A millimeter-wave signal sampling circuit, method and device

Abstract

The present application discloses a millimeter-wave signal sampling circuit, method and device. The circuit includes a millimeter-wave chip, a PWM signal generating device and an ADC hardware module. The millimeter-wave chip includes a PosFlag signal output port and a millimeter-wave signal output port. The ADC hardware module includes a trigger signal input port and a sampling channel. The PosFlag signal output port is connected to the trigger signal input port and is used as an external trigger source for the ADC hardware module. The sampling channel is connected to the millimeter-wave signal output port and is used to sample the millimeter-wave signal. The PosFlag signal output port and the trigger signal input port are connected through an AND gate. The PosFlag output port signal and the PWM signal generating device are connected to the input end of the AND gate, and the trigger signal input port is connected to the output end of the AND gate. In the present application, the sampling consistency of the millimeter-wave signal is not affected due to the sharing of the ADC hardware module, the number of ADC hardware modules used in the system can be reduced, and the cost is reduced to a certain extent and the functional redundancy of the system is reduced.

Description

Technical Field

[0001] This application relates to the field of signal sampling, and in particular, to a millimeter-wave signal sampling circuit, method, and device. Background Art

[0002] Conventional millimeter-wave signal sampling is to sample the signal through an ADC hardware module, and then output the digital signal to the backend for relevant analysis or algorithm calculation to finally obtain relevant results. And the ADC hardware module here basically comes from the MCU, and the resources of the ADC are relatively scarce at a certain cost.

[0003] Since the millimeter-wave signal has extremely high requirements for the time consistency of each sampling, generally, an independent ADC hardware module is used for sampling its signal. And at this time, even if there are other signals with lower requirements for sampling time consistency that need to be sampled, another independent ADC hardware module has to be used for work, resulting in difficulties in MCU selection or redundancy in system function design.

[0004] Although some ADC hardware modules provide configuration options for injection channels and regular channels, sampling signals with high time consistency requirements through the injection channel and sampling general signals through the regular channel can solve the problem of sampling real-time performance. However, since the injection channel cannot perform continuous sampling, for signals such as millimeter-wave signals that require continuous sampling, it cannot be used, so two ADC hardware modules still need to be used for sampling.

[0005] Therefore, the above technical problems existing in the related technology need to be solved urgently. Summary of the Invention

[0006] This application aims to solve the technical problems in the related technology. To this end, embodiments of this application provide a millimeter-wave signal sampling circuit, method, and device, which can share an ADC hardware module to complete the sampling of two or more different signals.

[0007] According to an aspect of the embodiments of this application, a millimeter-wave signal sampling circuit is provided. The circuit includes a millimeter-wave chip, a PWM signal generating device, and an ADC hardware module. The millimeter-wave chip includes a PosFlag signal output port and a millimeter-wave signal output port. The ADC hardware module includes a trigger signal input port and a sampling channel;

[0008] The PosFlag signal output port is connected to the trigger signal input port and is used as an external trigger source for the ADC hardware module;

[0009] The sampling channel is connected to the millimeter-wave signal output port and is used to sample the millimeter-wave signal;

[0010] The PosFlag signal output port is connected to the trigger signal input port through a logic gate. The PosFlag output port signal and the PWM signal generating device are connected to the input end of the logic gate, and the trigger signal input port is connected to the output end of the logic gate.

[0011] In one embodiment, the PosFlag signal output port is an external trigger source, and sampling is performed through the PosFlag signal.

[0012] In one embodiment, the sampling through the PosFlag signal includes:

[0013] When the PosFlag signal is at a high level, it indicates the rising stage of the chirp, and when it is at a low level, it indicates the falling stage of the chirp. The ADC is triggered to sample through the rising edge or falling edge of the PosFlag signal.

[0014] In one embodiment, the sampling channel samples in the regular channel mode. When the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and the injection channel sampling is started.

[0015] In one embodiment, interrupting the current regular channel sampling and starting the injection channel sampling includes:

[0016] The PWM signal generating device outputs a PWM signal. The PWM signal and the PosFlag signal pass through the logic gate together and are then output to the trigger signal input port. The sampling frequency of the sampling channel is determined by the frequency of the PWM signal.

[0017] In one embodiment, the hard-triggering of the sampling of the millimeter-wave signal includes:

[0018] After the sampling channel receives a preset trigger signal, the sampling of the millimeter-wave signal is triggered. The preset trigger signal includes at least one of a high level, a low level, a rising edge, and a falling edge.

[0019] According to one aspect of the embodiments of the present application, a method for sampling millimeter-wave signals is provided. The method includes:

[0020] Detecting the sampling mode of the sampling channel;

[0021] When the sampling channel is in the regular channel mode, when the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and the injection channel sampling is started.

[0022] In one embodiment, interrupting the current regular channel sampling and starting the injection channel sampling includes:

[0023] Output a PWM signal, and output the PWM signal and the PosFlag signal to the trigger signal input port after passing through a logic gate, and determine the sampling frequency of the sampling channel according to the frequency of the PWM signal.

[0024] In one embodiment, the hard trigger is that: after the sampling channel receives a preset trigger signal, it triggers the millimeter-wave signal sampling, and the preset trigger signal includes at least one of high level, low level, rising edge, and falling edge.

[0025] According to one aspect of the embodiments of the present application, a millimeter-wave signal sampling device is provided, and the device includes:

[0026] A detection module, configured to detect the sampling mode of the sampling channel;

[0027] A switching module, configured to, when the sampling channel is in the regular channel mode, interrupt the current regular channel sampling and start the injection channel sampling when the millimeter-wave signal sampling is hard-triggered.

[0028] The beneficial effects of a millimeter-wave signal sampling circuit, method, and device provided by the embodiments of the present application are as follows: The circuit proposed in the present application includes a millimeter-wave chip, a PWM signal generating device, and an ADC hardware module. The millimeter-wave chip includes a PosFlag signal output port and a millimeter-wave signal output port, and the ADC hardware module includes a trigger signal input port and a sampling channel; the PosFlag signal output port is connected to the trigger signal input port and is used as an external trigger source for the ADC hardware module; the sampling channel is connected to the millimeter-wave signal output port and is used to sample the millimeter-wave signal; the PosFlag signal output port and the trigger signal input port are connected through a logic gate, the PosFlag output port signal and the PWM signal generating device are connected to the input end of the logic gate, and the trigger signal input port is connected to the output end of the logic gate. The sampling consistency of the millimeter-wave signal in the present application is not affected due to the shared use of the ADC hardware module, the number of ADC hardware modules used in the system can be reduced, and the cost and system function redundancy are reduced to a certain extent.

[0029] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. Description of the Drawings

[0030] To more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the accompanying drawings required for the description of the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0031] Figure 1 It is a circuit schematic diagram of a millimeter-wave signal sampling circuit provided by an embodiment of the present application;

[0032] Figure 2 It is a system circuit schematic diagram of a millimeter-wave signal sampling system provided by an embodiment of the present application;

[0033] Figure 3 It is a flowchart of a millimeter-wave signal sampling method provided by an embodiment of the present application;

[0034] Figure 4 It is a schematic diagram of a millimeter-wave signal sampling device provided by an embodiment of the present application. Detailed implementation manners

[0035] In order to enable those skilled in the art to better understand the solutions of the present application, the following will clearly and completely describe the technical solutions in the embodiments of the present application in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0036] The terms "first", "second", "third", "fourth", etc. in the specification, claims and drawings of the present application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products or devices.

[0037] Referring to "embodiment" herein means that a specific feature, structure or characteristic described in conjunction with the embodiment can be included in at least one embodiment of the present application. The phrase appears in various positions in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0038] Conventional millimeter-wave signal sampling is to sample the signal through an ADC hardware module, and then output the digital signal to the backend for relevant analysis or algorithm calculation to finally obtain relevant results. The ADC hardware module here basically comes from the MCU, and the resources of the ADC are relatively scarce at a certain cost.

[0039] Since millimeter-wave signals have extremely high requirements for the time consistency of each sampling, generally, a separate ADC hardware module is used for sampling the signals. At this time, even if there are other signals with lower requirements for sampling time consistency that need to be sampled, another separate ADC hardware module has to be used for operation, resulting in difficulties in MCU selection or redundancy in system function design.

[0040] Although some ADC hardware modules provide configuration options for injection channels and regular channels, by sampling signals with high time consistency requirements through the injection channel and sampling general signals through the regular channel, the problem of sampling real-time performance can be solved. However, since the injection channel cannot perform continuous sampling, for signals such as millimeter-wave signals that require continuous sampling, it cannot be used, so two ADC hardware modules still need to be used for sampling.

[0041] To solve the above problems, this application proposes a millimeter-wave signal sampling circuit, method and device.

[0042] Figure 1 As shown in the circuit schematic diagram of a millimeter-wave signal sampling circuit provided by an embodiment of this application, Figure 1 The millimeter-wave signal sampling circuit provided by the embodiment of this application includes a millimeter-wave chip, a PWM signal generating device and an ADC hardware module. The millimeter-wave chip includes a PosFlag signal output port and a millimeter-wave signal output port. The ADC hardware module includes a trigger signal input port and a sampling channel. The PosFlag signal output port is connected to the trigger signal input port and is used as an external trigger source for the ADC hardware module. The sampling channel is connected to the millimeter-wave signal output port and is used to sample the millimeter-wave signal. The PosFlag signal output port and the trigger signal input port are connected through an AND gate. The PosFlag output port signal and the PWM signal generating device are connected to the input end of the AND gate, and the trigger signal input port is connected to the output end of the AND gate.

[0043] In the millimeter-wave signal sampling circuit provided by the embodiment of the present application, the PosFlag signal output port is an external trigger source, and sampling is performed through the PosFlag signal. Specifically, sampling through the PosFlag signal includes: when the PosFlag signal is at a high level, it indicates the rising stage of the chirp, and when it is at a low level, it indicates the falling stage of the chirp. The ADC is triggered to sample through the rising edge or falling edge of the PosFlag signal.

[0044] It should be noted that for the ADC sampling of millimeter-wave signals, a hard-trigger mode is used and the injection channel mode is adopted; at the same time, the PosFlag signal output by the millimeter-wave chip and the PWM signal output by the MCU are output to the ADC sampling trigger pin after passing through an AND gate, and the ADC sampling is triggered by this signal, where the sampling frequency is determined by the PWM signal (the millimeter-wave signal here is only an example, and the invention is not limited to sampling only this one kind of signal). In this embodiment, the AND gate is used to make the signal output after the gate circuit consistent with the PWM signal. It should be noted that as long as the PosFlag signal and the PWM signal can be combined to make the signal output after the gate circuit consistent with the PWM signal, any type can be adopted (such as XOR gate, XNOR gate, NAND gate, etc.). The present specification does not make inappropriate limitations on the specific type of logic gate.

[0045] The sampling channel of this embodiment samples in the regular channel mode. When the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and the injection channel sampling is started. Interrupting the current regular channel sampling and starting the injection channel sampling specifically includes: the PWM signal generating device outputs a PWM signal, and the PWM signal and the PosFlag signal are output to the trigger signal input port after passing through an AND gate together, and the sampling frequency of the sampling channel is determined by the frequency of the PWM signal.

[0046] Optionally, the hard-triggering of the sampling of the millimeter-wave signal includes: after the sampling channel receives a preset trigger signal, the sampling of the millimeter-wave signal is triggered, and the preset trigger signal includes at least one of high level, low level, rising edge, and falling edge.

[0047] Specifically, taking the sampled signal as a millimeter-wave intermediate-frequency signal as an example, the operation process of the millimeter-wave sampling circuit proposed in this embodiment is as follows: The sampled signal is the intermediate-frequency signal output by the millimeter-wave chip (here the input signal is only an example and is not limited to this one type of signal), and is connected to the sampling channel of the ADC hardware module (here the sampling channel can be in the injection channel mode or the regular channel mode). The PosFlag signal of the millimeter-wave chip provides an indication externally and can represent which stage of a chirp the intermediate-frequency signal currently output by the millimeter-wave chip is in. A high level of PosFlag indicates the rising stage of the chirp, and a low level indicates the falling stage of the chirp; according to needs, PosFlag can be used as an external trigger source and connected to the trigger signal pin of the ADC hardware module to trigger the ADC to sample through its rising edge or falling edge.

[0048] Furthermore, when the ADC sampling channel is in the regular channel mode, since it already supports the function of continuous sampling itself, the AND gate and the PWM signal in Figure 1 can be omitted. When the ADC sampling channel is in the injection channel mode, since it only supports single sampling itself and only using the PosFlag signal cannot trigger the ADC to perform multiple samplings, therefore, in this embodiment, an external PWM signal is added. After passing through the AND gate together with the PosFlag signal, a signal is output to the trigger pin. At this time, the ADC sampling frequency is determined by the PWM frequency, so as to realize hard-trigger sampling of the millimeter-wave intermediate-frequency signal through an external signal and make it have high sampling consistency.

[0049] Exemplarily, for sampling by the same ADC hardware module, sampling is carried out sequentially in the regular channel mode. Assuming that channels 1 to 3 of the ADC hardware module are in the regular channel mode, if channel 1 is connected to the temperature sensor, channel 2 is connected to the humidity sensor, and channel 3 is connected to the millimeter-wave intermediate-frequency signal; in the regular channel mode, sampling must be carried out sequentially. At this time, when the hard-trigger signal arrives, it is impossible to determine which of channels 1 or 2 the current sampling is in, nor can it be determined at which moment during the sampling process, so it is impossible to ensure that the time for starting sampling of channel 3 is consistent each time; while using the injection channel to sample the millimeter-wave intermediate-frequency signal (for example, channel 4 is in the injection channel mode), when the hard-trigger arrives, the hardware will forcibly pause the sampling of the regular channel and switch to the injection channel for sampling, so the time consistency of starting sampling of channel 4 can be ensured.

[0050] Therefore, through the sampling circuit proposed in the above embodiment, it is possible to solve the situation where two independent ADC modules are required for sampling millimeter-wave signals and other signals with lower requirements for time consistency during millimeter-wave sampling, and it can effectively achieve sharing one ADC hardware module to complete the sampling of two different signals.

[0051] Meanwhile, this application proposes a continuous sampling method and circuit design for the injection channel mode sampling of the ADC hardware module.

[0052] Figure 2 The system circuit schematic diagram of a millimeter-wave signal sampling system provided by an embodiment of this application is shown in Figure 2 As shown, still taking the millimeter-wave intermediate-frequency signal as an example (this signal has high requirements for sampling consistency, and this signal will be referred to as the first signal to be sampled hereinafter), when other signals also need to be sampled in the system, but this signal has lower requirements for sampling consistency (this signal will be referred to as the second signal to be sampled hereinafter), such as temperature, humidity, etc.

[0053] The first signal to be sampled is still connected to the ADC hardware module in a Figure 1 circuit manner. At this time, the ADC hardware module in Figure 1 is the ADC controller inside the MCU in Figure 2 ; the PWM signal in Figure 1 is configured and output by the MCU timer in Figure 2 . The second signal to be sampled is connected to different sampling channels of the same ADC controller as the first signal to be sampled as shown in Figure 2 . Moreover, the sampling channel of the first signal to be sampled is in the injection channel mode, and the sampling channel of the second signal to be sampled is in the regular channel mode.

[0054] It should be noted that the second signal to be sampled can be triggered internally or externally, so as to enable the ADC controller to sample its signal. Due to the characteristics of the injection channel and the regular channel, when the trigger signal of the injection channel takes effect, the sampling of the regular channel will be immediately terminated and the injection channel sampling will start. Therefore, the sampling system and method of the present invention can use only one ADC controller to sample the first signal to be sampled and the second signal to be sampled, and ensure the sampling consistency of the first signal to be sampled. Through the sampling circuit of the present invention, when the injection channel mode is used in the sampling channel of the ADC controller, continuous sampling of signals such as millimeter-wave signals can still be performed and the consistency of the sampling time is ensured.

[0055] Through the sampling system and method of the above embodiment, the same ADC control can be used to sample the first signal to be sampled and the second signal to be sampled, effectively reducing the system cost and reducing the situation of system function redundancy.

[0056] Figure 3 The flowchart of a millimeter-wave signal sampling method provided by an embodiment of this application is shown in Figure 3 As shown, a millimeter-wave sampling method provided by this application includes:

[0057] S301. Detect the sampling mode of the sampling channel.

[0058] When the sampling channel is in the regular channel mode and the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and the injection channel sampling is started.

[0059] Optionally, interrupting the current regular channel sampling and starting the injection channel sampling in step S302 includes: outputting a PWM signal, passing the PWM signal and the PosFlag signal through an AND gate and then outputting to the trigger signal input port, and determining the sampling frequency of the sampling channel through the frequency of the PWM signal.

[0060] Specifically, the hard trigger in step S302 is: after the sampling channel receives a preset trigger signal, the millimeter-wave signal sampling is triggered, and the preset trigger signal includes at least one of high level, low level, rising edge, and falling edge.

[0061] The content in the above circuit embodiment is applicable to the method embodiment of the present application. The functions specifically implemented in the method embodiment of the present application are the same as those in the above circuit embodiment, and the beneficial effects achieved are also the same as those in the above circuit embodiment.

[0062] Figure 4 It is a schematic diagram of a millimeter-wave signal sampling device provided by an embodiment of the present application. As Figure 4 shown, a millimeter-wave signal sampling device provided in this embodiment includes:

[0063] A detection module 401, configured to detect the sampling mode of the sampling channel.

[0064] A switching module 402, configured to interrupt the current regular channel sampling and start the injection channel sampling when the sampling of the millimeter-wave signal is hard-triggered when the sampling channel is in the regular channel mode.

[0065] Similarly, the content in the above method embodiment is applicable to the device embodiment of the present application. The functions specifically implemented in the device embodiment of the present application are the same as those in the above method embodiment, and the beneficial effects achieved are also the same as those in the above method embodiment.

[0066] In some alternative embodiments, the functions / operations mentioned in the block diagram may not occur in the order mentioned in the operation diagram. For example, depending on the functions / operations involved, two consecutive blocks shown may actually be executed substantially simultaneously or the blocks can sometimes be executed in the reverse order. In addition, the embodiments presented and described in the flowcharts of the present application are provided by way of example for the purpose of providing a more comprehensive understanding of the technology. The disclosed method is not limited to the operations and logical flows presented herein. Alternative embodiments are contemplated, in which the order of various operations is changed and the sub-operations described as part of a larger operation are executed independently.

[0067] In addition, although the present application has been described in the context of functional modules, it should be understood that, unless otherwise stated to the contrary, one or more of the functions and / or features may be integrated in a single physical device and / or software module, or one or more functions and / or features may be implemented in separate physical devices or software modules. It should also be understood that a detailed discussion of the actual implementation of each module is not necessary for understanding the present application. Rather, given the attributes, functions, and internal relationships of the various functional modules in the devices disclosed herein, the actual implementation of the modules will be understood within the ordinary skills of an engineer. Thus, those skilled in the art can implement the present application as set forth in the claims without undue experimentation. It should also be understood that the specific concepts disclosed are merely illustrative and are not intended to limit the scope of the present application, which is determined by the full scope of the appended claims and their equivalents.

[0068] If a function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of the various embodiments of the present application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs.

[0069] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in conjunction with these instruction execution systems, apparatuses, or devices.

[0070] It should be understood that each part of the present application can be implemented by hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits having logic gate circuits for implementing logical functions on data signals, application specific integrated circuits having appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.

[0071] In the above description of this specification, the descriptions referring to the terms "one embodiment / example", "another embodiment / example", or "certain embodiments / examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0072] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and purposes of the present application, and the scope of the present application is defined by the claims and their equivalents.

[0073] The above, the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present application.

Claims

1. A millimeter-wave signal sampling circuit, characterized in that The circuit includes a millimeter-wave chip, a PWM signal generating device, and an ADC hardware module. The millimeter-wave chip includes a PosFlag signal output port and a millimeter-wave signal output port. The ADC hardware module includes a trigger signal input port and sampling channels; The PosFlag signal output port is connected to the trigger signal input port and is used as an external trigger source for the ADC hardware module; The sampling channels are connected to the millimeter-wave signal output port and are used to sample the millimeter-wave signal; The PosFlag signal output port and the trigger signal input port are connected through a logic gate. The PosFlag output port signal and the PWM signal generating device are connected to the input end of the logic gate, and the trigger signal input port is connected to the output end of the logic gate. Among them, the PosFlag signal output port is an external trigger source. The PosFlag signal being at a high level indicates the rising stage of the chirp, and a low level indicates the falling stage of the chirp. The ADC is triggered to sample through the rising edge or falling edge of the PosFlag signal; The first sampled signal with high requirements for sampling consistency is connected to the ADC hardware module. The PWM signal is configured and output by the MCU timer. The second sampled signal with lower requirements for sampling consistency is connected to different sampling channels of the ADC hardware module. The sampling channel of the first sampled signal is in the injection channel mode, and the sampling channel of the second sampled signal is in the regular channel mode; When the ADC sampling channel is in the regular channel mode, the AND gate and the PWM signal are omitted; When the ADC sampling channel is in the injection channel mode, the signal output to the trigger pin after the PosFlag signal and the PWM signal pass through the AND gate. The ADC sampling frequency is determined by the frequency of the PWM signal; 2. The millimeter-wave signal sampling circuit according to claim 1, wherein The sampling channels sample in the regular channel mode. When the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and injection channel sampling is started.

3. The millimeter-wave signal sampling circuit according to claim 2, characterized in that, Interrupting the current regular channel sampling and starting injection channel sampling includes: The PWM signal generating device outputs a PWM signal. The PWM signal and the PosFlag signal pass through the logic gate together and are output to the trigger signal input port. The sampling frequency of the sampling channels is determined by the frequency of the PWM signal; 4. The millimeter-wave signal sampling circuit according to claim 2, wherein, The hard-triggering of the sampling of the millimeter-wave signal includes: After the sampling channels receive a preset trigger signal, the sampling of the millimeter-wave signal is triggered. The preset trigger signal includes at least one of a high level, a low level, a rising edge, and a falling edge; 5. A millimeter-wave signal sampling method, characterized in that A method for sampling a millimeter-wave signal is applied to a millimeter-wave signal sampling circuit according to any one of claims 1-4. The method includes: Detecting the sampling mode of the sampling channels according to the sampling consistency requirements; When the sampling channels are in the regular channel mode, when the sampling of the millimeter-wave signal is hard-triggered, the current regular channel sampling is interrupted and injection channel sampling is started.

6. A millimeter-wave signal sampling method according to claim 5, characterized in that Interrupting the current regular channel sampling and starting injection channel sampling includes: Output a PWM signal, and make the PWM signal pass through a logic gate together with the PosFlag signal and then output to the trigger signal input port, and determine the sampling frequency of the sampling channel according to the frequency of the PWM signal.

7. A millimeter-wave signal sampling method according to claim 5, characterized in that, The hard trigger is: after the sampling channel receives a preset trigger signal, it triggers the millimeter-wave signal sampling, and the preset trigger signal includes at least one of high level, low level, rising edge and falling edge.

8. A millimeter-wave signal sampling device, characterized in that, The millimeter-wave signal sampling device includes a millimeter-wave signal sampling circuit according to any one of claims 1-4, and the device includes: A detection module, configured to detect the sampling mode of the sampling channel according to the sampling consistency requirement; A switching module, configured to, when the sampling channel is in the regular channel mode and the sampling of the millimeter-wave signal is hard-triggered, interrupt the current regular channel sampling and start the injection channel sampling.

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