A system for rapid antenna testing

Abstract

The present invention provides a system for rapid antenna testing, which includes an antenna under test, a test device, a switch matrix, a probe matrix, and a test controller for controlling the switch array; one port of the test device feeds power to the antenna under test, and the other port is connected to the probe array through the switch matrix; the probe matrix includes a metal floor, a dielectric layer, and a probe layer stacked in sequence, and the probe matrix further includes a first metal column, a second metal column, and a third metal column; the switch matrix and the dielectric layer are located on both sides of the metal floor, and the dielectric layer and the antenna under test are located on both sides of the probe layer; the projection of the antenna under test falls on the middle part of the probe layer; the probe layer is composed of probes arranged; the probe is composed of a first microstrip line and a second microstrip line that are orthogonal to each other; one end of the first microstrip line is connected to the switch matrix through the first metal column, and the other end is connected to the second microstrip line; one end of the second microstrip line is connected to the switch matrix through the second metal column, and the other end is connected to the metal floor through the third metal column.

Description

Technical Field

[0001] The present invention relates to the technical field of antenna testing, and in particular to a system for rapid antenna testing. Background Art

[0002] With the development of 5G mobile communications and the acceleration of the R & D cycle of antenna products, the amount of testing in the product production line is large, posing challenges to the cost, speed, mobility, and portability of the testing system.

[0003] In the face of these new testing challenges, there are currently two solutions from major companies: one is the far-field testing method, and the other is the near-field testing compact range testing method. The far-field testing method requires a large site and a large number of absorber materials to be laid out, so the construction cost is expensive; the near-field testing compact range testing method, based on the testing method of the compact range, is expanded by plane waves, cylindrical waves, and spherical waves, and has the advantages of small volume and low cost. Currently, most compact ranges use methods with a small number of probes or mechanical arm movement to obtain more near-field data. Most of these testing devices require absorber materials, a dedicated site to be built, and the mechanical arm moves slowly. Therefore, when the testing surface is large, the probe needs to move for a long time, and the interference between the probe and the metal arm needs to be handled. Therefore, it is of great significance to design an efficient, low-complexity, fast, simple, and antenna testing system that does not require a complex site.

[0004] Existing patents have disclosed a near-field microwave scanning system. The system includes a switch array of antenna elements forming an array surface, a scanning surface substantially parallel to the array surface and separated by a distance less than approximately one wavelength of the measurement frequency, and a processing engine for acquiring and processing near-field data. Absorbers are not used in the system. The antenna elements are staggered in two orthogonal directions to obtain the components of the electromagnetic field in two directions at each sampling point; for the amplitude, interpolation of data from surrounding antenna elements is required; for the phase, the phases need to be sorted, screened, and then averaged; for sampling points on the edges and corners, special processing or extrapolation is required. Therefore, for the amplitude and phase data of the probe at positions such as the middle, edges, and corners, the processes of data screening, data determination, and data processing are all complex and inevitably introduce data errors, making it difficult to guarantee the measurement accuracy. The system also needs to use two signals, one as a reference and the other as output test data. This method requires two phase detectors in hardware, and two probes need to work simultaneously during operation. When switching the probes, the two probes need to be turned on simultaneously, so a complex circuit needs to be designed to achieve this. Moreover, there is interference between the signals of the two working probes, and a filter structure needs to be connected. For the calibration and processing of the amplitude, the mutual coupling effect needs to be considered, and the processing of calibrating the mutual coupling is complex, further increasing the difficulty of data processing. In addition, the uniform distribution adopted in this patent inevitably brings data redundancy for the antenna test system, further increasing the burden of data processing. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to design a fast test system with a simpler structure and data processing method.

[0006] To solve the above technical problems, the technical solution adopted by the present invention is as follows:

[0007] A system for rapid antenna testing, comprising an antenna under test, a test device, a switch matrix, a probe matrix, and a test controller for controlling the switch array; one port of the test device feeds power to the antenna under test, and the other port is connected to the probe array through the switch matrix; the probe matrix includes a metal floor, a dielectric layer, and a probe layer stacked in sequence, and the probe matrix further includes a first metal column, a second metal column, and a third metal column; the switch matrix and the dielectric layer are located on both sides of the metal floor, and the dielectric layer and the antenna under test are located on both sides of the probe layer; the projection of the antenna under test falls on the middle part of the probe layer; the probe layer is composed of probes arranged; the probe is composed of a first microstrip line and a second microstrip line that are orthogonal to each other; one end of the first microstrip line is connected to the switch matrix through the first metal column, and the other end is connected to the second microstrip line; one end of the second microstrip line is connected to the switch matrix through the second metal column, and the other end is connected to the metal floor through the third metal column.

[0008] Further, the central operating frequency wavelength of the antenna under test is λ; the probe layer is composed of probes arranged in a pattern of dense in the middle and sparse at the edges or composed of probes arranged uniformly, and the distance between adjacent two probes is 0.333λ - 1λ; the distance from the projection of the antenna under test on the probe layer to the center of the probe layer is 0 - 3λ.

[0009] Further, all the first microstrip lines of all the probes are parallel to each other, and all the second microstrip lines of all the probes are also parallel to each other.

[0010] Further, the probes are arranged in a concentric circular pattern or a concentric rectangular pattern or a spiral pattern in a pattern of dense in the middle and sparse at the edges.

[0011] Further, the concentric circular pattern is composed of at least two concentric circles, and one probe is arranged at the center position; along the direction from the center to the outer edge, the radius of the first circle is R, and the radius difference between adjacent two circles is R; one probe is arranged at each of the N equal division positions of the same circle; taking the center as the vertex, the angle between two adjacent probes located on adjacent two circles and also adjacent in position and the center is α, where 0° ≤ α < 180°, and N is a natural number greater than or equal to 2.

[0012] Further, the concentric rectangular pattern is composed of at least two concentric rectangles, and one probe is arranged at the center position; along the direction from the center to the outer edge, the side length of the first rectangle is L, and the side length difference between adjacent two rectangles is L; one probe is arranged at each of the four corners and the middle positions of the four sides of the same rectangle.

[0013] Further, along the inward-outward rotation direction of the spiral pattern, the distance from the probe to the center of the probe layer gradually increases.

[0014] Further, the length of the first microstrip line is A, and the width is B; the length of the second microstrip line is C, and the width is D; the distance from the intersection point of the first microstrip line and the second microstrip line to the third metal post is E; the distance from the antenna under test to the probe layer is H, where 0.01λ ≤ A ≤ 1λ, 0 < B ≤ 0.25λ, 0.015λ ≤ C ≤ 1.1λ, 0 < D ≤ 0.25λ, 0.4C ≤ E ≤ 0.6C, 0.1λ ≤ H ≤ 1λ.

[0015] Further, the test device is a network analyzer; the antenna under test is an antenna element or an antenna array.

[0016] Further, it further includes a terminal for storing and processing data, and the terminal is respectively signal-connected to the test controller and the test device.

[0017] The beneficial effects of the present invention are as follows: The system does not need to use absorber materials and filters. The switch matrix circuit only needs to have an on-off function. The number of probes per unit area is reduced, and the manufacturing cost is decreased. Since the two orthogonal microstrip lines are integrated in the same probe, the magnetic field coordinate offsets in the two orthogonal directions obtained at the same position are small. After the system is calibrated, the measurement result will not deviate with the replacement of the antenna under test, and the measured value is the actual value, and the data does not need secondary processing. A single probe works, and the other probes in the probe matrix have little influence on the working probe. The amplitude and phase can be calibrated simultaneously during system calibration, and no secondary calibration is required after calibration is completed. Description of the Drawings

[0018] The following details the specific structure of the present invention with reference to the drawings

[0019] Figure 1 It is a schematic structural diagram of a system for rapid antenna testing according to the present invention;

[0020] Figure 2 It is a top view of partial structural details in the probe matrix of a system for rapid antenna testing according to the present invention;

[0021] Figure 3 It is a bottom view of partial structural details in the probe matrix of a system for rapid antenna testing according to the present invention;

[0022] Figure 4 (a), Figure 4 (b), Figure 4 (c) and Figure 4(d) Schematic diagram of the probe arrangement of the probe matrix of a system for rapid antenna testing according to the present invention;

[0023] Figure 5 Far - field normalized radiation pattern of the test result and the theoretical result value (reference value) when the probes are evenly arranged in a system for rapid antenna testing according to the present invention

[0024] Figure 6 Far - field normalized radiation pattern of the test result and the theoretical result value (reference value) when the probes are evenly arranged in a system for rapid antenna testing according to the present invention

[0025] Figure 7 Far - field normalized radiation pattern when the probes are non - evenly arranged and evenly arranged in a system for rapid antenna testing according to the present invention

[0026] Figure 8 Far - field normalized radiation pattern when the probes are non - evenly arranged and evenly arranged in a system for rapid antenna testing according to the present invention

[0027] Wherein, 1 - probe layer, 11 - first microstrip line, 12 - second microstrip line, 13 - first metal column, 14 - second metal column, 15 - third metal column, 2 - dielectric layer, 3 - metal floor, 4 - switch matrix, 5 - test controller, 6 - test equipment, 7 - antenna under test, 8 - terminal. Detailed implementation manner

[0028] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0029] Embodiment 1

[0030] Please refer to Figures 1 to 4, A system for rapid antenna testing, comprising an antenna under test 7, a test device 5, a switch matrix 4, a probe matrix, and a test controller 5 for controlling the switch array 4; the test device 5 is provided with at least two ports, one port of the test device 5 feeds power to the antenna under test 7, and the other port is connected to the probe matrix through the switch matrix; the probe matrix includes a metal floor 3, a dielectric layer 2, and a probe layer 1 stacked in sequence, and the probe matrix further includes a first metal column 13, a second metal column 14, and a third metal column 15; the switch matrix 4 and the dielectric layer 2 are located on both sides of the metal floor 3, and the dielectric layer 2 and the antenna under test 7 are located on both sides of the probe layer 1; the projection of the antenna under test 7 falls on the middle part of the probe layer 1; the probe layer 1 is composed of probes arranged; the probe is composed of a first microstrip line 11 and a second microstrip line 12 that are orthogonal to each other; one end of the first microstrip line 11 is connected to the switch matrix 4 through the first metal column 13, and the other end is connected to the second microstrip line 12; one end of the second microstrip line 12 is connected to the switch matrix 4 through the second metal column 14, and the other end is connected to the metal floor 3 through the third metal column 15. The first microstrip line 11 and the second microstrip line 12 respectively form two orthogonal polarization directions. The position of the first metal column 13 away from the end of the first microstrip line 11 corresponds to the first port, and the position of the second metal column 14 away from the end of the second microstrip line 12 corresponds to the second port. For the first port and the second port of the same probe, one port corresponds to one test channel. Therefore, it is necessary to switch these two ports through the switch matrix 4 to measure the phase and amplitude of the two polarization directions of the same probe. However, the phase and amplitude can be measured simultaneously.

[0031] The system does not need to use absorber materials and does not need filters. The switch matrix circuit only needs to have the function of on and off. The number of probes per unit area is reduced, and the manufacturing cost is reduced. Since the two orthogonal microstrip lines are integrated in the same probe, the magnetic field coordinate offset in the two orthogonal directions obtained at the same position is small. After the system is calibrated, the measurement result will not deviate with the replacement of the antenna under test, and the measured value is the actual value, and the data does not need secondary processing. A single probe works, and the influence of other probes in the probe matrix on the working probe is small. The amplitude and phase can be calibrated simultaneously during system calibration, and no secondary calibration is required after calibration. A slight change in the specific position of the projection of the antenna under test 7 on the probe layer 1 will not affect the accuracy of the measurement result, so it is simple to replace the antenna under test 7.

[0032] During calibration, after an electromagnetic field (plane wave) with a known amplitude and phase is incident, the ports of the probe matrix obtain the amplitude and phase of the electromagnetic field. By directly comparing the measured data with the known incident data, the amplitude and phase calibration coefficients of the probes can be obtained simultaneously. The measured data does not need to be screened or interpolated. For the probes at the same position in the same system structure, their amplitude and phase calibration coefficients are fixed and unchanged, and replacing the antenna body 7 to be measured will not cause the system calibration coefficients to change.

[0033] Embodiment 2

[0034] Based on the above structure, the central operating frequency wavelength of the antenna body 7 to be measured is λ; please refer to Figure 4 (a), Figure 4 (b), Figure 4 (c) and Figure 4 (d). The probe layer 1 is composed of probes arranged according to the rule of being dense in the middle and sparse at the edges or composed of probes arranged uniformly, which can further reduce the number of probes used, but does not affect the measurement accuracy. With the reduction of the number of probes, the corresponding data processing volume is also further reduced. The distance between adjacent two probes is 0.333λ - 1λ, which not only ensures sufficient measurement data but also further reduces the mutual influence between the probes. The distance from the projection of the antenna body 7 to be measured on the probe layer 1 to the center of the probe layer 1 is 0 - 3λ.

[0035] Embodiment 3

[0036] Based on the above structure, all the first microstrip lines 11 of all the probes are parallel to each other, and all the second microstrip lines 12 of all the probes are also parallel to each other.

[0037] Embodiment 4

[0038] Based on the above structure, please refer to Figure 4 (b), Figure 4 (c) and Figure 4 (d). The probes are arranged in a concentric circular pattern or a concentric rectangular pattern or a spiral pattern according to the rule of being dense in the middle and sparse at the edges. Since the projection of the antenna body 7 to be measured falls on the middle part of the probe layer 1, the electromagnetic field density is large at the middle part of the probe layer 1 but small at the edges, so setting a sparse number of probes at the edges does not affect the measurement accuracy.

[0039] Embodiment 5

[0040] Based on the structure of Embodiment 4 above, please refer to Figure 4(b), the concentric circular pattern consists of at least two concentric circles, and one of the probes is arranged at the center position; along the direction from the center to the outer edge, the radius of the first circle is R, and the radius difference between adjacent two circles is R; one of the probes is arranged at each of the N equal - division positions of the same circle; taking the center as the vertex, the angle between two adjacent probes located on adjacent circles and the center is α, where 0° ≤ α < 180°, and N is a natural number greater than or equal to 2.

[0041] Embodiment 6

[0042] Based on the structure of the above - mentioned Embodiment 4, please refer to Figure 4 (c), the concentric rectangular pattern consists of at least two concentric rectangles, and one of the probes is arranged at the center position; along the direction from the center to the outer edge, the side length of the first rectangle is L, and the side - length difference between adjacent two rectangles is L; one of the probes is arranged at each of the four - corner positions and the middle positions of the four sides of the same rectangle. The four - corner positions of the same rectangle refer to the positions within 0.1L from the right - angle vertex, preferably the position of the right - angle vertex. The middle positions of the four sides refer to the positions within the range of 0.4L - 0.6L from one end - point of the side itself, preferably the position of the mid - point of the side.

[0043] Embodiment 7

[0044] Based on the structure of the above - mentioned Embodiment 4, please refer to Figure 4 (d), along the in - out rotation direction of the spiral pattern, the distance from the probe to the center of the probe layer 1 gradually increases. In this structure, the number of probes used per unit area is less, but it does not affect the accuracy of the final result.

[0045] Embodiment 8

[0046] Based on any of the above - mentioned structures, the length of the first microstrip line 11 is A, and the width is B; the length of the second microstrip line 1 is C, and the width is D; the distance from the intersection point of the first microstrip line 11 and the second microstrip line 12 to the third metal column 15 is E; the distance from the antenna body under test 7 to the probe layer 1 is H, where 0.01λ ≤ A ≤ 1λ, 0 < B ≤ 0.25λ, 0.015λ ≤ C ≤ 1.1λ, 0 < D ≤ 0.25λ, 0.4C ≤ E ≤ 0.6C, 0.1λ ≤ H ≤ 1λ. This further improves the measurement accuracy.

[0047] Embodiment 9

[0048] Based on any of the above - mentioned structures, the test device 6 is a network analyzer; the antenna body under test 7 is an antenna unit or an antenna array.

[0049] Embodiment 10

[0050] Based on any of the above structures, it further includes a terminal 8 for storing and processing data. The terminal 8 is respectively connected to the test controller 5 and the test device 6 in a signal connection. The signal connection can be a wired connection or a wireless connection. The terminal 9 is one or several of a computer, a mobile phone, and a tablet. During calibration, the terminal 9 can obtain the numerical values of electromagnetic waves with known phase and amplitude, and the numerical values of phase and amplitude measured at the probe port. By comparing the known phase numerical value with the measured phase numerical value, and comparing the known amplitude numerical value with the measured amplitude numerical value, the calibration coefficients of both amplitude and phase can be obtained and stored. When measuring the antenna body to be tested, the numerical value obtained after calibrating the measured numerical value at the probe port through the calibration coefficient corresponding to the probe is the true numerical value of the antenna body 7 to be tested at the position of this probe. The entire data processing process is simple and does not involve interpolation and data screening.

[0051] After the terminal 8 finishes obtaining the measured numerical value of one port in one probe from the test device 6, it will trigger the test controller 5 to send a signal to the switch matrix 4 for switch switching, switching to the other port of this probe or the port of the next probe.

[0052] By discretizing the two-dimensional test probe data, that is, the entire test plane into grids one by one, each grid point represents the probe data, and two mutually perpendicular microstrip lines are arranged at each test sampling point. After removing the influence of the metal floor 3 from the test data using appropriate techniques, the magnetic fields H_x and H_y can be obtained. According to the Fourier transform, the plane wave spectrum expansion coefficient can be obtained:

[0053] F x，y (k x , k y ) = ∫∫H x，y (x, y)exp[j(k x x + k y y)]dS

[0054] In the formula, x and y represent two mutually orthogonal polarization directions, H is the magnetic field strength, k is the wave number corresponding to the test frequency, and j is the imaginary unit. The plane polarization probe matrix distribution is: on the test surface, the position of the microstrip line is (ρ m cosφ mn , ρ m sinφ mn ), ρ and φ are the polar radius and polar angle, m is the number of the probe in the radial direction, and n is the number of the probe in the angular direction. For the sake of simplicity of expression, a simple structure selected is: the step in the radial direction is In the formula, λ is the wavelength; on the ring where ρ = ρ m , the sampling step of the polar angle is taken as Δφ m = λ / (2ρ m ).

[0055] In the plane polar coordinate system, the plane wave spectrum coefficients can be approximately calculated as follows

[0056]

[0057] The above equation can be accelerated by using the Non-Uniform Discrete Fourier Transform (Non-Uniform DFT).

[0058] Furthermore, the far-field radiation can be obtained from the plane wave spectrum

[0059]

[0060] wherein

[0061]

[0062] F φ =-F x sinφ + F y cosφ

[0063] To further illustrate the beneficial effects of the present invention, further discussions are made based on the following test examples. The following test examples 1-2 have the following structure

[0064] A system for rapid antenna testing, comprising an antenna under test 7, a test device 6, a switch matrix 4, a probe matrix, a test controller 5 for controlling the switch array 4, and a terminal 8 for storing and processing data; at least two ports are provided on the test device 6, one port of the test device 6 feeds power to the antenna under test 7, and the other port is connected to the probe matrix through the switch matrix 4; the probe matrix includes a metal floor 3, a dielectric layer 2, and a probe layer 1 stacked in sequence, and the probe matrix further includes a first metal column 13, a second metal column 14, and a third metal column 15; the switch matrix 4 and the dielectric layer 2 are located on both sides of the metal floor 3, and the dielectric layer 2 and the antenna under test 7 are located on both sides of the probe layer 1; the projection of the antenna under test 7 falls on the middle part of the probe layer 1; the probe layer 1 is composed of probes arranged; the probe is composed of a first microstrip line 11 and a second microstrip line 12 that are orthogonal to each other; one end of the first microstrip line 11 is connected to the switch matrix 4 through the first metal column 13, and the other end is connected to the second microstrip line 12; one end of the second microstrip line 12 is connected to the switch matrix 4 through the second metal column 14, and the other end is connected to the metal floor 3 through the third metal column 15. The first microstrip lines 11 of all the probes are parallel to each other, and the second microstrip lines 12 of all the probes are also parallel to each other. The terminal 8 is respectively connected to the test controller 5 and the test device 6 in signal

[0065] The length of the first microstrip line 11 is A = 1.5 mm, and the width is B = 0.2 mm; the length of the second microstrip line is C = 1.5 mm, and the width is D = 0.2 mm; the distance from the intersection point of the first microstrip line 11 and the second microstrip line 12 to the third metal post 15 is E = 0.75 mm; the distance from the antenna body 7 to be measured to the probe layer 1 is H = 0.2λ. The projection of the antenna body 7 to be measured falls on the center of the probe layer 1.

[0066] The test device 6 is a network analyzer; the antenna body 7 to be measured is an antenna element or an antenna array. The center operating frequency wavelength of the antenna body 7 to be measured is 5G; the parameters of the incident wave used for calibration are uniform plane waves generated by a special device.

[0067] Test Example 1

[0068] In Test Example 1, in addition to the above structure, the probes are uniformly arranged to form a 20*20 rectangular array, as shown in Figure 4 (a). The spacing between adjacent two probes is 0.5λ.

[0069] According to the test data, the far-field normalization result is calculated, and the obtained far-field normalized radiation pattern result is shown in detail in Figure 5 and Figure 6 . From the results of Figure 5 and Figure 6 , it can be seen that when the antenna body 7 to be measured is tested according to the method of the present application, the test result is basically consistent with the theoretical result.

[0070] Test Example 2

[0071] In Test Example 2, in addition to the above structure, the probes are non-uniformly arranged, as shown in Figure 4 (b). The probes are arranged in a concentric circular pattern with a dense middle and a sparse edge. The concentric circular pattern is composed of at least two concentric circles, and one probe is arranged at the center position; along the direction from the center to the outer edge, the radius of the first circle is R = 0.5λ, and the radius difference between adjacent two circles is R = 0.5λ; one probe is arranged at the quarter positions of the same circle; the included angle between the connection lines of two probes at opposite positions on the same circle and the connection lines of two probes at opposite positions on the adjacent another circle is 45°. The total number of probes is 400.

[0072] When calculating, the step size in the radial direction is where λ is the wavelength; on the ring of ρ = ρ m , the sampling step size of the polar angle is taken as Δφ m = λ / (2ρ m ).

[0073] Based on the test data of Test Example 1 and Test Example 2, the far-field normalization result is calculated, and the far-field normalization pattern result is shown in detail in Figure 7 and Figure 8 . It can be seen from the results of Figure 7 and Figure 8 that when the antenna body 7 to be measured is tested according to the method of the present application, the test results of the uniform arrangement and non-uniform arrangement of the probes are basically the same.

[0074] In summary, a system for rapid antenna testing provided by the present invention does not require absorber materials, does not require filters, and the switching matrix circuit only needs to have on-off functions. The number of probes per unit area is reduced, and the manufacturing cost is decreased. Since the microstrip lines in two orthogonal directions are integrated in the same probe, the magnetic field coordinate offset in two orthogonal directions obtained at the same position is small. After the system is calibrated, the measurement result will not deviate with the replacement of the antenna body to be measured, and the measured value is the actual value, and the data does not require secondary processing. A single probe works, and the influence of other probes in the probe matrix on the working probe is small. The amplitude and phase can be calibrated simultaneously during system calibration. After calibration is completed, the calibration coefficients are stored in the terminal, and secondary calibration is not required after the environment is changed.

[0075] Here, the first, the second... only represent the distinction of their names, and do not represent any differences in their importance and positions.

[0076] The above are only embodiments of the present invention, and do not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied to other related technical fields, are similarly included in the patent protection scope of the present invention.

Claims

1. A system for rapid antenna testing, comprising an antenna under test, a test device, a switch matrix, a probe matrix, and a test controller for controlling the switch matrix; the test device is provided with at least two ports; one port of the test device feeds power to the antenna under test, and the other port is connected to the probe matrix through the switch matrix, characterized in that, The probe matrix includes a metal floor, a dielectric layer, and a probe layer stacked in sequence. The probe matrix further includes a first metal column, a second metal column, and a third metal column. The switch matrix and the dielectric layer are located on both sides of the metal floor. The dielectric layer and the antenna under test are located on both sides of the probe layer. The projection of the antenna under test falls on the middle part of the probe layer. The probe layer is composed of arranged probes. The probe is composed of a first microstrip line and a second microstrip line that are orthogonal to each other. One end of the first microstrip line is connected to the switch matrix through the first metal column, and the other end is connected to the second microstrip line. One end of the second microstrip line is connected to the switch matrix through the second metal column, and the other end is connected to the metal floor through the third metal column. The system further includes a calibration process and a test process. In the calibration process, electromagnetic wave values with known phase and amplitude can be obtained, as well as the phase and amplitude values measured at the probe ports. By comparing the known phase values with the measured phase values and comparing the known amplitude values with the measured amplitude values, calibration coefficients for both amplitude and phase can be obtained simultaneously. In the test process, after obtaining the measured value of a port in a probe, the test controller will trigger the switch matrix to send a signal to switch to another port of the probe or the port of the next probe. By discretizing the two-dimensional test probe data, that is, the entire test plane into grids, each grid point represents the probe data, and two mutually perpendicular microstrip lines are arranged at each test sampling point, the magnetic field H can be obtained by removing the influence of the metal floor from the test data using appropriate technology. x and H y ; According to the Fourier transform, the plane wave spectrum expansion coefficient can be obtained: F x,y (k x ,k y ) = ∫∫H x,y (x,y) exp[j(k x x + k y y)] dS In the formula, x and y represent two mutually orthogonal polarization directions, H is the magnetic field strength, k is the wave number corresponding to the test frequency, and j is the imaginary unit. The matrix distribution of the planar polarization probes is as follows: on the test surface, the positions of the microstrip lines are (ρ m cosφ mn , ρ m sinφ mn ), where ρ and φ are the polar radius and the polar angle, m is the number of the probe in the radial direction, and n is the number of the probe in the angular direction; In the plane polarization coordinate system, the plane wave spectrum coefficient can be approximately calculated as follows: The far-field radiation of the antenna under test can be obtained through the plane wave spectrum: In the formula, F φ = -F x sinφ + F y cosφ。 2. The system for rapid antenna testing according to claim 1, characterized in that, The wavelength at the center operating frequency of the antenna under test is λ. The probe layer is composed of probes arranged in a pattern of being dense in the middle and sparse at the edges or composed of uniformly arranged probes. The distance between adjacent two probes is 0.333λ - 1λ. The distance from the projection of the antenna under test on the probe layer to the center of the probe layer is 0 - 3λ.

3. The system for rapid antenna testing according to claim 2, characterized in that, All the first microstrip lines of all the probes are parallel to each other, and all the second microstrip lines of all the probes are also parallel to each other.

4. The system for rapid antenna testing according to claim 3, characterized in that, The probes are arranged in a concentric circular pattern or a concentric rectangular pattern or a spiral pattern according to the rule of being dense in the middle and sparse at the edges.

5. The system for rapid antenna testing according to claim 4, wherein The concentric circular pattern is composed of at least two concentric circles, and one probe is set at the center position. Along the direction from the center to the outer edge, the radius of the first circle is R, and the radius difference between adjacent two circles is R. One probe is set at each of the N equal division positions of the same circle. Taking the center as the vertex, the included angle between two adjacent probes located on adjacent two circles and also adjacent in position and the center is α, where 0° ≤ α < 180°, and N is a natural number greater than or equal to 2.

6. The system for rapid antenna testing according to claim 4, wherein The concentric rectangular pattern is composed of at least two concentric rectangles, and one probe is set at the center position. Along the direction from the center to the outer edge, the side length of the first rectangle is L, and the side length difference between adjacent two rectangles is L. One probe is set at each of the four corners and the middle positions of the four sides of the same rectangle.

7. The system for rapid antenna testing according to claim 4, wherein, Along the rotation direction from the inside to the outside of the spiral pattern, the distance from the probe to the center of the probe layer gradually increases.

8. The system for rapid antenna testing according to any one of claims 2 to 7, characterized in that The length of the first microstrip line is A, and the width is B; the length of the second microstrip line is C, and the width is D; the distance from the intersection point of the first microstrip line and the second microstrip line to the third metal post is E; the distance from the antenna body under test to the probe layer is H, where 0.01λ ≤ A ≤ 1λ, 0 < B ≤ 0.25λ, 0.015λ ≤ C ≤ 1.1λ, 0 < D ≤ 0.25λ, 0.4C ≤ E ≤ 0.6C, 0.1λ ≤ H ≤ 1λ.

9. The system for rapid antenna testing according to any one of claims 1 to 7, characterized in that, The test equipment is a network analyzer; the antenna body under test is an antenna unit or an antenna array.

10. The system for rapid antenna testing according to any one of claims 1 to 7, characterized in that It further includes a terminal for storing and processing data, and the terminal is respectively signal-connected to the test controller and the test equipment.

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