A Cylindrical Axial Measurement Method Based on the Coupling of Five Systematic Errors

Abstract

The present invention is a cylindrical axial measurement method based on the coupling of five systematic errors. The present invention relates to the technical field of surface profile measurement. The present invention determines the actual sampling angle offset; determines the sampling angle offset of the sensor probe; determines the offset of the actual verticality measurement value H'; determines the offset of the surface runout value at the actual measurement point; there is an included angle between the axis of the cylindrical component itself and the axis of the rotating main shaft, resulting in the existence of an inclination error of the cylindrical component being coupled in the measurement model, and the inclination error causes an offset in the measured value of the axial profile verticality, and determines the offset of the actual axial end face runout value; the sensor automatically compensates for the error caused by the probe radius, and the coupling of the inclination error of the probe support rod results in the probe radius still having an impact on the measurement. Determine the final axial end face runout measurement model and the actual sampling angle, and evaluate the verticality of the end face.

Description

Technical Field

[0001] The present invention relates to the technical field of surface profile measurement, and is a method for measuring the axial direction of a cylinder based on the coupling of five systematic errors. Background Art

[0002] In the field of high-end intelligent manufacturing, object profile data is the basis for realizing precision machining and model engineering. At present, advanced intelligent manufacturing systems such as digital twin and cloud manufacturing have been gradually and deeply applied to ultra-precision fields such as high-end intelligent machine tools, lithography machine manufacturing, and rocket system engineering. This means that the object modeling accuracy needs to reach the micron level or even the nanometer level to ensure the accuracy of the tip machining and manufacturing system. Ultra-precision measurement technology is a method for realizing high-precision reconstruction of object profiles. At present, the contact measurement accuracy can reach the sub-micron level or even the nanometer level, which is an effective way to ensure the high-precision realization of precision model engineering. Large high-precision cylindrical rotary parts are typical parts in the field of precision machinery manufacturing. Key mechanical components, such as high-precision machine tool spindles and rocket turbo pumps, all have a cylindrical rotary structure. Taking the model engineering of a cylindricity standard as an example, when measuring the surface profile of a cylindricity standard, there are multiple systematic errors in its measuring device, such as an ultra-precision cylindricity meter. The coupling of these systematic errors will significantly affect the surface profile measurement accuracy. Therefore, improving the surface profile measurement model and effectively separating the multi-systematic errors of the measurement model are of great significance for improving ultra-precision measurement accuracy and realizing precision model engineering.

[0003] When measuring the perpendicularity of a cylindrical component with an ultra-precision contact cylindricity meter, the problem that the perpendicularity measurement of the axial profile of the cylindricity standard is inaccurate due to the coupling of five systematic errors in the device system, namely eccentricity error, probe offset error, probe radius error, probe support tilt error, and tilt error, urgently requires the proposal of a perpendicularity measurement model considering the systematic errors of the cylindricity meter to provide a theoretical basis for subsequent error separation. Summary of the Invention

[0004] In order to overcome the deficiencies of the prior art, the present invention provides a method for measuring the axial direction of a cylinder based on the coupling of five systematic errors.

[0005] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or device.

[0006] The present invention provides a method for measuring the axial direction of a cylinder based on the coupling of five systematic errors, and the present invention provides the following technical solutions:

[0007] A method for measuring the axial direction of a cylinder based on the coupling of five systematic errors, the method comprising the following steps:

[0008] Step 1: The eccentricity error causes the sampling angle to shift during the axial measurement of the cylindrical component, and determine the actual sampling angle shift amount;

[0009] Step 2: During the measurement process, the measurement direction of the sensor cannot coincide with the sampling direction, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing the sampling angle to shift, and determine the sampling angle shift amount of the sensor probe;

[0010] Step 3: The probe radius error is coupled into the measurement result, and the radius error causes the measured value H of the axial profile perpendicularity to increase, and determine the offset amount of the actual perpendicularity measurement value H';

[0011] Step 4: The probe support rod tilt error and the probe radius error are coupled with each other, causing the surface runout at the measurement point to be too high, and determine the offset amount of the actual surface runout value at the measurement point;

[0012] Step 5: There is an included angle between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in an inclination error of the cylindrical component being coupled in the measurement model. The inclination error causes the measured value of the axial profile perpendicularity to shift, and determine the offset amount of the actual axial end face runout value;

[0013] Step 6: The sensor automatically compensates for the error caused by the probe radius. The coupling of the probe support rod tilt error causes the probe radius to still affect the measurement. Determine the final axial end face runout measurement model and the actual sampling angle, and evaluate the perpendicularity of the end face.

[0014] Preferably, the specific content of step 1 is as follows:

[0015] The eccentricity error causes the sampling angle to shift during the axial measurement of the cylindrical component. The actual sampling angle shift amount is determined by the following formula:

[0016]

[0017] where e 0 is the initial eccentricity, α is the corresponding eccentric angle, r 0 is the fitting radius, θ' i is the actual sampling angle, and θ i is the ideal sampling angle.

[0018] Preferably, the specific content of step 2 is as follows:

[0019] During the measurement process, the measurement direction of the sensor cannot coincide with the sampling direction, resulting in a probe offset error of the sensor. The probe offset error and the offset error are coupled, jointly causing the sampling angle to deviate. Let d be the probe offset of the sensor, and the sampling angle offset of the sensor probe is determined by the following formula:

[0020]

[0021] Preferably, step 3 is specifically as follows:

[0022] When the sensor measures, it does not take the contact point between the probe and the cylindrical contour surface as the measurement point, but takes the center point of the spherical probe of the sensor as the measurement point. The probe radius error r is coupled in the measurement result. The probe radius error causes the measured value H of the axial contour perpendicularity to be on the high side. The offset of the actual perpendicularity measurement value H' is expressed by the following formula:

[0023] ν i = H′ - H = r

[0024] Preferably, step 4 is specifically as follows:

[0025] During the measurement, when the probe contacts the cylindrical contour, the probe rod of the sensor needs to be deflected by a certain angle resulting in the coupling of the probe support rod tilt error and the probe radius error, causing the surface runout Δz at the measurement point i to be on the high side. The offset of the actual surface runout value at the measurement point is determined by the following formula:

[0026]

[0027] Preferably, step 5 is specifically as follows:

[0028] Since there is a certain machining error on the bottom surface when the cylindrical component is placed, there will be a deflection angle between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in the coupling of the tilt error of the cylindrical component in the measurement model. The error will cause the measured value of the axial contour perpendicularity to deviate. The offset of the actual axial end face runout value is determined by the following formula:

[0029]

[0030] where r 0 is the sampling radius, γ is the geometric axis tilt angle, and β is the angle between the projection direction of the geometric axis on the measurement plane and the initial measurement direction.

[0031] Preferably, step 6 is specifically as follows:

[0032] During actual measurement, the sensor automatically compensates for the error caused by the radius of the probe. The coupling of the tilting error of the probe support rod results in the radius of the probe still having an impact on the measurement result. The final axial end face runout measurement model and the actual sampling angle are determined by the following formula:

[0033]

[0034]

[0035] The perpendicularity of the end face is evaluated based on the axial end face runout.

[0036] A cylindrical axial measurement device based on the coupling of five systematic errors, the device includes:

[0037] An actual sampling angle offset measurement module, which determines the actual sampling angle offset when the eccentricity error causes the sampling angle to shift during the axial measurement of the cylindrical component during measurement;

[0038] A sensor probe sampling angle offset measurement module, which determines the sensor probe sampling angle offset when the measurement direction of the sensor cannot coincide with the sampling direction during the measurement process, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing the sampling angle to shift;

[0039] An actual perpendicularity measurement value offset measurement module, which determines the offset of the actual perpendicularity measurement value H' when the radius error is coupled into the measurement result, and the radius error causes the axial profile perpendicularity measurement value H to increase;

[0040] An actual surface runout value offset measurement module at the actual measurement point, which determines the actual surface runout value offset at the measurement point when the tilting error of the probe support rod and the radius error of the probe are coupled, resulting in a higher surface runout at the measurement point;

[0041] An actual axial end face runout value offset measurement module, which determines the actual axial end face runout value offset when there is an included angle between the axis of the cylindrical component itself and the axis of the rotating main shaft, resulting in a tilting error of the cylindrical component being coupled into the measurement model, and the tilting error causes the axial profile perpendicularity measurement value to shift;

[0042] An evaluation module, which determines the final axial end face runout measurement model and the actual sampling angle when the sensor automatically compensates for the error caused by the radius of the probe, and the coupling of the tilting error of the probe support rod results in the radius of the probe still having an impact on the measurement, and evaluates the perpendicularity of the end face.

[0043] A computer-readable storage medium stores a computer program thereon, and the program is executed by a processor to implement a cylindrical axial measurement method based on five-system error coupling.

[0044] A computer device includes a memory and a processor. A computer program is stored in the memory. When the processor runs the computer program stored in the memory, the processor executes a cylindrical axial measurement method based on five-system error coupling.

[0045] The present invention has the following beneficial effects:

[0046] In view of the problem that the perpendicularity measurement of the axial profile of a cylindricity standard is inaccurate due to the coupling of five systematic errors, namely eccentricity error, probe offset error, probe radius error, probe support rod tilt error, and tilt error, in a cylindricity measuring device, the present invention proposes a corresponding five-system error perpendicularity measurement model for separating the measurement errors of the axial profile of a cylindrical component. Description of the Drawings

[0047] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0048] Figure 1 It is a schematic diagram of eccentricity error;

[0049] Figure 2 It is a schematic diagram of probe offset error;

[0050] Figure 3 It is a schematic diagram of probe radius error;

[0051] Figure 4 It is a schematic diagram of probe support rod tilt error;

[0052] Figure 5 It is a schematic diagram of tilt error;

[0053] Figure 6 It is a schematic diagram of model simulation. Detailed Embodiments

[0054] The technical solutions of the present invention will be clearly and completely described below in conjunction with the drawings. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art without creative efforts based on the embodiments of the present invention fall within the protection scope of the present invention.

[0055] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0056] In the description of the present invention, it should be noted that unless otherwise clearly specified and defined, the terms "installation", "connection", "coupling" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0057] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0058] The present invention is described in detail below in conjunction with specific embodiments. Specific Embodiment 1:

[0060] According to Figures 1 to 6 As shown, the specific optimized technical solution adopted by the present invention to solve the above technical problems is: the present invention relates to a method for measuring the axial direction of a cylinder based on the coupling of five system errors.

[0061] A method for measuring the axial direction of a cylinder based on the coupling of five system errors, the method comprising the following steps:

[0062] Step 1: The eccentricity error causes a deviation in the sampling angle during the axial measurement of the cylindrical component, and determine the actual deviation of the sampling angle.

[0063] Step 2: During the measurement process, the measurement direction of the sensor cannot coincide with the sampling direction, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing a deviation in the sampling angle, and determine the sampling angle deviation of the sensor probe.

[0064] Step 3: The probe radius error is coupled into the measurement result, and the radius error causes an increase in the measured value H of the axial profile perpendicularity. Determine the deviation of the actual perpendicularity measurement value H'.

[0065] Step 4: The inclination error of the probe rod and the radius error of the probe are coupled with each other, resulting in a high surface runout at the measuring point, and determining the offset of the surface runout value at the actual measuring point;

[0066] Step 5: There is an included angle between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in an inclination error of the cylindrical component being coupled in the measurement model. The inclination error causes an offset in the measured value of the axial profile perpendicularity, and determining the offset of the actual axial end face runout value;

[0067] Step 6: The sensor automatically compensates for the error caused by the radius of the probe. The coupling of the inclination error of the probe rod still causes the radius of the probe to affect the measurement. Determining the final measurement model of the axial end face runout and the actual sampling angle, and evaluating the perpendicularity of the end face. Specific Embodiment Two:

[0069] The difference between Embodiment Two and Embodiment One of this application is only that:

[0070] The specific content of the said Step 1 is:

[0071] Considering that during the measurement of the cylindrical component, the machining error of its own assembly surface causes the geometric center of the cylindrical component to be in a non-ideal position. At the same time, since the axis of the rotary main shaft of the measuring device and the axis of the cylindrical component itself cannot be adjusted to an absolutely coincident state, there will be an eccentricity error in the cylindrical component during the measurement. As Figure 1 shown, the eccentricity error will cause an offset in the sampling angle during the axial measurement of the cylindrical component. The actual sampling angle offset is determined by the following formula:

[0072]

[0073] where, e 0 is the initial eccentricity, α is the corresponding eccentric angle, r 0 is the fitting radius, θ' i is the actual sampling angle, and θ i is the ideal sampling angle. Specific Embodiment Three:

[0075] The difference between Embodiment Three and Embodiment Two of this application is only that:

[0076] The specific content of the said Step 2 is:

[0077] During the measurement process, the measuring direction of the sensor cannot coincide with the sampling direction, resulting in an offset error of the probe of the sensor. As Figure 2 shown, the offset error of the probe and the coupling of the offset error jointly cause an offset in the sampling angle. Let d be the offset of the probe of the sensor, and the sampling angle offset of the probe of the sensor is determined by the following formula:

[0078] Specific Embodiment 4:

[0080] The difference between Embodiment 4 and Embodiment 3 of this application is only that:

[0081] Step 3 is specifically:

[0082] When the sensor measures, the measurement point is not the contact point between the probe and the cylindrical contour surface, but the center point of the spherical probe of the sensor. The radius error r of the probe is coupled in the measurement result. As Figure 3 shown, the radius error of the probe causes the measured value H of the axial contour perpendicularity to be on the high side. The offset of the actual perpendicularity measured value H' is represented by the following formula:

[0083] ν i = H′ - H = r Specific Embodiment 5:

[0085] The difference between Embodiment 5 and Embodiment 4 of this application is only that:

[0086] Step 4 is specifically:

[0087] During the measurement, the probe needs to deflect a certain angle when contacting the cylindrical contour which causes the coupling of the probe support rod tilt error and the probe radius error, resulting in the surface runout Δz at the measurement point i being on the high side. The offset of the actual surface runout value at the measurement point is determined by the following formula:

[0088] Specific Embodiment 6:

[0090] The difference between Embodiment 6 and Embodiment 5 of this application is only that:

[0091] Step 5 is specifically:

[0092] Since there are certain machining errors on the bottom surface when the cylindrical component is placed, there will be a deflection angle between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in the coupling of the tilt error of the cylindrical component in the measurement model. The error will cause the measured value of the axial contour perpendicularity to shift. The offset of the actual axial end face runout value is determined by the following formula:

[0093]

[0094] where r 0 is the sampling radius, γ is the geometric axis tilt angle, and β is the angle between the projection direction of the geometric axis on the measurement plane and the initial measurement direction. Specific Embodiment 7:

[0096] The difference between Embodiment 7 and Embodiment 6 of this application is only that:

[0097] Step 6 specifically includes:

[0098] During actual measurement, the sensor automatically compensates for the error caused by the radius of the probe. The coupling of the tilt error of the probe rod results in the radius of the probe still affecting the measurement result. The final axial end face runout measurement model and the actual sampling angle are determined by the following formula:

[0099]

[0100]

[0101] The perpendicularity of the end face is evaluated based on the axial end face runout. Specific Embodiment VIII:

[0103] The difference between Embodiment VIII and Embodiment VII of this application is only that:

[0104] The present invention provides a cylindrical axial measurement device based on the coupling of five system errors, and the device includes:

[0105] An actual sampling angle offset measurement module, which determines the actual sampling angle offset when the sampling angle during the axial measurement of the cylindrical component is offset due to the eccentricity error during measurement.

[0106] A sensor probe sampling angle offset measurement module, which determines the sensor probe sampling angle offset when the measurement direction of the sensor cannot coincide with the sampling direction during the measurement process, resulting in a probe offset error of the sensor. The coupling of the probe offset error of the sensor and the offset error jointly causes the sampling angle to be offset.

[0107] An actual perpendicularity measurement value offset measurement module, which determines the offset of the actual perpendicularity measurement value H' when the radius error of the probe is coupled into the measurement result, and the radius error causes the measured value H of the axial profile perpendicularity to increase.

[0108] An actual surface runout value offset measurement module at the actual measurement point, which determines the offset of the actual surface runout value at the measurement point when the tilt error of the probe rod and the radius error of the probe are coupled with each other, resulting in a higher surface runout at the measurement point.

[0109] An actual axial end face runout value offset measurement module, which determines the actual axial end face runout value offset when there is an included angle between the axis of the cylindrical component itself and the axis of the rotating main shaft, resulting in a tilt error of the cylindrical component being coupled into the measurement model, and the tilt error causes an offset in the measured value of the axial profile perpendicularity.

[0110] An evaluation module, which compensates for the error caused by the radius of the probe automatically by the sensor. The coupling of the inclination error of the probe rod results in the radius of the probe still affecting the measurement. The final axial end face runout measurement model and the actual sampling angle are determined, and the perpendicularity of the end face is evaluated. Specific Embodiment Nine:

[0112] The difference between the ninth embodiment of the present application and the eighth embodiment is only that:

[0113] The present invention provides a computer-readable storage medium, on which a computer program is stored, and the program is executed by a processor to implement a cylindrical axial measurement method based on the coupling of five system errors. Specific Embodiment Ten:

[0115] The difference between the tenth embodiment of the present application and the ninth embodiment is only that:

[0116] The present invention provides a computer device, including a memory and a processor. A computer program is stored in the memory. When the processor runs the computer program stored in the memory, the processor executes a cylindrical axial measurement method based on the coupling of five system errors. Specific Embodiment Eleven:

[0118] The difference between the eleventh embodiment of the present application and the tenth embodiment is only that:

[0119] The perpendicularity measurement model and the actual sampling angle are respectively

[0120]

[0121]

[0122] As Figure 6 shown. To analyze the coupling law of the five system errors in the model, five error levels of Level1 to 5 are set from small to large, and the overall model is simulated.

[0123] Level1: e = 1μm, γ = 1′, d = 50μm, r = 2.5mm, w = 1″, φ = 1″;

[0124] Level2: e = 5μm, γ = 3′, d = 100μm, r = 2mm, w = 3″, φ = 3″;

[0125] Level3: e = 10μm, γ = 5′, d = 200μm, r = 1.5mm, w = 8″, φ = 8″;

[0126] Level4: e = 20μm, γ = 8′, d = 300μm, r = 1mm, w = 12″, φ = 12″;

[0127] Level5: e = 30μm, γ = 12′, d = 500μm, r = 0.5mm, w = 20″, φ = 20″.

[0128] When the error magnitude gradually increases from Level1 to Level5, the error of the measurement model gradually increases, and the maximum error of the axial perpendicularity increases from 29.8μm to 371.7μm, indicating that the coupling of the five systematic errors will have a significant impact on the measurement accuracy.

[0129] In the description of this specification, the descriptions referring to terms such as "one embodiment", "some embodiments", "examples", "specific examples", or "some examples", etc., mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any one or N embodiments or examples in a suitable manner. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples. Furthermore, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present invention, the meaning of "N" is at least two, such as two, three, etc., unless otherwise specifically and clearly defined. Any process or method description represented in a flowchart or described in other ways herein can be understood as representing a module, segment, or part of code including one or more N executable instructions for implementing a customized logic function or process, and the scope of the preferred embodiments of the present invention includes additional implementations, where the functions can be executed in a manner that may not be in the order shown or discussed, including in a substantially simultaneous manner according to the functions involved or in the reverse order, which should be understood by those skilled in the art to which the embodiments of the present invention belong. The logic and / or steps represented in a flowchart or described in other ways herein, for example, can be considered as a sequenced list of executable instructions for implementing a logical function, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in combination with these instruction execution systems, apparatus, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transmit a program for use by or in combination with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion (electronic device) having one or N wirings, a portable computer diskette (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM).In addition, the computer-readable medium can even be paper or other suitable media on which the program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpretation or other appropriate processing as necessary, and then stored in a computer memory. It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above embodiments, the N steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits with logic gate circuits for implementing logical functions on data signals, application specific integrated circuits with appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.

[0130] Those of ordinary skill in the art can understand that all or part of the steps carried by the method of the above embodiments can be completed by a program instructing relevant hardware. The program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments. In addition, in each embodiment of the present invention, the functional units can be integrated into a processing module, or each unit can exist physically alone, or two or more units can be integrated into one module. The above integrated module can be implemented in the form of hardware or in the form of a software functional module. When the above integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.

[0131] The above is only a preferred embodiment of a cylindrical axial measurement method based on five-system error coupling. The protection scope of a cylindrical axial measurement method based on five-system error coupling is not limited to the above embodiments. Any technical solution falling within this concept belongs to the protection scope of the present invention. It should be noted that for those skilled in the art, several improvements and changes made without departing from the principle of the present invention should also be regarded as within the protection scope of the present invention.

Claims

1. A cylindrical axial measurement method based on the coupling of five systematic errors, characterized in that: The method includes the following steps: Step 1: The eccentric error causes the sampling angle to shift during the axial measurement of the cylindrical component, and determine the actual sampling angle shift amount; Step 2: During the measurement process, the measurement direction of the sensor cannot coincide with the sampling direction, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing the sampling angle to shift. Determine the sampling angle shift amount of the sensor probe; Step 3: The radius error of the probe will be coupled into the measurement result, and the radius error causes the measured value H of the axial profile perpendicularity to increase. Determine the offset amount of the actual perpendicularity measured value H'; Step 4: The tilt error of the probe support rod and the radius error of the probe are coupled with each other, causing the surface runout at the measuring point to be on the high side. Determine the offset amount of the actual surface runout value at the measuring point; Step 5: There is an angular deviation between the axis of the cylindrical component itself and the axis of the rotating spindle, resulting in the coupling of the tilt error of the cylindrical component in the measurement model. The tilt error causes the measured value of the axial profile perpendicularity to shift. Determine the offset amount of the actual axial end face runout value; Step 6: The sensor automatically compensates for the error caused by the probe radius. The coupling of the tilt error of the probe support rod causes the probe radius to still affect the measurement. Determine the final axial end face runout measurement model and the actual sampling angle, and evaluate the perpendicularity of the end face.

2. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 1, characterized in that: The specific content of step 1 is: The eccentric error causes the sampling angle to shift during the axial measurement of the cylindrical component. The actual sampling angle shift amount is determined by the following formula: where e 0 is the initial eccentricity, α is the corresponding eccentric angle, r 0 is the fitting radius, θ' i is the actual sampling angle, and θ i is the ideal sampling angle.

3. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 2, characterized in that: The specific content of step 2 is: During the measurement process, the measurement direction of the sensor cannot coincide with the sampling direction, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing the sampling angle to shift. Let d be the offset amount of the sensor probe. The sampling angle shift amount of the sensor probe is determined by the following formula:

4. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 3, characterized in that: The specific content of step 3 is: When the sensor measures, it does not take the contact point between the probe and the surface of the cylindrical profile as the measuring point, but takes the center point of the spherical probe of the sensor as the measuring point. The radius error r of the probe is coupled in the measurement result. The radius error of the probe causes the measured value H of the axial profile perpendicularity to be on the high side. The offset amount of the actual perpendicularity measured value H' is expressed by the following formula: ν i = H′ - H = r 5. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 4, characterized in that: The specific content of step 4 is: During measurement, when the probe contacts the cylindrical contour, the sensor stylus needs to be deflected by a certain angle. This causes the coupling of the stylus tilt error and the probe radius error, resulting in a higher surface runout Δz at the measurement point. i The offset of the surface runout value at the actual measurement point is determined by the following formula:

6. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 5, characterized in that: The specific content of step 5 is: When the cylindrical component is placed, due to certain machining errors on the bottom surface, there will be an angular deviation between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in an inclination error of the cylindrical component being coupled into the measurement model. The error will cause the measured value of the axial profile perpendicularity to deviate. The offset of the actual axial end face runout value is determined by the following formula: where r 0 is the sampling radius, γ is the tilt angle of the geometric axis, and β is the angle between the projection direction of the geometric axis on the measurement plane and the initial measurement direction.

7. A cylindrical axial measurement method based on the coupling of five systematic errors according to claim 6, characterized in that: The specific steps of step 6 are as follows: During actual measurement, the sensor automatically compensates for the error caused by the radius of the probe. The coupling of the inclination error of the probe rod results in the radius of the probe still having an impact on the measurement result. The final axial end face runout measurement model and the actual sampling angle are determined by the following formula: The perpendicularity of the end face is evaluated based on the axial end face runout.

8. A cylindrical axial measurement device based on the coupling of five systematic errors, characterized in that: The device includes: An actual sampling angle offset measurement module, which determines the actual sampling angle offset when the eccentricity error causes the sampling angle to deviate during the axial measurement of the cylindrical component during measurement; A sensor probe sampling angle offset measurement module, which determines the sensor probe sampling angle offset when the measurement direction of the sensor cannot coincide with the sampling direction during the measurement process, resulting in a probe offset error of the sensor. The probe offset error of the sensor and the offset error are coupled, jointly causing the sampling angle to deviate; An offset measurement module for the actual perpendicularity measurement value, which determines the offset of the actual perpendicularity measurement value H' when the radius error of the probe is coupled into the measurement result, and the radius error causes the measured value H of the axial profile perpendicularity to increase; A surface runout value offset measurement module at the actual measurement point, which determines the surface runout value offset at the actual measurement point when the inclination error of the probe rod and the radius error of the probe are coupled with each other, resulting in a higher surface runout at the measurement point; An actual axial end face runout value offset measurement module, which determines the actual axial end face runout value offset when there is an angular deviation between the axis of the cylindrical component itself and the axis of the rotary main shaft, resulting in an inclination error of the cylindrical component being coupled into the measurement model, and the inclination error causes the measured value of the axial profile perpendicularity to deviate; An evaluation module, which determines the final axial end face runout measurement model and the actual sampling angle when the sensor automatically compensates for the error caused by the radius of the probe, and the coupling of the inclination error of the probe rod results in the radius of the probe still having an impact on the measurement, and evaluates the perpendicularity of the end face.

9. A computer-readable storage medium, on which a computer program is stored, characterized in that, when the program is executed by a processor, it is used to implement a cylindrical axial measurement method based on the coupling of five systematic errors according to any one of claims 1-7.

10. A computer device, characterized in that, It includes a memory and a processor. A computer program is stored in the memory. When the processor runs the computer program stored in the memory, the processor executes a method for measuring the axial direction of a cylinder based on the coupling of five system errors according to any one of claims 1-7.

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