2;

[0025] The absolute time corresponding to the first slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T start The absolute time corresponding to the last slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T end ,

[0026] By T end With T start The difference in θ determines the micropulse duration.

[0027] Optionally, performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises:

[0028] Multiply every two adjacent disturbance voltages in the second column of data of the single micropulse sequence, and when the product value is not greater than 0, record the time point corresponding to the product, and record the time point in the group column M2;

[0029] According to the group M2, a local extreme value of the zero point interval is determined in the single micropulse sequence, and the absolute time corresponding to the value where the absolute value of the local extreme value is greater than the waveform change rate determination threshold TH3 and the corresponding value in the single micropulse sequence are recorded to obtain the group M3;

[0030] The original value at the time corresponding to the maximum absolute value of the second column in the group M3 is recorded as Pk1. In the group M3, search rightward in time order, and the first value with a different sign from Pk1 is recorded as Pk2, and the first value with a different sign from Pk2 is recorded as Pk3. Determine Pk n Value, record Pk n Value and Pk n The corresponding value is recorded in the group M4, and the micropulse attenuation coefficient can be calculated as Pk5 / Pk1, Pk 10 / Pk1;

[0031] Pk1, Pk2, and Pk4 correspond to time point T PK1 , T PK2 , T PK3 As coordinates, find the first zero point on the left side in the ancestor column M2, denoted as T PK01 , T PK02 , T PK03 , then the micropulse rise time is approximately equal to T PK1 With T PK01 0.8 times the difference, determine T PK02 The difference is the micropulse oscillation period.

[0032] Optionally, generating port disturbance voltage evaluation information according to the characteristic parameters includes:

[0033] Obtaining weights corresponding to the feature parameters;

[0034] The port disturbance voltage evaluation value is determined and outputted according to the value of the characteristic parameter and its corresponding weight.

[0035] In one embodiment, the present invention provides a port disturbance voltage analysis device, the port disturbance voltage analysis device comprising:

[0036] An acquisition module, used to acquire the measurement waveform of the full-time-domain port disturbance voltage;

[0037] A disassembly module, used for disassembling the measured waveform into a series of micro-pulse sequences;

[0038] A feature extraction module, configured to extract features from each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period;

[0039] The analysis module is used to generate port disturbance voltage evaluation information according to the characteristic parameters and analyze the port disturbance voltage.

[0040] In one embodiment, the present invention provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the above-mentioned port disturbance voltage analysis method.

[0041] In one embodiment, the present invention provides a computer-readable storage medium, characterized in that a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the processor executes the steps of the above-mentioned port disturbance voltage analysis method.

[0042] In the present invention, by dividing the port disturbance voltage measurement waveform into a series of micro-pulse sequences and then performing feature extraction on each micro-pulse sequence, the amount of data to be processed can be greatly reduced, data that does not contain important information can be eliminated, and the information contained in the test data can be fully mined to more comprehensively reflect the test results of the product under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] A more complete understanding of exemplary embodiments of the present invention may be obtained by referring to the following drawings:

[0044] Figure 1 A diagram of an application environment of a port disturbance voltage analysis method provided in one embodiment of the present invention;

[0045] Figure 2 This is a structural diagram of the testing device of the present invention;

[0046] Figure 3 A flow chart of a port disturbance voltage analysis method provided in one embodiment of the present invention;

[0047] Figure 4It is a waveform diagram of the whole process of closing operation described in the present invention;

[0048] Figure 5 It is a waveform diagram of the whole process of the opening operation described in the present invention;

[0049] Figure 6 This is a waveform disassembly flow chart of the present invention;

[0050] Figure 7 This is a feature extraction flow chart of the present invention;

[0051] Figure 8 A structural block diagram of a port disturbance voltage analysis device provided in one embodiment of the present invention;

[0052] Fig. 9 The figure is a block diagram of the internal structure of a computer device in one embodiment of the present invention. DETAILED DESCRIPTION

[0053] Now, exemplary embodiments of the present invention are described with reference to the accompanying drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are provided to disclose the present invention in detail and completely and to fully convey the scope of the present invention to those skilled in the art. The terms used in the exemplary embodiments shown in the accompanying drawings are not intended to limit the present invention. In the accompanying drawings, the same units / elements are marked with the same reference numerals.

[0054] Unless otherwise specified, the terms (including technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it is understood that the terms defined in commonly used dictionaries should be understood to have the same meanings as those in the context of the relevant fields, and should not be understood as idealized or overly formal meanings.

[0055] Figure 1 FIG1 is a diagram of an application environment of a port disturbance voltage analysis method provided in an embodiment. As shown in FIG1 , in the application environment, a computer device 100 and a test apparatus 200 are included.

[0056] The computer device 100 may be an independent physical server or terminal, or a server cluster composed of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud servers, cloud databases, cloud storage, and CDN. The computer device 100 processes and analyzes the data collected by the test device by executing the port disturbance voltage analysis method provided by the present invention to output the port disturbance voltage evaluation information of the tested sample.

[0057] The optional structure of the test device 200 is as follows: Figure 2The device can be connected to and installed at position 2 and position 3 to install the EVT test product to be tested. Figure 2 In the figure, ES and DS represent the grounding switch and disconnector, respectively; high-frequency sensor probes are built-in at positions 1 and 4 to monitor the transient overvoltage on the primary side during the opening and closing process of the disconnector. At the same time, the GIS pipeline is designed with a telescopic slide rail at the bottom right of the figure, which is compatible with the installation of most electronic transformer test products.

[0058] like Figure 3 As shown, in one embodiment, a port disturbance voltage analysis method is proposed. This embodiment mainly applies this method to the above Figure 1 The computer device 100 in FIG. 1 is used as an example to illustrate. Specifically, the following steps may be included:

[0059] Step S202, obtaining a full-time-domain port disturbance voltage measurement waveform.

[0060] In the embodiment of the present invention, the full time domain port disturbance voltage measurement waveform is as follows: Figure 4 , 5 As shown in the figure. During the closing operation, the micropulses of the port disturbance voltage are sparse at the beginning and dense at the end, and the maximum pulse amplitude of the micropulses gradually decreases; the opening operation is the opposite, the micropulses of the port disturbance voltage are dense at the beginning and sparse at the end, and the maximum pulse amplitude of the micropulses gradually increases. The port disturbance voltage U measured by sample I under test circuit A d For example, Figure 4 , 5 As shown, Figure 4 This is a typical waveform of the whole process of the port disturbance voltage under the closing operation of the disconnector. The whole process consists of dozens to hundreds of micro pulses, and the maximum pulse amplitude of the micro pulse gradually decreases. The duration of the whole time domain process is about 185ms. Figure 5This is a typical waveform of the whole process of the port disturbance voltage under the disconnection switch opening operation. The whole process is also composed of dozens to hundreds of micropulses, and the maximum pulse amplitude of the micropulses gradually increases. The duration of the whole time domain process is about 230ms. The above physical phenomena can be qualitatively explained as follows: (1) When there is no breakdown inside the GIS, because the EVT has an extremely high voltage division ratio under steady-state voltage such as power frequency, the voltage transmitted to the secondary port is very small or close to zero, and the potential difference between the L port and the common grounding point is also close to zero. This phenomenon is manifested as the interval time period between micropulses in the port disturbance voltage measurement waveform. (2) When a breakdown occurs inside the GIS, a transient voltage traveling wave will be generated and coupled to the EVT secondary port through conduction, radiation, etc. In a slightly non-uniform field, the critical breakdown field strength of the SF6 gas gap can be approximately regarded as a fixed constant. Therefore, it can be considered that the critical breakdown voltage of the disconnector gap varies linearly with the switch spacing. During the closing process of the disconnector, the distance between the contact gaps is getting smaller and smaller, and the critical breakdown voltage required is also getting smaller and smaller, making the gap discharge more intensive, and the amplitude of the transient voltage traveling wave (VFTO) generated by each breakdown is also getting smaller and smaller, and the disturbance voltage propagated to the port side of other equipment also shows a trend of gradually decreasing; during the opening process of the disconnector, the distance between the contact gaps is getting larger and larger, and the critical breakdown voltage required is also getting larger and larger, making the gap discharge more sparse, and the amplitude of the transient voltage traveling wave (VFTO) generated by each breakdown is also getting larger and larger, and the disturbance voltage propagated to the port side of other equipment also shows a trend of gradually increasing. In computer processing, the measured waveform is actually read in as discrete time series data.

[0061] Step S204, decomposing the measured waveform into a series of micro-pulse sequences.

[0062] In the embodiment of the present invention, a specific embodiment is taken as an example: more than 400 groups of full-time domain port disturbance voltage measurement waveforms are obtained in the experiment. Due to the high acquisition rate (625M / s) during the experiment, a single full-time domain waveform contains a time axis of 500ms in length, and its sampling points are 312.5M. It can be seen that the processing of such a large number of data points needs to be optimized through algorithms to reduce the amount of data. The full-time domain waveform is disassembled according to relevant features and extracted into a series of micro-pulse sequences. When the measurement waveform is disassembled into a series of micro-pulse sequences, the local maximum value and the global maximum value rules are adopted.

[0063] Step S206 , performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period.

[0064] In the embodiment of the present invention, micropulse characteristic parameters are extracted from each micropulse sequence according to the micropulse characteristics, and on this basis, characteristic parameters to be extracted are obtained.

[0065] In the embodiment of the present invention, the following characteristic parameters are mainly included: maximum amplitude of macro pulse, duration of macro pulse, maximum amplitude of micro pulse, duration of micro pulse, number of micro pulses, oscillation period of micro pulse, rise time of micro pulse and attenuation coefficient of micro pulse.

[0066] Among them, 1) the maximum amplitude of the macro pulse refers to the amplitude of the larger absolute value between the maximum value and the minimum value in a single full time domain, which is equivalent to the Pk1 value in the reference standard definition from the perspective of strict assessment; 2) the duration of the macro pulse refers to the difference between the end time of the last micro pulse and the start time of the first micro pulse, which corresponds to the burst duration in the standard definition; 3) the number of micro pulses refers to the number of all micro pulses in the interference waveform, and its ratio to the duration of the macro pulse corresponds to the repetition rate in the standard definition; 4) the maximum amplitude of the micro pulse refers to the amplitude of the larger absolute value between the maximum value and the minimum value in a single micro pulse waveform; 5) the duration of the micro pulse refers to the difference between the end time of the micro pulse waveform (at this time, the subsequent waveform peaks are all less than the set threshold, which is basically submerged in the environmental noise) and the start time (the beginning of oscillation). Referring to the definition of attenuation in the standard, it can be roughly assumed that Pk 20 The waveform is close to decaying to 0, then the micropulse duration is correlated with the decay in the standard; 6) The micropulse oscillation period refers to the time period T between the first and third zero points after Pk1, and its reciprocal corresponds to the voltage oscillation frequency of the standard waveform; 7) The micropulse rise time refers to the time from 10% to 90% of the measured waveform peak; 8) The micropulse attenuation coefficient refers to Pk5 / Pk1, Pk 10 / Pk1.

[0067] Step S208: generating port disturbance voltage evaluation information according to the characteristic parameters, and analyzing the port disturbance voltage.

[0068] In the embodiment of the present invention, after obtaining the characteristic parameters, the values ​​of the characteristic parameters can also be used to generate disturbance voltage evaluation information to evaluate the condition of the tested port. The step of generating the port disturbance voltage evaluation information according to the characteristic parameters includes the following steps: obtaining the weight corresponding to the characteristic parameters; determining the port disturbance voltage evaluation value according to the values ​​of the characteristic parameters and their corresponding weights and outputting it.

[0069] The present invention divides the port disturbance voltage measurement waveform into a series of micro-pulse sequences and then performs feature extraction on each micro-pulse sequence, which can greatly reduce the amount of processed data, eliminate data that does not contain important information, and fully mine the information contained in the test data to more comprehensively reflect the test results of the tested product.

[0070] In one embodiment, step S204 is to decompose the measured waveform into a series of micro-pulse sequences, which may specifically include the following steps:

[0071] Step S302: dividing the measured waveform into a number of local sequences of equal length.

[0072] Step S304, searching for the maximum absolute value of the disturbance voltage and its corresponding time sequence in each local sequence, and recording the maximum value and its corresponding time sequence into the group sequence M1.

[0073] In the embodiment of the present invention, optionally, TH1 is set to 0.2.

[0074] Step S306 , searching for a maximum disturbance voltage in the group M1 , and if the searched maximum disturbance voltage is greater than a preset threshold TH1 , determining an interval with the searched maximum disturbance voltage as an upper limit.

[0075] In an embodiment of the present invention, the interval can be determined by the size of the amount of data contained. For example, the number of interference voltage points contained in the difference is limited to 100. When it exceeds 100, the left endpoint of the interval is increased to reduce the difference; otherwise, it is increased to obtain an interval of appropriate size.

[0076] Step S308, saving the disturbance voltages falling within the interval and their corresponding time sequences as a new sequence to obtain a series of micro-pulse sequences.

[0077] In one embodiment of the present invention, the port disturbance voltage analysis method further includes:

[0078] Several local maximum values ​​before and after the maximum disturbance voltage in group M1 are set to 0, and micro-pulses are extracted repeatedly until the maximum disturbance voltage in M1 is no greater than the threshold TH1.

[0079] In the embodiment of the present invention, according to the above process, the full time domain waveform can be disassembled and all micro-pulse sequences that meet the preset conditions can be extracted. Among them, the maximum value of the first micro-pulse sequence obtained is the maximum amplitude of the macro pulse; the number of micro-pulse sequences is the number of micro-pulses; if the duration of the micro-pulse is not taken into account, it can be considered that the difference between the maximum time and the minimum time corresponding to the extracted micro-pulse sequence is the macro pulse time. Figure 6 A flow chart of waveform disassembly is shown.

[0080] In one embodiment, step S206 is to extract features from each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, which may specifically include the following steps:

[0081] Step S402, reading a single micro-pulse sequence.

[0082] In the embodiment of the present invention, it should be noted that the steps of this embodiment are directed to each micro-pulse sequence.

[0083] Step S404 , performing a global search on the second column of data of the single micro-pulse sequence, and extracting the maximum value DATAmax of the global absolute value of the second column of data of the single micro-pulse sequence.

[0084] Step S406, determining a slope change rate determination threshold TH2 and a waveform change rate determination threshold TH3 according to the maximum value DATAmax of the global absolute value.

[0085] Step S408, calculating the change rate of each row in the second column of data of the single micro-pulse sequence according to the slope change rate determination threshold TH2.

[0086] Step S410: record the absolute time corresponding to the first slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence as T start The absolute time corresponding to the last slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T end .

[0087] Step 412, by T end With T start The difference in θ determines the micropulse duration.

[0088] In one embodiment, Figure 7 The flowchart of feature parameter extraction is shown. Step S206 is to extract features from each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter. Specifically, the following steps may be included:

[0089] Step S502, multiplying every two adjacent disturbance voltages in the second column of data of the single micropulse sequence, and when the product value is not greater than 0, recording the time point corresponding to the product, and recording the time point in the group column M2.

[0090] Step S504, according to the group M2, determine the local extreme value of the zero point interval in the single micropulse sequence, record the absolute time corresponding to the value when the absolute value of the local extreme value is greater than the waveform change rate determination threshold TH3 and its corresponding value in the single micropulse sequence, and obtain the group M3.

[0091] Step S506, record the original value at the time corresponding to the maximum absolute value of the second column in the group column M3 as Pk1, search rightward in the group column M3 in chronological order, record the first value with a different sign from Pk1 as Pk2, record the first value with a different sign from Pk2 as Pk3, and determine Pkn Value, record Pk n Value and Pk n The corresponding value is recorded in the group M4, and the micropulse attenuation coefficient can be calculated as Pk5 / Pk1, Pk 10 / Pk1.

[0092] Step S508, Pk1, Pk2, Pk4 correspond to time point T PK1 , T PK2 , T PK3 As coordinates, find the first zero point on the left side in the ancestor column M2, denoted as T PK01 , T PK02 , T PK03 , then the micropulse rise time is approximately equal to T PK1 With T PK01 0.8 times the difference, determine T PK02 The difference is the micro-pulse oscillation period.

[0093] like Figure 8 As shown, in one embodiment, a port disturbance voltage analysis device, which can be integrated into the above-mentioned computer device 100, may specifically include:

[0094] An acquisition module 801 is used to acquire a full-time domain port disturbance voltage measurement waveform;

[0095] A disassembly module 802, configured to disassemble the measurement waveform into a series of micro-pulse sequences;

[0096] A feature extraction module 803 is used to extract features from each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period;

[0097] The evaluation module 804 is used to generate port disturbance voltage evaluation information according to the characteristic parameters and analyze the port disturbance voltage.

[0098] In the embodiment of the present invention, for the explanation of each module, please refer to the content of the method part of the present invention, and the embodiment of the present invention will not be repeated here.

[0099] Fig. 9 The internal structure diagram of a computer device in one embodiment is shown. The computer device may specifically be Figure 1The computer device 100 in the embodiment of the present invention. The computer device includes a processor, a memory, a network interface, an input device and a display screen connected via a system bus. The memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program, which, when executed by the processor, enables the processor to implement the port disturbance voltage analysis method provided in the embodiment of the present invention. The internal memory may also store a computer program, which, when executed by the processor, enables the processor to execute the port disturbance voltage analysis method provided in the embodiment of the present invention. The display screen of the computer device may be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device may be a touch layer covered on the display screen, or a button, trackball or touchpad provided on the housing of the computer device, or an external keyboard, touchpad or mouse.

[0100] Those skilled in the art will understand that Fig. 9 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device to which the solution of the present invention is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0101] In one embodiment, the port disturbance voltage analysis device provided by the embodiment of the present invention can be implemented in the form of a computer program. The computer program can be Fig. 9 The computer device shown in the figure is run. The memory of the computer device can store various program modules constituting the port disturbance voltage analysis device, for example, Figure 8 The acquisition module, disassembly module, feature extraction module and evaluation module shown in the figure. The computer program composed of various program modules enables the processor to execute the steps of the port disturbance voltage analysis method of various embodiments of the present invention described in this specification.

[0102] For example, Fig. 9 The computer device shown can be Figure 8 The acquisition module in the port disturbance voltage analysis device shown executes step S202; the computer device may execute step S204 through the disassembly module; the computer device may execute step S206 through the feature extraction module; and the computer device may execute step S208 through the evaluation module.

[0103] In one embodiment, a computer device is provided, the computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the following steps are implemented:

[0104] Obtain the full time domain port disturbance voltage measurement waveform;

[0105] Decomposing the measurement waveform into a series of micro-pulse sequences;

[0106] Performing feature extraction on each of the micro-pulse sequences to obtain at least one feature parameter;

[0107] Port disturbance voltage evaluation information is generated according to the characteristic parameters.

[0108] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the processor performs the following steps:

[0109] Obtain the full time domain port disturbance voltage measurement waveform;

[0110] Decomposing the measurement waveform into a series of micro-pulse sequences;

[0111] Performing feature extraction on each of the micro-pulse sequences to obtain at least one feature parameter;

[0112] Port disturbance voltage evaluation information is generated according to the characteristic parameters.

[0113] Those skilled in the art will appreciate that the embodiments of the present application can be provided as methods, systems, or computer program products. Therefore, the present application can adopt the form of complete hardware embodiments, complete software embodiments, or embodiments in combination with software and hardware. Moreover, the present application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code. The scheme in the embodiments of the present application can be implemented in various computer languages, for example, object-oriented programming language Java and literal scripting language JavaScript, etc.

[0114] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0115] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0116] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0117] Although the preferred embodiments of the present application have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present application.

[0118] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A port disturbance voltage analysis method, characterized in that: The method comprises: Obtain the measurement waveform of the full-time-domain port disturbance voltage; Decomposing the measurement waveform into a series of micro-pulse sequences; Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period; Generate port disturbance voltage evaluation information according to the characteristic parameters, and analyze the port disturbance voltage; Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises: Reading a single micropulse train; Performing a global search on the second column of data of the single micro-pulse sequence to extract a maximum value DATAmax of the global absolute value of the second column of data of the single micro-pulse sequence; Determine the slope change rate determination threshold TH2 and the waveform change rate determination threshold TH3 according to the maximum value DATAmax of the global absolute value; Calculate the change rate of each row in the second column of data of the single micropulse sequence according to the slope change rate determination threshold TH2; The absolute time corresponding to the first slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T start The absolute time corresponding to the last slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T end , By T end With T start The difference of determines the duration of the micropulse; Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises: Multiply every two adjacent disturbance voltages in the second column of data of the single micropulse sequence, and when the product value is not greater than 0, record the time point corresponding to the product, and record the time point in the group column M2; According to the group M2, a local extreme value of the zero point interval is determined in the single micropulse sequence, and the absolute time corresponding to the value where the absolute value of the local extreme value is greater than the waveform change rate determination threshold TH3 and the corresponding value in the single micropulse sequence are recorded to obtain the group M3; The original value at the time corresponding to the maximum absolute value of the second column in the group M3 is recorded as Pk1. In the group M3, search rightward in time order, and the first value with a different sign from Pk1 is recorded as Pk2, and the first value with a different sign from Pk2 is recorded as Pk3. Determine Pk n Value, record Pk n Value and Pk n The corresponding value is recorded in the group M4, and the micropulse attenuation coefficient can be calculated as Pk5 / Pk1, Pk 10 / Pk1; Pk1, Pk2, and Pk3 correspond to time point T PK1 , T PK2 , T PK3 As coordinates, find the first zero point on the left side in the group M2, denoted as T PK01 , T PK02 , T PK03 , then the micropulse rise time is approximately equal to T PK1 With T PK01 0.8 times the difference, determine T PK02 The difference is the micro-pulse oscillation period; Generating port disturbance voltage evaluation information according to the characteristic parameters includes: Obtaining weights corresponding to the feature parameters; The port disturbance voltage evaluation value is determined and outputted according to the value of the characteristic parameter and its corresponding weight.

2. The method according to claim 1, characterized in that: The measurement waveform is decomposed into a series of micro-pulse sequences, including: The measured waveform is decomposed into a series of micro-pulse sequences by using local maximum and global maximum rules.

3. The method according to claim 1 or 2, characterized in that: Decomposing the measured waveform into a series of micro-pulse sequences also includes: Dividing the measured waveform into a plurality of local sequences of equal length; Searching for the maximum absolute value of the disturbance voltage and its corresponding time sequence in each local sequence, and recording the maximum value and its corresponding time sequence into the group column M1; Searching for a maximum disturbance voltage in the group M1, if the maximum disturbance voltage found is greater than a preset threshold TH1, determining an interval with the maximum disturbance voltage found as an upper limit; The disturbance voltage falling within the interval and its corresponding time sequence are saved as a new sequence to obtain a series of micro-pulse sequences.

4. The method according to claim 3, characterized in that The method further comprises: A number of local maximum values ​​before and after the maximum value of the disturbance voltage in the group M1 are set to 0, and micro pulses are extracted again until the maximum value of the disturbance voltage in M1 is not greater than the threshold TH1.

5. A port disturbance voltage analysis device, characterized in that: The port disturbance voltage analysis device comprises: An acquisition module, used to acquire the measurement waveform of the full-time-domain port disturbance voltage; A disassembly module, used for disassembling the measured waveform into a series of micro-pulse sequences; A feature extraction module, configured to extract features from each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter, wherein the feature parameter includes a micropulse duration and a micropulse oscillation period; An analysis module, used to generate port disturbance voltage evaluation information according to the characteristic parameters and analyze the port disturbance voltage; Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises: Reading a single micropulse train; Performing a global search on the second column of data of the single micro-pulse sequence to extract a maximum value DATAmax of the global absolute value of the second column of data of the single micro-pulse sequence; Determine the slope change rate determination threshold TH2 and the waveform change rate determination threshold TH3 according to the maximum value DATAmax of the global absolute value; Calculate the change rate of each row in the second column of data of the single micropulse sequence according to the slope change rate determination threshold TH2; The absolute time corresponding to the first slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T start The absolute time corresponding to the last slope change rate greater than the slope change rate determination threshold TH2 in the second column of data of the single micropulse sequence is recorded as T end , By T end With T start The difference of determines the duration of the micropulse; Performing feature extraction on each micropulse sequence in the series of micropulse sequences to obtain at least one feature parameter comprises: Multiply every two adjacent disturbance voltages in the second column of data of the single micropulse sequence, and when the product value is not greater than 0, record the time point corresponding to the product, and record the time point in the group column M2; According to the group M2, a local extreme value of the zero point interval is determined in the single micropulse sequence, and the absolute time corresponding to the value where the absolute value of the local extreme value is greater than the waveform change rate determination threshold TH3 and the corresponding value in the single micropulse sequence are recorded to obtain the group M3; The original value at the time corresponding to the maximum absolute value of the second column in the group M3 is recorded as Pk1. In the group M3, search rightward in time order, and the first value with a different sign from Pk1 is recorded as Pk2, and the first value with a different sign from Pk2 is recorded as Pk3. Determine Pk n Value, record Pk n Value and Pk n The corresponding value is recorded in the group M4, and the micropulse attenuation coefficient can be calculated as Pk5 / Pk1, Pk 10 / Pk1; Pk1, Pk2, and Pk3 correspond to time point T PK1 , T PK2 , T PK3 As coordinates, find the first zero point on the left side in the group M2, denoted as T PK01 , T PK02 , T PK03 , then the micropulse rise time is approximately equal to T PK1 With T PK01 0.8 times the difference, determine T PK02 The difference is the micro-pulse oscillation period; Generating port disturbance voltage evaluation information according to the characteristic parameters includes: Obtaining weights corresponding to the feature parameters; The port disturbance voltage evaluation value is determined and outputted according to the value of the characteristic parameter and its corresponding weight.

6. A computer device, characterized in that: The invention comprises a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the processor executes the steps of the port disturbance voltage analysis method according to any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the processor executes the steps of the port disturbance voltage analysis method according to any one of claims 1 to 4.

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