Testers, test systems, and test methods

Abstract

The application relates to a test machine, a test system and a test method. The test machine comprises a plurality of test board cards, a main control module and a coprocessing module, the service functions realized by the test board cards are different, the main control module is connected with the test board cards and used for connecting a host computer, receiving test items sent by the host computer, and sending each test sequence in the test items to each test board card, the test board cards are used for connecting at least one measured device, sending an excitation signal to the measured device according to the received test sequence, receiving a response signal fed back by the measured device based on the excitation signal, obtaining test data and sending the test data to the coprocessing module, the coprocessing module is connected with the test board cards and used for processing the test data obtained by the test board cards, obtaining test results and sending the test results to the host computer. The application can improve test efficiency.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a test machine, a test system and a test method. BACKGROUND

[0002] Automatic Test Equipment (ATE) is a device for detecting the functional integrity of integrated circuits (ICs) in the semiconductor industry, which is applied to the last process of integrated circuit production and manufacturing to ensure the quality of integrated circuit production and manufacturing.

[0003] The ATE includes a host, a tester and a device under test (DUT). The host sends a test sequence to the tester. The tester generates an excitation signal according to the test sequence and sends it to the device under test. The device under test feeds back a response signal to the tester according to the excitation signal. The tester obtains test data according to the response signal and sends it to the host. The host processes the test data to obtain a test result to instruct a handler to classify the device under test.

[0004] However, as the number of devices under test increases, the test efficiency decreases. SUMMARY

[0005] Therefore, it is necessary to provide a test machine, a test system and a test method capable of improving test efficiency to solve the above technical problems.

[0006] In a first aspect, the present application provides a test machine. The test machine includes a plurality of test board cards, a master control module and a coprocessing module.

[0007] The master control module is connected to the plurality of test board cards respectively and is used to connect a host, receive a test item sent by the host, and send each test sequence in the test item to each test board card.

[0008] The plurality of test board cards are used to connect at least one device under test, send an excitation signal to the device under test according to the received test sequence, receive a response signal fed back by the device under test based on the excitation signal, obtain test data and send it to the coprocessing module.

[0009] The coprocessing module is connected to the plurality of test board cards respectively and is used to process the test data obtained by the test board cards, obtain a test result and send it to the host.

[0010] In one embodiment, the coprocessing module is used to,

[0011] obtaining expected data from the host computer, and comparing the expected data with test data obtained by the test board card to obtain the test result.

[0012] In one of the embodiments, the coprocessor module is configured to,

[0013] receiving the expected data sent by the host module, the expected data being sent by the host computer to the host module.

[0014] In one of the embodiments, the coprocessor module is configured to,

[0015] sending the test result to the host module, so that the host module sends the test result to the host computer.

[0016] In one of the embodiments, the host module is configured to,

[0017] receiving test configuration sent by the host computer, the test configuration including channel labels corresponding to each of the test sequences, the channels to which the channel labels belong being located between the test board card and test stations, each of the test stations being configured to set a device under test;

[0018] sending each of the test sequences and the channel labels corresponding to the test sequences to the test board card corresponding to the channel labels.

[0019] In one of the embodiments, the test board card includes a controller and a functional circuit.

[0020] The controller is connected with the host module and the functional circuit of the same test board card respectively, and is configured to receive the test sequences and the channel labels corresponding to the test sequences sent by the host module, control the functional circuit to generate excitation signals according to the received test sequences, and send the excitation signals generated by the functional circuit to the device under test set by the test station corresponding to the channel labels.

[0021] In one of the embodiments, the controller is further connected with the coprocessor module, and is configured to receive response signals fed back by the device under test based on the excitation signals, obtain test data and send the test data to the coprocessor module.

[0022] In one of the embodiments, the test board card is configured to,

[0023] when the test data needs to be processed, sending the test data to the coprocessor module, so that the coprocessor module processes the test data to obtain a test result;

[0024] when the test data does not need to be processed, sending the test data to the host module so that the host module sends the test data to the host computer; or

[0025] sending the test data to the coprocessor module and the host module respectively, so that the coprocessor module processes the test data that needs to be processed to obtain test results, and the host module sends the test data that does not need to be processed to the host computer.

[0026] In one embodiment, the test machine further comprises:

[0027] A data interaction module connected to the plurality of test board cards respectively and used for connecting a server, for uploading the test data obtained by the test board cards to the server.

[0028] In one embodiment, the test machine further comprises:

[0029] A clock module connected to the host module, for providing a clock signal.

[0030] A calibration module connected to the clock module and the host module respectively, for providing a calibration signal.

[0031] In one embodiment, the test machine further comprises:

[0032] A system monitoring module connected to the plurality of test board cards respectively and used for connecting the host computer, for monitoring each of the test board cards and feeding back to the host computer.

[0033] In one embodiment,

[0034] In a second aspect, the application provides a test system. The test system comprises a host computer and a test machine as provided in the first aspect.

[0035] In a third aspect, the application provides a test method. The test method comprises:

[0036] receiving a test item sent by a host computer;

[0037] sending an excitation signal to a device under test according to each test sequence in the test item;

[0038] receiving a response signal fed back by the device under test based on the excitation signal, to obtain test data;

[0039] processing the test data to obtain test results and sending the test results to the host computer.

[0040] The test machine, the test system and the test method, the test machine comprises a plurality of test board cards, a main control module and a coprocessing module, and the service functions realized by the test board cards are different. The main control module is connected with the plurality of test board cards and used for connecting a host computer, receiving a test item sent by the host computer, and sending each test sequence in the test item to each test board card. The plurality of test board cards are used for connecting at least one device under test, sending an excitation signal to the device under test according to the received test sequence, receiving a response signal fed back by the device under test based on the excitation signal, obtaining test data and sending the test data to the coprocessing module. The coprocessing module is connected with the plurality of test board cards and used for processing the test data obtained by the test board cards, obtaining a test result and sending the test result to the host computer. In this way, the test data is processed in the test machine, which can reduce the data processing amount of the host computer, reduce the data processing time, shorten the feedback path of the test data and reduce the data transmission time. In summary, the test efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0042] Figure 1 It is a structural schematic diagram of the test machine in an embodiment;

[0043] Figure 2 It is a schematic diagram of information interaction in the test process in the prior art;

[0044] Figure 3 It is a schematic diagram of information interaction in the test process in an embodiment;

[0045] Figure 4 It is a flowchart of the test method in an embodiment.

[0046] Explanation of reference signs:

[0047] 10, test board card, 11, controller, 12, functional circuit;

[0048] 20, main control module, 21, parallel control unit, 22, station control unit, 23, packing unit, 24, synchronization unit;

[0049] 30, coprocessing module;

[0050] 40, data interaction module;

[0051] 50, clock module;

[0052] 60, calibration module;

[0053] 70, system monitoring module;

[0054] 100, host, 200, device under test, 210, carrier board, 300, server, 400, tester. DETAILED DESCRIPTION

[0055] For the purpose of promoting an understanding of the application, the application will now be described in greater detail with reference to the figures illustrative of embodiments thereof. The embodiments shown in the drawings are intended to explain the principles of the application and enable a person skilled in the art to most effectively utilize the application. It is to be understood that no limitation of the scope of the application is intended to be implied by the particular detailed embodiments disclosed herein. The application is to cover and embrace all alternatives, modifications, equivalents, and / or improvements in accordance with the appended claims. Various embodiments of the application are described herein with reference to the accompanying drawings. These embodiments are described in order to illustrate the application and cannot be understood to limit the scope of the application. Those of ordinary skill in the art will appreciate that the concepts and technologies described herein can be employed in a variety of different embodiments and that the embodiments described herein are only by way of example.

[0056] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description herein is for describing particular embodiments only and is not intended to be limiting of the application.

[0057] It is to be understood that the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise. It is to be understood that the terms "approximately" and "substantially" are used herein to represent the insubstantial difference in the numerical quantity that can be caused by measurement error, manufacturing error, and / or other factors. It is to be understood that the terms "first," "second," and the like can be used herein to describe various elements, but these elements should not be limited by these terms. These terms are only used to distinguish one element from another.

[0058] Spatially relative terms, such as "under", "below", "lower", "over", "upper" and the like, can be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientations depicted in the figures. For example, if a device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "below" can encompass both an orientation of above and below. The device can also be oriented in the other direction, and the spatially relative terms used herein are intended to encompass such additional orientations. It is to be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientations depicted in the figures. For example, if a device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "below" can encompass both an orientation of above and below. The device can also be oriented in the other direction, and the spatially relative terms used herein are intended to encompass such additional orientations.

[0059] It is to be understood that when one element is referred to as being "connected" to another element, it can be directly connected to the other element, or connected through an intervening element. In addition, "connected" in the following embodiments should be understood as "electrically connected", "communicatively connected", and the like if there is a transmission of electrical signals or data between the connected objects.

[0060] As used herein, the singular forms "a", "an" and "the" include plural referents unless the context clearly dictates otherwise. It should also be understood that the term "comprising" or "having" etc. specifies the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but does not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, the term "and / or" as used in the specification includes any and all combinations of one or more of the associated listed items.

[0061] As described in the background, the prior art test system has the problem of low test efficiency. The inventor has found that the cause of this problem is that the existing test machine includes a host control module and at least one test board card (instrument). The host sends a test sequence to the host control module, and the host control module forwards the test sequence to the test board card. The test board card generates an excitation signal according to the received test sequence and sends it to the device under test. The device under test feeds back a response signal to the test board card according to the excitation signal. The test board card obtains test data according to the response signal and sends it to the host control module, and the host control module forwards the test data to the host. The host processes the test data (such as compares the data result with a preset value) to obtain a test result.

[0062] Among them, the test data obtained by the test board card will be forwarded to the host through the host control module, and the host will process the test data. Since the test result of one device under test needs to be obtained according to a plurality of test data, the number of test data will greatly increase as the number of devices under test increases. Since all test data need to be forwarded to the host through the host control module to be processed by the host to obtain the test result, a large amount of test data will cause congestion in the transmission channel, and the transmission time of the entire test data is relatively long, which seriously affects the test efficiency. And all test structures need to process test data through the host to obtain, a large amount of test data forms a blockage in the host, and the processing time of the entire test data is also relatively long, which further reduces the test efficiency.

[0063] Based on the above reasons, this invention provides a testing machine, a testing system, and a testing method. By adding a coprocessing module within the testing machine, the test data obtained from the test board is processed, and the test results are then sent to the host. This allows test results to be obtained earlier at the testing machine, shortening the data feedback path. The testing machine changes from sending test data to sending test results to the host. Since the amount of test results is much smaller than the amount of test data, the data transmission time between the testing machine and the host is significantly reduced, thereby improving testing efficiency. Furthermore, test data from multiple testing machines is processed internally within each testing machine, avoiding the need to process test data from multiple testing machines on a single host, reducing data processing time and further improving testing efficiency.

[0064] In one embodiment, such as Figure 1 As shown, a test machine is provided, including multiple test boards 10, a main control module 20, and a coprocessing module 30. Each test board 10 implements different business functions. The main control module 20 is connected to the multiple test boards 10 and is used to connect to a host 100, receive test items sent by the host 100, and send each test sequence in the test items to each test board 10. The multiple test boards 10 are used to connect to at least one device under test (DUT) 200, send excitation signals to the DUT 200 according to the received test sequences, and receive response signals from the DUT 200 based on the excitation signals, obtaining test data and sending it to the coprocessing module 30. The coprocessing module 30 is connected to the multiple test boards 10, processes the test data obtained by the test boards 10, obtains test results, and sends them to the host 100.

[0065] The test board 10 is the circuit board used for testing. In practical applications, multiple test boards 10 can be integrated into one unit, meaning that circuits implementing different business functions are distributed on the same board. Alternatively, multiple test boards 10 can operate independently, with circuits implementing different business functions distributed on different boards. For example, circuits implementing one business function can be distributed on one board, forming one circuit board, while circuits implementing another business function can be distributed on another board, forming another circuit board.

[0066] Both the main control module 20 and the coprocessor module 30 can be processors. In practical applications, the main control module 20 and the coprocessor module 30 can be implemented using the same processor or different processors. The number of processors used to implement either the main control module 20 or the coprocessor module 30 can be one or more.

[0067] Specifically, the host 100 sends test items to the main control module 20, where each test item includes multiple test sequences. The main control module 20 sends each test sequence in the test item to the corresponding test board 10. The test board 10 corresponding to a test sequence can be determined based on at least one of the following: the business function to be implemented by the test sequence, whether the test board 10 is occupied, and the sending time of the test sequence. The test board 10 sends an excitation signal to the device under test 200 based on the received test sequence. The device under test 200 feeds back a response signal based on the received excitation signal. The test board 10 obtains test data based on the received response signal and sends it to the coprocessing module 30. The coprocessing module 30 processes the test data obtained by the test board 10, obtains the test result, and sends it to the host 100. In practical applications, the coprocessing module 30 can directly send the test result to the host 100, or it can first send the test result to the main control module 20, and then the main control module 20 sends the test result to the host 100.

[0068] For example, the coprocessor module 30 is used to send the test results to the master control module 20, so that the master control module 20 sends the test results to the host 100.

[0069] Figure 2 This is a schematic diagram illustrating information interaction during the testing process in existing technologies. For example... Figure 2 As shown, the test sequence is first sent from the host to the main control module in the test machine, then from the main control module to the test board in the test machine, and finally from the test board to the device under test (DUT) to begin the test. The test data obtained at the end of the test is first sent from the DUT to the test board, then from the test board to the main control module, and finally from the main control module to the host.

[0070] Figure 3 This is a schematic diagram illustrating information interaction during testing in one embodiment. For example... Figure 3 As shown, the test sequence first sends data from the host to the main control module in the test machine, then from the main control module to the test board in the test machine, and finally from the test board to the device under test (DUT) to begin the test. Unlike existing technologies, after the test data is sent from the DUT to the test board, the test board sends the test data to both the main control module and the coprocessing module in the test machine. The main control module still sends the test data to the host. The coprocessing module processes the test data according to the expected data sent by the main control module to obtain the test results, and then sends the test results to both the main control module and the host.

[0071] Therefore, this invention moves the processing of test data from the host computer to the testing machine, thereby shortening the feedback path of the test data and reducing the data transmission time. Furthermore, having the testing machine process the test data reduces the amount of data processing required by the host computer and shortens the data processing time.

[0072] The test machine includes a plurality of test board cards, a main control module and a coprocessing module. The test board cards implement different service functions. The main control module is connected with the plurality of test board cards and a host computer, receives test items sent by the host computer, and sends each test sequence in the test items to each test board card. The plurality of test board cards are connected with at least one device under test, send excitation signals to the device under test according to the received test sequences, receive response signals fed back by the device under test based on the excitation signals, obtain test data, and send the test data to the coprocessing module. The coprocessing module is connected with the plurality of test board cards, processes the test data obtained by the test board cards, obtains test results, and sends the test results to the host computer. In this way, the test data is processed inside the test machine, which can reduce the data processing amount of the host computer and the data processing time, and can shorten the feedback path of the test data and reduce the data transmission time. In summary, the test efficiency is improved.

[0073] Exemplarily, the test board card 10 can be a dedicated test board card, and one test board card can complete the measurement of one device under test. The test board card 10 can also be a general test board card, and a plurality of test board cards can complete the measurement of one device under test together. Different test board cards can be combined for measurement according to different devices under test. For example, the plurality of test board cards include four test board cards, which are a first test board card, a second test board card, a third test board card and a fourth test board card. The four test board cards implement different service functions, the first test board card is a power supply board, the second test board card is a digital circuit board, the third test board card is a signal source board, and the fourth test board card is an oscilloscope board.

[0074] In one embodiment, the coprocessing module 30 is configured to obtain expected data from the host computer 100, compare the expected data with the test data obtained by the test board card 10, and obtain test results.

[0075] The expected data is data for judging whether the test is passed.

[0076] Exemplarily, the coprocessing module 30 is configured to receive the expected data sent by the main control module 20, and the expected data is sent by the host computer 100 to the main control module 20.

[0077] Specifically, the host 100 can send the expected data to the coprocessing module 30 directly, or send the expected data to the host control module 20 first, and then send the expected data to the coprocessing module 30 by the host control module 20. The expected data is compared with the test data obtained by the test board card 10, for example, if the test data obtained by the test board card 10 is greater than or equal to the expected data, it is determined that the test is passed; if the test data obtained by the test board card 10 is less than the expected data, it is determined that the test is failed. Alternatively, if the test data obtained by the test board card 10 is less than or equal to the expected data, it is determined that the test is passed; if the test data obtained by the test board card 10 is greater than the expected data, it is determined that the test is failed.

[0078] In the above embodiment, the coprocessing module can replace the host to process the test data by obtaining the expected data from the host, such as comparing the expected data with the test data obtained by the test board card to obtain the test result.

[0079] In one embodiment, the host control module 20 is configured to receive the test configuration sent by the host 100, the test configuration including the channel label corresponding to each test sequence, and the channel to which the channel label belongs is located between the test board card 10 and the test station, and each test station is configured to set a device under test 200; and send each test sequence and the channel label corresponding to the test sequence to the test board card 10 corresponding to the channel label.

[0080] The test configuration is configured to control the sending of each test sequence in the test item.

[0081] Specifically, the host 100 sends the test item and the test configuration to the host control module 20. The host control module 20 obtains the channel label corresponding to each test sequence in the test item from the test configuration. The channel to which the channel label belongs is located between the test board card 10 and the test station, and the test station is configured to set the device under test 200. One channel label can correspond to the test sequence, the test board card 10 and the device under test 200, so as to control the host control module 20 to send the test sequence to the test board card 10 corresponding to the channel label, and then control the test board card 10 to send the excitation signal generated according to the test sequence to the test station corresponding to the channel label, i.e. the device under test 200.

[0082] For example, as shown in Figure 1 A load board 210 is provided, and the load board is provided with a plurality of test stations, and the device under test 200 is arranged on the test station.

[0083] In one embodiment, as shown in Figure 1As shown, the test board card 10 includes a controller 11 and a function circuit 12. The controller 11 is connected with the host module 20 and the function circuit 12 of the same test board card 10 respectively, for receiving the test sequence and the channel label corresponding to the test sequence sent by the host module 20, controlling the function circuit 12 to generate the excitation signal according to the received test sequence, and sending the excitation signal generated by the function circuit 12 to the DUT 200 set in the test site corresponding to the channel label.

[0084] Among them, the controller 11 realizes the information interaction between the test board card 10 and the outside (including between each test board card 10), and the function circuit 12 realizes the business function of the test board card 10. In actual application, the controller 11 can include a processor and a communication interface.

[0085] Specifically, the host module 20 sends the test sequence and the channel label to the controller 11. The controller 11 controls the function circuit 12 to generate the corresponding excitation signal according to the test sequence, and sends the excitation signal to the DUT 200 set in the test site corresponding to the channel label.

[0086] In the above embodiment, the controller is arranged in the host module, and the information interaction between the test board card and the outside can be realized.

[0087] In one embodiment, the controller 11 is also connected with the coprocessor module 30, for receiving the response signal fed back by the DUT 200 based on the excitation signal, obtaining the test data and sending it to the coprocessor module 30.

[0088] In one embodiment, the test board card 10 is used to send the test data to the coprocessor module 30 when the test data needs to be processed, so that the coprocessor module 30 processes the test data to obtain the test result.

[0089] In one embodiment, the test board card 10 is also used to send the test data to the host module 20 when the test data does not need to be processed, so that the host module 20 sends the test data to the host computer 100.

[0090] Specifically, some of the test data need to be processed, such as comparison with expected data, and some do not need to be processed. The controller 11 sends the test data that needs to be processed to the coprocessor module 30 for processing to obtain the test result sent to the host computer 100, and sends the test data that does not need to be processed to the host module 20, which sends the test data directly to the host computer 100.

[0091] In one embodiment, the test board card 10 is used to send the test data to the host module 20 and the coprocessor module 30 respectively, so that the host module 20 sends the test data that does not need to be processed to the host computer 100, and the coprocessor module 30 processes the test data that needs to be processed to obtain the test result.

[0092] In one embodiment, as shown in Figure 1 The testing machine further comprises a data interaction module 40. The data interaction module 40 is connected to the plurality of testing board cards 10 respectively and is used to connect to the server 300, for uploading the testing data obtained by the testing board cards 10 to the server 300.

[0093] The data interaction module 40 is a processor. In practical application, the main control module 20, the coprocessing module 30 and the data interaction module 40 can be implemented by using the same processor or different processors. The number of the processors implementing the data interaction module 40 can be one or more.

[0094] Specifically, the testing board cards 10 send the testing data to the data interaction module 40 in addition to sending the testing data to the main control module 20 or the coprocessing module 30. The data interaction module 40 uploads the testing data to the server 300.

[0095] In the above embodiment, the testing data can be uploaded to the server by adding the data interaction module, which is convenient for query.

[0096] Exemplarily, the data interaction module 40 is further connected to the main control module 20 and the coprocessing module 30 respectively, for monitoring the main control module 20 and the coprocessing module 30.

[0097] In the above embodiment, the data interaction module can also monitor the running conditions of the main control module and the coprocessing module in real time.

[0098] In one embodiment, as shown in Figure 1 The testing machine further comprises a clock module 50. The clock module 50 is connected to the main control module 20, for providing a clock signal.

[0099] Exemplarily, the clock module 50 is further connected to the testing board cards 10.

[0100] In the above embodiment, the clock module is added to provide the clock signal for the inside of the testing machine.

[0101] In one embodiment, as shown in Figure 1 The testing machine further comprises a calibration module 60. The calibration module 60 is connected to the clock module 50 and the main control module 20 respectively, for providing a calibration signal.

[0102] Exemplarily, the calibration module 60 is further connected to the testing board cards 10.

[0103] In the above embodiment, the calibration module is added to calibrate the clock for the inside of the testing machine.

[0104] In one embodiment, as shown in Figure 1As shown, the test machine further comprises a system monitoring module 70. The system monitoring module 70 is connected to the plurality of test board cards 10 respectively and is used to be connected to the host 100, for monitoring the test board cards 10 respectively and feeding back to the host 100.

[0105] In the above embodiments, by adding the system monitoring module, the running state of each test board card can be monitored, which is beneficial to timely alarm or processing when the test board card is abnormal.

[0106] Based on the same inventive concept, a test system is also provided, such as Figure 1 As shown, the test system comprises the host 100 and the test machine 400 provided in any of the above embodiments.

[0107] Based on the same inventive concept, a test method is also provided, such as Figure 4 As shown, the test method comprises the following steps:

[0108] S401, receiving a test item sent by a host.

[0109] Specifically, the test machine comprises a host control module, which receives the test item sent by the host.

[0110] In actual application, the host receives a work mode confirmation signal input by a user on one hand, and loads a user program on the other hand. The work mode includes a software and hardware debugging mode and a mass production mode, and the user program includes a test configuration and a test item. Then the host checks the hardware configuration in the test machine and the software configuration in the user program, and confirms the test configuration, such as specifying the number of stations, the station number, and external devices. Then the test machine loads the test configuration and part of the test sequence, and waits for a start of test (SOT) signal. After the start of test, the test machine starts to test the device under test. In addition, the test machine sends an end of test (EOT) signal to the host, and the host controls a mechanical hand to replace the device under test.

[0111] S402, sending an excitation signal to the device under test according to each test sequence in the test item.

[0112] Specifically, the test machine further comprises a plurality of test board cards, and the host control module sends each test sequence in the test item to a corresponding test board card, and the test board card generates an excitation signal according to the received test sequence and sends it to the device under test.

[0113] S403, receiving a response signal fed back by the device under test based on the excitation signal, and obtaining test data.

[0114] Specifically, the test board card receives a response signal fed back by the device under test based on the excitation signal, and obtains test data.

[0115] S404, processing the test data to obtain a test result and sending the test result to the host.

[0116] Specifically, the test machine further comprises a coprocessor module, the test board card sends the test data to the coprocessor module, the coprocessor module processes the test data to obtain a test result and sends the test result to the host.

[0117] In the description of the present specification, the description referring to the terms "some embodiments", "other embodiments", "ideal embodiments" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiments or examples are contained in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example.

[0118] The technical features of the above embodiments can be combined arbitrarily, and in order to make the description simple, not all possible combinations of the technical features in the above embodiments are described, however, as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present specification.

[0119] The above embodiments only express several implementation manners of the present application, the description is more specific and detailed, but it should not be understood as the limitation of the patent scope of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A testing machine characterized by, The test machine comprises a plurality of test board cards, a master module and a coprocessor module; The master module is connected with the plurality of test board cards respectively and used for connecting a host computer, receiving test items sent by the host computer and sending each test sequence in the test items to each test board card; The test sequence corresponding test board card can be determined according to at least one of a service function to be realized by the test sequence, whether the test board card is occupied or a sending time of the test sequence; The plurality of test board cards are used for connecting at least one device under test, sending an excitation signal to the device under test according to the received test sequence, receiving a response signal fed back by the device under test based on the excitation signal, obtaining test data and sending the test data to the coprocessor module, and sending test data which does not need to be processed to the master module so that the master module sends the test data which does not need to be processed directly to the host computer; The coprocessor module is connected with the plurality of test board cards respectively and used for comparing the test data obtained by the test board card with expected data obtained from the host computer, obtaining test results and sending the test results to the host computer; The test board card is further used for, when the test data needs to be processed, sending the test data to the coprocessor module so that the coprocessor module processes the test data to obtain test results; when the test data does not need to be processed, sending the test data to the master module so that the master module sends the test data to the host computer; or sending the test data to the coprocessor module and the master module respectively so that the coprocessor module processes the test data which needs to be processed to obtain test results and the master module sends the test data which does not need to be processed to the host computer.

2. The testing machine of claim 1, wherein, The coprocessor module is used for, receiving the expected data sent by the master module, the expected data being sent by the host computer to the master module.

3. The testing machine of claim 1, wherein, The coprocessor module is used for, sending the test results to the master module so that the master module sends the test results to the host computer.

4. The testing machine of claim 1, wherein, The master module is used for, receiving a test configuration sent by the host computer, the test configuration comprising a channel mark corresponding to each test sequence, and a channel to which the channel mark belongs being located between the test board card and a test station, each test station being used for setting one device under test; sending each test sequence and the channel mark corresponding to the test sequence to the test board card corresponding to the channel mark.

5. The testing machine of claim 4, wherein, The test board card comprises a controller and a functional circuit; The controller is connected with the master module and the functional circuit of the same test board card respectively and used for receiving the test sequence and the channel mark corresponding to the test sequence sent by the master module, controlling the functional circuit to generate an excitation signal according to the received test sequence and sending the excitation signal generated by the functional circuit to the device under test set by the test station corresponding to the channel mark.

6. The testing machine of claim 5, wherein, The controller is also connected with the coprocessor module, for receiving a response signal fed back by the device under test based on the excitation signal, obtaining test data and sending to the coprocessor module.

7. The testing machine of any of claims 1-6, wherein, The test machine further comprises: A data interaction module connected with the plurality of test board cards respectively and used for connecting a server, for uploading the test data obtained by the test board cards to the server.

8. The testing machine of any of claims 1-6, wherein, The test machine further comprises: A clock module connected with the main control module, for providing a clock signal; A calibration module connected with the clock module and the main control module respectively, for providing a calibration signal.

9. The testing machine of any of claims 1-6, wherein, The test machine further comprises: A system monitoring module connected with the plurality of test board cards respectively and used for connecting the host computer, for monitoring each test board card and feeding back to the host computer.

10. A test system, characterized by The test system comprises a host computer and the test machine according to any one of claims 1-9.

11. A test method characterized by, Applied to a test machine; the test machine comprises a plurality of test board cards, a main control module and a coprocessor module; the main control module is connected with the plurality of test board cards respectively and used for connecting a host computer; the plurality of test board cards are used for connecting at least one device under test; The coprocessor module is connected with the plurality of test board cards respectively; the method comprises: The main control module receives a test item sent by the host computer, and sends each test sequence in the test item to each test board card; the test board card corresponding to the test sequence can be determined according to at least one of a business function required to be realized by the test sequence, whether the test board card is occupied, and a sending time of the test sequence; The test board card sends an excitation signal to the device under test according to the received test sequence, receives a response signal fed back by the device under test based on the excitation signal, obtains test data and sends to the coprocessor module, and sends test data that does not need to be processed to the main control module, so that the main control module sends the test data that does not need to be processed directly to the host computer; The test board card is further used for, When the test data needs to be processed, the test data is sent to the coprocessor module, so that the coprocessor module processes the test data to obtain test results; When the test data does not need to be processed, the test data is sent to the main control module, so that the main control module sends the test data to the host computer; or The test data is sent to the coprocessor module and the main control module respectively, so that the coprocessor module processes the test data that needs to be processed to obtain test results, and the main control module sends the test data that does not need to be processed to the host computer; The coprocessor module compares the test data obtained by the test board card with expected data obtained from the host computer, obtains test results and sends to the host computer.

Images