Electronic component testing apparatus

Abstract

The present application provides an electronic component testing device, comprising: a machine table, which is provided with a machine table surface; a bearing chassis, which is provided on the machine table surface, and is provided with a testing plate that can be driven to rotate; and an inlet unit, an inspection unit, and an outlet unit, which are provided outside the periphery of the bearing chassis; the inlet unit is provided with an arc-shaped grid frame, which is provided with a plurality of concentric ring-shaped arc-shaped grid plates that are spaced apart at intervals in the radial direction, and defines a plurality of load channels; the grid frame is fixed to a fixed portion of a connecting piece that is pivoted to a fixed seat, and is connected to the connecting piece, so that the grid frame and the connecting piece can pivot around the shaft center of the fixed seat as a fulcrum, to form an upward angle with the surface of the testing plate, or to be lowered to be close to the surface of the testing plate; thereby making the operation more convenient.

Description

TECHNICAL FIELD

[0001] The present invention relates to a testing device, in particular, an electronic component testing device. BACKGROUND

[0002] Generally, after the manufacture of electronic components, they are usually tested to determine their physical characteristics. For example, the device provided in Patent Application No. 411735, "Circuit Component Loading and Unloading Device", which uses a concentric ring seat with one or several component slots, is rotatable relative to the ring center. The slots are evenly spaced at an angle and are rotated in increments, the rotation increment being the angle between adjacent slots. The ring seat is inclined at an angle, and when the ring seat is rotated, the component flow path pours the components into the ring seat. The stationary grid plate adjacent to the outer side of the slot limits the components from randomly rolling into the empty slots in the arc segment of the rotation path of the ring seat. The random rolling causes the components to be returned to the slots. In the path of the rotating ring seat, there are electronic contacts for connecting the components and the testing machine. The tested components pass under an ejection manifold, which defines a plurality of ejection holes. When the ring seat is rotated by an increment, the ejection holes are aligned with a set of slots. The ejection manifold is connected to an ejection port. The components are ejected from the slots by the air blast of the selectively activated air pressure valve. Under the action of air blast and gravity, the ejected components fall through the tube and are guided by the tube plate into the sorting storage box. The component flow path can be selectively directed to the grid plate in response to a signal from the detector indicating that the grid plate is missing components. The inductor can detect the components in the seat slot that have not been ejected by the ejection manifold.

[0003] The prior art of Patent Application No. 411735 provides testing and sorting collection of capacitive electronic components. The feed material is fed through an arc-shaped loading rack with a plurality of seated grid plates. The loading rack is moved into the testing plate in a swing manner, and the feed material is fed from above the loading rack through an opening hopper (the front and rear are determined by the direction of the intermittent rotation flow path, and the rear is the outlet) by a vibrating feeder. When the loading rack is moved into the testing plate in a swing manner, the distance between the loading rack and the testing plate is set. The bottom of the seated grid plate must be separated from the testing plate by a metal sheet each time the loading rack is moved in. Once the loading rack is moved out of the testing plate, the distance setting is lost, and the distance must be re-set, which is quite troublesome.

[0004] Therefore, the purpose of the present invention is to provide an electronic component testing device that is easy to operate.

[0005] The electronic component testing device according to the present application comprises: a machine table, a loading base arranged on the machine table, a testing plate arranged on the loading base and capable of being driven to rotate, an input unit, an inspection unit and an output unit arranged outside the periphery of the loading base; the input unit is provided with an arc-shaped grid frame, the grid frame is provided with a plurality of arc-shaped grid plates arranged in a plurality of concentric rings at a radial interval, and a plurality of loading channels are defined; the grid frame is fixed to a fixed portion of a connecting piece pivoted to a fixed seat by an outer side portion, and is connected with the connecting piece, the grid frame and the connecting piece can be pivoted around the axis of the fixed seat as a fulcrum to form an angle with the surface of the testing plate, or to be placed close to the surface of the testing plate.

[0006] The electronic component testing device according to the present application, the grid frame of the input unit is fixed to a fixed portion of a connecting piece pivoted to a fixed seat by an outer side portion, and is connected with the connecting piece, the grid frame and the connecting piece can be pivoted around the axis of the fixed seat as a fulcrum to form an angle with the surface of the testing plate, or to be placed close to the surface of the testing plate; the gasket is arranged between the fixed portion of the grid frame and the connecting piece, not between the grid plate of the grid frame and the testing plate, and only needs to be changed when the specification of the tested component is changed, the gap does not change when the grid frame is pivoted and then placed down, and the thickness or number of the gasket does not need to be adjusted, so that the operation is more convenient. BRIEF DESCRIPTION OF DRAWINGS

[0007] Figure 1 It is a perspective view of an electronic component testing device for illustrating the embodiment of the present application.

[0008] Figure 2 It is a schematic view of the configuration of each mechanism on the machine table of the electronic component testing device.

[0009] Figure 3 It is a schematic view of the loading base of the electronic component testing device.

[0010] Figure 4 It is a schematic view of each block corresponding to each unit in the electronic component testing device.

[0011] Figure 5 It is a schematic view of the upper surface of the testing plate in the electronic component testing device.

[0012] Figure 6 It is a schematic view of the lower surface of the testing plate in the electronic component testing device.

[0013] Figure 7 It is a perspective exploded view of the input unit of the electronic component testing device and a schematic view of the corresponding relationship with the testing plate.

[0014] Figure 8 is a schematic diagram of the corresponding relationship between the feeding unit and the test board, the feeding unit of the electronic component testing device.

[0015] Figure 9 is a schematic diagram of the rotational displacement of the feeding unit from the feeding unit of the electronic component testing device.

[0016]

Symbol Description

[0017] A: machine

[0018] A1: machine table

[0019] A11: fixed seat

[0020] A2: machine table

[0021] A21: positioning hole

[0022] B: bearing chassis

[0023] B1: feeding block

[0024] B11: feeding suction groove

[0025] B12: suction hole

[0026] B13: short arc edge

[0027] B14: long arc edge

[0028] B15: front end edge

[0029] B16: rear end edge

[0030] B17: empty part

[0031] B171: third suction groove

[0032] B172: suction hole

[0033] B2: inspection block

[0034] B21: first inspection block

[0035] B211: first suction groove

[0036] B212: suction hole

[0037] B213: partition rib

[0038] B214: shaft ring

[0039] B215: shaft hole

[0040] B216: short arc edge

[0041] B217: long arc edge

[0042] B218: Front-end edge

[0043] B219: Backend Edge

[0044] B22: Second Inspection Block

[0045] B221: Second suction groove

[0046] B222: Suction hole

[0047] B223: Rib

[0048] B224: Collar

[0049] B225: Shaft hole

[0050] B226: Short curved edge

[0051] B227: Long curved edge

[0052] B228: Front End

[0053] B229: Backend Edge

[0054] B23: Second Inspection Block

[0055] B3: Exit Block

[0056] B31: Discharge suction nozzle

[0057] B32: Suction hole

[0058] B33: Short curved edge

[0059] B34: Long curved edge

[0060] B35: Front Edge

[0061] B36: Backend Edge

[0062] C: Test board

[0063] C1: Seat Slot

[0064] C2: Guide trench

[0065] C3: Cleaning tank

[0066] C31: Expanded Convex Region

[0067] D: Feeding unit

[0068] D1: Fence

[0069] D11: Grid plate

[0070] D12: Material loading channel

[0071] D13: Entrance port

[0072] D14: outlet end

[0073] D15: inner side portion

[0074] D16: outer side portion

[0075] D2: material inlet seat

[0076] D21: material inlet

[0077] D3: diversion seat

[0078] D31: guide groove

[0079] D32: leakage groove

[0080] D33: material inlet end

[0081] D34: material outlet end

[0082] D35: air blowing pipe

[0083] D4: material guide seat

[0084] D41: material guide slot

[0085] D42: material guide channel

[0086] D5: cover

[0087] D51: air hole

[0088] D6: communication member

[0089] D61: air pressure connector

[0090] D62: guide hole

[0091] D63: air groove

[0092] D7: air blowing seat

[0093] D8: detection seat

[0094] D81: detection element

[0095] D9: connecting member

[0096] D91: fixing portion

[0097] D92: adjusting member

[0098] D93: gasket

[0099] D94: buckle pivot portion

[0100] D95: locking member

[0101] D951: flexible gasket

[0102] D952: screw member

[0103] D96: stop seat

[0104] D961: pad

[0105] E: inspection unit

[0106] E1: first inspection unit

[0107] E2: second inspection unit

[0108] E3: third inspection unit

[0109] F: discharge unit

[0110] G: feeding unit

[0111] G1: vibrating feeder

[0112] G11: hopper

[0113] G12: conveying path

[0114] G13: vibrating element

[0115] G14: base

[0116] G141: push lever

[0117] G2: swing seat

[0118] G3: first wheel body

[0119] G4: second wheel body

[0120] G41: holder

[0121] G411: peg

[0122] H: guide frame

[0123] K: collection mechanism

[0124] L: radial axis DETAILED DESCRIPTION

[0125] See Figure 1 , 2As shown, the electronic component testing device for testing the to-be-tested components of the capacitor type is used to illustrate the embodiments of the present application, but is not limited to the implementation of the capacitor type electronic components; a metal material bearing bottom plate B in the shape of a disc is arranged on a workbench table A1 inclined by about 60 degrees on a workbench A, the bearing bottom plate B is provided with a test plate C that can be driven to rotate intermittently in a clockwise direction, an in-feed unit D for loading the to-be-tested components is arranged outside the periphery of the bearing bottom plate B, an inspection unit E for testing the characteristics of the to-be-tested components is arranged, and an ejection unit F for ejecting and collecting the to-be-tested components after the testing is completed is arranged, a feeding unit G for providing the to-be-tested components is arranged on a horizontal workbench table A2 of the workbench A, and a guide frame H for guiding the ejection unit F to a collection mechanism K is arranged, and the collection mechanism K for accommodating a plurality of boxes K1 is arranged on the front side of the workbench A.

[0126] As shown in Figure 2 The inspection unit E includes a first inspection unit E1 for performing insulation resistance (commonly known as IR) inspection of the capacitor, and two second inspection units E2 and E3 respectively located in front of and behind the first inspection unit E1 in the direction of intermittent rotation for performing capacitance, loss or quality factor (commonly known as CD) inspection of the capacitor; wherein the second inspection unit E3 behind the first inspection unit E1 in the direction of intermittent rotation can be omitted as needed.

[0127] As shown in Figure 3 , 4 The bearing bottom plate B is composed of a plurality of different size sector-shaped blocks that are independent but can be butt-jointed, including an in-feed block B1 corresponding to the in-feed unit D, an inspection block B2 corresponding to the inspection unit E, and an ejection block B3 corresponding to the ejection unit F, wherein the inspection block B2 is composed of a first inspection block B21 and two second inspection blocks B22 and B23 that are independent but can be butt-jointed, wherein the first inspection block B21 is arranged corresponding to the first inspection unit E1, and the two second inspection blocks B22 and B23 are arranged corresponding to the two second inspection units E2 and E3 respectively;

[0128] The in-feed block B1 is provided with a plurality of in-feed suction grooves B11 in the shape of concave arcs arranged in concentric rings at a radial interval (8 rings are arranged in this embodiment), and a plurality of hollow suction holes B12 are arranged along the bottom of each in-feed suction groove B11 at an interval; the suction holes B12 can be connected to a negative pressure source to form a vacuum state of negative pressure in the in-feed suction groove B11; the in-feed block B1 includes a short arc edge B13 and a long arc edge B14 that are parallel to each other, and a front end edge B15 and a rear end edge B16 that form an included angle with each other;

[0129] The first inspection block B21 is provided with a plurality of rows (8 rows in this embodiment) of concave annular first suction grooves B211 arranged concentrically at a radial interval, each first suction groove B211 is provided with a plurality of hollow suction holes B212 arranged at an interval along the bottom of the first suction groove B211, and a partition rib B213 is arranged at a corresponding position between every two first suction grooves B211 arranged in a radial straight line, and a plurality of rows (16 rows in this embodiment) of shaft rings B214 made of insulating material are arranged at an interval on the partition rib B213 along the radial axis of the sector, and each shaft ring B214 is provided with a shaft hole B215; the suction holes B212 can be connected to a negative pressure source to form a vacuum state with negative pressure in the first suction groove B211; the first inspection block B21 includes a short arc edge B216 and a long arc edge B217 which are parallel to each other, and a front end edge B218 and a rear end edge B219 which form an angle with each other;

[0130] The second inspection block B22 is provided with a plurality of rows (8 rows in this embodiment) of concave annular second suction grooves B221 arranged concentrically at a radial interval, each second suction groove B221 is provided with a plurality of hollow suction holes B222 arranged at an interval along the bottom of the second suction groove B221, and only one row of shaft rings B224 made of insulating material is arranged at a corresponding position between every two second suction grooves B221 arranged in a radial straight line, and each shaft ring B224 is provided with a shaft hole B225, and the shaft rings B224 of each row are located on the radial axis L of the sector at the center; the suction holes B222 can be connected to a negative pressure source to form a vacuum state with negative pressure in the second suction groove B221; the second inspection block B22 includes a short arc edge B226 and a long arc edge B227 which are parallel to each other, and a front end edge B228 and a rear end edge B229 which form an angle with each other;

[0131] The second inspection block B23 has the same structure as the second inspection block B22, and the same reasoning applies, so it is not repeated here; however, when the second inspection unit E3 is not needed and is omitted as described above, the second inspection block B23 can omit the shaft ring B224 and the shaft hole B225 in the second inspection block B22 as shown in Figure 3

[0132] The discharge block B3 is provided with a plurality of rows (8 rows in this embodiment) of concave annular discharge suction grooves B31 arranged concentrically at a radial interval, each discharge suction groove B31 is provided with a plurality of hollow suction holes B32 arranged at an interval along the bottom of the discharge suction groove B31; the suction holes B32 can be connected to a negative pressure source to form a vacuum state with negative pressure in the discharge suction groove B31; the discharge block B3 includes a short arc edge B33 and a long arc edge B34 which are parallel to each other, and a front end edge B35 and a rear end edge B36 which form an angle with each other;

[0133] ​The first suction groove B211 on the first inspection block B21 is in communication with the second suction groove B221 on the second inspection block B22 and B23 when they are combined, but is not in communication with the feeding suction groove B11 on the feeding block B1 and the discharging suction groove B31 on the discharging block B3 when they are combined; the feeding suction groove B11 on the feeding block B1 has an empty space B17 at the rear end, which is provided with a third suction groove B171 that is in communication with the second suction groove B221 on the second inspection block B22 when they are combined, and is provided with a hollow suction hole B172 in the third suction groove B171.

[0134] As shown in Figure 3 , 5 , the upper surface of the test plate C is provided with a plurality of concentric ring-shaped rectangular seat grooves C1 arranged at a radial interval (8 rows are provided in this embodiment), each row of seat grooves C1 is arranged at a radial interval, and each row of seat grooves C1 is arranged in a plurality of rows in a straight line interval; each seat groove C1 can accommodate a to-be-tested element, such as a capacitor-type electronic element, which has electrodes arranged at the upper and lower ends, respectively, and is placed in the seat groove C1 at the feeding unit D of the test plate C. Figure 5

[0135] As shown in Figure 3 , 6 , the lower surface of the test plate C is provided with a recessed guide groove C2 at the bottom of each seat groove C1, which is radially outwardly circumferentially arranged, and is in communication with the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharging suction groove B31 of the bearing bottom plate B when the test plate C is intermittently rotated, so that the negative pressure introduced from the suction holes B12, B1213, B1223, and B32 of the bearing bottom plate B can be transmitted through the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharging suction groove B31 to adsorb the to-be-tested objects (capacitor-type electronic elements in this embodiment) accommodated in each seat groove C1; the test plate C is formed with a long recessed interval-shaped cleaning groove C3 between two rows of seat grooves C1 on the lower surface, which is formed with an expansion interval C31 close to each seat groove C1, and the cleaning groove C3 is used to accommodate the powder generated by the long-term operation of the lower surface of the test plate C and the bearing bottom plate B to avoid blocking the aperture of the bottom of the seat groove C1.

[0136] As shown in Figure 7 ​As shown, the feeding unit D is provided with an arc-shaped grid D1, which is provided with a plurality of concentric annular arc-shaped grid plates D11 at a radial interval, defining a plurality of load channels D12 (8 in this embodiment), each corresponding to a column of seat grooves C1 on the upper surface of the test board C; the grid D1 is located above the entrance end D13 of the grid D1 in the direction of the intermittent rotation flow path of the test board C, and is provided with a feeding seat D2 above the entrance end D13, which is provided with a plurality of feeding ports D21 arranged in a first axial X straight line below and corresponding to each load channel D12; the feeding seat D2 is provided with a turning seat D3 above, which is provided with a plurality of guide grooves D31 and a plurality of perforated leakage grooves D32 arranged in a first axial X straight line and corresponding to each feeding port D21; each guide groove D31 includes a feeding end D33 and a discharge end D34, each feeding end D33 is arranged in a second axial Y straight line, each discharge end D34 is in communication with one leakage groove D32, and each feeding end D33 is provided with a gas blowing pipe D35 that blows gas from the feeding end D33 to the discharge end D34; the turning seat D3 is covered with a guide seat D4 above, which is provided with a plurality of guide channels D42 arranged in a second axial Y straight line and corresponding to each feeding end D33 of the guide groove D31 in a rectangular material conveying slot D41; one side of the guide seat D4 is provided with a cover D5 covering the turning seat D3 above, which is provided with a plurality of air holes D51 arranged in a first axial X straight line and corresponding to each perforated leakage groove D32 on the turning seat D3; the cover D5 is provided with a connecting member D6, one side of which is provided with a gas pressure connector D61, the other bottom side D62 is provided with a guide hole D62 in communication with the gas pressure connector D61 and a plurality of gas grooves D63 in communication with the guide hole D62 in the form of unequal length straight grooves; when the connecting member D6 covers the cover D5, each gas groove D63 corresponds to one air hole D51 on the cover D5; in this way, when the to-be-tested element is guided to be input from the guide channel D42 of the material conveying slot D41 on the guide seat D4, the to-be-tested element will fall through the feeding end D33 to the discharge end D34 of the turning seat D3, and at the leakage groove D32 of the discharge end D34, the gas blown by the gas blown by the gas pressure connector D61 on the connecting member D6 through the guide hole D62 and the gas groove D63 and blown out from the air hole D51 on the cover D5 will fall through the feeding port D21 of the feeding seat D2 into one corresponding load channel D12 of the grid D1, and will randomly fall into one of the corresponding column of seat grooves C1 on the test board C in the intermittent rotation flow path of the test board C;

[0137] The grid D1 is located at the outlet end D14 of the test plate C in the intermittent rotation flow path direction and is provided with an air blowing seat D7. The air blowing seat D7 provides gas to blow from the outlet end D14 to the inlet end D13 in each of the material loading channels D12, so that the test components in each of the material loading channels D12 that do not randomly fall into the seat C1 are blown back and given another chance to fall into the seat C1.

[0138] The grid D1 is located between the feed seat D2 and the outlet end D14 of the grid D1 in the intermittent rotation flow path direction of the test plate C. A detection seat D8 is provided between the feed seat D2 and the outlet end D14 of the grid D1. The detection seat D8 is provided with a plurality of detection elements D81, each corresponding to a material loading channel D12 for detection. When the number of test elements in the detected material loading channel D12 accumulates to the level detected by the detection element D81, it indicates that there are too many test elements in the material loading channel D12. The system will control to temporarily stop supplying the test elements to the guide seat D4 of the guide seat D4.

[0139] The grid frame D1 has an inner arc-shaped portion D15 facing the center of the test plate C and an outer arc-shaped portion D16 facing the outer edge of the circumference of the test plate C. The grid frame D1 is fixed to the test plate C by the outer arc-shaped portion D16. Figure 1 A connecting member D9, pivotally mounted on a fixed base A11 on the table surface A1 of the test bench, has an arc-shaped recessed fixing part D91. This allows the grid frame D1, along with the connecting member D9, to pivot and be raised to an upward angle relative to the surface of the test plate C, or lowered close to the upper surface of the test plate C, using an adjusting member D92 on the connecting member D9 to secure it to the table surface A1 via a threaded screw, thus fixing the positioning of the grid frame D1. A shim D93 of appropriate thickness is embedded between the grid frame D1 and the fixing part D91 of the connecting member D9 to adjust the height of the grid frame D1 when fixed, maintaining a proper gap with the test plate C. The shim D93 only needs to be changed when changing the specifications of the component under test; the gap does not change when the grid frame D1 is pivoted and lowered.

[0140] The connector D9 is pivotally mounted to the two outer ends of the fixing part D91 via two interlocking pivot portions D94, with each of the two pivot portions D94 pressed against a flexible washer D951 by a locking fastener D95 at each outer end. A screw fastener D952 is used to tighten or loosen the connector D9, thus changing the tightness of the pivot when the connector D9 is linked to the grid D1 to rotate up or down. The fixing seat A11 is located on the other side opposite the connector D9. Figure 1A stop seat D96 is arranged on the table top A1. An inclined pad D961 made of flexible material is arranged above the stop seat D96. When the connecting member D9 is pivoted to pull up the grid D1, the pad D961 can be reversely pulled to stop against the stop seat D96 to maintain the whole in a preset open position.

[0141] Please refer to Figure 8 As shown in the figure, the feeding slot D41 of the guide seat D4 of the feeding unit D is supplied with the components to be tested by the feeding unit G. The feeding unit G is provided with a vibrating feeder G1,

[0142] The vibrating feeder G1 is provided with a hopper G11 for placing the components to be tested and a plurality of (eight in the embodiment) parallel conveying paths G12 corresponding to the number of the seat grooves C1 of the test board C for conveying the components to be tested. Each conveying path G12 is arranged in the third axial direction Z perpendicular to the second axial direction Y of the feeding slot D41 of the guide seat D4 and is driven by a set of vibrating elements G13 (eight in the embodiment). The vibrating feeder G1 is arranged on a swing seat G2 on the table top A2. The swing seat G2 is provided with a first wheel body G3 and a second wheel body G4 at a distance. The first wheel body G3 and the second wheel body G4 are connected by a belt G5 to rotate in the same direction. A rack G41 is arranged above the second wheel body G4. The vibrating feeder G1 is arranged on the rack G41 by a base G14. The base G14 and the rack G41 can rotate relative to each other. A lever G141 is arranged on the base G14. A rod-shaped bolt G411 is arranged on one side of the swing seat G2 to selectively insert into a positioning hole A21 on the table top A2.

[0143] Please refer to Figure 8 、 9 As shown in the figure, the operator can hold and pull the lever G141 to rotate and move the whole vibrating feeder G1 away from the feeding unit D by a distance. At this time, the swing seat G2 will rotate and deviate clockwise around the axis of the first wheel body G3. By the mutual rotation of the first wheel body G3 and the second wheel body G4 in the same direction, the base G14 and the rack G41 will rotate relative to each other. During the displacement process of the vibrating feeder G1, each conveying path G12 will still move out of the feeding slot D41 of the guide seat D4 in the original corresponding third axial direction Z without colliding with the side edge of the feeding slot D41 due to the deviation of the swing seat G2. After the vibrating feeder G1 is rotated and moved to the preset position, the bolt G411 can be operated to insert into the positioning hole A21 to fix the swing seat G2. The function of rotating and moving away of the vibrating feeder G1 will help the operator to approach the feeding unit D for maintenance.

[0144] The electronic component testing device of the embodiment of the present application, since the grid frame D1 of the feeding unit D is fixed on the fixed part D93 of the connecting piece D9 pivoted on the fixed seat A11, and moves together with the connecting piece D9, the grid frame D1 together with the connecting piece D9 can be pivoted on the axis pivoted on the fixed seat A11 as a fulcrum, to form an angle with the surface of the testing plate C, or to be placed close to the surface of the testing plate C; since the gasket D93 is arranged between the fixed part D91 of the grid frame D1 and the connecting piece D9, instead of between the grid plate D11 of the grid frame D1 and the testing plate, the gasket D93 only needs to be changed when the specification of the component to be tested is changed, and the gap will not be changed when the grid frame D1 is pivoted up and then placed down, and it is not necessary to adjust the thickness or quantity of the gasket D93, so that the operation is more convenient.

[0145] The above merely describes the embodiments of the present application, and cannot limit the scope of the embodiments of the present application, and any simple equivalent changes and modifications made according to the scope of the patent application and the content of the patent specification of the present application still belong to the scope of the present application.

Claims

1. An electronic component testing device, comprising: A machine platform, on which a machine platform is provided; A support chassis is mounted on the machine platform, and a test plate that can be driven to rotate is mounted on the support chassis. A feeding unit, an inspection unit, and a discharge unit are provided around the perimeter of the supporting chassis. The feeding unit is provided with an arc-shaped grid frame, which has multiple concentric arc-shaped grid plates arranged at radially spaced intervals, and the grid plates define multiple material loading channels; The feature is that: the grid frame is fixed on an outer side of a connecting member pivotally mounted on a fixed base and moves in conjunction with the connecting member. The grid frame together with the connecting member pivotally mounted on the fixed base is pivotally mounted on the axis of the fixed base and pivots to form an upward angle with the surface of the test plate, or is lowered close to the surface of the test plate.

2. The electronic component testing apparatus as described in claim 1, wherein, The adjusting part on the connector is screwed and locked to the machine table surface by a threaded screw to fix the positioning of the grid frame.

3. The electronic component testing apparatus as described in claim 1, wherein, A gasket of appropriate thickness is embedded between the grid frame and the fixing part of the connector.

4. The electronic component testing apparatus as described in claim 1, wherein, The grid is provided with a feed seat at the entrance end of the grid near the intermittent rotating flow path of the test plate, which is to be entered into the grid. The feed seat has a plurality of feed ports arranged in a straight line along a first axial direction and corresponding to each of the material loading channels.

5. The electronic component testing apparatus as described in claim 4, wherein, A steering seat is provided above the feed seat. The steering seat has multiple guide grooves and multiple perforated slots arranged in a straight line along the first axis X and corresponding to the multiple feed ports respectively. Each guide groove includes a feed end and a discharge end. The feed ends are arranged in a straight line along the second axis. Each discharge end is connected to one of the slots.

6. The electronic component testing apparatus as described in claim 5, wherein, Each of the feed ends is equipped with an air blowing pipe that can blow gas from the feed end toward the discharge end.

7. The electronic component testing apparatus as described in claim 5, wherein, A guide seat is provided above the steering seat. The guide seat has multiple guide channels arranged in parallel along the second axis Y in a material conveying groove and respectively corresponding to the inlet end of each guide groove.

8. The electronic component testing apparatus as described in claim 5, wherein, A cover is provided above the steering seat. The cover has multiple air holes arranged in a straight line along the first axial direction X and corresponding to the multiple slots on the steering seat. A connecting member is provided on the cover. One side of the connecting member has a pneumatic connector, and the other bottom side has a guide hole communicating with the pneumatic connector and multiple air grooves with unequal lengths communicating with the guide hole. When the connecting member covers the cover, each air groove corresponds to and connects to one air hole on the cover.

9. The electronic component testing apparatus as described in claim 1, wherein, The grid is located at the outlet end of the grid in the direction of the intermittent rotation flow of the test plate, where it is about to leave the grid, and provides gas to blow into each of the material loading channels.

10. The electronic component testing apparatus as claimed in claim 1, wherein, The grid is located between an inlet seat and an outlet end of the grid in the intermittent rotation flow path direction of the test plate. The detection seat is provided with multiple detection elements, each corresponding to one of the material loading channels for detection.

11. The electronic component testing apparatus as claimed in claim 1, wherein, The connector is pivotally mounted on the inner sides of the two interlocking pivots at a distance from each other to the two outer ends of the fixing part. The two pivots are pressed against a flexible washer by a locking fastener at each of the two outer ends, and can be screwed in or released by a screw fastener.

12. The electronic component testing apparatus as described in claim 1, wherein, The fixed base is provided with a stop on the other side of the connecting member on the machine table.

13. The electronic component testing apparatus as described in claim 1, wherein, The feeding unit is supplied with the test component by a feeding unit. The feeding unit is equipped with a vibrating feeder. The vibrating feeder is equipped with a conveyor for conveying the test component. The vibrating feeder can swing away from the feeding unit by a distance. During the displacement process, the conveyor will not sway.

14. The electronic component testing apparatus as described in claim 13, wherein, The vibrating feeder is mounted on a swing base, which is located on a machine table. A first wheel and a second wheel are positioned at a distance from each other on the swing base. The first wheel and the second wheel are connected by a belt and can move in tandem. A frame is provided above the second wheel. The vibrating feeder is placed on the frame with a base, and the base and the frame can rotate relative to each other.

15. The electronic component testing apparatus as described in claim 14, wherein, The base is equipped with a lever, and the swing seat on one side of the frame is equipped with a bolt that is inserted downward into a positioning hole on the table of the machine.

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