Detection device and method for binocular structured light camera module

Abstract

The application provides a detection device and method of a binocular structured light camera module. The detection device comprises a first fixing device, a left infrared camera module, a speckle projection module and a right infrared camera module which are installed on a substrate support according to a preset baseline, a standard infrared camera module which is fixed vertically above the speckle projection module at a specific distance, and an optical processing device which is horizontally arranged at the center line position of the standard infrared camera module and the speckle projection module and is used for partially reflecting and partially transmitting the light beam projected by the speckle projection module. The left infrared camera module, the right infrared camera module and the standard infrared camera module have the same structure. The detection device of the binocular structured light camera module can simultaneously detect whether each camera module is qualified, thereby improving the yield of the camera module post-stage calibration and ensuring the output quality of the depth image.

Description

Technical Field

[0001] This application relates to the field of camera module technology, and in particular to a detection device and method for a binocular structured light camera module. Background Technology

[0002] In recent years, 3D structured light camera modules have been increasingly used in the consumer electronics field, such as in robot obstacle avoidance, facial recognition payment, and scene modeling. 3D structured light technology can not only image target objects but also acquire their depth information, making it the most widely used 3D imaging device currently available.

[0003] The 3D binocular structured light depth camera consists of a speckle projection module and two identical infrared camera modules on the left and right. After the three optical modules are assembled, quickly confirming whether the speckle projection module performs well and whether the two identical infrared camera modules on the left and right perform well and are consistent is an extremely important part of the entire assembly and manufacturing process. It is closely related to subsequent rework and the 3D reconstruction accuracy of the 3D binocular structured light depth camera.

[0004] Currently, although the manufacturing of each module of 3D structured light is quite mature, how to quickly determine whether each optical module has been damaged during the assembly process, whether it does not meet the performance requirements, and especially whether the clarity performance of the left and right infrared camera modules is consistent, are still problems to be solved. Summary of the Invention

[0005] The main objective of this application is to provide a detection device and method for a binocular structured light camera module. The aim is to simultaneously detect the qualification of each module—the speckle projection module, the left infrared camera module, and the right infrared camera module—based on the detection device, thereby improving the yield rate of the camera module's post-calibration and ensuring the output quality of depth images.

[0006] To achieve the above objectives, a first aspect of this application provides a detection device for a binocular structured light camera module, the detection device comprising:

[0007] The first fixing device includes a substrate support and a left infrared camera module, a speckle projection module and a right infrared camera module mounted on the substrate support according to a preset baseline. The speckle projection module is located at the center of the left infrared camera module and the right infrared camera module.

[0008] A standard infrared camera module is fixed vertically above the speckle projection module at a specific distance.

[0009] An optical processing device is horizontally arranged at a middle line position of the standard infrared camera module and the speckle projection module, and is configured to partially reflect and partially transmit the light beam projected by the speckle projection module.

[0010] The left infrared camera module, the right infrared camera module and the standard infrared camera module are of the same structure.

[0011] In some embodiments, the optical processing device comprises:

[0012] A glass plate is horizontally arranged at a middle line position of the standard infrared camera module and the speckle projection module, and a white paper is attached to the glass plate.

[0013] Alternatively, a mirror is horizontally arranged at a middle line position of the standard infrared camera module and the speckle projection module, and an optical film is coated on the mirror.

[0014] To achieve the above object, a second aspect of the embodiments of the present application provides a detection method of a binocular structured light camera module, which is executed based on the detection device of the binocular structured light camera module according to the first aspect.

[0015] The binocular structured light camera module to be detected is installed at a corresponding position of the detection device, and the binocular structured light camera module comprises a left infrared camera module, a speckle projection module and a right infrared camera module.

[0016] The speckle image projected by the speckle projection module is collected by the camera module, and the zero-order region speckle points are extracted, the zero-order region speckle points are all the speckle points in the central region of the speckle image, and the camera module comprises the standard infrared camera module, the left infrared camera module and the right infrared camera module.

[0017] The average speckle area and the average speckle ellipticity of the zero-order region speckle points are calculated respectively.

[0018] Whether the binocular structured light camera module is qualified is determined according to the average speckle area and the average speckle ellipticity of the zero-order region speckle points and the corresponding preset specifications, and the preset specifications comprise a speckle area threshold and a speckle ellipticity threshold.

[0019] When it is determined that the left infrared camera module and the right infrared camera module are both qualified, a first array and a second array are compared to determine whether the left infrared camera module and the right infrared camera module satisfy the secondary qualification, the first array comprises the average speckle area and the average speckle ellipticity of the zero-order region speckle points corresponding to the left infrared camera module, and the second array comprises the average speckle area and the average speckle ellipticity of the zero-order region speckle points corresponding to the right infrared camera module.

[0020] In some embodiments, the detection method comprises:

[0021] acquiring a first speckle image projected by the speckle projection module through the standard infrared camera module, and extracting first zero-level region speckle points, which are all speckle points in a central region of the first speckle image;

[0022] calculating a speckle area mean value and a speckle ellipticity mean value of the first zero-level region speckle points;

[0023] judging whether the speckle projection module is qualified according to the speckle area mean value and the speckle ellipticity mean value of the first zero-level region speckle points and a first preset specification, the first preset specification comprising a first speckle area threshold and a first speckle ellipticity threshold;

[0024] acquiring a second speckle image projected by the speckle projection module through the left infrared camera module, and extracting second zero-level region speckle points, which are all speckle points in a central region of the second speckle image;

[0025] calculating a speckle area mean value and a speckle ellipticity mean value of the second zero-level region speckle points;

[0026] judging whether the left infrared camera module is qualified according to the speckle area mean value and the speckle ellipticity mean value of the second zero-level region speckle points and a second preset specification, the second preset specification comprising a second speckle area threshold and a second speckle ellipticity threshold;

[0027] acquiring a third speckle image projected by the speckle projection module through the right infrared camera module, and extracting third zero-level region speckle points, which are all speckle points in a central region of the third speckle image;

[0028] calculating a speckle area mean value and a speckle ellipticity mean value of the third zero-level region speckle points;

[0029] judging whether the right infrared camera module is qualified according to the speckle area mean value and the speckle ellipticity mean value of the third zero-level region speckle points and a third preset specification, the third preset specification comprising a third speckle area threshold and a third speckle ellipticity threshold;

[0030] when it is determined that both the left infrared camera module and the right infrared camera module are qualified, comparing the speckle area mean value and the speckle ellipticity mean value of the second zero-level region speckle points with the speckle area mean value and the speckle ellipticity mean value of the third zero-level region speckle points to judge whether the left infrared camera module and the right infrared camera module meet a secondary qualification.

[0031] In some embodiments, the calculating the speckle area average and the speckle ellipticity average of the speckle points in the first zero-level region comprises:

[0032] extracting a first zero-level region, the first zero-level region being a central region of the first speckle image;

[0033] processing the first zero-level region to identify all speckle points in the first zero-level region;

[0034] calculating the speckle area and the speckle ellipticity of each speckle point in the first zero-level region;

[0035] calculating the speckle area average of the speckle points in the first zero-level region according to the speckle area of each speckle point in the first zero-level region;

[0036] calculating the speckle ellipticity average of the speckle points in the first zero-level region according to the speckle ellipticity of each speckle point in the first zero-level region.

[0037] In some embodiments, the judging whether the speckle projection module is qualified according to the speckle area average and the speckle ellipticity average of the speckle points in the first zero-level region and the first preset specification comprises:

[0038] when the speckle area average of the speckle points in the first zero-level region is not greater than the first speckle area threshold value, and the speckle ellipticity average of the speckle points in the first zero-level region is not less than the first speckle ellipticity threshold value, determining that the speckle projection module is qualified;

[0039] when the speckle area average of the speckle points in the first zero-level region is greater than the first speckle area threshold value, or the speckle ellipticity average of the speckle points in the first zero-level region is less than the first speckle ellipticity threshold value, determining that the speckle projection module is unqualified.

[0040] In some embodiments, the judging whether the speckle projection module is qualified according to the speckle area average and the speckle ellipticity average of the speckle points in the first zero-level region and the first preset specification comprises:

[0041] comparing the speckle area average of the speckle points in the first zero-level region with the first speckle area threshold value;

[0042] if the speckle area average of the speckle points in the first zero-level region is greater than the first speckle area threshold value, determining that the speckle projection module is unqualified;

[0043] if the speckle area average of the speckle points in the first zero-level region is not greater than the first speckle area threshold value, comparing the speckle ellipticity average of the speckle points in the first zero-level region with the first speckle ellipticity threshold value;

[0044] If the average speckle ellipticity of the speckle points in the first zero-level region is not less than the first speckle ellipticity threshold, it is determined that the speckle projection module is qualified, and if the average speckle ellipticity of the speckle points in the first zero-level region is less than the first speckle ellipticity threshold, it is determined that the speckle projection module is unqualified.

[0045] In some embodiments, the judging whether the left infrared camera module is qualified according to the average speckle area and the average speckle ellipticity of the speckle points in the second zero-level region and the second preset specification comprises:

[0046] When the average speckle area of the speckle points in the second zero-level region is not greater than the second speckle area threshold, and the average speckle ellipticity of the speckle points in the second zero-level region is not less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is qualified.

[0047] When the average speckle area of the speckle points in the second zero-level region is greater than the second speckle area threshold, or the average speckle ellipticity of the speckle points in the second zero-level region is less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is unqualified.

[0048] In some embodiments, the judging whether the right infrared camera module is qualified according to the average speckle area and the average speckle ellipticity of the speckle points in the third zero-level region and the third preset specification comprises:

[0049] When the average speckle area of the speckle points in the third zero-level region is not greater than the third speckle area threshold, and the average speckle ellipticity of the speckle points in the third zero-level region is not less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is qualified.

[0050] When the average speckle area of the speckle points in the third zero-level region is greater than the third speckle area threshold, or the average speckle ellipticity of the speckle points in the third zero-level region is less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is unqualified.

[0051] In some embodiments, the judging whether the left infrared camera module and the right infrared camera module satisfy the secondary qualification comprises:

[0052] When the absolute value of the difference between the average speckle area of the speckle points in the second zero-level region and the average speckle area of the speckle points in the third zero-level region is not greater than a first preset threshold, and the absolute value of the difference between the average speckle ellipticity of the speckle points in the second zero-level region and the average speckle ellipticity of the speckle points in the third zero-level region is not greater than a second preset threshold, it is determined that the left infrared camera module and the right infrared camera module satisfy the secondary qualification.

[0053] When the absolute value of the difference between the speckle area average of the speckle points of the second zero-level area and the speckle area average of the speckle points of the third zero-level area is greater than a first preset threshold, or the absolute value of the difference between the speckle ellipticity average of the speckle points of the second zero-level area and the speckle ellipticity average of the speckle points of the third zero-level area is greater than a second preset threshold, it is determined that the left infrared camera module and the right infrared camera module do not meet the secondary qualification.

[0054] The application provides a detection device and method for a binocular structured light camera module. The detection device comprises a first fixing device, a standard infrared camera module, and an optical processing device. The first fixing device comprises a substrate support and a left infrared camera module, a speckle projection module, and a right infrared camera module which are installed on the substrate support according to a preset baseline. The speckle projection module is located at the center position of the left infrared camera module and the right infrared camera module. The standard infrared camera module is fixed vertically above the speckle projection module at a specific distance. The optical processing device is horizontally arranged at the center line position of the standard infrared camera module and the speckle projection module, and is used for partially reflecting and partially transmitting the light beam projected by the speckle projection module. The left infrared camera module, the right infrared camera module, and the standard infrared camera module have the same structure. The detection device for the binocular structured light camera module can simultaneously detect whether each module of the speckle projection module, the left infrared camera module, and the right infrared camera module is qualified, thereby improving the yield of camera module post-stage calibration and ensuring the output quality of a depth image. BRIEF DESCRIPTION OF DRAWINGS

[0055] Figure 1 FIG. 1 is a structural schematic diagram of a detection device for a binocular structured light camera module provided in an embodiment of the application;

[0056] Figure 2 FIG. 2 is a step flowchart of a detection method performed by the detection device shown in FIG. 1; Figure 1

[0057] Figure 3 FIG. 3 is a schematic diagram of a first zero-level area extracted according to the detection method shown in FIG. 2;

[0058] Figure 4 FIG. 4 is a step flowchart of calculating the speckle area average and the speckle ellipticity average of the speckle points of the first zero-level area according to the detection method shown in FIG. 2;

[0059] Figure 5 FIG. 5 is a schematic diagram of the first zero-level area after being processed according to the detection method shown in FIG. 2;

[0060] Figure 6 FIG. 6 is a schematic diagram of data corresponding to each speckle point in the first zero-level area shown in FIG. 5; Figure 5

[0061] Figure 7 ​​is a flow chart for judging whether the speckle projection module is qualified provided by the embodiment of the present application;

[0062] Figure 8 is a flow chart for judging whether the left infrared camera module is qualified provided by the embodiment of the present application;

[0063] Figure 9 is a flow chart for judging whether the right infrared camera module is qualified provided by the embodiment of the present application;

[0064] Figure 10 is a flow chart for judging whether the left infrared camera module and the right infrared camera module meet the secondary qualification provided by the embodiment of the present application;

[0065] Figure 11 is an example diagram of data of each speckle point collected by the unqualified camera module provided by the embodiment of the present application. DETAILED DESCRIPTION

[0066] In order to make the purpose, technical scheme and advantages of the present application more clear, the present application is further described in detail below in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, and are not used to limit the present application.

[0067] It should be noted that although the functional modules are divided in the device schematic diagram, and the logical order is shown in the flow chart, in some cases, the steps shown or described can be executed in a manner different from the module division in the device or the order in the flow chart. The terms "first", "second", etc. in the specification and claims and the above-described drawings are used to distinguish similar objects, and do not necessarily describe a specific order or sequence.

[0068] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs. The terms used herein are only for the purpose of describing the embodiments of the present application, and are not intended to limit the present application.

[0069] With the gradual upgrading of the consumer field, the demand for applying 3D imaging technology to the consumer field is increasingly urgent. In addition to imaging the target object, 3D imaging technology can also obtain the depth information of the target object, and according to the depth information, 3D face recognition, virtual scene modeling, human-computer interaction and other functions can be further realized. At the same time, it is required that the 3D imaging device can meet the requirements of low power, high performance and miniaturization, so as to be set in an electronic terminal device which is convenient to carry.

[0070] Currently, in the 3D imaging technical solutions, the structured light scheme is relatively mature and widely used. Generally, binocular structured light cameras will be calibrated in the module factory before leaving the factory, but the calibration of the rear section of the structured light camera module takes a long time, so before calibration, that is, after module assembly, it is necessary to ensure that the assembled speckle transmission module has good performance, the performance of the left and right two identical infrared camera modules is good and consistent, only in this way, the efficiency of the module rear section calibration can be improved, manpower, material resources and other resources can be saved.

[0071] Based on this, the embodiment of the application provides a detection device for a binocular structured light camera module. The detection device can simultaneously detect whether the speckle transmission module and the left and right infrared camera modules of the binocular structured light camera are qualified, and can ensure that each module has good performance after assembly, thereby improving the yield of the camera module rear section calibration and ensuring the output quality of the depth image.

[0072] Reference Figure 1 , Figure 1 is a structural schematic diagram of the detection device for the binocular structured light camera module provided in the embodiment of the application. As shown in Figure 1 , the detection device comprises:

[0073] The first fixing device 100 comprises a substrate support 101 and a left infrared camera module 102, a speckle projection module 103 and a right infrared camera module 104 mounted on the substrate support 101 according to a pre-set baseline, and the speckle projection module 103 is located at the center position of the left infrared camera module 102 and the right infrared camera module 104;

[0074] The standard infrared camera module 110 is fixed vertically above the speckle projection module 103 at a specific distance;

[0075] The optical processing device 120 is horizontally arranged at the midline position of the standard infrared camera module 110 and the speckle projection module 103, and is used for partially reflecting and partially transmitting the light beam projected by the speckle projection module 103;

[0076] The left infrared camera module 102, the right infrared camera module 104 and the standard infrared camera module 110 are of the same structure.

[0077] Specifically, the speckle projection module 103 comprises a light source, a collimating mirror and a diffractive optical element (DOE). The light source is a VCSEL (Vertical-Cavity Surface-Emitting Laser) array light source, which is mounted on a ceramic substrate by a semiconductor packaging process and comprises a two-dimensional pattern of a plurality of sub-light sources. Compared with a traditional light source, the VCSEL array light source has the advantages of small size, small divergence angle and concentrated energy. The collimating mirror is used to receive the light beam emitted by the VCSEL array light source and collimate the light beam with a certain divergence angle. The diffractive optical element is used to receive the collimated light beam and project the light beam into the target space by means of light diffraction. The light beam is formed by copying the VCSEL array light source. For example, if the VCSEL has 100 sub-light sources and the number of copies of the diffractive optical element is 100, then 10,000 speckle points will be formed in the space.

[0078] The standard infrared camera module 110 is fixed vertically above the speckle projection module 103 at a certain distance, so that the standard infrared camera module 110 can acquire the speckle image projected by the speckle projection module 103.

[0079] Optionally, the optical processing device 120 comprises:

[0080] a glass plate horizontally arranged at the middle line position of the standard infrared camera module 110 and the speckle projection module 103 and a white paper attached to the glass plate;

[0081] Alternatively, a mirror is horizontally arranged at the middle line position of the standard infrared camera module 110 and the speckle projection module 103, and an optical film is coated on the mirror.

[0082] In the embodiment of the present application, the optical processing device 120 is used to partially reflect and partially transmit the light beam projected by the speckle projection module 103. Therefore, part of the light beam projected by the speckle projection module 103 is reflected by the optical processing device 120, so that the left infrared camera module 102 and the right infrared camera module 104 can acquire the speckle image projected by the speckle projection module 103. Part of the light beam projected by the speckle projection module 103 is transmitted by the optical processing device 120, so that the standard infrared camera module 110 can also acquire the speckle image projected by the speckle projection module 103.

[0083] It can be understood that the specific form, structure and mounting method of the optical processing device 120 are not limited in the embodiment of the present application, and any device capable of partially reflecting and partially transmitting the light beam projected by the speckle projection module 103 can be used.

[0084] It should be noted that in the embodiments of the present application, the left infrared camera module 102 and the right infrared camera module 104 are the left and right camera modules of the binocular structured light camera, and their structures are the same. The structure of the standard infrared camera module 110 is also the same as that of the left infrared camera module 102 and the right infrared camera module 104, so as to ensure that the speckle images collected by the standard infrared camera module 110 are the same as the speckle images collected by the left infrared camera module 102 and the right infrared camera module 104.

[0085] In the embodiments of the present application, based on the detection device shown in Figure 1 , the left infrared camera module, the speckle projection module and the right infrared camera module of the binocular structured light camera can be detected simultaneously. Specifically, the binocular structured light camera module to be detected is installed at the corresponding position of the detection device shown in Figure 1 , and the binocular structured light camera module includes the left infrared camera module, the speckle projection module and the right infrared camera module. The speckle image projected by the speckle projection module is collected by the camera module, and the zero-order region speckle points are extracted, wherein the camera module includes the standard infrared camera module, the left infrared camera module and the right infrared camera module. The average speckle area and the average speckle ellipticity of the zero-order region speckle points are calculated respectively. Then, whether the binocular structured light camera module is qualified is judged according to the average speckle area and the average speckle ellipticity of the zero-order region speckle points and the corresponding preset specifications, wherein the preset specifications include the speckle area threshold and the speckle ellipticity threshold. When it is determined that the left infrared camera module and the right infrared camera module are qualified, the first array and the second array are compared to judge whether the left infrared camera module and the right infrared camera module meet the secondary qualification, wherein the first array includes the average speckle area and the average speckle ellipticity of the zero-order region speckle points corresponding to the left infrared camera module, and the second array includes the average speckle area and the average speckle ellipticity of the zero-order region speckle points corresponding to the right infrared camera module.

[0086] Referring to Figure 2 , Figure 2 , the detection method provided in the embodiments of the present application is based on the detection device shown in Figure 1 , and the step flow chart of the detection method includes but is not limited to steps S201 to S2010.

[0087] In step S201, the first speckle image projected by the speckle projection module is collected by the standard infrared camera module, and the first zero-order region speckle points are extracted, wherein the first zero-order region speckle points are all the speckle points in the central region of the first speckle image.

[0088] In the embodiments of the present application, the assembled binocular structured light camera module is placed in the detection device as shown in Figure 1The detection device shown in the figure, ensure speckle projection module 103 perpendicular to optical processing device 120, and with the standard infrared camera module 110 symmetry, speckle projection module 103 to optical processing device 120 distance and standard infrared camera module 110 to optical processing device 120 distance is equal. Then open the light source of speckle projection module 103, speckle projection module of projection beam through optical processing device 120 a part of the standard infrared camera module 110 can be transmitted, so that the standard infrared camera module 110 can be collected speckle projection module 103 projection speckle image. At the same time, speckle projection module of projection beam through optical processing device 120 a part of the first fixed device 100, so that the left infrared camera module 102 and right infrared camera module 104 can be collected speckle projection module 103 projection speckle image. And because the standard infrared camera module 110 and left infrared camera module 102, right infrared camera module 104 structure is same, therefore, if the left infrared camera module 102 and right infrared camera module 104 are qualified, the standard infrared camera module 110 collected speckle image and left infrared camera module 102 collected speckle image and right infrared camera module 104 collected speckle image is same.

[0089] In the embodiment of the application, the speckle image projected by the speckle projection module is collected by the standard infrared camera module, which is recorded as a first speckle image. Then the central region of the first speckle image is extracted, which is called a first zero-order region. All the speckle points in the first zero-order region are called first zero-order region speckle points. As shown in Figure 3 Figure 3 is a schematic diagram of the first zero-order region extracted by the embodiment of the application. Figure 3 The first zero-order region in contains 33 speckle points.

[0090] It should be noted that the central region of the speckle image has the best optical performance and will not have light distortion and distortion. Therefore, the central region is extracted from the speckle image in the embodiment of the application, and the first zero-order region speckle points are calculated and detected, which can reduce the amount of calculation and ensure the accuracy of detection.

[0091] In step S202, the average speckle area and the average speckle ellipticity of the first zero-order region speckle points are calculated.

[0092] In the embodiment of the application, the first zero-order region extracted contains a plurality of speckle points, and the speckle area and the speckle ellipticity of the plurality of speckle points are calculated, and then the average speckle area and the average speckle ellipticity of the first zero-order region speckle points are calculated.

[0093] Referring to Figure 4 , Figure 4 ​This is a flowchart of the steps for calculating the average speckle area and average speckle ellipticity of the first zero-order region speckle according to the embodiments of this application, including but not limited to steps S401 to S405.

[0094] Step S401: Extract the first zero-level region, which is the central region of the first speckle image;

[0095] Step S402: Process the first zero-level region to identify all speckles in the first zero-level region;

[0096] Step S403: Calculate the speckle area and speckle ellipticity of each speckle in the first zero-order region;

[0097] Step S404: Calculate the average speckle area of ​​the speckle spots in the first zero-level region based on the speckle area of ​​each speckle spot in the first zero-level region.

[0098] Step S405: Calculate the average speckle ellipticity of the speckle spots in the first zero-order region based on the speckle ellipticity of each speckle spot in the first zero-order region.

[0099] In this embodiment of the application, the following is extracted from the acquired speckle image: Figure 3 Following the first level zero region shown, the region of interest is first converted to grayscale, then denoised, followed by binarization. Then, 8-connectivity is used to connect the images, and the Canny edge algorithm is used to find the boundaries of the connected components in the binarized image. (Refer to...) Figure 5 , Figure 5 This is a schematic diagram illustrating the processing of the first zero-level region according to an embodiment of this application. After processing the first zero-level region, all speckle patterns within the first zero-level region can be identified. Then, the speckle area and speckle ellipticity of each speckle pattern in the first zero-level region are calculated. The average speckle area of ​​the speckle patterns in the first zero-level region is calculated based on the speckle area of ​​each speckle pattern, and the average speckle ellipticity of the speckle patterns in the first zero-level region is calculated based on the speckle ellipticity of each speckle pattern. (Refer to...) Figure 6 , Figure 6 This is provided by the embodiments of this application. Figure 5 The diagram shows the data corresponding to each speckle in the first zero-level region.

[0100] It should be noted that, in the embodiments of this application, operations such as extracting the first zero-level region, processing the first zero-level region, and calculating the average speckle area and average speckle ellipticity of the speckles in the first zero-level region can all be implemented through pre-set programming. That is, after the standard infrared camera module acquires the first speckle image, it can directly output the average speckle area and average speckle ellipticity of the speckles in the first zero-level region.

[0101] It should be noted that the speckle points in the speckle image projected by the qualified speckle projection module are approximately circular, and the circularity can reach greater than 0.9. At the same time, under the projection at a fixed distance, the clarity of the receiving camera module (such as the standard infrared camera module, the left infrared camera module and the right infrared camera module) is changed, the speckle points become blurred and large, and the calculated speckle area also becomes large, that is, the speckle area can indirectly represent the clarity. When the camera module is assembled with an inclination or the lens and the photosensitive chip are inclined, the speckle points become elliptical, and all the speckle points are inclined in the same direction. Based on these principles, whether the assembled speckle projection module and the left and right infrared camera modules are defective can be judged by calculating the speckle area and the speckle ellipticity of the speckle points.

[0102] In step S203, whether the speckle projection module is qualified is judged according to the speckle area mean and the speckle ellipticity mean of the first zero-level region speckle points and the first preset specification. The first preset specification includes a first speckle area threshold and a first speckle ellipticity threshold.

[0103] In the embodiments of the present application, after the speckle area mean and the speckle ellipticity mean of the first zero-level region speckle points are calculated, the calculated speckle area mean and the speckle ellipticity mean of the first zero-level region speckle points are compared with the first preset specification, so that whether the speckle projection module is qualified can be judged.

[0104] It should be noted that the speckle points in the speckle image projected by the qualified speckle projection module are approximately circular, and the circularity can reach greater than 0.9. At the same time, under the projection at a fixed distance, the clarity of the receiving camera module (such as the standard infrared camera module, the left infrared camera module and the right infrared camera module) is changed, the speckle points become blurred and large, and the calculated speckle area also becomes large, that is, the speckle area can indirectly represent the clarity. When the camera module is assembled with an inclination or the lens and the photosensitive chip are inclined, the speckle points become elliptical, and all the speckle points are inclined in the same direction. Based on these principles, whether the assembled speckle projection module and the left and right infrared camera modules are defective can be judged by calculating the speckle area and the speckle ellipticity of the speckle points. Figure 1 The detection device shown in FIG. 1 first detects a certain number of binocular structured light camera modules to obtain detection data. The detection data includes each first speckle image collected based on the standard infrared camera module, and the speckle area mean and the speckle ellipticity mean of the corresponding first zero-level region speckle points are calculated. Then, the first speckle area threshold can be further determined according to the speckle area mean corresponding to each first speckle image, and the first speckle ellipticity threshold can be further determined according to the speckle ellipticity mean corresponding to each first speckle image.

[0105] Similarly, the detection data includes each second speckle image collected based on the left infrared camera module, and the speckle area mean and the speckle ellipticity mean of the corresponding second zero-level region speckle points are calculated. Then, the second speckle area threshold can be further determined according to the speckle area mean corresponding to each second speckle image, and the second speckle ellipticity threshold can be further determined according to the speckle ellipticity mean corresponding to each second speckle image.

[0106] Similarly, the detection data contains each third speckle image collected based on the right infrared camera module, and the average speckle area and the average speckle ellipticity of the corresponding third zero-level region speckle point are calculated. Then the third speckle area threshold can be further determined according to the average speckle area of each third speckle image. The third speckle ellipticity threshold is determined according to the average speckle ellipticity of each third speckle image.

[0107] Exemplarily, first based on Figure 1 The detection device shown in the figure first detects 100 binocular structured light camera modules, and the standard infrared camera module can correspondingly collect 100 first speckle images and calculate 100 corresponding average speckle areas and 100 average speckle ellipticities. Then further average the 100 average speckle areas to obtain the first speckle area threshold; average the 100 average speckle ellipticities to obtain the first speckle ellipticity threshold.

[0108] Similarly, based on Figure 1 After the detection device shown in the figure detects 100 binocular structured light camera modules, the left infrared camera module can correspondingly collect 100 second speckle images and calculate 100 corresponding average speckle areas and 100 average speckle ellipticities. Then further average the 100 average speckle areas to obtain the second speckle area threshold; average the 100 average speckle ellipticities to obtain the second speckle ellipticity threshold.

[0109] Similarly, based on Figure 1 After the detection device shown in the figure detects 100 binocular structured light camera modules, the right infrared camera module can correspondingly collect 100 third speckle images and calculate 100 corresponding average speckle areas and 100 average speckle ellipticities. Then further average the 100 average speckle areas to obtain the third speckle area threshold; average the 100 average speckle ellipticities to obtain the third speckle ellipticity threshold.

[0110] Referring to Figure 7 , Figure 7 is a flowchart provided by the embodiment of the application for judging whether the speckle projection module is qualified, including but not limited to steps S701 to S704.

[0111] Step S701, judging whether the average speckle area of the first zero-level region speckle point is greater than the first speckle area threshold;

[0112] Step S702, if the average speckle area of the first zero-level region speckle point is not greater than the first speckle area threshold, judging whether the average speckle ellipticity of the first zero-level region speckle point is less than the first speckle ellipticity threshold;

[0113] Step S703, if the average speckle area of the speckle points in the first zero-level region is greater than the first speckle area threshold value or the average speckle ellipticity of the speckle points in the first zero-level region is less than the first speckle ellipticity threshold value, it is determined that the speckle projection module is unqualified.

[0114] Step S704, if the average speckle area of the speckle points in the first zero-level region is greater than the first speckle area threshold value or the average speckle ellipticity of the speckle points in the first zero-level region is less than the first speckle ellipticity threshold value, it is determined that the speckle projection module is unqualified.

[0115] In the embodiment of the present application, when the average speckle area of the speckle points in the first zero-level region is not greater than the first speckle area threshold value and the average speckle ellipticity of the speckle points in the first zero-level region is not less than the first speckle ellipticity threshold value, it is determined that the speckle projection module is qualified. When the average speckle area of the speckle points in the first zero-level region is greater than the first speckle area threshold value or the average speckle ellipticity of the speckle points in the first zero-level region is less than the first speckle ellipticity threshold value, it is determined that the speckle projection module is unqualified.

[0116] Step S204, the second speckle image projected by the speckle projection module is collected by the left infrared camera module, and the second zero-level region speckle points are extracted, which are all the speckle points in the central region of the second speckle image.

[0117] In the embodiment of the present application, after turning on the light source of the speckle projection module 103, part of the projection light beam of the speckle projection module 103 is reflected back to the first fixed device 100 through the optical processing device 120, so that the left infrared camera module 102 can collect the speckle image projected by the speckle projection module 103. The speckle image projected by the speckle projection module 103 is collected by the left infrared camera module 102, which is recorded as the second speckle image, and then the central region of the second speckle image is extracted, which is called the second zero-level region. All the speckle points in the second zero-level region are called the second zero-level region speckle points.

[0118] Step S205, the average speckle area and the average speckle ellipticity of the second zero-level region speckle points are calculated.

[0119] In the embodiment of the present application, similarly, the extracted second zero-level region contains a plurality of speckle points, and the speckle area and the speckle ellipticity of each of the plurality of speckle points need to be calculated, and then the average speckle area and the average speckle ellipticity of the second zero-level region speckle points are calculated. The calculation process and method are the same as the process and method of calculating the average speckle area and the average speckle ellipticity of the first zero-level region speckle points, which will not be described here.

[0120] Step S206, according to the average speckle area and the average speckle ellipticity of the second zero-level region speckle points and the second preset specification, it is determined whether the left infrared camera module is qualified, and the second preset specification includes the second speckle area threshold value and the second speckle ellipticity threshold value.

[0121] In the embodiment of the present application, after the speckle area average and the speckle ellipticity average of the second zero-level region speckle points are calculated, the calculated speckle area average and the speckle ellipticity average of the second zero-level region speckle points are compared with the second preset specification, so that it can be determined whether the left infrared camera module is qualified.

[0122] Referring to Figure 8 , Figure 8 is a flowchart for determining whether the left infrared camera module is qualified, including but not limited to steps S801 to S804.

[0123] In step S801, it is determined whether the speckle area average of the second zero-level region speckle points is greater than the second speckle area threshold.

[0124] In step S802, if the speckle area average of the second zero-level region speckle points is not greater than the second speckle area threshold, it is determined whether the speckle ellipticity average of the second zero-level region speckle points is less than the second speckle ellipticity threshold.

[0125] In step S803, if the speckle ellipticity average of the second zero-level region speckle points is not less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is qualified.

[0126] In step S804, if the speckle area average of the second zero-level region speckle points is greater than the second speckle area threshold, or the speckle ellipticity average of the second zero-level region speckle points is less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is unqualified.

[0127] In the embodiment of the present application, when the speckle area average of the second zero-level region speckle points is not greater than the second speckle area threshold, and the speckle ellipticity average of the second zero-level region speckle points is not less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is qualified. When the speckle area average of the second zero-level region speckle points is greater than the second speckle area threshold, or the speckle ellipticity average of the second zero-level region speckle points is less than the second speckle ellipticity threshold, it is determined that the left infrared camera module is unqualified.

[0128] In step S207, the third speckle image projected by the speckle projection module is collected by the right infrared camera module, and the third zero-level region speckle points are extracted, which are all the speckle points in the central region of the third speckle image.

[0129] In the embodiment of the present application, after the light source of the speckle projection module 103 is turned on, the projection light beam of the speckle projection module 103 is reflected by the optical processing device 120 to the first fixing device 100, so that the right infrared camera module 104 can capture the speckle image projected by the speckle projection module 103. The speckle image projected by the speckle projection module 103 is captured by the right infrared camera module 104, denoted as a third speckle image, and then the central region of the third speckle image is extracted, referred to as a third zero-order region. All speckle points in the third zero-order region are referred to as third zero-order region speckle points.

[0130] In step S208, the speckle area average and speckle ellipticity average of the third zero-order region speckle points are calculated.

[0131] In the embodiment of the present application, similarly, the third zero-order region extracted contains a plurality of speckle points, and the speckle area and speckle ellipticity of each of the plurality of speckle points need to be calculated, and then the speckle area average and speckle ellipticity average of the third zero-order region speckle points are calculated. The calculation process and method are the same as the calculation process and method of the speckle area average and speckle ellipticity average of the first zero-order region speckle points and the second zero-order region speckle points, which will not be described here.

[0132] In step S209, whether the right infrared camera module is qualified is judged according to the speckle area average and speckle ellipticity average of the third zero-order region speckle points and a third preset specification, and the third preset specification includes a third speckle area threshold and a third speckle ellipticity threshold.

[0133] In the embodiment of the present application, after the speckle area average and speckle ellipticity average of the third zero-order region speckle points are calculated, the speckle area average and speckle ellipticity average of the third zero-order region speckle points are compared with the third preset specification, so that whether the right infrared camera module is qualified can be judged.

[0134] Referring to Figure 9 , Figure 9 is a flowchart for judging whether the right infrared camera module is qualified, including but not limited to steps S901 to S904.

[0135] In step S901, whether the speckle area average of the third zero-order region speckle points is greater than a third speckle area threshold is judged.

[0136] In step S902, if the speckle area average of the third zero-order region speckle points is not greater than the third speckle area threshold, whether the speckle ellipticity average of the third zero-order region speckle points is less than a third speckle ellipticity threshold is judged.

[0137] Step S903, if the speckle ellipticity average of the speckle points in the third zero-level region is not less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is qualified;

[0138] Step S904, if the speckle area average of the speckle points in the third zero-level region is greater than the third speckle area threshold, or the speckle ellipticity average of the speckle points in the third zero-level region is less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is unqualified.

[0139] In the embodiment of the application, when the speckle area average of the speckle points in the third zero-level region is not greater than the third speckle area threshold, and the speckle ellipticity average of the speckle points in the third zero-level region is not less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is qualified. When the speckle area average of the speckle points in the third zero-level region is greater than the third speckle area threshold, or the speckle ellipticity average of the speckle points in the third zero-level region is less than the third speckle ellipticity threshold, it is determined that the right infrared camera module is unqualified.

[0140] Step S210, when it is determined that the left infrared camera module and the right infrared camera module are both qualified, the speckle area average and the speckle ellipticity average of the second zero-level region speckle points and the speckle area average and the speckle ellipticity average of the third zero-level region speckle points are compared to determine whether the left infrared camera module and the right infrared camera module meet the secondary qualification.

[0141] In the embodiment of the application, if it is determined that the left infrared camera module is qualified based on the second preset specification, and it is determined that the right infrared camera module is qualified based on the third preset specification, the speckle area average and the speckle ellipticity average of the second zero-level region speckle points and the speckle area average and the speckle ellipticity average of the third zero-level region speckle points need to be further compared to determine whether the left infrared camera module and the right infrared camera module meet the secondary qualification.

[0142] Reference Figure 10 , Figure 10 is a flowchart provided by the embodiment of the application for determining whether the left infrared camera module and the right infrared camera module meet the secondary qualification, including but not limited to steps S1001 to S1006.

[0143] Step S1001, a first value is calculated, the first value being an absolute value of the difference between the speckle area average of the second zero-level region speckle points and the speckle area average of the third zero-level region speckle points;

[0144] Step S1002, it is determined whether the first value is greater than a first preset threshold;

[0145] Step S1003, if the first value is not greater than the first preset threshold, a second value is calculated, the second value being an absolute value of the difference between the speckle ellipticity average of the second zero-level region speckle points and the speckle ellipticity average of the third zero-level region speckle points;

[0146] In step S1004, it is judged whether the second value is greater than a second preset threshold value.

[0147] In step S1005, if the second value is not greater than the second preset threshold value, it is determined that the left infrared camera module and the right infrared camera module meet the secondary qualification.

[0148] In step S1006, if the first value is greater than the first preset threshold value, or the second value is greater than the second preset threshold value, it is determined that the left infrared camera module and the right infrared camera module do not meet the secondary qualification.

[0149] In the embodiment of the present application, when the absolute value of the difference between the average speckle area of the speckle points in the second zero-level region and the average speckle area of the speckle points in the third zero-level region is not greater than the first preset threshold value, and the absolute value of the difference between the average speckle ellipticity of the speckle points in the second zero-level region and the average speckle ellipticity of the speckle points in the third zero-level region is not greater than the second preset threshold value, it is determined that the left infrared camera module and the right infrared camera module meet the secondary qualification. When the absolute value of the difference between the average speckle area of the speckle points in the second zero-level region and the average speckle area of the speckle points in the third zero-level region is greater than the first preset threshold value, or the absolute value of the difference between the average speckle ellipticity of the speckle points in the second zero-level region and the average speckle ellipticity of the speckle points in the third zero-level region is greater than the second preset threshold value, it is determined that the left infrared camera module and the right infrared camera module do not meet the secondary qualification.

[0150] In the embodiment of the present application, when it is judged that the camera module is defective based on the speckle ellipticity, that is, the average speckle ellipticity is less than a preset threshold value, for example, when the average speckle ellipticity is less than 0.7, the elliptical direction of each speckle point in the central region of the speckle image can be further calculated, and then the average of the elliptical directions is obtained, wherein the elliptical direction is the angle between the major axis of the ellipse and the X direction of the image. This can help subsequent recombination, repair and other work of the defective module. For example, the average of the elliptical directions corresponding to the defective module is θ, and the elliptical direction corresponding to the good module is α based on the pre-test, at this time, the assembly angle of the defective module or the tilt angle between the lens and the photosensitive chip can be adjusted, so that the average of the elliptical directions θ can gradually approach α. That is, data reference and guidance can be provided for subsequent repair of the defective module. For reference Figure 11 , Figure 11 is an example of data of each speckle point collected by the unqualified camera module provided in the embodiment of the present application.

[0151] The embodiments described in the embodiments of the present application are for more clearly illustrating the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided by the embodiments of the present application. Those skilled in the art can know that, with the evolution of technology and the appearance of new application scenarios, the technical solutions provided by the embodiments of the present application are also applicable to similar technical problems.

[0152] Those skilled in the art can understand that the technical solutions shown in the figures do not constitute a limitation to the embodiments of the present application, and can include more or fewer steps than the figures, or combine certain steps, or different steps.

[0153] The apparatus embodiments described above are merely illustrative, and units described as separate components can or can not be physically separate, i.e., can be located in one place, or can be distributed to multiple network units. Part or all of the modules can be selected according to actual needs to achieve the purpose of the embodiments.

[0154] Those skilled in the art can understand that all or some of the steps in the above disclosed method, the functions of the modules / units in the system and the device can be implemented as software, firmware, hardware and their appropriate combinations.

[0155] The terms "first", "second", "third", "fourth" and the like in the description of the present application and the above-described figures (if any) are used to distinguish similar objects, and do not necessarily have to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0156] It should be understood that in the present application, "at least one" means one or more, and "multiple" means two or more. "And / or" is used to describe the relationship between the associated objects, which means that there can be three relationships, for example, "A and / or B" can mean that there are three cases: only A, only B, and A and B at the same time, where A and B can be singular or plural. The character " / " generally represents an "or" relationship between the associated objects. "At least one of the following" or similar expressions means any combination of these items, including any combination of single or multiple items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0157] In several embodiments provided in the present application, it should be understood that the disclosed apparatus and method can be implemented in other manners. For example, the described apparatus embodiments are merely schematic. The division of the units is merely logical function division. There can be another division manner for the actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interfaces, devices or units, and can be in electrical, mechanical or other forms.

[0158] The units described as separate components can or can not be physically separate, and the components shown as units can or can not be physical units, that is, can be located in one place, or can be distributed on multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the embodiments of the present application.

[0159] The preferred embodiments of the present application are described above with reference to the accompanying drawings, and the scope of the present application is not limited thereto. Any modification, equivalent replacement and improvement made by those skilled in the art without departing from the scope and spirit of the present application shall fall within the scope of the present application.

Claims

1. A detection method for a binocular structured light camera module, characterized in that, Based on the execution of the detection device, the detection device includes: The first fixing device includes a substrate support and a left infrared camera module, a speckle projection module and a right infrared camera module mounted on the substrate support according to a preset baseline. The speckle projection module is located at the center of the left infrared camera module and the right infrared camera module. A standard infrared camera module is fixed vertically above the speckle projection module at a specific distance. An optical processing device is horizontally positioned at the center line between the standard infrared camera module and the speckle projection module, and is used to partially reflect and partially transmit the light beam projected by the speckle projection module. The left infrared camera module, the right infrared camera module, and the standard infrared camera module have the same structure. The detection method includes: The binocular structured light camera module to be tested is installed at the corresponding position of the testing device. The binocular structured light camera module includes a left infrared camera module, a speckle projection module, and a right infrared camera module. The camera module acquires speckle images projected by the speckle projection module and extracts zero-order region speckles, which are all speckles in the central region of the speckle image. The camera module includes the standard infrared camera module, the left infrared camera module, and the right infrared camera module. The mean speckle area and mean speckle ellipticity of the speckle in the zero-order region were calculated respectively. The binocular structured light camera module is qualified based on the average speckle area and average speckle ellipticity of the speckles in the zero-order region and the corresponding preset specifications. The preset specifications include speckle area threshold and speckle ellipticity threshold. Once it is determined that both the left infrared camera module and the right infrared camera module are qualified, the first array and the second array are compared to determine whether the left infrared camera module and the right infrared camera module meet the second qualification requirement. The first array includes the average speckle area and the average speckle ellipticity of the speckle in the zero-order region corresponding to the left infrared camera module, and the second array includes the average speckle area and the average speckle ellipticity of the speckle in the zero-order region corresponding to the right infrared camera module.

2. The method according to claim 1, characterized in that, The detection method includes: The first speckle image projected by the speckle projection module is acquired by the standard infrared camera module, and the first zero-order region speckle points are extracted. The first zero-order region speckle points are all speckle points in the central region of the first speckle image. The average speckle area and average speckle ellipticity of the speckle in the first zero-order region were calculated. The speckle projection module is deemed qualified based on the average speckle area and average speckle ellipticity of the speckle in the first zero-level region and the first preset specification. The first preset specification includes a first speckle area threshold and a first speckle ellipticity threshold. The left infrared camera module acquires the second speckle image projected by the speckle projection module, and extracts the second zero-order region speckle, which is all the speckle in the central region of the second speckle image. The average speckle area and average speckle ellipticity of the speckle in the second zero-order region were calculated. The left infrared camera module is deemed qualified based on the average speckle area and average speckle ellipticity of the second zero-level region speckle and the second preset specification. The second preset specification includes a second speckle area threshold and a second speckle ellipticity threshold. The third speckle image projected by the speckle projection module is acquired by the right infrared camera module, and the third zero-order region speckle points are extracted. The third zero-order region speckle points are all the speckle points in the central region of the third speckle image. The average speckle area and average speckle ellipticity of the speckle in the third zero-order region were calculated. The right infrared camera module is deemed qualified based on the average speckle area and average speckle ellipticity of the speckle in the third zero-level region and the third preset specification. The third preset specification includes the third speckle area threshold and the third speckle ellipticity threshold. Once it is determined that both the left infrared camera module and the right infrared camera module are qualified, the average speckle area and average speckle ellipticity of the second zero-level region speckle are compared with the average speckle area and average speckle ellipticity of the third zero-level region speckle to determine whether the left infrared camera module and the right infrared camera module meet the second qualification requirement.

3. The method according to claim 2, characterized in that, The calculation of the average speckle area and average speckle ellipticity of the first zero-order region includes: Extract the first zero-level region, which is the central region of the first speckle image; The first zero-level region is processed to identify all speckles within the first zero-level region; Calculate the speckle area and speckle ellipticity of each speckle in the first zero-order region; The average speckle area of ​​the speckle spots in the first zero-level region is calculated based on the speckle area of ​​each speckle spot in the first zero-level region. The average speckle ellipticity of the speckle spots in the first zero-order region is calculated based on the speckle ellipticity of each speckle spot in the first zero-order region.

4. The method according to claim 2, characterized in that, The step of determining whether the speckle projection module is qualified based on the average speckle area and average speckle ellipticity of the first zero-level region speckle and the first preset specification includes: When the average speckle area of ​​the first zero-order region speckle is not greater than the first speckle area threshold, and the average speckle ellipticity of the first zero-order region speckle is not less than the first speckle ellipticity threshold, the speckle projection mode is determined to be qualified. When the average speckle area of ​​the first zero-order region speckle is greater than the first speckle area threshold, or the average speckle ellipticity of the first zero-order region speckle is less than the first speckle ellipticity threshold, the speckle projection module is determined to be unqualified.

5. The method according to claim 2, characterized in that, The step of determining whether the speckle projection module is qualified based on the average speckle area and average speckle ellipticity of the first zero-level region speckle and the first preset specification includes: The average speckle area of ​​the speckle in the first zero-order region is compared with the first speckle area threshold. If the average speckle area of ​​the speckle in the first zero-level region is greater than the first speckle area threshold, the speckle projection module is deemed unqualified. If the average speckle area of ​​the speckle in the first zero-order region is not greater than the first speckle area threshold, then the average speckle ellipticity of the speckle in the first zero-order region is compared with the first speckle ellipticity threshold. If the average speckle ellipticity of the speckles in the first zero-order region is not less than the first speckle ellipticity threshold, then the speckle projection module is determined to be qualified; if the average speckle ellipticity of the speckles in the first zero-order region is less than the first speckle ellipticity threshold, then the speckle projection module is determined to be unqualified.

6. The method according to claim 2, characterized in that, The step of determining whether the left infrared camera module is qualified based on the average speckle area and average speckle ellipticity of the second zero-level region speckle and the second preset specification includes: When the average speckle area of ​​the second zero-order region speckle is not greater than the second speckle area threshold, and the average speckle ellipticity of the second zero-order region speckle is not less than the second speckle ellipticity threshold, the left infrared camera module is determined to be qualified. When the average speckle area of ​​the second zero-order region speckles is greater than the second speckle area threshold, or the average speckle ellipticity of the second zero-order region speckles is less than the second speckle ellipticity threshold, the left infrared camera module is determined to be unqualified.

7. The method according to claim 2, characterized in that, The step of determining whether the right infrared camera module is qualified based on the average speckle area and average speckle ellipticity of the third zero-level region speckle and the third preset specification includes: When the average speckle area of ​​the third zero-order region speckles is not greater than the third speckle area threshold, and the average speckle ellipticity of the third zero-order region speckles is not less than the third speckle ellipticity threshold, the right infrared camera module is determined to be qualified. When the average speckle area of ​​the speckle in the third zero-level region is greater than the third speckle area threshold, or the average speckle ellipticity of the speckle in the third zero-level region is less than the third speckle ellipticity threshold, the right infrared camera module is determined to be unqualified.

8. The method according to claim 2, characterized in that, Determining whether the left infrared camera module and the right infrared camera module meet the secondary qualification requirements includes: When the absolute value of the difference between the average speckle area of ​​the second zero-level region speckle and the average speckle area of ​​the third zero-level region speckle is not greater than the first preset threshold, and the absolute value of the difference between the average speckle ellipticity of the second zero-level region speckle and the average speckle ellipticity of the third zero-level region speckle is not greater than the second preset threshold, the left infrared camera module and the right infrared camera module are determined to meet the second qualification requirement. When the absolute value of the difference between the average speckle area of ​​the second zero-level region speckle and the average speckle area of ​​the third zero-level region speckle is greater than a first preset threshold, or the absolute value of the difference between the average speckle ellipticity of the second zero-level region speckle and the average speckle ellipticity of the third zero-level region speckle is greater than a second preset threshold, it is determined that the left infrared camera module and the right infrared camera module do not meet the second qualification requirement.

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