Switching tube life diagnosis method, device, equipment, medium and program product

Abstract

The application relates to a switching tube life diagnosis method, device, equipment, medium and program product, the method comprises the following steps: obtaining the initial driving threshold voltage of a target switching tube; determining the failure driving threshold voltage of the target switching tube according to the initial driving threshold voltage; applying the failure driving threshold voltage to the target switching tube, and determining whether the target switching tube is in an impending failure state according to whether the conduction state of the target switching tube meets a preset condition. The method can diagnose the life of the switching tube in real time during the working of the switching tube, avoids the interference of a complex environment on the measurement of the life of the switching tube, and further improves the accuracy of the life diagnosis of the switching tube.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of semiconductor technology, in particular to a switching tube life diagnosis method, device, equipment, medium and program product. BACKGROUND

[0002] MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) is the core device of electronic switch, which is widely used in power electronic equipment. Because of long working time and complex working environment, MOSFET is prone to aging and damage. The failure of MOSFET will cause accidents and high maintenance costs. Therefore, it is very important to predict the life of MOSFET.

[0003] At present, the conventional method for predicting the life of MOSFET is to provide a certain stress environment for the MOSFET sample, detect the change rule of parameters such as threshold voltage and saturation drain voltage, obtain a corresponding life prediction model, and predict the life of MOSFET through the prediction model.

[0004] However, the actual working environment of MOSFET is complex and changeable, and the life prediction model cannot completely and accurately restore the actual working environment of MOSFET. Therefore, the accuracy of predicting the life of MOSFET through the life prediction model is low. SUMMARY

[0005] Therefore, it is necessary to provide a switching tube life diagnosis method, device, equipment, medium and program product capable of accurately measuring the life of switching tube in different environments.

[0006] In a first aspect, the present application provides a switching tube life diagnosis method, which comprises:

[0007] obtaining an initial drive threshold voltage of a target switching tube; determining a failure drive threshold voltage of the target switching tube according to the initial drive threshold voltage; applying the failure drive threshold voltage to the target switching tube, and determining whether the target switching tube is in an impending failure state according to whether the conduction state of the target switching tube meets a preset condition.

[0008] In one of the embodiments, obtaining the initial drive threshold voltage of the target switching tube comprises: obtaining a maximum design drive threshold voltage and a minimum design drive threshold voltage of the target switching tube; gradually adjusting the drive threshold voltage output to the target switching tube in a voltage range between the maximum design drive threshold voltage and the minimum design drive threshold voltage until the conduction state of the target switching tube meets the preset condition; and taking the drive threshold voltage output to the target switching tube when the conduction state meets the preset condition as the initial drive threshold voltage.

[0009] In one of the embodiments, the method further comprises determining the preset condition according to whether the current value through the target switch tube is greater than a current threshold value, the current threshold value being determined according to circuit elements in a circuit in which the target switch tube is located.

[0010] In one of the embodiments, the circuit in which the target switch tube is located comprises an inductor connected in series with the target switch tube, and the current threshold value is calculated according to a voltage applied to the inductor, a pulse width of a drive threshold voltage applied to the target switch tube, and an inductance value of the inductor.

[0011] In one of the embodiments, the method further comprises: if the conduction state of the target switch tube is that the current value through the target switch tube is greater than or equal to the current threshold value, determining that the conduction state of the target switch tube meets the preset condition; and if the conduction state of the target switch tube is that the current value through the target switch tube is less than the current threshold value, determining that the conduction state of the target switch tube does not meet the preset condition.

[0012] In one of the embodiments, the method further comprises outputting a warning signal after determining that the target switch tube is in the state of being about to fail.

[0013] In one of the embodiments, determining the failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage comprises: obtaining a sensitivity; and determining the failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage and the sensitivity.

[0014] In one of the embodiments, applying the failure drive threshold voltage to the target switch tube comprises: before driving the target switch tube to be conductive each time, performing the step of applying the failure drive threshold voltage to the target switch tube.

[0015] In a second aspect, the present application further provides a switch tube life diagnosis device, which comprises:

[0016] a control unit, a drive unit, a target switch tube, and a detection unit, wherein the drive unit is connected to a gate of the target switch tube, and the control unit is connected to the drive unit and the detection unit respectively; the control unit is configured to control the drive unit to apply a failure drive threshold voltage to the target switch tube, wherein the failure drive threshold voltage is determined according to an initial drive threshold voltage of the target switch tube; the control unit is further configured to control the detection unit to detect a conduction state of the target switch tube, and to determine whether the target switch tube is in a state of being about to fail according to whether the conduction state of the target switch tube meets a preset condition.

[0017] In one of the embodiments, the control unit is further configured to control the driving unit to gradually adjust the driving threshold voltage output to the target switch tube within a voltage range between the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switch tube; the control unit is further configured to control the detecting unit to detect the conduction state of the target switch tube during the gradual adjustment of the driving threshold voltage output to the target switch tube by the driving unit; and the control unit is further configured to control the driving unit to stop outputting the driving threshold voltage to the target switch tube when the conduction state of the target switch tube meets the preset condition, and to take the driving threshold voltage output to the target switch tube by the driving unit when the conduction state meets the preset condition as the initial driving threshold voltage.

[0018] In one of the embodiments, the detecting unit is configured to detect the current value passing through the target switch tube; and the control unit is configured to determine the preset condition according to whether the current value is greater than a current threshold value, the current threshold value being determined according to circuit elements in the circuit in which the target switch tube is located.

[0019] In one of the embodiments, the device further comprises an inductor and a power supply, the power supply, the inductor and the first pole of the target switch tube being connected in series, and the current threshold value being calculated according to a voltage applied to the inductor by the power supply, a pulse width of the driving threshold voltage applied to the target switch tube and an inductance value of the inductor.

[0020] In one of the embodiments, the device further comprises a resistor, the second pole of the target switch tube being connected to the resistor and then grounded, and the detecting unit being configured to detect a current value passing through the resistor, wherein the current value passing through the resistor is consistent with the current value passing through the target switch tube.

[0021] In one of the embodiments, the device further comprises an alarm unit, the alarm unit being connected to the control unit, and the control unit being further configured to control the alarm unit to output a warning signal when it is determined that the target switch tube is in the state of being about to fail.

[0022] In one of the embodiments, before driving the target switch tube to conduct each time, the control unit controls the driving unit to apply a failure driving threshold voltage to the target switch tube.

[0023] In a third aspect, the present application further provides a computer device, comprising a memory and a processor, the memory storing a computer program, and the processor implementing the steps of the method in any one of the first aspect when executing the computer program.

[0024] In a fourth aspect, the present application further provides a computer readable storage medium, storing a computer program, and the computer program implementing the steps of the method in any one of the first aspect when executed by a processor.

[0025] In a fifth aspect, the present application also provides a computer program product comprising a computer program which, when executed by a processor, implements the steps of the method of any one of the above first aspect.

[0026] The switch tube life diagnosis method, device, equipment, medium and program product can acquire the initial drive threshold voltage of the target switch tube, determine the failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage, and then apply the failure drive threshold voltage to the target switch tube, so as to determine whether the target switch tube is in the state of being about to fail according to whether the conduction state of the target switch tube meets the preset condition. The present application can diagnose the life of the switch tube in real time in the working of the switch tube, avoid the interference of a complex environment on the measurement of the life of the switch tube, and thus improve the accuracy of the diagnosis of the life of the switch tube. BRIEF DESCRIPTION OF DRAWINGS

[0027] Figure 1 A flowchart of the switch tube life diagnosis in an embodiment;

[0028] Figure 2 A flowchart of acquiring the initial drive threshold voltage in an embodiment;

[0029] Figure 3 A structural diagram of the switch tube life diagnosis device in an embodiment;

[0030] Figure 4 A structural diagram of the switch tube life diagnosis device in another embodiment;

[0031] Figure 5 A structural diagram of the switch tube life diagnosis device in another embodiment;

[0032] Figure 6 A structural diagram of the switch tube life diagnosis device in another embodiment;

[0033] Figure 7 An internal structural diagram of the computer equipment in an embodiment. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical scheme and advantages of the present application clearer, the present application is further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application.

[0035] The switch tube is used in the control circuit, wherein the MOSFET is used as a switch tube, and is widely used in high-frequency and high-voltage power systems due to high blocking voltage, high working frequency, strong high-temperature resistance, low on-state resistance and small switching loss. With the continuous development of power electronics technology, more and more fields such as aerospace, aviation, oil exploration, nuclear energy, communication and the like urgently need electronic devices capable of working in extreme environments such as high temperature and high frequency. Working in extreme environments such as high temperature and high frequency will accelerate the aging of electronic devices. In order to avoid the influence of aging failure of the MOSFET on the normal operation of the entire device or system, it is necessary to monitor the state of the MOSFET, predict the service life of the MOSFET according to the monitored parameters, and then take relevant maintenance measures such as replacing the MOSFET.

[0036] In one embodiment, as shown in Figure 1 A switch tube life diagnosis method is provided, and the embodiment takes the electronic device provided with a switch tube as an example for description. The switch tube may be, for example, a MOSFET, and the electronic device may be, for example, an elevator control device installed in an elevator. It should be noted that the specific type of the switch tube is not limited in the embodiment, and the specific type of the electronic device is also not limited in the embodiment. Any electronic device provided with a switch tube can be used. In the embodiment, the method comprises the following steps:

[0037] Step 101: obtaining an initial drive threshold voltage of a target switch tube.

[0038] Specifically, the target switch tube is a switch tube whose service life is diagnosed. The target switch tube may be an N-type MOSFET or a P-type MOSFET. The pin of the MOSFET has three pins: source, gate and drain. When the voltage applied to the gate of the MOSFET is greater than the threshold voltage of the MOSFET, the MOSFET is turned on. If the MOSFET is N-type, the current flows from the drain to the source, and if the MOSFET is P-type, the current flows from the source to the drain. The threshold voltage of the target switch tube decreases with the working time, and the initial drive threshold voltage is the threshold voltage of the target switch tube before it is used for work.

[0039] Optionally, when the target switch tube is initially used for work, the voltage applied to the gate of the target switch tube is adjusted, and then it is detected whether the target switch tube is turned on. The minimum voltage that can turn on the target switch tube is the initial drive threshold voltage of the target switch tube. For example, in an elevator system, when the target switch tube is initially used, the voltage applied to the gate of the target switch tube is increased by 0.01 each time from 0, and then it is detected whether the target switch tube has current passing through. When the applied voltage is 2.11V, it is detected that the target switch tube has current passing through, and the initial drive threshold voltage of the target switch tube is 2.11V.

[0040] For the new target switch tube, although the initial drive threshold voltage of the target switch tube can be obtained from the data manual, the obtained value is a range value, not the accurate initial drive threshold voltage of the target switch tube. For the old target switch tube, in the new operation, the accurate initial drive threshold voltage of the target switch tube in the new operation can be obtained by the above method. Therefore, the accurate value of the initial drive threshold voltage of the target switch tube can be obtained by the above method, so as to ensure the accuracy of the failure drive threshold voltage determined by the initial drive threshold voltage, and further improve the accuracy of the switch tube life diagnosis.

[0041] In step 102, the failure drive threshold voltage of the target switch tube is determined according to the initial drive threshold voltage.

[0042] Specifically, the threshold voltage of the target switch tube will decrease with the increase of the working time, and when the threshold voltage of the target switch tube decreases to a certain value, the target switch tube is considered to be failed, and the failure drive threshold voltage is the threshold voltage of the target switch tube representing the failure of the target switch tube.

[0043] Optionally, according to the specification of MOSFET electrical characteristics in the International Electrotechnical Commission Standard IEC62373-2006, if the threshold voltage of the MOSFET exceeds the initial value by ±10%, the MOSFET is considered to be failed. Therefore, the failure drive threshold voltage of the target switch tube can be at least 0.9 times the initial drive threshold voltage. For example, the initial drive threshold voltage of the target switch tube is 3V, and in the operation of the elevator system, the target switch tube is required to be replaced when the threshold voltage of the target switch tube decreases to 8% of the initial value. Therefore, the failure drive threshold voltage of the target switch tube is 3×(1-8%)V=2.76V.

[0044] In step 103, the failure drive threshold voltage is applied to the target switch tube, and whether the target switch tube is in the state of being about to fail is determined according to whether the conduction state of the target switch tube meets the preset condition.

[0045] Specifically, the conduction state of the target switch tube can be represented by the current value passing through the target switch tube. When the failure drive threshold voltage applied to the target switch tube is greater than or equal to the threshold voltage of the target switch tube, the target switch tube will be turned on and current will pass through. The preset condition is a standard set for determining whether the target switch tube is about to fail, which can be set according to needs.

[0046] Optionally, before or after each operation of the target switch tube, a failure driving threshold voltage is applied to the gate of the target switch tube, and then the current value of the target switch tube is detected. If the detected current value meets the preset condition, it indicates that the target switch tube is in a state of impending failure. If the detected current does not meet the preset condition, it indicates that the target switch tube can continue to be put into normal operation. It should be noted that the failure driving threshold voltage applied to the gate of the target switch tube is a voltage with a fixed pulse width t0.

[0047] Before or after each operation of the target switch tube, the target switch tube is judged whether to fail by applying a failure driving threshold voltage to the target switch tube, which realizes the purpose of diagnosing the life of the target switch tube in real time. This method is not affected by the environment and does not interfere with the normal work of the system in which the target switch tube is located.

[0048] In summary, when the target switch tube is initially operated, the voltage applied to the gate of the target switch tube is adjusted to the minimum voltage that can make the target switch tube have current passing through, which is the initial driving threshold voltage of the target switch tube. Then, according to the standard requirement of the threshold voltage of the target switch tube in different operations and the initial driving threshold voltage of the target switch tube, the failure driving threshold voltage of the target switch tube is obtained. Then, before or after each operation of the target switch tube, the failure driving threshold voltage is applied to the gate of the target switch tube, so as to judge whether the target switch tube is in a state of impending failure according to whether the detected conduction state of the target switch tube meets the preset condition. The present application can diagnose the life of the switch tube in real time during the operation of the switch tube, avoid the interference of complex environment on the measurement of the life of the switch tube, and thus improve the accuracy of the life diagnosis of the switch tube.

[0049] In one embodiment, as shown in FIG. 1, a flowchart for obtaining an initial driving threshold voltage is shown. The steps for obtaining the initial driving threshold voltage of the target switch tube include: Figure 2

[0050] Step 201, obtaining the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switch tube.

[0051] Specifically, according to the model of the target switch tube, the value interval of the driving threshold voltage of the target switch tube can be obtained from the data manual. The maximum value in the value interval is taken as the maximum design driving threshold voltage of the target switch tube, and the minimum value in the value interval is taken as the minimum design driving threshold voltage of the target switch tube. For example, the model of the target switch tube is VBZM7N60, and the data interval of the design driving threshold voltage of the target switch tube is [2.1V, 2.5V] obtained from the data manual. The maximum design driving threshold voltage is 2.5V, and the minimum design driving threshold voltage is 2.1V. ​

[0052] Step 202, gradually adjust the drive threshold voltage output to the target switch tube in the voltage range between the maximum design drive threshold voltage and the minimum design drive threshold voltage until the conduction state of the target switch tube meets the preset condition.

[0053] Step 203, the conduction state symbol and the drive threshold voltage output to the target switch tube at the preset condition are taken as the initial drive threshold voltage.

[0054] Specifically, the drive threshold voltage is the voltage applied to the gate of the target switch tube, which is within the range of the maximum design drive threshold voltage and the minimum design drive threshold voltage of the target switch tube. Gradually adjusting the drive threshold voltage output to the target switch tube can be based on the minimum design drive threshold voltage of the target switch tube, adjusting the drive threshold voltage output to the target switch tube from small to large according to the preset algorithm, or based on the maximum design drive threshold voltage of the target switch tube, adjusting the drive threshold voltage output to the target switch tube from large to small according to the preset algorithm. The preset algorithm can be V i equal to the drive threshold voltage V i-1 output to the target switch tube last time, and the sum of the increment A, that is, V i = V i-1 +A, or the preset algorithm can be V i =A×V i-1 It should be noted that the value of the increment A, the drive threshold voltage V i-1 output to the target switch tube last time, and the relationship of the increment A can be set as needed, which is not limited here.

[0055] Optionally, when the target switch tube is initially operated, the minimum design drive threshold voltage is taken as the starting point, and the drive threshold voltage output to the gate of the target switch tube is adjusted in the way of increasing the value A from small to large. When it is detected that the conduction state of the target switch tube meets the first preset condition, the drive threshold voltage output to the target switch tube at this time is the initial drive threshold voltage of the target switch tube.

[0056] Optionally, when the target switch tube is initially operated, the maximum design drive threshold voltage is taken as the starting point, and the drive threshold voltage output to the gate of the target switch tube is adjusted in the way of decreasing the value A from large to small. When it is detected that the conduction state of the target switch tube meets the second preset condition, the drive threshold voltage output to the target switch tube at this time is the initial drive threshold voltage of the target switch tube.

[0057] It should be noted that whether it is from small to large or from large to small, the drive threshold voltage output to the target switch tube is a voltage with a fixed pulse width t0.

[0058] For example, the data interval of the design driving threshold voltage of the target switch tube of VBZM7N60 is [2.1V, 2.5V] obtained from the data manual, and the voltage applied to the gate of the target switch tube is increased by 0.01V each time starting from 2.1V when the target switch tube is initially operated, and then it is detected whether the current value through the target switch tube meets the preset condition. When the applied voltage is 2.2V, it is detected that the current value through the target switch tube exactly meets the preset condition, and the initial driving threshold voltage of the target switch tube is 2.2V, and the voltage applied to the gate of the target switch tube is stopped.

[0059] By gradually adjusting the driving threshold voltage output to the target switch tube in the range of the maximum design driving threshold voltage of the target switch tube within the minimum design driving threshold voltage, the number of times of outputting the driving threshold voltage to the target switch tube is reduced, and the initial driving threshold voltage can be quickly obtained, thereby saving a lot of time.

[0060] In one embodiment, the preset condition is determined according to whether the current value through the target switch tube is greater than a current threshold value, and the current threshold value is determined according to the circuit elements in the circuit in which the target switch tube is located. The circuit in which the target switch tube is located includes an inductor connected in series with the target switch tube, and the current threshold value is calculated according to the voltage applied to the inductor, the pulse width of the driving threshold voltage applied to the target switch tube, and the inductance value of the inductor. If the on state of the target switch tube is that the current value through the target switch tube is greater than or equal to the current threshold value, it is determined that the on state of the target switch tube meets the preset condition; if the on state of the target switch tube is that the current value through the target switch tube is less than the current threshold value, it is determined that the on state of the target switch tube does not meet the preset condition.

[0061] Specifically, the calculation formula of the current threshold value is I Lth = U i × t0 / L0, where I Lth is the current threshold value, U i is the voltage applied to the inductor, specifically the fixed voltage of the constant power source input connected in series with the inductor, t0 is the pulse width of the driving threshold voltage applied to the target switch tube, and L0 is the inductance value of the inductor connected in series with the target switch tube. The current value I sence through the target switch tube can be directly measured at the source or drain level of the target switch tube, or can be obtained by measuring the voltage U sence of the resistor R1 connected in series with the source of the target switch tube, and the calculation formula of the current value through the target switch tube is I sence = U sence / R1.

[0062] Optionally, the current threshold is calculated according to parameters of circuit elements in a circuit in which the target switch tube is located, the current value through the target switch tube is calculated according to the resistance in series with the target switch tube and the voltage of the measuring resistance, and the preset condition is that the current value through the target switch tube is greater than or equal to the current threshold. The conduction state of the target switch tube has two kinds, the first kind is that the current value of the target switch tube is greater than or equal to the current threshold, and the second kind is that the current value of the target switch tube is less than the current threshold. If the conduction state of the target switch detected is the first kind, it is indicated that the conduction state of the target switch tube meets the preset condition, and if the conduction state of the target switch detected is the second kind, it is indicated that the conduction state of the target switch tube does not meet the preset condition.

[0063] The life of the switch tube is determined according to its threshold voltage, and the threshold voltage will decrease with the increase of working time. When the threshold voltage decreases to a certain value, it is considered to be invalid. However, it is difficult to directly measure the change of the threshold voltage without affecting the normal work of the system in which the switch tube is located. By the above method, the measurement of the threshold voltage of the target switch tube is converted into the measurement of the current value of the target switch tube, and the current value of the target switch tube can be directly measured. Therefore, the method for diagnosing the life of the switch tube is simplified.

[0064] In one embodiment, after determining that the target switch tube is in the state of being about to fail, a warning signal is output.

[0065] Specifically, after determining that the target switch tube is in the state of being about to fail according to step 103, a warning signal is output to inform the user to replace the target switch tube in time. The purpose of outputting the warning signal is to inform the user that the target switch tube is about to fail, and the specific notification form is not limited herein, which can be in the form of issuing an alarm sound, flashing an indicator light, or both.

[0066] In one embodiment, the failure driving threshold voltage of the target switch tube is determined according to the initial driving threshold voltage, comprising: obtaining a sensitivity; and determining the failure driving threshold voltage of the target switch tube according to the initial driving threshold voltage and the sensitivity.

[0067] Specifically, according to the specification of MOSFET characteristics in the International Electrotechnical Commission Standard IEC62373-2006, as long as the change of the threshold voltage of the MOSFET exceeds ±10% of the initial value, the MOSFET is considered to be invalid. Therefore, the sensitivity a is generally less than 10%. The failure driving threshold voltage V th of the target switch tube is V th0 (1-a), wherein V th0 is the initial driving threshold voltage. The failure driving threshold voltage of the target switch tube can also be V th =a×V th0Wherein the value of a can be adjusted according to actual requirements. It should be noted that the relationship between the initial drive threshold voltage and the sensitivity determining the failure drive threshold voltage of the target switch tube can be set as required, and is not limited herein.

[0068] By adjusting the sensitivity a, the requirements of different operations on the target switch tube can be achieved. For example, in an elevator system, if the threshold voltage of the target switch tube exceeds the initial value by 8% to notify the maintenance personnel to replace, the sensitivity a can be set to 8% to achieve this.

[0069] In one embodiment, the step of applying the failure drive threshold voltage to the target switch tube includes: before each time the target switch tube is driven to be turned on, performing the step of applying the failure drive threshold voltage to the target switch tube.

[0070] Specifically, in the operation of the elevator system, before the target switch tube is driven to be turned on each time, the failure drive threshold voltage is applied to the target switch tube to determine whether the target switch tube is in a state of impending failure, so that the purpose of diagnosing the service life of the target switch tube in real time can be achieved without affecting the normal operation of the target switch tube.

[0071] Based on the same inventive concept, the embodiments of the present application also provide a switch tube service life diagnosis device for implementing the switch tube service life diagnosis method described above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme described in the above method, and therefore the specific limitations in one or more switch tube service life diagnosis device embodiments provided below can be referred to the limitations of the switch tube service life diagnosis method described above, which will not be repeated here.

[0072] In one embodiment, as shown in Figure 3 A switch tube service life diagnosis device is provided, which includes a control unit 301, a drive unit 302, a target switch tube M, and a detection unit 303. The drive unit 302 is connected to the gate of the target switch tube M, and the control unit 301 is connected to the drive unit 302 and the detection unit 303, respectively. The control unit 301 is configured to control the drive unit 302 to apply a failure drive threshold voltage to the target switch tube M, wherein the failure drive threshold voltage is determined according to an initial drive threshold voltage of the target switch tube M. The control unit 301 is further configured to control the detection unit 303 to detect the turn-on state of the target switch tube M. The control unit 301 is further configured to determine whether the target switch tube M is in an impending failure state according to whether the turn-on state of the target switch tube M meets a preset condition.

[0073] In one embodiment, the control unit 301 is further configured to control the driving unit 302 to gradually adjust the driving threshold voltage output to the target switch tube M within a voltage range between the maximum design driving threshold voltage and the minimum design driving threshold voltage of the target switch tube M, and the control unit 301 is further configured to control the detection unit 303 to detect the conduction state of the target switch tube M during the gradual adjustment of the driving threshold voltage output to the target switch tube M by the driving unit 302, and the control unit 301 is further configured to control the driving unit 302 to stop outputting the driving threshold voltage to the target switch tube M when the conduction state of the target switch tube M meets the preset condition, and to take the driving threshold voltage output to the target switch tube M by the driving unit 302 when the conduction state meets the preset condition as the initial driving threshold voltage.

[0074] In one embodiment, the detection unit 303 is configured to detect the current value passing through the target switch tube M, and the control unit 301 is configured to determine the preset condition according to whether the current value is greater than a current threshold value, the current threshold value being determined according to circuit elements in the circuit in which the target switch tube M is located.

[0075] In one embodiment, as shown in Figure 4 , the switch tube life diagnosis device further comprises an inductor L and a power supply U, the power supply U, the inductor L and the first pole of the target switch tube M are connected in series, and the current threshold value is calculated according to the voltage applied to the inductor L by the power supply U, the pulse width of the driving threshold voltage applied to the target switch tube M and the inductance value of the inductor L.

[0076] In one embodiment, as shown in Figure 5 , the switch tube life diagnosis device further comprises a resistor R, the second pole of the target switch tube M is connected to the resistor R and then grounded, and the detection unit 303 is configured to detect the current value passing through the resistor R, wherein the current value passing through the resistor R is consistent with the current value passing through the target switch tube M.

[0077] In one embodiment, as shown in Figure 6 , the switch tube life diagnosis device further comprises an alarm unit 304, the alarm unit 304 is connected to the control unit 301, and the control unit 301 is further configured to control the alarm unit 304 to output a warning signal after determining that the target switch tube M is in a state of impending failure. The alarm unit 304 and the detection unit 303 can be integrated together.

[0078] In one embodiment, before driving the target switch tube M to conduct each time, the control unit 301 controls the driving unit 302 to apply a failure driving threshold voltage to the target switch tube M.

[0079] In one embodiment, a computer device is provided, which can be a server, and the internal structure diagram thereof can be as shown in Figure 7As shown in the figure. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operating system and the computer program in the non-volatile storage medium to run. The database of the computer device is used to store antenna pose information measurement data. The network interface of the computer device is used to communicate with the external terminal through the network connection. The computer program is executed by the processor to implement a switch tube life diagnosis method.

[0080] Those skilled in the art can understand that, Figure 7 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or less components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0081] In one embodiment, a computer device is also provided, including a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps in the above method embodiments.

[0082] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by a processor to implement the steps in the above method embodiments.

[0083] In one embodiment, a computer program product is provided, which includes a computer program, and the computer program is executed by a processor to implement the steps in the above method embodiments.

[0084] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetoresistive random access memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, etc. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc. The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a block chain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0085] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present application.

[0086] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are within the scope of protection of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A switching tube life diagnosis method characterized by comprising: The method comprises: acquiring an initial drive threshold voltage of a target switch tube; determining a failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage; applying the failure drive threshold voltage to the target switch tube, and determining whether the target switch tube is in an impending failure state according to whether a conduction state of the target switch tube meets a preset condition; the acquiring of the initial drive threshold voltage of the target switch tube comprises: acquiring a maximum design drive threshold voltage and a minimum design drive threshold voltage of the target switch tube; gradually adjusting a drive threshold voltage output to the target switch tube in a voltage range between the maximum design drive threshold voltage and the minimum design drive threshold voltage until the conduction state of the target switch tube meets the preset condition; and taking the drive threshold voltage output to the target switch tube when the conduction state meets the preset condition as the initial drive threshold voltage; the circuit in which the target switch tube is located comprises an inductor connected in series with the target switch tube, and the method further comprises: determining the preset condition according to whether a current value passing through the target switch tube is greater than a current threshold, the current threshold being calculated according to a voltage applied to the inductor, a pulse width of the drive threshold voltage applied to the target switch tube, and an inductance value of the inductor.

2. The method of claim 1, wherein, The method further comprises: if the conduction state of the target switch tube is that the current value passing through the target switch tube is greater than or equal to the current threshold, it is determined that the conduction state of the target switch tube meets the preset condition; if the conduction state of the target switch tube is that the current value passing through the target switch tube is less than the current threshold, it is determined that the conduction state of the target switch tube does not meet the preset condition.

3. The method of claim 1, wherein, The method further comprises: outputting a warning signal after it is determined that the target switch tube is in the impending failure state.

4. The method of claim 1, wherein, The determining of the failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage comprises: acquiring a sensitivity; determining the failure drive threshold voltage of the target switch tube according to the initial drive threshold voltage and the sensitivity.

5. The method of claim 1, wherein, The applying of the failure drive threshold voltage to the target switch tube comprises: performing the step of applying the failure drive threshold voltage to the target switch tube before each time the target switch tube is driven to be conductive.

6. A switching tube life diagnosis device characterized by comprising: The device comprises a control unit, a drive unit, a target switch tube, and a detection unit, wherein the drive unit is connected to a gate of the target switch tube, and the control unit is connected to the drive unit and the detection unit respectively; the control unit is configured to control the drive unit to apply a failure drive threshold voltage to the target switch tube, wherein the failure drive threshold voltage is determined according to an initial drive threshold voltage of the target switch tube; the control unit is further configured to control the detection unit to detect a conduction state of the target switch tube; the control unit is further configured to determine whether the target switch tube is in an impending failure state according to whether the conduction state of the target switch tube meets a preset condition; the detection unit is configured to detect a current value passing through the target switch tube; The control unit is further configured to control the driving unit to gradually adjust the driving threshold voltage output to the target switch tube within a voltage range between a maximum design driving threshold voltage and a minimum design driving threshold voltage of the target switch tube, control the detection unit to detect the conduction state of the target switch tube during the gradual adjustment of the driving threshold voltage output to the target switch tube by the driving unit, and control the driving unit to stop outputting the driving threshold voltage to the target switch tube when the conduction state of the target switch tube meets the preset condition, and take the driving threshold voltage output to the target switch tube by the driving unit when the conduction state meets the preset condition as the initial driving threshold voltage. The device further comprises an inductor and a power supply, the power supply, the inductor and the first electrode of the target switch tube are connected in series, and the control unit is configured to determine the preset condition according to whether the current value is greater than a current threshold value, the current threshold value being calculated according to a voltage applied to the inductor by the power supply, a pulse width of the driving threshold voltage applied to the target switch tube and an inductance value of the inductor.

7. The apparatus of claim 6, wherein, The device further comprises a resistor, the second electrode of the target switch tube is connected to the resistor and then grounded, and the detection unit is configured to detect a current value passing through the resistor, wherein the current value passing through the resistor is consistent with the current value passing through the target switch tube.

8. The apparatus of claim 6, wherein, The device further comprises an alarm unit connected to the control unit, and the control unit is further configured to control the alarm unit to output a warning signal when it is determined that the target switch tube is in an impending failure state.

9. The apparatus of claim 6, wherein, The driving unit applies the failure driving threshold voltage to the target switch tube before driving the target switch tube to conduct each time. 10.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-9. The processor executes the computer program to implement the steps of the method of any one of claims 1 to 5.

11. A computer readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method of any one of claims 1 to 5.

12. A computer program product comprising a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method of any one of claims 1 to 5.

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