A test fixture, a test device, and a solar cell testing system

Abstract

An embodiment of the present application provides a test fixture, a test device, and a solar cell testing system. The test fixture includes: two clamping mechanisms arranged at a relative interval, and the two clamping mechanisms are used for clamping the solar cell; the clamping mechanism includes a substrate, a first metal strip, a second metal strip, and a plug-in member, and the first metal strip and the second metal strip are detachably electrically connected to the substrate through the plug-in member; wherein, the second metal strip is arranged on a side of the first metal strip away from the substrate, and the second metal strip is used for contacting the solar cell, and the first metal strip and the second metal strip are insulated from each other; a plurality of elastic thimbles are arranged on the first metal strip, and the elastic thimbles pass through the second metal strip and at least partially expose outside the second metal strip to contact the solar cell. The test fixture described in the embodiment of the present application has a long service life and high test efficiency.

Description

Technical Field

[0001] This application belongs to the field of photovoltaic technology, and specifically relates to a test fixture, a test device, and a solar cell testing system. Background Art

[0002] In recent years, solar energy, as a clean energy source, has received great attention. Photovoltaic manufacturers and researchers strive to continuously improve the performance and quality of photovoltaic modules through process technology optimization and production process improvement. Among them, performing performance test experiments such as electrical performance (IV) testing and defect (EL) testing on solar cells is an essential step in confirming the performance and quality during the production of photovoltaic modules. In specific applications, a test fixture is usually used to clamp the solar cell for electrical performance testing and defect testing of the solar cell.

[0003] In the existing technology, the test fixture usually has a bus bar and multiple arranged probes. The multiple probes are arranged in a row, with a complex structure and great difficulty in processing and assembly. Since both the bus bar and the probes need to be replaced regularly, a relatively long time is consumed during the replacement process of the bus bar and the probes. Correspondingly, the downtime of the test device for waiting is also relatively long, which is very likely to reduce the testing efficiency of the solar cell. Summary of the Invention

[0004] This application aims to provide a test fixture, a test device, and a solar cell testing system to solve the problem of low testing efficiency of the existing test fixture.

[0005] To solve the above technical problems, this application is implemented as follows:

[0006] In a first aspect, this application discloses a test fixture for performing performance testing on a solar cell. The test fixture includes: two clamping mechanisms arranged at a relative interval, and the two clamping mechanisms are used to clamp the solar cell;

[0007] The clamping mechanism includes a substrate, a first metal strip, a second metal strip, and a plug-in member. The first metal strip and the second metal strip are detachably electrically connected to the substrate through the plug-in member;

[0008] Wherein, the second metal strip is arranged on a side of the first metal strip away from the substrate, and the second metal strip is used to contact the solar cell, and the first metal strip and the second metal strip are insulated from each other;

[0009] A plurality of elastic thimbles are arranged on the first metal strip. The elastic thimbles pass through the second metal strip and at least partially expose outside the second metal strip to contact the solar cell.

[0010] In an embodiment of the present application, the two clamping mechanisms in the test fixture can be clamped on the front and back sides of the solar cell, respectively, to test the performance of the solar cell. The second metal strip in the clamping mechanism can be in contact with the solar cell, and is used to measure the current of the solar cell or inject current into the solar cell. The multiple elastic pins on the first metal strip can pass through the second metal strip and contact the solar cell to measure the voltage of the solar cell. Since the first metal strip and the second metal strip can both be detachably electrically connected to the substrate through the connector, when the first metal strip and the second metal strip need to be replaced, it can be achieved by plugging and unplugging the connector, which takes less time. In this way, the downtime waiting time of the test equipment can be reduced, and the test efficiency of the solar cell is improved. Optionally, a plurality of first threaded holes are provided on the first metal strip;

[0011] The elastic ejector pin comprises a needle head, a first elastic member and a needle tail, wherein the needle head is connected to the needle tail through the first elastic member;

[0012] The needle tail is threadedly connected to the first threaded hole, and the needle head passes through the second metal strip and is at least partially exposed from the second metal strip to contact the solar cell sheet.

[0013] Optionally, the second metal strip is provided with a first through hole at a position corresponding to the first threaded hole, the diameter of the first through hole is larger than the outer diameter of the needle, and the needle passes through the first through hole and is at least partially exposed to the second metal strip; wherein,

[0014] A gap is formed between the outer wall of the needle and the inner wall of the first through hole.

[0015] Optionally, the test fixture further includes a first connection block and two second connection blocks; wherein,

[0016] The first connection block is welded to the middle area of ​​the substrate, and the two second connection blocks are welded to the two ends of the substrate;

[0017] The first connection block is provided with a first mounting hole, and the first metal strip is plugged into the first mounting hole through the plug-in component;

[0018] The second connection block is provided with a second mounting hole, and the second metal strip is plugged into the second mounting hole through the plug-in component.

[0019] In the embodiment of the present application, since the operation of opening holes on the substrate to directly connect probes or bus bars is avoided, the structure of the substrate can be greatly simplified and the strength of the substrate can be improved. Accordingly, the service life of the test fixture can be increased.

[0020] Optionally, an elastic clamping member is further disposed in the second mounting hole. When the plugging member is plugged into the second mounting hole, the plugging member can be clamped with the elastic clamping member.

[0021] Optionally, the plugging member is an elastic plugging member.

[0022] Optionally, the elastic plugging member includes a connecting portion, a plugging portion, and a second elastic member. The plugging portion is connected to the connecting portion through the second elastic member.

[0023] External threads are provided on the connecting portion. The connecting portion is threadedly connected to the first metal strip or the second metal strip through the external threads.

[0024] The plugging portion is detachably electrically connected to the substrate.

[0025] Optionally, the test fixture further includes two first insulating gaskets and insulating fasteners. Among them,

[0026] The two first insulating gaskets are disposed at the ends of the first metal strip.

[0027] The first insulating gasket is embedded between the first metal strip and the second metal strip.

[0028] The insulating fastener sequentially passes through the first metal strip, the first insulating gasket, and the second metal strip to connect the first metal strip, the first insulating gasket, and the second metal strip.

[0029] Optionally, the test fixture further includes a second insulating gasket. Among them,

[0030] The second insulating gasket is disposed between the two first insulating gaskets and is embedded between the first metal strip and the second metal strip.

[0031] In a second aspect, the present application also discloses a test device, and the test device includes the test fixture described in any one of the above.

[0032] In a third aspect, the present application also discloses a solar cell testing system, including: the above test device and a solar cell. Among them,

[0033] The test device includes a test fixture, and the test fixture includes two clamping mechanisms that are relatively spaced apart from the device. The two clamping mechanisms are used to clamp the solar cell.

[0034] The additional aspects and advantages of the present invention will be partially given in the following description, partially become apparent from the following description, or be understood through the practice of the present invention. Brief Description of the Drawings

[0035] The above and / or additional aspects and advantages of the present invention will become apparent and be readily understood from the following description of embodiments in conjunction with the accompanying drawings, in which:

[0036] Figure 1 is a schematic structural view of a test fixture according to an embodiment of the present application;

[0037] Figure 2 is Figure 1 a schematic structural view of the test fixture shown from another angle;

[0038] Figure 3 is Figure 1 a schematic structural view of a clamping mechanism in the test fixture shown;

[0039] Figure 4 is Figure 3 a schematic structural view of the clamping mechanism shown from another angle;

[0040] Figure 5 is a schematic structural view of a first metal strip according to an embodiment of the present application;

[0041] Figure 6 is a schematic structural view of an elastic thimble according to an embodiment of the present application;

[0042] Figure 7 is Figure 6 a schematic structural view of the elastic thimble shown from another angle;

[0043] Figure 8 is a schematic structural view of a second metal strip according to an embodiment of the present application;

[0044] Figure 9 is a schematic structural view of a substrate according to an embodiment of the present application;

[0045] Figure 10 is a schematic structural view of a first connection block according to an embodiment of the present application;

[0046] Figure 11 is a schematic structural view of a second connection block according to an embodiment of the present application;

[0047] Figure 12 is a schematic structural view of an elastic snap-in member of the present application;

[0048] Figure 13 is a structural diagram of a plug-in member according to an embodiment of the present application;

[0049] Figure 14 is a schematic structural view of another plug-in member according to an embodiment of the present application;

[0050] Figure 15 is Figure 3 a schematic structural view of the clamping mechanism A at the position shown;

[0051] Figure 16 is a schematic structural view of a first insulating gasket according to an embodiment of the present application;

[0052] Reference numerals: 100 - clamping mechanism, 200 - solar cell, 10 - substrate, 101 - first mounting groove, 102 - second mounting groove, 11 - first metal strip, 111 - first threaded hole, 12 - second metal strip, 121 - first through hole, 13 - plug-in member, 131 - connecting portion, 132 - plugging portion, 133 - second elastic member, 14 - elastic thimble, 141 - needle tip, 142 - first elastic member, 143 - needle tail, 15 - first connecting block, 151 - first mounting hole, 16 - second connecting block, 161 - second mounting hole, 162 - elastic clamping member, 17 - first insulating gasket, 171 - gasket body, 172 - extending portion, 18 - insulating fastener, 19 - second insulating gasket. Detailed implementation manners

[0053] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the drawings, wherein the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative efforts belong to the scope of protection of the present application.

[0054] The terms "first" and "second" in the specification and claims of the present application may explicitly or implicitly include one or more of such features. In the description of the present invention, unless otherwise specified, the meaning of "a plurality" is two or more. In addition, "and / or" in the specification and claims means at least one of the connected objects. The character " / " generally indicates an "or" relationship between the related objects before and after.

[0055] In the description of the present invention, it should be understood that the orientation or positional relationships indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. are based on the orientation or positional relationships shown in the drawings. These are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present invention.

[0056] In the description of the present invention, it should be noted that unless otherwise clearly specified and limited, the terms "mounted", "connected", and "coupled" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0057] The embodiment of the present application provides a test fixture, which can be used for a test device, and the test device can be used for testing the performance of solar cells. Specifically, the test fixture can be used to clamp the solar cells.

[0058] Referring to Figure 1 , a schematic structural diagram of a test fixture according to an embodiment of the present application is shown. Referring to Figure 2 , it shows Figure 1 A schematic structural diagram of the test fixture shown from another angle. Referring to Figure 3 , it shows Figure 1 A schematic structural diagram of the clamping mechanism in the test fixture shown in Figure 4 , it shows Figure 3 A schematic structural diagram of the clamping mechanism shown from another angle. As shown in Figure 1 , Figure 2 The test fixture may include two clamping mechanisms 100 arranged at intervals relative to each other, and the two clamping mechanisms 100 can be used to clamp the solar cells 200.

[0059] As shown in Figure 2As shown in the figure, the clamping mechanism 100 may specifically include a substrate 10, a first metal strip 11, a second metal strip 12, and a connector 13. The first metal strip 11 and the second metal strip 12 are detachably electrically connected to the substrate 10 through the connector 13. Among them, the second metal strip 12 is disposed on the side of the first metal strip 11 away from the substrate 10. The second metal strip 12 can be used to contact the solar cell 200. The first metal strip 11 and the second metal strip 12 are insulated from each other. A plurality of elastic thimbles 14 are provided on the first metal strip 11. The elastic thimbles 14 pass through the second metal strip 12 and at least partially expose outside the second metal strip 12 to contact the solar cell 200.

[0060] In the embodiment of the present application, the two clamping mechanisms 100 in the test fixture can respectively clamp the front and back sides of the solar cell 200 to test the performance of the solar cell 200. The second metal strip 12 in the clamping mechanism 100 can contact the solar cell 200 and is used to measure the current of the solar cell 200 or inject current into the solar cell 200. The plurality of elastic thimbles 14 on the first metal strip 11 can pass through the second metal strip 12 and contact the solar cell 200 to measure the voltage of the solar cell 200. Since both the first metal strip 11 and the second metal strip 12 can be detachably electrically connected to the substrate 10 through the connector 13, when it is necessary to replace the first metal strip 11 and the second metal strip 12, it can be achieved by plugging and unplugging the connector 13, which consumes less time. In this way, the downtime waiting time of the test equipment can be reduced, and the test efficiency of the solar cell 200 can be improved.

[0061] Specifically, the substrate 10 can be a circuit board, and the substrate 10 can be connected to the test equipment. The surface of the substrate 10 can be copper-clad and painted with matte paint. The substrate 10 can be used to support the first metal strip 11 and the second metal strip 12, and is electrically connected to the first metal strip 11 and the second metal strip 12 through the connector 13 to realize the transmission of test signals. In the embodiment of the present application, since the operation of opening holes on the substrate 10 to connect probes or bus bars is avoided, the structure of the substrate 10 is simple, the performance is reliable, and the processing cost is low. Moreover, since the strength reduction caused by opening holes is avoided, the strength of the substrate 10 is improved. Correspondingly, the support reliability of the substrate 10 for the first metal strip 11 and the second metal strip 12 can be improved, and thus, the service life of the test fixture can be improved.

[0062] In the embodiments of the present application, when the clamping mechanism 100 clamps the front and back sides of the solar cell 200, the second metal strip 12 can be pressed against the main grid line of the solar cell 200 to measure the current of the solar cell 200 or inject current into the solar cell 200. The elastic thimble 14 on the first metal strip 11 can then pass through the second metal strip 12 and be pressed against the main grid line of the solar cell 200 to measure the voltage of the solar cell 200. Since the first metal strip 11 and the second metal strip 12 are insulated, the current detection and voltage detection of the solar cell 200 can be made non-interfering with each other, thereby improving the test accuracy of the solar cell 200.

[0063] It should be noted that in practical applications, in order to avoid interference, the lengths and structures of the first metal strip 11 pressed against the front side of the solar cell 200 and the first metal strip 11 pressed against the back side of the solar cell 200 may be slightly different. The lengths and structures of the second metal strip 12 and the substrate 10 pressed against the front and back sides of the solar cell 200 may also be slightly different, and the embodiments of the present application do not limit this.

[0064] Refer to Figure 5 , which shows a schematic structural diagram of a first metal strip according to an embodiment of the present application. Refer to Figure 6 , which shows a schematic structural diagram of an elastic thimble according to an embodiment of the present application. Refer to Figure 7 , which shows Figure 6 a schematic structural diagram of the elastic thimble shown in another angle. As Figure 5 shown, a plurality of first threaded holes 111 are provided on the first metal strip 11. As Figure 6 , Figure 7 shown, the elastic thimble 14 may specifically include a needle head 141, a first elastic member 142, and a needle tail 143. The needle head 141 is connected to the needle tail 143 through the first elastic member 142; the needle tail 143 is threadedly connected to the first threaded hole 111, and the needle head 141 passes through the second metal strip 12 and is at least partially exposed outside the second metal strip 12 to contact the solar cell 200.

[0065] In a specific application, since the needle tail 143 is threadedly connected to the first threaded hole 111 on the first metal strip 11, by screwing the needle tail 143, the overall height of the elastic thimble 14 can be adjusted so that the needle head 141 can be in good contact with the solar cell 200, avoiding crushing the solar cell 200 by the elastic thimble 14 or causing hidden cracks in the solar cell 200.

[0066] Refer to Figure 8 , which shows a schematic structural diagram of a second metal strip according to an embodiment of the present application. As Figure 8As shown, the second metal strip 12 is provided with a first through hole 121 at a position corresponding to the first threaded hole 111. The diameter of the first through hole 121 is larger than the outer diameter of the needle 141. The needle 141 passes through the first through hole 121 and at least partially exposes outside the second metal strip 12. A gap is formed between the outer wall of the needle 141 and the inner wall of the first through hole 121 to achieve insulation between the elastic thimble 14 and the second metal strip 12.

[0067] In practical applications, during the process of pressing the clamping mechanism 100 onto the surface of the solar cell 200, since the needle 141 of the elastic thimble 14 at least partially exposes outside the second metal strip 12, the needle 141 will first contact the surface of the solar cell 200. As the clamping mechanism 100 continues to approach the solar cell 200, through the elastic deformation of the first elastic member 142, the needle 141 will be compressed into the first through hole 121 of the second metal strip 12 until the needle 141 and the first metal strip 11 are simultaneously pressed onto the surface of the solar cell 200. Since a gap is formed between the outer wall of the needle 141 and the inner wall of the first through hole 121, during the retraction process of the needle 141, it can maintain a non-contact state with the second metal strip 12 to achieve insulation between the elastic thimble 14 and the second metal strip 12 and avoid interference between their detection signals.

[0068] Exemplarily, the first elastic member 142 may include but is not limited to any one of a spring and a spring sheet. The specific form of the first elastic member 142 in the embodiments of the present application may not be limited.

[0069] Optionally, the test fixture may further include a first connection block 15 and two second connection blocks 16. The first connection block 15 is welded to the middle area of the substrate 10, and the two second connection blocks 16 are welded to both ends of the substrate 10. The first connection block 15 can be used to connect the first metal strip 11, and the second connection block 16 can be used to connect the second metal strip 12.

[0070] Refer to Figure 9 , which shows a schematic structural diagram of a substrate according to an embodiment of the present application. Refer to Figure 10 , which shows a schematic structural diagram of a first connection block according to an embodiment of the present application. Refer to Figure 11 , which shows a schematic structural diagram of a second connection block according to an embodiment of the present application. As Figure 10 shown, the first connection block 15 is provided with a first mounting hole 151, and the first metal strip 11 is inserted into the first mounting hole 151 through the plug-in member 13. As Figure 11As shown, a second mounting hole 161 is provided on the second connecting block 16, and the second metal strip 12 is inserted into the second mounting hole 161 through the connector 13. In this way, the operation of directly opening holes on the substrate 10 to connect the connector 13 can be avoided, and the structure of the substrate 10 can be further simplified to enhance the strength of the substrate 10. Thus, the overall strength and service life of the test fixture can be improved.

[0071] In a specific application, a first mounting groove 101 can be provided in the middle area of the substrate 10. The first connecting block 15 can be embedded in the first mounting groove 101 and welded to the substrate 10. The connector 13 connected to the first metal strip 11 can be inserted into the first mounting hole 151 of the first connecting block 15 to achieve a reliable connection between the first metal strip 11 and the first connecting block 15.

[0072] Similarly, second mounting grooves 102 can be opened at both ends of the substrate 10. The second connecting block 16 can be embedded in the second mounting grooves 102 and welded to the substrate 10. The connector 13 connected to the second metal strip 12 can be inserted into the second mounting hole 161 of the second connecting block 16 to achieve a reliable connection between the second metal strip 12 and the second connecting block 16.

[0073] In the embodiment of the present application, since the operation of directly opening holes on the substrate 10 to connect the probe or the bus bar is avoided, the structure of the substrate 10 can be greatly simplified and the strength of the substrate 10 can be improved. Correspondingly, the service life of the test fixture can be improved.

[0074] Optionally, an elastic clamping member 162 is further provided in the second mounting hole 161. When the connector 13 is inserted into the second mounting hole 161, the connector 13 can be clamped with the elastic clamping member 162 to enhance the connection strength between the connector 13 and the second connecting block 16. In practical applications, when the connector 13 connected to the second metal strip 12 is inserted into the second mounting hole 161, it can be clamped on the elastic clamping member 162 in the second mounting hole 161, so that the connector 13 can be in good contact with the second connecting block 16 and is not easy to fall off.

[0075] Refer to Figure 12 , a schematic structural diagram of an elastic clamping member of the present application is shown. As Figure 12 shown, the elastic clamping member 162 can be a crown spring with a through hole in the middle. The crown spring can be clamped around the connector 13 to reliably connect the connector 13 in the second mounting hole 161.

[0076] As Figure 11As shown, in order to facilitate the installation of the elastic clamping member 162 into the second mounting hole 161 of the second connection block 16, the second mounting hole 161 can be configured as a stepped hole, and the elastic clamping member 162 can be connected to the portion with a larger inner diameter within the stepped hole.

[0077] It should be noted that since the first metal strip 11 is connected to the second metal strip 12, the plug-in members 13 on the second metal strip 12 can be reliably connected to the second connection blocks 16 at both ends of the substrate 10 from both ends. To simplify the structure of the first connection block 15 and reduce the thickness of the first connection block 15, an elastic clamping member 162 may not be provided in the first mounting hole 151 within the first connection block 15.

[0078] Exemplarily, in order to achieve better electrical conduction between the plug-in member 13 and the substrate 10, the first connection block 15 and the second connection block 16 can be made of metals with good electrical conductivity such as copper and silver. The specific materials of the first connection block 15 and the second connection block 16 in the embodiments of the present application may not be limited.

[0079] In some alternative embodiments of the present application, the plug-in member 13 can be an elastic plug-in member, that is, the plug-in member 13 can undergo elastic deformation. Since both the first metal strip 11 and the second metal strip 12 can be connected to the substrate 10 through the elastic plug-in member, when the elastic thimble 14 on the first metal strip 11 and the second metal strip 12 are pressed against the solar cell 200, through the elastic deformation of the elastic plug-in member, the second metal strip 12 and the elastic thimble 14 can be in close contact with the solar cell 200, and the solar cell 200 will not be crushed or cause hidden cracks in the solar cell 200.

[0080] Refer to Figure 13 , which shows a structural diagram of a plug-in member described in the embodiments of the present application. Refer to Figure 14 , which shows a schematic structural diagram of another plug-in member described in the embodiments of the present application. As Figure 13 、 Figure 14 shown, the plug-in member 13 can specifically include: a connection portion 131, a plug-in portion 132, and a second elastic member 133. The plug-in portion 132 is connected to the connection portion 131 through the second elastic member 133; an external thread is provided on the connection portion 131, and the connection portion 131 is threadedly connected to the first metal strip 11 or the second metal strip 12 through the external thread; the plug-in portion 132 is detachably electrically connected to the substrate 10.

[0081] In practical applications, the first metal strip 11 and the second metal strip 12 may be provided with threaded holes at positions where the connector 13 needs to be connected. The external threads on the connecting portion 131 can be threadedly connected into the threaded holes to reliably connect the connector 13 to the first metal strip 11 or the second metal strip 12. The plugging portion 132 can be plugged into the substrate 10. For example, the plugging portion 132 can be plugged into the first connection block 15 or the second connection block 16 on the substrate 10. Since the plugging portion 132 is connected to the connecting portion 131 through the second elastic member 133, through the elastic deformation of the second elastic member 133, the distance between the first metal strip 11, the second metal strip 12 and the substrate 10 can be adjusted so that the second metal strip 12 and the elastic thimble 14 are in close contact with the solar cell 200, and the solar cell 200 is not crushed or caused to have a hidden crack.

[0082] It should be noted that in specific applications, the second elastic member 133 can be arranged inside the connector 13 as shown in Figure 13 or outside the connector 13 as shown in Figure 14 . The specific embodiment of the present application does not limit the specific position of the second elastic member 133.

[0083] Referring to Figure 15 , a schematic structural diagram of the position of the clamping mechanism A shown in Figure 3 is shown. As shown in Figure 15 , the test fixture further includes two first insulating gaskets 17 and an insulating fastener 18. Among them, the two first insulating gaskets 17 are arranged at the end of the first metal strip 11; the first insulating gasket 17 is embedded between the first metal strip 11 and the second metal strip 12; the insulating fastener 18 sequentially passes through the first metal strip 11, the first insulating gasket 17 and the second metal strip 12 to connect the first metal strip 11, the first insulating gasket 17 and the second metal strip 12. In this way, not only can a reliable connection between the first metal strip 11 and the second metal strip 12 be achieved, but also insulation between the first metal strip 11 and the second metal strip 12 can be achieved.

[0084] Referring to Figure 16 , a schematic structural diagram of a first insulating gasket according to an embodiment of the present application is shown. As shown in Figure 16 , the first insulating gasket 17 may include a gasket body 171 and two extension portions 172 provided on both sides of the gasket body 171. Among them, the two extension portions 172 located above the gasket body 171 can be used to clamp the first metal strip 11, and the two extension portions 172 located below the gasket body 171 can be used to clamp the second metal strip 12, so that the first metal strip 11 and the second metal strip 12 can be accurately aligned, further improving the connection accuracy and connection reliability between the first metal strip 11 and the second metal strip 12.

[0085] Optionally, the test fixture further includes a second insulating gasket 19; wherein, the second insulating gasket 19 is disposed between two first insulating gaskets 17 and is embedded between the first metal strip 11 and the second metal strip 12. The second insulating gasket 19 can be used to physically isolate the first metal strip 11 and the second metal strip 12 in the middle region, so that the first metal strip 11 and the second metal strip 12 can be reliably insulated.

[0086] Exemplarily, the first insulating gasket 17, the second insulating gasket 19, and the insulating fastener 18 can be made of materials with insulating properties such as nylon and plastic. The insulating fastener 18 can include but is not limited to at least one of screws and bolts. The embodiments of the present application do not limit this.

[0087] The following provides some specific application scenario examples of the embodiments of the present application.

[0088] In practical applications, after the solar cell 200 to be measured is ready, the two clamping mechanisms 100 of the test fixture can be pressed together up and down. During the pressing process, the elastic thimbles 14 mounted on the first metal strip 11 first contact the front and back main grids of the solar cell 200, and then the second metal strip 12 contacts the front and back main grids of the solar cell 200. Then the test fixture continues to press (the upper and lower clamping mechanisms 100 continue to move about 2 mm), and the second metal strip 12 and the elastic thimbles 14 of the upper and lower clamping mechanisms 100 apply pressure to the grid lines of the solar cell 200. During the pressing process, the elastic thimbles 14 on the first metal strip 11 gradually rebound. Finally, the end faces of the elastic thimbles 14 and the end face of the second metal strip 12 are on the same plane, ensuring that the end faces of the second metal strip 12 and the elastic thimbles 14 are in close contact with the solar cell 200, and the solar cell 200 is not crushed or caused to have hidden cracks. Before and after pressing, the first metal strip 11 and the second metal strip 12 always remain isolated from each other and do not contact.

[0089] When it is necessary to perform an IV test on the solar cell 200, voltage measurement and current measurement can be respectively performed on the solar cell 200.

[0090] Specifically, the process of voltage measurement is as follows: After the test fixture is pressed, the light source emits light. The test fixture measures the voltages on both sides of the solar cell 200 (about 0.68 - 0.72V) through the elastic thimble 14 mounted on the first metal strip 11. The circuit loop is as follows: the voltage side of the substrate 10 of the upper clamping mechanism 100 - the first connecting block 15 of the upper clamping mechanism 100 - the plug-in part 13 inserted into the first connecting block 15 - the first metal strip 11 of the upper clamping mechanism 100 - the elastic thimble 14 of the upper clamping mechanism 100 - the solar cell 200 - the elastic thimble 14 of the lower clamping mechanism 100 - the first metal strip 11 of the lower clamping mechanism 100 - the elastic thimble 14 of the lower clamping mechanism 100 - the first connecting block 15 of the lower clamping mechanism 100 - the voltage side of the substrate 10 of the lower clamping mechanism 100.

[0091] Specifically, the process of current measurement is as follows: After the test fixture is pressed, the second metal strips 12 of the upper and lower clamping mechanisms 100 of the fixture are pressed on the main grid lines on both sides of the solar cell 200. The light source emits light, and the induced current generated by the solar cell 200 flows through the fine grid, main grid, second metal strip 12, plug-in part 13, second connecting block 16, substrate 10, etc. of the solar cell 200 to form a loop (the total current of the cell is about 13 - 14A). The circuit loop is as follows: the current side of the substrate 10 of the upper clamping mechanism 100 - the second connecting block 16 of the upper clamping mechanism 100 - the plug-in parts 13 at both ends of the upper clamping mechanism 100 - the second metal strip 12 of the upper clamping mechanism 100 - the solar cell 200 - the second metal strip 12 of the lower clamping mechanism 100 - the plug-in parts 13 at both ends of the lower clamping mechanism 100 - the second connecting block 16 of the lower clamping mechanism 100 - the current side of the substrate 10 of the lower clamping mechanism 100.

[0092] When EL testing of the solar cell 200 is required, the specific operation process is as follows: Utilizing the electroluminescence principle of the solar cell 200, after the measurement fixture is pressed, the test system supplies a reverse constant current (about 10 A in total) to the solar cell 200 through the second metal strip 12. Similar to current measurement, the externally applied current flows through the substrate 10, the second connection block 16, the plug-in connector 13, the second metal strip 12, the main grid, and the fine grid, and then injects into the solar cell 200. The solar cell 200 emits near-infrared light, and the infrared camera captures the near-infrared image of the solar cell 200. The upper computer acquires the picture and analyzes and determines the defects. The circuit loop is as follows: the current side of the substrate 10 of the lower row clamping mechanism 100 - the second connection block 16 of the lower row clamping mechanism 100 - the plug-in connectors 13 at both ends of the lower row clamping mechanism 100 - the second metal strip 12 of the lower row clamping mechanism 100 - the solar cell 200 - the second metal strip 12 of the upper row clamping mechanism 100 - the plug-in connectors 13 at both ends of the upper row clamping mechanism 100 - the second connection block 16 of the upper row clamping mechanism 100 - the current side of the substrate 10 of the upper row clamping mechanism 100.

[0093] In summary, the test fixture described in the embodiments of the present application has at least the following advantages:

[0094] In the embodiments of the present application, the two clamping mechanisms in the test fixture can respectively clamp the front and back surfaces of the solar cell to test the performance of the solar cell. The second metal strip in the clamping mechanism can contact the solar cell to measure the current of the solar cell or inject current into the solar cell. The multiple elastic thimbles on the first metal strip can pass through the second metal strip and contact the solar cell to measure the voltage of the solar cell. Since both the first metal strip and the second metal strip can be detachably electrically connected to the substrate through the plug-in connector, when the first metal strip and the second metal strip need to be replaced, it can be achieved by simply plugging and unplugging the plug-in connector, which consumes less time. In this way, the downtime waiting time of the test equipment can be reduced, and the test efficiency of the solar cell is improved.

[0095] The embodiments of the present application further provide a test device, and the test device can specifically be the test fixture described in any of the above embodiments.

[0096] It should be noted that in the embodiments of the present application, the specific structure and working principle of the test fixture are the same as those of the test fixture in the above embodiments, and will not be elaborated here.

[0097] The present application also discloses a solar cell testing system, which includes the above-mentioned testing device and a solar cell. Among them, the testing device includes a testing fixture, and the testing fixture includes two clamping mechanisms spaced relative to the device, and the two clamping mechanisms are used to clamp the solar cell.

[0098] It should be noted that in the embodiments of the present application, the specific structure and working principle of the testing device are the same as those of the testing devices in the above embodiments, and will not be elaborated here.

[0099] In the description of this specification, the description with reference to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0100] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and purposes of the present invention, and the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test fixture for performance testing of solar cells, characterized in that, the test fixture includes: two clamping mechanisms arranged at a relative interval, and the two clamping mechanisms are used for clamping the solar cell; the clamping mechanism includes a substrate, a first metal strip, a second metal strip and a plug-in member, and the first metal strip and the second metal strip are detachably electrically connected to the substrate through the plug-in member; wherein, the second metal strip is arranged on a side of the first metal strip away from the substrate, and the second metal strip is used for contacting the solar cell, and the first metal strip and the second metal strip are insulated from each other; a plurality of elastic thimbles are arranged on the first metal strip, and the elastic thimbles pass through the second metal strip and at least partially expose outside the second metal strip to contact the solar cell; the plug-in member is an elastic plug-in member; the elastic plug-in member includes: a connecting portion, a plugging portion and a second elastic member, and the plugging portion is connected to the connecting portion through the second elastic member; the plugging portion is detachably electrically connected to the substrate.

2. The test fixture according to claim 1, characterized in that, a plurality of first threaded holes are arranged on the first metal strip; the elastic thimble includes a needle head, a first elastic member and a needle tail, and the needle head is connected to the needle tail through the first elastic member; the needle tail is threadedly connected to the first threaded hole, and the needle head passes through the second metal strip and at least partially exposes outside the second metal strip to contact the solar cell.

3. The test fixture according to claim 2, characterized in that, the second metal strip is provided with a first through hole at a position corresponding to the first threaded hole, the diameter of the first through hole is larger than the outer diameter of the needle head, and the needle head passes through the first through hole and at least partially exposes outside the second metal strip; wherein, a gap is formed between the outer wall of the needle head and the inner wall of the first through hole.

4. The test fixture according to claim 1, characterized in that, the test fixture further includes a first connection block and two second connection blocks; wherein, the first connection block is welded to the middle area of the substrate, and the two second connection blocks are welded to both ends of the substrate; a first mounting hole is arranged on the first connection block, and the first metal strip is plugged into the first mounting hole through the plug-in member; a second mounting hole is arranged on the second connection block, and the second metal strip is plugged into the second mounting hole through the plug-in member.

5. The test fixture according to claim 4, characterized in that, an elastic clamping member is further arranged in the second mounting hole, and when the plug-in member is plugged into the second mounting hole, the plug-in member can be clamped with the elastic clamping member.

6. The test fixture according to claim 1, characterized in that, an external thread is arranged outside the connecting portion, and the connecting portion is threadedly connected to the first metal strip or the second metal strip through the external thread.

7. The test fixture according to claim 1, characterized in that, the test fixture further includes two first insulating gaskets and insulating fasteners; wherein, The two first insulating gaskets are arranged at the ends of the first metal strip; The first insulating gasket is embedded between the first metal strip and the second metal strip; The insulating fastener sequentially passes through the first metal strip, the first insulating gasket and the second metal strip to connect the first metal strip, the first insulating gasket and the second metal strip.

8. The test fixture according to claim 7, characterized in that the test fixture further comprises a second insulating gasket; wherein, the second insulating gasket is arranged between the two first insulating gaskets and is embedded between the first metal strip and the second metal strip.

9. A test device, characterized in that the test device comprises the test fixture according to any one of claims 1 to 6.

10. A solar cell testing system, characterized in that the solar cell testing system comprises: the test device according to claim 9 and a solar cell; wherein, the test device comprises a test fixture, and the test fixture comprises two clamping mechanisms arranged at intervals relatively, and the two clamping mechanisms are used for clamping the solar cell.

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