System for monitoring a switchgear

Abstract

The invention relates to a system (110) for monitoring a switchgear (100). The system (110) comprises: a plurality of infrared cameras (120) having a field of view (130); a processing unit (30); and an output unit (40). The plurality of infrared cameras is configured to acquire a plurality of image data of a plurality of phases (50, 60, 70) of the switchgear, wherein each phase comprises a plurality of component parts (52, 62, 72) comprising circuit breakers and a plurality of busbars, and wherein each phase comprises a plurality of connections (54) between the plurality of components. Each infrared camera is configured to acquire image data of the same component part of the plurality of component parts for each phase, and / or to acquire image data of the same connection of the plurality of connections for each phase, and wherein each infrared camera acquires different image data than the other infrared cameras of the plurality of infrared cameras. The processing unit is configured to determine that a phase imbalance is present in a particular phase comprising from the plurality of image data that temperature information of the plurality of component parts and / or the plurality of connections of the particular phase has an overall increased temperature compared to temperature information of the same plurality of component parts and / or the same plurality of connections of one or more other phases of the plurality of phases. The processing unit is configured to determine that a fault is present in a particular phase comprising from the plurality of image data that temperature information of a first component part and / or a first connection of the particular phase has an increased temperature compared to temperature information of the same first component part and / or the same first connection of one or more other phases of the plurality of phases, and that temperature information of one or more second component parts and / or one or more second connections of the particular phase does not have an increased temperature compared to temperature information of the same one or more second component parts and / or the same one or more second connections of one or more other phases of the plurality of phases. The output unit is configured to output information about the occurrence of a fault or a load imbalance in a phase.

Description

Technical Field

[0001] This invention relates to a system for monitoring switchgear. Background Technology

[0002] When using infrared camera images to monitor buses in three-phase electrical equipment (e.g., medium-voltage MV switchgear), one possible method for detecting a particular type of fault (e.g., loose screws or other poor contact or fault in parts or connections) is to compare the heat generated between different conductors. The conductor of the phase experiencing the overheating fault will be hotter than the conductors of the other phases. Because metallic busbars are good conductors of heat, the increased temperature can propagate along the busbar to locations some distance from the fault location. Therefore, the entire area of ​​the affected busbar visible on an IR camera may appear as having a significantly higher temperature compared to other buses. If a typically smaller and very hot spot at the actual fault location is hidden, for example, behind a cover or different section of the busbar (from the affected phase or different phases), the fault may appear as a general temperature increase in one phase compared to another. This could appear as a load imbalance, where more current flows through that phase.

[0003] In the event of a malfunction, the switchgear needs to be maintained.

[0004] However, in the presence of load imbalance—that is, when one phase consumes more power than the others—this results in a higher current flowing through the conductor of that phase compared to the other phases, and consequently, a higher temperature in that conductor. In this case, immediate maintenance is not necessary. While load imbalance does not require immediate remedial measures such as maintenance, it is not ideal, and better distribution of the load across the phases would be beneficial. Therefore, operators still need to be aware that this situation has occurred.

[0005] Therefore, in summary, there are two situations that can produce similar images on the IR camera monitoring the bus compartment, only one of which requires switchgear maintenance, but the switchgear operator needs to know whether either of them is happening and whether a fault or load imbalance has occurred.

[0006] These problems need to be addressed. Summary of the Invention

[0007] Therefore, it would be advantageous to have an improved system for monitoring switchgear, in which faults or load imbalances can be detected in the phases and faults can be distinguished from load imbalances.

[0008] The object of the invention is achieved through the subject matter of the independent claims, wherein further embodiments are incorporated in the dependent claims. It should be noted that the system is described for switching devices, but can also be used in other electrical systems without suffering from overheated components.

[0009] In one aspect, a system for monitoring switchgear is provided, the system comprising:

[0010] - Multiple infrared cameras with a field of view;

[0011] - Processing unit; and

[0012] - Output unit;

[0013] Multiple infrared cameras are configured to acquire multiple image data of multiple phases of the switching equipment, wherein each phase includes multiple component parts, the multiple component parts include circuit breakers and multiple busbars and / or cables, and wherein each phase includes multiple connections between the multiple components;

[0014] At least one of the plurality of infrared cameras is configured to acquire image data of the same component portion in a plurality of component parts of a plurality of phases and / or acquire image data of the same connection in a plurality of connections of a plurality of phases, and wherein each infrared camera acquires image data different from the other infrared cameras in the plurality of infrared cameras;

[0015] The processing unit is configured to determine that a phase imbalance exists in a specific phase, including determining from multiple image data that the temperature information of multiple component parts and / or multiple connections in the specific phase has an overall increased temperature compared to the temperature information of the same multiple component parts and / or the same multiple connections in one or more other phases.

[0016] The processing unit is configured to determine that a fault exists in a specific phase, including determining from multiple image data that: the temperature information of the first component portion and / or the first connection of the specific phase has an increased temperature compared to temperature information of the same first component portion and / or the same first connection of one or more other phases in the multiple phases, and the temperature information of the one or more second component portions and / or the one or more second connections of the specific phase does not have an increased temperature compared to temperature information of the same one or more second component portions and / or the same one or more second connections of one or more other phases in the multiple phases; and

[0017] The output unit is configured to output information about phase failures or load imbalances.

[0018] It should be noted that the description of each of the multiple infrared cameras acquiring image data different from the other infrared cameras does not imply that cameras cannot acquire overlapping image data. Therefore, different cameras can acquire images of the same component portions of one, two, or more phases, but the images acquired by each camera are not entirely identical to those acquired by the other cameras. Thus, each camera is acquiring at least some images not acquired by another camera. Furthermore, each camera has a field of view that can acquire images of the same portions of several (one, two, or three) phases. It is possible, for example, that two cameras are installed in each compartment, each camera viewing one or two phases. The information from the two cameras is then combined so that the processing unit can process it as described.

[0019] Therefore, there can be, for example, three phases, each with component parts that are heated due to Joule heating. These component parts are, for example, parts of circuit breakers, busbars, cables, and connections. An infrared camera can then be used to determine the temperature of a specific component part or the temperature of a component section. If the three phases are operating fault-free and / or there is no load imbalance, then the (multiple) identical components in all phases should be at the (multiple) identical temperatures. In one example, a single camera can be used to image the same component parts of all three phases, from which the temperatures of all phases of that component part can be used to provide information about whether there is a fault or phase imbalance in the phase. Alternatively, instead of using a single camera to image the same component parts of all phases, one, two, or three cameras can image these component parts, and the image data together are used to determine the temperature of these identical component parts of the three phases to determine whether there is a phase fault or load imbalance. In one example, a single camera can view the identical component parts of all three phases. In another example, a single camera can view the identical component parts of two phases, while a second camera can view the identical component parts of the third phase. In one example, a camera can view the same component portions of two phases, while a second camera can view the same component portions of a third phase, and can also at least partially view the same component portions of one phase in a phase also viewed by the first camera. In another example, three different cameras can each image the same component portions of one of the three phases, and when combined or analyzed together, the images from them make it possible to compare the temperatures of the same component portions across all three phases.

[0020] Therefore, for example, there can be two infrared cameras, and each camera observes two phases.

[0021] This system, for example, enables the determination that a specific component portion of a phase is hotter than its equivalent or corresponding component portions in other phases, while other component portions of that phase may have the same temperature as other component portions in other phases. Therefore, it can be determined that the first phase has a fault associated with that specific component portion. However, if a portion (if not all) of a component portion of the first phase has a higher elevated temperature than its corresponding component portions in other phases, it can be determined that the first phase has a load imbalance.

[0022] Here, "no temperature increase" means that the temperature of a component part and / or connection of a particular phase can be equal to or substantially equal to the temperature of the same part / connection of other phases.

[0023] It should also be noted that the reference to "specific phase" refers to any phase.

[0024] In this way, multiple infrared cameras are examining different parts of a phase, such as circuit breakers and sections thereof, as well as busbars and their connections to circuit breakers. This allows for the identification of faults causing localized overheating, such as loose screws, poor contact, or broken connections, requiring immediate remedial action. It also allows for the identification of whether the phase is experiencing load imbalance, where an above-ideal current is associated with the phase. This should be addressed, but is not a high-priority issue like a fault. Therefore, the system can not only identify these two types of faults or load imbalances, but also differentiate between them.

[0025] In other words, each camera can observe one or more parts of at least one phase. If necessary, each compartment can have only one camera, or more than one camera per compartment. This can be done in a way that allows one or more cameras to determine the temperature of all phases, as in a three-phase system. In this sense, one or more cameras would produce thermal images of corresponding parts of the three phases, for example, to compare these values. If the camera resolution is sufficient, a single camera can be used to optimize cost.

[0026] In one example, each infrared camera is configured to acquire image data of the same component portion of at least two phases, and / or acquire image data of the same connection of at least two phases.

[0027] Therefore, each camera can observe portions of at least two phases.

[0028] In other words, each camera observes portions of at least two phases. For example, in a compartmentalized arrangement, only one camera can be installed in each compartment, allowing the temperature of all phases to be determined, as in a three-phase system. Then, essentially algorithmically, if the temperature information from a phase indicates an overall increase in temperature (compared to other phases), it can be concluded that a phase imbalance exists. If one camera observes only localized intense heating, while other cameras observe the same phase, it can be concluded that there is a fault in the switching equipment, such as poor contact.

[0029] In one aspect, a system for monitoring switchgear is provided, the system comprising:

[0030] - Multiple infrared cameras;

[0031] - Processing unit; and

[0032] - Output unit.

[0033] A plurality of infrared cameras are configured to acquire image data of a first phase of a switchgear. The first phase includes multiple component sections, including circuit breakers and multiple busbars, and includes multiple connections between the multiple components. Each of the plurality of infrared cameras is configured to acquire image data of either a component section or a connection. Each of the plurality of infrared cameras acquires image data different from that of the other infrared cameras in the plurality of infrared cameras. A processing unit is configured to indicate a fault or load imbalance in the first phase. The indication includes determining that a temperature associated with image data acquired by a specific infrared camera in the plurality of infrared cameras is associated with a fault or load imbalance in the first phase. The determination includes the use of one or more temperatures associated with image data acquired by one or more other infrared cameras in the plurality of infrared cameras. An output unit is configured to output information regarding a fault or load imbalance in the first phase.

[0034] It should be noted that the description of each of the first plurality of infrared cameras acquiring image data different from the other infrared cameras in the first plurality of infrared cameras does not imply that cameras cannot acquire overlapping image data. Therefore, different cameras can acquire images of the same component portions, but the images acquired by each camera are not entirely identical to those acquired by the other cameras. Thus, each camera is acquiring at least some images that have not been acquired by the other cameras.

[0035] It should also be noted that "infrared camera" refers to an infrared light camera configured to acquire infrared image data.

[0036] It should also be noted that the reference to "specific infrared camera" refers to any one of the first plurality of infrared cameras, not a specific camera among those cameras. Therefore, the system described above is applicable to any infrared camera acquiring images for any component part or connection of the first phase.

[0037] In this way, multiple infrared cameras are examining different parts of a phase, such as circuit breakers and sections thereof, as well as busbars and their connections to circuit breakers. This allows for the identification of faults causing localized overheating, such as loose screws, poor contact, or broken connections, requiring immediate remedial action. It also determines whether the phase is experiencing load imbalance, where an above-ideal current is associated with the phase. This should be addressed, but is not a high-priority issue like a fault. Therefore, the system can not only identify these two types of faults or load imbalances, but also differentiate between them.

[0038] In one example, the output unit is configured to output information about a fault that occurred in the first phase regarding a component part or connection imaged by a specific infrared camera among a first plurality of infrared cameras.

[0039] In one example, the determination of the temperature associated with a fault, which is related to image data acquired by a specific infrared camera among a first plurality of infrared cameras, includes determining that the temperature associated with the image data acquired by the specific infrared camera is greater than a expected temperature. Determining the expected temperature includes utilizing one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras. It should be noted that a camera may observe two other phases within its mounting compartment, or multiple cameras may be used to observe all phases.

[0040] Expected temperature calculations can also involve temperature measurements from other phases, either using the same camera or other cameras.

[0041] In other words, the temperature determined by a camera viewing a specific part of a phase can be determined to be greater than expected relative to temperatures determined from other parts of the phase, for example, by comparison with a temperature lookup table. In other words, if a component or connection is hotter than it should be relative to other parts of the phase, a fault can be identified, thus determining that the fault is not caused by a load imbalance, which would result in overall heating of all components and connections in the phase.

[0042] In one example, a second plurality of infrared cameras are configured to acquire image data of a second phase of a switchgear. The second phase includes multiple component sections, including circuit breakers and multiple busbars, and includes multiple connections between the multiple components. Each of the second plurality of infrared cameras is configured to acquire image data of a component section or a connection within the multiple component sections of the second phase. Each of the second plurality of infrared cameras acquires image data different from that of the other infrared cameras in the second plurality of infrared cameras. Determining the association between temperature and fault or load imbalance associated with image data acquired by a specific infrared camera in the first plurality of infrared cameras includes utilizing the temperature associated with image data acquired by the infrared cameras in the second plurality of infrared cameras for the same component section or connection of the second phase as imaged by the specific infrared camera in the first plurality of infrared cameras.

[0043] It should be noted that the description of each of the second plurality of infrared cameras acquiring image data different from the other infrared cameras in the second plurality of infrared cameras does not imply that cameras cannot acquire overlapping image data. Therefore, different cameras can acquire images of the same component portions, but the images acquired by each camera are not entirely identical to those acquired by the other cameras. Thus, each camera is acquiring at least some images that have not been acquired by the other cameras.

[0044] In one example, the determination of temperature associated with image data acquired by a particular infrared camera among a first plurality of infrared cameras and its association with fault or load imbalance includes: utilizing one or more temperatures associated with image data acquired by one or more other infrared cameras among a second plurality of infrared cameras for one or more components and / or one or more connections of a second phase that are identical to one or more components and / or one or more connections of a first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0045] Here, the reference to one or more “other” infrared cameras in the second plurality of infrared cameras refers to an infrared camera that is different from the infrared camera in the second plurality of infrared cameras that is acquiring image data for the same components or connections imaged by a particular camera in the first plurality of infrared cameras.

[0046] In other words, information from different phases can be used as a baseline to determine a fault or load imbalance in a phase. Thus, for example, identical component parts and / or connections in each phase may exhibit the same or similar temperatures, while a part or connection in one phase may have a higher temperature relative to the same part or connection in different phases, indicating a fault in that part or connection of that phase. However, it can also be determined that all parts or connections in one phase have higher temperatures relative to the same part or connection in different phases, and the temperature distribution between phases is generally the same, indicating that more current flows through one phase compared to other phases; in other words, a load imbalance exists. Therefore, remedial action can be taken immediately upon indication of a fault, and a notification of the existence of a load imbalance can be issued, although such immediate action is not necessary for a fault.

[0047] In one example, the processing unit is configured to determine that a fault has occurred in the first phase relating to a component or connection imaged by the specific infrared camera among the first plurality of infrared cameras when the temperature associated with image data acquired by an infrared camera among the second plurality of infrared cameras for a component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, or a component portion or connection of the same second phase. Specifically, the processing unit is configured to determine that a fault has occurred when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras, are substantially different from the temperature data associated with the image data acquired by an infrared camera among the second plurality of infrared cameras for a component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with the image data acquired by one or more other infrared cameras among the second plurality of infrared cameras for one or more components or one or more components or one or more connections of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras, or one or more components or one or more connections of the same second phase.

[0048] In one example, the processing unit is configured to determine that a load imbalance has occurred in the first phase when the temperature associated with image data acquired by a specific infrared camera among a first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among a second plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same second phase. Specifically, the processing unit is configured to determine that a load imbalance has occurred when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras, and the temperature distribution between one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras, and the temperature data associated with image data acquired by an infrared camera among the second plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same second phase, and the temperature distribution between one or more temperatures associated with image data acquired by one or more other infrared cameras among the second plurality of infrared cameras for one or more components of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras or for one or more components of the same second phase or for one or more connections of the same second phase.

[0049] In one example, a third plurality of infrared cameras are configured to acquire image data of a third phase of a switchgear. The third phase includes multiple component sections, including circuit breakers and multiple busbars, and includes multiple connections between the multiple components. Each of the third plurality of infrared cameras is configured to acquire image data of a component section or a connection within the multiple components of the third phase. Each of the third plurality of infrared cameras acquires image data different from that of the other infrared cameras in the third plurality of infrared cameras. The determination of the association between temperature and fault or load imbalance associated with image data acquired by a specific infrared camera in the first plurality of infrared cameras includes the utilization of the temperature associated with image data acquired by the infrared cameras in the third plurality of infrared cameras for the same component section or connection of the third phase as imaged by the specific infrared camera in the first plurality of infrared cameras.

[0050] It should be noted that the description of each of the third or more infrared cameras acquiring image data different from the other infrared cameras in the third or more infrared cameras does not imply that cameras cannot acquire overlapping image data. Therefore, different cameras can acquire images of the same component parts, but the images acquired by each camera are not exactly the same as those acquired by the other cameras. Thus, each camera is acquiring at least some images that have not been acquired by another camera.

[0051] In one example, the determination of temperature associated with image data acquired by a specific infrared camera among the first plurality of infrared cameras and its association with fault or load imbalance includes: utilization of one or more temperatures associated with image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components and / or one or more connections of the same third phase as those imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0052] Here, the reference to one or more “other” infrared cameras in the third plurality of infrared cameras refers to an infrared camera that is different from the infrared camera in the third plurality of infrared cameras that is acquiring image data for the same components or connections imaged by a particular camera in the first plurality of infrared cameras.

[0053] In one example, the processing unit is configured to determine that a fault has occurred in the first phase relating to a component portion or connection imaged by the specific infrared camera among the first plurality of infrared cameras when the temperature associated with image data acquired by an infrared camera among the third plurality of infrared cameras for a component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, or a component portion or connection of the same third phase. Specifically, the processing unit is configured to determine that a fault has occurred when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is substantially different from the temperature distribution between the temperature data associated with the image data acquired by an infrared camera among the third plurality of infrared cameras for a component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with the image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components or one or more components or one or more connections of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0054] In one example, the processing unit is configured to determine that a load imbalance has occurred in the first phase when the temperature associated with image data acquired by a specific infrared camera among a first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among a third plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same third phase. Specifically, the processing unit is configured to determine that a load imbalance has occurred when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is the same as the temperature distribution between the temperature data associated with the image data acquired by an infrared camera among the third plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same third phase, and the temperature distribution between the temperature data associated with the image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras or for one or more components of the same third phase or for one or more connections of the same third phase.

[0055] Therefore, by using information from all three phases, a fault or load imbalance can be determined based on statistical information. Thus, the temperature of a specific part or connection in one phase may be higher than the temperature of the same part or connection in the other two phases, even if they have similar temperatures, while other parts or connections in the first phase may have the same temperature as those parts or connections in the other two phases, indicating a fault in that part or connection of the first phase. However, if all parts or connections in the first phase are at elevated temperatures relative to the same parts or connections in the other two phases with similar temperatures, it can be determined that there is a load imbalance due to elevated current flowing through the first phase.

[0056] In one aspect, a switching device is provided, the switching device comprising a system according to one of the above aspects.

[0057] The above aspects and examples will become clear and illustrated with reference to the embodiments described below. Attached Figure Description

[0058] Exemplary embodiments will now be described with reference to the following figures:

[0059] Figure 1 A schematic diagram illustrating an example of a system for monitoring switchgear installed within switchgear is shown;

[0060] Figures 2 to 3A schematic diagram showing the components and connections of the three phases within the switch compartment is provided; and

[0061] Figure 4 A schematic diagram of the components and connections of a phase in a switch compartment monitored by multiple infrared cameras is shown. Detailed Implementation

[0062] Figure 1 This relates to a system used for monitoring switchgear. The system is in... Figure 1 The system is shown as being installed within a switchgear, but it can be retrofitted to and removed from the switchgear and reinstalled on another switchgear if necessary. According to one example, the system includes multiple infrared cameras 20, a processing unit 30, and an output unit 40. A first plurality of infrared cameras 22 are configured to acquire image data of a first phase 50 of the switchgear. The first phase includes multiple component sections 52, each including a circuit breaker and multiple busbars, and includes multiple connections 54 between the multiple components. Each of the first plurality of infrared cameras is configured to acquire image data of either a component section or a connection. Each of the first plurality of infrared cameras acquires image data different from that of the other infrared cameras in the first plurality of infrared cameras. The processing unit is configured to indicate a fault or load imbalance in the first phase. This indication includes determining that a temperature associated with the image data acquired by a particular infrared camera in the first plurality of infrared cameras is related to a fault or load imbalance in the first phase. This determination includes the use of one or more temperatures associated with image data acquired by one or more other infrared cameras in the first plurality of infrared cameras. The output unit is configured to output information about a fault or load imbalance in the first phase.

[0063] According to one example, the output unit is configured to output information about a fault that occurred in the first phase regarding a component part or connection imaged by a specific infrared camera among a first plurality of infrared cameras.

[0064] According to one example, the determination of temperature-related faults associated with image data acquired by a particular infrared camera among a first plurality of infrared cameras includes: determining that the temperature associated with the image data acquired by the particular infrared camera is greater than a expected temperature. Determining the expected temperature includes utilizing one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras.

[0065] According to one example, a second plurality of infrared cameras 24 are configured to acquire image data of a second phase 60 of a switchgear. The second phase includes a plurality of component sections 62, each including a circuit breaker and a plurality of busbars, and includes a plurality of connections 64 between the components. Each of the second plurality of infrared cameras is configured to acquire image data of a component section or a connection within the plurality of connections of the second phase. Each of the second plurality of infrared cameras acquires image data different from that of the other infrared cameras in the second plurality of infrared cameras. Determining the association between temperature and fault or load imbalance associated with image data acquired by a particular infrared camera in the first plurality of infrared cameras includes utilizing the temperature associated with image data acquired by the infrared cameras in the second plurality of infrared cameras for a component section or connection of the second phase that is identical to the component section or connection of the first phase imaged by the particular infrared camera in the first plurality of infrared cameras.

[0066] According to one example, the determination of temperature associated with image data acquired by a particular infrared camera in a first plurality of infrared cameras and its association with fault or load imbalance includes: utilization of one or more temperatures associated with image data acquired by one or more other infrared cameras in a second plurality of infrared cameras for one or more components and / or one or more connections of a second phase that are identical to one or more components and / or one or more connections of a first phase imaged by one or more other infrared cameras in the first plurality of infrared cameras.

[0067] According to one example, the processing unit is configured to determine that a fault has occurred in the first phase regarding a component or connection imaged by the specific infrared camera among the first plurality of infrared cameras when the temperature associated with image data acquired by a specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among the second plurality of infrared cameras for a component or connection of the same second phase imaged by the specific infrared camera among the first plurality of infrared cameras. The processing unit is specifically configured to determine that a fault has occurred when the temperature distribution associated with image data acquired by a specific infrared camera among a first plurality of infrared cameras and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras are substantially different from the temperature distribution associated with image data acquired by an infrared camera among a second plurality of infrared cameras for a component portion or connection of a second phase that is the same as or connected to a component portion or connection of a first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with image data acquired by one or more other infrared cameras among the second plurality of infrared cameras for one or more components or connections of a second phase that is the same as or connected to a component portion or connection of a first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0068] According to one example, the processing unit is configured to determine that a load imbalance has occurred in the first phase when the temperature associated with image data acquired by a specific infrared camera among a first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among a second plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same second phase. Specifically, the processing unit is configured to determine that a load imbalance has occurred when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is the same as the temperature distribution between the temperature data associated with the image data acquired by an infrared camera among the second plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same second phase imaged by the specific infrared camera among the first plurality of infrared cameras and one or more temperatures associated with the image data acquired by one or more other infrared cameras among the second plurality of infrared cameras for one or more components of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras or for one or more components of the same second phase imaged by one or more other infrared cameras among the first plurality of infrared cameras or for one or more connections of the same second phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0069] According to one example, a third plurality of infrared cameras 26 are configured to acquire image data of a third phase 70 of a switchgear. The third phase includes a plurality of component sections 72, each including a circuit breaker and a plurality of busbars, and includes a plurality of connections 74 between the components. Each of the third plurality of infrared cameras is configured to acquire image data of a component section or a connection within the plurality of connections of the third phase. Each of the third plurality of infrared cameras acquires image data different from that of the other infrared cameras in the third plurality of infrared cameras. Determining the association between temperature and fault or load imbalance associated with image data acquired by a specific infrared camera in the first plurality of infrared cameras includes utilizing the temperature associated with image data acquired by the infrared cameras in the third plurality of infrared cameras for the same component section or connection of the third phase as imaged by the specific infrared camera in the first plurality of infrared cameras.

[0070] According to one example, the determination of temperature associated with image data acquired by a particular infrared camera among a first plurality of infrared cameras and its association with fault or load imbalance includes: utilization of one or more temperatures associated with image data acquired by one or more other infrared cameras among a third plurality of infrared cameras for one or more components and / or one or more connections of a third phase that are identical to one or more components and / or one or more connections of a first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0071] According to one example, the processing unit is configured to determine that a fault has occurred in the first phase regarding a component or connection imaged by the specific infrared camera among the first plurality of infrared cameras when the temperature associated with image data acquired by a specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among the third plurality of infrared cameras for a component or connection of the same third phase imaged by the specific infrared camera among the first plurality of infrared cameras. The processing unit is specifically configured to determine that a fault has occurred when the temperature distribution associated with image data acquired by a particular infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras, is substantially different from the temperature distribution associated with image data acquired by an infrared camera among the third plurality of infrared cameras for a component portion or connection of the same third phase as the component portion or connection of the first phase imaged by the particular infrared camera among the first plurality of infrared cameras, and one or more temperatures associated with image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components or connections of the same third phase as the component portion or connection of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras, and one or more temperatures associated with the component portion or connection of the same third phase imaged by one or more other infrared cameras among the first plurality of infrared cameras.

[0072] According to one example, the processing unit is configured to determine that a load imbalance has occurred in the first phase when the temperature associated with image data acquired by a specific infrared camera among a first plurality of infrared cameras is greater than the temperature data associated with image data acquired by an infrared camera among a third plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same third phase. Specifically, the processing unit is configured to determine that a load imbalance has occurred when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is the same as the temperature distribution between the temperature data associated with the image data acquired by an infrared camera among the third plurality of infrared cameras for a component portion of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras or for a component portion or connection of the same third phase, and one or more temperatures associated with the image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components of the first phase imaged by one or more other infrared cameras among the first plurality of infrared cameras or for one or more components of the same third phase or for one or more connections of the same third phase.

[0073] Figure 2A schematic diagram of a switchgear with a 3-phase structure is shown, viewed from the front. Dots indicate the connection locations between phase components. Multiple infrared cameras 120 are viewing the different connections and all components of the phases. One camera 122, with a field of view 132, is viewing the same connections of all three phases. Another camera 124, with a field of view 134, is viewing the same connections of all three phases, where these connections differ from the others. These can be multiple cameras viewing all parts of the phases of the switchgear.

[0074] Figure 3 It shows Figure 2 The image shows a side view of the same switchgear compartment. Only one phase is visible at this point. In this particular example, the phases are housed in many different compartments or cabinets. However, a camera can be placed in each compartment / cabinet to view all or a subset of the components and connections of all or some of the three phases within that compartment / cabinet.

[0075] Figure 4 Different cameras 121, 122, 123, 124, and 125 are shown viewing portions of a phase within a switchgear. The same cameras may also have other phases within their field of view. It should be noted that although only one phase is shown, there are three phases in the compartment, and typically each camera observes the equivalent portions of all three phases. However, depending on other requirements, two cameras may be used to observe the equivalent portions of all three phases, or practically three cameras may be used. Images from two or more cameras observing the equivalent portions of the three phases can be analyzed together to determine the presence of a fault or load imbalance, or images from a single camera observing all three phases can be analyzed.

[0076] Therefore, regarding Figures 2-4A system 11 for monitoring switchgear 100 includes a plurality of infrared cameras 120 having a field of view 30, a processing unit 30, and an output unit 40. The plurality of infrared cameras are configured to acquire multiple image data of multiple phases 50, 60, and 70 of the switchgear. Each phase includes multiple component parts 52, 62, and 72, which include circuit breakers and multiple busbars and / or cables or other conductive parts, and wherein each phase includes multiple connections 54 between the multiple components. At least one infrared camera is configured to acquire image data of the same component parts among the multiple component parts of the multiple phases and / or acquire image data of the same connections among the multiple connections of the multiple phases, and each infrared camera acquires image data different from that of the other infrared cameras in the plurality of infrared cameras. The processing unit is configured to determine that a phase imbalance exists in a particular phase, including determining from the multiple image data that the temperature information of the multiple component parts and / or the multiple connections of the particular phase has an overall increased temperature compared to temperature information of the same multiple component parts and / or the same multiple connections of one or more other phases in the plurality of phases. The processing unit is configured to determine that a fault exists in a specific phase, including determining from multiple image data that: the temperature information of the first component portion and / or the first connection of the specific phase has an increased temperature compared to temperature information of the same first component portion and / or the same first connection of one or more other phases, and the temperature information of the one or more second component portions and / or the one or more second connections of the specific phase does not have an increased temperature compared to temperature information of the same second component portion and / or the same second connection of one or more other phases. The output unit is configured to output information regarding a fault or load imbalance in the phase.

[0077] Therefore, the above system solves the problem of distinguishing between overheating of one phase caused by load imbalance—which is usually not serious and can occur on a well-functioning switchgear—and a real fault caused by locally increased resistance and poor contact.

[0078] This solution involves the use of several infrared cameras. These are installed in several compartments of the switchgear and face the conductive components (busbars, cables, circuit breakers, connectors, etc.). The system is suitable for all possible systems (AC or DC) in which several parallel conductors are used for power transmission and / or distribution.

[0079] Each camera observes portions of multiple phases. Typically, only one camera is installed in each compartment, in this way the temperature of all phases can be determined, for example in a three-phase system.

[0080] In one example, each infrared camera is configured to acquire image data of the same component portion of at least two phases, and / or acquire image data of the same connection of at least two phases.

[0081] The system operates on an algorithmic basis:

[0082] If the temperature information from a phase shows an overall increase in temperature (compared to other phases), it can be concluded that there is a phase imbalance. If one camera observes only localized intense heating, while other cameras observe the same phase, it can be concluded that there is a fault in the switching equipment, such as poor contact.

[0083] Therefore, in the described system, images or pictures from multiple IR cameras are captured and sent to a common processing unit. The locations of buses, connections, and other components for each phase in these IR images are known, and for each bus, connection, or component, which phase it belongs to is also known. Furthermore, if necessary, knowledge of how far heat generated by a fault will propagate along the bus can also be taken into account.

[0084] If a significant temperature difference between buses is detected on one phase, the processing unit will assess whether this temperature difference (multiple identical phases being hotter than other phases) exists on other IR images of the same switchgear. If the result is that one or both phases are hotter than other phases, a low-priority warning of potential current imbalance can be given. However, if only a portion of the conductors or certain parts of a phase are hotter than their corresponding portions, a high-priority alarm will be generated to warn of an developing fault. Therefore, a simple and effective method is provided to distinguish between a fault and a load imbalance in a switchgear, and the ability to differentiate between these two situations is offered.

[0085] This system makes it possible that load imbalances and faults may not be distinguishable in the IR image of a single part of the switchgear in some cases. However, joint analysis of several IR images from different parts of the switchgear can resolve this ambiguity. This is because the temperature difference caused by a fault does not propagate a long distance, resulting in localized heating, while current or load imbalance affects the entire conductor, resulting in an overall temperature increase.

[0086] The inventors realized that the aforementioned system could be developed because, although heat can propagate from a point fault along a certain length of the conductor, some heat will dissipate along the conductor into the ambient air. Particularly, there is not much heat propagation across busbar connections and through circuit breakers. Therefore, in the case of a point fault, the inventors realized that the elevated temperature can be seen along all sections of the busbar of the affected phase in the field of view of one IR camera, but not or to a much lesser extent in the field of view of other IR cameras on buses farther from the fault location. Therefore, multiple cameras are used to observe different sections of the phases of the switching equipment. Conversely, in the case of load imbalance, the inventors realized that the temperature difference between the busbar and the components used for different phases will be observed throughout the switching equipment on all IR cameras. Therefore, cross-correlation data from multiple or all IR cameras, along with appropriate algorithms, can be used to distinguish between local faults requiring intervention and load imbalances between conductors that do not require intervention. Here, the reference to "algorithm" involves, on one level, a simple comparison of temperature with the temperature distribution along a phase point, as described above.

Claims

1. A system for monitoring switchgear, the system comprising: - Multiple infrared cameras (20); - Processing unit (30); as well as - Output unit (40); The first plurality of infrared cameras (22) are configured to acquire image data of a first phase (50) of a switching device, wherein the first phase includes a plurality of component parts, the plurality of component parts including circuit breakers and a plurality of busbars, and the first phase includes a plurality of connections between the plurality of components, wherein each of the first plurality of infrared cameras is configured to acquire image data of a component part among the plurality of component parts or of a connection among the plurality of connections, and wherein each of the first plurality of infrared cameras acquires image data different from that of the other infrared cameras in the first plurality of infrared cameras. A second plurality of infrared cameras (24) are configured to acquire image data of a second phase (60) of the switching equipment, wherein the second phase comprises a plurality of component parts, the plurality of component parts including circuit breakers and a plurality of busbars, and the second phase includes a plurality of connections between the plurality of components, wherein each of the second plurality of infrared cameras is configured to acquire image data of a component part among the plurality of component parts or a connection among the plurality of connections of the second phase, and wherein each of the second plurality of infrared cameras acquires image data different from the other infrared cameras in the second plurality of infrared cameras. The processing unit is configured to indicate a fault or load imbalance in the first phase. The feature is that the indication includes determining that the temperature associated with image data acquired by a specific infrared camera among the first plurality of infrared cameras is associated with a fault or load imbalance in the first phase, wherein the determination includes the use of one or more temperatures associated with image data acquired by one or more other infrared cameras among the first plurality of infrared cameras, wherein the determination that the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras is associated with a fault or load imbalance includes: the use of the temperature associated with image data acquired by an infrared camera among the second plurality of infrared cameras for a component portion or connection of the second phase that is the same as the component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and The output unit is configured to output information about a fault or load imbalance in the first phase.

2. The system of claim 1, wherein the output unit is configured to output information regarding a fault occurring in the first phase concerning a component portion or connection imaged by a particular infrared camera among the first plurality of infrared cameras.

3. The system of claim 1, wherein the determination of the temperature associated with the fault, which is related to the image data acquired by the specific infrared camera among the first plurality of infrared cameras, comprises: Determining that the temperature associated with the image data acquired by the specific infrared camera is greater than a expected temperature, wherein determining the expected temperature includes the use of the one or more temperatures associated with the image data acquired by the one or more other infrared cameras among the first plurality of infrared cameras.

4. The system of claim 1, wherein the determination of the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and the fault or load imbalance comprises: The utilization of one or more temperatures associated with image data acquired by one or more other infrared cameras among the second plurality of infrared cameras for one or more components and / or one or more connections of the second phase that are identical to those of the first plurality of infrared cameras among the one or more other infrared cameras.

5. The system of claim 1, wherein the processing unit is configured to: when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with the image data acquired by the infrared camera among the second plurality of infrared cameras for a component portion or connection of the same second phase as the component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and the one or more temperatures associated with the image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is substantially different from that associated with the image data acquired by the specific infrared camera among the second plurality of infrared cameras. When the infrared camera in the external camera determines that a fault has occurred in the first phase with respect to the component portion or connection imaged by the specific infrared camera in the first plurality of infrared cameras, when the temperature data associated with the image data acquired by the infrared camera in the first plurality of infrared cameras with respect to the component portion or connection of the second phase that is the same as the component portion or connection of the first phase imaged by the specific infrared camera in the first plurality of infrared cameras, and the temperature distribution associated with the one or more temperatures associated with the image data acquired by the one or more other infrared cameras in the second plurality of infrared cameras with respect to the component portion or connection of the second phase that is the same as the component portion or connection of the first phase imaged by the one or more other infrared cameras in the first plurality of infrared cameras, the fault is determined to have occurred in the first phase with respect to the component portion or connection imaged by the specific infrared camera in the first plurality of infrared cameras.

6. The system of claim 1, wherein the processing unit is configured to: when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with the image data acquired by the infrared camera among the second plurality of infrared cameras for a component portion or connection of the second phase imaged by the specific infrared camera among the first plurality of infrared cameras, and when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and the one or more temperatures associated with the image data acquired by one or more other infrared cameras among the first plurality of infrared cameras are... When the temperature distribution is the same as the temperature data associated with the image data acquired by the infrared camera in the second plurality of infrared cameras for the same component portion or connection of the second phase as the specific infrared camera in the first plurality of infrared cameras, and the temperature data associated with the one or more other infrared cameras in the second plurality of infrared cameras for the image data associated with the one or more components or connections of the second phase as the same as the one or more components or connections of the first phase as the one or more other infrared cameras in the first plurality of infrared cameras, a load imbalance is determined to have occurred in the first phase.

7. The system according to any one of claims 1-6, wherein a third plurality of infrared cameras (26) are configured to acquire image data of a third phase (70) of the switching equipment, wherein the third phase comprises a plurality of component portions, the plurality of component portions including circuit breakers and a plurality of busbars, and the third phase includes a plurality of connections (74) between the plurality of components, wherein each of the third plurality of infrared cameras is configured to acquire image data of a component portion of the plurality of component portions of the third phase or a connection of the plurality of connections, and wherein each of the third plurality of infrared cameras acquires image data different from that of the other infrared cameras in the third plurality of infrared cameras, and wherein the determination of temperature associated with fault or load imbalance associated with the image data acquired by the particular infrared camera in the first plurality of infrared cameras includes: The utilization of temperature associated with image data acquired by one of the third plurality of infrared cameras for the same component portion or connection of the third phase as the specific infrared camera in the first plurality of infrared cameras.

8. The system of claim 7, wherein the determination of the temperature associated with the image data acquired by the particular infrared camera among the first plurality of infrared cameras and the fault or load imbalance comprises: The utilization of one or more temperatures associated with image data acquired by one or more other infrared cameras among the third plurality of infrared cameras for one or more components and / or one or more connections of the third phase that are the same as those of the one or more other infrared cameras among the first plurality of infrared cameras for the first phase imaged by the one or more other infrared cameras.

9. The system of claim 7, wherein the processing unit is configured to: when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with the image data acquired by the infrared camera among the third plurality of infrared cameras for a component portion or connection of the same third phase as the component portion or connection of the first phase imaged by the specific infrared camera among the first plurality of infrared cameras, and when the temperature distribution between the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and the one or more temperatures associated with the image data acquired by one or more other infrared cameras among the first plurality of infrared cameras is substantially different from that associated with the image data acquired by the specific infrared camera among the third plurality of infrared cameras. When the infrared camera in the camera determines that a fault has occurred in the first phase with respect to the component portion or connection imaged by the specific infrared camera in the first plurality of infrared cameras, the temperature data associated with the image data of the component portion or connection of the third phase that is the same as the component portion or connection of the first phase imaged by the specific infrared camera in the first plurality of infrared cameras, and the temperature distribution associated with the one or more temperatures associated with the image data of the one or more components or connections of the third phase that are the same as the component portion or connection of the first phase imaged by the one or more other infrared cameras in the third plurality of infrared cameras, the camera determines that a fault has occurred in the component portion or connection imaged by the specific infrared camera in the first plurality of infrared cameras.

10. The system of claim 7, wherein the processing unit is configured to: when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras is greater than the temperature data associated with the image data acquired by the infrared camera among the third plurality of infrared cameras for the same component portion or connection of the third phase imaged by the specific infrared camera among the first plurality of infrared cameras, and when the temperature associated with the image data acquired by the specific infrared camera among the first plurality of infrared cameras and the one or more temperatures associated with the image data acquired by one or more other infrared cameras among the first plurality of infrared cameras are... When the temperature distribution is the same as the temperature data associated with the image data acquired by the infrared camera in the third plurality of infrared cameras for the component portion or connection of the third phase that is the same as the component portion or connection of the first phase imaged by the specific infrared camera in the first plurality of infrared cameras, and the temperature distribution associated with the one or more temperatures associated with the image data acquired by the one or more other infrared cameras in the third plurality of infrared cameras for the one or more components or connections of the third phase that are the same as the component portion or connection of the first phase imaged by the one or more other infrared cameras in the first plurality of infrared cameras, a load imbalance is determined to have occurred in the first phase.

11. A switching device (100) comprising the system according to any one of claims 1-10.

Images