Back-contact solar cell testing device and testing method

Abstract

The present application provides a back-contact solar cell testing device and a testing method. The former includes a testing tabletop, a first testing piece, a second testing piece and a pressing device; a row of positive protrusions is arranged on the first testing piece, and each positive protrusion is in one-to-one correspondence and abutment with a positive lead of a solar cell, and a first gap for a negative lead to pass through is formed between every two positive protrusions; a row of negative protrusions is arranged on the second testing piece, and each negative protrusion is in one-to-one correspondence and abutment with a negative lead of a solar cell, and a second gap for a positive lead to pass through is formed between every two negative protrusions; the pressing device presses the solar cell to make it abut against the first testing piece and the second testing piece; the first testing piece and the second testing piece are arranged at intervals on the testing tabletop and are both connected to a tester. The solar cell testing device and the testing method in the present application can solve the problems of difficult alignment and unstable connection when testing solar cells in the prior art.

Description

Technical Field

[0001] The present invention relates to the technical field of solar cell testing devices, and in particular, to a back-contact solar cell testing device and a testing method. Background Art

[0002] With the gradual advancement of the new energy strategy, solar cells have been increasingly widely used. During the preparation process of solar cells, the measurement of electrical performance parameters is a very important link. Usually, the performance parameters of the battery are measured through a test platform to evaluate the quality of solar cells.

[0003] The existing back-contact solar cell testing mainly realizes through a test bench provided with probes. After the back-contact solar cell is placed on the test bench, the probes are in contact with the back of the back-contact solar cell for testing. However, in the existing technology, it is relatively difficult for the probes on the test bench to align with the positive and negative wires on the back of the back-contact solar cell during testing, which is likely to cause a short-circuit problem, resulting in poor contact during testing, affecting the test results, and poor stability. Summary of the Invention

[0004] In view of this, the present application provides a back-contact solar cell testing device and a testing method to solve the problems of difficult alignment between the test piece and the solar cell in the test bench and poor stability of the test results during the testing process of the back-contact solar cell.

[0005] The present application provides a back-contact solar cell testing device, which includes a test table surface, a first test piece, a second test piece, and a pressing device;

[0006] A row of positive protrusions is arranged on the first test piece, and each positive protrusion is in one-to-one correspondence with a positive wire of the solar cell and abuts against it. A first gap is formed between every two positive protrusions, and the first gap is used for the negative wire of the solar cell to pass through;

[0007] A row of negative protrusions is arranged on the second test piece, and each negative protrusion is in one-to-one correspondence with a negative wire of the solar cell and abuts against it. A second gap is formed between every two negative protrusions, and the second gap is used for the positive wire of the solar cell to pass through; and

[0008] The pressing device is located above the test table surface, and the pressing device abuts against the solar cell to make the solar cell abut against the first test piece and the second test piece;

[0009] The first test piece and the second test piece are arranged at intervals on the test table surface and are both connected to the tester.

[0010] In the above solution, the solar cell is placed on the first test piece and the second test piece, and the positive protrusion on the first test piece is correspondingly abutted against the positive wire of the solar cell, while the negative protrusion on the second test piece is correspondingly abutted against the negative wire of the solar cell.

[0011] Since a first gap is formed between every two of the positive protrusions, a second gap is formed between every two of the negative protrusions, and the projection of the positive protrusion on the solar cell is collinear with the projection of the second gap on the solar cell, and the projection of the negative protrusion on the solar cell is collinear with the projection of the first gap on the solar cell, the negative wire of the solar cell can just pass through the first gap, and its positive wire can just pass through the second gap, thereby preventing short circuit between the positive and negative poles during testing from affecting the test result.

[0012] The pressing device pushes the solar cell to abut against the first test piece and the second test piece to ensure the connection stability during the test. Finally, the tester connected to the first test piece and the second test piece performs the test and obtains the result.

[0013] After adopting the above technical solution, there are at least the following beneficial effects:

[0014] In the back-contact solar cell testing device of the present application, the first test piece and the second test piece are respectively connected to the positive wire and the negative wire of the solar cell for testing. Since the positive wire and the negative wire of the back-contact solar cell are arranged in an interleaved manner, the above-described structure of the first test piece and the second test piece makes the alignment of the solar cell with the first test piece and the second test piece more accurate during testing, thereby improving the test stability.

[0015] And the setting of the pressing device makes the connection between the solar cell and the first test piece and the second test piece stable, prevents the test result from fluctuating, and improves the test stability.

[0016] In addition, the multiple positive protrusions provided on the first test piece and the multiple negative protrusions provided on the second test piece are uniformly abutted against the positive wire and the negative wire of the solar cell, avoiding stress concentration at the contact positions with the solar cell during testing, reducing the probability of the solar cell being broken during testing, and thus saving production costs.

[0017] In a possible design, the pressing device includes a pressing driving member and a pressing abutting member that are connected to each other.

[0018] In the above solution, the pressing driving member drives the pressing abutting member to abut against or disengage from the solar cell, with high automation and low production costs.

[0019] In a possible design, the height H of the positive electrode protrusion and / or the negative electrode protrusion is 20 - 40 μm.

[0020] In a possible design, the width W of the positive electrode protrusion and / or the negative electrode protrusion is 100 - 150 μm, and the width K of the first gap and / or the second gap is 500 - 900 μm.

[0021] In the above solution, the structures of the first test piece and the second test piece can achieve a better test effect.

[0022] In a possible design, the back - contact solar cell testing device further includes a detection camera. The detection camera is disposed on the side of the first test piece and / or the second test piece, and the shooting direction of the detection camera is parallel to the extension direction of the positive electrode wire. The detection camera is used to detect the relative position between the positive electrode wire and the positive electrode protrusion, and the detection camera is also used to detect the relative position between the negative electrode wire and the negative electrode protrusion.

[0023] In the above solution, the detection camera can detect the connection tightness and alignment accuracy between the solar cell and the first test piece and the second test piece in real time.

[0024] In a possible design, the back - contact solar cell testing device further includes a light source. The light source is disposed on the side of the pressing device away from the solar cell, and the light source is oriented towards the solar cell.

[0025] In the above solution, by setting the light source, parameters such as the light intensity and spectrum irradiated onto the solar cell can be precisely controlled, so as to comprehensively and accurately test the photovoltaic conversion efficiency and performance parameters of the solar cell under various light environments.

[0026] In a possible design, the material of the first test piece and / or the second test piece includes one or more of copper, iron, and silver.

[0027] In the above solution, the first test piece and / or the second test piece is made of one or more of copper, iron, and silver. Utilizing the good electrical conductivity characteristics of the above - mentioned metals can ensure the electrical conductivity effect and improve the test accuracy.

[0028] In a possible design, a silver - plated layer is provided at one end of the positive electrode protrusion close to the solar cell and / or at one end of the negative electrode protrusion close to the solar cell.

[0029] In the above solution, silver metal has good electrical conductivity but is expensive. Therefore, setting silver - plated layers on the positive electrode protrusion and the negative electrode protrusion can achieve a good electrical conductivity effect and improve the stability during testing while saving costs.

[0030] In a possible design, the solar cell is an IBC (interdigitated back contact) main-gridless solar cell.

[0031] The present application also provides a testing method, which uses the back-contact solar cell testing device described in any one of the above, and the method includes:

[0032] An installation step of placing the solar cell on the first test piece and the second test piece, such that the positive electrode wires of the solar cell are connected to the positive electrode protrusions one by one, and the negative electrode wires of the solar cell are connected to the negative electrode protrusions one by one;

[0033] A confirmation step of using a detection camera disposed on the side of the first test piece and / or the second test piece to confirm the relative positional relationship between the positive electrode wire and the positive electrode protrusion, and to confirm the relative positional relationship between the negative electrode wire and the negative electrode protrusion;

[0034] If the positive electrode wires are connected to the positive electrode protrusions one by one and the negative electrode wires are connected to the negative electrode protrusions one by one, then proceed to the next step;

[0035] A testing step of pressing the solar cell against the first test piece and the second test piece by a pressing device, turning on a tester, and testing the performance parameters of the solar cell.

[0036] In the above solution, the positive electrode wires of the solar cell are connected to the positive electrode protrusions of the first test piece, and the negative electrode wires of the solar cell are connected to the negative electrode protrusions of the second test piece. During testing, the contact range between the wires and the test pieces is large and there are many contact points, which not only provides good contact stability but also reduces the probability of the solar cell being crushed during testing.

[0037] Other features and advantages of the embodiments of the present application will be described in the subsequent specification, and in part, will be obvious from the specification, or will be understood by implementing the embodiments of the present application. The objectives and other advantages of the embodiments of the present application are achieved and obtained by the structures specifically pointed out in the specification and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0039] Figure 1Schematic structural diagram of the back-contact solar cell testing device provided by an embodiment of the present application;

[0040] Figure 2 Schematic structural diagram of the first test piece and the second test piece of the back-contact solar cell testing device provided by an embodiment of the present application;

[0041] Figure 3 Schematic connection diagram of a solar cell chip with the first test piece and the second test piece provided by an embodiment of the present application;

[0042] Figure 4 Schematic structural diagram of the pressure grid provided by an embodiment of the present application;

[0043] Figure 5 Schematic structural diagram of the silver-plated layer on the first test piece and the second test piece provided by an embodiment of the present application;

[0044] Figure 6 Schematic structural diagram of the detection camera of the back-contact solar cell testing device provided by an embodiment of the present application;

[0045] Figure 7 Schematic structural diagram of a certain angle of the back-contact solar cell testing device provided by an embodiment of the present application;

[0046] Figure 8 Schematic structural diagram of another angle of the back-contact solar cell testing device provided by an embodiment of the present application.

[0047] Reference numerals:

[0048] 100 - Back-contact solar cell testing device;

[0049] 200 - Battery chip main body;

[0050] 201 - Positive electrode wire;

[0051] 202 - Negative electrode wire;

[0052] 1 - Test tabletop;

[0053] 2 - First test piece;

[0054] 21 - Positive electrode protrusion;

[0055] 22 - First gap;

[0056] 3 - Second test piece;

[0057] 31 - Negative electrode protrusion;

[0058] 32 - Second gap;

[0059] 4 - Compression device;

[0060] 41 - Compression driving part;

[0061] 42 - Compression abutting part;

[0062] 421 - Mesh pressing;

[0063] 5 - Tester;

[0064] 6 - Light source;

[0065] 7 - Silver plating layer;

[0066] 8 - Detection camera.

[0067] The accompanying drawings here are incorporated into the specification and form a part of this specification, showing embodiments consistent with this application, and are used together with the specification to explain the principles of this application. Detailed implementation manners

[0068] For a better understanding of the technical solutions of this application, the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0069] It should be clear that the described embodiments are only a part of the embodiments of this application, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in this application without any creative work fall within the scope of protection of this application.

[0070] The terms used in the embodiments of this application are only for the purpose of describing specific embodiments, and are not intended to limit this application. The singular forms of "a", "the" and "said" used in the embodiments of this application and the appended claims are also intended to include the plural forms, unless the context clearly indicates otherwise.

[0071] It should be understood that the term "and / or" used herein is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " herein generally represents an "or" relationship between the associated objects before and after.

[0072] It should be noted that the orientation terms such as "upper", "lower", "left", and "right" described in the embodiments of this application are described from the angles shown in the accompanying drawings, and should not be construed as limitations on the embodiments of this application. In addition, in the context, it should also be understood that when it is mentioned that an element is connected "above" or "below" another element, it can not only be directly connected "above" or "below" another element, but also be indirectly connected "above" or "below" another element through an intermediate element.

[0073] The following will describe specific embodiments of the back-contact solar cell testing device provided by the embodiments of the present application according to its structure.

[0074] As Figure 1 shown, the present application provides a back-contact solar cell testing device 100, which includes a testing table 1, a first testing piece 2, a second testing piece 3, and a pressing device 4.

[0075] The first testing piece 2 and the second testing piece 3 are arranged at intervals on the testing table 1 and are both connected to the tester 5.

[0076] A row of positive electrode protrusions 21 is arranged on the first testing piece 2, and each positive electrode protrusion 21 is in one-to-one correspondence with and abuts against a positive electrode wire 201 of the solar cell. A first gap 22 is formed between every two positive electrode protrusions 21, and the first gap 22 is used for the negative electrode wire 202 of the solar cell to pass through.

[0077] A row of negative electrode protrusions 31 is arranged on the second testing piece 3, and each negative electrode protrusion 31 is in one-to-one correspondence with and abuts against a negative electrode wire 202 of the solar cell. A second gap 32 is formed between every two negative electrode protrusions 31, and the second gap 32 is used for the positive electrode wire 201 of the solar cell to pass through.

[0078] The pressing device 4 is located above the testing table 1. The pressing device 4 includes a pressing driving member 41 and a pressing abutting member 42 that are connected to each other. The pressing driving member 41 is used to drive the pressing abutting member 42 to abut against the solar cell, so that the solar cell abuts against the first testing piece 2 and the second testing piece 3.

[0079] After adopting the above technical solutions, there are at least the following beneficial effects:

[0080] In the back-contact solar cell testing device 100 of the present application, the first testing piece 2 and the second testing piece 3 are used to connect with the positive electrode wire 201 and the negative electrode wire 202 of the solar cell for testing. After the solar cell is placed on the first testing piece 2 and the second testing piece 3, because the positive electrode protrusions 21 on the first testing piece 2 and the negative electrode protrusions 31 on the second testing piece 3 are arranged in a staggered manner, the positive electrode wire 201 and the negative electrode wire 202 on the solar cell can be conveniently aligned and abutted against the positive electrode protrusions 21 and the negative electrode protrusions 31, improving the testing efficiency and reducing the possibility of short circuit between the positive and negative electrodes.

[0081] Furthermore, by setting the pressing device 4, the connection between the solar cell and the first testing piece 2 and the second testing piece 3 is stabilized, preventing fluctuations in the test results and improving the stability of the test.

[0082] In addition, multiple positive protrusions 21 provided on the first test piece 2 and multiple negative protrusions 31 provided on the second test piece 3 are uniformly in contact with the positive electrode wire 201 and the negative electrode wire 202 of the solar cell, avoiding stress concentration at the contact positions with the solar cell during testing, reducing the probability of fragmentation of the solar cell during testing, and thus saving production costs.

[0083] Please refer to Figure 2 and Figure 3 , a back-contact solar cell is a common type of cell in the photovoltaic field. During its production process, it is necessary to test its photovoltaic conversion efficiency. The solar cell is composed of a plate-shaped cell body 200 and alternately arranged positive and negative electrode wires. Among them, the positive electrode wire 201 and the negative electrode wire 202 are sequentially arranged at intervals on the back surface of the cell body 200, and the positive electrode wire 201 and the negative electrode wire 202 are straight wires parallel to each other. During testing, it is necessary to ensure not only the mutual insulation between the positive electrode wire 201 and the negative electrode wire 202, but also the mutual insulation between the conductor in contact with the positive electrode wire 201 and the conductor in contact with the negative electrode wire 202. It should be noted that the front surface of the solar cell is the surface facing and receiving sunlight, and the back surface of the solar cell is the surface facing away from sunlight.

[0084] Please refer to Figure 1 and Figure 2 , the solar cell is placed on the first test piece 2 and the second test piece 3, and the positive protrusions 21 on the first test piece 2 are correspondingly in contact with the positive electrode wire 201 of the solar cell, and at the same time, the negative protrusions 31 on the second test piece 3 are correspondingly in contact with the negative electrode wire 202 of the solar cell. Specifically, the positive protrusions 21 and the negative protrusions 31 can be square block-shaped protrusion structures, or they can also be arc-shaped protrusion structures, or the tops of both can be flat surfaces or any shape structures matching the electrode wires. The first test piece 2 and the second test piece 3 are arranged at intervals on the test table 1 and are both connected to the tester 5. The tester 5 can be a common electrical tester 5 for detecting voltage and current.

[0085] Because a first gap 22 is formed between every two positive protrusions 21, a second gap 32 is formed between every two negative protrusions 31, and the center line of the projection of the positive protrusions 21 on the solar cell coincides with the center line of the projection of the second gap 32 on the solar cell, and the projection of the negative protrusions 31 on the solar cell is collinear with the projection of the first gap 22 on the solar cell, so each negative electrode wire 202 on the solar cell can just pass through a first gap 22, and each positive electrode wire 201 of it can just pass through a second gap 32. In this way, it can be ensured that the positive and negative poles are separated from each other during testing, avoiding short circuit and affecting the test results.

[0086] After the solar cell is placed on the first test piece 2 and the second test piece 3 and is correctly connected to the positive wire 201 and the negative wire 202, the pressing device 4 further pushes the solar cell into close contact with the first test piece 2 and the second test piece 3 to ensure the connection stability during the test. Finally, the tester 5 connected to the first test piece 2 and the second test piece 3 conducts the test and obtains the results.

[0087] The pressing driving member 41 in the pressing device 4 can be a common telescopic cylinder, telescopic motor, etc., and the pressing and holding member 42 can be a common flat plate, etc.

[0088] Please refer to Figure 7 , in one embodiment, the height H of the positive protrusion 21 and / or the negative protrusion 31 is set to 20 - 40 μm. The purpose is to have sufficient vertical space to accommodate the metal wires of the other polarity of the battery and avoid short circuits caused by contacting the bottom of the gap.

[0089] Please refer to Figure 7 And Figure 8 , in one embodiment, the width W of the positive protrusion 21 and / or the negative protrusion 31 is 100 - 150 μm, and the width K of the first gap 22 and / or the second gap 32 is 500 - 900 μm. The purpose of the wider gap is to reserve a certain space for the positive wire 201 and the negative wire 202 to prevent the positive wire 201 of the solar cell from contacting the negative protrusion 31 or the negative wire 202 from contacting the positive protrusion 21 when they are not fully aligned, thus causing a short circuit; while the alignment of the positive wire 201 of the battery with the positive protrusion 21 and the alignment of the negative wire 202 with the negative protrusion 31 can be compensated by other components such as a detection camera. Therefore, the protrusion width W can be set smaller.

[0090] It can be understood that adopting the above structure can better test the solar cell, improve the test accuracy, and prevent short circuits.

[0091] It should be noted that when testing the 182 model solar cell, the structure of the back-contact solar cell test device 100 in the present application can be as follows: the width W of the positive protrusion 21 and / or the negative protrusion 31 is 100 - 150 μm, the height H of the positive protrusion 21 and / or the negative protrusion 31 is set to 20 - 40 μm, and the width K of the first gap 22 and / or the second gap is 600 - 800 μm.

[0092] When testing the battery chips of model 163, the specific structure of the back-contact solar cell testing device 100 in this application can be as follows: the width W of the positive electrode protrusion 21 and / or the negative electrode protrusion 31 is 100 - 150 μm, the height H of the positive electrode protrusion 21 and / or the negative electrode protrusion 31 is set to 20 - 40 μm, and the width K of the first gap 22 and / or the second gap is 500 - 700 μm.

[0093] For the two types of solar cell chips given in the above two embodiments, the back-contact solar cell testing device 100 in this application can be used for testing.

[0094] In one embodiment, the pressing driving member 41 is a telescopic motor.

[0095] Please refer to Figure 1 , using a compression motor as the pressing driving member 41, with the characteristics of quietness and high precision of the telescopic motor, it can well press the solar cell chip and also avoid the problem that the conventional pressing driving member 41 is prone to excessive extrusion during pressing, resulting in damage to the solar cell chip during testing.

[0096] In one embodiment, the pressing abutting member 42 is a press mesh 421, and the press mesh 421 abuts against the side of the solar cell chip away from the first test piece 2.

[0097] Please refer to Figure 4 , the pressing abutting member 42 is a press mesh 421, and the press mesh 421 itself is a mesh structure with a plurality of mesh holes formed thereon. Therefore, even when the press mesh 421 abuts against the solar cell chip, it can ensure that the light during testing can irradiate the solar cell chip through the mesh holes of the press mesh 421, without affecting the light absorption of the solar cell chip, thereby improving the detection efficiency and adaptability during detection.

[0098] Specifically, the press mesh can include a plurality of intersecting fiber filaments, the diameter of the fiber filaments can be, and the mesh holes of the press mesh can be circular, square, rhombic, etc. For example, the mesh holes of the press mesh are square.

[0099] In addition, due to the mesh structure of the press mesh 421 itself, the contact positions between the press mesh 421 and the solar cell chip are not only numerous but also relatively dispersed in distribution positions. Obviously, the problem of stress concentration during testing can be avoided, further reducing the fragmentation probability of the solar cell chip during testing, and thus reducing the production cost and improving the production efficiency.

[0100] In one embodiment, the main body of the press mesh 421 is made of a light-blocking material.

[0101] Please refer to Figure 1 and Figure 4Because the testing process of solar cells is mainly to test the photovoltaic conversion efficiency of solar cells, it is necessary to strictly control the light intensity and spectrum of the light irradiating the solar cells. Conventional presses usually use materials such as glass with a certain degree of light transmittance. When light is irradiated on it, the glass will produce a certain light absorption effect, resulting in changes in the incident spectrum, affecting the test accuracy of the solar panel.

[0102] In this solution, an opaque pressing screen 421 is used to avoid the influence of spectral changes on the test results. Accordingly, the light reflected by the pressing screen 421 body can be compensated by increasing the light intensity or spectrum of the incident light to ensure the accuracy of the test.

[0103] In one embodiment, the back-contact solar cell testing device 100 also includes a detection camera 8, which is arranged on the side of the first test piece 2 and / or the second test piece 3, and the shooting direction of the detection camera 8 is parallel to the extension direction of the positive wire 201. The detection camera 8 is used to detect the relative position between the positive wire 201 and the positive protrusion 21, and the detection camera 8 is also used to detect the relative position between the negative wire 202 and the negative protrusion 31.

[0104] See also Figure 1 and Figure 6 , the detection camera 8 is arranged on the side of the first test piece 2 and / or the second test piece 3. Accordingly, one or two detection cameras 8 can be arranged. Because the shooting direction of the detection camera 8 is parallel to the extension direction of the positive wire 201, the cross-section of the positive wire 201 and the negative wire 202 perpendicular to the axial direction can be projected onto the detection camera 8. In this way, the detection camera 8 can detect whether the relative positions between each positive wire 201 and each positive protrusion 21 are overlapped or in contact, and can also detect whether the relative positions between each negative wire 202 and each negative protrusion 31 are overlapped or in contact. If the detection camera 8 detects and identifies that the solar cell is aligned with the first test piece 2 and the second test piece 3 and the position is correct, the tester 5 is started to test the solar cell. In one embodiment, the back contact solar cell test device 100 also includes a light source 6, which is arranged on the side of the pressing device 4 away from the solar cell, and the light source 6 is arranged toward the solar cell.

[0105] See also Figure 1 The light source 6 can be any device used to simulate sunlight, and its spectral matching, spatial non-uniformity and temporal stability are all obtained by simulating sunlight under natural conditions. By setting the light source 6, the parameters such as the light intensity and spectrum irradiated on the solar cell can be accurately controlled, so as to comprehensively and accurately test the photovoltaic conversion efficiency and performance parameters of the solar cell under various light environments.

[0106] In one embodiment, the material of the first test piece 2 and / or the second test piece 3 includes one or more of copper, iron, and silver.

[0107] The first test piece 2 and / or the second test piece 3 can be made of copper, iron, silver or their alloy materials. Utilizing the good electrical conductivity of the above metals can ensure the electrical conductivity effect and improve the test accuracy.

[0108] In one embodiment, a silver plating layer 7 is provided at one end of the positive electrode protrusion 21 close to the solar cell and / or at one end of the negative electrode protrusion 31 close to the solar cell.

[0109] Please refer to Figure 5 , silver metal has good electrical conductivity but is expensive. Therefore, setting the silver plating layer 7 on the positive electrode protrusion 21 and the negative electrode protrusion 31 can achieve a good electrical conductivity effect on the premise of saving costs and improve the stability during testing.

[0110] In one embodiment, the solar cell is an IBC non-main-grid solar cell, which is characterized in that only fine grid lines are printed on the back to form alternating positive and negative conductors. Since there is no need to print insulating glue and main grids, compared with the main-grid IBC cell, the manufacturing process is simple and the cost is lower.

[0111] The structure of the IBC non-main-grid solar cell can be as follows: the main structure of the cell is a flat plate, and long positive and negative conductors are alternately arranged on its plane. Since the positive and negative conductors are staggered, there are gaps between each adjacent positive and negative conductors.

[0112] The present application also provides a testing method, which uses the back-contact solar cell testing device 100 of any one of the above. The method includes:

[0113] An installation step of placing the solar cell on the first test piece 2 and the second test piece 3, such that the positive conductors 201 of the solar cell are connected to the positive electrode protrusions 21 one by one, and the negative conductors 202 of the solar cell are connected to the negative electrode protrusions 31 one by one;

[0114] A confirmation step of using the detection camera 8 provided on the side of the first test piece 2 and / or the second test piece 3 to confirm the relative position relationship between the positive conductors 201 and the positive electrode protrusions 21, and to confirm the relative position relationship between the negative conductors 202 and the negative electrode protrusions 31. If the positive conductors 201 are connected to the positive electrode protrusions 21 one by one and the negative conductors 202 are connected to the negative electrode protrusions 31 one by one, then the testing step is continued.

[0115] Testing steps: The pressing device 4 presses the solar cell against the first test piece 2 and the second test piece 3, and then the tester 5 is turned on to test the performance parameters of the solar cell.

[0116] Please refer to Figure 1 , the positive wire 201 of the solar cell is connected to the positive protrusion 21 of the first test piece 2, and the negative wire 202 of the solar cell is connected to the negative protrusion 31 of the second test piece 3. During testing, the contact range between the wires and the test pieces is large and there are many contact points, which not only ensures good contact stability but also reduces the probability of the solar cell being crushed during testing. The pressing device 4 ensures the stability of the connection between the solar cell and the first test piece 2 and the second test piece 3 during the testing process, preventing retesting due to inaccurate test results and thus improving the test efficiency.

[0117] Before the testing steps and after the installation steps, a confirmation step is carried out using the detection camera 8. Since the detection camera 8 is arranged on the side of the first test piece 2 and / or the second test piece 3, it can detect whether the relative positions between each positive wire 201 and each positive protrusion 21 coincide or are in contact. If each positive wire 201 is in contact with a positive protrusion 21 and each negative wire 202 is in contact with a negative protrusion 31, then the position of the solar cell is accurate at this time and its contact with the first test piece 2 and the second test piece 3 is good.

[0118] When the confirmation step confirms that the positive wires 201 are connected to the positive protrusions 21 one by one and the negative wires 202 are connected to the negative protrusions 31 one by one, then the next testing step is entered. The above solution avoids testing solar cells with misaligned or wrongly connected wires, improves the detection efficiency of the testing method, and reduces the risk of short circuit during battery testing.

[0119] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A back-contact solar cell testing device, characterized in that include: Test table; A first test piece, wherein a row of positive electrode protrusions is disposed on the first test piece, each of the positive electrode protrusions is in one-to-one correspondence with a positive electrode wire of a solar cell, and a first gap is formed between every two of the positive electrode protrusions, and the first gap is used for the negative electrode wire of the solar cell to pass through; a second test piece, wherein a row of negative electrode protrusions is arranged on the second test piece, each of the negative electrode protrusions is in one-to-one correspondence with a negative electrode wire of the solar cell, a second gap is formed between every two of the negative electrode protrusions, and the second gap is used for the positive electrode wire of the solar cell to pass through, and the positive electrode protrusions on the first test piece and the negative electrode protrusions on the second test piece are arranged alternately; and A pressing device, the pressing device is located above the test table, the pressing device abuts against the solar cell, so that the solar cell abuts against the first test piece and the second test piece; The first test piece and the second test piece are arranged on the test table with an interval and are both connected to the tester.

2. The back-contact solar cell testing device according to claim 1, characterized in that The height H of the positive electrode protrusion and / or the negative electrode protrusion is 20-40 μm.

3. The back-contact solar cell testing device according to claim 1 or 2, characterized in that, A width W of the positive electrode protrusion and / or the negative electrode protrusion is 100-150 μm, and a width K of the first gap and / or the second gap is 500-900 μm.

4. The back-contact solar cell testing device according to claim 1, wherein The clamping device comprises a clamping driving member and a clamping holding member which are connected to each other.

5. The back-contact solar cell testing device according to claim 1 or 4, characterized in that The back-contact solar cell testing device also includes a detection camera, which is arranged on the side of the first test piece and / or the second test piece, and the shooting direction of the detection camera is parallel to the extension direction of the positive electrode wire. The detection camera is used to detect the relative position between the positive electrode wire and the positive electrode protrusion, and the detection camera is also used to detect the relative position between the negative electrode wire and the negative electrode protrusion.

6. The back-contact solar cell testing device according to claim 1 or 4, characterized in that The back-contact solar cell testing device further comprises a light source, which is arranged on a side of the pressing device away from the solar cell sheet, and the light source is arranged toward the solar cell sheet.

7. The back contact type solar cell testing device according to claim 1, wherein The material of the first test piece and / or the second test piece includes one or more of copper, iron, and silver.

8. The back-contact solar cell testing device according to claim 1 or 7, characterized in that, A silver-plated layer is provided at one end of the positive electrode protrusion close to the solar cell and / or at one end of the negative electrode protrusion close to the solar cell.

9. The back-contact solar cell testing device according to claim 1, characterized in that, The solar cell is an IBC busbar-free solar cell.

10. A testing method, characterized in that, The method uses the back-contact solar cell testing device according to any one of claims 1 to 9, and the method comprises: An installation step, placing the solar cell on the first test piece and the second test piece, so that the positive electrode wires of the solar cell are connected to the positive electrode protrusions in a one-to-one correspondence, and so that the negative electrode wires of the solar cell are connected to the negative electrode protrusions in a one-to-one correspondence; a confirmation step, using a detection camera disposed on a side of the first test piece and / or the second test piece to confirm the relative positional relationship between the positive electrode wire and the positive electrode protrusion, and to confirm the relative positional relationship between the negative electrode wire and the negative electrode protrusion; If the positive electrode wires are connected to the positive electrode protrusions one by one and the negative electrode wires are connected to the negative electrode protrusions one by one, proceed to the next step; Testing step: The pressing device presses the solar cell on the first test piece and the second test piece, turns on the tester, and tests the performance parameters of the solar cell.

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