A resonance frequency calibration method, device, FPGA calibration board and mass spectrometer

Abstract

This application relates to the field of mass spectrometer equipment, and particularly to a resonance frequency calibration method, device, FPGA calibration board and mass spectrometer. The resonance frequency calibration method includes: obtaining N configuration frequency parameters based on a preset value and a first preset rule, where N is an integer greater than 1; obtaining the current value corresponding to each configuration frequency parameter in sequence based on a preset time interval, a preset sequence rule and the N configuration frequency parameters; screening each of the current values according to a second preset rule to obtain an optimal current value, and using the configuration frequency parameter corresponding to the optimal current value as the optimal frequency parameter. This application can achieve automatic calibration of the resonance frequency, and through automatic frequency adjustment, the accuracy is greatly improved, and at the same time, a series of cumbersome processes are reduced.

Description

Technical Field

[0001] This application relates to the field of mass spectrometer equipment, and particularly to a resonance frequency calibration method, device, FPGA calibration board, and mass spectrometer. Background Art

[0002] As an instrument for analyzing functions such as mass, the mass spectrometer plays an important role in various experiments. For a quadrupole mass spectrometer, generally, a DC high voltage and an AC high voltage are applied to the quadrupole to scan ions. However, due to the deviation between the theoretical design of the hardware and the actual situation, and due to reasons such as the accuracy of the hardware, there are certain differences between each instrument, resulting in inaccurate oscillation and finally inaccurate experimental results. There are two existing solutions. One is to calibrate manually, but the operation is cumbersome and the accuracy is low. The second is to implement calibration through manual cooperation with the host computer to perform a calibration algorithm, which not only takes a long time but also occupies CPU resources. Summary of the Invention

[0003] In view of the above problems, this application proposes a resonance frequency calibration method, device, FPGA calibration board, and mass spectrometer.

[0004] An embodiment of this application proposes a resonance frequency calibration method, including:

[0005] Based on a preset value and a first preset rule, obtain N configuration frequency parameters, where N is an integer greater than 1;

[0006] Based on a preset time interval, a preset sequence rule, and the N configuration frequency parameters, sequentially obtain the current value corresponding to each configuration frequency parameter;

[0007] According to a second preset rule, screen each of the current values to obtain an optimal current value, and use the configuration frequency parameter corresponding to the optimal current value as the optimal frequency parameter.

[0008] Further, in the above resonance frequency calibration method, the preset value includes a first preset step value, and the method further includes:

[0009] Use the optimal frequency parameter obtained at the previous moment as a new reference frequency parameter, and based on the first preset step value, the new reference frequency parameter, and the first preset rule, obtain new M configuration frequency parameters, where M is an integer greater than 1;

[0010] Based on the preset time interval and the M configuration frequency parameters, sequentially obtain the updated current values corresponding to the new M configuration frequency parameters;

[0011] Screen each of the updated current values according to the second preset rule to obtain a new optimal current value, and use the configuration frequency parameter corresponding to the new optimal current value as the new optimal frequency parameter at the next moment.

[0012] Further, in the above resonance frequency calibration method, the preset value includes a second preset step value and a preset reference frequency parameter, and the first preset rule includes:

[0013] Using the second preset step value as an adjustment coefficient, increase the preset reference frequency parameter by X times and decrease it by Y times in sequence, and obtain the configuration frequency parameters after each increase and decrease respectively, where X + Y + 1 = N, and both X and Y are integers greater than or equal to 1.

[0014] Further, in the above resonance frequency calibration method, the second preset rule includes:

[0015] Take the smallest current value among the current values corresponding to each of the configuration frequency parameters as the optimal current value.

[0016] Further, in the above resonance frequency calibration method, the value range of the preset time interval is 1 to 5 microseconds.

[0017] Another embodiment of the present application further proposes a resonance frequency calibration device, including: a receiving module, a calculation module, a configuration module, a collection module, and a screening module;

[0018] The receiving module is used to receive a preset value and transmit the preset value to the calculation module;

[0019] The calculation module is used to obtain N configuration frequency parameters based on the preset value and the first preset rule, where N is an integer greater than 1;

[0020] The configuration module is used to output the N configuration frequency parameters to the connected device based on a preset time interval and a preset sequence rule.

[0021] The collection module is used to collect the current values corresponding to the simple harmonic waves generated by the device according to each of the configuration frequency parameters;

[0022] waves;

[0023] The screening module is used to screen each of the current values according to the second preset rule,

[0024] obtain the optimal current value, and use the configuration frequency parameter corresponding to the optimal current value as the optimal frequency parameter.

[0025] Another embodiment of the present application further proposes an FPGA calibration board, including a controller and a memory,

[0026] The memory stores a computer program, and the controller executes the resonance frequency calibration method as described above by calling the computer program stored in the memory.

[0027] Another embodiment of the present application further provides a mass spectrometer, including a control module, a current feedback circuit, and an FPGA calibration board;

[0028] The control module is configured to generate corresponding simple harmonic waves according to a plurality of acquired configuration frequency parameters;

[0029] The current feedback circuit is configured to sequentially obtain the current value corresponding to each of the configuration frequency

[0030] parameters from the control module, and transmit each of the current values to the FPGA calibration board;

[0031] The FPGA calibration board is configured to execute the resonance frequency calibration method as described above to obtain an optimal frequency parameter for calibration.

[0032] Further, in the above mass spectrometer, the control module is further configured to receive the optimal frequency parameter output by the FPGA calibration board, and generate corresponding simple harmonic waves according to the optimal frequency parameter.

[0033] Another embodiment of the present application further provides a computer-readable storage medium storing a computer program, and the computer program is suitable for a processor to load and execute the steps of the resonance frequency calibration method as described above.

[0034] The embodiments of the present application have the following beneficial effects:

[0035] The embodiments of the present application provide a resonance frequency calibration method, which realizes the automatic calibration function of the resonance frequency through the lower computer, and through automatic frequency adjustment, the accuracy is greatly improved. It not only makes the operation speed faster, but also reduces a series of cumbersome processes because there is no need for the upper computer and manual participation, greatly shortening the time, and at the same time, it does not need to occupy CPU resources. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the present application, the drawings required for the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as limiting the protection scope of the present application. In each drawing, similar components are numbered similarly.

[0037] Figure 1 Shows a first flow diagram of the resonance frequency calibration method of some embodiments of the present application;

[0038] Figure 2 The second process schematic diagram of the resonance frequency calibration method according to some embodiments of the present application is shown;

[0039] Figure 3 The structural schematic diagram of the resonance frequency calibration device according to some embodiments of the present application is shown;

[0040] Figure 4 The structural schematic diagram of the mass spectrometer according to some embodiments of the present application is shown. Specific embodiments

[0041] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments.

[0042] Generally, the components of the embodiments of the present application described and shown in the accompanying drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application claimed, but merely represents the selected embodiments of the present application. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative efforts belong to the scope of protection of the present application.

[0043] Hereinafter, the terms "including", "having" and their cognates that can be used in various embodiments of the present application are only intended to represent specific features, numbers, steps, operations, elements, components or combinations of the foregoing items, and should not be construed as first excluding the existence of one or more other features, numbers, steps, operations, elements, components or combinations of the foregoing items or increasing the possibility of one or more features, numbers, steps, operations, elements, components or combinations of the foregoing items.

[0044] In addition, the terms "first", "second", "third", etc. are only used for distinguishing descriptions and cannot be understood as indicating or implying relative importance.

[0045] Unless otherwise limited, all terms (including technical terms and scientific terms) used here have the same meaning as those commonly understood by those of ordinary skill in the art to which various embodiments of the present application belong. The terms (such as those defined in a general-use dictionary) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning unless clearly defined in various embodiments of the present application.

[0046] Next, some embodiments of the present application will be described in detail in conjunction with the accompanying drawings. Without conflict, the following embodiments and the features in the embodiments can be combined with each other.

[0047] Generally, in actual hardware, due to certain errors in the accuracy of each component itself, if multiple components are integrated together, and there are also hardware errors between each instrument, the overall error will be even greater. Theoretically, since the values of theoretical calculation devices cannot be reached or are not easily reached in practice, generally, values close to them are found to replace them in practice, which will cause deviations between the actual and the theoretical. And these errors and deviations will result in the final output frequency not being the most ideal frequency. In order to enable each instrument to find the corresponding optimal AC oscillation frequency.

[0048] Therefore, the present application proposes a resonance frequency calibration method to solve the above problems.

[0049] Please refer to Figure 1 , which is a schematic flowchart of a resonance frequency calibration method proposed in an embodiment of the present application. Exemplarily, this resonance frequency calibration method is applied to a mass spectrometer.

[0050] In some embodiments, a resonance frequency calibration method may include:

[0051] S110, based on a preset value and a first preset rule, obtain N configuration frequency parameters, where N is an integer greater than 1.

[0052] Specifically, the preset value includes but is not limited to the reference frequency parameter to be adjusted and the adjustment accuracy, and the adjustment accuracy is called the step value. Therefore, the step value determines the difference between every two adjacent frequency parameters. The larger the step value, the larger the difference, and the lower the accuracy; conversely, the higher the accuracy. The first preset rule is how to adjust the reference frequency parameter according to the step value to obtain multiple configuration frequency parameters, where the configuration frequency parameter is the frequency parameter obtained by adjusting the reference frequency parameter according to the step value.

[0053] Furthermore, N can be any integer greater than 1 and is set according to actual requirements.

[0054] In some embodiments, the preset value in the resonance frequency calibration method includes a second preset step value and a preset reference frequency parameter, and the first preset rule includes:

[0055] Taking the second preset step value as the common difference coefficient, sequentially increase the preset reference frequency parameter X times and sequentially decrease it Y times to obtain the configuration frequency parameters for each increase and decrease, where X + Y + 1 = N, and both X and Y are integers greater than or equal to 1.

[0056] Specifically, the preset rule is how to adjust the reference frequency parameter according to the step value, and finally obtain multiple configured frequency parameters. The preset rule in this embodiment is called the first preset rule. Specifically, the first preset rule is to increase the preset reference frequency parameter by X times in sequence according to the second preset step value to obtain X new frequency parameters, and the new frequency parameters are called configured frequency parameters. Demonstratively, if the preset reference frequency parameter is 1 MHz, the second step value is 30 KHz, and X is 4, then 1 MHz is increased 4 times in sequence, with the step value of each increase being 30 KHz, and finally 1.03 MHz, 1.06 MHz, 1.09 MHz, and 1.12 MHz are obtained, a total of 4 configured frequency parameters.

[0057] Then, decrease the preset reference frequency parameter by Y times in sequence according to the second preset step value to obtain Y new frequency parameters, and the new frequency parameters are called configured frequency parameters. Demonstratively, if the preset reference frequency parameter is 1 MHz, the second step value is 30 KHz, and Y is 4, then 1 MHz is decreased 4 times in sequence, with the step value of each decrease being 30 KHz, and finally 0.97 MHz, 0.94 MHz, 0.91 MHz, and 0.88 MHz are obtained, a total of 4 configured frequency parameters. So far, all the configured parameters obtained by decreasing and increasing add up to 8 configured parameters, plus the preset reference frequency parameter, a total of 9 configured frequency parameters.

[0058] It can be imagined that the quantities of X and Y are not fixed values and can be selected according to the specific actual situation, which is not limited here.

[0059] Furthermore, in this embodiment, X and Y are not necessarily equal. Demonstratively, if the preset reference frequency parameter is 1 MHz, the second step value is 40 Hz, and X is 4, then 1 MHz is increased 4 times in sequence, with the step value of each increase being 40 KHz, and finally 1.04 MHz, 1.08 MHz, 1.12 MHz, and 1.16 MHz are obtained, a total of 4 configured frequency parameters. Y is 3, then 1 MHz is decreased 3 times in sequence, with the step value of each decrease being 40 KHz, and finally 0.96 MHz, 0.92 MHz, and 0.88 MHz are obtained, a total of 3 configured frequency parameters. So far, all the configured parameters obtained by decreasing and increasing add up to 7 configured parameters, plus the preset reference frequency parameter, a total of 8 configured frequency parameters.

[0060] Alternatively, in the same embodiment, the increased step value and the decreased step value can be different, i.e., there are two different step values. Exemplarily, if the preset reference frequency parameter is 1 MHz, the second step value is 40 Hz, and X is 4, then 1 MHz is increased 4 times in sequence, with the step value of each increase being 40 KHz. Finally, 1.04 MHz, 1.08 MHz, 1.12 MHz, and 1.16 MHz are obtained, a total of 4 configured frequency parameters. Y is 3, but the decreased step value can be selected as 30 KHz, and finally 0.97 MHz, 0.94 MHz, and 0.91 MHz are obtained, a total of 3 configured frequency parameters. So far, adding up all the configured parameters for decrease and increase, there are a total of 7 configured parameters, and adding the preset reference frequency parameter, there are a total of 8 configured frequency parameters.

[0061] S210, based on the preset time interval, preset sequence rule, and N configured frequency parameters, sequentially obtain the current values corresponding to each configured frequency parameter.

[0062] Specifically, according to the preset sequence rule and preset time interval, sequentially generate the simple harmonic waves corresponding to all the obtained configured frequency parameters. When generating the corresponding simple harmonic waves, since the backend drive part of the mass spectrometer acts as an impedance, during the process of tuning the frequency, due to different impedances, the corresponding interrupted currents will be different. Therefore, by detecting the current of the simple harmonic wave corresponding to each frequency, the optimal frequency parameter can be selected.

[0063] Optionally, in the resonance frequency calibration method of any of the above embodiments, the preset time interval can be any value from 1 to 5 microseconds. Of course, it can also be other values, which are not limited here.

[0064] Specifically, since when generating the simple harmonic wave corresponding to each frequency parameter, it is necessary to make the corresponding configuration completed, the transmitted signal reach the stable state, and the feedback circuit acquisition preparation completed, all these tasks require a certain amount of time. Therefore, the time interval is increased to allow the relevant circuits to have sufficient time to prepare and the corresponding data to reach the stable state.

[0065] S310, screen each current value according to the second preset rule to obtain the optimal current value, and use the configured frequency parameter corresponding to the optimal current value as the optimal frequency parameter.

[0066] Specifically, during the process of tuning the frequency, when the impedance of the backend drive part is the largest, its resonance effect is the best. Therefore, when the detected current value is the smallest, it means that the frequency parameter corresponding to the smallest current value is the optimal frequency parameter. Among them, the second preset rule includes taking the smallest current value among the current values corresponding to each configured frequency parameter as the optimal current value.

[0067] In some embodiments, such asFigure 2 As shown, the preset values in the resonance frequency calibration method include a first preset step value, and further include:

[0068] S410. Based on the first preset step value, the optimal frequency parameter, and the first preset rule, obtain M new configured frequency parameters, where M is an integer greater than 1, and the optimal frequency parameter serves as the new reference frequency parameter.

[0069] Specifically, in order to find a better frequency parameter, fine-tuning is required after rough tuning. Therefore, on the premise of the optimal frequency parameter obtained after the above-mentioned rough tuning, this optimal frequency parameter needs to be used as the new reference frequency parameter, and it is further adjusted to multiple new configured frequency parameters, and then a new optimal frequency parameter is found from them. Since more precise adjustment is carried out based on the optimal frequency parameter in the rough tuning, the first preset step value in this embodiment is smaller than the second preset step value in the rough tuning.

[0070] In addition, the first preset rule further includes that when the second adjustment (fine tuning) is performed on the basis of the first adjustment (rough tuning), the first preset step value is used as the arithmetic difference coefficient, and the preset reference frequency parameter is increased A times and decreased B times in sequence to obtain the configured frequency parameters for each increase and decrease, where A + B + 1 = M, and both A and B are integers greater than or equal to 1. Of course, the number M of the configured frequency parameters in this embodiment may be the same as or different from the number N of the configured frequency parameters in the rough tuning, and it needs to be selected according to the specific situation, which is not limited here. Among them, A and B may be equal or not equal, depending on the specific situation.

[0071] Exemplarily, if the preset reference frequency parameter in the rough tuning is 1 MHz, the second step value is 30 KHz, X is 4, and Y is 4, then after increasing and decreasing 1 MHz 4 times in sequence, finally 0.88 MHz, 0.91 MHz, 0.94 MHz, 0.97 MHz, 1.03 MHz, 1.06 MHz, 1.09 MHz, and 1.12 MHz are obtained, a total of 8 configured frequency parameters. Adding the preset reference frequency parameter, there are a total of 9 configured frequency parameters, which are 0.88 MHz, 0.91 MHz, 0.94 MHz, 0.97 MHz, 1 MHz, 1.03 MHz, 1.06 MHz, 1.09 MHz, and 1.12 MHz. If the optimal frequency parameter obtained through the current value feedback is 1.03 MHz finally, then 1.03 MHz is used as the reference frequency parameter in the fine tuning.

[0072] In the fine tuning, if the first step value is 5 KHz and A = B = 4, the last M configured frequency parameters obtained are 1.01 MHz, 1.015 MHz, 1.02 MHz, 1.025 MHz, 1.035 MHz, 1.04 MHz, 1.045 MHz, and 1.05 MHz respectively. Adding the reference frequency parameter, all the configured frequency parameters are 1.01 MHz, 1.015 MHz, 1.02 MHz, 1.025 MHz, 1.03 MHz, 1.035 MHz, 1.04 MHz, 1.045 MHz, and 1.05 MHz respectively.

[0073] S510, based on a preset time interval and the new M configured frequency parameters, sequentially obtain the current values corresponding to each new configured frequency parameter.

[0074] S610, screen each current value according to a second preset rule to obtain a new optimal current value, and use the configured frequency parameter corresponding to the new optimal current value as the new optimal frequency parameter.

[0075] It can be understood that the resonance frequency calibration methods in S510 and S610 of this embodiment respectively correspond to the resonance frequency calibration methods in S210 and S310 of the above embodiment. Among them, the optional items of the above resonance frequency calibration method are also applicable to this embodiment, and will not be described repeatedly here.

[0076] Further, after the fine tuning in the above implementation manner, fine tuning can be performed again. It can be imagined that the step value of the second fine tuning will be smaller than that of the previous fine tuning, so that better frequency parameters can be obtained. Place the obtained optimal frequency parameters in the specified register and configure them into the control module to provide a specific frequency for its subsequent instrument operation.

[0077] The embodiment of the present application proposes a resonance frequency calibration method, which realizes the automatic calibration function through the lower computer, and through automatic frequency adjustment, greatly improves the accuracy. It not only makes the operation speed faster, but also reduces a series of cumbersome processes because there is no need for the upper computer and manual participation, greatly shortens the time, and at the same time does not need to occupy CPU resources.

[0078] Another embodiment of the present application also proposes a resonance frequency calibration device 700, as Figure 3 shown. The resonance frequency calibration device 700 includes:

[0079] A receiving module 710, a calculation module 720, a configuration module 730, a collection module 740, and a screening module 750;

[0080] The receiving module 710 is used to receive a preset value and transmit the preset value to the calculation module 720;

[0081] A calculation module 720, configured to obtain N configuration frequency parameters based on a preset value and a first preset rule, where N is an integer greater than 1;

[0082] A configuration module 730, configured to output the N configuration frequency parameters to a connected device based on a preset time interval and a preset sequence rule.

[0083] An acquisition module 740 is configured to acquire the current value corresponding to the simple harmonic wave generated by the device according to each configuration frequency parameter;

[0084] A screening module 750, configured to screen each current value according to a second preset rule to obtain an optimal current value, and use the configuration frequency parameter corresponding to the optimal current value as the optimal frequency parameter.

[0085] Another embodiment of the present application further provides an FPGA calibration board 800, as Figure 4 shown, including a controller and a memory. A computer program is stored in the memory. The controller executes the resonance frequency calibration method as described above by calling the computer program stored in the memory.

[0086] Another embodiment of the present application further provides a mass spectrometer 900, as Figure 4 shown, including a control module 910, a feedback circuit 920, and an FPGA calibration board 800;

[0087] The control module 910 is configured to output a corresponding simple harmonic wave according to each obtained configuration frequency parameter.

[0088] The feedback circuit 920 is configured to sequentially obtain the current value corresponding to each configuration frequency parameter and transmit each current value to the FPGA calibration board 800.

[0089] Specifically, the control module 910 may be a Direct Digital Synthesis (DDS) chip, and of course, it may also be other chips or control modules that can achieve the same function.

[0090] Further, in the above mass spectrometer, the control module 910 is further configured to receive the optimal frequency parameter output by the FPGA calibration board 800 and generate a corresponding simple harmonic wave according to the optimal frequency parameter.

[0091] It can be understood that the method steps of this embodiment correspond to the resonance frequency calibration method in the above embodiment. Among them, the optional items of the above resonance frequency calibration method are also applicable to this embodiment, and will not be repeated here.

[0092] Another embodiment of the present application further provides a computer-readable storage medium storing a computer program, which is adapted to be loaded by a processor to execute the steps of the resonant frequency calibration method as described above.

[0093] It can be understood that the method steps of this embodiment correspond to the resonant frequency calibration method in the above embodiment. Among them, the optional items of the above resonant frequency calibration method are also applicable to this embodiment and will not be described repeatedly here.

[0094] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are only illustrative. For example, the flowcharts and structure diagrams in the drawings show the possible architectures, functions, and operations of the devices, methods, and computer program products according to multiple embodiments of the present application. In this regard, each block in the flowchart or block diagram may represent a module, a program segment, or a part of code, and the module, program segment, or part of code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in an alternative implementation, the functions marked in the block may occur in a different order from that marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the structure diagram and / or flowchart, as well as the combination of blocks in the structure diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0095] In addition, each functional module or unit in each embodiment of the present application may be integrated together to form an independent part, or each module may exist alone, or two or more modules may be integrated to form an independent part.

[0096] When the above-mentioned functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of this application, in essence, or the part that contributes to the prior art or a part of this technical solution can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a smart phone, a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs.

[0097] The above is only the specific implementation manner of this application, but the protection scope of this application is not limited thereto. Any person skilled in the art within the technical scope disclosed by this application can easily think of changes or substitutions, which should all be covered within the protection scope of this application.

Claims

1. A resonance frequency calibration method, characterized in that, Including: Based on a preset value and a first preset rule, N configuration frequency parameters are obtained, where N is an integer greater than 1; wherein, the preset value includes a second preset step value and a preset reference frequency parameter, and the first preset rule includes: using the second preset step value as an adjustment coefficient, increasing the preset reference frequency parameter by X times and decreasing it by Y times in sequence, respectively obtaining the configuration frequency parameters after each increase and decrease, where X + Y + 1 = N, and both X and Y are integers greater than or equal to 1; Based on a preset time interval and the N configuration frequency parameters, the current values corresponding to each configuration frequency parameter are sequentially obtained according to a preset order; According to a second preset rule, each of the current values is screened to obtain an optimal current value, and the configuration frequency parameter corresponding to the optimal current value is used as the optimal frequency parameter; wherein, the second preset rule includes: using the smallest one of the current values corresponding to each configuration frequency parameter as the optimal current value.

2. The resonance frequency calibration method according to claim 1, wherein The preset value includes a first preset step value, and the method further includes: Taking the optimal frequency parameter obtained at the previous moment as a new reference frequency parameter, and based on the first preset step value, the new reference frequency parameter and the first preset rule, M new configuration frequency parameters are obtained, where M is an integer greater than 1; Based on the preset time interval and the M configuration frequency parameters, the updated current values corresponding to the M new configuration frequency parameters are sequentially obtained; According to the second preset rule, each of the updated current values is screened to obtain a new optimal current value, and the configuration frequency parameter corresponding to the new optimal current value is used as the new optimal frequency parameter at the next moment.

3. The resonance frequency calibration method according to any one of claims 1-2, characterized in that The value range of the preset time interval is 1 to 5 microseconds.

4. A resonant frequency calibration device, characterized in that, Including: A receiving module, a calculation module, a configuration module, a collection module and a screening module; The receiving module is configured to receive a preset value and transmit the preset value to the calculation module; The calculation module is configured to obtain N configuration frequency parameters based on the preset value and a first preset rule, where N is an integer greater than 1; wherein, the preset value includes a second preset step value and a preset reference frequency parameter, and the first preset rule includes: using the second preset step value as an adjustment coefficient, increasing the preset reference frequency parameter by X times and decreasing it by Y times in sequence, respectively obtaining the configuration frequency parameters after each increase and decrease, where X + Y + 1 = N, and both X and Y are integers greater than or equal to 1; The configuration module is configured to output the N configuration frequency parameters to the connected device in sequence according to a preset order based on a preset time interval; The collection module is configured to collect the current values corresponding to the simple harmonic waves generated by the device according to each configuration frequency parameter; The screening module is configured to screen each of the current values according to a second preset rule to obtain an optimal current value, and use the configuration frequency parameter corresponding to the optimal current value as the optimal frequency parameter; wherein, the second preset rule includes: taking the smallest one of the current values corresponding to each of the configuration frequency parameters as the optimal current value.

5. An FPGA calibration board, characterized in that, It includes a controller and a memory, and a computer program is stored in the memory. The controller executes the resonance frequency calibration method according to any one of claims 1-3 by calling the computer program stored in the memory.

6. A mass spectrometer, characterized in that, It includes a control module, a current feedback circuit, and an FPGA calibration board; The control module is configured to generate corresponding simple harmonic waves according to a plurality of obtained configuration frequency parameters; The current feedback circuit is configured to sequentially obtain the current value corresponding to each of the configuration frequency parameters from the control module, and transmit each of the current values to the FPGA calibration board; The FPGA calibration board is configured to execute the resonance frequency calibration method according to any one of claims 1-3 to obtain an optimal frequency parameter for calibration.

7. The mass spectrometer according to claim 6, wherein The control module is further configured to receive the optimal frequency parameter output by the FPGA calibration board, and generate corresponding simple harmonic waves according to the optimal frequency parameter.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, and the computer program is suitable for being loaded by a processor to execute the steps of the resonance frequency calibration method according to any one of claims 1 to 3.

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