A rapid on-site quality inspection system and method

Abstract

The application discloses a kind of on-site rapid quality inspection system and method, system includes low-power equipment and magnetic component, the low-power equipment is configured with hall sensor, processor and indicator light;The magnetic component is used to generate magnetic field and is adsorbed on the outer wall of low-power equipment;The hall sensor is used to induct magnetic field and trigger processor work;The processor is used to obtain the adsorption time of magnetic component, and different solidification programs are called according to adsorption time, to execute different detection functions;The indicator light is used to show different detection results.The application generates magnetic field by the relative motion of magnetic component and hall sensor, inducts magnetic field by hall sensor and triggers processor work, processor calls corresponding solidification program according to the adsorption time of magnetic component and low-power equipment, to start different detection functions, and different detection results are shown by indicator light, to realize the rapid quality inspection of use site.

Description

Technical Field

[0001] This invention relates to the field of equipment quality inspection technology, and in particular to the quality inspection of low-power devices in the production process, specifically a rapid on-site quality inspection system and method. Background Technology

[0002] Currently, in some fields of condition monitoring or data acquisition, the real-time requirements for the transmission of monitored or acquired data are relatively low, and real-time acquisition and transmission of data are not required. Therefore, considering the lifespan of the equipment, low-power devices with sleep mechanisms are used for condition monitoring or data acquisition.

[0003] These low-power devices require regular performance testing to obtain their performance parameters, facilitating timely maintenance or replacement. However, testing performance parameters typically necessitates frequent data reporting. Because low-power devices have a unique sleep cycle, they are not constantly active; they only report data when awake. This makes testing of low-power devices difficult.

[0004] There are also some existing testing methods for low-power devices, such as a testing method for low-power electronic devices disclosed in Chinese Patent No. CN104375027A on February 25, 2015. However, existing methods are applicable to the design prototype stage and production stage of products. For products that have been put into use, it is difficult to achieve product performance testing in the use stage due to the influence of their dormancy cycle.

[0005] Therefore, for low-power devices in the usage phase, it is very important to conduct rapid and accurate field tests to obtain device performance parameters so as to facilitate timely device maintenance or replacement. Summary of the Invention

[0006] To overcome the shortcomings of the prior art, the present invention provides a rapid on-site quality inspection system and method to achieve rapid quality inspection during the equipment use phase.

[0007] According to one aspect of the present invention, a rapid on-site quality inspection system is provided, comprising a low-power device and a magnetic component. The low-power device is equipped with a Hall sensor, a processor, and an indicator light. The magnetic component is used to generate a magnetic field and be attracted to the outer wall of the low-power device. The Hall sensor is used to sense the magnetic field and trigger the processor to operate. The processor is used to acquire the attraction time of the magnetic component and call different curing programs according to the attraction time to perform different detection functions. The indicator light is used to display different detection results.

[0008] The above technical solution generates a magnetic field through the relative movement of the magnetic component and the Hall sensor. The Hall sensor senses the magnetic field and triggers the processor to work. The processor calls the corresponding curing program according to the adsorption time between the magnetic component and the low-power device to start different detection functions and display different detection results through indicator lights, thereby realizing rapid quality inspection at the application site.

[0009] Since low-power devices do not work during their sleep period, it is difficult to carry out on-site equipment testing. Therefore, the interaction between magnetic components and Hall sensors is used to trigger the processor to wake up and execute the corresponding quality inspection program, so as to achieve the purpose of rapid on-site quality inspection. The above technical solution can execute the low-power device quality inspection program at any time without waiting for the device to wake up, which solves the problem that existing low-power devices cannot be quickly inspected on-site due to sleep, and improves the quality inspection efficiency.

[0010] As a further technical solution, when the adsorption time is the first preset time period, the full data reporting program is invoked; when the adsorption time is the second preset time period, the full-function quality inspection program is invoked; and when the adsorption time is the third preset time period, the final inspection program is invoked.

[0011] Once the processor starts, it begins timing to obtain the adsorption time between the magnetic component and the low-power device. When quality inspection is required, on-site personnel adsorb the magnetic component onto the low-power device for a target time according to the inspection requirements, and then remove the magnetic component. At this time, the processor obtains the adsorption time, calls the corresponding quality inspection program based on the adsorption time, and executes it.

[0012] Generally, the target time is considered to be equal to the adsorption time acquired by the processor.

[0013] As a further technical solution, when calling the full-function quality inspection program, if the indicator light shows an abnormal test result, the processor will call the sub-function quality inspection program one by one in a preset order and judge the test result based on the status of the indicator light.

[0014] The processor is pre-loaded with a full-function quality inspection program and various sub-function quality inspection programs. The processing logic of the full-function quality inspection program and each sub-function quality inspection program is pre-set. Only when the full-function quality inspection program has completed execution and the execution result is abnormal will the sub-function quality inspection program be started in a preset order. The next sub-function quality inspection program will be started only after the current sub-function quality inspection program has completed execution. The test results of each sub-function quality inspection program are displayed through indicator lights, stored, and uploaded to the cloud platform for processing when needed.

[0015] When the full-function quality inspection results show an anomaly, there may be one or more sub-functions that are abnormal. Therefore, the sub-function quality inspection program is started, and the inspection results of each sub-function are saved and uploaded so that the cloud platform can analyze and process them, identify the abnormal sub-functions, and then carry out targeted equipment maintenance, component replacement or program maintenance.

[0016] As a further technical solution, the processor includes a processing unit, a timing unit, and a storage unit. After receiving the signal from the Hall sensor, the processing unit starts the timing unit to obtain the adsorption time, and calls the corresponding curing program in the storage unit according to the adsorption time fed back by the timing unit.

[0017] When the low-power device is awake, the processor executes the original functions of the low-power device. When the low-power device is in sleep mode, it is triggered by the Hall sensor to start and execute the quality inspection function.

[0018] As a further technical solution, the processor also includes a communication unit for connecting to the cloud platform and transmitting data with the cloud platform.

[0019] The processor uploads monitoring and quality inspection data from the low-power device to the cloud platform via the communication unit, so that the data can be processed and analyzed on the cloud platform. This avoids data processing on the device itself, reduces the computing overhead of the low-power device, and allows the processor of the low-power device to be implemented with only a simple microcontroller, thus reducing the cost of the device.

[0020] As a further technical solution, the magnetic component includes a magnet or a strong magnet. The interaction between the magnet or strong magnet and the Hall sensor generates a magnetic field to trigger the processor to operate.

[0021] As a further technical solution, the indicator light's display status includes fast flashing and slow flashing, with fast flashing indicating an abnormal detection result and slow flashing indicating a normal detection result.

[0022] The indicator lights are located on the outer surface of the low-power device, allowing staff to easily see the status of the indicator lights and quickly obtain test results.

[0023] According to one aspect of the present invention, a rapid on-site quality inspection method is provided, implemented using the aforementioned system, comprising:

[0024] Use magnetic components to move toward the low-power device and attach to the outer surface of the low-power device;

[0025] The Hall sensor senses the magnetic field and sends a signal to the processor;

[0026] The processor obtains the adsorption time of the magnetic component and calls different curing programs based on the adsorption time to perform different detection functions;

[0027] The indicator lights display different test results.

[0028] In the above technical solution, the magnetic component and the Hall sensor generate relative motion, thereby generating a magnetic field. The Hall sensor senses the magnetic field and outputs a signal to the processor, triggering the processor to wake up from hibernation. After the processor is woken up, it starts timing the adsorption time of the magnetic component. When the magnetic component is removed, the processor calls different curing programs to execute the quality inspection program according to the acquired adsorption time, and displays the test results through indicator lights, so that on-site staff can intuitively see the quality inspection results and realize rapid on-site quality inspection.

[0029] As a further technical solution, the method further includes: calling the full data reporting program when the adsorption time is a first preset time period; calling the full-function quality inspection program when the adsorption time is a second preset time period; and calling the final inspection program when the adsorption time is a third preset time period.

[0030] As a further technical solution, when calling the full-function quality inspection program, if the indicator light shows an abnormal test result, the processor will call the sub-function quality inspection program one by one in a preset order and judge the test result based on the status of the indicator light.

[0031] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0032] (1) The present invention generates a magnetic field by the relative motion between the magnetic component and the Hall sensor. The Hall sensor senses the magnetic field and triggers the processor to work. The processor calls the corresponding curing program according to the adsorption time between the magnetic component and the low-power device to start different detection functions and display different detection results through indicator lights, thereby realizing rapid quality inspection at the use site.

[0033] (2) This invention is not affected by the sleep cycle of low-power devices. It can trigger the low-power devices to wake up and execute the corresponding quality inspection procedures at any time when there is a quality inspection requirement. It is suitable for rapid quality inspection in the field use stage. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of a rapid on-site quality inspection system according to an embodiment of the present invention.

[0035] Figure 2 This is a flowchart of a rapid on-site quality inspection method according to an embodiment of the present invention. Detailed Implementation

[0036] The technical solutions of various embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0037] In the description of this invention, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined as "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0038] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection, an electrical connection, or a connection that allows for communication; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0039] According to one aspect of the present invention, a rapid on-site quality inspection system is provided, such as... Figure 1 As shown, the device includes a low-power device and a magnetic component. The low-power device is equipped with a Hall sensor, a processor, and an indicator light. The magnetic component generates a magnetic field and adheres to the outer wall of the low-power device. The Hall sensor senses the magnetic field and triggers the processor. The processor acquires the adsorption time of the magnetic component and calls different curing programs based on the adsorption time to execute different detection functions. The indicator light displays different detection results.

[0040] The magnetic component can be made of magnet steel or a strong magnet. The interaction between the magnet steel or strong magnet and the Hall sensor generates a magnetic field to trigger the processor.

[0041] Preferably, the system further includes a cloud platform, which is communicatively connected to the processor for analyzing and processing data uploaded by the processor. Furthermore, the cloud platform can also connect to a mobile terminal to send the processing results from the cloud platform to the mobile terminal for display or notification, facilitating remote monitoring of the overall status of the equipment by equipment manufacturers or managers.

[0042] The processor includes a processing unit, a timing unit, and a storage unit. Upon receiving a signal from the Hall sensor, the processing unit activates the timing unit to acquire the adsorption time and, based on the adsorption time fed back by the timing unit, calls the corresponding curing program from the storage unit.

[0043] Preferably, the processor further includes a communication unit for connecting to and transmitting data with the cloud platform. The processor uploads monitoring and quality inspection data from the low-power device to the cloud platform via the communication unit, enabling data processing and analysis on the cloud platform. This avoids data processing on the device itself, reducing computational overhead on the low-power device and allowing the processor to be implemented using only a simple microcontroller, thus lowering device costs.

[0044] Preferably, the processor can be implemented using a microcontroller. Microcontrollers are inexpensive and have timing and storage functions, enabling the writing, storage, and execution of quality inspection programs. Therefore, based on existing low-power devices, this invention only requires the addition of a sensor and a magnetic component to solve the on-site quality inspection problem. The magnetic component can be reused, thereby achieving low-cost, rapid on-site quality inspection.

[0045] The processor contains various quality inspection programs, preferably including a full data reporting program, a full-function quality inspection program, and a final inspection program. Furthermore, it also contains multiple sub-function quality inspection programs, each corresponding to a sub-function of the device.

[0046] The processing logic of the full-function quality inspection program and each sub-function quality inspection program in the processor is preset. Only when the full-function quality inspection program has been executed and the execution result is abnormal will the sub-function quality inspection program be started in a preset order. The next sub-function quality inspection program will be started only after the current sub-function quality inspection program has been executed. The test results of each sub-function quality inspection program are displayed by indicator lights, stored, and uploaded to the cloud platform for processing when needed.

[0047] When the full-function quality inspection results show an anomaly, there may be one or more sub-functions that are abnormal. Therefore, the sub-function quality inspection program is started, and the inspection results of each sub-function are saved and uploaded so that the cloud platform can analyze and process them, identify the abnormal sub-functions, and then carry out targeted equipment maintenance, component replacement or program maintenance.

[0048] The processor has multiple preset time periods, each corresponding to a different quality inspection procedure. Once the processor starts, it begins timing to obtain the adsorption time between the magnetic component and the low-power device. When a quality inspection is required, on-site personnel adsorb the magnetic component onto the low-power device for a target time according to the inspection requirements, and then remove the magnetic component. At this time, the processor obtains the adsorption time and compares it with the preset time periods to determine the quality inspection procedure to be invoked.

[0049] Specifically, the processor has three preset time periods: a first preset time period, a second preset time period, and a third preset time period, with the duration of each increasing sequentially. For example, the first preset time period is set to be less than 3 seconds, the second preset time period is set to 3-5 seconds, and the third preset time period is set to 5-10 seconds. When the adsorption time obtained by the processor falls within 3 seconds, it indicates that the full data reporting program needs to be called; when the adsorption time obtained by the processor falls within 3-5 seconds, it indicates that the full-function quality inspection program needs to be called; and when the adsorption time obtained by the processor falls within 5-10 seconds, it indicates that the final inspection program needs to be called.

[0050] Preferably, when the adsorption time falls on a time period node, it is considered to belong to the previous time period. For example, when the adsorption time is 3 seconds, it is considered to belong to the first preset time period.

[0051] Ignoring the error caused by on-site personnel attaching the magnetic component to the equipment and starting the target time, the target time is generally considered to be equal to the attachment time obtained by the processor.

[0052] When the full-function quality inspection program is invoked, if the indicator light shows that the test result is abnormal, the processor will invoke the sub-function quality inspection program one by one in a preset order and judge the test result based on the status of the indicator light.

[0053] The indicator light's display status includes fast flashing and slow flashing. Fast flashing indicates an abnormal detection result, while slow flashing indicates a normal detection result. For example, if the indicator light flashes slowly for 5 seconds and then goes out, it indicates a normal detection result; if the indicator light flashes quickly for 10 seconds and then goes out, it indicates an abnormal detection result.

[0054] The indicator lights are located on the outer surface of the low-power device, allowing staff to easily see the status of the indicator lights and quickly obtain test results.

[0055] Since low-power devices do not work during their sleep period, it is difficult to carry out on-site equipment testing. Therefore, the interaction between magnetic components and Hall sensors is used to trigger the processor to wake up and execute the corresponding quality inspection program, so as to achieve the purpose of rapid on-site quality inspection. This invention can execute the low-power device quality inspection program at any time without waiting for the device to wake up, which solves the problem that existing low-power devices cannot be quickly inspected on-site due to sleep, and improves the quality inspection efficiency.

[0056] According to one aspect of the present invention, a rapid on-site quality inspection method is provided, which is implemented using the aforementioned system.

[0057] like Figure 2 As shown, the method includes:

[0058] Use magnetic components to move toward the low-power device and attach to the outer surface of the low-power device;

[0059] The Hall sensor senses the magnetic field and sends a signal to the processor;

[0060] The processor obtains the adsorption time of the magnetic component and calls different curing programs based on the adsorption time to perform different detection functions;

[0061] The indicator lights display different test results.

[0062] In this method, a relative motion is generated between the magnetic component and the Hall sensor, thereby generating a magnetic field. The Hall sensor senses the magnetic field and outputs a signal to the processor, triggering the processor to wake up from hibernation. After the processor is awakened, it starts timing the adsorption time of the magnetic component. When the magnetic component is removed, the processor calls different curing programs to execute quality inspection programs according to the acquired adsorption time, and displays the test results through indicator lights, so that on-site staff can intuitively see the quality inspection results and realize rapid on-site quality inspection.

[0063] The processor has multiple preset time periods, each corresponding to a different quality inspection procedure. Once the processor starts, it begins timing to obtain the adsorption time between the magnetic component and the low-power device. When a quality inspection is required, on-site personnel adsorb the magnetic component onto the low-power device for a target time according to the inspection requirements, and then remove the magnetic component. At this time, the processor obtains the adsorption time and compares it with the preset time periods to determine the quality inspection procedure to be invoked.

[0064] Specifically, the processor has three preset time periods: a first preset time period, a second preset time period, and a third preset time period, with the duration of each increasing sequentially. For example, the first preset time period is set to be less than 3 seconds, the second preset time period is set to 3-5 seconds, and the third preset time period is set to 5-10 seconds. When the adsorption time obtained by the processor falls within 3 seconds, it indicates that the full data reporting program needs to be called; when the adsorption time obtained by the processor falls within 3-5 seconds, it indicates that the full-function quality inspection program needs to be called; and when the adsorption time obtained by the processor falls within 5-10 seconds, it indicates that the final inspection program needs to be called.

[0065] The processing logic of the full-function quality inspection program and each sub-function quality inspection program in the processor is preset. Only when the full-function quality inspection program has been executed and the execution result is abnormal will the sub-function quality inspection program be started in a preset order. The next sub-function quality inspection program will be started only after the current sub-function quality inspection program has been executed. The test results of each sub-function quality inspection program are displayed by indicator lights, stored, and uploaded to the cloud platform for processing when needed.

[0066] When the full-function quality inspection results show an anomaly, there may be one or more sub-functions that are abnormal. Therefore, the sub-function quality inspection program is started, and the inspection results of each sub-function are saved and uploaded so that the cloud platform can analyze and process them, identify the abnormal sub-functions, and then carry out targeted equipment maintenance, component replacement or program maintenance.

[0067] When the full-function quality inspection program is invoked, if the indicator light shows that the test result is abnormal, the processor will invoke the sub-function quality inspection program one by one in a preset order and judge the test result based on the status of the indicator light.

[0068] The indicator light's display status includes fast flashing and slow flashing. Fast flashing indicates an abnormal detection result, while slow flashing indicates a normal detection result. For example, if the indicator light flashes slowly for 5 seconds and then goes out, it indicates a normal detection result; if the indicator light flashes quickly for 10 seconds and then goes out, it indicates an abnormal detection result.

[0069] The indicator lights are located on the outer surface of the low-power device, allowing staff to easily see the status of the indicator lights and quickly obtain test results.

[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the technical solutions of the embodiments of the present invention.

Claims

1. A field rapid quality inspection system, characterized in that, The low-power device is configured with a Hall sensor, a processor and an indicator light; the magnetic component is used to generate a magnetic field and be adsorbed on the outer wall of the low-power device; the Hall sensor is used to induct the magnetic field and trigger the processor to work; The processor is used to acquire the adsorption time of the magnetic component, and call different solidification programs according to the adsorption time to perform different detection functions; the indicator light is used to display different detection results; wherein, when there is a quality inspection requirement, the field staff adsorbs the magnetic component to a target time of the low-power device according to the quality inspection requirement, and then takes away the magnetic component, at this time, the processor acquires the adsorption time of the magnetic component, compares the adsorption time with a preset time period, to determine the quality inspection program to be called; when the adsorption time is a first preset time period, a full data reporting program is called; when the adsorption time is a second preset time period, a full-function quality inspection program is called; when the adsorption time is a third preset time period, a final inspection program is called.

2. The system of claim 1, wherein, When the full-function quality inspection program is called, if the indicator light displays an abnormal detection result, the processor calls a sub-function quality inspection program in a preset order one by one, and judges the detection result according to the display state of the indicator light.

3. The field rapid quality testing system of claim 1, wherein, The processor includes a processing unit, a timing unit and a storage unit, after receiving the signal of the Hall sensor, the processing unit starts the timing unit to acquire the adsorption time, and calls the corresponding solidification program in the storage unit according to the adsorption time fed back by the timing unit.

4. The field rapid quality testing system of claim 3, wherein, The processor further includes a communication unit for connecting a cloud platform and transmitting data with the cloud platform.

5. The field rapid quality testing system of claim 1, wherein, The magnetic component includes a magnetic steel or a strong magnet.

6. The field rapid quality testing system of claim 1, wherein, The display state of the indicator light includes fast flashing and slow flashing, the fast flashing represents an abnormal detection result, and the slow flashing represents a normal detection result.

7. A method for rapid on-site quality inspection, implemented by using the system according to any one of claims 1-6, characterized in that, Comprise: Use the magnetic component to move towards the low-power device and be adsorbed on the outer surface of the low-power device; The Hall sensor inducts the magnetic field and sends a signal to the processor; The processor acquires the adsorption time of the magnetic component, and calls different solidification programs according to the adsorption time to perform different detection functions; The indicator light displays different detection results.

8. The method of claim 7, wherein the method is a rapid on-site identification method. The method further comprises: when the adsorption time is a first preset time period, a full data reporting program is called; when the adsorption time is a second preset time period, a full-function quality inspection program is called; when the adsorption time is a third preset time period, a final inspection program is called.

9. The method of claim 8, wherein the method is a rapid on-site identification method. When the full-function quality inspection program is called, if the indicator light displays an abnormal detection result, the processor calls a sub-function quality inspection program in a preset order one by one, and judges the detection result according to the display state of the indicator light.

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