A device for measuring the slit area of ​​a solar monitoring irradiance meter

Through technical means such as 4F system and high-brightness integral sphere light source, high-precision measurement of the slit area is achieved, the problem of difficulty in measuring the slit area in the existing technology is solved, and the accuracy of solar spectral irradiance measurement is improved.

CN115265419BActive Publication Date: 2025-04-29HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES
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Patent Information

Application Number
CN202210696909.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-06-20
Publication Date
2025-04-29
Estimated Expiration
2042-06-20

AI Technical Summary

Technical Problem

The prior art is difficult to measure the slit area with high accuracy, especially the slits with small lengths, which affects the accuracy of solar spectral irradiance measurement.

Method used

The 4F system is adopted, combining a high-brightness integral sphere light source, achromatic lens, aperture stop and electronically controlled object-controlled load-carrying wheel, and high-precision slit area measurement is achieved through the comparison between the standard circular hole and the slit to be measured.

Benefits of technology

High-precision measurement of the slit area is achieved, the influence of dimensional and morphological errors is reduced, and the accuracy of spectral radiation measurement and remote sensing calibration is improved.

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Abstract

The present invention discloses a device for measuring the slit area of ​​a solar monitoring irradiance meter. The device uses a high-brightness integrating sphere light source as the system illumination light source, and uses a 4F system to collimate the emitted light to the measurement position, forming a uniform light spot at the measurement position, and limiting the incident angle to 0.5° through an aperture diaphragm. After passing through the slit, the light spot enters the measuring integrating sphere, and a high-precision low-noise detector is used for data acquisition. The standard circular hole and the position of the slit to be measured are switched by a rotating wheel to achieve comparative measurement of the standard circular hole and the slit to be measured, thereby achieving measurement of the area of ​​the slit to be measured. Starting from the basic principle of measuring the area by the flux method, the present invention achieves high-precision measurement of the area of ​​the slit to be measured by comparing it with the area of ​​a high-precision standard circular hole, reducing the scientific problem of the influence of size and shape and position errors on the slit area measurement results, and has broad application prospects in spectral radiation measurement and remote sensing high-precision calibration.
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Description

Technical Field

[0001] The invention belongs to the technical field of light radiation measurement and remote sensor calibration, and in particular relates to a device for measuring the slit area of ​​a solar monitoring irradiance meter. Background Art

[0002] Solar radiation illumination change data plays an important role in the research of solar physics, geospace weather forecast and climate change, geo-atmospheric physics, geo-ecosystem environment and other fields. Therefore, solar radiation illumination change is the focus of scientific research. The main means of studying solar radiation illumination change are ground-based spectroscopic instrument observation and satellite payload observation. Ground-based spectroscopic instruments are affected by the atmospheric environment and the observation accuracy and time of solar radiation illumination change are relatively large. Therefore, long-term, stable and multi-task satellite payload observation is currently used. The equipment for satellite-borne observation of solar irradiance data mainly includes solar constant monitors and solar spectrum irradiance monitors.

[0003] In the solar monitoring spectral irradiance meter, the size of the slit area limits the geometric area and energy of the incident light, and determines the incident area and the solid angle of the radiant brightness used to calculate the radiant illumination. Therefore, high-precision measurement of the slit area is of great significance to improving the measurement accuracy of solar spectral irradiance.

[0004] At present, there are three main methods for high-precision measurement of aperture area: geometric method, flux comparison method and laser dot scanning method. Among them, the geometric method uses mechanical or optical methods to determine the edge position of the aperture, uses a laser interferometer to measure the length, and calculates the aperture area through multi-point fitting. However, the measurement process is relatively complicated and can only be used to measure circular apertures with regular shapes, but not to measure slit areas. The laser dot scanning method uses the superposition of equally spaced Gaussian laser beams to form a spatially uniform illumination field, and measures the aperture area through the limiting effect of the aperture on the laser beam. However, due to the limitation of the laser beam size, this method cannot measure small slits. Summary of the invention

[0005] The purpose of the present invention is to remedy the defects of the prior art and provide a device for measuring the slit area of ​​a solar monitoring irradiance meter.

[0006] The present invention is achieved through the following technical solutions:

[0007] A device for measuring the slit area of ​​a solar monitoring irradiance meter comprises a high-brightness integrating sphere light source, an aperture stop, a shutter, an achromatic lens, an electrically controlled object-carrying rotating wheel, a standard circular hole, a slit to be measured and a measurement and acquisition module; a 4F system is adopted, F is the focal length of the achromatic lens, that is, the light outlet of the high-brightness integrating sphere light source is located at 2 times the focal length of the achromatic lens, and the achromatic lens is used to image the slit area at a standard circular hole at 2 times the focal length and the position of the slit to be measured in a 1:1 ratio, the non-uniformity of the imaged plane is better than 0.5%, and the aperture stop is located at The focus of the achromatic lens is used to limit the angle of the incident light to 0.5°; the aperture diaphragm is coaxial with the center of the exit plane of the high-brightness integrating sphere light source, and the shutter is located on the rear surface of the aperture diaphragm and close to the aperture diaphragm; the center of the light-through hole of the electrically-controlled object-carrying wheel is fixed at a position of 2 times the focal length of the achromatic lens; a uniform surface light source is formed at the light-through hole of the electrically-controlled object-carrying wheel, and the position switching of the standard circular hole and the slit to be measured is realized by the electrically-controlled object-carrying wheel, and the signal values ​​measured by the two are recorded to realize the measurement of the area of ​​the slit to be measured.

[0008] Furthermore, the inner wall coating of the high-brightness integrating sphere light source is made of polytetrafluoroethylene material, the inner wall diameter is 200mm, the outlet diameter is 25.4mm, and 4 35W halogen tungsten lamps are built in and evenly distributed on the front hemisphere. A light baffle is installed next to the halogen tungsten lamp to prevent direct light emission; the high-brightness integrating sphere light source has a fan at the upper and lower sides of the vertical light outlet along the center of the sphere to facilitate the heat dissipation of the high-brightness integrating sphere light source and improve the stability of the light source; the instability of the high-brightness integrating sphere light source is less than 0.5%, and the planar non-uniformity is less than 0.5%. The high-brightness integrating sphere light source has a built-in monitoring silicon detector for correcting the influence of power stability on the test results.

[0009] Furthermore, the focal length of the achromatic lens is F, and the diameter of the aperture stop is obtained based on the divergence angle of sunlight being 0.5°. (0.5°), the effective aperture of the achromatic lens should be larger than Ds + 2D, where D s is the light outlet diameter of the high brightness integrating sphere light source, and D is the diameter of the aperture stop.

[0010] Furthermore, the diameter of the shutter opening is greater than 1.5 times the diameter of the aperture diaphragm, and the surface is coated with stray light-eliminating black paint for measurement of dark backgrounds.

[0011] Furthermore, the electrically-controlled object-carrying wheel is an electrically-controlled rotating angular displacement stage, which has 6 sample mounting ports therein, each of which has a diameter of 25.4 mm and is used to achieve alternating measurement of standard circular holes and slits to be measured.

[0012] Furthermore, the measurement and acquisition module includes a Φ70 mm integrating sphere, the light entrance size of which is 25.4 mm, and also includes a low-noise silicon detector, a medium-to-high gain amplifier, and a data collector for realizing signal acquisition.

[0013] Furthermore, the monitoring silicon detector, shutter, electrically controlled object-carrying rotating wheel and measurement acquisition module are all controlled by a computer.

[0014] Furthermore, the shutter, achromatic lens, electrically controlled object-carrying rotating wheel, and measurement and acquisition module are all arranged in a dark room that eliminates stray light.

[0015] Beneficial effects:

[0016] The present invention starts from the basic principle of measuring area by the flux method, and realizes high-precision measurement of the slit area to be measured by comparing it with the area of ​​a high-precision standard circular hole, thereby reducing the scientific problem of the influence of size and shape and position errors on the slit area measurement results. It has broad application prospects in spectral radiation measurement and remote sensing high-precision calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 The present invention is a schematic structural diagram of a device for measuring the slit area of ​​a solar monitoring irradiance meter.

[0018] In the figure: high-brightness integrating sphere light source 1, aperture diaphragm 2, shutter 3, achromatic lens 4, electrically controlled loading wheel 5, measurement and acquisition module 6, computer 7, darkroom 8, inner wall coating 11, halogen tungsten lamp 12, monitoring silicon detector 13, integrating sphere 61, low-noise silicon detector 62, medium and high gain amplifier 63, data acquisition device 64. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0020] like Figure 1As shown, a device for measuring the slit area of ​​a solar monitoring irradiance meter of the present invention comprises a high-brightness integrating sphere light source 1, an aperture diaphragm 2, a shutter 3, an achromatic lens 4, an electrically controlled object-carrying wheel 5, a standard circular hole, a slit to be measured and a measurement acquisition module 6. A 4F system is adopted, where F is the focal length of the achromatic lens 4, i.e., the light outlet of the high-brightness integrating sphere light source 1 is located at 2 times the focal length of the achromatic lens 4, and the light is imaged to the standard diaphragm and the slit to be measured at 2 times the focal length through the achromatic lens 4, and the non-uniformity of the imaged plane is better than 0.5%. The aperture diaphragm 2 is located at the focus of the achromatic lens 4, and is used to limit the angle of the incident light to 0.5°. The aperture diaphragm 2 is coaxial with the center of the exit plane of the high-brightness integrating sphere light source 1, and the shutter 3 is located at the edge of the darkroom 8 and is close to the rear surface of the aperture diaphragm 2. The center position of the electrically-controlled object-carrying rotating wheel 5 is at twice the focal length of the achromatic lens 4, and a uniform surface light source is formed at the light-passing hole of the electrically-controlled object-carrying rotating wheel 5. The switching of the standard circular hole and the slit position to be measured is achieved through the electrically-controlled object-carrying rotating wheel 5, and the signal values ​​measured by both are recorded to realize the slit area measurement based on the flux method.

[0021] The inner wall coating 11 of the high-brightness integrating sphere light source 1 is made of polytetrafluoroethylene, the inner wall diameter is 200mm, the outlet diameter is 25.4mm, and 4 35W halogen tungsten lamps 12 are built in and evenly distributed on the front hemisphere. A light shield is installed next to the halogen tungsten lamp 12 to prevent direct light emission. The vertical light outlet of the integrating sphere has a fan up and down along the center of the sphere, which is convenient for the high-brightness integrating sphere light source 1 to dissipate heat and improve the stability of the light source. The instability (RMS value) of the high-brightness integrating sphere light source 1 is less than 0.5%. The high-brightness integrating sphere light source 1 has a built-in monitoring silicon detector 13 for light source stability correction.

[0022] The focal length of the achromatic lens 4 is F, and the diameter of the aperture stop 2 is obtained based on the divergence angle of sunlight being 0.5°. (0.5°), the effective aperture of the achromatic lens 4 should be larger than D s +2D, where D S is the diameter of the light outlet of the high-brightness integrating sphere light source 1, and D is the diameter of the aperture stop 2.

[0023] The diameter of the shutter 3 opening is larger than 1.5 times the diameter of the aperture diaphragm 2, and the surface is coated with stray light black paint for dark background measurement. The electrically controlled object carrier wheel 5 is an electrically controlled rotary angular displacement stage, which has 6 sample mounting ports with a diameter of 25.4 mm, and is used to achieve alternating measurement of standard circular holes and slits to be measured.

[0024] The measurement acquisition module 6 includes a Φ70 mm integrating sphere 61 (with a light entrance size of 25.4 mm), a low-noise silicon detector 62, a medium-high gain amplifier 63, and a data collector 64, and is used to realize signal acquisition.

[0025] The monitoring silicon detector 13 , shutter 3 , electrically controlled object-carrying rotating wheel 5 and measurement acquisition module 6 are all controlled by a computer 7 .

[0026] The shutter 3, achromatic lens 4, electrically controlled object-carrying rotating wheel 5, and measurement and acquisition module 6 should all be arranged in a dark room 8 for eliminating stray light.

[0027] The specific measurement steps of the slit area measurement device of the solar monitoring irradiance meter of the present invention are as follows:

[0028] (1) Installing a standard round hole and a slit to be measured on the electrically controlled loading wheel 5;

[0029] (2) Turn on the power supply to start up the high-brightness integrating sphere light source 1, the electronically controlled loading wheel 5, the measurement and acquisition module 6 and other components, and preheat for 30 minutes;

[0030] (3) Collect the measurement signal value of the slit to be tested and the standard circular hole and record it as I slit , I aper , while recording and monitoring the signal value of silicon detector 13 , ;

[0031] (4) Close the shutter and record the measured background signal values ​​of the slit to be tested and the standard circular hole. , ;

[0032] (5) Using the calibration value A of the standard circular hole aper Calculate the area of ​​the slit to be measured:

[0033] ;

[0034] (6) After the test is completed, turn off all power supplies and remove the standard round hole and the slit to be tested.

[0035] The present invention uses a high-brightness integrating sphere light source as the system illumination light source, uses a 4F system to collimate and image the emitted light of the high-brightness integrating sphere light source to the measurement position, forms a uniform light spot at the measurement position, and enters the measurement integrating sphere after passing through the slit to be measured, and uses a high-precision low-noise detector to collect data. The standard circular hole and the slit to be measured are switched by an electrically controlled carrier wheel to achieve comparative measurement of the standard circular hole and the slit to be measured, thereby achieving measurement of the area of ​​the slit to be measured.

[0036] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A device for measuring the slit area of ​​a solar monitoring irradiance meter, characterized in that: It comprises a high-brightness integrating sphere light source, an aperture diaphragm, a shutter, an achromatic lens, an electrically controlled object-carrying wheel, a standard circular hole, a slit to be measured and a measurement acquisition module; a 4F system is adopted, where F is the focal length of the achromatic lens, that is, the light outlet of the high-brightness integrating sphere light source is located at twice the focal length of the achromatic lens, and the achromatic lens forms a 1:1 image to the standard circular hole at twice the focal length and the position of the slit to be measured, and the non-uniformity of the imaged plane is better than 0.5%, the aperture diaphragm is located at the focus of the achromatic lens, and is used to limit the angle of the incident light to 0.5°; the aperture diaphragm is coaxial with the center of the exit plane of the high-brightness integrating sphere light source, and the shutter is located on the rear surface of the aperture diaphragm and is in close contact with the aperture diaphragm; The center of the light hole of the electrically controlled object-carrying rotating wheel is fixed at a position of 2 times the focal length of the achromatic lens; a uniform surface light source is formed at the light hole of the electrically controlled object-carrying rotating wheel, and the positions of the standard circular hole and the slit to be measured are switched by the electrically controlled object-carrying rotating wheel, and the signal values ​​measured by the two are recorded to achieve the measurement of the area of ​​the slit to be measured; The inner wall coating of the high-brightness integrating sphere light source is made of polytetrafluoroethylene material, the inner wall diameter is 200mm, the outlet diameter is 25.4mm, and 4 35W halogen tungsten lamps are built in and evenly distributed on the front hemisphere. A light baffle is installed next to the halogen tungsten lamp to prevent direct light emission; the vertical light outlet of the high-brightness integrating sphere light source is provided with a fan respectively up and down along the direction of the center of the sphere, which is convenient for the high-brightness integrating sphere light source to dissipate heat and improve the stability of the light source; the instability of the high-brightness integrating sphere light source is less than 0.5%, and the plane non-uniformity is less than 0.5%. The high-brightness integrating sphere light source has a built-in monitoring silicon detector for correcting the influence of wavelength stability on the test results.

2. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 1, characterized in that: The focal length of the achromatic lens is F, and the diameter of the aperture stop is F according to the divergence angle of sunlight being 0.5°. tan (0.5°), the effective aperture of the achromatic lens should be larger than Ds + 2D, where D s is the light outlet diameter of the high brightness integrating sphere light source, and D is the diameter of the aperture stop.

3. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 1, characterized in that: The opening diameter of the shutter is greater than 1.5 times the diameter of the aperture diaphragm, and the surface is coated with stray light-eliminating black paint for measuring dark backgrounds.

4. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 1, characterized in that: The electrically controlled object-carrying rotating wheel is an electrically controlled rotating angular displacement stage, which has 6 sample mounting ports therein. The sample mounting ports have a diameter of 25.4 mm and are used to realize the alternating measurement of the standard circular hole and the slit to be measured.

5. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 1, characterized in that: The measurement acquisition module includes a Φ70mm integrating sphere, the light entrance size of which is 25.4mm, a low-noise silicon detector, a medium-high gain amplifier, and a data collector for realizing signal acquisition.

6. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 1, characterized in that: The monitoring silicon detector, shutter, electrically controlled loading wheel and measurement acquisition module are all controlled by a computer.

7. The device for measuring the slit area of ​​a solar monitoring irradiance meter according to claim 6, characterized in that: The shutter, achromatic lens, electrically controlled object-carrying rotating wheel and measuring and collecting module are all arranged in a dark room for eliminating stray light.

Citation Information

Patent Citations

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