Quantum teaching machine and optical imaging system for quantum teaching machine

Abstract

This application relates to a quantum teaching machine and an optical imaging system for a quantum teaching machine. The quantum teaching machine is used to implement particle trapping and display the states of the trapped particles, and the optical imaging system is used to acquire image information of the trapped particles for display on the screen of the quantum teaching machine; the optical imaging system includes: a laser light source, a diaphragm, and an imaging device; wherein, the laser light source and the imaging device are arranged around the quadrupole device, the lens of the imaging device and the laser light source are both oriented towards the region where the ion trap is located, wherein, the laser light source is located on one side of the vertical plane of the light source main axis, the imaging device and the laser light source are on the same side of the vertical plane or are respectively on both sides of the vertical plane, and when the imaging device and the laser light source are respectively on both sides of the vertical plane, the imaging device is outside the range of the maximum opening angle of the line laser. The optical imaging system provided by this application is more ingenious and reasonable in optical path design, and has a better illumination effect on the particle chain trapped in the ion trap.

Description

Technical Field

[0001] This application relates to the field of quantum computing technology, and particularly to a quantum teaching machine and an optical imaging system for a quantum teaching machine. Background Art

[0002] A quantum computer is used to implement the processing of quantum information and is a research hotspot in the current frontier technology field. At present, the quantum system of trapped ions is one of the systems promising to realize a quantum computer. In order to enable people to "visually" understand quantum information technology and quantum computers, a quantum teaching machine has emerged. The main function of the quantum teaching machine is to realize the trapping of microparticles and display the trapped state of the microparticles. For example, for a quantum teaching machine based on a quadrupole ion trap, a feeding device and a material recovery device are provided near the quadrupole device. In order to better capture and display the trapped state of the microparticles, a light source can also be set inside the quantum teaching machine to illuminate the trapped microparticles, and at the same time, an electronic imaging device is used for imaging and displayed on the screen of the quantum teaching machine, which can achieve a better demonstration effect.

[0003] However, due to the large number of various devices in the quantum teaching machine and strict operation specifications, the design of the internal space of the existing quantum teaching machine is not reasonable, and it is difficult to optimize the design, resulting in a low degree of automation in the whole machine during use and no longer meeting the conventional use requirements. Summary of the Invention

[0004] Aiming at the technical problems existing in the prior art, this application proposes a quantum teaching machine and an optical imaging system for a quantum teaching machine. The optical system proposed in this application can illuminate the microparticle chain trapped inside the quantum teaching machine and display it on the screen of the quantum teaching machine to achieve the purpose of enlightenment learning.

[0005] An optical imaging system for a quantum teaching machine proposed in this application, the optical imaging system for a quantum teaching machine includes: a laser light source, disposed on one side of a plane perpendicular to the main axis of the laser light source, for generating line laser to illuminate the microparticle chain trapped in the ion trap, and the ion trap is included in the quadrupole device inside the quantum teaching machine; and an imaging device, disposed on the same side of the plane as the laser light source, or disposed on both sides of the plane with the laser light source respectively and the imaging device is located outside the maximum opening angle range of the line laser, for photographing the area where the ion trap is located and generating image information for the illuminated microparticle chain to be displayed on the screen outside the quantum teaching machine, wherein the laser light source and the imaging device are arranged around the quadrupole device, and the lens of the imaging device and the laser light source both face the area where the ion trap is located.

[0006] Optionally, the optical imaging system for the quantum teaching machine further includes: a diaphragm, disposed on the optical path of the laser emitted by the laser light source, for adjusting the range illuminated by the line laser.

[0007] Optionally, the included angle formed by the optical axis of the lens of the imaging device and the main axis of the laser light source is an acute angle.

[0008] Optionally, the included angle formed by the optical axis of the lens of the imaging device and the main axis of the laser light source is between 40° and 50°.

[0009] Optionally, by adjusting the aperture of the diaphragm, the range illuminated by the line laser is matched with the length of the particle chain.

[0010] Optionally, the width of the line laser is greater than or equal to the length of the particle chain.

[0011] Optionally, the diaphragm is mounted on a fixed bracket, and the diaphragm is located at a position 4 mm to 8 mm away from the light-emitting surface of the laser light source.

[0012] Optionally, the imaging device includes a complementary metal oxide semiconductor (CMOS) image sensor, and the lens of the imaging device is 100 nm to 150 nm away from the quadrupole device.

[0013] Optionally, the quantum teaching machine further includes a feeding device and a particle recovery device. Among them, the feeding device is used to put particles into the quadrupole device, and the particle recovery device is used to collect the particles falling from the quadrupole device; and the imaging device, the laser light source, the feeding device, and the particle recovery device are arranged in sequence around the quadrupole device.

[0014] Optionally, the quadrupole device has a housing, and the housing is provided with a first opening and a second opening. Among them, the line laser enters through the first opening to illuminate the area where the ion trap is located, and the imaging device takes pictures of the area where the ion trap is located through the second opening.

[0015] Optionally, the housing is a square housing, and the laser light source and the imaging device are both located outside the same side wall of the square housing; or the housing is an octagonal prism structure, and the laser light source and the imaging device are respectively located outside adjacent two side walls of the octagonal prism.

[0016] This application also proposes a quantum teaching machine, and the quantum teaching machine includes the optical imaging system as described above.

[0017] In the embodiments of the present application, the placement positions of the devices in the optical imaging system are optimized. After optimization, the system uses line lasers, forming a reasonable optical path and having a good illumination effect on the particle chain. Compared with the previous method of directly placing a point laser source in the direction of the particle chain for incidence, the optical imaging system in the embodiments of the present application is more ingenious and reasonable in optical path design, has a better illumination effect on the particle chain trapped in the ion trap, and based on this optimization design, the space in the direction of the particle chain of the quadrupole device can be vacated to accommodate and place, such as, but not limited to, a feeding device to achieve automatic feeding of the quadrupole device, thereby improving the overall automation degree of the quantum teaching machine. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Next, the preferred embodiments of the present application will be further described in detail with reference to the accompanying drawings, where:

[0019] Figure 1 shows a schematic diagram of the internal structure of a quantum teaching machine according to an embodiment of the present application;

[0020] Figure 2 shows a schematic diagram of the internal structure of a quantum teaching machine according to another embodiment of the present application;

[0021] Figure 3 shows a first optical path diagram of an optical imaging system according to an embodiment of the present application;

[0022] Figure 4 shows a second optical path diagram of an optical imaging system according to an embodiment of the present application;

[0023] Figure 5 shows a third optical path diagram of an optical imaging system according to an embodiment of the present application;

[0024] Figure 6 shows a schematic diagram of the overall appearance of a quantum teaching machine according to an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0026] In the following detailed description, reference is made to the various specification drawings that form a part of the present application and illustrate specific embodiments of the present application. In the drawings, like reference numerals generally describe substantially similar components in different figures. The specific embodiments of the present application are described in sufficient detail below to enable those of ordinary skill in the relevant art and technology to implement the technical solutions of the present application. It should be understood that other embodiments may also be utilized or structural, logical, or electrical changes may be made to the embodiments of the present application.

[0027] An embodiment of the present application provides an optical imaging system for a quantum teaching machine, which includes a laser light source and an imaging device. Among them, the laser light source is arranged on one side of the vertical plane of the main axis of the laser light source, and is used to generate line laser to illuminate the particle chain trapped in the ion trap, and the ion trap is included in the quadrupole device inside the quantum teaching machine; the imaging device and the laser light source are arranged on the same side of the vertical plane, or the imaging device and the laser light source are respectively arranged on both sides of the vertical plane and the imaging device is located outside the maximum angular spread range of the line laser. The imaging device is used to photograph the area where the ion trap is located and generate image information for the illuminated particle chain to be displayed on the screen outside the quantum teaching machine; among them, the laser light source and the imaging device are arranged around the quadrupole device, and the lens of the imaging device and the laser light source both face the area where the ion trap is located.

[0028] According to the embodiment of the present application, the laser light source and the imaging device are arranged around the quadrupole device inside the quantum teaching machine, and the lens of the imaging device and the laser light source both face the area where the ion trap located in the quadrupole device. Specifically, the laser light source itself is located on one side of the vertical plane of the main axis of the laser light source. The imaging device can be on the same side of the vertical plane as the laser light source, or the imaging device and the laser light source can be respectively on both sides of the vertical plane. In this case, the imaging device should also be located outside the maximum angular spread range of the line laser of the laser light source.

[0029] The advantage of such a setting is that by optimizing the positions of the laser light source and the imaging device, not only can the imaging device receive the light source reflected or scattered by the particles to obtain a good shooting effect, but also the imaging device will not be directly exposed to laser irradiation. During operation, the line laser emitted by the laser light source can illuminate the particle chain in the ion trap alone, with a large contrast with the background and a good illumination effect, which is beneficial for the imaging device to capture and photograph the particle chain in the ion trap; and, the laser light source does not need to occupy the position on the extension line of the particle chain. That is, the above overall design allows the position on the extension line of the particle chain to be vacated, facilitating the placement of other devices required inside the quantum teaching machine, and can overall improve the optimization degree of the internal structure of the quantum teaching machine.

[0030] In some embodiments of the present application, the optical imaging system further includes a diaphragm, which is disposed on the optical path of the laser emitted by the laser light source and is used to adjust the range illuminated by the line laser. Adding a diaphragm in the optical system can conveniently adjust the illuminated range of the line laser and improve the accuracy of the illuminated range of the line laser.

[0031] The following describes the optional implementation manners of the embodiments of the present application in detail through a plurality of schematic embodiments.

[0032] Figure 1 The schematic internal structure diagram of a quantum teaching machine according to an embodiment of the present application is shown. Figure 2 The schematic internal structure diagram of another quantum teaching machine according to an embodiment of the present application is shown. Figure 1 and Figure 2 both include the optical imaging system of the embodiment of the present application. Figure 3 、 4 and 5 show three optical path diagrams of the optical imaging system of the embodiment of the present application. Combining Figures 1-5 As shown, the quantum teaching machine is used to implement particle trapping and display the state of the trapped particles, and the optical imaging system is used to obtain the image information of the trapped particles for display on the screen of the quantum teaching machine; wherein, the quantum teaching machine can trap particles in the ion trap 102 through the quadrupole device 101 provided inside and form a particle chain in the ion trap 102.

[0033] In Figure 1 and Figure 2 In the quantum teaching machine shown, the optical imaging system includes a laser light source 201, a diaphragm 202, and an imaging device 203. Among them, the laser light source 201 is used to generate line laser to illuminate the particle chain; the diaphragm 202 is located on the optical path of the laser emitted by the laser light source 201, and the diaphragm 202 is used to adjust the size of the range that the line laser can illuminate; the imaging device 203 is used to photograph the area where the ion trap 102 is located and generate the image information of the particle chain illuminated by the laser for display on the screen.

[0034] In Figure 1 and Figure 2 In the quantum teaching machine shown, the laser light source 201 and the imaging device 203 are arranged around the quadrupole device 101, the lens of the imaging device 203 and the laser light source 201 both face the area where the ion trap 102 is located. Among them, the laser light source 201 is located on one side of the vertical plane C-C of the light source main axis L, and the imaging device 203 and the laser light source 201 are on the same side of the vertical plane C-C or are respectively located on both sides of the vertical plane C-C. And when the imaging device 203 and the laser light source 201 are respectively located on both sides of the vertical plane C-C, the imaging device 203 is outside the range of the maximum opening angle α of the line laser.

[0035] As an example, referring to Figures 3-5, the placement of the laser light source 201 and the imaging device 203 can be as follows:

[0036] · Method 1: The line laser enters the imaging device after reflection

[0037] As Figure 3 In the illustrated embodiment, the laser light source 201 is disposed at position A, and the imaging device 203 is disposed at position B, that is, the imaging device 203 and the laser light source 201 are on the same side of the vertical plane C-C. In this case, the imaging device 203 at the reflection surface direction can receive the light diffusely reflected by the particles (i.e., the particles are illuminated) for observing the particle position, and the imaging effect is good.

[0038] · Method 2: The line laser enters the imaging device after Mie scattering

[0039] As Figure 4 In the illustrated embodiment, the laser light source 201 is disposed at position A, and the imaging device 203 is disposed at position C, that is, the imaging device 203 and the laser light source 201 are respectively on both sides of the vertical plane C-C. In this case, the imaging device 203 can receive the light scattered by the particles through Mie scattering (i.e., the particles are illuminated) for observing the particle position. However, compared with the reflected light in Method 1, the light in Method 2 is relatively weak. Therefore, the imaging effect of Method 2 is inferior to that of Method 1.

[0040] · Method 3: The line laser directly irradiates the imaging device

[0041] As Figure 5 In the illustrated embodiment, when the laser light source 201 and the imaging device 203 are disposed on both sides of the vertical plane C-C, the imaging device 203 is within the range of the maximum opening angle α of the line laser (for example, the laser light source 201 is disposed at position A and the imaging device 203 is disposed at position D in the figure). In this case, the imaging device 203 is in the transmission direction and at the same time within the line laser fan range. Although it can receive the light scattered by the particles through Mie scattering, the light emitted by the laser will also directly irradiate the receiver. At that time, it will be difficult to determine the particle position, and the imaging effect cannot be guaranteed. In addition, due to the high laser energy, the imaging device 203 may be damaged during direct irradiation. Therefore, the placement method of Method 3 should be avoided.

[0042] It can be seen that when the laser light source 201 and the imaging device 203 are disposed on both sides of the vertical plane C-C, the imaging device 203 cannot be disposed within the range of the α angle, that is, the imaging device 203 is outside the range of the maximum opening angle α of the line laser. In this way, the light emitted by the laser light source 201 can be prevented from directly irradiating the imaging device 203, and the imaging device 203 can be prevented from being damaged.

[0043] According to an embodiment of the present application, after an operator injects microparticles (such as SiC microparticles), the voltage of the ion trap 102 is adjusted to trap the microparticles in the trap and arrange them in a particle chain; the laser light source 201 is turned on, and the laser light source 201 emits a line laser to illuminate the ion trap 102. The incident position of the line laser is observed through the imaging device 203, and the incident angle of the laser light source 201 is adjusted to illuminate the particle chain in the trap; the aperture 202 is used to adjust the illumination range of the line laser so that it can illuminate the particle chain in the trap without illuminating other positions in the quadrupole device 101. It can be seen that the optical imaging system proposed in the present application has a reasonable optical path, good illumination effect on the particle chain, is conducive to capturing and photographing the particle chain in the ion trap, is very suitable for a quantum teaching machine, and is used for the popularization and enlightenment of learning quantum computing.

[0044] In some embodiments of the present application, such as Figure 1 and Figure 2 the embodiment shown, the included angle between the lens optical axis of the imaging device 203 and the main axis of the laser light source 201 is an acute angle. In this way, it can not only ensure that the line laser emitted by the laser light source 201 can illuminate the particle chain in the ion trap and the imaging device 203 can capture the image in the ion trap, but also make there be enough space inside the quantum teaching machine to accommodate the automatic feeding device 106, so that the operation of manually putting microparticles into the high-voltage quadrupole device 101 in the past can be changed to putting microparticles through the feeding device 106, avoiding the risk of manual feeding touching high voltage and improving the safety of the operation of the quantum teaching machine.

[0045] In some embodiments of the present application, the included angle between the lens optical axis of the imaging device 203 and the main axis of the laser light source 201 is between 40° and 50°. For example, the included angle between the lens optical axis of the imaging device 203 and the main axis of the laser light source 201 is 45°. In this way, the line laser emitted by the laser light source 201 is reflected by the particle chain in the ion trap and received by the imaging device 203, which can not only make the line laser emitted by the laser light source 201 illuminate the particle chain, but also make the imaging device 203 receive most of the reflected light.

[0046] In some embodiments of the present application, the included angle between the extending direction of the lens optical axis of the imaging device 203 and the electrode placement direction in the quadrupole device 101 is less than or equal to 90°. For example, the included angle between the extending direction of the lens optical axis of the imaging device 203 and the electrode placement direction in the quadrupole device 101 is 90°. In this way, it is convenient for the imaging device 203 to capture the area where the ion trap in the quadrupole device 101 is located.

[0047] In some embodiments of the present application, by adjusting the aperture of the diaphragm 202, the range illuminated by the line laser can be matched with the length of the particle chain. In this way, the adjustment method is fast and efficient, avoiding repeatedly adjusting the distance between the laser light source 201 and the quadrupole device 101 so that the line laser can illuminate.

[0048] In some embodiments of the present application, the width of the line laser is greater than or equal to the length of the particle chain. In the embodiments of the present application, the width of the line laser is the same as the length of the particle chain. In this way, the line laser only illuminates the particle chain, forming a contrast between light and dark with the surrounding environment, and the imaging is clear.

[0049] In some embodiments of the present application, as Figure 1 shown, the diaphragm 202 is installed on the fixed bracket 204, and the diaphragm 202 is located at a position 4 mm to 8 mm, preferably 6 mm, from the light-emitting surface of the laser light source 201.

[0050] In some embodiments of the present application, the imaging device 203 includes a complementary metal oxide semiconductor (CMOS) image sensor, and the lens of the imaging device 203 is at a distance of 100 nm to 150 nm, preferably 120 mm, from the quadrupole device 101.

[0051] In some embodiments of the present application, as Figure 1 shown, the quantum teaching machine further includes a feeding device 106 and a particle recovery device 104. Among them, the feeding device 106 is used to put particles into the quadrupole device 101, and the particle recovery device 104 is used to collect the particles dropped in the quadrupole device 101; and the imaging device 203, the laser light source 201, the feeding device 106, and the particle recovery device 104 are arranged in sequence around the quadrupole device 101.

[0052] As Figure 1 shown in the embodiment, the discharge port of the feeding device 106 is connected to the feed port of the quadrupole device 101, and the feed port of the particle recovery device 104 is connected to the discharge port of the quadrupole device 101. In this way, the staff puts particles into the feeding device 106, and the particles enter the quadrupole device 101 after being adjusted by the feeding device 106. The particles that do not meet the requirements are directly recovered by the recovery device, and the particles that meet the requirements are trapped by the ion trap 102 and arranged into an equidistant particle chain under the action of the electric field in the trap.

[0053] In some embodiments of the present application, the quadrupole device 101 has a housing, and one or more openings are provided on the housing. Among them, the line laser is incident through the first opening to illuminate the area where the ion trap 102 is located, and the imaging device 203 takes pictures of the area where the ion trap 102 is located through the second opening. In other embodiments, according to the shape of the housing, the first opening and the second opening can be designed as the same opening, or the quadrupole device 101 does not have a housing, and the line laser directly illuminates the area where the ion trap is located. Whether to design the housing of the quadrupole device 101 can be determined according to the actual situation.

[0054] In some embodiments of the present application, the housing is a square housing, and both the laser light source 201 and the imaging device 203 are located outside the same side wall of the square housing. In other embodiments of the present application, the housing is an octagonal prism structure, and the laser light source 201 and the imaging device 203 are respectively located outside two adjacent side walls of the octagonal prism.

[0055] The internal structure of the quantum teaching machine of the quadrupole device 101 with different-shaped housings will be described below through specific examples.

[0056] Regardless of whether the housing of the quadrupole device 101 is square or octagonal prism structure, the internal structure of the quadrupole device 101 is the same. The ion trap in the quadrupole device 101 is composed of four long cylindrical stainless steel rods and two conical stainless steel electrodes. The four stainless steel rods generate an alternating electric field, and the two conical electrodes generate a direct current electric field. The stainless steel rods and the conical electrodes form the ion trap 102. By adjusting the voltages of the two, the particles that meet the requirements injected into the ion trap 102 are arranged in a particle chain. In other embodiments, the particles in the ion trap 102 can be arranged in an equally spaced straight line.

[0057] Such as Figure 1In the illustrated embodiment, the housing of the quadrupole device 101 in the quantum teaching machine 100 has an octagonal prism structure. The center inside the quadrupole device 101 is an ion trap 102. The ion trap 102 is a cuboid formed by four long cylindrical stainless steel rods 102-1, and two conical stainless steel electrodes 102-2 are respectively located on two opposite sides of the cuboid. An imaging device 203 is placed outside the first side of the octagonal prism housing. The imaging lens of the imaging device 203 has a resolution of 3.45 μm and can clearly capture the image inside the trap. The extending direction of the optical axis of the lens of the imaging device 203 is perpendicular to the direction of electrode placement in the quadrupole device 101 and is 120 nm away from the center of the ion trap. The laser light source 201 is located on the second side of the octagonal prism housing. The second side is adjacent to the first side. The included angle between the main axis of the laser light source 201 and the direction of electrode placement in the quadrupole device 101 is 45°, and the included angle with the optical axis of the lens of the imaging device 203 is 45°. The laser light source 201 uses a 638-nm tunable laser with a light output divergence angle of 10° and can generate one-dimensional line laser. A diaphragm 202 is placed in the laser output direction of the laser light source 201. The diaphragm 202 is fixed by a fixed bracket 202-1 at a distance of 6 mm from the laser output surface of the laser light source 201. The first side and the second side are respectively provided with openings, so that the imaging device 203 can capture the image inside the ion trap 102 through the opening on the first side, and the line laser of the laser light source 201 can irradiate the area inside the ion trap 102 through the opening on the second side. A pressure regulating valve 105 device is placed outside the third side of the octagonal prism housing, and a particle recovery device 104 is placed outside the fourth and fifth sides. The feed inlet of the particle recovery device 104 extends into the quadrupole device 101 and is connected to the discharge outlet of the quadrupole device 101. A feeding device 106 is placed outside the sixth and seventh sides of the octagonal prism housing. The discharge outlet of the feeding device 106 is connected to the feed inlet of the quadrupole device 101 through a feed pipe 106-1 on the upper top surface of the quadrupole device 101. A fixed bracket 106-2 for fixing the feed pipe 106-1 is installed near the ion trap 102 inside the quadrupole device 101. An electrical feedthrough 101-4 is provided on the eighth side of the octagonal prism housing as a current connector to supply power to the ion trap 102. Symmetric handles 101-3 are provided on the upper top surface of the octagonal prism, which can open the upper top surface of the quadrupole device 101. A viewing window is provided in the area corresponding to the internal ion trap on the upper top surface, and the ion trap 102 inside the quadrupole device 101 can be directly observed through the viewing window 102-3.

[0058] As Figure 2In the illustrated embodiment, the housing of the quadrupole device 101 in the quantum teaching machine 100 is square. Among them, the opening 101-5 is located on the first side wall of the square housing, and the opening 101-5 is strip-shaped; the imaging device 203 is located outside the first side wall of the square housing, and the optical axis of the lens of the imaging device 203 is perpendicular to the first side wall of the square housing; the feeding device 106 is located outside the second side wall of the square housing; the laser light source 201 is located between the imaging device 203 and the feeding device 106, and the included angle between the main axis of the laser light source 201 and the optical axis of the imaging device 203 is 45°. The line laser emitted by the laser light source 201 illuminates the area where the ion trap is located in the quadrupole device 101 through the strip-shaped opening 101-5, and the imaging device 203 takes pictures of the area where the ion trap is located in the quadrupole device 101 through the strip-shaped opening 101-5; the aperture 202 is fixed by the fixing bracket 202-1 at a distance of 6 mm from the laser output surface of the laser light source 201; the particle recovery device 104 is located outside the third side wall of the square housing; a pressure regulating valve 105 device is provided outside the fourth side wall of the square housing for adjusting the particle velocity during the operation of the feeding device 106 by controlling the magnitude of the blowing gas pressure during the operation of the feeding device 106; where the second side wall is adjacent to the first side wall, the third side wall is opposite to the first side wall, and the fourth side wall is opposite to the second side wall. That is, the imaging device 203 is opposite to the particle recovery device 104, the feeding device 106 is opposite to the pressure regulating valve 105 device, and the feeding device 106 is adjacent to the particle recovery device 104 and the laser illumination device. Among them, the feeding device 106 is connected to the feed port of the quadrupole device 101 through a U-shaped pipe 101-6, and the particle recovery device 104 is connected to the discharge port of the quadrupole device 101 through a recovery pipe.

[0059] Based on the optical imaging system of the embodiments of the present application, the present application also provides a quantum teaching machine, which includes the optical imaging system as described above. Specifically, the quantum teaching machine of the embodiments of the present application may include: a housing and a quadrupole device, a feeding device, a particle recovery device, a pressure regulating valve device, and an optical imaging system provided inside the housing, where a display screen should be provided on the housing for displaying the trapped particles.

[0060] Figure 6 The overall appearance schematic diagram of the quantum teaching machine according to an embodiment of the present application is shown. As Figure 6As shown, a display screen 302 is provided on the housing 301 for displaying the images captured by the imaging device 203, so that people can intuitively view the state of the trapped particles through the display screen 302. As an example, a power switch button 303, a fault button 304, and a pause button 305 may also be provided on the housing 301, where the fault button 304 can be used to flash and / or emit an alarm when the quantum teaching machine fails. The faults of the teaching machine usually include insufficient particles in the quadrupole device 101, particles cannot enter the quadrupole device 101 normally, the particle recovery device 104 cannot work properly, etc. The setting of the fault button can timely remind the staff to handle the fault.

[0061] The optical imaging system for a quantum teaching machine proposed in this application, by setting the positions of the imaging device and the laser light source inside the quantum teaching machine, enables the line laser emitted by the laser light source to illuminate the particle chain in the ion trap, realizes individual particle lighting, has a large contrast with the background, and forms an image of the particle chain on the screen after being received by the imaging device. The imaging is clear, the particle trapping state is highly visual, easy to be accepted by the public, and is especially suitable for use in the occasion of popular science teaching.

[0062] The above describes the structural features and technical advantages of the quantum teaching machine and the optical imaging system for the quantum teaching machine according to the embodiments of this application through multiple embodiments. The following describes the operation process of the optical system for the quantum teaching machine according to the embodiments of this application in the quantum teaching machine through specific examples.

[0063] ① Turn on the laser light source 201, observe the incident position of the line laser through the lens of the imaging device 203, and adjust the incident angle of the laser light source 201 so that the line laser enters the center of the ion trap 102 at 45° relative to the electrode placement direction in the quadrupole device 101;

[0064] ② Adjust the outgoing light spot with the aperture 202 and adjust the spot to just cover the line laser in the central area of the ion trap 102;

[0065] ③ Use the feeding device 106 to inject particles, trap the particles through the quadrupole device 101, and adjust the focus according to the particle imaging to make the imaging clear;

[0066] ④ Adjust the electric field in the ion trap 102 to form a particle chain, and finely adjust the lens angle of the imaging device 203 so that the particle chain is in the center of the imaging screen.

[0067] As can be seen from the above operation process, the quantum teaching machine using the feeding device 106 can significantly improve the operation efficiency and the utilization rate of products, reduce the risk of electric shock to operators, and eliminate potential safety hazards; using the line laser to illuminate the particle chain in the ion trap 102 to achieve individual particle illumination, with a large contrast with the background and clear imaging. Providing the placement positions of multiple laser light sources 201 and the imaging device 203 offers multiple possibilities for the internal layout of the quantum teaching machine.

[0068] The above embodiments are only for illustrative purposes of the present application and are not limitations thereof. Those of ordinary skill in the relevant technical fields can also make various changes and modifications without departing from the scope of the present application. Therefore, all equivalent technical solutions should also fall within the scope of the disclosure of the present application.

Claims

1. An optical imaging system for a quantum teaching machine, characterized in that, Comprising: A laser light source, disposed on one side of a plane perpendicular to the main axis of the laser light source, for generating a line laser to illuminate a particle chain trapped in an ion trap, and the ion trap is included in a quadrupole device inside the quantum teaching machine; An imaging device, disposed on the same side of the plane as the laser light source, or, disposed on both sides of the plane respectively with the laser light source, and the imaging device is located outside the maximum angular spread range of the line laser, for photographing the area where the ion trap is located and generating image information for the illuminated particle chain to be displayed on a screen outside the quantum teaching machine, wherein, the plane is a plane perpendicular to the main axis of the laser light source, and the plane is located at the center of the ion trap; and A diaphragm, disposed on the optical path of the laser emitted by the laser light source, for adjusting the illumination range of the line laser, and by adjusting the aperture of the diaphragm, making the illumination range of the line laser match the length of the particle chain, and the width of the line laser is greater than or equal to the length of the particle chain, wherein, the particle chain is a straight line formed by particles trapped in the ion trap arranged at equal intervals; Wherein, the laser light source and the imaging device are arranged around the quadrupole device, and the lens of the imaging device and the laser light source both face the area where the ion trap is located.

2. The optical imaging system for a quantum teaching machine according to claim 1, wherein, When the imaging device and the laser light source are disposed on the same side of the plane, the included angle formed by the optical axis of the lens of the imaging device and the main axis of the laser light source is an acute angle.

3. The optical imaging system for a quantum teaching machine according to claim 2, characterized in that, The included angle formed by the optical axis of the lens of the imaging device and the main axis of the laser light source is between 40° and 50°.

4. The optical imaging system for a quantum teaching machine according to claim 1, wherein The diaphragm is mounted on a fixed bracket, and the diaphragm is located at a position 4 mm to 8 mm away from the light-emitting surface of the laser light source.

5. The optical imaging system for a quantum teaching machine according to claim 1, wherein The imaging device includes a complementary metal oxide semiconductor (CMOS) image sensor, and the lens of the imaging device is 100 mm to 150 mm away from the quadrupole device.

6. The optical imaging system for a quantum teaching machine according to claim 1, wherein The quantum teaching machine further includes a feeding device and a particle recovery device, wherein, the feeding device is used to put particles into the quadrupole device, and the particle recovery device is used to collect the particles dropped in the quadrupole device; and, the imaging device, the laser light source, the feeding device and the particle recovery device are arranged in sequence around the quadrupole device.

7. The optical imaging system for a quantum teaching machine according to claim 1, characterized in that, The quadrupole device has a housing, and the housing is provided with a first opening and a second opening, wherein, the line laser enters through the first opening to illuminate the area where the ion trap is located, and the imaging device photographs the area where the ion trap is located through the second opening.

8. The optical imaging system for a quantum teaching machine according to claim 7, wherein The housing is a square housing, and the laser light source and the imaging device are both located outside the same side wall of the square housing; or, the housing is an octagonal prism structure, and the laser light source and the imaging device are respectively located outside adjacent two side walls of the octagonal prism.

9. A quantum teaching machine, characterized in that, The quantum teaching machine includes the optical imaging system according to any one of claims 1-8.

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