A dynamic error index evaluation method for inertial devices based on high dynamic centrifuge
By designing the dynamic error index evaluation method of inertial devices on a high dynamic centrifuge, using the overall standard deviation of overload value and the absolute error calculation of time domain, the lack of dynamic error evaluation of inertial devices in a high dynamic environment is solved, and dynamics of inertial devices are realized Effective evaluation of errors and improvement of accuracy.
Patent Information
- Application Number
- CN202210540511.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-05-17
- Publication Date
- 2024-12-24
- Estimated Expiration
- 2042-05-17
AI Technical Summary
The existing high-dynamic centrifuge lacks appropriate inspection indicators and evaluation methods in the dynamic error calibration of inertial devices, and cannot effectively improve the accuracy of inertial devices in high-dynamic overload environments.
A method for evaluating dynamic error index of inertial devices based on high dynamic centrifuge is designed. By calculating the overall standard deviation of overload value and the absolute error of overload value time domain, combined with the dual-axis overload and high-precision output of high dynamic centrifuge, the inertial devices are realized. Specific evaluation of dynamic errors.
It provides suitable dynamic error verification indicators and calculation methods for inertial devices under dynamic overload conditions, solves the problem of no relevant quantization indicators in the existing technology, realizes the credibility evaluation of the dynamic error of inertial devices, and improves the inertial devices. Accuracy in high dynamic environments.
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Figure CN114964312B_ABST
