A Server Board I / O Port Logic Function Testing Device and Method

Abstract

The present invention provides a test device for the logical function of the I / O ports of a server board. The test signal output end of the test control module is correspondingly communicatively connected to one end of a signal output probe through an isolation module, and the other end of the signal output probe is communicatively connected to the signal input end of the board under test. The test signal input end of the test control module is correspondingly communicatively connected to one end of a signal acquisition probe through an isolation module, and the other end of the signal acquisition probe is communicatively connected to the signal output end of the board under test. The test control module is used to select a corresponding test scheme according to the test mode selected by the user, and perform logical function tests on the I / O ports of the board under test through the signal probe module and the isolation module. The present invention also provides a method for testing the logical function of the I / O ports of a server board, which effectively improves the efficiency of testing the logical function of the I / O ports of a server board and reduces the cost of testing the logical function of the I / O ports of a server board.

Description

Technical Field

[0001] The present invention relates to the field of server board testing, and in particular to a server board I / O port logic function testing device and method. Background Art

[0002] In the design of servers, it is required that the server can run reliably for a long time, have a strong I / O (input / output) external data throughput capacity, and better scalability, etc. Therefore, higher requirements are put forward for the hardware design of each server board, that is, it is necessary to ensure the realization of these requirements in design and verify whether our design meets the indicators. There may be potential problems in the server design stage, which cannot be seen only from the surface. Each module circuit must be tested specifically to nip the problems in the bud. Therefore, testing is an indispensable part of the entire server design cycle. Therefore, in the case of meeting standards and the actual environment, the hardware testing work needs to develop more accurate, fast, and efficient testing methods and tools.

[0003] Currently, the logic function testing of the I / O ports of server boards mainly relies on instruments such as multimeters, oscilloscopes, and signal generators. For example, a signal is input to a specific I / O port of the server board, and it is tested whether the corresponding hardware module in the board can output the corresponding value according to the preset logic program. At this time, it is necessary to use a signal generator to output a signal to a specific I / O port (logic function input port), and the oscilloscope probe is connected to the logic function output port to test this logic function.

[0004] Although using a signal generator and an oscilloscope can more accurately obtain data such as the voltage value and signal ramp time of the port under test, for the response time of the I / O port logic input and output functions of the hardware module in the board, and the testing of server boards including multiple ports, etc., a large number of instruments and human resources are required, which is not conducive to improving the efficiency of the logic function testing of the I / O ports of server boards and reducing the cost of the logic function testing of the I / O ports of server boards. Summary of the Invention

[0005] In order to solve the problems existing in the prior art, the present invention innovatively proposes a server board I / O port logic function testing device and method, which effectively solves the problems of high cost and low efficiency of the logic function testing of the I / O ports of server boards caused by the prior art, effectively improves the efficiency of the logic function testing of the I / O ports of server boards, and reduces the cost of the logic function testing of the I / O ports of server boards.

[0006] In the first aspect of the present invention, a logic function test device for I / O ports of a server board is provided, which is used to perform logic function tests on multiple I / O ports of the server board, including: a signal probe module, an isolation module, and a test control module. The signal probe module includes multiple signal output probes and multiple signal acquisition probes. The test signal output end of the test control module is correspondingly communicatively connected to one end of the signal output probe through the isolation module. The other end of the signal output probe is communicatively connected to the signal input end of the server board to be tested. The test signal input end of the test control module is correspondingly communicatively connected to one end of the signal acquisition probe through the isolation module. The other end of the signal acquisition probe is communicatively connected to the signal output end of the server board to be tested. The test control module is used to select a corresponding test scheme according to the test mode selected by the user, and perform logic function tests on the I / O ports of the server board to be tested through the signal probe module and the isolation module.

[0007] Optionally, it further includes a first connector. One end of the first connector is communicatively connected to the signal probe module, and the other end is communicatively connected to the test control module through the isolation module.

[0008] Optionally, it further includes a power controller. The power controller is communicatively connected to the test control module and is used to output a corresponding test voltage value to the isolation module according to the test voltage instruction of the test control module, where the test voltage instruction is jointly determined according to the server board to be tested and the test mode.

[0009] Furthermore, it further includes a jumper cap. The jumper cap is arranged between the power controller and the isolation module and is used to adjust the test voltage value output to the isolation module according to the test voltage instruction of the test control module.

[0010] Optionally, it further includes a storage module. The storage module is communicatively connected to the test control module and is used to save the test data sent by the test control module.

[0011] Optionally, it further includes a keyboard or a DIP switch. The keyboard or the DIP switch is communicatively connected to the test mode control end of the test control module and is used to obtain the test mode input by the user. According to the test mode input by the user, a corresponding test scheme is selected to perform logic function tests on the I / O ports of the server board to be tested.

[0012] Optionally, it further includes a host computer. The host computer is communicatively connected to the test control module and is used to obtain the test data sent by the test control module.

[0013] Furthermore, it further includes a second connector. One end of the second connector is communicatively connected to the test control module, and the other end is communicatively connected to the host computer.

[0014] Optionally, the logic function test includes performing an error reporting function test on the error reporting function of the hardware module circuit in the server board to be tested, performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board to be tested, and performing a communication function test on the data communication function of the hardware module in the server board to be tested.

[0015] The second aspect of the present invention provides a method for testing the logic function of the I / O ports of a server board, which is implemented based on the testing device for the logic function of the I / O ports of a server board described in the first aspect of the present invention, and includes:

[0016] The test control module selects a corresponding logic function test scheme according to the test mode selected by the user;

[0017] The test control module sequentially outputs the test signals generated according to the logic function test scheme to the signal input end of the server board to be tested through the isolation module and the signal output probe;

[0018] The test control module sequentially obtains the test feedback signals output by the server board to be tested through the signal acquisition probe and the isolation module;

[0019] The test control module outputs the test results according to the test feedback signals output by the server board to be tested and the test signals generated according to the logic function test scheme.

[0020] The technical solutions adopted by the present invention include the following technical effects:

[0021] 1. In the technical solution of the present invention, a signal generator, an oscilloscope, etc. are integrated in the test device. Through the signal probe module including multiple signal output probes and multiple signal acquisition probes and the test control module, the test of the server board including multiple I / O ports can be realized, effectively solving the problems of high cost and low efficiency in the logic function test of the I / O ports of the server board caused by the prior art, effectively improving the efficiency of the logic function test of the I / O ports of the server board, and reducing the cost of the logic function test of the I / O ports of the server board.

[0022] 2. In the technical solution of the present invention, the power controller is communicatively connected to the test control module and is used to output a test voltage with a corresponding value to the isolation module according to the test voltage instruction of the test control module. Among them, the test voltage instruction is jointly determined according to the server board to be tested and the test mode, so that the test device can be compatible with the logic function test requirements of the I / O ports of server boards with different voltage ranges.

[0023] 3. In the technical solution of the present invention, the test voltage value output to the isolation module can also be adjusted through the jumper cap according to the test voltage instruction of the test control module, so that the test device can be compatible with the logic function test requirements of the I / O ports of server boards with different voltage ranges.

[0024] 4. The technical solution of the present invention further includes a storage module, which can save the test data sent by the test control module and store the tested data in Flash (flash memory), enabling the test device to have the functions of data storage and non-loss of data during power-off.

[0025] 5. The technical solution of the present invention further includes a keyboard, which can obtain the test mode input by the user and select the corresponding test scheme according to the test mode input by the user to perform logical function tests on the I / O ports of the server board to be tested, improving the flexibility of the logical function test of the server board I / O ports.

[0026] 6. The technical solution of the present invention further includes a host computer, which can obtain the test data sent by the test control module and has functions such as viewing real-time test data and data export.

[0027] 7. The logical function test in the technical solution of the present invention can include error function tests on the error reporting functions of the hardware module circuits in the server board to be tested, control function tests on the peripheral circuit control functions of the hardware module circuits in the server board to be tested, and communication function tests on the data communication functions of the hardware modules in the server board to be tested, improving the comprehensiveness of the logical function test of the server board I / O ports.

[0028] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0030] Figure 1 It is a schematic structural diagram of the device in the first embodiment of the present invention;

[0031] Figure 2 It is a schematic flowchart of the method in the second embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0032] To clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific embodiments and in conjunction with its accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, the components and settings of specific examples are described below. In addition, the present invention may repeat reference numerals and / or letters in different examples. This repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. It should be noted that the components illustrated in the drawings are not necessarily drawn to scale. The present invention omits the description of well-known components, processing technologies, and processes to avoid unnecessarily limiting the present invention.

[0033] Embodiment 1

[0034] As Figure 1 shown, the present invention provides a server board I / O port logic function test device for performing logic function tests on multiple I / O ports of a server board, including: a signal probe module 1, an isolation module 2, and a test control module 3. The signal probe module includes a plurality of signal output probes 11 and a plurality of signal acquisition probes 12. The test signal output end of the test control module 3 is correspondingly communicatively connected to one end of the signal output probe 11 through the isolation module 2. The other end of the signal output probe 11 is communicatively connected to the signal input end of the server board 4 to be tested. The test signal input end of the test control module 3 is correspondingly communicatively connected to one end of the signal acquisition probe 12 through the isolation module 2. The other end of the signal acquisition probe 12 is communicatively connected to the signal output end of the server board 4 to be tested. The test control module 3 is used to select a corresponding test scheme according to the test mode selected by the user, and perform logic function tests on the I / O ports of the server board 4 to be tested through the signal probe module 1 and the isolation module 2.

[0035] Furthermore, a server board I / O port logic function test device in Embodiment 1 of the present invention further includes a first connector 51 (connector1). One end of the first connector 51 is communicatively connected to the signal probe module 1 through a cable, and the other end is communicatively connected to the test control module 3 through the isolation module 2.

[0036] In this embodiment, the test control module can use a single-chip microcomputer as the core controller. The I / O and other resources of the single-chip microcomputer itself are used to implement the input and output of signals. And a preset program can be embedded into the single-chip microcomputer to achieve test process control, data processing (that is, in the embedded program, the I / O pins of the test control module are given input or output functions. For example, a specific I / O pin of the test control module can be set as an input pin, and a single high or low level digital signal can be collected, or a section of high and low level digital signals can be collected. At the same time, there is an algorithm formula for encoding and decoding digital signals in the program to process the collected signals, and the processed signals are converted into the data we need and output; for example, a specific I / O pin of the test control module can be set as an output pin, and the generated single high or low level digital signal can be output to the signal output probe through the isolation module), data storage and other functions.

[0037] The isolation module (OCEP) realizes the interface isolation between the test control module and the signal probe module (probe). The isolation module can be specifically implemented by an optocoupler. That is, an optocoupler with a wide voltage working range is added between the test control module and the signal probe module, and the optoelectronic isolation of the interface between the test control module and the test control module can be realized.

[0038] Preferably, a server board I / O port logic function test device in the first embodiment further includes a power controller 61. The power controller 61 is communicatively connected to the test control module 3 and is used to output a test voltage with a corresponding value to the isolation module 2 according to the test voltage instruction of the test control module 3. Among them, the test voltage instruction is jointly determined according to the server board 4 to be tested and the test mode. Specifically, different server boards to be tested correspond to different test voltage values, and the test voltage values corresponding to different test modes (corresponding to different test schemes) of the same server board to be tested may also be different. Therefore, in this embodiment, the value of the voltage output to the isolation module 2 is jointly determined by the server board to be tested and the test module. While performing optoelectronic isolation, the working voltage of the optocoupler is selected through the voltage controller 61, so that the test device can be compatible with the test requirements of the I / O port logic functions of boards with different voltage ranges.

[0039] Furthermore, a server board I / O port logic function test device in the first embodiment further includes a jumper cap 62. The jumper cap 62 is arranged between the power controller 61 and the isolation module 2 and is used to manually adjust the value of the test voltage output to the isolation module 2 according to the test voltage instruction of the test control module 3, so that the test device can be compatible with the test requirements of the I / O port logic functions of boards with different voltage ranges.

[0040] Further, a server board I / O port logic function test device in the first embodiment of the present invention further includes a storage module 7 (flash). The storage module 7 is communicatively connected to the test control module 3 and is used to save the test data sent by the test control module 3. By mounting a Flash around the test control module 3, the tested data can be stored in the Flash, enabling the tooling to have the functions of data storage and non-loss of data during power-off. Moreover, the test control module 3 can read the data in the Flash.

[0041] Further, a server board I / O port logic function test device in the first embodiment of the present invention further includes a keyboard 81 (Key Board / DIP) or a DIP switch 82. The keyboard 81 or the DIP switch 82 is communicatively connected to the test mode control terminal of the test control module 3 and is used to obtain the test mode input by the user. According to the test mode input by the user, a corresponding test scheme is selected to perform a logic function test on the I / O port of the server board 4 to be tested.

[0042] Further, a server board I / O port logic function test device in the first embodiment of the present invention further includes a host computer 9. The host computer 9 is communicatively connected to the test control module 3 and is used to obtain the test data sent by the test control module 3. The test control module 3 is equipped with a serial communication interface and can be connected to the host computer 9 through a cable. Through the host computer 9, functions such as viewing real-time test data and data export can be achieved, and the test mode (corresponding test scheme) can also be selected through the host computer 9.

[0043] Further, a server board I / O port logic function test device in the first embodiment of the present invention further includes a second connector 52. One end of the second connector 52 is communicatively connected to the test control module 3, and the other end is communicatively connected to the host computer 9 through a cable.

[0044] Specifically, the logic function test may include performing an error reporting function test on the error reporting function of the hardware module circuit in the server board to be tested, performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board to be tested, and performing a communication function test on the data communication function of the hardware module in the server board to be tested. Specifically, the test mode selection can be to build multiple sets of test schemes in the test control module to meet different test scenarios. For example, 1. performing an error reporting function test on the error reporting function of the hardware module circuit in the server board to be tested; 2. performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board to be tested; 3. performing a communication function test on the data communication function (parallel data input, feedback signal output) of the hardware module in the server board to be tested. The selection of the test mode can be made through the keyboard 81 or the DIP switch 82 on the test device, and can also be made through the host computer 9.

[0045] The technical solution of the present invention integrates a digital signal generator and a sampling device (oscilloscope) into a tooling, and only one device is required for the entire test process; different program flows pre-embedded in the program represent different test modes, and the test modes can be switched; different test modes (different test schemes) can be used for different logical function tests of different server boards to be tested. Specifically, a database or data table can be set in the test control module to store the correspondence between the server boards to be tested, the types of logical function tests (such as error reporting function tests, control function tests, communication function tests, etc.), the test timing requirements (triggering one or more I / O ports according to a specific timing or automatically performing long-term periodic I / O port logical function tests), and the test modes and test schemes. Among them, the test modes and test schemes correspond one by one, and the test mode or test scheme is jointly determined by the server board to be tested, the type of logical function test, and the test timing requirements. In the test mode selection, the user can either directly specify the test mode corresponding to the test scheme or input the server board to be tested, the type of logical function test, and the test timing requirements. The test control module determines the corresponding test mode according to the server board to be tested, the type of logical function test, and the test timing requirements input by the user, and then determines the corresponding test scheme to be called according to the corresponding test mode, so as to improve the flexibility and comprehensiveness of different types of logical function tests with different test timing requirements for the I / O ports of different server boards. Further, the test modes and the corresponding test schemes in the test control module support regular or irregular updates, which is convenient for timely updating the test modes and test schemes according to factors such as the server boards to be tested, the types of logical function tests, and the test timing requirements, thereby improving the flexibility of the logical function test of the I / O ports of the server boards.

[0046] In the technical solution of the present invention, a signal generator, an oscilloscope, etc. are integrated into the test device. Through a signal probe module including a plurality of signal output probes and a plurality of signal collection probes and a test control module, the test of a server board including a plurality of I / O ports can be realized, effectively solving the problems of high cost and low efficiency of the logical function test of the I / O ports of the server board caused by the prior art, effectively improving the efficiency of the logical function test of the I / O ports of the server board, and reducing the cost of the logical function test of the I / O ports of the server board.

[0047] In the technical solution of the present invention, a power controller is communicatively connected to the test control module and is used to output a test voltage with a corresponding value to the isolation module according to the test voltage instruction of the test control module. Among them, the test voltage instruction is jointly determined according to the server board to be tested and the test mode, so that the test device can be compatible with the logical function test requirements of the I / O ports of server boards with different voltage ranges.

[0048] In the technical solution of the present invention, the test voltage value output to the isolation module can also be adjusted through a jumper cap according to the test voltage instruction of the test control module, so that the test device can be compatible with the test requirements of the I / O port logic functions of server boards with different voltage ranges.

[0049] The technical solution of the present invention further includes a storage module, which can save the test data sent by the test control module and store the tested data in Flash (flash memory), enabling the test device to have the functions of data storage and non-loss of data during power-off.

[0050] The technical solution of the present invention further includes a keyboard, which can obtain the test mode input by the user and select the corresponding test plan according to the test mode input by the user to perform logic function tests on the I / O ports of the server board to be tested, improving the flexibility of the logic function tests of the I / O ports of the server board.

[0051] The technical solution of the present invention further includes a host computer, which can obtain the test data sent by the test control module and has functions such as viewing real-time test data and data export.

[0052] The logic function tests in the technical solution of the present invention can include error function tests on the error reporting functions of the hardware module circuits in the server board to be tested, control function tests on the peripheral circuit control functions of the hardware module circuits in the server board to be tested, and communication function tests on the data communication functions of the hardware modules in the server board to be tested, improving the comprehensiveness of the logic function tests of the I / O ports of the server board.

[0053] Embodiment 2

[0054] As Figure 2 shown, the technical solution of the present invention also provides a method for testing the logic functions of the I / O ports of a server board, which is implemented based on a test device for the logic functions of the I / O ports of a server board in Embodiment 1 and includes:

[0055] S1. The test control module selects the corresponding logic function test plan according to the test mode selected by the user;

[0056] S2. The test control module sequentially outputs the test signals generated according to the logic function test plan to the signal input end of the server board to be tested through the isolation module and the signal output probe;

[0057] S3. The test control module sequentially obtains the test feedback signals output by the server board to be tested through the signal acquisition probe and the isolation module;

[0058] S4. The test control module outputs the test result according to the test feedback signals output by the server board to be tested and the test signals generated according to the logic function test plan.

[0059] Among them, in step S1, specifically, the logic function test may include performing an error reporting function test on the error reporting function of the hardware module circuit in the server board under test, performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board under test, and performing a communication function test on the data communication function of the hardware module in the server board under test. Specifically, the test mode selection may be to build multiple sets of test schemes in the test control module to meet different test scenarios. For example, 1. performing an error reporting function test on the error reporting function of the hardware module circuit in the server board under test; 2. performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board under test; 3. performing a communication function test on the data communication function (parallel data input, feedback signal output) of the hardware module in the server board under test. The selection of the test mode can be made through the keyboard 81 or the DIP switch 82 on the test device, and can also be made through the host computer 9.

[0060] The technical solution of the present invention integrates a digital signal generator and a sampling device (oscilloscope) into a tooling, and only one device is required for the entire test process; different program flows pre-embedded in the program represent different test modes, and the test modes can be switched; different test modes (different test schemes) can be different logic function tests for different server boards under test. Specifically, a database or data table can be set in the test control module to store the correspondence between the server board under test, the type of logic function test (such as error reporting function test, control function test, communication function test, etc.), the test timing requirements (triggering one or more I / O ports according to a specific timing or automatically performing a long-term periodic I / O port logic function test), and the test mode and test scheme. Among them, the test mode and the test scheme are in one-to-one correspondence, and the test mode or test scheme is jointly determined by the server board under test, the type of logic function test, and the test timing requirements. In the test mode selection, the user can either directly specify the test mode corresponding to the test scheme or input the server board under test, the type of logic function test, and the test timing requirements. The test control module determines the corresponding test mode according to the server board under test, the type of logic function test, and the test timing requirements input by the user, and then determines the corresponding test scheme to be called according to the corresponding test mode, so as to improve the flexibility and comprehensiveness of different types of logic function tests with different test timing requirements for the I / O ports of different server boards. Further, the test mode and the corresponding test scheme in the test control module support regular or irregular updates, so as to be able to update the test mode and the test scheme in a timely manner according to factors such as the server board under test, the type of logic function test, and the test timing requirements, improving the flexibility of the I / O port logic function test of the server board.

[0061] In steps S2 - S4, the test control module sequentially outputs the test signals generated according to the logic function test scheme to the signal input end of the server board under test through the isolation module and the signal output probe; the test control module sequentially obtains the test feedback signals output by the server board under test through the signal acquisition probe and the isolation module; and the test result is output based on the test feedback signals output by the server board under test and the test signals generated according to the logic function test scheme. If the test control module can receive the test feedback signals (function normal or function abnormal) of the server board under test, it indicates that the test result of the logic function test of the I / O ports of the server board under test (such as error reporting function test, control function test, communication function test, etc.) is normal. Further, if the test timing requirement is long - term periodic testing or testing according to a specified timing, whether the test control module can receive the test feedback signals of the server board under test periodically or according to the corresponding specified timing (which can be delayed by a certain period compared with the signal sending period or the specified timing) indicates that the test result of the logic function test of the I / O ports of the server board under test (such as error reporting function test, control function test, communication function test, etc.) is normal. Otherwise, it indicates that the test fails.

[0062] In the technical solution of the present invention, a signal generator, an oscilloscope, etc. are integrated into the test device. Through the signal probe module including multiple signal output probes and multiple signal acquisition probes and the test control module, the test of the server board including multiple I / O ports can be realized, effectively solving the problems of high cost and low efficiency in the logic function test of the I / O ports of the server board caused by the prior art, effectively improving the efficiency of the logic function test of the I / O ports of the server board, and reducing the cost of the logic function test of the I / O ports of the server board.

[0063] In the technical solution of the present invention, the power controller is communicatively connected to the test control module and is used to output a test voltage with a corresponding value to the isolation module according to the test voltage instruction of the test control module, where the test voltage instruction is jointly determined according to the server board under test and the test mode, enabling the test device to be compatible with the logic function test requirements of the I / O ports of server boards with different voltage ranges.

[0064] In the technical solution of the present invention, the test voltage value output to the isolation module can also be adjusted through a jumper cap according to the test voltage instruction of the test control module, enabling the test device to be compatible with the logic function test requirements of the I / O ports of server boards with different voltage ranges.

[0065] The technical solution of the present invention further includes a storage module, which can save the test data sent by the test control module and can store the tested data in Flash (flash memory), enabling the test device to have the functions of data storage and non - loss of data during power - off.

[0066] The technical solution of the present invention further includes a keyboard, which can obtain the test mode input by the user. According to the test mode input by the user, the corresponding test solution is selected to perform a logic function test on the I / O ports of the server board to be tested, improving the flexibility of the logic function test of the server board I / O ports.

[0067] The technical solution of the present invention further includes a host computer, which can obtain the test data sent by the test control module and has functions such as viewing real-time test data and data export.

[0068] The logic function test in the technical solution of the present invention can include performing an error reporting function test on the error reporting function of the hardware module circuit in the server board to be tested, performing a control function test on the peripheral circuit control function of the hardware module circuit in the server board to be tested, and performing a communication function test on the data communication function of the hardware module in the server board to be tested, improving the comprehensiveness of the logic function test of the server board I / O ports.

[0069] Although the specific implementation manners of the present invention are described above in conjunction with the drawings, it is not a limitation to the protection scope of the present invention. Those skilled in the art should understand that based on the technical solution of the present invention, various modifications or deformations that can be made without creative labor by those skilled in the art are still within the protection scope of the present invention.

Claims

1. A server board I / O port logic function testing device, characterized in that It is used for logical function testing of multiple I / O ports of a server board, including: a signal probe module, an isolation module, and a test control module. The signal probe module includes multiple signal output probes and multiple signal acquisition probes. The test signal output end of the test control module is correspondingly communicatively connected to one end of the signal output probe through the isolation module. The other end of the signal output probe is communicatively connected to the signal input end of the server board to be tested. The test signal input end of the test control module is correspondingly communicatively connected to one end of the signal acquisition probe through the isolation module. The other end of the signal acquisition probe is communicatively connected to the signal output end of the server board to be tested; the test control module is used to select a corresponding logical function test scheme according to the test mode selected by the user, and perform logical function testing on the I / O ports of the server board to be tested through the signal probe module and the isolation module; specifically, the test control module sequentially outputs the test signals generated according to the logical function test scheme to the signal input end of the server board to be tested through the isolation module and the signal output probe, and sequentially obtains the test feedback signals output by the server board to be tested through the signal acquisition probe and the isolation module, and outputs the test results according to the test feedback signals output by the server board to be tested and the test signals input to the server board to be tested.

2. The I / O port logic function test device for a server board according to claim 1, characterized in that, It further includes a first connector. One end of the first connector is communicatively connected to the signal probe module, and the other end is communicatively connected to the test control module through the isolation module.

3. The I / O port logic function test device for a server board according to claim 1, characterized in that, It further includes a power controller. The power controller is communicatively connected to the test control module and is used to output a test voltage with a corresponding value to the isolation module according to the test voltage instruction of the test control module. Among them, the test voltage instruction is jointly determined according to the server board to be tested and the test mode.

4. The server board I / O port logic function test device according to claim 3, characterized in that It further includes a jumper cap. The jumper cap is arranged between the power controller and the isolation module and is used to adjust the test voltage value output to the isolation module according to the test voltage instruction of the test control module.

5. The I / O port logic function test device for a server board according to claim 1, wherein It further includes a storage module. The storage module is communicatively connected to the test control module and is used to save the test data sent by the test control module.

6. The I / O port logic function test device for a server board according to claim 1, characterized in that It further includes a keyboard or a DIP switch. The keyboard or the DIP switch is communicatively connected to the test mode control end of the test control module and is used to obtain the test mode input by the user. According to the test mode input by the user, a corresponding test scheme is selected to perform logical function testing on the I / O ports of the server board to be tested.

7. A server board I / O port logic function test device according to any one of claims 1-6, characterized in that, It further includes a host computer. The host computer is communicatively connected to the test control module and is used to obtain the test data sent by the test control module.

8. The server board I / O port logic function testing device according to claim 7, characterized in that, It further includes a second connector. One end of the second connector is communicatively connected to the test control module, and the other end is communicatively connected to the host computer.

9. A server board I / O port logic function testing device according to any one of claims 1-6, characterized in that, The logical function testing includes error reporting function testing for the error reporting function of the hardware module circuit in the server board to be tested, control function testing for the peripheral circuit control function of the hardware module circuit in the server board to be tested, and communication function testing for the data communication function of the hardware module in the server board to be tested.

10. A method for testing the logical function of I / O ports of a server board, characterized in that Based on the basis of a server board I / O port logical function testing device according to any one of claims 1-9, it includes: The test control module selects the corresponding logic function test scheme according to the test mode selected by the user; The test control module sequentially outputs the test signals generated according to the logic function test scheme to the signal input end of the server board under test through the isolation module and the signal output probe; The test control module sequentially obtains the test feedback signals output by the server board under test through the signal acquisition probe and the isolation module; The test control module outputs the test results according to the test feedback signals output by the server board under test and the test signals generated according to the logic function test scheme.

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