Device for measuring magnetic flux distribution near the air gap of magnetic sample

Abstract

The present invention relates to the technical field of magnetic sample flux measurement, and specifically discloses a device for measuring the magnetic flux distribution near the air gap of a magnetic sample. The device includes: a carrying mechanism; a first direction adjustment mechanism, connected to the carrying mechanism, used to adjust and fix the positions of the first sample to be tested and the second sample to be tested in the first direction; a second direction adjustment mechanism, connected to the carrying mechanism, used to adjust the positions of the first sample to be tested and the second sample to be tested in the second direction, thereby adjusting the spacing between the first sample to be tested and the second sample to be tested; a probe adjustment mechanism equipped with a probe, and the probe adjustment mechanism is connected to the carrying mechanism. The present invention adjusts the positions of the first sample to be tested and the second sample to be tested in the first direction and the second direction, and measures the magnetic flux distribution under different air gap lengths. The probe adjustment mechanism controls the probe to correspond to the air gap between the first sample to be tested and the second sample to be tested, so as to measure the magnetic flux distribution at different positions of the sample to be tested.

Description

Technical Field

[0001] The invention relates to the technical field of magnetic sample magnetic flux measurement, and in particular to a device for measuring magnetic flux distribution near an air gap of a magnetic sample. Background Art

[0002] With the widespread use of electric energy, people have to come into contact with electrical equipment in their lives. As an important part of du / dt filters, sine filters and voltage peak limiters, reactors are used to meet the requirements of power grid standards and EMC (Electro Magnetic Environment) regulations and are an indispensable part of power electronic equipment.

[0003] In the actual use of reactors, the reactor core is usually cut to have an air gap, mainly because: without an air gap, the inductance of the reactor is linearly related to the magnetic permeability of the core itself, and is easily affected by external conditions such as temperature. Adding an air gap can make the inductance of the reactor more stable; the magnetic permeability of the reactor core is generally large, and a small external excitation will saturate the core. Adding an air gap can make the reactor withstand a larger excitation current, greatly enhancing the reactor's anti-saturation ability; the energy storage capacity of the reactor increases with the increase of the air gap, so that the reactor can store more energy in a smaller volume. Increasing the air gap can greatly improve the performance of the reactor.

[0004] However, with the addition of air gaps, the reactor will generate additional losses near the air gap and affect the distribution of magnetic flux near the air gap, and the distribution of magnetic flux will cause the loss to increase. The increase in this part of the loss reduces the overall working efficiency of the equipment, and in extreme cases even damages the electrical equipment. Therefore, it is of great significance to measure the distribution of magnetic flux near the air gap, understand the distribution of magnetic flux near the air gap, calculate the corresponding losses, and propose corresponding methods to reduce losses, which is of great significance to improving the working efficiency and safe and stable operation of electrical equipment. At present, there are few studies on the measurement of magnetic flux distribution near the air gap under different air gap lengths, and there is no corresponding device, which greatly limits the research in this area. Summary of the invention

[0005] In view of this, the present invention proposes a device for measuring the magnetic flux distribution near the air gap of a magnetic sample, aiming to solve the problem that the magnetic flux near the air gap of the magnetic sample cannot be measured.

[0006] The present invention proposes a device for measuring magnetic flux distribution near an air gap of a magnetic sample, the device comprising: a bearing mechanism for fixing a U-shaped iron core; a first direction adjustment mechanism connected to the bearing mechanism, the first direction adjustment mechanism being used to adjust and fix the first sample to be tested and the second sample to be tested in the first direction; the first sample to be tested and the second sample to be tested are respectively pressed against two free end surfaces of the U-shaped iron core; a second direction adjustment mechanism connected to the bearing mechanism, the second direction adjustment mechanism being used to adjust and fix the first sample to be tested and the second sample to be tested in the second direction so that the first sample to be tested and the second sample to be tested form an air gap in the second direction; a probe adjustment mechanism equipped with a probe, the probe adjustment mechanism being connected to the bearing mechanism, the probe adjustment mechanism being used to adjust the position of the probe in the first direction, the second direction and the third direction; the first direction, the second direction and the third direction are perpendicular to each other, and the second direction is the length direction of the first sample to be tested and the second sample to be tested.

[0007] Furthermore, the above-mentioned bearing mechanism includes: a lower platform body, used to fix the U-shaped iron core; an upper platform body, connected to the lower platform body, and the upper platform body is provided with through holes for the two free ends of the U-shaped iron core to pass through.

[0008] Furthermore, in the above-mentioned supporting mechanism, the first direction adjustment mechanism includes: two sample placement tables, both connected to the upper platform body and placed correspondingly along the first direction, the two sample placement tables are respectively used to place the first sample to be tested and the second sample to be tested, and to adjust the positions of the first sample to be tested and the second sample to be tested in the first direction.

[0009] Furthermore, in the above-mentioned supporting mechanism, each of the sample placement tables includes: a first placement table body, connected to the upper platform body, the first placement table body being protrudingly provided with a supporting portion for supporting the first sample to be tested or the second sample to be tested; a first direction displacement table, connected to the first placement table body, the first direction displacement table being in contact with the first sample to be tested and thereby adjusting the position of the first sample to be tested or the second sample to be tested in the first direction.

[0010] Further, in the above-mentioned supporting mechanism, the first direction displacement stage includes: a first lower platform, fixedly connected to the first placing stage body, the first lower platform protrudingly provided with a first connecting member, the first connecting member having a first threaded hole; a first upper platform, placed above the first lower platform and slidably connected to the first lower platform along the first direction; a first baffle, fixedly connected to the first upper platform, and the first baffle abuts against the first sample to be tested; a first spiral micrometer sleeve, threadedly connected to the first threaded hole and the end portion of which is penetrated by the first threaded hole and abuts against the first upper platform to push the first upper platform to slide relative to the first lower platform along the first direction.

[0011] Furthermore, in the above-mentioned carrying mechanism, there are two first-direction displacement stages distributed on both sides of the first sample to be tested.

[0012] Further, in the above-mentioned supporting mechanism, the first placement table body of at least one of the sample placement tables is adjustably connected to the upper platform body along the first direction; or, a middle baffle is arranged between the first sample to be tested and the second sample to be tested, and the middle baffle is slidably connected to the upper platform body along the first direction.

[0013] Furthermore, in the above-mentioned supporting mechanism, the second direction adjustment mechanism includes: two sample end overlapping platforms, both of which are connected to the upper platform body and distributed at both ends of the upper platform body along the second direction, and the two sample end overlapping platforms are respectively used to place the ends of the first sample to be tested and the second sample to be tested that are opposite to each other, and to adjust the distance between the first sample to be tested and the second sample to be tested in the second direction.

[0014] Furthermore, in the above-mentioned supporting mechanism, each of the sample end overlapping platforms includes: a second lower platform, fixedly connected to the upper platform body, the second lower platform protruding with a second connecting piece, and the second connecting piece having a second threaded hole; a second upper platform, placed above the second lower platform and slidably connected to the second lower platform along the second direction; a second baffle, fixedly connected to the second upper platform, and the second baffle abuts against the end of the first sample to be tested or the second sample to be tested; a second spiral micrometer sleeve, threadedly connected to the second threaded hole and abutting against the second upper platform after the end is penetrated by the second threaded hole, so as to push the second upper platform to slide relative to the second lower platform along the second direction.

[0015] Further, in the above-mentioned carrying mechanism, the probe adjustment mechanism includes: a first direction lower platform, fixedly connected to the lower platform body; a first direction upper platform, slidably connected to the first direction lower platform along the first direction; a first direction adjusting member, connected to the first direction lower platform and the first direction upper platform, to push the first direction upper platform to slide relative to the first direction lower platform; a second direction lower platform, fixedly connected to the first direction upper platform; a second direction upper platform, slidably connected to the second direction lower platform along the second direction; a second direction adjusting member, connected to the second direction lower platform and the second direction upper platform, to push the second direction upper platform to slide relative to the second direction lower platform; a third direction lower platform, fixedly connected to the second direction upper platform; a third direction upper platform, slidably connected to the third direction lower platform along the third direction; a third direction adjusting member, connected to the third direction lower platform and the third direction upper platform, to push the third direction upper platform to slide relative to the third direction lower platform; a bracket, connected to the second direction upper platform, for installing a probe.

[0016] It can be seen that the present invention adjusts the positions of the first sample to be tested and the second sample to be tested in the first direction and the second direction, and then measures the magnetic flux distribution under different air gap lengths. In addition, the probe adjustment mechanism is used to control the position of the probe relative to the air gap between the first sample to be tested and the second sample to be tested, so that the magnetic flux distribution at different positions of the sample to be tested can be measured. In addition, the first direction adjustment mechanism and the second direction adjustment mechanism of the present invention can also fix the first sample to be tested and the second sample to be tested, ensuring that the first sample to be tested and the second sample to be tested will not generate excessive jitter during the test process, thereby improving the measurement accuracy and reducing the experimental cost.

[0017] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The above and other objects, features and advantages of the present application will become more apparent through a more detailed description of exemplary embodiments of the present application in conjunction with the accompanying drawings, wherein the same reference numerals generally represent the same components in the exemplary embodiments of the present application.

[0019] Figure 1 It is a schematic diagram of the structure of a device for measuring the magnetic flux distribution near the air gap of a magnetic sample provided in an embodiment of the present invention;

[0020] Figure 2 It is another structural schematic diagram of a device for measuring magnetic flux distribution near an air gap of a magnetic sample provided in an embodiment of the present invention;

[0021] Figure 3 It is a structural schematic diagram of the lower platform body in an embodiment of the present invention;

[0022] Figure 4 It is a structural schematic diagram of a lower platform body with an iron core installed in an embodiment of the present invention;

[0023] Figure 5 It is a schematic diagram of the structure of the upper platform body in an embodiment of the present invention;

[0024] Figure 6 A schematic diagram of the structure of a probe support in an embodiment of the present invention;

[0025] Figure 7 is another structural schematic diagram of a probe support in an embodiment of the present invention;

[0026] Figure 8 It is a structural schematic diagram of the first placement table body in an embodiment of the present invention;

[0027] Fig. 9 It is a structural schematic diagram of a sample placement table in an embodiment of the present invention;

[0028] Fig.10 It is a schematic diagram of the structure of the sample end lap platform in an embodiment of the present invention;

[0029] Fig.11 This is a schematic diagram of the connection structure between the middle baffle and the upper platform body in an embodiment of the present invention;

[0030] Fig.12 for Figure 6 A partial enlarged view of part Ⅰ;

[0031] Fig.13 for Figure 7 A partial enlarged view of part II. DETAILED DESCRIPTION

[0032] The preferred embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although the preferred embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided to make the present application more thorough and complete, and to fully convey the scope of the present application to those skilled in the art.

[0033] The terms used in this application are for the purpose of describing specific embodiments only and are not intended to limit this application. The singular forms of "a", "said" and "the" used in this application and the appended claims are also intended to include plural forms unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0034] It should be understood that although the terms "first", "second", "third", etc. may be used in this application to describe various information, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of this application, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0035] In the description of the present application, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0036] Unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0037] See also Figure 1 and Figure 5 The embodiment of the present application provides a device for measuring magnetic flux distribution near an air gap of a magnetic sample, the device comprising: a supporting mechanism 100, a first direction adjustment mechanism 200, a second direction adjustment mechanism and a probe adjustment mechanism 400.

[0038] The supporting mechanism 100 is used to fix the U-shaped iron core 500 , and a coil 510 is sleeved in the middle of the U-shaped iron core 500 .

[0039] In one embodiment, the supporting mechanism 100 includes a lower platform body 110 and an upper platform body 120. The lower platform body 110 is used to fix the U-shaped iron core. The U-shaped iron core 500 is fixed to the lower platform body 110 by an iron core fixing shell 520. The iron core fixing shell 520 is connected to the lower platform body 110 by bolts. The upper platform body 120 is connected to the lower platform body 110, and the upper platform body 120 is provided with through holes 121 for the two free ends of the U-shaped iron core 500 to pass through. Figure 5 The lower platform body 110 is provided with a plurality of L-shaped connecting parts 111, and the upper platform body 120 is placed on the connecting parts 111 of the lower platform body 110 and is connected to the left and right sides of the lower platform body 110 (relative to the Figure 1 As shown in the state shown in the figure, the upper platform body 120 and the connecting part 111 are aligned, and the upper platform body 120 and the connecting part 111 are connected by bolts.

[0040] In another embodiment, the supporting mechanism 100 is a box-type structure, the U-shaped iron core 500 is fixed in the box, the upper end cover of the box is provided with a through hole, and the two free ends of the U-shaped iron core 500 are passed through the through hole and extend to the outside of the box.

[0041] The first direction adjustment mechanism 200 is connected to the supporting mechanism 100, and is used to fix the first sample to be tested 600 and the second sample to be tested 700, and to clamp and adjust the positions of the first sample to be tested 600 and the second sample to be tested 700 in the first direction. The first sample to be tested 600 and the second sample to be tested 700 are respectively pressed against the two free end surfaces 530 of the U-shaped iron core 500.

[0042] The first sample piece 600 and the second sample piece 700 are both in the shape of long strips, and are placed side by side along the length direction with a gap, which is the air gap between the first sample piece 600 and the second sample piece 700. In a specific implementation, the first sample piece 600 and the second sample piece 700 are magnetic samples, such as silicon steel sheets, etc., and can be the same magnetic samples or different magnetic samples, and can be one sheet or multiple sheets stacked together.

[0043] The first direction is Figure 1 The A direction shown in , that is, Figure 1 The width direction of the first sample to be tested 600 and the second sample to be tested 700 shown in the figure is perpendicular to the length direction. The first direction adjustment mechanism 200 can adjust the positions of the first sample to be tested 600 and the second sample to be tested 700 along the first direction, so that the first sample to be tested 600 and the second sample to be tested 700 are aligned in the width direction, and then the first sample to be tested 600 and the second sample to be tested 700 are fixed.

[0044] The second direction adjustment mechanism is connected to the supporting mechanism 100, and is used to adjust the positions of the first sample 600 and the second sample 700 in the second direction, so that the first sample 600 and the second sample 700 form an air gap in the second direction. The length of the air gap can be adjusted by the second direction adjustment mechanism. Figure 1 The B direction shown is the length direction of the first sample to be tested 600 and the second sample to be tested 700 .

[0045] The left end of the first sample to be tested 600 (relative to Figure 1 The state shown) and the right end of the second test sample 700 (relative to Figure 1 As shown in the state, both are placed on the second direction adjustment mechanism, and the second direction adjustment mechanism adjusts the positions of the first sample 600 and the second sample 700 to be tested in the second direction, thereby adjusting the air gap therebetween, and then fixes them.

[0046] See also Figures 1 to 7 , a probe adjusting mechanism 400 is installed with a probe 400a, the probe adjusting mechanism 400 is connected to the carrier mechanism 100, the probe 400a corresponds to the gap between the first sample 600 and the second sample 700, and the probe adjusting mechanism 400 is used to adjust the position of the probe 400a in the first direction, the second direction and the third direction. The third direction is Figure 1 The C direction shown is the thickness direction of the first sample 600 and the second sample 700 , and the first direction, the second direction, and the third direction are perpendicular to each other.

[0047] During measurement, the first sample to be tested 600 and the second sample to be tested 700 are placed on the first direction adjustment mechanism 200, and the position in the first direction is adjusted by the first direction adjustment mechanism 200, so that the first sample to be tested 600 and the second sample to be tested 700 are aligned or staggered by a certain distance in the first direction. The spacing, i.e., the air gap, between the first sample to be tested 600 and the second sample to be tested 700 is adjusted by the second direction adjustment mechanism 300. Current is passed through both ends of the coil 510 to apply excitation, and then the position of the probe is adjusted by the probe holder adjustment mechanism 400 to perform measurement.

[0048] It can be seen that the embodiment of the present invention can adjust the position of the first sample to be tested 600 and the second sample to be tested 700 in the first direction and the second direction, and then measure the magnetic flux distribution under different air gap lengths. In addition, the probe adjustment mechanism 400 is used to control the position of the probe relative to the air gap between the first sample to be tested and the second sample to be tested, so that the magnetic flux distribution at different positions of the sample to be tested can be measured. Moreover, the first direction adjustment mechanism 200 and the second direction adjustment mechanism 300 of the embodiment of the present application can also fix the first sample to be tested 600 and the second sample to be tested 700, ensuring that the first sample to be tested 600 and the second sample to be tested 700 will not generate excessive jitter during the test process, thereby improving the measurement accuracy and reducing the experimental cost.

[0049] It should be noted that the embodiment of the present invention can measure the magnetic flux near the air gap between the first sample to be tested 600 and the second sample to be tested 700. The near in this embodiment refers to a certain range around the air gap. The range can be determined based on actual conditions and this embodiment does not impose any limitation on it.

[0050] In some embodiments, see Figure 1 The first direction adjustment mechanism 200 includes: two sample placement tables 210, both connected to the upper platform body 120 and placed correspondingly along the first direction, the two sample placement tables are used to place the first sample to be tested 600 and the second sample to be tested 700 respectively, and adjust the positions of the first sample to be tested 600 and the second sample to be tested 700 in the first direction. The two sample placement tables 210 are fixed on the central axis of the upper platform body 120 along the second direction and ensure that the upper end surface of the sample placement table 210 is flush with the first sample to be tested 600 or the second sample to be tested.

[0051] In some embodiments, see Figure 1 , Figure 8 and Fig. 9 Each sample placement platform 210 includes: a first placement platform body 211 and a first direction displacement platform 212. The first placement platform body 211 is connected to the upper platform body 120. The first placement platform body 211 is provided with a bearing portion 211a for placing the first sample to be tested 600 or the second sample to be tested 700. The sample fixing shell 211b is pressed on the first sample to be tested 600 or the second sample to be tested 700 and is bolted to the bearing portion 211a. The first direction displacement platform 212 is connected to the first placement platform body 211. The first direction displacement platform 212 abuts against the first sample to be tested 600 or the second sample to be tested 700, thereby adjusting the position of the first sample to be tested 600 or the second sample to be tested 700 in the first direction.

[0052] Continue to see Fig. 9In some embodiments, the first direction displacement stage 212 includes: a first lower platform 212b, a first upper platform 212c, a first baffle 212d and a first screw micrometer sleeve 212e. The first lower platform 212a is bolted to the first placement platform body 211, the first lower platform 212b is provided with a first connecting member 212f, and the first connecting member 212f is provided with a first threaded hole. The first upper platform 212c is placed above the first lower platform 212b (relative to Fig. 9 The first baffle 212d is fixedly connected to the first upper platform 212c, and the first baffle 212d abuts against the first sample 600 or the second sample 700 to be tested. The first spiral micrometer sleeve 212e is threadedly connected to the first threaded hole and the end thereof is abutted against the first upper platform 212c after passing through the first threaded hole. The first spiral micrometer sleeve 212e is screwed, and the first spiral micrometer sleeve 212e pushes the first upper platform 212c to slide relative to the first lower platform 212b along the first direction.

[0053] Specifically, the sliding connection between the first lower platform 212b and the first upper platform 212c can be achieved by means of a dovetail groove, a slide rail, etc.

[0054] In some embodiments, see Fig. 9 There are two first-direction displacement stages 212, which are distributed on both sides of the first sample 600 or the second sample 700 ( Figure 1 The positions of the first sample 600 and the second sample 700 can be adjusted on both sides of the first sample 600 and the second sample 700, and the two first direction displacement stages 212 can clamp the first sample 600 and the second sample 700 through the first baffle 212d, to ensure that the first sample 600 and the second sample 700 will not generate excessive jitter during the measurement process, thereby improving the measurement accuracy and reducing the experimental cost.

[0055] In some embodiments, the first placement platform body 211 of at least one sample placement platform 210 is adjustably connected to the upper platform body 120 along the first direction, so that the relative position of the first sample to be tested 600 and the second sample to be tested can be further adjusted in the first direction. Specifically, the first placement platform body 211 is slidably connected to the upper platform body 120, and a connecting portion is provided on the upper platform body 120, and a threaded hole is provided on the connecting portion. The third spiral micrometer sleeve 213 is connected to the threaded hole and the end thereof extends out of the threaded hole and is connected to the first placement platform body 211. The relative position of the first placement platform body 211 and the upper platform body 120 can be adjusted by screwing the third spiral micrometer sleeve 213.

[0056] In some embodiments, see Figure 1The second direction adjustment mechanism includes: two sample end overlap platforms 310, both of which are connected to the upper platform body 120 and distributed at both ends of the upper platform body 120 along the second direction, and the two sample end overlap platforms 310 are respectively used to place the ends of the first sample to be tested 600 and the second sample to be tested 700 that are opposite to each other, and to adjust the air gap between the first sample to be tested 600 and the second sample to be tested 700 in the second direction.

[0057] In some embodiments, see Fig.10 , each sample end lap platform 310 includes: a second lower platform 311, a second upper platform 312, a second baffle 313 and a second spiral micrometer sleeve 314. The second lower platform 311 is fixedly connected to the upper platform body 120, and the second lower platform 311 is convexly provided with a second connecting member 311a, and the second connecting member 311a is provided with a second threaded hole. The second upper platform 312 is placed above the second lower platform and is slidably connected to the second lower platform 311 along the second direction. The second baffle 313 is fixedly connected to the second upper platform 312, and the second baffle 313 abuts against the end of the first sample to be tested 600 or the second sample to be tested 700. Specifically, the second baffle 313 is fixed to the second upper platform 312 by bolts and ensures that its rear end surface ( Figure 1 left or right as shown).

[0058] The second micrometer sleeve 314 is threadedly connected to the second threaded hole and the end thereof is passed through the second threaded hole and abuts against the second upper platform 312 to push the second upper platform 312 to slide relative to the second lower platform along the second direction.

[0059] In a specific implementation, the second lower platform 311 is threadedly connected to the upper platform body 120. The sliding connection between the second lower platform 311 and the second upper platform 312 can be achieved by means of a dovetail groove, a slide rail, etc.

[0060] In some embodiments, see Figure 1 , Figure 2 and Fig.11 It may also include a middle baffle 800. The middle baffle 800 is slidably connected to the upper platform body 120 along a first direction and is placed between the first sample to be tested 600 and the second sample to be tested 700. By adjusting the position of the middle baffle 800, the size of the air gap between the first sample to be tested 600 and the second sample to be tested 700 can be adjusted.

[0061] Specifically, two bases 810 are bolted together at both ends along the first direction in the middle of the upper platform body 120 (corresponding to the air gap between the first sample to be tested 600 and the second sample to be tested 700), and both ends of the slide rail 820 are respectively connected to the two bases 810, and the slide 830 and the slide rail 820 form a dovetail groove connection, and the middle baffle plate 800 is fixed on the slide 830. Specifically, the middle baffle plate 830 is threadedly connected to the slide 830.

[0062] In some embodiments, see Figure 1 , Figure 4 , Figure 6 and Figure 7 The probe adjustment mechanism 400 includes: a first direction lower platform 410, a first direction platform 420, a first direction adjustment member 430, a second direction lower platform 440, a second direction platform 450, a second direction adjustment member 460, a third direction lower platform 470, a third direction upper platform 480, a third direction adjustment member 490 and a bracket 400a.

[0063] The first direction lower platform 410 is fixedly connected to the lower platform body 110, specifically by bolt connection. The first direction upper platform 420 is slidably connected to the first direction lower platform 410 along the first direction, and the sliding connection can be achieved by means of a slide rail connection, a dovetail groove connection, etc. The first direction adjustment member 430 is connected to the first direction lower platform 410 and the first direction platform 420. Specifically, the first direction adjustment member 430 is a spiral micrometer sleeve, which is threadedly connected to the first direction lower platform 410 and the first direction platform 420. The threaded micrometer sleeve is screwed to push the first direction platform to slide relative to the first direction lower platform.

[0064] The second direction lower platform 440 is fixedly connected to the first direction platform 420, specifically by bolt connection. The second direction platform 450 is slidably connected to the second direction lower platform 440 along the second direction, and the sliding connection can be achieved by means of a slide rail connection, a dovetail groove connection, etc. The second direction adjustment member 460 is connected to the second direction lower platform 440 and the second direction platform 450. Specifically, the second direction adjustment member 460 is a spiral micrometer sleeve, which is screwed to push the second direction platform 450 to slide relative to the second direction lower platform 440.

[0065] The third downward platform 470 is fixedly connected to the second directional platform 450, which can be specifically connected by bolts. The third directional platform 480 is slidably connected to the third downward platform 470 along the third direction, and the sliding connection can be achieved by means of a slide rail, a dovetail groove, etc. The third directional adjustment member 490 is connected to the third downward platform 470 and the third upward platform 480. Specifically, the third directional adjustment member 460 is a spiral micrometer sleeve, which is screwed to push the third upward platform 480 to slide relative to the third downward platform 470.

[0066] The bracket 400b is connected to the third direction platform 480, one end of the bracket 400b is used to install the probe 400a, and the other end of the bracket 400b is used to be fixedly connected to the third direction platform 480. The probe adjustment mechanism 400 can adjust the position of the bracket 400b in the first direction, the second direction and the third direction, thereby adjusting the position of the probe 400a.

[0067] See also Figure 4 , Fig.12 and Fig.13 , a boss 112 is provided on one side of the lower platform body 110, the first direction lower platform 410 is fixedly connected to the boss 112 by bolts, the two ends of the spring 400c are respectively welded to the upper end surface of the probe 400a and the probe housing 400d; the signal line 400e is welded to the probe 400a, passes through the spring 400c, and passes through the small hole on the probe housing 400d. The probe housing 400d is fixed in the through hole of the probe lower housing 400f; the probe lower housing 400f is fixedly connected to the probe upper housing 400g to ensure that the signal line 400e can pass through the small hole of the probe upper housing 400g, and the signal line passing through is connected to an oscilloscope to display the magnitude of the measured magnetic flux density.

[0068] It should be noted that, in specific implementation, the fixed connection in this embodiment can be achieved by bolt connection, screw connection, etc.

[0069] The working principle and workflow of the present invention are as follows:

[0070] See also Figure 1 , take two identical samples to be tested and place them on two sample placement tables 210 respectively, and place them on Figure 1 The first sample to be tested 600 is placed on the sample placement table 210 on the left side. Figure 1The sample to be tested on the right sample placement table 210 is called the second sample to be tested 700. The relative positions of the first sample to be tested 600 and the second sample to be tested 700 are controlled by adjusting the middle baffle 800, the first direction adjustment mechanism 200, and the second direction adjustment mechanism, so that the first sample to be tested 600 and the second sample to be tested 700 are aligned or staggered by a certain distance along the first direction, i.e., the width direction, and a certain distance is left along the second direction, i.e., the length direction, and the first sample to be tested 600 and the second sample to be tested 700 are clamped by each first baffle 212d and each second baffle 313. The middle baffle 800 is moved to one side of the slide rail 820, and the first screw micrometer sleeve 212e of the sample placement table 210 on the left is rotated to change the position of the first sample to be tested 600 on the left, while the position of the second sample to be tested 700 on the right remains unchanged, thereby adjusting the size of the air gap between the first sample to be tested 600 and the second sample to be tested 700. Current is passed through both ends of the coil 510 to apply excitation, and the first direction adjustment member 430, the second direction adjustment member 460 and the third direction adjustment member 490 of the rear probe adjustment mechanism are rotated to adjust the position of the probe 400a. The two probes 400a can measure the electromotive force signal induced by the change of magnetic flux, which can be observed by the oscilloscope connected through the signal line 400e.

[0071] According to Faraday's law of electromagnetic induction e B is the measured induced voltage value; N B is the equivalent turns of the probe. Since the probe measures the voltage on one side of the closed loop, which is equivalent to a half-turn coil, N B =1 / 2,S B is the effective area of ​​the probe measurement area, which is equal to the product of the distance between the probes and the thickness of the sample to be measured. T is the measurement period of the probe, so the value of the magnetic flux density at the probe is

[0072] This embodiment uses a B probe to measure the magnetic flux distribution. When the B probe spacing is controlled to be small, the local magnetic flux distribution of the sample can be measured, thereby improving the accuracy of magnetic flux measurement. Since the probe adjustment mechanism 400 is used in this embodiment to control the position of the B probe relative to the air gap of the two parts of the sample, the magnetic flux distribution measurement of different positions of the sample can be achieved. In addition, since the relative positions of the samples on both sides can be adjusted, the magnetic flux distribution under the actual condition of core end face misalignment can be simulated.

[0073] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A device for measuring magnetic flux distribution near the air gap of a magnetic sample, characterized in that: include: A bearing mechanism for fixing the U-shaped iron core; A first direction adjustment mechanism is connected to the bearing mechanism, and is used to adjust and fix the first sample to be tested and the second sample to be tested in the first direction; the first sample to be tested and the second sample to be tested are respectively pressed against two free end surfaces of the U-shaped iron core; A second direction adjustment mechanism, connected to the bearing mechanism, the second direction adjustment mechanism is used to adjust and fix the first sample to be tested and the second sample to be tested in the second direction so that the first sample to be tested and the second sample to be tested form an air gap in the second direction; A probe adjustment mechanism having a probe installed thereon, the probe adjustment mechanism being connected to the supporting mechanism, and the probe adjustment mechanism being used to adjust the position of the probe in a first direction, a second direction, and a third direction; The first direction, the second direction, and the third direction are perpendicular to each other, and the second direction is the length direction of the first sample to be tested and the second sample to be tested.

2. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 1, characterized in that: The carrying mechanism comprises: The lower platform body is used to fix the U-shaped iron core; The upper platform body is connected to the lower platform body, and the upper platform body is provided with through holes for the two free ends of the U-shaped iron core to pass through.

3. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 2, characterized in that: The first direction adjustment mechanism comprises: Two sample placement tables are connected to the upper platform body and placed correspondingly along the first direction. The two sample placement tables are respectively used to place the first sample to be tested and the second sample to be tested, and to adjust the positions of the first sample to be tested and the second sample to be tested in the first direction.

4. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 3, characterized in that: Each of the sample placement platforms comprises: A first placement table body connected to the upper platform body, wherein the first placement table body is provided with a carrying portion for carrying the first to-be-tested sample or the second to-be-tested sample; The first direction displacement platform is connected to the first placement platform body, and the first direction displacement platform abuts against the first sample to be tested to adjust the position of the first sample to be tested or the second sample to be tested in the first direction.

5. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 4, characterized in that: The first direction translation stage comprises: A first lower platform is fixedly connected to the first placing table body, the first lower platform is protrudingly provided with a first connecting piece, and the first connecting piece is provided with a first threaded hole; A first upper platform, disposed above the first lower platform and slidably connected to the first lower platform along the first direction; A first baffle, fixedly connected to the first upper platform, and the first baffle abuts against the first sample to be tested; The first spiral micrometer sleeve is threadedly connected to the first threaded hole and the end thereof is penetrated through the first threaded hole and abuts against the first upper platform to push the first upper platform to slide relative to the first lower platform.

6. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 5, characterized in that: There are two first-direction translation stages distributed on both sides of the first sample to be tested.

7. The device for measuring magnetic flux distribution near an air gap of a magnetic sample according to any one of claims 4 to 6, characterized in that: The first placement table body of at least one of the sample placement tables is connected to the upper platform body in an adjustable manner along the first direction; or, A middle baffle is disposed between the first sample to be tested and the second sample to be tested, and the middle baffle is slidably connected to the upper platform body along the first direction.

8. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 7, characterized in that: The second direction adjustment mechanism comprises: Two sample end landing platforms are connected to the upper platform body and distributed at both ends of the upper platform body along the second direction. The two sample end landing platforms are respectively used to place the ends of the first sample to be tested and the second sample to be tested that are opposite to each other, and to adjust the air gap between the first sample to be tested and the second sample to be tested in the second direction.

9. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 8, characterized in that: Each of the sample end lap joints comprises: A second lower platform is fixedly connected to the upper platform body, the second lower platform is convexly provided with a second connecting piece, and the second connecting piece is provided with a second threaded hole; A second upper platform is disposed above the second lower platform and is slidably connected to the second lower platform along the second direction; A second baffle, fixedly connected to the second upper platform, and the second baffle abuts against an end of the first sample to be tested or the second sample to be tested; The second spiral micrometer sleeve is threadedly connected to the second threaded hole and the end thereof is penetrated through the second threaded hole and abuts against the second upper platform to push the second upper platform to slide relative to the second lower platform.

10. The device for measuring magnetic flux distribution near the air gap of a magnetic sample according to claim 9, characterized in that: The probe adjustment mechanism comprises: A first directional lower platform, fixedly connected to the lower platform body; A first directional upper platform, slidably connected to the first directional lower platform along the first direction; A first direction adjusting member connected to the first direction lower platform and the first direction upper platform to push the first direction platform to slide relative to the first direction lower platform; A second directional lower platform, fixedly connected to the first directional platform; A second directional upper platform, slidably connected to the second directional lower platform along the second direction; A second direction adjusting member connected to the second direction lower platform and the second direction upper platform to push the second direction platform to slide relative to the second direction lower platform; A third downward platform, fixedly connected to the second upward platform; a third upward platform, slidably connected to the third downward platform along the third direction; A third direction adjusting member, connected to the third downward platform and the third upward platform, to push the third upward platform to slide relative to the third downward platform; The bracket is connected to the second direction upper platform and is used for mounting the probe.

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