Display device

Abstract

The present disclosure provides a display device that detects defective sub-pixels and performs repair by using an electronic fuse electrically connected to a driving transistor provided on the sub-pixels, and the display device can detect and repair defects through the circuit driving of the sub-pixels. Therefore, even in a case where physical repair is impossible depending on the type of the display device, by detecting the defects of the sub-pixels and performing repair, it is possible to prevent image quality degradation caused by the defects of the sub-pixels.

Description

[0001] Cross - reference to related applications

[0002] This application claims priority to Korean Patent Application No. 10 - 2021 - 0120748, filed on September 10, 2021, the entire contents of which are incorporated herein by reference. Technical field

[0003] The present disclosure relates to a display device. Background art

[0004] The development of the information society has led to an increased demand for display devices for displaying images and the use of various types of display devices (e.g., liquid crystal display devices, organic light - emitting display devices, etc.).

[0005] A display device includes a display panel in which a plurality of sub - pixels are provided and various driving circuits for driving the plurality of sub - pixels.

[0006] Some of the plurality of sub - pixels provided in the display panel may be defective during the manufacturing process or the driving process.

[0007] In the case of sub - pixels having defects among the sub - pixels provided in the display panel, the image quality of the display panel may deteriorate. Therefore, a method for preventing image quality deterioration due to the appearance of defective sub - pixels is required. Summary of the invention

[0008] Accordingly, the present disclosure provides a display device capable of easily detecting and repairing defects of sub - pixels provided in a display panel and preventing image quality deterioration due to defects of the sub - pixels.

[0009] Other features and advantages of the present disclosure will be clarified in the following description and will become partially apparent from the description, or may be learned through the practice of the present disclosure. Other advantages of the present disclosure will be achieved and obtained by the structures particularly pointed out in the written description and its claims and the drawings.

[0010] To achieve these and other advantages, and in accordance with the present disclosure, as embodied and broadly described, a display device includes: a plurality of sub - pixels provided on an active area of a display panel; and an element provided on each of the plurality of sub - pixels, the element including: a light - emitting element including a first electrode and a second electrode; a driving transistor configured to control a driving current supplied to the light - emitting element; and an electronic fuse electrically connected between the driving transistor and the first electrode of the light - emitting element.

[0011] In another aspect of the present disclosure, a display device includes: a plurality of sub-pixels disposed on an active area of a display panel; and elements disposed on each of the plurality of sub-pixels, the elements including: a light-emitting element; a driving transistor configured to control a driving current supplied to the light-emitting element; a capacitor including a first capacitor electrode electrically connected to a gate node of the driving transistor and a second capacitor electrode electrically connected to a source node of the driving transistor; and an electronic fuse electrically connected to the gate node of the driving transistor.

[0012] In yet another aspect of the present disclosure, a display device includes: a first sub-pixel including a first light-emitting element, a first driving transistor configured to drive the first light-emitting element, and a first electronic fuse electrically connected to the first driving transistor; and a second sub-pixel including a second light-emitting element, a second driving transistor configured to drive the second light-emitting element, and a second electronic fuse electrically connected to the second driving transistor and disconnected, wherein an anode electrode of the second light-emitting element is insulated from an anode electrode of the first light-emitting element.

[0013] According to various aspects of the present disclosure, by using an electronic fuse connected to a driving transistor disposed on a sub-pixel, repair of a defective sub-pixel can be easily performed, and a decrease in image quality due to defects in the sub-pixel that occur in a manufacturing process or a driving process can be prevented.

[0014] It should be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the claimed disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above and other features and advantages of the present disclosure will be more clearly understood from the following detailed description when taken in conjunction with the accompanying drawings, in which:

[0016] Figure 1 is a diagram schematically showing a configuration of a display device according to aspects of the present disclosure;

[0017] Figure 2 is a diagram showing an example of a circuit structure of a sub-pixel included in a display device according to aspects of the present disclosure;

[0018] Figure 3 is a diagram showing another example of a circuit structure of a sub-pixel included in a display device according to aspects of the present disclosure;

[0019] Figures 4 to 6 is a diagram showing the execution of Figure 3 an example of a method for repairing the sub-pixel shown in;

[0020] Figure 7 is a diagram showing the inclusion of Figure 3A diagram showing an example of a cross-sectional structure of a display panel of sub-pixels shown therein;

[0021] Figure 8 A diagram showing another example of a circuit structure of sub-pixels included in a display device according to aspects of the present disclosure;

[0022] Figures 9 to 11 A diagram showing the execution of Figure 8 An example of a method for repairing sub-pixels shown therein; and

[0023] Figure 12 A diagram showing an example of a cross-sectional structure of a display panel including sub-pixels shown therein. Figure 8 Detailed Description

[0024] In the following description of examples or aspects of the present disclosure, reference will be made to the accompanying drawings, in which specific examples or aspects that can be implemented are shown by way of illustration, and in the accompanying drawings, the same reference numerals and symbols may be used to represent the same or similar components, even when these components are shown in different drawings. Further, in the following description of examples or aspects of the present disclosure, when it is determined that a detailed description of well-known functions and components incorporated herein may make the subject matter in some aspects of the present disclosure rather unclear, the detailed description will be omitted. Terms such as "comprising", "having", "including", "constituting", "consisting of", and "formed of" used herein are generally intended to allow the addition of other components, unless these terms are used together with the term "only". As used herein, the singular form is intended to include the plural form, unless the context clearly indicates otherwise.

[0025] Terms such as "first", "second", "A", "B", "(A)", or "(B)" may be used herein to describe elements of the present disclosure. Each of these terms does not define the essence, order, sequence, number, etc. of the element, but is only used to distinguish the corresponding element from other elements.

[0026] When it is mentioned that a first element is "connected or coupled to" a second element, "contacts or overlaps" with the second element, etc., it should be interpreted that the first element can not only be "directly connected or coupled to" the second element or "directly contact or overlap" with the second element, but also a third element can be "disposed" between the first element and the second element, or the first element and the second element can be "connected or coupled", "contact or overlap", etc. with each other via a fourth element. Herein, the second element may be included in at least one of two or more elements that are "connected or coupled", "contact or overlap", etc. with each other.

[0027] When time-related terms such as "after", "subsequently", "next", "before", etc. are used to describe the processing or operation of components or configurations, or the processes or steps in an operation, processing, or manufacturing method, these terms can be used to describe non-consecutive or non-sequential processing or operations, unless used in conjunction with the terms "directly" or "immediately".

[0028] In addition, when referring to any dimensions, relative sizes, etc., it should be considered that the numerical values or corresponding information of components or features (e.g., levels, ranges, etc.) include the tolerance or error ranges that may be caused by various factors (e.g., processing factors, internal or external influences, noise, etc.), even if the relevant descriptions are not specifically stated. Furthermore, the term "may" fully encompasses all the meanings of the term "able to".

[0029] Hereinafter, various aspects of the present disclosure will be described in detail with reference to the accompanying drawings.

[0030] Figure 1 is a diagram schematically showing the configuration of a display device 100 according to various aspects of the present disclosure. All components of the display device 100 according to the present disclosure are operably coupled and configured.

[0031] Referring to Figure 1 , the display device 100 may include a display panel 110, a gate driving circuit 120, a data driving circuit 130, and a controller 140 for driving the display panel 110.

[0032] The display panel 110 may include an active area AA in which a plurality of sub-pixels SP are provided and a non-active area NA located outside the active area AA.

[0033] A plurality of gate lines GL and a plurality of data lines DL may be arranged on the display panel 110. A plurality of sub-pixels SP may be located in the area where the gate lines GL and the data lines DL cross each other.

[0034] The gate driving circuit 120 is controlled by the controller 140 and sequentially outputs scan signals to the plurality of gate lines GL arranged on the display panel 110, thereby controlling the driving timing of the plurality of sub-pixels SP.

[0035] The gate driving circuit 120 may include one or more gate driver integrated circuits GDIC, and may be located only on one side of the display panel 110 or on both sides of the display panel 110 according to the driving method.

[0036] Each gate driver integrated circuit GDIC can be connected to the bonding pads of the display panel 110 by a tape automated bonding (TAB) method or a chip-on-glass (COG) method. Alternatively, each gate driver integrated circuit GDIC can be implemented by an in-panel gate (GIP) method to be directly disposed on the display panel 110. Alternatively, the gate driver integrated circuit GDIC can be integrated and disposed on the display panel 110. Alternatively, each gate driver integrated circuit GDIC can be implemented by a chip-on-film (COF) method in which components are mounted on a film connected to the display panel 110.

[0037] The data driving circuit 130 receives image data from the controller 140 and converts the image data into an analog data voltage. Then, the data driving circuit 130 outputs the data voltage to each data line DL according to the timing of applying a scanning signal through the gate line GL, such that each sub-pixel SP among the plurality of sub-pixels SP emits light having a luminance according to the image data.

[0038] The data driving circuit 130 may include one or more source driver integrated circuits SDICs.

[0039] Each source driver integrated circuit SDIC may include a shift register, a latch circuit, a digital-to-analog converter, an output buffer, etc.

[0040] Each source driver integrated circuit SDIC can be connected to the bonding pads of the display panel 110 by a tape automated bonding (TAB) method or a chip-on-glass (COG) method. Alternatively, each source driver integrated circuit SDIC can be directly disposed on the display panel 110. Alternatively, the source driver integrated circuit SDIC can be integrated and disposed on the display panel 110. Alternatively, each source driver integrated circuit SDIC can be implemented by a chip-on-film (COF) method. In this case, each source driver integrated circuit SDIC can be mounted on a film connected to the display panel 110 and can be electrically connected to the display panel 110 through wires on the film.

[0041] The controller 140 can supply various control signals to the gate driving circuit 120 and the data driving circuit 130 and can control the operations of the gate driving circuit 120 and the data driving circuit 130.

[0042] The controller 140 can be mounted on a printed circuit board, a flexible printed circuit, etc., and can be electrically connected to the gate driving circuit 120 and the data driving circuit 130 through a printed circuit board, a flexible printed circuit, etc.

[0043] The controller 140 may allow the gate driving circuit 120 to output a scan signal according to the timing implemented per frame. The controller 140 may convert the data signal received from the outside into a data signal format used in the data driving circuit 130, and then output the converted image data to the data driving circuit 130.

[0044] The controller 140 receives various timing signals including a vertical synchronization signal VSYNC, a horizontal synchronization signal HSYNC, an input data enable DE signal, a clock signal CLK, etc., and image data from the outside (e.g., a host system).

[0045] The controller 140 may generate various control signals using the various timing signals received from the outside, and may output the control signals to the gate driving circuit 120 and the data driving circuit 130.

[0046] For example, in order to control the gate driving circuit 120, the controller 140 may output various gate control signals GCS including a gate start pulse GSP, a gate shift clock GSC, a gate output enable signal GOE, etc.

[0047] The gate start pulse GSP controls the operation start timing of one or more gate driver integrated circuits GDICs constituting the gate driving circuit 120. The gate shift clock GSC, which is a clock signal commonly input to one or more gate driver integrated circuits GDICs, controls the shift timing of the scan signal. The gate output enable signal GOE specifies the timing information regarding one or more gate driver integrated circuits GDICs.

[0048] In addition, in order to control the data driving circuit 130, the controller 140 may output various data control signals DCS including a source start pulse SSP, a source sampling clock SSC, a source output enable signal SOE, etc.

[0049] The source start pulse SSP controls the data sampling start timing of one or more source driver integrated circuits SDICs constituting the data driving circuit 130. The source sampling clock SSC is a clock signal for controlling the timing of the sampled data in each source driver integrated circuit SDIC. The source output enable signal SOE controls the output timing of the data driving circuit 130.

[0050] The display device 100 may further include a power management integrated circuit for supplying various voltages or currents to the display panel 110, the gate driving circuit 120, the data driving circuit 130, etc. or controlling the various voltages or currents to be supplied thereto.

[0051] Each sub-pixel SP may be an area defined by the intersection of a gate line GL and a data line DL, and at least one circuit element including an element that emits light may be provided on the sub-pixel SP.

[0052] For example, in the case where the display device 100 is an organic light-emitting display device, an organic light-emitting diode OLED and various circuit elements may be provided on the plurality of sub-pixels SP. By controlling the current supplied to the organic light-emitting diode OLED by the various circuit elements, each sub-pixel may represent a luminance corresponding to the image data.

[0053] Alternatively, in some cases, a light-emitting diode LED or a micro light-emitting diode μLED may be provided on the sub-pixel SP.

[0054] Figure 2 FIG. is a diagram showing an example of a circuit structure of a sub-pixel SP included in a display device 100 according to aspects of the present disclosure.

[0055] Referring to Figure 2 , a light-emitting element ED and a driving transistor DRT for driving the light-emitting element ED may be provided on the sub-pixel SP. In addition, at least one circuit element other than the light-emitting element ED and the driving transistor DRT may be provided on the sub-pixel SP.

[0056] For example, such as Figure 2 in the example shown, a first switching transistor SWT1, a second switching transistor SWT2, and a storage capacitor Cstg may also be provided on the sub-pixel SP.

[0057] Figure 2 The example shown in FIG. exemplarily shows a 3T1C structure in which three thin-film transistors and one capacitor other than the light-emitting element ED are provided on the sub-pixel SP, but the aspects of the present disclosure are not limited thereto. In addition, Figure 2 The example shown in FIG. exemplarily shows the case where all the thin-film transistors are N-type, but in some cases, the thin-film transistors provided on the sub-pixel SP may be P-type.

[0058] The first switching transistor SWT1 may be electrically connected between the data line DL and the first node N1. A data voltage may be supplied to the sub-pixel SP through the data line DL. The first node N1 may be a gate node of the driving transistor DRT.

[0059] The first switching transistor SWT1 may be controlled by a scan signal supplied to the gate line GL. The first switching transistor SWT1 may be controlled to apply the data voltage supplied through the data line DL to the gate node of the driving transistor DRT.

[0060] The driving transistor DRT can be electrically connected between the line to which the first driving voltage DV1 is applied and the light-emitting element ED. The first driving voltage DV1 can be supplied to the third node N3 of the driving transistor DRT. The first driving voltage DV1 can be a high-potential driving voltage. The third node N3 can be the drain node or the source node of the driving transistor DRT.

[0061] The driving transistor DRT can be controlled by the voltage applied to the first node N1. And the driving transistor DRT can control the driving current supplied to the light-emitting element ED.

[0062] The second switching transistor SWT2 can be electrically connected between the sensing line SL and the second node N2. A reference voltage can be supplied to the second node N2 through the sensing line SL. The second node N2 can be the source node or the drain node of the driving transistor DRT.

[0063] The second switching transistor SWT2 can be controlled by the scan signal supplied to the gate line GL. The gate line GL for controlling the second switching transistor SWT2 can be the same as or different from the gate line GL for controlling the first switching transistor SWT1.

[0064] The second switching transistor SWT2 can be controlled to apply the reference voltage to the second node N2. In addition, in some cases, the second switching transistor SWT2 can be controlled to sense the voltage of the second node N2 through the sensing line SL.

[0065] The storage capacitor Cstg can be electrically connected between the first node N1 and the second node N2. The storage capacitor Cstg can hold the data voltage applied to the first node N1 for one frame.

[0066] The light-emitting element ED can be electrically connected between the second node N2 and the line to which the second driving voltage DV2 is supplied. The second driving voltage DV2 can be a low-potential driving voltage.

[0067] The light-emitting element ED can include a first electrode E1, a second electrode E2, and a light-emitting layer EL provided between the first electrode E1 and the second electrode E2.

[0068] The light-emitting element ED can represent the luminance according to the driving current supplied through the driving transistor DRT.

[0069] As described above, the light-emitting element ED provided on the sub-pixel SP can be controlled by a plurality of circuit elements included in the sub-pixel SP, and can represent the luminance according to the image data.

[0070] In the case where some of a plurality of circuit elements including a light-emitting element ED provided on a sub-pixel SP malfunction, the sub-pixel SP may become a defective state. In such a case, it may not be possible to precisely control the light-emitting element ED provided on the sub-pixel SP, and it may not be possible to represent the luminance corresponding to the image data.

[0071] Aspects of the present disclosure can provide a method that can easily detect and repair a defect of a sub-pixel SP in the case where a defect of the sub-pixel SP occurs, and prevent a degradation in the image quality displayed on the display panel 110 due to the defective sub-pixel SP.

[0072] Figure 3 FIG. is a diagram showing another example of a circuit structure of a sub-pixel SP included in a display device 100 according to aspects of the present disclosure. Figures 4 to 6 FIG. is a diagram showing an example of Figure 3 a method of repairing the sub-pixel SP shown in

[0073] Referring to Figure 3 , the sub-pixel SP may include a driving transistor DRT and a light-emitting element ED, such as Figure 2 the example shown in

[0074] The sub-pixel SP may further include a first switching transistor SWT1, a second switching transistor SWT2, and a storage capacitor Cstg.

[0075] The sub-pixel SP may further include an electronic fuse EF electrically connected to the driving transistor DRT. Figure 3

[0076]

[0077]

[0078] For example, in case A as shown in

[0079] Figure 2 ​​​​In the case of the described normal state, the driving transistor DRT can be controlled by the switching transistors SWT1 and SWT2. The driving current of the driving transistor DRT can pass through the electronic fuse EF and be supplied to the light-emitting element ED. The light-emitting element ED can represent the luminance corresponding to the image data and the image can be displayed.

[0080] In the case where the sub-pixel SP is in a defective state, the light-emitting element ED may not be able to accurately represent the luminance corresponding to the image data.

[0081] In this case, the defective state of the sub-pixel SP can be checked, and repair using the electronic fuse EF provided in the sub-pixel SP can be performed.

[0082] Referring to Figure 4 , it is possible to detect whether the sub-pixel SP is defective in the first period P1. The first period P1 can be referred to as a "sensing period".

[0083] There are various methods to detect whether the sub-pixel SP is defective.

[0084] For example, when the arrangement of the light-emitting element ED on the sub-pixel SP is completed, such as <EX 1>, it can be checked by the naked eye or a camera. It can be performed during the manufacturing process of the display device 100 or during the driving process of the display device 100 according to <ex1>Inspection method.

[0085] Through inspection by a method such as <EX 1>, sub-pixels SP represented as dark spots or bright spots among the sub-pixels SP provided in the display panel 110 can be detected.

[0086] For another example, such as <EX 2>, it is possible to detect whether a sub-pixel SP is defective by a method of supplying a specific data voltage to the sub-pixel SP and sensing current.

[0087] When the layout of circuit elements such as thin film transistors in the display panel 110 is completed, inspection such as <EX 2> can be performed regardless of the layout of the light-emitting element ED. Inspection such as <EX 2> can be performed before or after setting the light-emitting element ED during the processing of the display device 100.

[0088] In addition, inspection such as <EX 2> can be performed during the driving process of the display device 100. In this case, inspection such as <EX 2> can be performed in a state where the power supply of the display device 100 is turned off.

[0089] In the case of detecting a defect of the sub-pixel SP by current sensing such as <EX 2>, a sensing data voltage Vdata_sen can be supplied to the sub-pixel SP through the data line DL. The sensing data voltage Vdata_sen can be applied to the first node N1 which is the gate node of the driving transistor DRT.

[0090] The sensing data voltage Vdata_sen can be a voltage of a specific level configured to detect whether the sub-pixel SP is defective. The sensing data voltage Vdata_sen can be a voltage included within the range of the data voltage supplied through the data line DL during display driving.

[0091] In the first period P1, a voltage lower than the sensing data voltage Vdata_sen can be supplied to the second node N2 which is the source node of the driving transistor DRT. The voltage supplied to the second node N2 can be 0V. The voltage supplied to the second node N2 can be a reference voltage.

[0092] The second electrode E2 of the light-emitting element ED can be floated in the first period P1. In the first period P1, it may not be possible to supply the second driving voltage DV2 to the second electrode E2 of the light-emitting element ED.

[0093] Since the sensing data voltage Vdata_sen is applied to the first node N1 of the driving transistor DRT and a voltage lower than the sensing data voltage Vdata_sen is applied to the second node N2 in the first period, a sensing current Current_sen can flow through the driving transistor DRT.

[0094] The sensing current Current_sen can be detected through the sensing line SL.

[0095] The sensing current Current_sen can be detected through the sensing line SL by an analog-to-digital converter provided in the data driving circuit 130 or a circuit provided separately from the data driving circuit 130.

[0096] The display device 100 can check whether the sub-pixel SP is defective according to the sensing current Current_sen detected through the sensing line SL in the first period P1.

[0097] Checking whether the sub-pixel SP is defective can be performed by the controller 140, but is not limited thereto.

[0098] When the sensing current Current_sen is included within a predetermined range, the display device 100 can determine that the sub-pixel SP is defective. The predetermined range may refer to a range deviating from the normal range of the sensing current Current_sen. For example, the predetermined range may refer to a range less than the minimum limit value or greater than the upper limit value.

[0099] When the sensing current Current_sen is included within a predetermined range, the display device 100 can determine whether the sub-pixel SP is a dark point defect or a bright point defect.

[0100] When a defective sub-pixel SP is detected, the display device 100 can perform an operation for repairing the sub-pixel SP.

[0101] Refer to Figure 5 , and the operation for repairing the defective sub-pixel SP can be performed in the second period P2. The second period P2 may be referred to as the "repair period".

[0102] The repair data voltage Vdata_rep can be supplied to the data line DL in the second period P2. The repair data voltage Vdata_rep can be applied to the first node N1 of the driving transistor DRT.

[0103] The repair data voltage Vdata_rep can be a voltage higher than the sensing data voltage Vdata_sen. The repair data voltage Vdata_rep can be a voltage deviating from the range of the data voltage supplied to the sub-pixel SP during display driving. For example, the repair data voltage Vdata_rep can be a voltage with a level greater than the upper limit value of the data voltage supplied during display driving.

[0104] In the second period P2, a voltage lower than the repair data voltage Vdata_rep may be supplied to the second node N2 of the driving transistor DRT. The voltage supplied to the second node N2 may be 0V and may be a reference voltage.

[0105] The second electrode E2 of the light-emitting element ED may be floating in the second period P2.

[0106] Since voltages are applied to the first node N1 and the second node N2 of the driving transistor DRT, a repair current Current_rep may flow through the driving transistor DRT in the second period P2.

[0107] The repair current Current_rep may pass through the driving transistor DRT and the electronic fuse EF and flow through the sensing line SL.

[0108] Since the repair data voltage Vdata_rep, which is a high voltage, is applied to the first node N1, which is the gate node of the driving transistor DRT, the repair current Current_rep flowing to the sub-pixel SP may be a high current.

[0109] The repair current Current_rep may be a current capable of disconnecting the electronic fuse EF provided in the sub-pixel SP. The repair data voltage Vdata_rep may be configured to be a voltage level that causes the repair current Current_rep to flow to disconnect the electronic fuse EF.

[0110] Since the repair current Current_rep, which is a high current, flows through the electronic fuse EF, the electronic fuse EF may be disconnected in the second period P2.

[0111] In the second period, due to the disconnection of the electronic fuse EF, such as the part indicated by 501, a disconnection part between the driving transistor DRT and the light-emitting element ED appears. The sub-pixel SP becomes darker.

[0112] As described above, the repair of the defective sub-pixel SP can be performed by dimming in the repair period.

[0113] Alternatively, in some cases, it may not be possible to perform the operation of dimming the defective sub-pixel SP in the repair period.

[0114] For example, the sensing current Current_sen detected in the first period P1 may be less than a predetermined value. The predetermined value may be a value less than the lowest limit value of a predetermined range, and the predetermined range is a reference for determining whether the sub-pixel SP is defective. In this case, the repair data voltage Vdata_rep is not supplied to the sub-pixel SP in the second period P2.

[0115] If the sensed current Current_sen detected in the first period P1 is less than a predetermined value, it can be seen that the sub-pixel SP has darkened. Therefore, it may not be possible to perform an operation for repairing the sub-pixel SP in the second period P2.

[0116] When the repair of the sub-pixel SP is completed through the above process, driving for compensating the repaired sub-pixel SP can be performed during display driving.

[0117] Referring to Figure 6 , an example of a method for driving the repaired sub-pixel SP_rep and sub-pixels SP1, SP2, SP3 located around the repaired sub-pixel SP_rep in the third period P3 is shown. The third period P3 can be referred to as a "display driving period".

[0118] Since the repaired sub-pixel SP_rep is in a darkened state, the repaired sub-pixel SP_rep may not be driven in the third period P3.

[0119] In the third period P3, the driving current flowing through the driving transistor DRT of at least one sub-pixel SP located around the repaired sub-pixel SP can be increased.

[0120] For example, the compensation data voltage Vdata_comp can be supplied to the first sub-pixel SP1 and the second sub-pixel SP2 adjacent to the repaired sub-pixel SP_rep through the data line DL. The reference voltage Vref can be supplied to the first sub-pixel SP1 and the second sub-pixel SP2 through the sense line SL.

[0121] The first sub-pixel SP1 and the second sub-pixel SP2 can be sub-pixels SP representing the same color as the color represented by the repaired sub-pixel SP_rep. The compensation data voltage Vdata_comp can be a voltage greater than the voltage corresponding to the image data of the first sub-pixel SP1 and the second sub-pixel SP2.

[0122] Since the compensation data voltage Vdata_comp is supplied to the first sub-pixel SP1 and the second sub-pixel SP2 in the third period P3, the compensation driving current Current_drv_comp flowing through the driving transistors DRT provided on the first sub-pixel SP1 and the second sub-pixel SP2 can be a current higher than the driving current corresponding to the image data.

[0123] For example, the compensation driving current Current_drv_comp can be a current 1.5 times the current corresponding to the luminance of the image data according to the first sub-pixel SP1 and the second sub-pixel SP2, but is not limited thereto.

[0124] Since the compensation driving current Current_drv_comp is supplied to the first sub-pixel SP1 and the second sub-pixel SP2 located around the repair sub-pixel SP_rep, the brightness represented by the first sub-pixel SP1 and the second sub-pixel SP2 can be increased.

[0125] Compensation for the already darkened repair sub-pixel SP_rep can be performed based on the brightness represented by the first sub-pixel SP1 and the second sub-pixel SP2.

[0126] Among the sub-pixels SP located around the repair sub-pixel SP_rep, there may be sub-pixels SP to which the compensation driving current Current_drv_comp is not supplied.

[0127] For example, in the third period P3, a normal data voltage Vdata_nor can be supplied to the third sub-pixel SP3 through the data line DL. The reference voltage Vref can be supplied to the third sub-pixel SP3 through the sense line SL.

[0128] The third sub-pixel SP3 can be a sub-pixel SP that represents a color different from the color represented by the repair sub-pixel SP_rep.

[0129] Due to the supply of the normal data voltage Vdata_nor, a normal driving current Current_drv_nor can flow through the driving transistor DRT provided on the third sub-pixel SP3. The third sub-pixel SP3 can represent the brightness corresponding to the image data.

[0130] As described above, since the compensation driving current Current_drv_comp or the normal driving current Current_drv_nor can flow through the driving transistor DRT in the sub-pixel SP according to the color represented by the sub-pixel SP among the sub-pixels SP located around the repair sub-pixel SP_rep, the brightness drop caused by the repair sub-pixel SP_rep can be compensated.

[0131] The light-emitting element ED and the driving transistor DRT provided on the first sub-pixel SP1 and the second sub-pixel SP2 to which the compensation driving current Current_drv_comp is supplied can be in a state insulated from the light-emitting element ED provided on the repair sub-pixel SP_rep.

[0132] For example, the first electrode E1, which is the anode electrode of the light-emitting element ED provided on the repair sub-pixel SP_rep, can be in a state insulated from the anode electrode of the light-emitting element ED provided on the first sub-pixel SP1 and the anode electrode of the light-emitting element ED provided on the second sub-pixel SP2. Since the repair sub-pixel SP_rep is dimmed and no electrical connection to adjacent sub-pixels SP is required, the repair can be performed only by driving the sub-pixel SP.

[0133] Therefore, the display panel 110 according to aspects of the present disclosure can include a structure in which a sub-pixel SP having a disconnected electronic fuse EF provided thereon and a sub-pixel SP having an undisconnected electronic fuse EF provided thereon are placed adjacent to each other, and the light-emitting elements in the two sub-pixels SP are not electrically connected to each other.

[0134] Compensation can be performed in a case where the circuit elements provided on the repair sub-pixel SP_rep are not electrically connected to the circuit elements provided on the adjacent sub-pixels SP. During the process of repairing the repair sub-pixel SP_rep, a physical repair process may not be required.

[0135] Since the repair and compensation of the sub-pixel SP are performed by a method of driving the circuit of the sub-pixel SP, sensing and repairing of defects in the sub-pixel SP can be performed more easily.

[0136] Figure 7 is a diagram showing Figure 3 an example of a cross-sectional structure of the display panel 110 including the sub-pixel SP shown in. For ease of description, Figure 7 only some of the circuit elements provided on the sub-pixel SP are shown.

[0137] Referring to Figure 7 , Figure 7 an example of a cross-sectional structure of a red sub-pixel SP_R, a green sub-pixel SP_G, and a blue sub-pixel SP_B is shown. The first region A1 shows a portion where a circuit unit including a thin-film transistor and a capacitor, etc. is provided. The second region A2 shows a portion where the first electrode E1 constituting the light-emitting element ED is provided.

[0138] The driving transistor DRT can be provided on the substrate SUB. For example, the substrate SUB can be an opaque substrate. Alternatively, the substrate SUB can be a substrate with a low transmittance. The substrate SUB can be a substrate made of silicon. Since aspects of the present disclosure perform the repair of the sub-pixel SP by circuit driving, they can also be applied to a display device 100 including a substrate SUB that cannot be repaired by physical methods.

[0139] The driving transistor DRT can include a gate electrode GE, a source node S, and a drain node D. A gate insulating layer GI can be provided between the gate electrode GE and the substrate SUB.

[0140] To form a circuit unit for a sub-pixel SP, a plurality of metal layers M can be provided on a driving transistor DRT in a first region A1. An interlayer insulating layer ILD can be provided between different metal layers M. A via Via can be formed in the interlayer insulating layer ILD. Different metal layers M can be connected through the via Via. Figure 7 An example shows four metal layers M1, M2, M3, M4, seven interlayer insulating layers ILD1, ILD2, ILD3, ILD4, ILD5, ILD6, ILD7, and five vias Via1, Via2, Via3, Via4, Via5, but aspects of the present disclosure are not limited thereto.

[0141] A first electrode E1 of a light-emitting element ED can be provided in a second region A2. The first electrode E1 can be electrically connected to a source node S of the driving transistor DRT through a plurality of metal layers M. The first electrode E1 can have a microcavity structure for resonating according to the wavelength of light represented by the sub-pixel SP.

[0142] For example, the first electrodes E1_R, E1_G, E1_B provided on each sub-pixel SP_R, SP_G, SP_B can include first portions E1a_R, E1a_G, E1a_B located on a seventh interlayer insulating layer ILD7. The first portions E1a_R, E1a_G, E1a_B of the first electrodes E1_R, E1_G, E1_B can be made of a material with a high transmittance.

[0143] The first electrodes E1_R, E1_G, E1_B can further include second portions E1b_R, E1b_G, E1b_B. The second portions E1b_R, E1b_G, E1b_B of the first electrodes E1_R, E1_G, E1_B can be made of a material with a high reflectivity. For each sub-pixel SP_R, SP_G, SP_B, the second portions E1b_R, E1b_G, E1b_B can be located on different layers.

[0144] For example, the second portion E1b_R of the first electrode E1_R provided on a red sub-pixel SP_R that emits red light with the longest wavelength can be located below a sixth interlayer insulating layer ILD6. The second portion E1b_G of the first electrode E1_G provided on a green sub-pixel SP_G can be located between a sixth interlayer insulating layer ILD6 and a seventh interlayer insulating layer ILD7. The second portion E1b_B of the first electrode E1_B provided on a blue sub-pixel SP_B that emits blue light with the shortest wavelength can be located on the seventh interlayer insulating layer ILD7.

[0145] The first portions E1a_R, E1a_G, E1a_B of the first electrodes E1_R, E1_G, E1_B can be set to have substantially the same area as the second portions E1b_R, E1b_G, E1b_B, which can improve the resonance efficiency of the light emitted from each light-emitting element ED and can improve the light-emitting efficiency.

[0146] Each sub-pixel SP_R, SP_G, SP_B can include an electronic fuse EF for repair.

[0147] The electronic fuse EF can be located on the path where the source node S of the driving transistor DRT is electrically connected to the first electrode E1 of the light-emitting element ED. For example, the electronic fuse EF can be located in at least one of the plurality of through-holes Via1, Via2, Via3, Via4 positioned between the substrate SUB and the fourth metal layer M4. Alternatively, in some cases, the electronic fuse EF can be set by using a part of the metal layer M.

[0148] By arranging the electronic fuse EF when forming the through-hole Via that constitutes the connection between the metal layers M, a structure of the sub-pixel SP that can be easily repaired by circuit driving can be provided.

[0149] Therefore, even in a state where physical repair is impossible after the arrangement of the light-emitting element ED due to circuit elements being provided on the silicon substrate, repair can be performed by circuit driving of the sub-pixel SP.

[0150] In addition, in some cases, the electronic fuse EF can be located on a path other than the path between the source node S of the driving transistor DRT and the first electrode E1 of the light-emitting element ED.

[0151] Aspects of the present disclosure can provide such a structure of the sub-pixel SP: repair can be easily performed by the electronic fuse EF electrically connected to the driving transistor DRT in the sub-pixel SP, and the positions of the electronic fuses EF provided on the sub-pixel SP can be different.

[0152] Figure 8 is a diagram showing still another example of the circuit structure of the sub-pixel SP included in the display device 100 according to aspects of the present disclosure. Figures 9 to 11 is a diagram showing Figure 8 an example of a method of repairing the sub-pixel SP shown in

[0153] Referring to Figure 8 , the same as in case A, the sub-pixel SP according to case B can include a first switching transistor SWT1, a second switching transistor SWT2, a driving transistor DRT, a light-emitting element ED, and a storage capacitor Cstg.

[0154] The sub-pixel SP according to case B may include an electronic fuse EF connected between the driving transistor DRT and the first switching transistor SWT1.

[0155] The electronic fuse EF may be electrically connected to the gate node of the driving transistor DRT. The electronic fuse EF may be electrically connected to the drain node of the first switching transistor SWT1.

[0156] Even when the electronic fuse EF is electrically connected to the gate node of the driving transistor DRT, defect detection and repair of the sub-pixel SP can be performed in a manner similar to that in case A described above.

[0157] Referring to Figure 9 , sensing for detecting defects in the sub-pixel SP can be performed in a first period P1 as a sensing period. Such as <EX 1>, inspection can be performed with the naked eye or a camera. In addition, such as <EX 2>, inspection can be performed by supplying a sensing data voltage Vdata_sen to the sub-pixel SP and detecting a sensing current Current_sen.

[0158] Similar to case A, the sensing data voltage Vdata_sen can be a voltage at an appropriate level for detecting the sensing current Current_sen without disconnecting the electronic fuse EF.

[0159] Referring to Figure 10 , an operation for repairing the sub-pixel SP can be performed in a second period P2 as a repair period.

[0160] The repair data voltage Vdata_rep can be supplied to the defective sub-pixel SP through the data line DL in the second period P2. The second electrode E2 of the light-emitting element ED can be floated in the second period P2.

[0161] The repair data voltage Vdata_rep can be a high-level voltage capable of short-circuiting the storage capacitor Cstg provided on the sub-pixel SP.

[0162] The repair data voltage Vdata_rep can be a voltage greater than the sensing data voltage Vdata_sen. The repair data voltage Vdata_rep can be a voltage greater than the upper limit value of the data voltage supplied during display driving.

[0163] If the repair data voltage Vdata_rep is supplied to the sub-pixel SP for a certain period, the storage capacitor Cstg provided on the sub-pixel SP may become short-circuited.

[0164] When the storage capacitor Cstg becomes short-circuited in a state where the repair data voltage Vdata_rep is applied, a path for current to flow through the storage capacitor Cstg can be formed.

[0165] Since the repair data voltage Vdata_rep is a high-level voltage, a high current can flow through the shorted storage capacitor Cstg.

[0166] Therefore, a part such as indicated by 1002, the electronic fuse EF located on the path of the high current flow will be disconnected.

[0167] After the storage capacitor Cstg is shorted due to the application of a high voltage, the electronic fuse EF connected between the first switching transistor SWT1 and the first node N1 may be disconnected due to the high current flow.

[0168] The defective sub-pixel SP may become dark due to the disconnected electronic fuse EF, and the repair of the defective sub-pixel SP can be performed.

[0169] The storage capacitor Cstg may have a structure that is easily shorted when a high voltage is applied.

[0170] For example, such as Figure 8 As shown in, the storage capacitor Cstg may include a first capacitor electrode CE1 electrically connected to the first node N1 and a second capacitor electrode CE2 electrically connected to the second node N2.

[0171] At least one of the first capacitor electrode CE1 or the second capacitor electrode CE2 may include at least one protrusion 800 protruding toward the other.

[0172] Figure 8 The example shown in shows an example in which the first capacitor electrode CE1 includes a protrusion 800 protruding toward the second capacitor electrode CE2, but is not limited thereto.

[0173] Since the first capacitor electrode CE1 includes the protrusion 800, when a high voltage is applied to the storage capacitor Cstg, the short circuit of the storage capacitor Cstg can be easily performed.

[0174] For example, a part such as indicated by Figure 10 As shown in 1001, due to the application of a high voltage, the protrusion 800 of the first capacitor electrode CE1 can be connected to the second capacitor electrode CE2.

[0175] Since the first capacitor electrode CE1 and the second capacitor electrode CE2 become short-circuited, a high current can flow through the electronic fuse EF and the storage capacitor Cstg. And the electronic fuse EF can be disconnected, and the repair through the darkening of the sub-pixel SP can be easily performed.

[0176] Referring to Figure 11 , in the third period P3 which is a display driving period, the driving for compensating the repair sub-pixel SP_rep can be performed similarly to case A.

[0177] A compensation data voltage Vdata_comp greater than the voltage corresponding to the image data can be supplied to the sub-pixels SP1, SP2, and the sub-pixels SP1, SP2 represent the same color as the repair sub-pixel SP_rep.

[0178] A normal data voltage Vdata_nor corresponding to the image data can be supplied to the sub-pixel SP3, and the sub-pixel SP3 represents a color different from the repair sub-pixel SP_rep.

[0179] The light-emitting element ED of the repair sub-pixel SP_rep can maintain a state of not being electrically connected to the circuit elements in the peripheral sub-pixels SP.

[0180] As described above, even when the electronic fuse EF is electrically connected to the gate node of the driving transistor DRT, defect detection and repair can be performed through the circuit driving of the sub-pixel SP.

[0181] Figure 12 is a diagram showing an example of a cross-sectional structure of a display panel 110 having the circuit structure of the sub-pixel SP shown in Figure 8 . For ease of description, Figure 12 only some circuit elements provided on the sub-pixel SP are shown.

[0182] Referring to Figure 12 , a first switching transistor SWT1 and a driving transistor DRT can be provided on the substrate SUB. A plurality of metal layers M can be provided on the first switching transistor SWT1 and the driving transistor DRT. An interlayer insulating layer ILD can be provided between different metal layers M. Through-holes Via can be formed in the interlayer insulating layer ILD. Different metal layers M can be connected through the through-holes Via. Figure 12 shows an example in which four metal layers M1, M2, M3, M4, seven interlayer insulating layers ILD1, ILD2, ILD3, ILD4, ILD5, ILD6, ILD7 and five through-holes Via1, Via2, Via3, Via4, Via5 are provided, but aspects of the present disclosure are not limited thereto.

[0183] The first switching transistor SWT1 can be electrically connected to the gate electrode GE of the driving transistor DRT and the first capacitor electrode CE1 of the storage capacitor Cstg through a plurality of metal layers M and a plurality of through-holes Via.

[0184] The electronic fuse EF can be located on the path where the drain node D of the first switching transistor SWT1 is connected to the first capacitor electrode CE1.

[0185] Figure 12 The example shown in [Fig. 2] shows an example in which the second capacitor electrode CE2 included in the storage capacitor Cstg includes a protrusion 800.

[0186] When a high voltage is applied to repair a defective sub-pixel SP, the first capacitor electrode CE1 and the second capacitor electrode CE2 of the storage capacitor Cstg may become short-circuited. Through the short-circuit of the storage capacitor Cstg, a high current can flow through the first switching transistor SWT1 and the storage capacitor Cstg, and the electronic fuse EF located on the path of the high current flow can be disconnected.

[0187] Therefore, even when the electronic fuse EF is electrically connected between the first switching transistor SWT1 and the driving transistor DRT, the defect detection and repair of the sub-pixel can be easily performed by circuit driving.

[0188] Aspects of the present disclosure described above will be briefly described below.

[0189] A display device 100 according to aspects of the present disclosure may include: a plurality of sub-pixels SP provided on an active area AA of a display panel 110; a light-emitting element ED provided on each of the plurality of sub-pixels SP and including a first electrode E1 and a second electrode E2; a driving transistor DRT configured to control a driving current supplied to the light-emitting element ED; and an electronic fuse EF electrically connected between the driving transistor DRT and the first electrode E1 of the light-emitting element ED.

[0190] The electronic fuse EF provided on at least one of the plurality of sub-pixels SP may be open.

[0191] A compensation data voltage Vdata_comp greater than a voltage corresponding to image data may be configured to be supplied to at least one of the sub-pixels SP provided on the periphery of the sub-pixel SP on which the open electronic fuse EF is provided.

[0192] The color represented by the sub-pixel SP to which the compensation data voltage Vdata_comp is supplied may be the same as the color represented by the sub-pixel SP on which the open electronic fuse EF is provided.

[0193] The first electrode E1 of the light-emitting element ED provided on the sub-pixel SP to which the compensation data voltage Vdata_comp is supplied may be insulated from the first electrode E1 of the light-emitting element ED provided on the sub-pixel SP on which the open electronic fuse EF is provided.

[0194] The normal data voltage Vdata_nor corresponding to the image data can be configured to be supplied to at least one sub-pixel SP on the periphery of the sub-pixel SP where the electronic fuse EF with a break set thereon is located.

[0195] In the first period P1, the sense data voltage Vdata_sen can be configured to be supplied to the gate node of the driving transistor DRT provided on at least one sub-pixel SP among the plurality of sub-pixels SP, and the sense current Current_sen flowing through the node between the driving transistor DRT and the first electrode E1 of the light-emitting element ED can be configured to be detected.

[0196] The second electrode E2 of the light-emitting element ED can be configured to float in the first period P1.

[0197] If the sense current Current_sen is included within a predetermined range, in the second period P2 after the first period P1, the repair data voltage Vdata_rep greater than the sense data voltage Vdata_sen can be configured to be supplied to the gate node of the driving transistor DRT provided on the sub-pixel SP where the sense current Current_sen is detected.

[0198] The second electrode E2 of the light-emitting element ED can be configured to float in the second period P2.

[0199] If the sense current Current_sen is less than a predetermined value, in the second period P2, the repair data voltage Vdata_rep can be configured not to be supplied to the sub-pixel SP where the sense current Current_sen is detected.

[0200] After the second period P2, the electronic fuse EF provided on the sub-pixel SP to which the repair data voltage Vdata_rep is supplied can be disconnected.

[0201] The driving transistor DRT and the light-emitting element ED can be provided on an opaque substrate.

[0202] The display device 100 according to aspects of the present disclosure may include: a plurality of sub-pixels SP provided on the active area AA of the display panel 110; a light-emitting element ED provided on each of the plurality of sub-pixels SP; a driving transistor DRT configured to control the driving current supplied to the light-emitting element ED; a capacitor including a first capacitor electrode CE1 electrically connected to the gate node of the driving transistor DRT and a second capacitor electrode CE2 electrically connected to the source node of the driving transistor DRT; and an electronic fuse EF electrically connected to the gate node of the driving transistor DRT.

[0203] At least one of the first capacitor electrode CE1 or the second capacitor electrode CE2 of the capacitor may include at least one protrusion 800 protruding toward the other.

[0204] The first capacitor electrode CE1 and the second capacitor electrode CE2 of the capacitor provided on some of the plurality of sub-pixels SP may be short-circuited.

[0205] The electronic fuse EF provided on some of the sub-pixels SP where the first capacitor electrode CE1 and the second capacitor electrode CE2 of the capacitor are set to be short-circuited may be disconnected.

[0206] The compensation data voltage Vdata_comp greater than the voltage corresponding to the image data may be configured to be supplied to at least one of the sub-pixels SP provided on the periphery where the electronic fuse EF is disconnected.

[0207] In the first period P1, the sense data voltage Vdata_sen may be configured to be supplied to the gate node of the driving transistor DRT provided on at least one of the plurality of sub-pixels SP, and in the second period P2 after the first period P1, the repair data voltage Vdata_rep greater than the sense data voltage Vdata_sen may be configured to be supplied to the gate node of the driving transistor DRT.

[0208] The display device 100 according to aspects of the present disclosure may include: a first sub-pixel including a first light-emitting element; a first driving transistor configured to drive the first light-emitting element; and a first electronic fuse electrically connected to the first driving transistor; and a second sub-pixel including a second light-emitting element; a second driving transistor configured to drive the second light-emitting element; and a second electronic fuse electrically connected to the second driving transistor and disconnected, wherein the anode electrode of the second light-emitting element is insulated from the anode electrode of the first light-emitting element.

[0209] According to aspects of the present disclosure, by using the electronic fuse EF electrically connected to the driving transistor DRT provided on the sub-pixel SP, defect detection and repair of the sub-pixel SP can be easily performed.

[0210] Due to the use of the electronic fuse EF provided on the sub-pixel SP, defect detection and repair can be performed through the circuit driving of the sub-pixel SP.

[0211] Therefore, even in a case where physical repair is not possible depending on the type of the display panel 110, the display device 100 capable of easily detecting and repairing defects of the sub-pixel SP and preventing a decrease in display quality due to defects of the sub-pixel SP can be provided.

[0212] The above description is presented to enable any person skilled in the art to make and use the technical conceptions of the present disclosure, and the above description has been provided in the context of a particular application and its requirements. Various modifications, additions, and substitutions to the described aspects will be readily apparent to those skilled in the art, and the general principles defined herein can be applied to other aspects and applications without departing from the spirit and scope of the present disclosure. The above description and the accompanying drawings provide examples of the technical conceptions of the present disclosure for illustrative purposes only. That is, the disclosed aspects are intended to illustrate the scope of the technical conceptions of the present disclosure. Accordingly, the scope of the present disclosure is not limited to the aspects shown, but should be accorded the broadest scope consistent with the claims. The scope of protection of the present disclosure should be interpreted based on the appended claims, and all technical conceptions within the scope of their equivalents should be construed as being included within the scope of the present disclosure.

Claims

1. A display device, comprising: a plurality of sub-pixels disposed on an active area of a display panel; and an element disposed on each of the plurality of sub-pixels, the element comprising: a light-emitting element having a first electrode and a second electrode; a driving transistor configured to control a driving current supplied to the light-emitting element; an electronic fuse electrically connected between the driving transistor and the first electrode of the light-emitting element; and a capacitor having a first capacitor electrode electrically connected to a gate node of the driving transistor and a second capacitor electrode electrically connected to the second electrode of the light-emitting element, wherein one end of the electronic fuse is electrically connected to the second capacitor electrode and the light-emitting element, and the other end of the electronic fuse is electrically connected to the driving transistor, and wherein the electronic fuse is disposed in a via among a stack of vias stacked between a source node of the driving transistor and the first electrode.

2. The display device according to claim 1, wherein an electronic fuse disposed on at least one of the plurality of sub-pixels is open.

3. The display device according to claim 2, wherein a compensation data voltage greater than a voltage corresponding to image data is supplied to at least one sub-pixel located at a periphery of the sub-pixel on which the open electronic fuse is disposed.

4. The display device according to claim 3, wherein a color represented by the sub-pixel supplied with the compensation data voltage is the same as a color represented by the sub-pixel on which the open electronic fuse is disposed.

5. The display device according to claim 3, wherein a first electrode of a light-emitting element disposed on the sub-pixel supplied with the compensation data voltage is insulated from a first electrode of a light-emitting element disposed on the sub-pixel on which the open electronic fuse is disposed.

6. The display device according to claim 2, wherein a normal data voltage corresponding to image data is supplied to at least one sub-pixel located at a periphery of the sub-pixel on which the open electronic fuse is disposed.

7. The display device according to claim 1, wherein during a first period, a sense data voltage is supplied to a gate node of a driving transistor disposed on at least one of the plurality of sub-pixels, and a sense current flowing through a node between the driving transistor disposed on the at least one sub-pixel and the first electrode of the light-emitting element is detected.

8. The display device according to claim 7, wherein a second electrode of the light-emitting element disposed on the at least one sub-pixel is floated during the first period.

9. The display device according to claim 7, wherein when the sense current is within a predetermined range, a repair data voltage greater than the sense data voltage is supplied to the gate node of the driving transistor disposed on the at least one sub-pixel during a second period after the first period.

10. The display device according to claim 9, wherein a second electrode of the light-emitting element disposed on the at least one sub-pixel is floated during the second period.

11. The display device according to claim 9, Among them, when the sensed current is less than a predetermined value, during the second period, the repair data voltage is not supplied to the at least one sub-pixel.

12. The display device according to claim 9, wherein, after the second period, the electronic fuse provided on the at least one sub-pixel is disconnected.

13. The display device according to claim 1, wherein, the driving transistor and the light emitting element are provided on an opaque substrate.

14. A display device, comprising: a plurality of sub-pixels provided on an active area of a display panel; and an element provided on each of the plurality of sub-pixels, the element comprising: a light emitting element; a driving transistor configured to control a driving current supplied to the light emitting element; a capacitor having a first capacitor electrode electrically connected to a gate node of the driving transistor and a second capacitor electrode electrically connected to a source node of the driving transistor; and an electronic fuse electrically connected to the gate node of the driving transistor.

15. The display device according to claim 14, wherein, at least one of the first capacitor electrode and the second capacitor electrode of the capacitor includes at least one protrusion protruding toward the other.

16. The display device according to claim 14, wherein, the first capacitor electrode and the second capacitor electrode of the capacitor provided on some of the plurality of sub-pixels are short-circuited.

17. The display device according to claim 16, wherein, the electronic fuse provided on the sub-pixel where the first capacitor electrode and the second capacitor electrode of the capacitor are short-circuited is disconnected.

18. The display device according to claim 17, wherein, a compensation data voltage greater than the voltage corresponding to the image data is supplied to at least one sub-pixel located around the sub-pixel provided with the disconnected electronic fuse.

19. The display device according to claim 14, wherein, during a first period, a sensed data voltage is supplied to a gate node of a driving transistor provided on at least one of the plurality of sub-pixels, and during a second period after the first period, a repair data voltage greater than the sensed data voltage is supplied to the gate node of the driving transistor.

20. A display device, comprising: a first sub-pixel including a first light emitting element, a first driving transistor configured to drive the first light emitting element, a first electronic fuse electrically connected to the first driving transistor, and a first capacitor having a first capacitor electrode electrically connected to a gate node of the first driving transistor and a second capacitor electrode electrically connected to the first light emitting element; and a second sub-pixel including a second light emitting element, a second driving transistor configured to drive the second light emitting element, a second electronic fuse electrically connected to the second driving transistor and disconnected, and a second capacitor having a first capacitor electrode electrically connected to a gate node of the second driving transistor and a second capacitor electrode electrically connected to the second light emitting element, Among them, the second light-emitting element has an anode electrode insulated from the anode electrode of the first light-emitting element. Among them, one end of the first electronic fuse is electrically connected to the second capacitor electrode of the first capacitor and the first light-emitting element, and the other end of the first electronic fuse is electrically connected to the first driving transistor. Among them, one end of the second electronic fuse is electrically connected to the second capacitor electrode of the second capacitor and the second light-emitting element, and the other end of the second electronic fuse is electrically connected to the second driving transistor, and Among them, the second electronic fuse is disposed in a via hole among a stack of via holes stacked between the source node of the second driving transistor and the second light-emitting element.

Images