Nanoknife calibration method and device

Abstract

This invention provides a nanosecond knife calibration method and apparatus, relating to the field of nanosecond knife technology. The method includes: acquiring electric field data of a medium inside a target container using an electric field probe; transmitting the electric field data to the target container via a nanosecond knife; generating electric field calibration parameters for the nanosecond knife based on the electric field data; and determining the nanosecond knife calibration result based on the electric field calibration parameters and a preset calibration range. This invention can calibrate nanosecond knives to select those meeting accuracy requirements.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of nanosecond knife, in particular to a nanosecond knife calibration method and device. BACKGROUND

[0002] Now in the corresponding cancer treatment technology, minimally invasive tumor ablation treatment has gradually become the preferred treatment method of clinical patients due to its small trauma, rapid and accurate elimination of tumor and strong repeatability. With the rapid development of minimally invasive tumor ablation treatment in the global range, minimally invasive methods such as microwave, radio frequency, freezing and nanosecond knife have been gradually applied in the treatment of various tumors, and minimally invasive tumor ablation will gradually become one of the mainstream therapies for tumor treatment in the future.

[0003] The currently widely used medical image guided microsecond pulse electric field nanosecond knife ablation is based on the reversible electroporation principle (RE) to form reversible electroporation and combine local drug delivery to treat tumor tissue; or the treatment method based on the irreversible electroporation principle (IRE), that is, by applying high-voltage electric field in the form of high-frequency pulse on the phospholipid bilayer of tumor cell membrane, so that the cell membrane produces permanent nanopore, the inside of the cell and the tissue fluid are connected, and the outflow of substances causes irreversible damage to the cell and causes cell apoptosis, thereby rapidly ablates tumor cells.

[0004] On the basis of studying the reversible electroporation and irreversible electroporation of microsecond pulse electric field (μsPEF), by further adjusting the parameters of the pulse electric field, different cell responses can be regulated and induced. When the pulse width of the applied pulse electric field is reduced to nanosecond level and the field strength is increased to megavolt per meter level, no obvious irreversible perforation phenomenon will occur on the cell membrane surface, but some functional changes may occur in cell organelles such as nucleus and mitochondria, and apoptosis of cells is induced, thereby indirectly killing tumor cells. The biological electric effect of this pulse is different from that of irreversible electroporation. The nanosecond pulse electric field (nsPEF) therapy treats tumors by inducing apoptosis, and has become a research hotspot in the field of bioelectromagnetic treatment of tumors at home and abroad. The nanosecond pulse technology has stronger extensibility and operability than the microsecond pulse technology.

[0005] The nanosecond knife is an essential device in nanosecond pulse technology. Since the nanosecond pulse technology has high precision requirements for the nanosecond knife, it is necessary to select qualified nanosecond knives for use, but there is no better nanosecond knife calibration scheme at present. SUMMARY

[0006] The present application provides a nanosecond knife calibration method and device, which can calibrate the nanosecond knife to screen the nanosecond knife meeting the precision requirements.

[0007] In a first aspect, an embodiment of the present application provides a nanosecond knife calibration method, which comprises: acquiring electric field data of a medium in a target container by using an electric field probe; the electric field data is sent into the target container by the nanosecond knife; generating electric field calibration parameters of the nanosecond knife according to the electric field data; and determining a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range.

[0008] In a second aspect, an embodiment of the present application further provides a nanosecond knife calibration device, which comprises: an acquisition module, configured to acquire electric field data of a medium in a target container by using an electric field probe; the electric field data is sent into the target container by the nanosecond knife; a parameter module, configured to generate electric field calibration parameters of the nanosecond knife according to the electric field data; and a calibration module, configured to determine a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range.

[0009] In a third aspect, an embodiment of the present application further provides a computer device, which comprises a memory, a processor, and a computer program stored in the memory and capable of running on the processor, and the processor implements the nanosecond knife calibration method when executing the computer program.

[0010] In a fourth aspect, an embodiment of the present application further provides a computer readable storage medium, which stores a computer program for implementing the nanosecond knife calibration method.

[0011] Embodiments of the present application have the following beneficial effects: the embodiments of the present application provide a nanosecond knife calibration scheme, which comprises: acquiring electric field data of a medium in a target container by using an electric field probe; the electric field data is sent into the target container by the nanosecond knife; generating electric field calibration parameters of the nanosecond knife according to the electric field data; and determining a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range. The embodiments of the present application can calibrate the nanosecond knife, so as to screen nanosecond knives meeting the accuracy requirements.

[0012] Other features and advantages of the present application will be further described in the following specification, and some will become apparent from the specification, or will be learned through practice of the present application. The objects and other advantages of the present application will be realized and achieved by the structure particularly pointed out in the specification, claims, and drawings.

[0013] In order to make the above objects, features and advantages of the present application more apparent, the following preferred embodiments are specifically described with reference to the attached drawings, and the detailed description is as follows. BRIEF DESCRIPTION OF DRAWINGS

[0014] In order to more clearly illustrate the technical solutions in the specific embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or prior art description. Obviously, the drawings described below are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor based on these drawings.

[0015] Figure 1 The nanosecond knife calibration method flow chart provided for the embodiments of the present application;

[0016] Figure 2 The two-directional view of the calibration system main body provided for the embodiments of the present application;

[0017] Figure 3 The three-dimensional modeling effect diagram of the calibration system and the measurement probe provided for the embodiments of the present application;

[0018] Figure 4 The side view (three-directional probe orthogonal, thus side view Figure 1 ) and three-dimensional view of the measurement probe provided for the embodiments of the present application;

[0019] Figure 5 The COMSOL calibration system simulation model schematic diagram provided for the embodiments of the present application;

[0020] Figure 6 The COMSOL calibration system electric field simulation visualization result schematic diagram provided for the embodiments of the present application;

[0021] Figure 7 The COMSOL calibration system simulation model schematic diagram after adding the measurement probe provided for the embodiments of the present application;

[0022] Figure 8 The COMSOL calibration system electric field simulation visualization result schematic diagram after adding the measurement probe provided for the embodiments of the present application

[0023] Figure 9 The nanosecond knife calibration device structure block diagram provided for the embodiments of the present application;

[0024] Figure 10 The computer equipment structure block diagram provided for the embodiments of the present application. DETAILED DESCRIPTION

[0025] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions of the present application will be described clearly and completely below with reference to the drawings. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort belong to the protection scope of the present application.

[0026] At present, microwave ablation (MWA) belongs to a kind of tumor thermal effect ablation treatment. High-frequency electromagnetic waves are used to transmit electromagnetic energy to human tissues, which is converted into a large amount of heat energy. Under the action of the microwave electric field, the polar molecules of the tissue itself generate heat in high-speed rotation friction, the local temperature of the tissue rises rapidly, the cells die due to intracellular protein denaturation and phospholipid bilayer cracking, thereby achieving the purpose of inactivating tumor tissue.

[0027] The main disadvantage of the thermal effect ablation treatment method such as microwave ablation is that the thermal effect is non-selective in destroying the tissue. In addition to ablation of tumor tissue, normal tissue such as blood vessels, nerves, bile ducts, etc. in the ablation area will also be completely destroyed. This disadvantage can lead to many postoperative complications (such as hematuria and urinary obstruction after ablation of kidney cancer tissue; pneumothorax after lung ablation, etc.). The nanoknife ablation procedure does not damage the body's ducts and nerves during the ablation process, and compared with thermal ablation technology, it can safely and effectively treat some important parts.

[0028] In addition, compared with the nanoknife ablation procedure, the microwave ablation procedure also has the following defects: protein denaturation in the ablation area produces toxicity or protein coagulation necrosis; there is a gray area in the ablation (i.e. an area where ablation is not complete), which has a heat sink effect, and incomplete ablation can lead to a high risk of recurrence, etc.

[0029] The effect of microsecond-level pulses on cells is mainly to use electroporation technology (reversible or irreversible) to treat tumor cells with drugs or destroy cell membranes under high-frequency high-voltage electric fields, thereby effectively treating tumors without damaging other tissues.

[0030] In the case of using pulse electric fields, when the pulse width of the applied pulse electric field is reduced to the nanosecond level, the cell membrane surface can be controlled to not undergo significant irreversible perforation phenomenon. The ultra-short time pulse electric field (USPEF) can extend the electroporation phenomenon to the inner plasma membrane of the cell substructure to ablate tumor cells in a way that affects the internal metabolism of the cell, or change the permeability of the nuclear membrane, mitochondrial membrane and other intracellular membranes to cooperate with drug treatment, or set different thresholds for cells of different sizes, shapes and functions to selectively induce intracellular effects. In summary, nanosecond pulse technology has stronger extensibility and operability than microsecond pulse technology.

[0031] Although the nanosecond pulse stimulation has been favored and deeply researched by many medical institutions and enterprises, the nanosecond pulse system existing in the market still lacks a unified calibration system.

[0032] Based on this, the embodiment of the application provides a nanosecond knife calibration method and device, which measures the electric field intensity, electric field distribution and pulse waveform generated by the nanosecond knife in the system, and the volume greater than a specific field strength (used to represent the ablation volume) to calibrate and measure the nanosecond pulse stimulation system in the market.

[0033] In order to facilitate the understanding of the embodiment, first, a nanosecond knife calibration method disclosed by the embodiment of the application is introduced in detail.

[0034] The embodiment of the application provides a nanosecond knife calibration method, referring to the flow chart of the nanosecond knife calibration method shown in Figure 1 The method comprises the following steps:

[0035] S102, acquiring electric field data of a medium in a target container by using an electric field probe.

[0036] In the embodiment of the application, the electric field data is sent to the target container by the nanosecond knife. The nanosecond knife sends a pulse signal into the target container, and the pulse signal is transmitted into the target container through the nanosecond knife to form electric field data in the target container. The electric field data in the target container is collected by using an electric field probe.

[0037] It should be noted that the target container can contain a medium. The nanosecond knife is inserted into the target container through the shell of the target container.

[0038] Referring to Figure 2 , the "+" symbol in the figure can represent an electric field probe. The number of electric field probes can be set according to actual needs, and the embodiment of the application does not make specific limitation. The target container can be a 20x20x20cm container, which can include a metal shell. Medium A and medium B can be placed in the target container, medium A fills the entire container, and medium B is located inside medium A.

[0039] S104, generating electric field calibration parameters of the nanosecond knife according to the electric field data.

[0040] In the embodiment of the application, the electric field calibration parameters are used to reflect the capability characteristics of the nanosecond knife. The types of electric field calibration parameters can be set according to actual needs.

[0041] S106, determining a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range.

[0042] In the embodiment of the present application, the preset calibration range is set according to the type of the electric field calibration parameter, which is used to evaluate whether each electric field calibration parameter meets the requirements. The electric field calibration parameter is compared with the preset calibration range to obtain the nanosecond knife calibration result.

[0043] It should be noted that the embodiment of the present application can be used for calibration of a double-electrode nanosecond knife or a multi-electrode nanosecond knife.

[0044] The embodiment of the present application provides a nanosecond knife calibration method, which comprises: obtaining electric field data of a medium in a target container by using an electric field probe; sending the electric field data to the target container by using a nanosecond knife; generating electric field calibration parameters of the nanosecond knife according to the electric field data; and determining a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range. The embodiment of the present application can calibrate the nanosecond knife to screen the nanosecond knife meeting the accuracy requirements.

[0045] In one embodiment, the electric field data of the medium in the target container is obtained by using the electric field probe, which can be executed according to the following steps:

[0046] The electric field data of the medium in the target container is obtained by using the electric field probe in batches; and the position of each batch of electric field probes in the target container is different.

[0047] In the embodiment of the present application, the target container can be a hollow cube, and the size thereof can be set according to actual requirements. The electric field data of different positions in the target container is obtained by using the electric field probe in batches.

[0048] In one embodiment, the electric field calibration parameters comprise an electric field intensity parameter, an electric field waveform parameter and an electric field proportion parameter; and the nanosecond knife calibration result is determined according to the electric field calibration parameters and the preset calibration range, which comprises: if the electric field intensity parameter, the electric field waveform parameter or the electric field proportion parameter does not meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife fails to pass the calibration; and if the electric field intensity parameter, the electric field waveform parameter and the electric field proportion parameter meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife passes the calibration.

[0049] In the embodiment of the present application, the electric field proportion parameter is used to describe the electric field range generated by the nanosecond knife in the target container. The electric field waveform parameter is used to describe the curve of the electric field intensity parameter changing with time. The electric field waveform parameter can be displayed by using a display. The display can be an oscilloscope, which can be selected according to actual requirements. When any one of the electric field intensity parameter, the electric field waveform parameter and the electric field proportion parameter does not meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife fails to pass the calibration; and when all of the electric field intensity parameter, the electric field waveform parameter and the electric field proportion parameter meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife passes the calibration. The nanosecond knife passing the calibration can be used to generate the electric field data meeting the requirements.

[0050] In one embodiment, the electric field calibration parameter of the nanosecond knife is generated according to the electric field data, including: calculating a first number of electric field probes whose batch electric field intensity parameters meet a preset field intensity range; and determining the electric field proportion parameter according to the first number and a total number of the batch electric field probes.

[0051] In the embodiment of the present application, after the electric field data of different positions in the target container is obtained in batches, the electric field intensity parameter of one position in the target container can be measured by each electric field probe, whether the electric field intensity parameter meets the preset field intensity range is calculated, if yes, the electric field probe is recorded as a first number, the number of all electric field probes meeting the preset field intensity range is calculated, the value of the first number is obtained, and the electric field proportion parameter is obtained by dividing the value of the first number by the total number of the electric field probes used in batches.

[0052] It should be noted that the preset field intensity range can be set according to actual needs, and the embodiment of the present application does not make specific limitation.

[0053] In one embodiment, the surface of the target container is provided with a first fixing device and a second fixing device; the first fixing device is used for fixing the nanosecond knife; and the second fixing device is used for fixing the electric field probe.

[0054] In the embodiment of the present application, referring to Figure 2 , the high-voltage coaxial conductor shown in the figure is connected with the nanosecond knife, the nanosecond knife is inserted into the target container by using two external insulated high-voltage coaxial conductors, and the electric field probe can also be inserted into the target container by using a hard insulated coaxial conductor. The first fixing device can fix the hard conductor of the nanosecond knife on the surface of the target container, so that the nanosecond knife is stably inserted into the target container, and the second fixing device can fix the hard conductor of the electric field probe on the surface of the target container, so that the electric field probe is stably inserted into the target container. The structures of the first fixing device and the second fixing device can be the same or different, and can be set according to actual needs. By selecting the fixing position of the hard conductor of the nanosecond knife or selecting the fixing position of the hard conductor of the electric field probe, the depth of the nanosecond knife or the electric field probe inserted into the target container can be controlled, so as to more accurately control the experimental data, and then calibrate the nanosecond knife.

[0055] The implementation steps of the method are described below with one specific embodiment. The method can be implemented by a calibration system, referring to Figure 2 , the two direction views of the main body of the calibration system and Figure 3 , the overall three-dimensional modeling effect diagram of the calibration system and the measurement probe, the main body of the calibration system is divided into three parts:

[0056] ①The measurement model is a 20×20×20cm 3 metal shell containing conductive gel, the gel is divided into two layers, the inner layer is 8×8×8cm 3Gel block for characterizing tumor tissue.

[0057] The standard nanosecond ablation system is two external insulated coaxial high-voltage conductive wires inserted vertically from the Z-axis direction into the gel by 10 cm, with a wire diameter of 1 mm, and the two wires are respectively positioned at the center of the XY plane of the metal shell and displaced by 0.875 cm in the X+ and X- directions. The upper metal plate is provided with corresponding insertion holes, and the rear end of the wire is connected to an adjustable high-voltage nanosecond pulse generator.

[0058] The electric field measurement probe part: the probe specifications are: three-directional probes made of metal, each with a length of 1 cm and a diameter of 1 mm, and the connecting wire is a hard insulated coaxial wire similar to that in ②, with a diameter of 1 mm. In the calibration system, a total of 7x7x3 measurement points are set, with an interval of 3 cm between the measurement points in the X and Y directions, and an interval of 6 cm between the measurement points in the Z direction. The measurement probe array is connected to a computer to store the measured electric field data.

[0059] Referring to Figure 4 the side view of the measurement probe (the three-directional probes are orthogonal, so the side view Figure 1 is not shown) and the three-dimensional view, the electric field probe used in the experiment has a main structure of X, Y, and Z three-directional orthogonal metal probes, and a single hard voltage conducting wire connected to the welding point of the three-directional probes, vertically upward along the Z-axis. The other end of the measurement system is grounded to ensure signal stability. The metal probes are 1 cm long and 1 mm in diameter in each direction, and the welding point is at the center of the three-directional probes, to ensure the symmetry of the probe welding points in the three directions. The advantage of using orthogonal three-directional probes is that they can evenly measure the electric field distribution in three directions, so that the electric field in three directions is evenly coupled at the detection end, effectively detecting the influence of each direction electric field component on the overall electric field.

[0060] Considering the high cost of the electric field probe part and the possible significant impact on electric field measurement when setting electric field probes at all points simultaneously at the physical level, the number of probes for simultaneous measurement in this system is set to 7, arranged in a row along the X-axis direction. During calibration, the measurement is performed 7x3 times respectively, and the readings at the same time point after the nanosecond knife is powered on are read, and the 21 measurement results are combined into field strength data.

[0061] Since the electric field probe and the wire are both 1 mm hard wires, changing the measurement position has little effect on the entire measurement system. To facilitate the change of measurement position, 7x7 holes corresponding to the outer insulation layer of the probe wire are set on the metal plate above the calibration phantom, and the corresponding positions of each probe wire are marked with Z-direction three-measurement scales. At the same time, the upper metal plate is also provided with a clamp to fix the electric field probe.

[0062] During the experimental measurement, first of all, the parameters of the nanosecond knife to be measured need to be understood, such as the physical parameters of the nanosecond knife, the standard field strength and pulse width when in use, the classical repetition frequency, and the maximum ablation volume claimed. Through the coaxial cable, the same conditions are set for the nanosecond knife to be measured, and the electric field probe is used to obtain the electric field values of each measurement point under the same conditions, which are saved in the computer for later comparison, so as to calibrate the nanosecond pulse ablation system to be measured.

[0063] Some auxiliary parameters can be defined in the calibration work, such as the half electric field ratio, where n represents the number of probes in the receiving electric field probe whose measured electric field intensity is greater than half of the set field strength, and N is the total number of probes. Due to the differences between ablation systems, the 1 / 2 ratio here can be modified for different situations, such as defining a 1 / 4 electric field ratio.

[0064] The calibration work can also be further analyzed in combination with the computer simulation results, for example, using the COMSOL Multiphysics system for simulation assistance during the analysis process. The results of different points obtained by the simulation software are compared with the actual measurement results to obtain the error between simulation and actual measurement, and the difference between the simulation of the system to be measured and the standard calibration system is compared.

[0065] The agar gel used in the experiment is PH6.0-7.0, and the two parts of the gel use 0.9% NaCl aqueous solution as the dispersion medium. The two electrodes of the nanosecond knife are inserted into the designated position of the inner agar, and the electric field measurement probes (7) of the first row position are installed and fixed on the metal plate. First, turn on the measurement program to receive electric field information in advance, then according to the initial field strength of 100 ns pulse width, 1kV / cm, the intra-string frequency is 1MHz, and each pulse string contains 100 pulses, a total of 100 pulse strings are emitted and measured. After ensuring that all the electric field information of the pulse string duration is recorded, turn off the measurement program, wait for 2-3 minutes (although the pulse stimulation time is very short, there is still a temperature change of 3-4 degrees Celsius), and after the gel is cooled to room temperature, the electric field probe is translated to the next group of measurement points in the Z-direction (in the experiment, the downward translation can minimize the influence of the movement of the electric field probe wires on the physical properties of the gel) and fixed, and the measurement program is turned on again to measure the next group of data. In this way, 21 groups of electric field data are measured.

[0066] The electric field measurement program is written by using a MATLAB script file, and 7*7*3 groups of electric field data are stored in corresponding matrix files respectively. When the data is processed in MATLAB, the corresponding parameters such as half electric field ratio can be calculated by writing a program through the script, the electric field change of a measurement point with the stimulation time can also be drawn by using a MATLAB scatter plot, and the electric field height at a specific moment on three measurement planes parallel to the XY plane can also be drawn by using a three-dimensional scatter plot.

[0067] When the double-electrode nanosecond knife is evaluated, the same method as the above measurement system can be used for evaluation, and for the multi-electrode nanosecond knife, the target needs to be measured.

[0068] In addition, while measuring, COMSOL Multiphysics 5.4 is used to model and simulate the measurement system, such as Figure 5 and Figure 6 , and the simulation of the measurement system containing the electric field probe, such as Figure 7 and Figure 8 .

[0069] The method experiment process is simple and easy to understand, the three-direction electric field probe is used, and the electric field generated by the nanosecond knife in the experimental environment of a 20*20*20cm gel block is measured with 7*7*3 measurement points, and the electric field change waveform of each point with time change. Not only the electric field distribution of the nanosecond knife is obtained, but also the concept of electric field ratio is proposed for the invention, which is used to obtain the intuitive cognition of the influence range of the nanosecond knife in the experimental environment. The present application provides a set of practical double-electrode nanosecond knife calibration standard in the field of nanosecond knife lacking systematic determination and calibration standard at present, and has high expansibility, which can be popularized and applied to the calibration of multi-electrode nanosecond knife, and becomes a standard system for testing various nanosecond knives on the market.

[0070] The present application provides a nanosecond knife calibration method and device, which is a kind of electric field calibration scheme with universality and expansibility for nanosecond pulse ablation probe;The method adds a three-direction electric field probe in the electric field calibration system to measure the electric field intensity of the corresponding point of the calibration system;In the electric field calibration system for tumor ablation, a separate gel block is used to represent the spatial separation between tumor cells and ordinary cells.

[0071] The present application also provides a nanosecond knife calibration device, as described in the following embodiments. Since the principle of solving the problem of the device is similar to that of the nanosecond knife calibration method, the implementation of the device can be referred to the implementation of the nanosecond knife calibration method, and the repeated parts will not be described again. Referring to Figure 9 The structure diagram of the nanosecond knife calibration device is shown in the figure, and the device comprises:

[0072] The acquisition module 71 is configured to acquire electric field data of a medium in a target container by using an electric field probe; the electric field data is sent to the target container by a nanosecond knife; the parameter module 72 is configured to generate electric field calibration parameters of the nanosecond knife according to the electric field data; and the calibration module 73 is configured to determine a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range.

[0073] In one embodiment, the electric field calibration parameters include an electric field intensity parameter, an electric field waveform parameter and an electric field proportion parameter; and the calibration module is specifically configured to: if the electric field intensity parameter, the electric field waveform parameter or the electric field proportion parameter does not satisfy the preset calibration range, determine that the calibration result is that the nanosecond knife fails to pass the calibration; and if the electric field intensity parameter, the electric field waveform parameter and the electric field proportion parameter satisfy the preset calibration range, determine that the calibration result is that the nanosecond knife passes the calibration.

[0074] In one embodiment, the parameter module is specifically configured to: calculate a first number of electric field probes whose electric field intensity parameters in each batch satisfy a preset field intensity range; and determine the electric field proportion parameter according to the first number and a total number of electric field probes in each batch.

[0075] In one embodiment, the surface of the target container is provided with a first fixing device and a second fixing device; the first fixing device is used for fixing the nanosecond knife; and the second fixing device is used for fixing the electric field probe.

[0076] The embodiment of the present application also provides a computer device, referring to Figure 10 a computer device structural schematic block diagram shown in the figure, the computer device includes a memory 81, a processor 82 and a computer program stored on the memory and can be run on the processor, when the processor executes the computer program, the steps of the above-mentioned any kind of nanosecond knife calibration method are realized.

[0077] Those skilled in the art can clearly understand that, for the convenience and brevity of the description, the specific working process of the computer device described above can refer to the corresponding process in the foregoing method embodiment, which will not be repeated here.

[0078] The embodiment of the present application also provides a computer readable storage medium, the computer readable storage medium stores the computer program for executing the above-mentioned any kind of nanosecond knife calibration method.

[0079] Those skilled in the art will appreciate that embodiments of the present application can be provided as methods, systems, or computer program products. Therefore, the present application can take the form of entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer usable storage media (including, but not limited to, disk storage, CD-ROMs, optical storage, etc.) containing computer usable program code.

[0080] The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 one or more flow or blocks. Figure 1 one or more flow or blocks.

[0081] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instructions which implement the function specified in the flowchart block or blocks. Figure 1 one or more flow or blocks. Figure 1 one or more flow or blocks.

[0082] The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 one or more flow or blocks. Figure 1 one or more flow or blocks.

[0083] Finally, it should be noted that the above-described embodiments are merely intended to illustrate the technical solutions of the present application, and not to limit the same. The protection scope of the present application is not limited to the above-described embodiments, and although the above-described embodiments have been described in detail, those skilled in the art should understand that any person skilled in the art can make modifications or easy changes to the technical solutions recorded in the above-described embodiments, or can easily think of equivalent replacements for some of the technical features; and these modifications, changes or replacements do not cause the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method of calibrating a nanosecond knife, characterized by, The method comprises the following steps: acquiring electric field data of a medium in a target container by using an electric field probe; the electric field data is sent into the target container by the nanosecond knife; generating electric field calibration parameters of the nanosecond knife according to the electric field data; determining a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range; the step of acquiring the electric field data of the medium in the target container by using the electric field probe comprises the following steps: acquiring the electric field data of the medium in the target container by using the electric field probe in batches; and the position of each batch of electric field probes in the target container is different; the electric field calibration parameters comprise an electric field intensity parameter and an electric field proportion parameter; the step of generating the electric field calibration parameters of the nanosecond knife according to the electric field data comprises the following steps: after acquiring the electric field data of different positions in the target container in batches, each electric field probe measures the electric field intensity parameter of one position in the target container, and whether the electric field intensity parameter meets a preset field intensity range is calculated; if the electric field intensity parameter of one position in the target container measured by the electric field probe meets the preset field intensity range, the electric field probe is recorded as a first number; the number of all electric field probes meeting the preset field intensity range is calculated, the value of the first number is obtained, and the electric field proportion parameter is obtained by dividing the value of the first number by the total number of electric field probes used in each batch.

2. The method of claim 1, wherein, the electric field calibration parameters further comprise an electric field waveform parameter; the step of determining the nanosecond knife calibration result according to the electric field calibration parameters and the preset calibration range comprises the following steps: if the electric field intensity parameter, the electric field waveform parameter or the electric field proportion parameter does not meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife fails to pass the calibration; if the electric field intensity parameter, the electric field waveform parameter and the electric field proportion parameter meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife passes the calibration.

3. The method of claim 1, wherein, the target container is provided with a first fixing device and a second fixing device; the first fixing device is used for fixing the nanosecond knife; the second fixing device is used for fixing the electric field probe.

4. A nanosecond knife calibration device, characterized by, The method comprises the following steps: an acquiring module is configured to acquire electric field data of a medium in a target container by using an electric field probe; the electric field data is sent into the target container by the nanosecond knife; a parameter module is configured to generate electric field calibration parameters of the nanosecond knife according to the electric field data; a calibration module is configured to determine a nanosecond knife calibration result according to the electric field calibration parameters and a preset calibration range; the acquiring module is specifically configured to acquire the electric field data of the medium in the target container by using the electric field probe in batches; and the position of each batch of electric field probes in the target container is different; the electric field calibration parameters comprise an electric field intensity parameter and an electric field proportion parameter; the parameter module is specifically configured to, after acquiring the electric field data of different positions in the target container in batches, measure, by each electric field probe, the electric field intensity parameter of one position in the target container, and calculate whether the electric field intensity parameter meets a preset field intensity range; If the electric field strength parameter of a position in the target container measured by the electric field probe meets the preset field strength range, the electric field probe is recorded as a first number; the number of all electric field probes meeting the preset field strength range is calculated to obtain the value of the first number, and the value of the first number is divided by the total number of electric field probes used in each batch to obtain the electric field proportion parameter.

5. The apparatus of claim 4, wherein, The electric field calibration parameter further includes an electric field waveform parameter; and the calibration module is specifically configured to: If the electric field strength parameter, the electric field waveform parameter or the electric field proportion parameter does not meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife does not pass the calibration. If the electric field strength parameter, the electric field waveform parameter and the electric field proportion parameter meet the preset calibration range, it is determined that the calibration result is that the nanosecond knife passes the calibration.

6. A computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, The processor executes the computer program to implement the nanosecond knife calibration method of any one of claims 1 to 3.

7. A computer readable storage medium characterized by The computer readable storage medium stores a computer program, and the computer program is executed by the processor to implement the nanosecond knife calibration method of any one of claims 1 to 3.

Images