Electronic component testing apparatus

Abstract

The present application provides an electronic component testing device, which comprises a testing plate arranged on a bearing base of a machine table top and driven to rotate, and an inlet unit, an inspection unit and an outlet unit arranged outside the periphery of the testing plate; the outlet unit is provided with a plurality of flexible conduits on a conduit plate, each conduit has one end above one seat groove on the testing plate and the other end leading to a magazine of a collection mechanism through the material guide frame; one side of the conduit plate is arranged on a lifting frame, and the lifting frame is pivotally arranged on a pivot seat above a seat frame of the collection mechanism, so that the conduit plate and the conduits thereon can be lifted along the lifting frame from the machine table top to the collection mechanism; thereby facilitating maintenance.

Description

Technical Field

[0001] This invention relates to a testing apparatus, and more particularly to an electronic component testing apparatus suitable for testing electronic components. Background Technology

[0002] After manufacturing, electronic components typically undergo testing to determine their physical characteristics. For example, the device described in patent application No. 411735, "Circuit Component Loading and Unloading Apparatus," for testing capacitor-type electronic components, uses a concentric ring seat with one or more component slots that can rotate relative to the ring center. The slots rotate at uniform angular intervals in an incremental manner, where the rotation increment is the angular interval between adjacent slots. The ring seat is tilted at a certain angle, and as the ring seat rotates, components flow towards the ring seat. Fixed grid plates adjacent to the outer side of the slot seat restrict unpositioned components from randomly rolling into empty slots along the arc segment of the ring seat's rotation path due to the force. This random rolling causes the components... Returning to its slot, the component is connected to the tester via an electronic contactor in the path of the rotating ring seat. The tested component passes under a jet manifold plate that defines a number of jet holes. Each time the ring seat rotates by an increment, the jet holes align with a set of slot seats. The jet pipe is connected to the jet outlet. The component is ejected from the slot seat by air blown by the air pressure valves that are selectively activated. Due to the air blown by the air and gravity, the ejected component falls through the pipe and is guided into the sorting bin by the pipeline plate. The component flow path can be selectively directed to the grid plate in response to the signal of the detector indicating that the grid plate is missing a component. The sensor can detect components in the slot that have not yet been ejected by the jet manifold.

[0003] Although the prior art of patent application No. 411735 provides testing and sorting of capacitor-type electronic components, the ejector manifold board of the prior art is fixed to the machine table with screws. Once maintenance is required for each ejector manifold, each screw must be disassembled one by one, which is quite troublesome and time-consuming. Therefore, there is room for improvement. Summary of the Invention

[0004] Therefore, the purpose of this invention is to provide an electronic component testing device that is convenient for maintenance.

[0005] The electronic component testing apparatus according to the present invention includes: a machine base with a machine base surface; a support chassis disposed on the machine base surface, a test plate that can be driven to rotate is disposed on the support chassis, and a feeding unit, an inspection unit, and a discharge unit are disposed around the periphery of the support chassis; wherein, the discharge unit is provided with a guide plate, the guide plate is provided with a plurality of flexible guides, each guide having one end aligned with a slot on the test plate, and the other end being guided through a guide frame to a material box of a collection mechanism; a lifting frame is disposed on one side of the guide plate, the lifting frame being pivotally mounted at one end on a frame of the collection mechanism to a pivot seat, so that the guide plate and each guide on it can be lifted by the lifting frame from the machine base surface toward the collection mechanism, i.e. toward the operator, so that the entire discharge unit is located above the frame.

[0006] Another electronic component testing device according to the present invention includes: a machine base with a machine base surface; a support chassis disposed on the machine base surface, a test plate that can be driven to rotate is disposed on the support chassis, and a feeding unit, an inspection unit, and a discharge unit are disposed around the periphery of the support chassis; wherein, the discharge unit is provided with a guide plate, the guide plate is provided with a plurality of flexible guides, each guide having one end aligned with the upper part of a seat groove on the test plate, and the other end being guided through the guide frame to a material box of a collection mechanism; the material box is disposed in the frame, the frame is pivotally mounted, and the frame can be flipped to one side, so that the side of the machine base surface near the discharge unit presents a hollow operating area.

[0007] In the electronic component testing device of this invention, since the guide plate is disposed on one side of the lifting frame, and the lifting frame is pivotally mounted at one end on the pivot seat above the base of the collection mechanism, the guide plate and each guide on it can be lifted from the machine table surface toward the collection mechanism, i.e. toward the operator, so that the entire discharge unit is located above the base, thus the operator can easily inspect and maintain the discharge unit. Attached Figure Description

[0008] Figure 1 This is a three-dimensional schematic diagram of an electronic component testing device, used to illustrate embodiments of the present invention.

[0009] Figure 2 This is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing device.

[0010] Figure 3 This is a schematic diagram of the support chassis in the electronic component testing device.

[0011] Figure 4 This is a schematic diagram of each block corresponding to each unit in the electronic component testing device.

[0012] Figure 5 This is a schematic diagram of the upper surface of the test board in the electronic component testing device.

[0013] Figure 6 This is a schematic diagram of the lower surface of the test board in the electronic component testing device.

[0014] Figure 7 This is a three-dimensional schematic diagram of one side of the discharge unit and the collection mechanism in the electronic component testing device.

[0015] Figure 8 This is a three-dimensional schematic diagram of the other side of the discharge unit and collection mechanism in the electronic component testing device.

[0016] Figure 9 This is a three-dimensional schematic diagram of the electronic component testing device, showing the lifting frame being lifted above the base and the base being flipped to one side.

[0017] [Symbol Explanation]

[0018] A: Machine

[0019] A1: Machine table surface

[0020] A11: Positioning component

[0021] A2: Machine desktop

[0022] A21: Positioning hole

[0023] A3: Front side of the machine

[0024] A31: Card / Clutch

[0025] B: Load-bearing chassis

[0026] B1: Feeding Block

[0027] B11: Feed suction groove

[0028] B12: Suction hole

[0029] B13: Short curved edge

[0030] B14: Long curved edge

[0031] B15: Front End

[0032] B16: Backend Edge

[0033] B17: Empty area

[0034] B171: Third suction groove

[0035] B172: Suction hole

[0036] B2: Check Block

[0037] B21: First Inspection Block

[0038] B211: First suction groove

[0039] B212: Suction hole

[0040] B213: Rib

[0041] B214: Collar

[0042] B215: Shaft hole

[0043] B216: Short curved edge

[0044] B217: Long curved edge

[0045] B218: Front-end edge

[0046] B219: Backend Edge

[0047] B22: Second Inspection Block

[0048] B221: Second suction groove

[0049] B222: Suction hole

[0050] B223: Rib

[0051] B224: Collar

[0052] B225: Shaft hole

[0053] B226: Short curved edge

[0054] B227: Long curved edge

[0055] B228: Front End

[0056] B229: Backend Edge

[0057] B23: Second Inspection Block

[0058] B3: Exit Block

[0059] B31: Discharge suction nozzle

[0060] B32: Suction hole

[0061] B33: Short curved edge

[0062] B34: Long curved edge

[0063] B35: Front Edge

[0064] B36: Backend Edge

[0065] C: Test board

[0066] C1: Seat Slot

[0067] C2: Guide trench

[0068] C3: Cleaning tank

[0069] C31: Expanded Convex Region

[0070] D: Feeding unit

[0071] E: Inspection Unit

[0072] E1: First Inspection Unit

[0073] E2: Second Inspection Unit

[0074] E3: Third Inspection Unit

[0075] F: Discharge unit

[0076] F1: Guide plate

[0077] F2: Catheter

[0078] F3: Lifting frame

[0079] F31: Overlapping area

[0080] F32: Screw fastener

[0081] F33: Positioning groove

[0082] F4: Connector

[0083] F5: Pivot

[0084] F6: Elastic element

[0085] F7: Screw anchor

[0086] F8: Ion Generator

[0087] F81: Blowing channel

[0088] F9: Check Components

[0089] F91: Detector

[0090] G: Feeding unit

[0091] H: Material guide frame

[0092] H1: Embedded base

[0093] H11: Side Seat

[0094] H12: Side Seat

[0095] H2: Embedded Hole

[0096] K: Collection Agency

[0097] K1: Material Box

[0098] K2: Stand

[0099] K21: Pivot

[0100] K22: Corner side

[0101] K23: Hook and Loop

[0102] K24: Pull handle

[0103] K25: Dorsal side

[0104] K26: Fastening section

[0105] K3: Trading Range

[0106] K4: Back and Side View

[0107] L: Radial axis Detailed Implementation

[0108] Please see Figure 1 , 2 As shown, this embodiment of the invention is described using an electronic component testing apparatus for testing capacitor-type components, but is not limited to the implementation of capacitor-type electronic components. It consists of a disc-shaped metal support base B on a machine table A1 tilted at approximately 60 degrees on a machine table A. A test plate C, which can be driven to rotate intermittently in a clockwise direction, is mounted on the support base B. Around the periphery of the support base B are a feeding unit D for loading the component under test, an inspection unit E for testing the characteristics of the component under test, and a discharge unit F for discharging and collecting the tested component. On a horizontal machine table A2 of the machine table A, there is a feeding mechanism G for providing the component under test and a guide rack H for guiding the discharge unit F to a collection mechanism K. The collection mechanism K, which accommodates multiple material boxes K1, is located at the front of the machine table A.

[0109] Please see Figure 2 As shown, the inspection unit E is provided with a first inspection unit E1 for checking the insulation resistance (commonly known as IR) of the capacitor, and two second inspection units E2 and E3 located before and after the first inspection unit E1 in the direction in which the test board C rotates intermittently, respectively, for checking the capacitance, loss or quality factor (commonly known as CD) of the capacitor; wherein, the second inspection unit E3 located after the first inspection unit E1 in the direction in which the intermittent rotation is performed can be omitted as needed.

[0110] Please see Figure 3 , 4As shown, the supporting chassis B is composed of multiple independent but interconnectable sector-shaped blocks of different sizes, including a feeding block B1 corresponding to the feeding unit D, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F. The inspection block B2 is composed of a first inspection block B21 and two second inspection blocks B22 and B23 that are independent but interconnectable. The first inspection block B21 corresponds to the first inspection unit E1, and the two second inspection blocks B22 and B23 correspond to the two second inspection units E2 and E3, respectively.

[0111] The feeding block B1 is provided with multiple rows (8 rows in this embodiment) of concentric annular feeding grooves B11 arranged at radial intervals. Each feeding groove B11 is provided with multiple hollowed-out suction holes B12 arranged at intervals along the bottom of the feeding groove B11. The suction holes B12 can be connected to a negative pressure source to create a vacuum state within the feeding groove B11. The feeding block B1 includes a short arc edge B13 and a long arc edge B14 that are parallel to each other, as well as a front end edge B15 and a rear end edge B16 that form an included angle with each other.

[0112] The first inspection block B21 is provided with multiple rows (8 rows in this embodiment) of concentrically arranged concave annular first suction grooves B211 arranged at radial intervals. Each first suction groove B211 is provided with multiple hollow suction holes B212 arranged at intervals along the bottom of the first suction groove B211. On the partition ribs B213 at corresponding positions between every two first suction grooves B211 arranged in a radial straight line, there are multiple rows (16 rows in this embodiment) of spaced intervals located on the fan-shaped radial axis, each of which is provided with a collar B214 made of insulating material. Each collar B214 is provided with a shaft hole B215. The suction holes B212 can be connected to a negative pressure source to draw a vacuum, so that a negative pressure vacuum state is formed in the first suction groove B211. The first inspection block B21 includes a short arc edge B216 and a long arc edge B217 that are parallel to each other, and a front end edge B218 and a rear end edge B219 that are at an included angle to each other.

[0113] The second inspection block B22 is provided with multiple rows (eight rows in this embodiment) of concentrically arranged concave annular second suction grooves B221 at radially spaced intervals. Each second suction groove B221 has multiple hollow suction holes B222 arranged at intervals along the bottom of the second suction groove B221. Each row of the partition ribs B223 between each two second suction grooves B221 arranged in a radial straight line is provided with a collar B224 made of insulating material. Each collar B224 is provided with a shaft hole B225. The collars B224 in each row are located on the radial axis L at the center of the fan shape. The suction holes B222 can be connected to a negative pressure source to evacuate the vacuum, so that a negative pressure vacuum state is formed in the second suction groove B221. The second inspection block B22 includes a short arc edge B226 and a long arc edge B227 that are parallel to each other, and a front end edge B228 and a rear end edge B229 that are at an included angle to each other.

[0114] The second inspection block B23 has the same structure as the second inspection block B22, and the same logic applies, so it will not be repeated here; however, when the second inspection unit E3 is omitted as not needed as mentioned above, the second inspection block B23 can be constructed as follows. Figure 3 The collar B224 and shaft hole B225 in the second inspection block B22 are omitted as shown.

[0115] The discharge block B3 is provided with multiple rows (eight rows in this embodiment) of concentric recessed annular discharge grooves B31 arranged at radial intervals. Each discharge groove B31 is provided with multiple hollowed-out suction holes B32 arranged at intervals along the bottom of the discharge groove B31. The suction holes B32 can be connected to a negative pressure source to create a vacuum state within the discharge groove B31. The discharge block B3 includes a short arc edge B33 and a long arc edge B34 that are parallel to each other, as well as a front end edge B35 and a rear end edge B36 that form an included angle with each other.

[0116] The first suction groove B211 on the first inspection block B21 is connected to the second suction groove B221 on the second inspection blocks B22 and B23 when they are combined, but is not connected to the feeding suction groove B11 on the feeding block B1 or the discharging suction groove B31 on the discharging block B3 when they are combined. The feeding suction groove B11 on the feeding block B1 has a gap B17 at the rear end. The gap B17 is provided with a small section of the third suction groove B171 that is connected to the second suction groove B221 on the second inspection block B22 when they are combined, and the third suction groove B171 is provided with a hollow suction hole B172.

[0117] Please see Figure 3 , 5As shown, the upper surface of the test plate C has multiple rows (eight rows in this embodiment) of concentrically arranged rectangular slots C1 spaced radially apart. Each row of slots C1 has multiple slots spaced at intervals, and the slots C1 corresponding to each row are arranged in a straight line at multiple rows. Each slot C1 can accommodate a test element, such as a capacitor, with electrodes at its upper and lower ends. The test element is positioned such that its electrodes are located at its upper and lower ends. Figure 5 The material is placed in the seat groove C1 at the feed unit D.

[0118] Please see Figure 3 , 6 Each groove C1 on the lower surface of the test plate C has a recessed guide groove C2 extending radially outward from its bottom. Each guide groove C2 is connected to the feed suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31 of the supporting chassis B during intermittent rotation of the test plate C. When negative pressure is introduced through the suction holes B12, B1213, B1223, and B32 in the supporting chassis B for vacuuming, the negative pressure can be transmitted through the feed suction groove B11, the first suction groove B211, the second suction groove B221, the third suction groove B221, the fourth suction groove B221, the fifth suction groove B32, and the sixth suction groove B31. Suction groove B221 and discharge suction groove B31 adsorb the test object (in this embodiment, a capacitor-type electronic component) placed in each of the seat grooves C1; a long strip of recessed cleaning groove C3 is formed between the two rows of seat grooves C1 on the lower surface of the test plate C; a raised area C31 is formed near each seat groove C1 of the cleaning groove C3, which is used to accommodate the dust generated by the friction between the lower surface of the test plate C and the supporting chassis B during long-term operation, so as to avoid clogging the bottom aperture of the seat groove C1.

[0119] Please see Figure 1 , 3 As shown in Figure 7, the discharge unit F is provided with a guide plate F1, and the guide plate F1 is provided with a plurality of flexible guides F2. Each guide F2 has one end facing the upper part of a seat groove C1 on the test plate C, and the other end is pulled through the guide frame H to a material box K1 of the collection mechanism K.

[0120] The collecting mechanism K has a rectangular frame-shaped base K2, in which the material box K1 is placed. The tabletop A2 of the machine is formed above the base K2 for placing the guide frame H. The guide frame H has multiple rows of long strip-shaped inserts H1. Each insert H1 has multiple holes H2 arranged in a straight line at intervals, each for inserting the guide F2. The insert H1 is composed of two detachable and assembleable side seats H11 and H12 placed on the left and right sides respectively.

[0121] Please see Figure 1 , 7As shown in Figure 8, the guide plate F1 of the discharge unit F is mounted on a hinge F3 on one side. The hinge F3 is connected to and moves with the guide plate F1 via a connector F4. The connector F4 and the hinge F3 have an overlapping portion F31 at their upper and lower ends. Two pivot rods F5 are provided at a distance from each other at the overlapping portion F31. An elastic element F6 (not shown in the figure) composed of springs is provided between the lower surface of the connector F4 and the upper surface of the hinge F3. The gap between the lower surface of the connector F4 and the upper surface of the hinge F3 is maintained by the support of the elastic element F6. A screw abutment F7 is provided on the connector F4 and screwed into the upper surface of the hinge F3 below. The screw abutment F7 moves downward or upward to adjust the position. The connector F4 moves up and down under the support of the two pivot rods F5, so as to change the distance between the guide plate F1 and the test plate C; the lifting frame F3 is provided with two screw fasteners F32 that can be screwed to the machine table A1 to fix the lifting frame F3; the lifting frame F3 is also provided with a hollowed-out long groove-shaped positioning groove F33, which can be precisely fitted into a positioning piece A11 on the machine table A1 when the lifting frame F3 is placed on the machine table A1, so that the lifting frame F3 is positioned; the lifting frame F3 is pivotally mounted at one end to a pivot seat K21 above the base K2 of the collecting mechanism K, and the base K2 is pivotally mounted at one corner K22 with a pivot seat K23 on the top and bottom respectively, and a pull handle K24 is provided on one side of the base K2.

[0122] Please see Figure 8 , 9 By pulling the handle K24, the base K2 can be flipped to one side with the pivot K23 as the fulcrum, so that a hollow operating area K3 is presented on the side of the machine table A1 near the discharge unit F. The operator can perform maintenance in the operating area K3 close to the machine table A1. The guide plate F1 and each guide F2 on it can be lifted from the machine table A1 towards the collection mechanism K, i.e. towards the operator, along with the lifting frame F3, so that the entire discharge unit F is located above the base K2. When the base K2 is flipped to one side, the entire discharge unit F will be displaced to one side.

[0123] Please see Figure 7 , 9An ion generator F8 is provided on the guide plate F1, which is located below the discharge unit F when the test plate C rotates intermittently in a clockwise direction to enter and exit the guide plate F1. A blowing channel F81, which is a long and narrow slot-shaped structure extending across and covering the rows of seat slots C1 in the radial direction of each test plate C, is provided below the guide plate F1 where the ion generator F8 is located. The ion generator F8 can generate ion gas and blow it through the blowing channel F81 to the upper surface of the test plate C to prevent the tested element from adhering to the surface of the test plate C due to static electricity. An inspection component F9 is provided outside the guide plate F1 after the test plate C rotates intermittently in a clockwise direction to exit the guide plate F1. The inspection component F9 is equipped with detectors F91 that are respectively positioned above the rows of seat slots C1 on the test plate C to check whether there are any tested elements that have not been discharged by the guide F2 or the adsorption channel F8.

[0124] The machine platform A1 is located on the front side A3 of the machine, which is equipped with a locking member A31 that is spaced apart and can be driven to extend or retract horizontally to one side. The seat K2 is located on the back side K25 of the machine platform A3, which is spaced apart and has two fastening parts K26 that are spaced apart and have two fastening parts K26 that are spaced apart and have two fastening parts K26 that are spaced apart. The seat K2 is supported by the pivot seat K23 on one side, so that the other side is positioned relative to the front side A3 of the machine platform. The locking member A31 can be driven to engage with the fastening part K26, so that the seat K2 is kept in position. Or, when it is desired to open the seat K2 with the pivot seat K23 on one side and the other side relative to the front side A3 of the machine platform, the locking member A31 is driven to retract and disengage from the fastening part K26, so that the seat K2 is released from position and can be opened.

[0125] In the electronic component testing device of this invention, since the guide plate F1 is disposed on one side of the lifting frame F3, and the lifting frame F3 is pivotally mounted at one end on the pivot seat K21 above the base K2 of the collection mechanism, the guide plate F1 and each guide plate F2 on it can be lifted from the machine table A1 towards the collection mechanism K, i.e. towards the operator, so that the entire discharge unit F is located above the base K2, thus the operator can easily inspect and maintain the discharge unit F.

[0126] The above description is merely an embodiment of the present invention and should not be construed as limiting the scope of the present invention. Any simple equivalent changes and modifications made in accordance with the scope of the patent application and the contents of the patent specification of the present invention shall still fall within the scope of the patent of the present invention.

Claims

1. An electronic component testing device, comprising: A machine platform, on which a machine platform is provided; A support chassis is provided on the machine platform. A test plate that can be driven to rotate is provided on the support chassis. A feeding unit, an inspection unit, and a discharge unit are provided around the periphery of the support chassis. The discharge unit is equipped with multiple flexible conduits. Each conduit has one end aligned with the top of a slot on the test plate, and the other end is drawn through a guide frame to a material box of a collection mechanism. The feature is that the conduit is disposed on a conduit plate that can be lifted by a lifting frame. The lifting frame is pivotally mounted at one end on a pivot seat above a frame of the collection mechanism, so that the conduit plate and each conduit on it can be lifted by the lifting frame from the table surface of the machine towards the collection mechanism, i.e. towards the operator, so that the discharge unit is located above the frame.

2. The electronic component testing apparatus as described in claim 1, wherein, The frame houses the material box and is pivotally mounted. The frame can be flipped to one side, creating an open operating area on the side of the machine table below the discharge unit.

3. An electronic component testing device, comprising: A machine platform, on which a machine platform is provided; A support chassis is provided on the machine platform. A test plate that can be driven to rotate is provided on the support chassis. A feeding unit, an inspection unit, and a discharge unit are provided around the periphery of the support chassis. The discharge unit is equipped with multiple flexible conduits. Each conduit has one end aligned with the top of a slot on the test plate, and the other end is drawn through a guide frame to a material box of a collection mechanism. Its characteristic is that the material box is located in a pivoted frame, which can be flipped to one side, so that the side of the machine table below the discharge unit presents a hollow operating area.

4. The electronic component testing apparatus as described in claim 3, wherein, The conduit is mounted on a conduit plate that can be lifted by a lifting frame. The lifting frame is pivotally mounted at one end on a pivot seat above the base, so that the conduit plate and each conduit on it can be lifted by the lifting frame from the machine table towards the collection mechanism, i.e. towards the operator, so that the entire discharge unit is located above the base.

5. The electronic component testing apparatus as claimed in claim 1 or 3, wherein, The frame is pivotally mounted on one of its upper and lower corners, respectively, by a pivot seat.

6. The electronic component testing apparatus as claimed in claim 1 or 3, wherein, A handle is provided on one side of the seat frame. By pulling the handle, the seat frame can be flipped to one side with a pivot seat as the fulcrum.

7. The electronic component testing apparatus according to claim 1 or 3, wherein, The mounting frame can be moved in conjunction with the entire discharge unit.

8. The electronic component testing apparatus as claimed in claim 1 or 3, wherein, The guide frame is mounted on the top of the support frame; the guide frame is provided with multiple rows of long strip-shaped inserts, and each insert has multiple holes arranged in a straight line at intervals for each guide tube to be inserted. The insert is composed of two detachable and assembleable side seats placed on the left and right sides and placed side by side.

9. The electronic component testing apparatus according to claim 1 or 4, wherein, The lifting frame is connected to and moves in conjunction with the guide plate via a connector. The connector and the lifting frame have overlapping portions on the upper and lower sides, and a pivot rod is provided at a distance from the overlapping portion. An elastic member is provided between the lower surface of the connector and the upper surface of the lifting frame. The distance between the lower surface of the connector and the upper surface of the lifting frame is maintained by the support of the elastic member. A screw abutment is provided on the connector and screwed into the upper surface of the lifting frame below. The screw abutment moves down or up to adjust the vertical displacement of the connector under the support of the pivot rod, thereby moving the guide plate to change the distance between it and the test plate.

10. The electronic component testing apparatus according to claim 1 or 4, wherein, The lifting frame is provided with a hollow positioning groove, which is precisely fitted onto a positioning component on the machine table when the lifting frame is placed on the machine table, so that the lifting frame is positioned.

Images