Chip detection method, device, equipment and storage medium

Abstract

The present application proposes a chip detection method, apparatus, device, and storage medium. The chip detection method is based on a preset detection circuit, which includes a chip interface, a pull-up resistor, and a power interface connected in sequence. The chip interface is used to access the chip to be tested, and both the chip interface and the power interface are connected to a single-chip microcomputer. The method includes: detecting the characteristic data to be tested presented by the chip to be tested during the process of the single-chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two sets of voltage-related characteristic parameters; and determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and the corresponding characteristic data of the preset reference chip. The present application can greatly improve the accuracy of differential detection and reduce the misjudgment and missed judgment caused by traditional methods.

Description

Technical Field

[0001] The present application belongs to the field of chip technology, and specifically relates to a chip detection method, device, equipment and storage medium. Background Art

[0002] With the advancement of chip technology, the number of chip manufacturers has increased. For chips of the same specifications (size, electrical performance, etc.) (including, but not limited to, chips used in microcontrollers), there are often multiple products on the market from multiple manufacturers. However, the performance of products from different manufacturers often varies. Therefore, before using a chip, it is usually necessary to test it to confirm that it is the selected chip.

[0003] In the prior art, when testing chips, especially when two chips use similar processes, the data of the two chips at specific points are often not much different, so it is easy to cause misjudgment and missed judgment, resulting in inaccurate test results. Summary of the Invention

[0004] The present application proposes a chip detection method, device, equipment and storage medium, which can greatly improve the accuracy of differential detection and reduce the misjudgment and missed judgment caused by traditional methods.

[0005] In a first aspect, an embodiment of the present application provides a chip detection method based on a preset detection circuit, wherein the preset detection circuit includes a chip interface, a pull-up resistor, and a power interface connected in sequence, wherein the chip interface is used to connect to the chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer; the method includes:

[0006] Detecting characteristic data to be tested presented by the chip to be tested during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters;

[0007] According to the characteristic data to be tested and corresponding characteristic data of a preset reference chip, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

[0008] In some embodiments of the present application, determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of a preset reference chip includes:

[0009] Determining a difference between the characteristic data of the chip to be tested and the preset reference chip based on the characteristic data to be tested and corresponding characteristic data of a preset reference chip;

[0010] According to the characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

[0011] In some embodiments of the present application, the characteristic data to be measured includes at least one of IV characteristic data and power-on characteristic data; the IV characteristic data is used to characterize the correspondence between the current passing through the pull-up resistor and the first voltage output by the power interface when the chip to be tested is loaded with different input voltages; the power-on characteristic data is used to characterize the correspondence between the stabilization time of the stable voltage output by the chip interface and the stable voltage when the power interface outputs a fixed first voltage.

[0012] In some embodiments of the present application, the characteristic data to be tested presented by the chip under test during the process of the single chip microcomputer supplying power to the preset detection circuit is detected; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters, including:

[0013] In the process of the single chip microcomputer providing different voltages to the preset detection circuit, detecting first voltage values ​​corresponding to different supply voltages and current values ​​passing through the pull-up resistor;

[0014] All detected first voltage values ​​and corresponding current values ​​are recorded as IV characteristic data to be measured, and the IV characteristic data to be measured is determined as characteristic data to be measured.

[0015] In some embodiments of the present application, determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of a preset reference chip includes:

[0016] Determining a difference between the IV characteristic data of the chip to be tested and the preset reference chip according to the IV characteristic data to be tested and the IV characteristic data of a preset reference chip;

[0017] According to the IV characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

[0018] In some embodiments of the present application, determining a difference between the IV characteristic data of the chip to be tested and the preset reference chip based on the IV characteristic data to be tested and the IV characteristic data of a preset reference chip includes:

[0019] determining an IV characteristic curve to be measured of the first voltage based on the IV characteristic data;

[0020] The characteristic data difference between the chip to be tested and the preset reference chip is determined according to the IV characteristic curve to be tested and the reference IV characteristic curve of a preset reference chip.

[0021] In some embodiments of the present application, determining a characteristic data difference between the chip under test and the preset reference chip based on the IV characteristic curve under test and a reference IV characteristic curve of a preset reference chip includes:

[0022] determining a difference curve according to an absolute value of a difference between a current value to be measured of the IV characteristic curve to be measured corresponding to each first voltage value and a reference current value of a reference IV characteristic curve;

[0023] An integration result of the difference curve is determined as a characteristic data difference between the chip to be tested and the preset reference chip.

[0024] In some embodiments of the present application, determining whether the chip under test and the preset reference chip have the same characteristics according to the characteristic data difference includes:

[0025] determining whether the characteristic data difference is less than or equal to a first preset threshold;

[0026] If so, it is determined that the chip under test and the preset reference chip have the same characteristics; if not, it is determined that the chip under test and the preset reference chip do not have the same characteristics.

[0027] In some embodiments of the present application, the characteristic data to be tested presented by the chip under test during the process of the single chip microcomputer supplying power to the preset detection circuit is detected; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters, including:

[0028] In the process of the single chip microcomputer supplying power to the preset detection circuit and maintaining the power interface outputting a fixed first voltage, detecting the stable time to be measured and the stable voltage to be measured of the stable voltage output by the chip interface;

[0029] The stable voltage to be measured and the stable time to be measured are recorded as power-on characteristic data to be measured, and the power-on characteristic data to be measured is determined as characteristic data to be measured.

[0030] In some embodiments of the present application, determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of a preset reference chip includes:

[0031] Determining a difference between the power-on characteristic data of the chip to be tested and the preset reference chip according to the power-on characteristic data of the chip to be tested and the power-on characteristic data of the preset reference chip;

[0032] According to the power-on characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

[0033] In some embodiments of the present application, determining the difference between the power-up characteristic data of the chip to be tested and the preset reference chip according to the power-up characteristic data to be tested and the power-up characteristic data of a preset reference chip includes:

[0034] Determining a power-on characteristic curve of the chip to be tested based on the stable voltage to be tested and the corresponding stable time to be tested;

[0035] The power-on characteristic data difference between the chip to be tested and the preset reference chip is determined according to the power-on characteristic curve to be tested and the reference power-on characteristic curve of a preset reference chip.

[0036] In some embodiments of the present application, determining the power-on characteristic data difference between the chip under test and the preset reference chip based on the power-on characteristic curve under test and the reference power-on characteristic curve of a preset reference chip includes:

[0037] Calculating, based on the power-on characteristic curve to be measured and the reference power-on characteristic curve, a voltage difference between the stable voltage to be measured and the reference stable voltage, a time difference between the stable time to be measured and the reference stable time, and a curvature difference between an average curvature to be measured and a reference average curvature of the power-on characteristic curve to be measured;

[0038] Based on the voltage difference, the time difference, and the curvature difference, a power-on characteristic data difference between the chip to be tested and the preset reference chip is determined.

[0039] In some embodiments of the present application, determining whether the chip under test and the preset reference chip have the same characteristics according to the characteristic data difference includes:

[0040] determining whether a deviation between the voltage difference and the reference stable voltage, a deviation between the time difference and the reference stable time, and a difference between the curvature difference and the reference average curvature are all less than or equal to a second preset threshold;

[0041] If so, it is determined that the chip under test and the preset reference chip have the same characteristics; if not, it is determined that the chip under test and the preset reference chip do not have the same characteristics.

[0042] An embodiment of a second aspect of the present application provides a chip detection device, based on a preset detection circuit, wherein the preset detection circuit includes a chip interface, a pull-up resistor, and a power interface connected in sequence, wherein the chip interface is used to connect to a chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer; the device includes:

[0043] a characteristic detection module, configured to detect characteristic data to be tested presented by the chip under test during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters;

[0044] The result determination module is used to determine whether the chip to be tested and the preset reference chip have the same characteristics according to the characteristic data to be tested and the corresponding characteristic data of the preset reference chip.

[0045] An embodiment of the third aspect of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps described in the first aspect when executing the computer program.

[0046] An embodiment of the fourth aspect of the present application provides a computer-readable storage medium having a computer program stored thereon, wherein the program is executed by a processor to implement the method described in the first aspect.

[0047] The technical solutions provided in the embodiments of this application have at least the following technical effects or advantages:

[0048] The chip detection method provided by the embodiment of the present application is based on a preset detection circuit, which includes a chip interface, a pull-up resistor and a power interface connected in sequence. The chip interface is used to access the chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer. The method is based on the above-mentioned preset detection circuit. After the chip to be tested is accessed to the preset detection circuit, the single-chip microcomputer can detect the measured characteristic data presented by the chip to be tested during the power supply process to the preset detection circuit, and then determine whether the chip to be tested and the preset reference chip have the same characteristics according to the measured characteristic data and the corresponding characteristic data of the preset reference chip. Then, the performance (including but not limited to power consumption performance and diode performance) detection of the chip to be tested can be achieved to improve the yield rate of the product, and the chip is subjected to anti-counterfeiting identification (the chip with the same characteristic description and the preset reference chip belongs to the same manufacturer, and the chip without the same characteristic description and the preset reference chip does not belong to the same manufacturer). And the present embodiment adopts at least two groups of voltage-related characteristic parameters, which can greatly improve the accuracy of distinguishing detection and effectively reduce the possibility of misjudgment and missed judgment. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present application. Throughout the accompanying drawings, the same reference numerals are used to denote the same components.

[0050] In the attached figure:

[0051] Figure 1 A schematic diagram of the framework structure of a preset detection circuit provided in an embodiment of the present application is shown;

[0052] Figure 2 A schematic diagram of the principle structure of a preset detection circuit provided in an embodiment of the present application is shown;

[0053] Figure 3 A schematic diagram of a chip detection method according to an embodiment of the present application is shown;

[0054] Figure 4 FIG1 shows a schematic diagram of an IV curve of a chip to be tested in an embodiment of the present application;

[0055] Figure 5 A schematic diagram of an absolute value curve of the difference between the IV curve of the chip under test and the IV curve of a preset reference chip in one embodiment of the present application is shown;

[0056] Figure 6 A schematic diagram showing a flow chart of another chip detection method provided in one embodiment of the present application is shown;

[0057] Figure 7 Schematic diagram of the TV curve of the chip A to be tested in the embodiment of the present application is shown;

[0058] Figure 8 Schematic diagram of the TV curve of the chip B to be tested in the embodiment of the present application is shown;

[0059] Figure 9 Shows the complete TV curve of the chip under test in one embodiment of the present application;

[0060] Figure 10 A schematic diagram of a difference curve between a TV curve of a chip under test and a TV curve of a preset reference chip in one embodiment of the present application is shown;

[0061] Figure 11 A schematic diagram showing a flow chart of another chip detection method provided in one embodiment of the present application is shown;

[0062] Figure 12 A schematic structural diagram of an electronic device provided in one embodiment of the present application is shown;

[0063] Figure 13 A schematic diagram of a storage medium provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0064] The following describes exemplary embodiments of the present application in more detail with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. Instead, these embodiments are provided to enable a more thorough understanding of the present application and to fully convey the scope of the present application to those skilled in the art.

[0065] It should be noted that, unless otherwise specified, the technical or scientific terms used in this application should have the common meanings understood by those skilled in the art to which this application belongs.

[0066] Existing testing methods typically use a fixed voltage source. This method sets a fixed voltage value, supplies power to the IO port of the chip under test, and then tests the voltage at the IO port under different pull-up resistors. This method, using a single IO port voltage for testing, often results in inaccurate results, which can easily lead to erroneous detection and judgment. This is especially true when the chip under test and a pre-set reference chip have similar process technology, and the values ​​at specific points between the two are not significantly different, making it very easy to misjudge or miss a detection.

[0067] In the existing technical solution, a fixed resistor can be used to provide a small pull-up current at a fixed voltage, and then the charging condition of the chip to be tested by the power output terminal is tested (i.e., the voltage increase of the IO port of the chip to be tested is tested). After it stabilizes, the final stable voltage is taken for judgment. In this way, similar to the above-mentioned detection method, a single parameter is also used for judgment. The detection results are often not very accurate, and it is easy to derive erroneous detection and judgment. Especially when the process of the chip to be tested and the preset reference chip are similar, the values ​​of the two at specific points are not much different, which can easily lead to misjudgment and missed judgment.

[0068] To solve the above problems, the present invention proposes a chip detection method, device, equipment and storage medium. The chip detection method is based on a preset detection circuit, such as Figure 1 and Figure 2 As shown, the preset detection circuit includes a chip interface, a pull-up resistor and a power interface connected in sequence. The chip interface is used to access the chip to be tested, and the chip interface and the power interface are both connected to the microcontroller.

[0069] Among them, the power interface can be a DAC (digital-to-analog converter) interface, which is connected to the single-chip microcomputer, receives the power supply voltage provided by the single-chip microcomputer, and can output a fixed voltage or a variable voltage. The chip interface is connected to the chip under test, can communicate with the chip under test, can send data to the chip under test, and receive data fed back by the chip under test. The chip interface can include an IO interface and can also include an ADC (analog-to-digital converter) interface. Its output can be an open-drain output (or push-pull output depending on technical requirements). Under the action of the pull-up resistor, its output voltage is pulled up to the voltage of the pull-up resistor.

[0070] In the above-mentioned preset detection circuit, the chip interface may include two pins, one pin V1 is connected to a pull-up resistor for IO output, and the other pin LIGND is grounded, which can pull the voltage of the pin V1 down to 0.

[0071] The chip in this embodiment is generally a chip used in a single chip microcomputer, and can be an analog chip or a digital chip, which is not specifically limited in this embodiment.

[0072] Based on the above-mentioned preset detection circuit, after the chip to be tested is connected to the preset detection circuit, the characteristic data to be tested presented by the chip to be tested during the process of the single-chip microcomputer supplying power to the preset detection circuit can be detected, and then, based on the characteristic data to be tested and the corresponding characteristic data of the preset reference chip, it is determined whether the chip to be tested and the preset reference chip have the same characteristics. Subsequently, the performance (including but not limited to power consumption performance and diode performance) of the chip to be tested can be detected to improve the yield rate of the product, and the chip can be anti-counterfeiting identified (chips with the same characteristic description and the preset reference chip belong to the same manufacturer, and chips with different characteristic descriptions and the preset reference chip do not belong to the same manufacturer). In addition, this embodiment adopts at least two groups of voltage-related characteristic parameters, which can greatly improve the accuracy of differential detection and effectively reduce the possibility of misjudgment and missed judgment.

[0073] Please refer to Figure 3 , is a flow chart of the chip detection method provided in the embodiment of the present application, such as Figure 3 As shown, the method includes the following steps:

[0074] Step S1: Detect the characteristic data presented by the chip under test during the process of the single chip microcomputer supplying power to the preset detection circuit. The characteristic data to be tested includes at least two sets of voltage-related characteristic parameters to improve the accuracy of detection and judgment.

[0075] Step S2 : determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and the corresponding characteristic data of the preset reference chip.

[0076] This embodiment can be applied to chip performance testing during chip production to improve product yield. It can also be applied to chip anti-counterfeiting during chip use to ensure that genuine chips are used and product performance is guaranteed.

[0077] Accordingly, when applied to the chip production process, the preset reference chip is usually a chip with relatively ideal performance produced by a manufacturer itself. The various electrical properties, specifications, internal logic, etc. of the preset reference chip can be tested and recorded before testing, and this can be used to check whether the subsequently produced chips meet the standards.

[0078] Furthermore, when applied to chip production, the pre-set reference chip is typically a chip with relatively ideal performance, produced by a selected manufacturer (either the manufacturer itself or an upstream manufacturer). Similarly, the electrical performance, specifications, dimensions, and internal logic of the pre-set reference chip can be tested and recorded before testing. This can be used to verify that subsequent production chips meet the standards.

[0079] In some embodiments, the above step S2 may include the following processing: determining the characteristic data difference between the chip to be tested and the preset reference chip based on the characteristic data to be tested and the corresponding characteristic data of the preset reference chip; and determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data difference.

[0080] The characteristic data difference can be the difference between all parameters in the characteristic data to be tested and the corresponding characteristic data of a preset reference chip, or it can be the difference between any two parameters. The difference can also be used to perform certain mathematical operations, such as absolute value, deviation, and integral. Any comparative analysis using the difference to determine whether the chip to be tested and the preset reference chip have the same characteristics falls within the scope of this embodiment.

[0081] Specifically, the characteristic data to be measured may include at least one of IV characteristic data and power-on characteristic data. The IV characteristic data is used to characterize the corresponding relationship between the current flowing through the pull-up resistor and the first voltage output by the power interface when the chip under test is loaded with different input voltages. The power-on characteristic data is used to characterize the corresponding relationship between the stabilization time of the stable voltage output by the chip interface and the stable voltage when the power interface outputs a fixed first voltage.

[0082] In other embodiments, when the above-mentioned characteristic data to be measured is IV characteristic data, the above-mentioned step S1 may include the following processing: in the process of the single-chip microcomputer providing different voltages to the preset detection circuit, detecting the first voltage values ​​corresponding to different power supply voltages and the current values ​​passing through the pull-up resistor; recording all the detected first voltage values ​​and corresponding current values ​​as the IV characteristic data to be measured, and determining the IV characteristic data to be measured as the characteristic data to be measured.

[0083] In this embodiment, the microcontroller continuously supplies voltages from high to low to a preset detection circuit and records in real time the first voltage output by the power interface and the output voltage of the chip interface. The potential difference between the first voltage and the output voltage of the chip interface is the voltage of the pull-up resistor. Based on the resistance value of the pull-up resistor, the current value passing through the pull-up resistor can be calculated. Thus, the first voltage value and current value corresponding to each power supply voltage provided by the microcontroller are obtained. Then, an IV characteristic data set is formed based on all the first voltage values ​​and corresponding current values.

[0084] Accordingly, step S2 may include the following processing: determining the IV characteristic data difference between the chip under test and the preset reference chip based on the IV characteristic data of the chip under test and the IV characteristic data of the preset reference chip; and determining whether the chip under test and the preset reference chip have the same characteristics based on the IV characteristic data difference. In this way, based on the IV characteristic data of the chip under test and the IV characteristic data of the preset reference chip, it is possible to determine whether the chip under test and the preset reference chip have the same characteristics, thereby enabling detection and anti-counterfeiting authentication of the chip under test.

[0085] Specifically, when determining the difference between the IV characteristic data of the chip to be tested and the preset reference chip according to the IV characteristic data to be tested and the IV characteristic data of the preset reference chip, the IV characteristic curve to be tested of the first voltage can be determined based on the IV characteristic data, such as Figure 4 As shown, Figure 4 The horizontal axis represents voltage in volts (V), and the vertical axis represents current in microamperes (μA). The characteristic data difference between the chip under test and the preset reference chip is then determined based on the IV characteristic curve under test and the baseline IV characteristic curve of the preset reference chip. By plotting the IV characteristic curve and comparing it with the baseline IV characteristic curve of the preset reference chip, the characteristic data difference between the chip under test and the preset reference chip can be determined.

[0086] When determining the characteristic data difference between the chip under test and the preset reference chip based on the IV characteristic curve under test and the reference IV characteristic curve of the preset reference chip, the difference curve can be determined based on the absolute value of the difference between the measured current value of the IV characteristic curve under test and the reference current value of the reference IV characteristic curve corresponding to each first voltage value, such as Figure 5 As shown, Figure 5 The horizontal axis is the voltage value, the unit is volt (v), and the vertical axis is the current value, the unit is microampere (μA). Figure 5The integration result of the difference curve shown is determined as the characteristic data difference between the chip under test and the preset reference chip. In this way, a difference curve is formed based on the absolute value of the difference between the measured current value and the reference current value, and the integration result of the difference curve is determined as the characteristic data difference between the chip under test and the preset reference chip. Because the integration can distinguish relatively small differences, it can improve detection accuracy, thereby effectively reducing the probability of misidentification and missed detection of chips.

[0087] It should be noted that the above-mentioned determination of the integral result of the difference curve as the characteristic data difference between the chip to be tested and the preset reference chip is only a preferred implementation method of this embodiment. This embodiment is not limited to this. For example, deviation, standard deviation, etc. can also be used for judgment.

[0088] When determining whether the chip to be tested and the preset reference chip have the same characteristics based on the difference in characteristic data, you can first determine whether the difference in characteristic data is less than or equal to a first preset threshold; if so, it is determined that the chip to be tested and the preset reference chip have the same characteristics; if not, it is determined that the chip to be tested and the preset reference chip do not have the same characteristics.

[0089] The first preset threshold value can be obtained through a limited number of experiments. Different types and specifications of chips may have different value ranges, which are not specifically limited in this embodiment. This embodiment can also select a larger or smaller first preset threshold value according to technical requirements.

[0090] The following is combined with Figure 6 Taking the identification and detection of chip from manufacturer A as an example, the process of chip detection based on IV curve is introduced in detail. Figure 6 As shown, the IV characteristic curve of the chip from manufacturer M can be first tested and used as the reference IV characteristic curve A. The IV characteristic curve of the chip under test, namely the reference IV characteristic curve B, is then tested. Based on the reference IV characteristic curve A and the reference IV characteristic curve B, a difference curve C is obtained between the two curves. Furthermore, a difference absolute value curve D is obtained, and curve D is integrated. This integral accurately reflects the difference between the chip under test and the reference chip. A first preset threshold X can be set. If the integral value is greater than X, the chip under test and the reference chip do not belong to the same manufacturer; correspondingly, if the integral value is less than or equal to X, the chip under test and the reference chip belong to the same manufacturer.

[0091] In other embodiments, the above-mentioned characteristic data to be measured is power-on characteristic data, then the above-mentioned step S1 may include the following processing: in the process of the single-chip microcomputer supplying power to the preset detection circuit and maintaining the power interface outputting a fixed first voltage, the stable time to be measured and the stable voltage to be measured of the stable voltage output by the detection chip interface are detected; the stable voltage to be measured and the stable time to be measured are recorded as the power-on characteristic data to be measured, and the power-on characteristic data to be measured are determined as the characteristic data to be measured.

[0092] In this embodiment, the microcontroller can power a preset detection circuit, causing the power interface to output a fixed first voltage. For example, the power interface DAC is first set to output 3.3V, the chip interface is pulled to ground, and the power at pin V1 of the chip under test is discharged. Pin V1 is then set as an ADC input, causing its voltage to continuously rise. During the voltage rise process, the voltage of V1 is continuously recorded, and the measured stable time and the measured stable voltage of the chip interface output stable voltage (TV curve area is smoothed) are recorded. The combined measured stable time and the corresponding measured stable voltage are combined to form a TV characteristic data set.

[0093] Due to reasons such as chip parasitic capacitance, the power-on sequence of modules inside the chip, and the power consumption of each module of the chip, different chips often have different power-on characteristic data. Therefore, this embodiment determines the power-on characteristic data to be tested as the characteristic data to be tested based on the power-on characteristic data, which can effectively improve the detection accuracy.

[0094] Specifically, when determining whether the chip under test and the preset reference chip have the same characteristics based on the characteristic data under test and the corresponding characteristic data of the preset reference chip, the difference in the power-up characteristic data between the chip under test and the preset reference chip can be first determined based on the power-up characteristic data under test and the power-up characteristic data of the preset reference chip. Then, based on the power-up characteristic data difference, it is determined whether the chip under test and the preset reference chip have the same characteristics. In this way, based on the power-up characteristic data, the chip under test can be tested to determine whether the chip under test and the preset reference chip have the same characteristics.

[0095] Furthermore, when determining the difference between the power-up characteristic data of the chip under test and the preset reference chip based on the power-up characteristic data of the chip under test and the power-up characteristic data of the preset reference chip, the power-up characteristic curve of the chip under test can be first determined based on the stable voltage to be tested and the corresponding stable time to be tested, that is, a TV curve (time-voltage curve) of the pin under test can be formed; and then the power-up characteristic data difference between the chip under test and the preset reference chip can be determined based on the power-up characteristic curve to be tested and the reference power-up characteristic curve of the preset reference chip. In this way, the power-up characteristic data difference between the power-up characteristic curve to be tested of the chip under test and the power-up characteristic data of the preset reference chip can be determined, thereby facilitating testing of the chip under test.

[0096] like Figure 7 and Figure 8 As shown in the figure, the TV curves of the chip A and the chip B are respectively (the horizontal axis is time and the vertical axis is voltage). It can be seen from the figure that the scheme A and the scheme B have differences in power-on time, power-on stable voltage, and power-on curvature. Figure 9 As shown in FIG. 1 , a TV curve diagram of a chip to be tested provided in this embodiment is shown. Figure 10This is the superposition effect diagram of the TV curve diagram of the chip under test and the TV curve diagram of the preset reference chip.

[0097] When determining the difference in power-on characteristic data between the chip to be tested and the preset reference chip based on the power-on characteristic curve to be tested and the reference power-on characteristic curve of the preset reference chip, the voltage difference between the stable voltage to be tested and the reference stable voltage, the time difference between the stable time to be tested and the reference stable time, and the curvature difference between the average curvature to be tested and the reference average curvature of the power-on characteristic curve to be tested can be calculated respectively based on the power-on characteristic curve to be tested and the reference power-on characteristic curve; based on the voltage difference, time difference and curvature difference, the power-on characteristic data difference between the chip to be tested and the preset reference chip is determined.

[0098] The average curvature can be understood as the average value of the slope increase values ​​of each point on the curve (first calculate the slope of each point, and then calculate the slope increase value of each point).

[0099] In this embodiment, the calculated voltage difference, time difference and curvature difference can be directly used as the power-on characteristic data difference between the chip to be tested and the preset reference chip. The voltage difference, time difference and curvature difference can also be subjected to certain data processing, such as removing the maximum and minimum values, calculating the average value, etc., and then the processed data is used as the power-on characteristic data difference between the chip to be tested and the preset reference chip.

[0100] When determining whether the chip to be tested and the preset reference chip have the same characteristics based on the difference in characteristic data, it is possible to first determine whether the deviation between the voltage difference and the reference stable voltage, the deviation between the time difference and the reference stable time, and the difference between the curvature difference and the reference average curvature are all less than or equal to a second preset threshold; if so, it is determined that the chip to be tested and the preset reference chip have the same characteristics; if not, it is determined that the chip to be tested and the preset reference chip do not have the same characteristics.

[0101] This embodiment combines the final pull-up stable voltage of the power output pin (V1) of the test chip, the power-on stabilization time, and the average scatter curvature of the power-on process to determine that the chip under test and the preset reference chip do not have the same characteristics, which can greatly improve the accuracy of the differentiation detection and reduce the misjudgment and missed judgment of traditional methods.

[0102] This embodiment calculates and compares the chip based on the voltage difference, time difference and curvature difference, which greatly improves the accuracy of testing the chip compared to traditional solutions.

[0103] The following is combined with Figure 11 Taking the identification and detection of chip from manufacturer A as an example, the process of chip detection based on TV curve is introduced in detail. Figure 11As shown, the TV curve of the chip from manufacturer M can be tested first, used as the reference TV curve, and then the TV test curve of the chip under test can be tested. The calculation of the power-on characteristic data difference is then performed. Specifically, the following steps are performed: First, the difference Vx between the power-on stability voltage of the chip under test and the reference stability voltage V0 is calculated; second, the difference Tx between the power-on stability time of the chip under test and the reference stability time T0 is calculated; third, the difference Ax between the average curvature of the chip under test and the reference average curvature is calculated; and fourth, if the deviations of Vx, Tx, and Ax relative to the reference parameters are all within a second preset threshold (e.g., 10%, 15%, etc.), the chip is determined to belong to the same manufacturer; otherwise, it belongs to different manufacturers.

[0104] Based on the same concept as above, this embodiment also provides a chip detection device, which is based on a preset detection circuit. The preset detection circuit includes a chip interface, a pull-up resistor, and a power interface connected in sequence. The chip interface is used to connect to the chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer. The device includes:

[0105] The characteristic detection module is used to detect the characteristic data to be tested presented by the chip under test during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters;

[0106] The result determination module is used to determine whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and the corresponding characteristic data of the preset reference chip.

[0107] The chip detection device provided in this embodiment is based on the same concept as the above-mentioned chip detection method, so it can at least achieve the above-mentioned beneficial effects, and any of the above-mentioned implementation methods can be applied to the chip detection device provided in this embodiment, which will not be repeated here.

[0108] The present application also provides an electronic device to perform the above chip detection method. Figure 12 , which shows a schematic diagram of an electrical device provided by some embodiments of the present application. Figure 12 As shown, the electrical device 40 includes: a processor 400, a memory 401, a bus 402 and a communication interface 403. The processor 400, the communication interface 403 and the memory 401 are connected through the bus 402; the memory 401 stores a computer program that can be run on the processor 400, and when the processor 400 runs the computer program, it executes the chip detection method provided in any of the aforementioned embodiments of the present application.

[0109] The memory 401 may include high-speed random access memory (RAM) and may also include non-volatile memory, such as at least one disk storage. The communication connection between the device network element and at least one other network element is achieved through at least one communication interface 403 (which may be wired or wireless), and may use the Internet, a wide area network, a local area network, a metropolitan area network, etc.

[0110] Bus 402 may be an ISA bus, a PCI bus, or an EISA bus. Buses may be classified as address buses, data buses, and control buses. Memory 401 is used to store programs, and processor 400 executes the programs upon receiving execution instructions. The chip detection method disclosed in any of the aforementioned embodiments of the present application may be applied to or implemented by processor 400.

[0111] The processor 400 may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method can be completed by hardware integrated logic circuits in the processor 400 or by software instructions. The above processor 400 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), an off-the-shelf field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in conjunction with the embodiments of this application can be directly implemented and executed by a hardware decoding processor, or by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium mature in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, etc. The storage medium is located in the memory 401 , and the processor 400 reads the information in the memory 401 and completes the steps of the above method in combination with its hardware.

[0112] The electrical equipment provided in the embodiment of the present application and the chip detection method provided in the embodiment of the present application are based on the same inventive concept and have the same beneficial effects as the methods adopted, operated or implemented therein.

[0113] The present application also provides a computer-readable storage medium corresponding to the chip detection method provided in the above embodiment. Figure 13The computer-readable storage medium shown is a CD 30 on which a computer program (ie, a program product) is stored. When the computer program is run by a processor, it executes the chip detection method provided by any of the aforementioned embodiments.

[0114] It should be noted that examples of computer-readable storage media may also include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other optical or magnetic storage media, which are not listed here one by one.

[0115] The computer-readable storage medium provided in the above-mentioned embodiments of the present application and the chip detection method provided in the embodiments of the present application are based on the same inventive concept and have the same beneficial effects as the methods adopted, run or implemented by the application programs stored therein.

[0116] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some or all of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. A chip detection method, characterized in that: Based on a preset detection circuit, the preset detection circuit includes a chip interface, a pull-up resistor and a power interface connected in sequence, the chip interface is used to access the chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer; the method includes: Detecting characteristic data to be tested presented by the chip to be tested during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters; determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of the preset reference chip; The characteristic data to be tested includes at least one of IV characteristic data and power-on characteristic data; the IV characteristic data is used to characterize the correspondence between the current passing through the pull-up resistor and the first voltage output by the power interface when the chip to be tested is loaded with different input voltages; the power-on characteristic data is used to characterize the correspondence between the stabilization time of the stable voltage output by the chip interface and the stable voltage when the power interface outputs a fixed first voltage.

2. The method according to claim 1, characterized in that Determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of the preset reference chip includes: Determining a difference between the characteristic data of the chip to be tested and the preset reference chip based on the characteristic data to be tested and corresponding characteristic data of a preset reference chip; According to the characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

3. The method according to claim 1, characterized in that Detecting the characteristic data to be tested presented by the chip to be tested during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters, including: In the process of the single chip microcomputer providing different voltages to the preset detection circuit, detecting first voltage values ​​corresponding to different supply voltages and current values ​​passing through the pull-up resistor; All detected first voltage values ​​and corresponding current values ​​are recorded as IV characteristic data to be measured, and the IV characteristic data to be measured is determined as characteristic data to be measured.

4. The method according to claim 3, characterized in that Determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of the preset reference chip includes: Determining a difference between the IV characteristic data of the chip to be tested and the preset reference chip based on the IV characteristic data to be tested and the IV characteristic data of a preset reference chip; According to the IV characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

5. The method according to claim 4, characterized in that Determining a difference between the IV characteristic data of the chip to be tested and the IV characteristic data of a preset reference chip according to the IV characteristic data to be tested and the IV characteristic data of a preset reference chip, comprising: determining an IV characteristic curve to be measured of the first voltage based on the IV characteristic data; The characteristic data difference between the chip to be tested and the preset reference chip is determined according to the IV characteristic curve to be tested and the reference IV characteristic curve of a preset reference chip.

6. The method according to claim 5, characterized in that Determining a characteristic data difference between the chip to be tested and the preset reference chip according to the IV characteristic curve to be tested and a reference IV characteristic curve of a preset reference chip, comprising: determining a difference curve according to an absolute value of a difference between a current value to be measured of the IV characteristic curve to be measured corresponding to each first voltage value and a reference current value of a reference IV characteristic curve; An integration result of the difference curve is determined as a characteristic data difference between the chip to be tested and the preset reference chip.

7. The method according to claim 4, characterized in that Determining whether the chip under test and the preset reference chip have the same characteristics according to the characteristic data difference includes: determining whether the characteristic data difference is less than or equal to a first preset threshold; If so, it is determined that the chip under test and the preset reference chip have the same characteristics; if not, it is determined that the chip under test and the preset reference chip do not have the same characteristics.

8. The method according to claim 1, characterized in that Detecting the characteristic data to be tested presented by the chip to be tested during the process of the single chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two groups of voltage-related characteristic parameters, including: In the process of the single chip microcomputer supplying power to the preset detection circuit and maintaining the power interface outputting a fixed first voltage, detecting the stable time to be measured and the stable voltage to be measured of the stable voltage output by the chip interface; The stable voltage to be measured and the stable time to be measured are recorded as power-on characteristic data to be measured, and the power-on characteristic data to be measured is determined as characteristic data to be measured.

9. The method according to claim 8, characterized in that Determining whether the chip to be tested and the preset reference chip have the same characteristics based on the characteristic data to be tested and corresponding characteristic data of the preset reference chip includes: Determining a difference between the power-on characteristic data of the chip to be tested and the preset reference chip according to the power-on characteristic data of the chip to be tested and the power-on characteristic data of the preset reference chip; According to the power-on characteristic data difference, it is determined whether the chip to be tested and the preset reference chip have the same characteristics.

10. The method according to claim 9, characterized in that Determining a difference between the power-up characteristic data of the chip to be tested and the power-up characteristic data of a preset reference chip according to the power-up characteristic data to be tested and the power-up characteristic data of a preset reference chip includes: Determining a power-on characteristic curve of the chip to be tested based on the stable voltage to be tested and the corresponding stable time to be tested; The power-on characteristic data difference between the chip to be tested and the preset reference chip is determined according to the power-on characteristic curve to be tested and the reference power-on characteristic curve of the preset reference chip.

11. The method according to claim 10, characterized in that Determining a power-on characteristic data difference between the chip to be tested and the preset reference chip according to the power-on characteristic curve to be tested and a reference power-on characteristic curve of a preset reference chip, comprising: Calculating, based on the power-on characteristic curve to be measured and the reference power-on characteristic curve, a voltage difference between the stable voltage to be measured and the reference stable voltage, a time difference between the stable time to be measured and the reference stable time, and a curvature difference between an average curvature to be measured and a reference average curvature of the power-on characteristic curve to be measured; Based on the voltage difference, the time difference, and the curvature difference, a power-on characteristic data difference between the chip to be tested and the preset reference chip is determined.

12. The method according to claim 11, characterized in that Determining whether the chip under test and the preset reference chip have the same characteristics according to the characteristic data difference includes: determining whether a deviation between the voltage difference and the reference stable voltage, a deviation between the time difference and the reference stable time, and a difference between the curvature difference and the reference average curvature are all less than or equal to a second preset threshold; If so, it is determined that the chip under test and the preset reference chip have the same characteristics; if not, it is determined that the chip under test and the preset reference chip do not have the same characteristics.

13. A chip detection device, characterized in that: Based on a preset detection circuit, the preset detection circuit includes a chip interface, a pull-up resistor and a power interface connected in sequence, the chip interface is used to access the chip to be tested, and the chip interface and the power interface are both connected to a single-chip microcomputer; the device includes: A characteristic detection module is configured to detect characteristic data to be tested presented by the chip under test during the process of the single-chip microcomputer supplying power to the preset detection circuit; the characteristic data to be tested includes at least two sets of voltage-related characteristic parameters; the characteristic data to be tested includes at least one of IV characteristic data and power-on characteristic data; the IV characteristic data is configured to characterize the corresponding relationship between the current passing through the pull-up resistor and the first voltage output by the power interface during the process of the chip under test being loaded with different input voltages; the power-on characteristic data is configured to characterize the corresponding relationship between the stabilization time and the stable voltage output by the chip interface when the power interface outputs a fixed first voltage; The result determination module is used to determine whether the chip to be tested and the preset reference chip have the same characteristics according to the characteristic data to be tested and the corresponding characteristic data of the preset reference chip.

14. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the method according to any one of claims 1 to 12 is implemented.

15. A computer-readable storage medium having a computer program stored thereon, characterized in that: The program is executed by a processor to implement the method according to any one of claims 1 to 12.

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