A high and low temperature cycle test method, system, terminal and storage medium

Abstract

The present application relates to the field of reliability testing technology, and in particular to a high-low temperature cycle test method, system, terminal, and storage medium. The method comprises: obtaining a test plan, performing a high-low temperature cycle test on a component based on the test plan, obtaining real-time test data, obtaining a real-time test temperature, and judging whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature. If the real-time test data meets the test threshold, the component is judged to be qualified; if the real-time test data does not meet the test threshold, the component is judged to be unqualified and the current test is terminated. The present application helps to improve the accuracy of component quality judgment.

Description

Technical Field

[0001] The present application relates to the field of reliability testing technology, and in particular to a high and low temperature cycle testing method, system, terminal and storage medium. Background Art

[0002] High-low temperature cycling testing, also known as thermal cycling or temperature cycling testing, is a reliability test that exposes test samples to a preset high-low temperature alternating test environment. It aims to verify the effects of simulated temperature fluctuations on the mechanical and electrical properties of electronic components. It assesses the components' ability to withstand repeated temperature changes in a short period of time and the thermal compatibility between different structural materials. It also reveals potential material and manufacturing defects, eliminates premature failures, and improves product reliability. Temperature cycling testing is suitable for revealing and evaluating the fatigue failure mechanism and reliability of "creep stress release" caused by shear stress, and is widely used in solder joint failure analysis and evaluation.

[0003] In the related art, after the components undergo high and low temperature cycle tests, the method for judging whether the quality of the components is qualified is to perform an electrical measurement on the components, and judge whether the quality of the components is qualified based on the measurement results, thereby screening out components with unqualified quality.

[0004] With respect to the above-mentioned related technologies, the inventors believe that the methods for determining whether the quality of components is qualified in the related technologies have major defects, which can easily lead to inaccurate judgment results and thus misjudge the quality of components. Summary of the Invention

[0005] In order to improve the accuracy of component quality judgment, the present application provides a high and low temperature cycle test method, system, terminal and storage medium.

[0006] In the first aspect, the present application provides a high and low temperature cycle test method, which adopts the following technical solution:

[0007] A high and low temperature cycle test method, comprising:

[0008] Get the test plan;

[0009] Performing high and low temperature cycle tests on components based on the test scheme and obtaining real-time test data;

[0010] Get real-time test temperature;

[0011] Based on the real-time test data and the real-time test temperature, determining whether the real-time test data meets a preset test threshold;

[0012] If the real-time test data meets the test threshold, the component is judged to be of qualified quality;

[0013] If the real-time test data does not meet the test threshold, the component is determined to be unqualified and the current test is terminated.

[0014] By adopting the above technical solution, real-time test temperature and real-time test data of components can be obtained, and the quality of components can be judged in all aspects and all time periods. This helps to reduce the possibility of components being misjudged as qualified due to components being in a failed state for a certain period of time but returning to normal after that period, thereby helping to improve the accuracy of component quality judgment.

[0015] Optionally, the specific steps of performing a high and low temperature cycle test on components based on the test scheme and obtaining real-time test data include:

[0016] Based on the test plan, obtaining the plate number of the aging test plate;

[0017] Based on the plate number, obtain all workstation numbers;

[0018] Based on the work station number, performing a high and low temperature cycle test on the component, and obtaining the working current and working voltage of the work station number;

[0019] The operating current and the operating voltage are used as the real-time test data.

[0020] By adopting the above technical solution, the working current and working voltage corresponding to all work station numbers are obtained, and the detection results are more comprehensive, which helps to improve the accuracy of component quality judgment.

[0021] Optionally, the specific step of determining whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature includes:

[0022] Based on the real-time test temperature, determining whether the operating current meets a preset current threshold;

[0023] If the operating current satisfies the current threshold, determining whether the operating voltage satisfies a preset voltage threshold;

[0024] If the operating voltage meets the voltage threshold, it is determined that the real-time test data meets the test threshold.

[0025] By adopting the above technical solution, it is first determined whether the working current meets the preset current threshold, and then whether the working voltage meets the preset voltage threshold, which helps to reduce the occurrence of life and property safety accidents caused by current short circuit.

[0026] Optionally, also include:

[0027] If the operating current does not meet the current threshold and / or the operating voltage does not meet the voltage threshold, it is determined that the real-time test data does not meet the test threshold.

[0028] By adopting the above technical solution, when the operating current does not meet the current threshold and / or the operating voltage does not meet the voltage threshold, it is determined that the real-time test data does not meet the test threshold, which helps to improve the accuracy of component quality judgment.

[0029] Optionally, after the step of performing a high and low temperature cycle test on the component based on the work station information and obtaining the working current and working voltage of the work station number, the method further includes:

[0030] Get the test time;

[0031] Acquire a current-time curve and a voltage-time curve based on the operating current, the operating voltage, and the test time;

[0032] A temperature-time curve is obtained based on the real-time test temperature and the test time.

[0033] By adopting the above technical solution, according to the relationship between the working current, working voltage and real-time test temperature and test time, a current time curve, a voltage time curve and a temperature time curve are established, which helps to more intuitively understand the working current and working voltage of the components at different times and different real-time test temperatures, thereby helping to more clearly judge whether the quality of the components is qualified.

[0034] Optionally, after determining that the component quality is unqualified if the real-time test data does not meet the test threshold and terminating the current test, the method further includes:

[0035] Obtain the unqualified detection rate of the target test channel;

[0036] Determining whether the unqualified detection rate exceeds a preset unqualified threshold;

[0037] If the unqualified detection rate exceeds the unqualified threshold, retesting the components corresponding to the target test channel and having unqualified quality, and acquiring retest data;

[0038] Determining whether the retest data matches the real-time test data;

[0039] Get the matching rate;

[0040] Determining whether the matching rate exceeds a preset matching rate threshold;

[0041] If the matching rate exceeds the matching rate threshold, it is determined that a test fault exists in the target test channel;

[0042] If the matching rate does not exceed the matching rate threshold, it is determined that there is no test fault in the target test channel.

[0043] By adopting the above technical solution, when the failure rate of components tested by a certain test channel is higher than the preset failure threshold, the components with unqualified quality tested by the test channel are retested. If the matching rate of the retest data and the real-time test data is higher than the preset matching rate threshold, it is determined that there is a test failure in the test channel. The staff can retest such unqualified components under a normal test channel, which helps to improve the accuracy of component quality judgment.

[0044] Optionally, also include:

[0045] Get the test humidity value;

[0046] Determining whether the test humidity value exceeds a preset humidity threshold;

[0047] If the test humidity value exceeds the humidity threshold, a humidity alarm is issued based on the test humidity value;

[0048] The test humidity value is adjusted and the test humidity value is reacquired.

[0049] By adopting the above technical solution, it is determined whether the test humidity is higher than the preset humidity threshold. When the test humidity is higher than the preset humidity threshold, the test humidity is adjusted, which helps to reduce condensation on the surface of components due to heating of components from a low temperature state, thereby reducing the occurrence of inaccurate tests.

[0050] In a second aspect, the present application also discloses a high and low temperature cycle test system, which adopts the following technical solution:

[0051] A high and low temperature cycle test system, comprising:

[0052] The first acquisition module is used to obtain the test plan;

[0053] An execution module is used to perform high and low temperature cycle tests on components based on the test plan and obtain real-time test data;

[0054] The second acquisition module is used to obtain the real-time test temperature;

[0055] A judgment module, configured to judge whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature;

[0056] a second execution module, configured to determine that the component is of qualified quality if the real-time test data meets the test threshold;

[0057] The third execution module is used to determine that the component quality is unqualified and terminate the current test if the real-time test data does not meet the test threshold.

[0058] By adopting the above technical solution, real-time test temperature and real-time test data of components can be obtained, and the quality of components can be judged in all aspects and all time periods. This helps to reduce the possibility of components being misjudged as qualified due to components being in a failed state for a certain period of time but returning to normal after that period, thereby helping to improve the accuracy of component quality judgment.

[0059] In a third aspect, the present application provides a computer device that adopts the following technical solution:

[0060] An intelligent terminal comprises a memory and a processor, wherein the memory is used to store a computer program that can be run on the processor, and when the processor loads the computer program, the method of the first aspect is executed.

[0061] By adopting the above technical solution, a computer program is generated based on the method of the first aspect and stored in a memory to be loaded and executed by a processor, thereby making an intelligent terminal based on the memory and the processor, which is convenient for users to use.

[0062] In a fourth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution:

[0063] A computer-readable storage medium stores a computer program, and when the computer program is loaded by a processor, the method of the first aspect is executed.

[0064] By adopting the above technical solution, a computer program is generated based on the method of the first aspect and stored in a computer-readable storage medium so as to be loaded and executed by a processor. The computer-readable storage medium facilitates the readability and storage of the computer program.

[0065] In summary, this application has the following beneficial technical effects:

[0066] Acquiring real-time test temperature and real-time test data of components to judge whether the quality of components is qualified in all aspects and all time periods helps reduce the possibility of components being misjudged as qualified due to components being in a failed state for a certain period of time but returning to normal after that period, thereby helping to improve the accuracy of component quality judgment. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 This is a main flow chart of a high and low temperature cycle test method according to an embodiment of the present application;

[0068] Figure 2 yes Figure 1 Specific step flow chart of step S200;

[0069] Figure 3 yes Figure 1 Specific steps of step S400 are shown in the flowchart;

[0070] Figure 4 It is a flowchart of the specific steps for obtaining the current time curve, voltage time curve and time temperature curve.

[0071] Description of reference numerals:

[0072] 1. First acquisition module; 2. First execution module; 3. Second acquisition module; 4. Judgment module; 5. Second execution module; 6. Third execution module. DETAILED DESCRIPTION

[0073] During the high and low temperature cycle test, the components to be tested are installed on the aging test board. The aging test board is driven by the driving board, so that it moves back and forth between the high temperature chamber and the low temperature chamber of the high and low temperature chamber. Therefore, the driving board and the aging test board need to be connected by a cable. A hole is opened on the side of the high and low temperature test chamber. One end of the cable is connected to the control and detection board outside the high and low temperature chamber, and the other end passes through the opening on the side of the high and low temperature chamber and is connected to the aging test board inside the high and low temperature chamber.

[0074] Cable selection: The cable length inside the high and low temperature test chamber should be as short as possible without affecting the reciprocating motion of the aging test board. Use high and low temperature resistant cables with a temperature range of -70℃ to 200℃ to adapt to the test temperature of the high and low temperature test chamber.

[0075] In a first aspect, the present application discloses a high and low temperature cycle test method.

[0076] Reference Figure 1 A high and low temperature cycle test method includes steps S100 to S600:

[0077] Step S100: Obtain a test plan.

[0078] Specifically, the test solution of this embodiment is a test solution for performing high and low temperature cycle tests on components.

[0079] Step S200: Perform high and low temperature cycle tests on components based on the test plan and obtain real-time test data.

[0080] Specifically, in this embodiment, the real-time test data includes the operating current and operating voltage of the components.

[0081] Step S300: Acquire real-time test temperature.

[0082] Specifically, in this embodiment, the real-time test temperature refers to the real-time temperature of the components when undergoing high and low temperature cycle tests, that is, the real-time temperature in the high and low temperature test chamber. In this embodiment, the real-time test temperature range is greater than or equal to -70 degrees Celsius and less than or equal to 200 degrees Celsius.

[0083] Step S400: Based on the real-time test data and the real-time test temperature, determine whether the real-time test data meets a preset test threshold.

[0084] Specifically, in this embodiment, the preset test threshold is the requirement for determining whether the quality of the component is qualified, and the test threshold includes a current threshold and a voltage threshold.

[0085] Step S500: If the real-time test data meets the test threshold, the component is determined to be of qualified quality.

[0086] Specifically, in this embodiment, the real-time test data meeting the test threshold means that the operating current of the component meets the current threshold and the operating voltage of the component meets the voltage threshold.

[0087] Step S600: If the real-time test data does not meet the test threshold, the component quality is determined to be unqualified and the current test is terminated.

[0088] The high and low temperature cycle test method provided by the test channel in this embodiment obtains real-time test temperature and real-time test data of components, and judges whether the quality of components is qualified in all aspects and all time periods. It helps to reduce the possibility of components being misjudged as qualified due to components being in a failed state for a certain period of time but returning to normal after the period, thereby helping to improve the accuracy of component quality judgment.

[0089] Reference Figure 2 In one implementation of this embodiment, the specific steps of step S200 include steps S210 to S240:

[0090] Step S210: Based on the test plan, obtain the board number of the aging test board.

[0091] Specifically, in this embodiment, a test platform for performing high and low temperature cycle tests on components is provided with a total of four control and detection areas, each area corresponds to a test channel, each test channel includes an aging test board and a control detection board, each control detection board is independently controlled by a set of microcomputers, corresponding to the control of an aging test board, real-time detection of the test parameters of each station and control of the test status and test process of the test channel.

[0092] In this embodiment, the aging test board is made of polyimide, which is one of the best organic polymer materials with comprehensive performance, high temperature resistance of over 400°C, long-term use temperature range of -200°C to 300°C, no obvious melting point, and high insulation performance.

[0093] In this embodiment, the burn-in test board uses a 100-core 2.54 interface, which allows for a larger number of workstations when burning in large packaged devices. The power ground and sampling ground are separated to improve sampling accuracy. Simultaneously, the sampling ground is added to address the problem of large test errors at each workstation when the current is high. With single-line sampling, the burn-in current increases with the number of workstations, and the voltage difference on the ground wire cannot be ignored, inevitably resulting in low sampling accuracy and poor consistency. If the interface allows, the number of sampling ground wires is increased so that the test results meet Kelvin dual-line sampling requirements, thereby helping to improve sampling accuracy.

[0094] Step S220: Based on the plate number, obtain all workstation numbers.

[0095] Specifically, in this embodiment, each aging test board has 64 detection test stations, and the test channel can be equipped with four aging test boards at the same time, with a total of 64 / board × 4 boards = 256 detection test station numbers; it is worth noting that the number of station numbers is related to the shape and power of the components being tested. The larger the volume and power of the components, the fewer the test stations will be.

[0096] Step S230: Based on the work station number, perform a high and low temperature cycle test on the component, and obtain the working current and working voltage of the work station number.

[0097] Specifically, in this embodiment, the working current and working voltage of the work station number are obtained to determine whether the quality of the component under test is qualified.

[0098] Step S240: using the operating current and the operating voltage as real-time test data.

[0099] The high and low temperature cycle test method provided in this embodiment obtains the working current and working voltage corresponding to all work station numbers, and the test results are more comprehensive, which helps to improve the accuracy of component quality judgment.

[0100] Reference Figure 3In one implementation of this embodiment, the specific steps of step S400 include steps S410 to S430:

[0101] Step S410: Based on the real-time test temperature, determine whether the operating current meets a preset current threshold.

[0102] Specifically, in this embodiment, the current threshold includes a minimum current threshold and a maximum current threshold, wherein the minimum current threshold is 0.5 mA and the maximum current threshold is 10A.

[0103] Step S420: If the operating current satisfies the current threshold, determine whether the operating voltage satisfies a preset voltage threshold.

[0104] Specifically, in this embodiment, the voltage threshold includes a minimum voltage threshold and a maximum voltage threshold, wherein the minimum voltage threshold is 0 and the maximum voltage threshold is 60V.

[0105] Step S430: If the operating voltage meets the voltage threshold, then determine whether the real-time test data meets the test threshold.

[0106] The high and low temperature cycle test method provided in this embodiment first determines whether the operating current meets the preset current threshold, and then determines whether the operating voltage meets the preset voltage threshold, which helps to reduce the occurrence of life and property safety accidents caused by current short circuits.

[0107] In one implementation of this embodiment, a high and low temperature cycle test method further includes step S440:

[0108] Step S440: If the operating current does not meet the current threshold and / or the operating voltage does not meet the voltage threshold, it is determined that the real-time test data does not meet the test threshold.

[0109] Reference Figure 4 In one implementation of this embodiment, after step S230, steps S231 to S233 are further included:

[0110] Step S231: Obtain test time.

[0111] Specifically, in this embodiment, the test time includes the test start time and the test real time.

[0112] Step S232: Based on the operating current, the operating voltage, and the test time, obtain a current-time curve and a voltage-time curve.

[0113] Step S233: Obtain a temperature-time curve based on the real-time test temperature and test time.

[0114] The high and low temperature cycle test method provided in this embodiment establishes a current-time curve, a voltage-time curve, and a temperature-time curve based on the relationship between the working current, working voltage, and real-time test temperature and test time, which helps to more intuitively understand the working current and working voltage of the components at different times and different real-time test temperatures, thereby helping to more clearly judge whether the quality of the components is qualified.

[0115] In addition, in another embodiment of the present application, the current time curve, the voltage time curve and the temperature time curve can be fitted on the same curve graph, which helps to more clearly observe the data of the working current and the working voltage at different test time points (segments) and different real-time test temperatures, thereby helping to more clearly and accurately judge whether the quality of the components is qualified.

[0116] In one implementation of this embodiment, after step S600, steps S610 to S680 are further included:

[0117] Step S610: Obtain the unqualified detection rate of the target test channel.

[0118] Specifically, in this embodiment, the target test channel refers to a test channel through which components detected by the test channel have unqualified quality, and the unqualified detection efficiency of the target test channel refers to the unqualified rate of components detected by the test channel.

[0119] Step S620: Determine whether the unqualified detection rate exceeds a preset unqualified threshold.

[0120] Specifically, in this embodiment, the unqualified threshold can be set according to the user's wishes, such as 50% or 60%.

[0121] Step S630: If the unqualified detection rate exceeds the unqualified threshold, retest the components corresponding to the target test channel and with unqualified quality, and obtain retest data.

[0122] Specifically, in this embodiment, when retesting components that fail the test, different test channels are selected to help obtain more accurate retest results.

[0123] Step S640: Determine whether the retest data matches the real-time test data.

[0124] Specifically, in this embodiment, whether the retest data matches the real-time test data refers to whether the difference between the retest data and the real-time test data is within the allowable error range. If so, they match; if not, they do not match.

[0125] Step S650: Obtain the matching rate.

[0126] Specifically, in this embodiment, the matching rate refers to the ratio of the number of retest data that matches the real-time test data to the total number of retest data.

[0127] Step S660: Determine whether the matching rate exceeds a preset matching rate threshold.

[0128] Specifically, in this embodiment, the preset matching rate threshold may be 90% or 95%.

[0129] Step S670: If the matching rate exceeds the matching rate threshold, it is determined that a test fault exists in the target test channel.

[0130] Specifically, in this embodiment, if there is a test failure in the target test channel, it means that there is a failure in the target test channel itself. Therefore, it is necessary to retest the components detected by the target test channel and re-determine whether the quality of such components is qualified, which helps to reduce the misjudgment of unqualified component quality due to failure in the test channel.

[0131] Step S680: If the matching rate does not exceed the matching rate threshold, it is determined that there is no test fault in the target test channel.

[0132] Specifically, in this embodiment, if there is no test fault in the target test channel, it means that there is no fault in the target test channel itself, and thus the existing determination of whether the component quality is qualified is maintained.

[0133] The high and low temperature cycle test method provided in this embodiment is that when the failure rate of components tested in a certain test channel is higher than a preset failure threshold, the components with unqualified quality tested in the test channel are retested. If the matching rate between the retest data and the real-time test data is higher than the preset matching rate threshold, it is determined that there is a test failure in the test channel. The staff can retest such unqualified components under a normal test channel, which helps to improve the accuracy of component quality judgment.

[0134] In one implementation of this embodiment, a high-low temperature cycle test method further includes steps S100A to S400A:

[0135] Step S100A: Obtain the test humidity value.

[0136] Specifically, in this embodiment, the test humidity refers to the humidity value in the high and low temperature test box.

[0137] Step S200A: Determine whether the test humidity value exceeds a preset humidity threshold.

[0138] Specifically, in this embodiment, the humidity threshold can be set according to the relative humidity. In this embodiment, the relative humidity is not greater than 80%.

[0139] Step S300A: If the test humidity value exceeds the humidity threshold, a humidity alarm is issued based on the test humidity value.

[0140] Specifically, in this embodiment, when the test humidity value exceeds the humidity threshold, an alarm is issued and the difference between the current test humidity value and the humidity threshold is prompted.

[0141] Step S400A: Adjust the test humidity value and reacquire the test humidity value.

[0142] Specifically, in this embodiment, a dry air blowing device can be used to adjust the test humidity value, and dry air can be blown into the high and low temperature test chamber cavity at low pressure. Due to the moisture adsorption capacity of low dew point air, the water in the test chamber will be adsorbed by the low dew point dry air and blown out of the test chamber by the subsequent dry air, thereby achieving the purpose of drying the air in the test chamber.

[0143] The high and low temperature cycle test method provided in this embodiment determines whether the test humidity is higher than a preset humidity threshold. When the test humidity is higher than the preset humidity threshold, the test humidity is adjusted to help reduce condensation on the surface of components due to heating of components from a low temperature state, thereby reducing the occurrence of inaccurate tests.

[0144] The implementation principle of a high and low temperature cycle test method in an embodiment of the present application is: obtain a test plan, perform a high and low temperature cycle test on components based on the test plan, and obtain real-time test data and real-time test temperature. Based on the real-time test data and the real-time test temperature, determine whether the real-time test data meets a preset test threshold. If the real-time test data meets the test threshold, the component quality is determined to be qualified; if the real-time test data does not meet the test threshold, the component quality is determined to be unqualified, and the current test is terminated.

[0145] In a second aspect, the present application also discloses a high and low temperature cycle test system.

[0146] A high and low temperature cycle test system, comprising:

[0147] The first acquisition module 1 is used to obtain a test plan;

[0148] The first execution module 2 is used to perform high and low temperature cycle tests on components based on the test plan and obtain real-time test data;

[0149] The second acquisition module 3 is used to obtain the real-time test temperature;

[0150] The judgment module 4 is used to judge whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature;

[0151] The second execution module 5 is used to determine whether the component quality is qualified if the real-time test data meets the test threshold;

[0152] The third execution module 6 is used to determine that the component quality is unqualified and terminate the current test if the real-time test data does not meet the test threshold.

[0153] The implementation principle of a high and low temperature cycle test system in an embodiment of the present application is as follows: the first acquisition module 1 acquires a test plan and sends the test plan to the first execution module 2; the first execution module 2 performs a high and low temperature cycle test on the components based on the test plan, and acquires real-time test data, and sends the real-time test data to the judgment module 4; the second acquisition module 3 acquires the real-time test temperature, and sends the implemented real-time test temperature to the judgment module 4; the judgment module 4 judges whether the real-time test data meets the preset test threshold based on the real-time test data and the real-time test temperature; if the real-time test data meets the test threshold, the judgment module 4 sends the judgment result to the second execution module 5; the second execution module 5 determines that the quality of the component is qualified; if the real-time test data does not meet the test threshold, the judgment module 4 sends the judgment result to the third execution module 6; the third execution module 6 determines that the quality of the component is unqualified and terminates the current test, thereby achieving the same technical effect as the aforementioned high and low temperature cycle test method.

[0154] In a third aspect, an embodiment of the present application discloses an intelligent terminal comprising a memory and a processor, wherein the memory is used to store a computer program that can be run on the processor, and when the processor loads the computer program, it executes a high and low temperature cycle test method of the above embodiment.

[0155] In a fourth aspect, an embodiment of the present application discloses a computer-readable storage medium, and a computer program is stored in the computer-readable storage medium, wherein when the computer program is loaded by a processor, a high and low temperature cycle test method of the above embodiment is executed.

[0156] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.

Claims

1. A high and low temperature cycle test method, characterized in that: include: Get the test plan; Performing high and low temperature cycle tests on components based on the test scheme and obtaining real-time test data; Get real-time test temperature; Based on the real-time test data and the real-time test temperature, determining whether the real-time test data meets a preset test threshold; If the real-time test data meets the test threshold, the component is judged to be of qualified quality; If the real-time test data does not meet the test threshold, the component is determined to be unqualified and the current test is terminated; The specific steps of performing high and low temperature cycle tests on components based on the test scheme and obtaining real-time test data include: Based on the test plan, obtaining the plate number of the aging test plate; Based on the plate number, obtain all workstation numbers; Based on the work station number, performing a high and low temperature cycle test on the component, and obtaining the working current and working voltage of the work station number; Using the operating current and the operating voltage as the real-time test data; The specific steps of determining whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature include: Based on the real-time test temperature, determining whether the operating current meets a preset current threshold; If the operating current satisfies the current threshold, determining whether the operating voltage satisfies a preset voltage threshold; If the operating voltage satisfies the voltage threshold, determining that the real-time test data satisfies the test threshold; The test platform is used to perform high and low temperature cycle tests on components. It has four control and detection areas. Each area corresponds to a test channel. Each test channel includes a burn-in test board and a control and detection board. The power ground and sampling ground are separated. The number of sampling grounds can be increased if the interface allows. After determining that the component quality is unqualified if the real-time test data does not meet the test threshold and terminating the current test, the method further includes: Obtain the unqualified detection rate of the target test channel; Determining whether the unqualified detection rate exceeds a preset unqualified threshold; If the unqualified detection rate exceeds the unqualified threshold, retesting the components corresponding to the target test channel and having unqualified quality, and acquiring retest data; Determining whether the retest data matches the real-time test data; Get the matching rate; Determining whether the matching rate exceeds a preset matching rate threshold; If the matching rate exceeds the matching rate threshold, it is determined that a test fault exists in the target test channel; If the matching rate does not exceed the matching rate threshold, it is determined that there is no test fault in the target test channel.

2. A high and low temperature cycle test method according to claim 1, characterized in that: Also includes: If the operating current does not meet the current threshold and / or the operating voltage does not meet the voltage threshold, it is determined that the real-time test data does not meet the test threshold.

3. A high and low temperature cycle test method according to claim 1, characterized in that: After the step of performing a high and low temperature cycle test on the component based on the work station number and obtaining the working current and working voltage of the work station number, the method further includes: Get the test time; Acquire a current-time curve and a voltage-time curve based on the operating current, the operating voltage, and the test time; A temperature-time curve is obtained based on the real-time test temperature and the test time.

4. A high and low temperature cycle test method according to claim 1, characterized in that: Also includes: Get the test humidity value; Determining whether the test humidity value exceeds a preset humidity threshold; If the test humidity value exceeds the humidity threshold, a humidity alarm is issued based on the test humidity value; The test humidity value is adjusted and the test humidity value is reacquired.

5. A high and low temperature cycle test system, characterized in that: include: A first acquisition module (1) is used to acquire a test plan; A first execution module (2) is used to perform a high and low temperature cycle test on the components based on the test scheme and obtain real-time test data; A second acquisition module (3) is used to obtain real-time test temperature; A judgment module (4) is used to judge whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature; A second execution module (5) is configured to determine that the component is of qualified quality if the real-time test data meets the test threshold; A third execution module (6) is configured to determine that the component quality is unqualified and terminate the current test if the real-time test data does not meet the test threshold; The specific steps of performing high and low temperature cycle tests on components based on the test scheme and obtaining real-time test data include: Based on the test plan, obtaining the plate number of the aging test plate; Based on the plate number, obtain all workstation numbers; Based on the work station number, performing a high and low temperature cycle test on the component, and obtaining the working current and working voltage of the work station number; Using the operating current and the operating voltage as the real-time test data; The specific steps of determining whether the real-time test data meets a preset test threshold based on the real-time test data and the real-time test temperature include: Based on the real-time test temperature, determining whether the operating current meets a preset current threshold; If the operating current satisfies the current threshold, determining whether the operating voltage satisfies a preset voltage threshold; If the operating voltage satisfies the voltage threshold, determining that the real-time test data satisfies the test threshold; The test platform is used to perform high and low temperature cycle tests on components. It has four control and detection areas. Each area corresponds to a test channel. Each test channel includes a burn-in test board and a control and detection board. The power ground and sampling ground are separated. The number of sampling grounds can be increased if the interface allows. After determining that the component quality is unqualified if the real-time test data does not meet the test threshold and terminating the current test, the method further includes: Obtain the unqualified detection rate of the target test channel; Determining whether the unqualified detection rate exceeds a preset unqualified threshold; If the unqualified detection rate exceeds the unqualified threshold, retesting the components corresponding to the target test channel and having unqualified quality, and acquiring retest data; Determining whether the retest data matches the real-time test data; Get the matching rate; Determining whether the matching rate exceeds a preset matching rate threshold; If the matching rate exceeds the matching rate threshold, it is determined that a test fault exists in the target test channel; If the matching rate does not exceed the matching rate threshold, it is determined that there is no test fault in the target test channel.

6. An intelligent terminal, comprising a memory and a processor, characterized in that: The memory is used to store a computer program that can be run on the processor, and when the processor loads the computer program, it executes the method according to any one of claims 1 to 4.

7. A computer-readable storage medium storing a computer program, wherein: When the computer program is loaded into a processor, the method according to any one of claims 1 to 4 is executed.

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