A pneumatic semiconductor automatic test probe

Abstract

The present invention discloses a pneumatic semiconductor automatic test probe, comprising a three-way connecting tube, the middle port of the three-way connecting tube is connected to an air inlet pipe, one side port of the three-way connecting tube is connected to a first needle tube, a first spring is arranged in the first needle tube, a first needle shaft is arranged in the first spring, the head of the first needle shaft extends from the first needle tube, the other side port of the three-way connecting tube is connected to a second needle tube, a second spring is arranged in the second needle tube, a second needle shaft is arranged in the second spring, the head of the second needle shaft extends from the second needle tube. The pneumatic semiconductor automatic test probe solves the problem that the existing probe is difficult to realize automatic testing due to its small size.

Description

Technical Field

[0001] The invention belongs to the technical field of semiconductor detection, and in particular relates to a pneumatic semiconductor automatic testing probe. Background Art

[0002] During the production of printed circuit boards, electrical tests are required to determine whether the electrical parameters (such as resistance, capacitance, or inductance) of various components of the printed circuit boards meet standard requirements.

[0003] A common PCB testing method is to set test points on the PCB, print solder paste on the surface of the test points, and then use automated test equipment or in-circuit test equipment to directly contact the solder paste area of ​​the test points with probes to obtain relevant electrical parameters.

[0004] With the development of science and technology, consumers are constantly moving towards smaller, lighter and thinner electronic products. Consequently, the requirements for the performance testing of electronic products are becoming increasingly higher. Probes have been widely used in the instrumentation and testing industry. They are the most commonly used sampling method for precise measurement of resistance or other electrical signals. The main types of probes are cantilever probes and vertical probes. However, existing probes are difficult to implement automated testing due to their small size. Summary of the Invention

[0005] The purpose of the present invention is to provide a pneumatic semiconductor automatic test probe to solve the problem that the existing probe is difficult to realize automatic testing due to its small size.

[0006] In order to solve the above technical problems, the present invention discloses a pneumatic semiconductor automatic test probe, including a three-way connecting tube, the middle port of the three-way connecting tube is connected to an air inlet pipe, one side port of the three-way connecting tube is connected to a first needle tube, a first spring is arranged in the first needle tube, a first needle shaft is arranged in the first spring, the head of the first needle shaft extends from the first needle tube, the other side port of the three-way connecting tube is connected to a second needle tube, a second spring is arranged in the second needle tube, a second needle shaft is arranged in the second spring, and the head of the second needle shaft extends from the second needle tube.

[0007] The technical solution of the present invention also has the following characteristics:

[0008] As a further improvement to the technical solution of the present invention, the first spring and the second spring are both compression springs.

[0009] As a further improvement of the technical solution of the present invention, the air intake pipe, the first needle tube, and the second needle tube are threadedly connected to the middle port and two side ports of the three-way connecting pipe respectively.

[0010] As a further improvement to the technical solution of the present invention, the tails of the first needle shaft and the second needle shaft are provided with limiting platforms, and the first spring and the second spring are sleeved on the first needle shaft and the second needle shaft.

[0011] As a further improvement to the technical solution of the present invention, the ports of the first needle tube and the second needle tube are formed with constricted openings.

[0012] Compared with the existing technology, the pneumatic semiconductor automatic testing probe of the present invention connects two needle tubes through a three-way connecting tube, and pneumatically drives the two needle shafts to move in the two needle tubes, thereby realizing automatic testing, which solves the problem that existing probes are difficult to perform automated testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0014] Figure 1 This is a schematic structural diagram of a pneumatic semiconductor automatic test probe according to the present invention;

[0015] Figure 2 This is an exploded view of a pneumatic semiconductor automatic test probe of the present invention.

[0016] In the picture:

[0017] 1. Three-way connecting pipe;

[0018] 2. First needle;

[0019] 3. First needle axis;

[0020] 4. First spring;

[0021] 5. Limiting table;

[0022] 6. Intake pipe;

[0023] 7. Second needle;

[0024] 8. Second needle axis;

[0025] 9. Second spring. DETAILED DESCRIPTION

[0026] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0027] In the description of the present invention, if there is a description of first and second, it is only for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0028] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, and connecting should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0029] like Figure 1 As shown, a pneumatic semiconductor automatic test probe of the present invention includes a three-way connecting tube 1, the middle port of the three-way connecting tube 1 is connected to the air inlet pipe 6, one side port of the three-way connecting tube 1 is connected to the first needle tube 2, a first spring 4 is arranged in the first needle tube 2, a first needle shaft 3 is arranged in the first spring 4, and the head of the first needle shaft 3 extends from the first needle tube 2, the other side port of the three-way connecting tube 1 is connected to the second needle tube 7, a second spring 9 is arranged in the second needle tube 7, a second needle shaft 8 is arranged in the second spring 9, and the head of the second needle shaft 8 extends from the second needle tube 7.

[0030] When working, air is inflated into the air inlet pipe 6, and the gas pushes the first needle shaft 3 and the second needle shaft 8 to extend from the first needle tube 2 and the second needle tube 7 respectively, so as to contact the object to be tested and realize automatic detection. The semiconductor test probe is easy to operate and is suitable for automatic detection in more complex environments.

[0031] like Figure 1 As shown, in a pneumatic semiconductor automatic test probe of the present invention, the first spring 4 and the second spring 9 are both compression springs.

[0032] The first spring 4 and the second spring 9 are preferably compression springs, which can ensure that the elastic force of the spring acts evenly on the first needle shaft 3 and the second needle head 8, ensuring that the first needle shaft 3 and the second needle head 8 can move up and down in a straight line in the first needle tube 2 and the second needle tube 7 without deviation.

[0033] like Figure 1 As shown, in a pneumatic semiconductor automatic test probe of the present invention, the air inlet pipe 6, the first needle tube 2, and the second needle tube 7 are threadedly connected to the middle port and two side ports of the three-way connecting pipe 1 respectively.

[0034] The air intake pipe 6, the first needle tube 2 and the second needle tube 7 are respectively threadedly assembled with the middle port and the two side ports of the three-way connecting pipe 1, which is convenient to assemble and can be replaced in case of partial damage, thereby extending the service life.

[0035] That is, the needle tube tail end is used for fastening. Specifically, after the second needle 6 is assembled in the needle tube 1, a circle of concave dots is made on the outside of the needle tube 1. This can fix the second needle 6 and the expansion tube 7 together, which is more convenient to operate.

[0036] like Figure 1 As shown, in a pneumatic semiconductor automatic test probe of the present invention, a limiting platform 5 is provided at the tail of the first needle shaft 3 and the second needle shaft 8, and the first spring 4 and the second spring 9 are sleeved on the first needle shaft 3 and the second needle shaft 8, and pressed against one side of the limiting platform 5. In this way, it can be ensured that the first needle shaft 3 and the second needle shaft 8 exert pressure on the first spring 4 and the second spring 9 when they move, ensuring that they undergo elastic deformation, so that they can be quickly reset under the action of elastic force when not inflated.

[0037] like Figure 1 As shown, in a pneumatic semiconductor automatic test probe of the present invention, the ports of the first needle tube 2 and the second needle tube 7 are formed with constrictions.

[0038] The end surface is limited by a concave surface, that is, a concave surface is formed at the end of the first needle tube 2 and the second needle tube 7, ensuring that the inner diameter of the concave surface is smaller than the outer diameter of the limiting platform 5, but larger than the outer diameter of the first needle shaft 3 and the second needle shaft 8. In this way, the first needle tube 2 and the second needle tube 7 can be ensured to move up and down within a certain range and will not fall out of the first needle tube 2 and the second needle tube 7.

[0039] Compared with the existing technology, the pneumatic semiconductor automatic testing probe of the present invention realizes the connection of two needle tubes (first needle tube 2 and second needle tube 7) through a three-way connecting tube 1, and pneumatically drives two needle shafts (first needle shaft 3 and second needle shaft 8) to move in the two needle tubes, thereby realizing automatic testing, which solves the problem that existing probes are difficult to perform automated testing.

[0040] The foregoing description shows and describes several preferred embodiments of the invention. However, as previously stated, it should be understood that the invention is not limited to the form disclosed herein and should not be construed as excluding other embodiments. Rather, the invention is applicable to various other combinations, modifications, and environments and is capable of modification within the scope of the inventive concept described herein, through the teachings above, or through techniques or knowledge in the relevant art. Modifications and variations made by those skilled in the art that do not depart from the spirit and scope of the invention are intended to be within the scope of the appended claims.

Claims

1. A pneumatic semiconductor automatic test probe, characterized in that: The invention comprises a three-way connecting tube (1), wherein the middle port of the three-way connecting tube (1) is connected to an air inlet pipe (6), a side port of the three-way connecting tube (1) is connected to a first needle tube (2), a first spring (4) is arranged in the first needle tube (2), a first needle shaft (3) is arranged in the first spring (4), a head of the first needle shaft (3) extends out of the first needle tube (2), and a second needle tube (7) is connected to the other side port of the three-way connecting tube (1), a second spring (9) is arranged in the second needle tube (7), and the second spring (9) A second needle shaft (8) is arranged in the third needle shaft (9), and the head of the second needle shaft (8) extends out from the second needle tube (7); the first spring (4) and the second spring (9) are both compression springs; the air intake pipe (6), the first needle tube (2) and the second needle tube (7) are respectively threadedly connected to the middle port and two side ports of the three-way connecting tube (1); a limiting platform (5) is arranged at the tail of the first needle shaft (3) and the second needle shaft (8), and the first spring (4) and the second spring (9) are sleeved on the first needle shaft (3) and the second needle shaft (8).

2. The pneumatic semiconductor automatic test probe according to claim 1, characterized in that: The ports of the first needle tube (2) and the second needle tube (7) are formed with constricted openings.

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