Measurement system for measuring a resistance to be measured

Abstract

The present disclosure relates to a measurement system for measuring a resistance to be measured, including: a measurement module, which includes a current source unit, an analog-to-digital converter unit, and a selection switch. A first variation curve is the variation relationship between current and voltage when connecting the current source unit, the analog-to-digital converter unit, and a standard resistor with a preset resistance value and adjusting the current source. A second variation curve is the variation relationship between voltage and resistance when the current is a preset value. When the current passing through the resistance to be measured is the preset value, if the voltage across the resistance to be measured is within the linear range of the second variation curve, the processing module obtains the resistance value of the resistance to be measured based on the voltage across the resistance to be measured and the second variation curve. In the present disclosure, the voltage across the resistance to be measured is obtained through the measurement module when the current flowing through the resistance to be measured is the preset value, and then the resistance value of the resistance to be measured is obtained through the processing module. Thus, the resistance value of the resistance to be measured with high accuracy can be obtained.

Description

Technical Field

[0001] The present disclosure specifically relates to a measurement system for measuring a resistance to be measured. Background Art

[0002] Conventionally, the scheme of obtaining the resistance value by using an analog-to-digital converter is to directly connect the measurement system to the resistance to be measured. Among them, the current source unit in the measurement system is connected in series with the resistance to be measured and applies a known constant current to the resistance to be measured. The analog voltage across the resistance to be measured is measured by the analog-to-digital converter unit. The analog-to-digital converter unit converts the measured analog voltage into a digital voltage output, and then the resistance value of the resistance to be measured is calculated by R = U / I.

[0003] However, directly according to the formula R = U / I, the accuracy of the obtained resistance value often depends on the accuracy of the measured voltage and current. Among them, the accuracy of the measured voltage and current depends to a large extent on the accuracy of the analog-to-digital converter and the current source unit. However, the price of high-precision analog-to-digital converters and current source units is very expensive. Staff often choose low-precision analog-to-digital converters and current source units to measure the resistance voltage. However, this will result in low accuracy of the measured voltage and current, making it difficult to obtain a relatively accurate resistance value. Summary of the Invention

[0004] The present disclosure is proposed in view of the above situation, and its purpose is to provide a measurement system for measuring a resistance to be measured that can effectively reduce costs and has high accuracy.

[0005] To this end, the present disclosure provides a measurement system for measuring a resistance to be measured, including: a measurement module, which includes a current source unit, an analog-to-digital converter unit, and a selection switch. By adjusting the selection switch, the current source unit and the analog-to-digital converter unit are connected to a standard resistance or a resistance to be measured to form a measurement loop. The current source unit is used to adjust the current flowing through the standard resistance or the resistance to be measured, and the analog-to-digital converter unit is used to measure the voltage across the standard resistance or the resistance to be measured and convert it into a digital voltage; a recording module, which records a first variation curve and a second variation curve; and a processing module, which obtains the resistance value of the resistance to be measured based on the first variation curve, the second variation curve, the current flowing through the resistance to be measured, and the digital voltage across the resistance to be measured. Wherein, the first variation curve is the variation relationship between the current flowing through the standard resistance and the voltage across the standard resistance when connecting the current source unit, the analog-to-digital converter unit to a standard resistance with a preset resistance value and adjusting the current source. The second variation curve is the variation relationship between the voltage and the resistance when the current is a preset value obtained based on the first variation curve. When the current flowing through the resistance to be measured is the preset value, if the voltage across the resistance to be measured is within the linear range of the second variation curve, the processing module obtains the resistance value of the resistance to be measured based on the voltage across the resistance to be measured and the second variation curve.

[0006] In the present disclosure, by the measurement module, the variation relationship between the voltage and the current corresponding to the standard resistance is obtained, thereby obtaining the first variation curve, and the second variation curve is obtained based on the first variation curve. The voltage across the resistance to be measured is obtained by the measurement module when the current flowing through the resistance to be measured is the preset value, and then the resistance value of the resistance to be measured is obtained by the processing module. Thus, the resistance value of the resistance to be measured with high accuracy can be obtained.

[0007] In the measurement system for measuring a resistance to be measured according to the present disclosure, optionally, the measurement system includes a plurality of resistances to be measured, and the measurement module is sequentially connected to one of the plurality of resistances to be measured to form a measurement loop. Thus, the resistance values of the plurality of resistances to be measured can be obtained sequentially.

[0008] In the measurement system for measuring a resistance to be measured according to the present disclosure, optionally, the analog-to-digital converter unit includes a resistor, an operational amplifier, and an analog-to-digital converter. Thus, the voltage across the standard resistance or the resistance to be measured can be measured.

[0009] In the measurement system for measuring a resistance to be measured according to the present disclosure, optionally, the resistance value of the resistance to be measured satisfies: R2 = ADC2 / ADC m × R0, where R2 is the resistance value of the resistance to be measured, ADC2 is the voltage of the resistance to be measured when the magnitude of the current flowing through the resistance to be measured is the preset value, and ADCm When the current through the standard resistor is the preset value, the voltage of the standard resistor is obtained, and R0 is the standard resistance value. Thus, the resistance value of the resistor to be measured can be obtained more accurately.

[0010] In the measurement system for measuring the resistor to be measured involved in the present disclosure, optionally, the preset value is a first threshold. When the current through the resistor to be measured is the first threshold, if the voltage across the resistor to be measured is not within the linear interval of the second change curve corresponding to the first threshold, then the preset value is adjusted by adjusting the current source unit until the voltage across the resistor to be measured corresponding to when the current is this preset value is within the linear interval of the corresponding second change curve. In this case, it is convenient to obtain the resistance value of the resistor to be measured more accurately subsequently.

[0011] In the measurement system for measuring the resistor to be measured involved in the present disclosure, optionally, the first threshold is the magnitude of the current corresponding to when the voltage measured by the analog-to-digital converter unit is the median value of the range of the analog-to-digital converter unit. In this case, it is convenient to obtain the resistance value of the resistor to be measured subsequently.

[0012] In the measurement system for measuring the resistor to be measured involved in the present disclosure, optionally, when the current through the resistor to be measured is the first threshold, if the voltage across the resistor to be measured is not within the linear interval of the second change curve corresponding to the first threshold, and the voltage across the resistor to be measured is greater than the maximum voltage value corresponding to the linear interval of the second change curve, then the preset value is adjusted, and the adjusted preset value is less than the first threshold. Thus, it is convenient to obtain the resistance value of the resistor to be measured more accurately subsequently.

[0013] In the measurement system for measuring the resistor to be measured involved in the present disclosure, optionally, when the current through the resistor to be measured is the first threshold, if the voltage across the resistor to be measured is not within the linear interval of the second change curve corresponding to the first threshold, and the voltage across the resistor to be measured is less than the minimum voltage value corresponding to the linear interval of the second change curve, then the preset value is adjusted, and the adjusted preset value is greater than the first threshold. Thus, it is convenient to obtain the resistance value of the resistor to be measured more accurately subsequently.

[0014] In the measurement system for measuring the resistor to be measured involved in the present disclosure, optionally, if the current source unit and the analog-to-digital converter unit form a measurement loop with the standard resistor, then the current source unit is connected in series with the standard resistor, and the analog-to-digital converter unit is connected in parallel with the standard resistor. Thus, the current flowing through the standard resistor can be adjusted, and the voltage across the corresponding standard resistor can be obtained.

[0015] In the measurement system for measuring a resistance to be measured according to the present disclosure, optionally, if the current source unit and the analog-to-digital converter unit form a measurement loop with the resistance to be measured, the current source unit is connected in series with the resistance to be measured, and the analog-to-digital converter unit is connected in parallel with the resistance to be measured. Thus, the current flowing through the resistance to be measured can be adjusted, and the voltage across the resistance to be measured can be obtained accordingly.

[0016] The measurement system for measuring a resistance to be measured according to the present disclosure can effectively reduce costs and has high accuracy. Brief Description of the Drawings

[0017] Figure 1 is a block diagram showing the structure of the measurement system according to an example of the present disclosure.

[0018] Figure 2A is a block diagram showing the structure of the measurement module according to an example of the present disclosure.

[0019] Figure 2B is a schematic diagram showing the structure of the measurement system according to an example of the present disclosure.

[0020] Figure 3 is a schematic diagram showing the measurement loop according to an example of the present disclosure.

[0021] Figure 4 is a block diagram showing the structure of the measurement system according to another example of the present disclosure.

[0022] Figure 5 is a schematic diagram showing the first variation curve according to an example of the present disclosure.

[0023] Figure 6 is a schematic diagram showing the second variation curve according to an example of the present disclosure. Detailed Description of the Embodiments

[0024] Hereinafter, with reference to the drawings, the preferred embodiments of the present disclosure will be described in detail. In the following description, the same reference numerals are given to the same components, and redundant descriptions are omitted. In addition, the drawings are only schematic diagrams, and the ratio of the sizes of the components to each other or the shapes of the components may be different from the actual ones.

[0025] In addition, the section headings and the like involved in the following description of the present disclosure are not intended to limit the content or scope of the present disclosure, and they only serve as a reading prompt. Such section headings should neither be understood as being used to divide the content of the article, nor should the content under the section headings be limited only to the scope of the section headings.

[0026] The present disclosure provides a measurement system for measuring a resistance to be measured. In the present disclosure, a resistance with an unknown value (resistance to be measured) can be measured, and the value of the resistance to be measured with high accuracy can be obtained.

[0027] In some examples, the resistance to be measured may be a conventional resistance, and the measurement system of this embodiment can be applied to the measurement of conventional resistances. For example, the resistance to be measured may be a carbon film resistor, a cement resistor, a metal film resistor, a wire-wound resistor, etc. However, the examples of the present disclosure are not limited thereto, and the resistance to be measured may be other devices, and the measurement system of this embodiment can measure the resistance value of the device, so as to verify whether the device is properly connected or properly operating, etc.

[0028] In some examples, the measurement system can be applied in the medical field. For example, the measurement system can be applied to a deep brain stimulator, a cochlear implant, a retinal electrical stimulator, etc. Taking the retinal electrical stimulator as an example, the retinal electrical stimulator may include an implanted part and an extracorporeal part. The implanted part of the retinal electrical stimulator may include a stimulating electrode array. When the retinal electrical stimulator is implanted into a patient's eyeball, a plurality of stimulating electrodes in the stimulating electrode array need to be properly implanted (for example, the stimulating electrodes can be closely attached to the ganglion cells or bipolar cells of the retina), so as to ensure that the retinal electrical stimulator can operate properly. The measurement system involved in this embodiment can be applied to the retinal electrical stimulator, and sequentially measure the resistance values of the stimulating electrodes after implantation, so as to judge the implantation conditions of the respective stimulating electrodes according to the resistance values of the respective stimulating electrodes (described in detail later).

[0029] Figure 1 FIG. shows a block diagram of a measurement system 1 according to an example of the present disclosure. Figure 2A FIG. shows a block diagram of a measurement module 20 according to an example of the present disclosure. Figure 2B FIG. shows a schematic structural diagram of a measurement system 1 according to an example of the present disclosure.

[0030] In some examples, referring to Figure 1 , the measurement system 1 can measure the resistance to be measured in the resistance area 10. In some examples, the resistance area 10 may include a standard resistor 110 with a preset resistance value. In some examples, the resistance area 10 may include several resistances to be measured with unknown resistance values (for example, referring to Figure 2B the resistance to be measured 120, the resistance to be measured 121, etc. therein). In this embodiment, the measurement system 1 can be used to measure and obtain the resistance value of the resistance to be measured.

[0031] In some examples, referring to Figure 1, the measurement system 1 may include a measurement module 20. In some examples, when using the measurement system 1 to measure the resistance value of a resistor under test (such as the resistor under test 120), the measurement module 20 can respectively form a measurement loop S with the standard resistor 110 and the resistor under test (see Figure 3 ). Among them, the resistor under test or the standard resistor 110 that forms the measurement loop S can be used as the target resistor R*. Thus, it is convenient to obtain the resistance value of the resistor under test subsequently. In some examples, if the resistor region 10 includes multiple resistors under test (such as the resistor under test 120, the resistor under test 121, the resistor under test 122, etc.), the measurement module 20 can be sequentially connected to one of the multiple resistors under test to form a measurement loop S. Thus, the resistance values of each resistor under test can be obtained sequentially.

[0032] In some examples, see Figure 2A and Figure 2B , the measurement module 20 may include a current source unit 210. In some examples, the current source unit 210 may include a current source. However, the examples of the present disclosure are not limited thereto, and the current source unit 210 may be other devices capable of adjusting the magnitude of the current flowing through the target resistor R*. For example, if there is an external power supply or other device providing current in the measurement loop S, the current source unit 210 may include a device for feedback of the current magnitude (such as an ammeter) and an adjustable resistor, etc.

[0033] In some examples, the measurement module 20 may include an analog-to-digital converter unit 220. In some examples, the analog-to-digital converter unit 220 may include an analog-to-digital converter. In some examples, the analog-to-digital converter unit 220 may include other components, such as internal resistors and operational amplifiers, etc. In this case, the analog-to-digital converter unit 220 can be used to measure the voltage across the target resistor R* and convert it into a digital voltage through the analog-to-digital converter. In some examples, the analog-to-digital converter unit 220 may be formed by connecting multiple components including an analog-to-digital converter, and the analog-to-digital converters may be integrated together.

[0034] In some examples, the measurement module 20 may include a selection switch 230. In some examples, the selection switch 230 may be a common switching device. In some examples, the selection switch 230 may also be other devices capable of selecting the target resistor R* from the resistor region 10 to form a measurement loop S. In some examples, the selection switch 230 may exist alone. However, the examples of the present disclosure are not limited thereto, and the selection switch 230 may also be integrated with the analog-to-digital converter unit 220. For example, the selection switch 230 may be multiple gate circuits or multiple mosfets used as switches, and multiple gate circuits or multiple mosfets used as switches can be directly integrated with the analog-to-digital converter unit 220.

[0035] Figure 3It shows a schematic diagram of the measurement circuit S involved in the examples of the present disclosure.

[0036] In some examples, referring to Figure 3 , when the measurement system 1 is working, the measurement module 20 can form a measurement circuit S by the current source unit 210, the analog-to-digital converter unit 220 and the target resistor R* through the selection switch 230.

[0037] Specifically, if the target resistor R* forming the measurement circuit S is the standard resistor 110, the current source unit 210 can be connected in series with the standard resistor 110, and the analog-to-digital converter unit 220 can be connected in parallel with the standard resistor 110. If the target resistor R* forming the measurement circuit S is the resistor to be measured (such as the resistor to be measured 120), then the current source unit 210 can be connected in series with the resistor to be measured, and the analog-to-digital converter unit 220 can be connected in parallel with the resistor to be measured. In this case, the current source unit 210 can adjust the magnitude of the current flowing through the target resistor R*. The analog-to-digital converter unit 220 can measure the voltage across the target resistor R* and can convert it into a digital voltage.

[0038] In some examples, the current source unit 210 and the analog-to-digital converter unit 220 can exist separately. In some examples, the current source unit 210 and the analog-to-digital converter unit 220 can be integrated together. In some examples, the standard resistor 110, the selection switch 230 and the analog-to-digital converter unit 220 can be integrated together at the same time.

[0039] In some examples, referring to Figure 1 , the measurement system 1 can include a recording module 30. In some examples, the recording module 30 can be connected to the measurement module 20. In some examples, the recording module 30 can record the magnitude of the current (i.e., the current value) flowing through the target resistor R* adjusted by the current source unit 210. The recording module 30 can record the digital voltage across the target resistor R* corresponding to each current value. That is to say, the magnitude of the current flowing through the target resistor R* adjusted by the current source unit 210 can be transmitted to the recording module 30 for recording, and the digital voltage measured by the analog-to-digital converter unit 220 at the same time can also be transmitted to the recording module 30 for recording.

[0040] In some examples, the recording module 30 can emit a feedback signal. In some examples, the feedback signal can be sent to the control module 50 (described later) and / or the measurement module 20. In this case, it can cause the measurement system 1 or remind the relevant personnel to control the measurement module 20 (for example, adjust the current source unit 210, the selection switch 230, etc.).

[0041] Figure 4 It shows a structural block diagram of the measurement system 1 involved in another example of the present disclosure.

[0042] In some examples, the current source unit 210 can be adjusted multiple times to change the magnitude of the current flowing through the target resistor R*. In this case, the recording module 30 can record multiple current values and the digital voltages corresponding to the multiple current values one by one. In some examples, the recording module 30 can fit the obtained discrete points into a curve (e.g., the first variation curve) through a pre-set program.

[0043] In some examples, the current source unit 210 can include an adjustment switch. In this case, the current source unit 210 can be adjusted through the adjustment switch to adjust the magnitude of the current flowing through the target resistor R*. In other examples, referring to Figure 4 , the measurement system 1 can also include a control module 50. In some examples, the control module 50 can be connected to the measurement module 20. For example, the control module 50 can be connected to the current source unit 210. In some examples, the current source unit 210 can be adjusted through the control module 50 to adjust the magnitude of the current flowing through the target resistor R*.

[0044] In some examples, the control module 50 can be wired to the current source unit 210. In other examples, the control module 50 can be wirelessly connected to the current source unit 210. For example, the wired connection can be a data line connection, and the wireless connection can be a Bluetooth connection, a WiFi connection, an infrared connection, an NFC connection, or a radio frequency connection, etc.

[0045] In some examples, the control module 50 can exist separately from the recording module 30 and can be connected to the measurement module 20 and / or the recording module 30. In some examples, the recording module 30 can also have the function of the control module 50.

[0046] Figure 5 is a schematic diagram of the first variation curve involved in the examples of the present disclosure.

[0047] In some examples, when the measurement system 1 measures the resistance value of the resistor to be measured (e.g., the resistor to be measured 120), the standard resistor 110 can be connected through the selection switch 230 first to obtain the first variation curve (refer to Figure 5 curve A in). In some examples, the first variation curve can at least have a substantially linear variation interval (refer to Figure 5 interval a in). In some examples, within interval a, the digital voltage measured by the analog-to-digital converter unit 220 can be substantially the same as the actual voltage across the target resistor R*. For example, within interval a, the digital voltage across the target resistor R* measured by the analog-to-digital converter unit 220 is equal to the actual voltage across the target resistor R*. That is, within interval a, the digital voltage across the target resistor R* measured by the analog-to-digital converter unit 220 is accurate.

[0048] Specifically, when the measurement system 1 is operating, first, the current source unit 210 and the analog-to-digital converter unit 220 in the measurement module 20 can be connected to the standard resistor 110 through the selection switch 230 to form a measurement loop S. Furthermore, by adjusting the current source unit 210 multiple times, the recording module 30 can obtain multiple current values flowing through the standard resistor 110 and multiple digital voltages corresponding one-to-one to the multiple current values. In this case, the recording module 30 can obtain the variation relationship between the current flowing through the standard resistor 110 and the voltage across the standard resistor 110 (i.e., the digital voltage) based on the multiple current values and multiple digital voltages corresponding to the standard resistor 110, that is, the first variation curve can be obtained.

[0049] In some examples, when the current magnitude flowing through the standard resistor 110 is at its maximum, the current magnitude can be gradually decreased until the current magnitude flowing through the standard resistor 110 is at its minimum, at which point the adjustment of the current source unit 210 is stopped or the current source unit 210 is turned off. In some examples, when the current magnitude flowing through the standard resistor 110 is at its minimum, the current magnitude can be gradually increased until the current magnitude flowing through the standard resistor 110 is at its maximum. However, the examples of the present disclosure are not limited to this. It is also possible to stop adjusting the current source unit 210 or turn it off when the variation between the current magnitude flowing through the standard resistor 110 and the digital voltage changes from being approximately linear to non-linear. Or, continue to increase or decrease the current magnitude to obtain several sets of data (i.e., current values and corresponding digital voltages) and then stop adjusting the current source unit 210 or turn it off. For example, when the recording module 30 adjusts the current source unit 210 multiple times, it can simultaneously record the current magnitude and the digital voltage and generate the first variation curve (see Figure 5 Curve A in). When the first variation curve changes from being approximately linear to non-linear, the recording module 30 can send a feedback signal to stop or turn off the adjustment of the current source unit 210, or the current source unit 210 continues to measure several sets of data and then stops or turns off.

[0050] In some examples, the current source unit 210 can be adjusted in an arithmetic progression manner to increase or decrease the magnitude of the current flowing through the standard resistor 110. In some examples, when the relationship between the magnitude of the current flowing through the standard resistor 110 and the change in the digital voltage changes from non-linear to approximately linear, or from approximately linear to non-linear, the difference of the arithmetic progression can be appropriately reduced to adjust the magnitude of the current flowing through the standard resistor 110. In this case, since the difference decreases when changing from non-linear to approximately linear, or from approximately linear to non-linear, the number of points in this partial region can be increased, thereby improving the accuracy of this partial region, and further obtaining a more accurate interval (operating interval) range. For example, when the current source unit 210 is adjusted in a certain arithmetic progression, the recording module 30 can record the magnitude of the current and the digital voltage simultaneously and generate a first change curve (see the curve A in Figure 5 ). When the first change curve changes from non-linear to approximately linear (see b in Figure 5 ), or from approximately linear to non-linear (see c in Figure 5 ), the difference of the arithmetic progression can be appropriately reduced when adjusting the magnitude of the current. In this case, it is convenient to subsequently obtain the operating interval (i.e., the linear operating interval) with relatively high accuracy of the analog-to-digital converter. However, the examples of the present disclosure are not limited thereto. In this embodiment, other methods can also be used to adjust the current source unit 210 to obtain the first change curve.

[0051] Figure 6 FIG. shows a schematic diagram of a second change curve involved in the examples of the present disclosure.

[0052] In some examples, the recording module 30 can obtain a second change curve from the first change curve. Among them, the second change curve can be the change relationship between the voltage (i.e., the digital voltage) and the resistance when the current is a preset value I'. Specifically, as described above, the recording module 30 can obtain the first change curve corresponding to the standard resistor 110. The recording module 30 can set the current value to the preset value I', and thus, according to the first change curve and Ohm's law R = U / I, the second change curve can be obtained. For example, see Figure 6 . Line B is the second change curve. Among them, when I = I' is defined, the linear interval in the first change curve can obtain line B according to Ohm's law R = U / I, and line B can be a straight line (i.e., a linear interval) within a certain interval.

[0053] In some examples, the current value corresponding to the second change curve (i.e., the preset value I') can be set by relevant personnel themselves. In some other examples, the current value corresponding to the second change curve can be selected by the recording module 30 itself.

[0054] In some examples, the preset value I' is variable (such as the first threshold, the second threshold, etc. described later). This can facilitate obtaining a more accurate resistance value of the resistor to be measured subsequently.

[0055] In some examples, when the measurement system 1 is operating, the preset value I' (such as the first threshold) can be preliminarily determined according to the range of the analog-to-digital converter unit 220 and the first change curve. Subsequently, the preset value I' (such as the second threshold and the third threshold described later) can be adjusted according to the voltage magnitude or resistance magnitude across the resistor to be measured (such as the resistor to be measured 120). In some examples, the preliminarily determined preset value I' can be the first threshold. The first threshold can be the current magnitude corresponding to when the voltage measured by the analog-to-digital converter unit 220 is the median value of its range. In this case, it can facilitate obtaining the resistance value of the resistor to be measured subsequently.

[0056] In some examples, the measurement system 1 can include a processing module 40. In some examples, the processing module 40 can be connected to the recording module 30. In some examples, the processing module 40 can obtain the resistance value of the resistor to be measured (such as the resistor to be measured 120) based on the first change curve, the second change curve, the current flowing through the resistor to be measured, and the digital voltage across the resistor to be measured.

[0057] Specifically, as described above, when the measurement system 1 is operating, the recording module 30 can obtain the first change curve and the second change curve. The processing module 40 can be connected to the recording module 30 and can obtain the first change curve and the second change curve. After the recording module 30 obtains the first change curve and the second change curve, the measurement system 1 or relevant personnel can adjust the selection switch 230 to connect the resistor to be measured (such as the resistor to be measured 120) to the measurement loop S, so that the current source unit 210 can adjust the magnitude of the current flowing through the resistor to be measured, and the analog-to-digital converter unit 220 can measure the digital voltage across the resistor to be measured. Subsequently, the measurement system 1 or relevant personnel can adjust the current source unit 210 to make the magnitude of the current flowing through the resistor to be measured be the preset value I', and at the same time, the analog-to-digital converter unit 220 can measure the digital voltage across the resistor to be measured and can transmit it to the processing module 40 via the recording module 30. In this case, the processing module 40 can obtain the resistance value of the resistor to be measured based on the first change curve, the second change curve, the current flowing through the resistor to be measured, and the digital voltage across the resistor to be measured.

[0058] In some examples, when the current passing through the resistor under test is a preset value I', if the voltage across the resistor under test can be within the linear range of the second variation curve (i.e., the segment of the second variation curve corresponding to the voltage range of the linear operating range in the first variation curve, that is, the segment of the second variation curve when the analog-to-digital converter unit 220 is in the linear operating range), the processing module 40 can obtain the resistance value of the resistor under test based on the voltage across the resistor under test, the first variation curve, and the second variation curve. For example, when it is determined that the preset value I' is the first threshold, the corresponding second variation curve is obtained, the selection switch 230 and the current source unit 210 are adjusted so that the current flowing through the resistor under test is the first threshold, and at the same time the analog-to-digital converter unit 220 obtains the digital voltage across the resistor under test. If the processing module 40 determines that the digital voltage is within the linear range of the second variation curve, the processing module 40 can obtain the resistance value of the resistor under test, and this resistance value satisfies: R = ADC / ADC m ×R0, where R is the resistance value of the resistor under test, ADC is the voltage across the resistor under test when the current passing through the resistor under test is the preset value I' (e.g., the first threshold) (which can be obtained by converting the digital voltage), ADC m is the voltage across the standard resistor 110 when the current passing through the standard resistor 110 is the preset value I' (e.g., the first threshold), and R0 is the resistance value of the standard resistor 110 (i.e., the predetermined resistance value). ADC m can be obtained by the processing module 40 through the first variation curve. In this case, a more accurate resistance value of the resistor under test can be obtained. However, the examples of the present disclosure are not limited to this. If the accuracy of the current source unit 210 is high, the resistance value of the resistor under test can be directly read from the second variation curve.

[0059] In some examples, when the current passing through the resistor under test is a preset value I', if the voltage across the resistor under test is not within the linear range of the second variation curve (or not within the range where the second variation curve is located), the preset value I' can be readjusted, so that the corresponding second variation curve corresponding to the preset value I' can be obtained again until the voltage across the resistor under test is within the linear range of the second variation curve when the current passing through the resistor under test is the preset value I'. For example, when the preset value I' is the first threshold and the processing module 40 determines that the digital voltage is not within the linear range of the second variation curve, the processing module 40 can send a feedback signal to the recording module 30 or relevant personnel, and the recording module 30 or relevant personnel can re-determine the preset value I' until the voltage across the corresponding resistor under test when the current is the preset value I' is within the linear range of the corresponding second variation curve. In this case, it is convenient to obtain a more accurate resistance value of the resistor under test subsequently.

[0060] In some examples, the preset value I' can be adjusted according to the voltage across the resistor to be measured. For example, if the preset value I' is the first threshold, and the voltage across the resistor to be measured is greater than the maximum voltage corresponding to the linear range of the second variation curve, then the preset value I' can be adjusted so that the adjusted preset value I' (i.e., the second threshold) is less than the first threshold. If the preset value I' is the first threshold, and the voltage across the resistor to be measured is less than the maximum voltage corresponding to the linear range of the second variation curve, then the preset value I' can be adjusted so that the adjusted preset value I' (i.e., the third threshold) is greater than the first threshold. Thus, it is convenient to obtain a more accurate resistance value of the resistor to be measured subsequently.

[0061] In some examples, the preset value I' can be adjusted multiple times until the corresponding voltage across the analog-to-digital converter unit 220 lies within the linear range of the second variation curve corresponding to the preset value I'. In this case, the analog-to-digital converter unit 220 can be in a linear operating range, and the analog-to-digital converter unit 220 can have a higher accuracy in this linear operating range, that is, the measured voltage can be more accurate. In some examples, the junctions between the non-linear range and the linear range in the first variation curve can be the first target point and the second target point respectively. For example, referring to Figure 5 in the figure, the point b in the first variation curve corresponds to the first target point, and the point c in the first variation curve corresponds to the second target point. In some examples, the preset value I' can be within the range of the current value corresponding to the first target point to the current value corresponding to the second target point. For example, the current value corresponding to the first target point can be I1, and the current value corresponding to the second target point can be I2. The range of the size of the preset value I' can be [I1, I2].

[0062] In some examples, the processing module 40 and the recording module 30 can exist separately and can be connected to the recording module 30. In some other examples, the processing module 40 can also have the related functions of the recording module 30 at the same time. In some examples, the multiple modules included in the measurement system 1 can be integrated together.

[0063] As described above, the measurement system 1 according to this embodiment can obtain the voltage and current variation relationship corresponding to the standard resistor 110 through the measurement module 20, can obtain the first variation curve through the recording module 30, can obtain the second variation curve based on the first variation curve, and can obtain the voltage across the resistor to be measured when the current flowing through the resistor to be measured is the preset value I' through the measurement module 20, and then can obtain the resistance value of the resistor to be measured through the processing module 40. Thus, a more accurate resistance value of the resistor to be measured can be obtained.

[0064] In some examples, the measurement system 1 involved in this embodiment can be applied to a retinal stimulator. In some examples, the retinal stimulator can include an implanted part and an external part (not shown).

[0065] In some examples, the implanted part can include a stimulation electrode array. The stimulation electrode array can include a plurality of stimulation electrodes. The stimulation electrodes can generate electrical stimulation signals according to visual signals. Specifically, after the implanted part is implanted into the human body (such as inside the eyeball), the implanted part can receive visual signals, and the stimulation electrodes can convert the received visual signals into bidirectional pulse current signals as electrical stimulation signals, so as to emit bidirectional pulse current signals to ganglion cells or bipolar cells of the retina to generate a sense of light.

[0066] In some examples, the visual signals received by the implanted part can be collected and processed by a camera device and an image processing device of the external part.

[0067] In some examples, the camera device can be used to capture images and convert the captured images into visual signals. For example, the camera device can capture images of the environment where the patient is located.

[0068] In some examples, the image processing device can receive the visual signals generated by the camera device. The image processing device can process the visual signals and send them to the receiving antenna of the implanted part via a transmitting antenna, so as to be received by the implanted part.

[0069] In some examples, the measurement system 1 can be arranged in the retinal stimulator, and the resistance values corresponding to the stimulation electrodes after implantation can be measured in sequence. For example, the measurement module 20 and the standard resistor 110 in the measurement system 1 can be arranged in the implanted part, and the recording module 30 and the processing module 40 in the measurement system 1 can be arranged in the image processing device of the external part. In some examples, one or more channels corresponding to a plurality of stimulation electrodes (such as the channels for controlling the stimulation electrodes to generate stimulation signals) can be used as a resistance to be measured.

[0070] In some examples, the implantation conditions of each stimulation electrode can be judged according to the resistance values corresponding to each stimulation electrode. Specifically, if the stimulation electrode is implanted normally (for example, the stimulation electrode should be closely attached to the ganglion cells or bipolar cells of the retina), then the stimulation electrode can correspond to a relatively large resistance value; if the stimulation electrode is not implanted normally, or even causes the stimulation electrode to be exposed in physiological saline, it may cause a short-circuit phenomenon or the resistance value corresponding to the stimulation electrode is relatively small. Thus, the implantation conditions of each stimulation electrode can be judged. In some examples, a comparison threshold can be preset in the processing module 40 (or the image processing device) for judging the implantation conditions of each stimulation electrode. The comparison threshold can be determined by the resistance value corresponding to the stimulation electrode after normal implantation.

[0071] Although the present disclosure has been specifically described above in conjunction with the accompanying drawings and embodiments, it is understood that the above description does not limit the present disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from the essence and scope of the present disclosure, and these modifications and variations all fall within the scope of the present disclosure.

Claims

1. A measurement system for measuring a resistance to be measured, characterized in that, Comprising: A measurement module, which includes a current source unit, an analog-to-digital converter unit, and a selection switch. By adjusting the selection switch, the current source unit and the analog-to-digital converter unit are connected to a standard resistor or a resistor under test to form a measurement loop. The current source unit is used to adjust the current flowing through the standard resistor or the resistor under test, and the analog-to-digital converter unit is used to measure the voltage across the standard resistor or the resistor under test and convert it into a digital voltage; A recording module that records a first change curve and a second change curve; and A processing module that obtains the resistance value of the resistor under test based on the first change curve, the second change curve, the current flowing through the resistor under test, and the digital voltage across the resistor under test. Wherein, the first change curve is the change relationship between the current flowing through the standard resistor and the voltage across the standard resistor when connecting the current source unit, the analog-to-digital converter unit to a standard resistor with a preset resistance value and adjusting the current source. The second change curve is the change relationship between voltage and resistance when the current is a preset value obtained based on the first change curve. Wherein, the preset value is the current value located in the linear interval of the first change curve, and the voltage range of the second change curve is the corresponding segment of the voltage range of the linear interval in the first change curve; When the current passing through the resistor under test is the preset value, if the voltage across the resistor under test is within the linear interval of the second change curve, the processing module obtains the resistance value of the resistor under test based on the voltage across the resistor under test and the second change curve.

2. The measurement system according to claim 1, characterized in that: The measurement system includes a plurality of resistors under test, and the measurement module is sequentially connected to one of the plurality of resistors under test to form a measurement loop.

3. The measurement system according to claim 1, characterized in that: The analog-to-digital converter unit includes an internal resistor, an operational amplifier, and an analog-to-digital converter.

4. The measurement system according to claim 1, characterized in that: The resistance value of the resistor to be measured satisfies: R = ADC / ADC m ×R0, where R is the resistance value of the resistor to be measured, ADC is the voltage of the resistor to be measured when the current passing through the resistor to be measured is the preset value, and ADC m is the voltage of the standard resistor when the current passing through the standard resistor is the preset value, and R0 is the standard resistance value.

5. The measurement system according to claim 3, characterized in that: The preset value is a first threshold. When the current passing through the resistor under test is the first threshold, the voltage across the resistor under test is not within the linear interval of the second change curve corresponding to the first threshold, then the preset value is adjusted by adjusting the current source unit until the voltage across the resistor under test corresponding to when the current is this preset value is within the linear interval of the corresponding second change curve.

6. The measurement system according to claim 5, characterized in that: The first threshold is the current magnitude corresponding to when the voltage measured by the analog-to-digital converter unit is the median value of the range of the analog-to-digital converter unit.

7. The measurement system according to claim 5, characterized in that: When the current passing through the resistance to be measured is the first threshold, the voltage across the resistance to be measured does not lie within the linear range of the second change curve corresponding to the first threshold, and the voltage across the resistance to be measured is greater than the maximum voltage corresponding to the linear range of the second change curve, then adjust the preset value, and the adjusted preset value is less than the first threshold.

8. The measurement system according to claim 5, characterized in that: When the current passing through the resistance to be measured is the first threshold, the voltage across the resistance to be measured does not lie within the linear range of the second change curve corresponding to the first threshold, and the voltage across the resistance to be measured is less than the minimum voltage corresponding to the linear range of the second change curve, then adjust the preset value, and the adjusted preset value is greater than the first threshold.

9. The measurement system according to claim 1, characterized in that: If the current source unit and the analog-to-digital converter unit form a measurement loop with the standard resistance, then the current source unit is connected in series with the standard resistance, and the analog-to-digital converter unit is connected in parallel with the standard resistance.

10. The measurement system according to claim 1, characterized in that: If the current source unit and the analog-to-digital converter unit form a measurement loop with the resistance to be measured, then the current source unit is connected in series with the resistance to be measured, and the analog-to-digital converter unit is connected in parallel with the resistance to be measured.

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