An optical inspection device

Abstract

The optical inspection device comprises a base, a first detection assembly and a second detection assembly. The base is provided with a structure assembly to be measured and is suitable for accommodating the structure assembly to be measured. The first detection assembly is arranged on the base and is provided with a first optical detection unit and a first movement structure. The first optical detection unit is arranged towards the structure assembly to be measured and is suitable for moving under the action of the first movement structure and detecting a first feature of the structure assembly to be measured. The second detection assembly is arranged on the base and is provided with a second optical detection unit, a second movement structure and a plurality of auxiliary detection units. The auxiliary detection units are arranged adjacent to the second optical detection unit and form a reflection detection light path with the second optical detection unit. The second optical detection unit is suitable for moving under the action of the second movement structure and detecting a second feature of the structure assembly to be measured through reflection.

Description

Technical Field

[0001] This invention relates to the field of optical instrument technology, and more specifically to an optical testing device. Background Technology

[0002] Optical testing is a technique that utilizes the various optical properties of substances to perform qualitative, quantitative, and structural analysis of substances. It includes optical rotation detection, optical analysis detection, fluorescence detection, spectrophotometric detection, and scattering spectroscopy detection. Currently, especially in the field of medical instruments and equipment, optical testing is widely used as one of the core detection technologies.

[0003] Currently, the development of medical instruments, such as testing devices or identification and detection elements, usually requires optical feasibility data to assist in the instrument development process. However, in the existing technology, the optical feasibility data of the instrument can only be obtained through repeated experiments during the development and design process, which is inefficient. Furthermore, existing optical testing equipment is usually used for data testing and effect verification after the medical instrument has been designed, manufactured, and assembled. This makes it difficult to apply the testing to the initial design and development of medical instruments due to its poor versatility. Summary of the Invention

[0004] Therefore, the technical problem to be solved by the present invention is to overcome the defect of low efficiency in acquiring optical feasibility data in the design process of medical instruments in the prior art, thereby providing an optical inspection device.

[0005] This invention provides an optical inspection device, comprising: a base on which a component to be tested is disposed, adapted to accommodate the component to be tested; a first detection component disposed on the base, the first detection component having a first optical detection unit and a first motion structure, the first optical detection unit being disposed toward the component to be tested, the first optical detection unit being adapted to move under the action of the first motion structure and detect a first feature of the component to be tested; and a second detection component disposed on the base, the second detection component having a second optical detection unit, a second motion structure and a plurality of auxiliary detection units, the auxiliary detection units being disposed adjacent to the second optical detection unit, the auxiliary detection units and the second optical detection unit forming a reflection detection optical path, the second optical detection unit being adapted to move under the action of the second motion structure and detect a second feature of the component to be tested by reflection.

[0006] The component under test includes a first test element and / or a second test element; the structural component under test includes a first structural component under test and / or a second structural component under test. The first structural component under test is disposed on the base to accommodate and limit the first test element. A detection opening is provided on the top side of the first structural component under test. The second structural component under test is disposed on the base. The second structural component under test includes a test motion structure and a limiting test element connected to each other. The limiting test element is adapted to accommodate and limit the second test element and moves toward or away from the second detection component under the action of the test motion structure.

[0007] The first motion structure includes: a first horizontal motion component, including a first horizontal support and a first guide member, the first guide member being disposed on the base, the first guide member being adjacent to the first structure under test, and the extension line of the first guide member along a first direction being spaced apart from the first structure under test, the first horizontal support being movably connected to the first guide member, and adapted to reciprocate along the first guide member under the action of an external force; and a first lifting motion component, including a first lifting support and a second guide member, the second guide member extending in a direction away from the base and connected to the first horizontal support, the first lifting support being movably connected to the second guide member, and the first lifting support being adapted to move along the second guide member in a third upward direction;

[0008] The first telescopic motion assembly includes a first telescopic platform and a third guide member. The third guide member is connected to the first lifting platform and extends in a direction toward the first structure to be tested. The first telescopic platform is connected to the first optical detection unit. The first telescopic platform and the third guide member are movably connected. The first telescopic platform is adapted to move along the third guide member in a second direction.

[0009] The first motion structure further includes: a first angle adjustment unit, which is connected between the first guide member and the second guide member, and / or connected between the second guide member and the third guide member, and / or connected between the first telescopic support and the first optical detection unit. The first angle adjustment unit is adapted to adjust the angle of the first optical detection unit toward the first structure under test.

[0010] The first angle adjustment unit includes: a connecting platform connected to the first telescopic support; and a first adjustment part including a first adjustment end and an adjustment shaft connected together. The adjustment shaft passes through the connecting platform and is movably connected to the connecting platform. The two ends of the adjustment shaft are respectively connected to the first optical detection unit and the first adjustment end. The adjustment shaft is adapted to rotate circumferentially along itself under the action of the first adjustment end.

[0011] The second motion structure includes: a second horizontal motion component, including a fourth guide member disposed on the base, the fourth guide member being adjacent to the second test structure; and a second clamping motion component movably connected to the fourth guide member. The second clamping motion component includes a detection space, the detection space housing a second optical detection unit and a plurality of auxiliary detection units disposed opposite to it. The detection space is adapted to accommodate the second test piece. The second optical detection unit has a first detection state that is oriented toward the second test piece and acquires an image of the second test piece in the detection space. The second optical detection unit also has a second detection state that is oriented toward the auxiliary detection units and acquires an image of the second test piece reflected by the auxiliary detection units.

[0012] The second clamping motion assembly further includes: at least two clamping components arranged in pairs, the clamping components being movably connected to the fourth guide member, the detection space being formed by clamping the two clamping components in the same pair, and the auxiliary detection unit being respectively arranged on the opposite side of the two clamping components in the same pair, wherein at least one of them is provided with the second optical detection unit, and the pair of clamping components are adapted to move towards each other or away from each other.

[0013] The clamping assembly includes: a movable slider disposed on the fourth guide and movably connected to the fourth guide; an adjusting platform connected to the movable slider, forming the detection space between the adjusting platform on the adjacent clamping assembly, the adjusting platform including a reflective part and an imaging part, the reflective part and the imaging part being disposed adjacent to each other along a third direction, the second optical detection unit being detachably connected to the periphery of the imaging part, the reflective part being inclined toward the adjusting platform on the adjacent clamping assembly, and the auxiliary detection unit being disposed on its inner side; a second adjusting part including a second adjusting end and an adjusting rod connected together, the reflective part being provided with an adjusting elongated hole, one end of the adjusting rod away from the second adjusting end passing through the adjusting elongated hole and connected to the auxiliary detection unit, the second adjusting end being adapted to move along the adjusting elongated hole.

[0014] The motion structure to be tested includes: a third horizontal motion assembly, comprising a second horizontal support and a fifth guide member, the fifth guide member being disposed on the base and extending toward the second detection assembly; the second horizontal support and the fifth guide member being movably connected; the second horizontal support being adapted to move along the extension direction of the fifth guide member; and a third lifting motion assembly, comprising a second lifting support and a sixth guide member, the sixth guide member extending away from the base and connected to the second horizontal support; the second lifting support and the sixth guide member being movably connected; the second lifting support being adapted to move along the extension direction of the sixth guide member; the sixth guide member being connected to the limiting test member; and the limiting test member extending in the same direction as the fourth guide member.

[0015] The connecting platform and the adjusting elongated hole are provided with adjustment scales; the first horizontal support platform, the first lifting support platform, the first telescopic support platform, the movable slider, the second horizontal support platform, and the second lifting support platform are provided with adjustment knobs, which are suitable for adjusting the movement stroke of the corresponding structures, and the adjustment knobs are provided with adjustment scales along the circumference.

[0016] The limiting component to be tested includes: a connecting part, which is detachably connected to the second lifting platform; and a limiting component, which is disposed on the connecting part and includes a first limiting part and / or a second limiting part, wherein the first limiting part is adapted to accommodate and limit the second component to be tested along a first preset direction of the second component to be tested, and the second limiting part is adapted to accommodate and limit the second component to be tested along a second preset direction of the second component to be tested.

[0017] The first limiting part includes a first limiting groove and a plurality of first limiting members. The first limiting groove is disposed on the connecting part and is disposed toward the second detection component. The first limiting members are distributed along the inner sidewall of the first limiting groove and are adapted to abut against and limit the second test component.

[0018] And / or,

[0019] The second limiting part includes a second limiting groove and a second limiting member. The second limiting groove is disposed on the connecting part and is disposed toward the second detection component. The second limiting member is distributed along the inner sidewall of the second limiting groove and is adapted to abut against and limit the second test piece.

[0020] The first limiting member and / or the second limiting member are configured as glass bead screws.

[0021] The first limiting groove is a through groove, and a limiting baffle is provided at one end of the first limiting groove away from the second detection component. The limiting baffle is detachably connected to the connecting part.

[0022] The optical testing device also includes a supplementary light structure, which is disposed on the base and distributed between the first structure to be tested and the second structure to be tested.

[0023] The supplementary lighting structure includes: several supplementary lighting plates, including a bright supplementary lighting surface and a dark surface arranged opposite to each other; several magnetic attraction structures are arranged on the base, distributed between the first structure under test and the structure under test, and magnetically connected to the supplementary lighting plates. The supplementary lighting plates have a supplementary lighting state with the bright supplementary lighting surface facing up and the dark surface facing down, and a backlight state when flipped under the action of external force with the bright supplementary lighting surface facing down and the dark surface facing up.

[0024] The first optical detection unit includes: a first optical detection body; and a receiving seat, including a first receiving cavity and an optical seat hole disposed on the bottom side of the first receiving cavity. The first receiving cavity houses the first optical detection body, and the optical seat hole is disposed toward the component under test. The first optical detection body is adapted to detect the component under test through the optical seat hole.

[0025] The housing also includes: a second housing cavity containing a distance detection unit; a distance measuring hole disposed on the bottom side of the second housing cavity, the distance measuring hole being disposed toward the structural component to be tested, the distance measuring hole being adjacent to and spaced apart from the optical seat hole, and the distance detection unit being adapted to detect the distance between itself and the component to be tested through the distance measuring hole.

[0026] The technical solution of this invention has the following advantages:

[0027] 1. An optical inspection device provided by the present invention includes: a base on which a component to be tested is disposed, adapted to accommodate the component to be tested; a first detection component disposed on the base, the first detection component having a first optical detection unit and a first motion structure disposed thereon, the first optical detection unit being disposed toward the component to be tested, the first optical detection unit being adapted to move under the action of the first motion structure and detect a first feature of the component to be tested; and a second detection component disposed on the base, the second detection component having a second optical detection unit, a second motion structure and a plurality of auxiliary detection units disposed thereon, the auxiliary detection units being disposed adjacent to the second optical detection unit, the auxiliary detection units and the second optical detection unit forming a reflection detection optical path, the second optical detection unit being adapted to move under the action of the second motion structure and detect a second feature of the component to be tested by reflection.

[0028] The first detection component is equipped with a first optical detection unit, oriented towards the component under test. This allows the first optical detection unit to detect the component under test via direct imaging. Simultaneously, the first optical detection unit moves under the action of a first moving structure, allowing adjustment of the detection distance between the first optical detection unit and the component under test. This facilitates the user in selecting a detection position with better detection quality, providing effective optical feasibility data. The second detection component is equipped with a second optical detection unit and several auxiliary detection units. The auxiliary units enable reflective imaging of the component under test. Simultaneously, the first optical detection unit, moving under the action of the first moving structure, measures reflective imaging, thus enabling the second optical detection unit to detect reflective imaging, expanding the range of optical detection data. The coordinated arrangement of the first and second detection components allows for the simultaneous detection and acquisition of data related to both fluorescence signals and QR code signals. This improves the range and efficiency of optical feasibility data acquisition in the medical instrument design process, offering broad applicability and overcoming the shortcomings of existing technologies, such as low efficiency in acquiring optical feasibility data and poor versatility of existing optical detection equipment.

[0029] 2. The optical inspection device provided by the present invention further includes: a first angle adjustment unit, which is connected and disposed between the first guide member and the second guide member, and / or connected and disposed between the second guide member and the third guide member, and / or connected and disposed between the first telescopic support and the first optical detection unit, wherein the first angle adjustment unit is adapted to adjust the angle of the first optical detection unit toward the first structure to be tested.

[0030] By setting a first angle adjustment unit, the motion freedom of the first optical detection unit can be increased on the combined structure of the first horizontal motion component, the first lifting motion component, and the first telescopic motion component. This allows the unit to move within a spatial range and adjust its detection angle relative to the first test piece, thereby further improving detection accuracy and expanding the range of optical detection data.

[0031] 3. The optical inspection device provided by the present invention includes a test motion structure comprising: a third horizontal motion component, including a second horizontal support and a fifth guide member, the fifth guide member being disposed on the base and extending toward the second detection component; the second horizontal support and the fifth guide member being movably connected; the second horizontal support being adapted to move along the extension direction of the fifth guide member; and a third lifting motion component, including a second lifting support and a sixth guide member, the sixth guide member extending away from the base and connected to the second horizontal support; the second lifting support and the sixth guide member being movably connected; the second lifting support being adapted to move along the extension direction of the sixth guide member; the sixth guide member being connected to the limiting test member; and the limiting test member extending in the same direction as the fourth guide member.

[0032] Since the fifth guide is set on the base and extends towards the second detection component in the first direction, and is coordinated with the sixth guide away from the base, the test piece can be limited to move in the vertical plane. At the same time, since the test piece and the fourth guide extend in the same direction, the test motion structure and the second motion structure cooperate with each other to realize the movement of the test piece relative to the second detection component within the spatial range, thereby realizing the precise adjustment of the second detection piece in the detection space. Furthermore, this setting optimizes the distribution position of the second test structure and the second detection component, reducing the space occupied by the equipment.

[0033] 4. The optical inspection device provided by the present invention includes adjustment scales on the connecting platform and the adjustment elongated hole; adjustment knobs are provided on the first horizontal support platform, the first lifting support platform, the first telescopic support platform, the movable slider, the second horizontal support platform, and the second lifting support platform, which are suitable for adjusting the movement stroke of the corresponding structures, and the adjustment knobs are provided with adjustment scales along the circumference.

[0034] By setting adjustment scales at locations such as the connecting platform, adjustment elongated holes, various support platforms, or movable sliders, users can accurately locate, identify, and record the required position data, thereby improving the accuracy and convenience of optical inspection. Attached Figure Description

[0035] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0036] Figure 1 This is a three-dimensional structural diagram of the optical inspection device provided in an embodiment of the present invention;

[0037] Figure 2 for Figure 1 A partial three-dimensional structural diagram of the optical testing device shown from another angle;

[0038] Figure 3 for Figure 1 A three-dimensional structural schematic diagram of the optical testing device shown from another angle;

[0039] Figure 4 for Figure 1 A three-dimensional structural diagram of the second motion structure in the optical inspection device shown;

[0040] Figure 5 for Figure 1 A schematic diagram of the three-dimensional structure of the optical testing device shown, which limits the test piece.

[0041] Figure 6 for Figure 5 A three-dimensional structural diagram of the optical testing device shown, which limits the test piece at another angle;

[0042] Figure 7 for Figure 1 A three-dimensional structural diagram of the supplementary light plate and magnetic attraction structure in the optical inspection device shown;

[0043] Figure 8 for Figure 1 A three-dimensional structural diagram of the first optical detection unit in the optical inspection device shown.

[0044] Explanation of reference numerals in the attached figures:

[0045] 1. Base; 11. Filler plate; 12. Magnetic suction structure; 2. First motion structure; 21. First horizontal support platform; 22. First guide component; 23. First lifting support platform; 24. Second guide component; 25. First telescopic support platform; 26. Third guide component; 27. First angle adjustment unit; 271. Connecting platform; 272. First adjustment part; 28. First optical detection unit; 281-First optical detection body; 282-Receiving seat; 283-Light seat hole; 284-Range measuring hole; 29-Distance detection unit; 3. Second motion structure; 31. Fourth guide component; 32. Clamping assembly; 321. Movable slider; 322. Detection space; 3 23. Reflecting part; 324. Imaging part; 325. Second adjustment part; 326. Adjustment elongated hole; 33. Second optical detection unit; 34. Detection unit mounting base; 35. Spring component; 36. Fastening screw; 4. First structure to be tested; 41. Detection opening; 5. Second structure to be tested; 51. Detection moving structure; 511. Second horizontal support platform; 512. Fifth guide component; 513. Second lifting support platform; 514. Sixth guide component; 52. Limiting component to be tested; 521. Connecting part; 522. First limiting part; 523. Second limiting part; 524. Limiting baffle; 6. Auxiliary detection unit; 7. Spare optical detection unit mounting platform. Detailed Implementation

[0046] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0047] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0048] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0049] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0050] like Figure 1 - Figure 8 This embodiment provides an optical inspection device, including: a base 1, a first detection component, and a second detection component.

[0051] The base 1 is arranged in a planar platform shape, on which a test component is disposed, suitable for accommodating the test component. In this embodiment, the test component has a first feature and a second feature. Specifically, the first feature is fluorescence information, and the second feature is QR code information. As a variable implementation, the first feature can also be QR code information, and the second feature can be fluorescence information. As other variable implementations, the first or second feature can also be optical rotation information, optical analysis information, spectrophotometric information, scattering spectrum information, etc. Specifically, the test component includes a first test piece and a second test piece. The first test piece has the first feature, and the second test piece has the second feature. As a variable implementation, a single test piece can also have both features simultaneously. Further, the first test piece can specifically be a test card or test strip with a fluorescently labeled sample, and the second test piece can be a test card or test strip with a QR code. As a variable implementation, the first test piece can also be a test card or test strip with an optical rotation labeled sample, an optical analysis labeled sample, a spectrophotometric labeled sample, or a scattering spectrum labeled sample. As another alternative implementation, the component under test may include only one of the first test element and the second test element. As another alternative implementation, the base 1 is non-planar.

[0052] The first detection component is mounted on the base 1, and includes a first optical detection unit 28 and a first motion structure 2. The first optical detection unit 28 is positioned towards the component under test and is adapted to move under the action of the first motion structure 2 to identify and detect the first feature of the component under test. The second detection component is mounted on the base 1, and includes a second optical detection unit 33, a second motion structure 3, and several auxiliary detection units 6. The auxiliary detection units 6 are adjacent to the second optical detection unit 33 and are adapted to reflect the image of the component under test. The second optical detection unit 33 is located at the end of the imaging optical path. The auxiliary detection units 6 and the second optical detection unit 33 together form the reflection detection optical path. The second optical detection unit 33 is adapted to move under the action of the second motion structure 3 and identify and detect the reflection image of the auxiliary detection units 6, thereby realizing the reflection detection of the second feature of the component under test.

[0053] Specifically, the auxiliary detection unit 6 is configured as a reflective lens, or it can be a reflective film, etc. The first optical detection unit 28 and the second optical detection unit 33 are specifically cameras or photosensitive components. In this embodiment, the first optical detection unit 28 is configured to correspond to the first device under test. Specifically, the first optical detection unit 28 includes: a first optical detection body 281 and a receiving seat 282. The first optical detection body 281 is specifically a fluorescence detector or other photodetector. The receiving seat 282 is block-shaped, with one end connected to the first angle adjustment unit 27. Specifically, it includes a first receiving cavity and a light seat hole 283 disposed on the bottom side of the first receiving cavity. The first receiving cavity is preferably configured as a groove, and the first optical detection body 281 can be embedded inside it. The light seat hole 283 is configured to face the direction of the structural component under test. The first optical detection body 281 can detect the component under test through the light seat hole 283.

[0054] Furthermore, the receiving base 282 also includes a second receiving cavity, which is groove-shaped and has a distance detection unit 29 embedded therein. Specifically, it is a laser rangefinder or other distance sensor. A distance measuring hole 284 is disposed on the bottom side of the second receiving cavity and is oriented towards the component to be measured. The distance measuring hole 284 is adjacent to and spaced apart from the optical seat hole 283. The distance detection unit 29 can detect the distance between itself and the component to be measured through the distance measuring hole 284. As an alternative implementation, the second receiving cavity and the distance detection unit 29 may also be omitted.

[0055] The second optical detection unit 33 is set to the second device under test, specifically a camera.

[0056] The first detection component is equipped with a first optical detection unit 28, which is oriented towards the component under test. This allows the first optical detection unit 28 to detect the component under test through direct imaging. Simultaneously, the first optical detection unit 28 moves under the action of the first motion structure 2, allowing adjustment of the detection distance between the first optical detection unit 28 and the component under test. This facilitates the user in selecting a detection position with better detection quality, providing effective optical detection feasibility data. The second detection component is equipped with a second optical detection unit 33 and several auxiliary detection units 6. These auxiliary units enable reflective imaging of the component under test. Simultaneously, the first optical detection unit 28, moving under the action of the first motion structure 2, can measure reflective imaging. This allows the second optical detection unit 33 to detect reflective imaging, expanding the range of optical detection data. The coordinated arrangement of the first and second detection components improves the range and efficiency of acquiring optical feasibility data in the medical instrument design process. It has a wide range of applications and overcomes the shortcomings of existing technologies, such as low efficiency in acquiring optical feasibility data in the medical instrument design process and poor versatility of existing optical detection equipment.

[0057] In this embodiment, the structure under test includes a first structure under test 4 and a second structure under test 5.

[0058] The first test structure 4 is disposed on the base 1 and is suitable for accommodating and limiting the first test piece. Specifically, the first test structure 4 is disposed in the form of a planar slot with the slot opening disposed laterally and parallel to or at a small angle to the plane of the base 1, so that the user can insert the test card or test strip into the first test structure 4 through the slot opening. A test opening 41 is provided on the top surface of the planar slot, which can expose the fluorescent marked sample on the test card or test strip.

[0059] The second test structure 5 is disposed on the base 1 and includes a test motion structure 51 and a limiting test component 52 connected to each other. The limiting test component 52 is used to accommodate and limit the second test component, and moves in the direction toward or away from the second detection component under the action of the test motion structure 51. This movement can be within a spatial range, a planar range or a linear range. In this embodiment, it is a planar range movement.

[0060] Specifically, the first motion structure 2 includes: a first horizontal motion component, a first lifting motion component, and a first telescopic motion component.

[0061] The first horizontal motion component includes a first horizontal support 21 and a first guide 22. The first guide 22 is disposed on the base 1 and is adjacent to the first structure under test 4. The extension line of the first guide 22 along the X-axis is spaced apart from the first structure under test 4. Specifically, the first guide 22 is adjacent to and spaced apart from the first structure under test 4. The first direction of the first guide 22 is in the same direction as the slot opening direction of the first structure under test 4. The first horizontal support 21 is movably connected to the first guide 22 and can reciprocate along the first guide 22 under the action of external force. In this embodiment, a coordinate system is established along the base. The first direction is the X-axis direction of the upper plane of the base, the second direction is the Y-axis direction of the upper plane of the base, and the third direction is the Z-axis direction of the upper plane of the base.

[0062] The first lifting motion assembly includes a first lifting platform 23 and a second guide member 24. The second guide member 24 extends in a direction away from the base 1 and is connected to the first horizontal platform 21. The first lifting platform 23 is movably connected to the second guide member 24 and is adapted to reciprocate along the second guide member 24 under the action of external force.

[0063] The first telescopic motion assembly includes a first telescopic platform 25 and a third guide member 26. The third guide member 26 is connected to the first lifting platform 23 and extends in the direction toward the first structure to be tested 4. The first telescopic platform 25 is connected to the first optical detection unit 28 and is movably connected to the third guide member 26, and is adapted to reciprocate along the third guide member 26 in the second direction under the action of external force.

[0064] The first motion structure 2 further includes a first angle adjustment unit 27, which is connected and disposed between the first guide member 22 and the second guide member 24, or between the second guide member 24 and the third guide member 26, or between the first telescopic support platform 25 and the first optical detection unit 28, and is adapted to adjust the angle of the first optical detection unit 28 toward the first structure under test 4 under the action of external force. In this embodiment, the first angle adjustment unit 27 is disposed between the first telescopic support platform 25 and the first optical detection unit 28.

[0065] As a variable implementation, the first angle adjustment unit 27 can also be connected and disposed between the first guide member 22 and the second guide member 24, between the second guide member 24 and the third guide member 26, and between the first telescopic support platform 25 and the first optical detection unit 28, at two or above all three of them.

[0066] By setting the first angle adjustment unit 27, the motion freedom of the first optical detection unit 28 can be increased on the combined structure of the first horizontal motion component, the first lifting motion component and the first telescopic motion component. This allows the unit to move within a spatial range and adjust its detection angle relative to the first test piece, thereby further improving detection accuracy and expanding the range of optical detection data.

[0067] The first angle adjustment unit 27 includes a connecting platform 271 and a first adjustment part 272.

[0068] The connecting platform 271 is a semi-circular plate connected to the first telescopic support 25. The first adjustment part 272 includes a first adjustment end and an adjustment shaft connected together. The adjustment shaft passes through the center of the connecting platform 271 and is movably connected to the connecting platform 271. The two ends of the adjustment shaft are respectively connected to the first optical detection unit 28 and the first adjustment end. The first adjustment end can drive the adjustment shaft to rotate around its own circumference under the action of external force.

[0069] The second motion structure 3 includes: a second horizontal motion component and a second clamping motion component.

[0070] The second horizontal motion component includes a fourth guide 31, which is disposed on the base 1 and is adjacent to the second structure to be tested 5. Preferably, the fourth guide 31 is disposed adjacent to and spaced apart from the first guide wire and is perpendicular to each other.

[0071] The second clamping motion assembly is movably connected to the fourth guide member 31 and includes a detection space 322. The detection space 322 houses a second optical detection unit 33 and two opposing auxiliary detection units 6. The detection space 322 is adapted to accommodate a second test piece. The second optical detection unit 33 has a first detection state that faces the second test piece and acquires an image of the second test piece in the detection space 322, and a second detection state that faces the auxiliary detection units 6 and acquires an image of the second test piece reflected by the auxiliary detection units 6.

[0072] The second clamping motion assembly also includes at least two clamping components 32, which are arranged in pairs, and the specific number can be one pair, two pairs or more pairs.

[0073] The clamping assembly 32 is movably connected to the fourth guide member 31. A detection space 322 is formed between the two clamping assemblies 32 of the same pair. An auxiliary detection unit 6 is provided on the opposite side of the two clamping assemblies 32 of the same pair. One of them is provided with a second optical detection unit 33. The clamping assembly 32 is adapted to move towards or away from the clamping assembly 32 of the same pair under the action of external force.

[0074] The clamping assembly 32 includes: a movable slider 321, an adjusting platform, and a second adjusting part 325.

[0075] The movable slider 321 is mounted on the fourth guide member 31 and is movably connected to the fourth guide member 31. The adjusting platform is connected to the movable slider 321, and a detection space 322 is formed between it and the adjusting platform on the adjacent clamping assembly 32. The adjusting platform includes a reflective part 323 and an imaging part 324. The reflective part 323 is mounted on the upper side of the imaging part 324. As a changeable implementation, the two can also be reversed.

[0076] In this embodiment, a detection unit mounting base 34 and a second optical detection unit 33 are detachably sleeved and connected to the periphery of the imaging unit 324 on one of the two paired clamping components 32. The detection unit mounting base 34 is semi-frame shaped, and the second optical detection unit 33 is movably connected to the opening of the semi-frame of the detection unit mounting base 34 and faces toward the detection space 322. A spring member 35 and a fastening screw 36 are provided between the detection unit mounting base 34 and the imaging unit 324, and the position of the second optical detection unit 33 can be adjusted by the fastening screw 36. As an alternative implementation, the second optical detection unit 33 can be respectively disposed on the two paired clamping components 32.

[0077] Furthermore, the reflective part 323 is inclined toward the adjustment support on the adjacent clamping assembly 32, and an auxiliary detection unit 6 is provided on its inner side. The inclined reflective part 323 facilitates mutual reflection of the auxiliary detection units 6 on it and imaging onto the second optical detection unit 33.

[0078] The second adjustment part 325 includes a second adjustment end and an adjustment rod connected together. The reflective part 323 is provided with an adjustment elongated hole 326. One end of the adjustment rod away from the second adjustment end passes through the adjustment elongated hole 326 and is connected to the auxiliary detection unit 6. The second adjustment end is adapted to drive the adjustment rod to reciprocate along the elongated hole under the action of external force.

[0079] The motion structure 51 to be tested includes: a third horizontal motion component and a third lifting motion component.

[0080] The third horizontal motion component includes a second horizontal support 511 and a fifth guide member 512. The fifth guide member 512 is disposed on the base 1 and extends toward the second detection component. The second horizontal support 511 and the fifth guide member 512 are movably connected, and are adapted to reciprocate along the extension direction of the fifth guide member 512 under the action of external force. Preferably, in this embodiment, the fifth guide member 512 and the first guide member 22 are disposed on opposite sides of the first structure to be tested 4 and are arranged parallel to each other. In addition, the fourth guide member 31 is arranged perpendicular to both the fifth guide member 512 and the first guide member 22.

[0081] The third lifting motion assembly includes a second lifting platform 513 and a sixth guide member 514. The sixth guide member 514 extends away from the base 1, specifically perpendicular to the base 1 and upward, or it can be inclined relative to the base 1. The sixth guide member 514 is fixedly connected to the second horizontal platform 511, and the second lifting platform 513 is movably connected to the sixth guide member 514, suitable for reciprocating motion along the extension direction of the sixth guide member 514 under the action of external force. The sixth guide member 514 is connected to the limiting test member 52, and the limiting test member 52 extends in the same direction as the fourth guide member 31.

[0082] Since the fifth guide member 512 is mounted on the base 1 and extends towards the second detection component along the X-axis, its cooperation with the sixth guide member 514, which is located away from the base 1, allows the test piece 52 to move in the vertical plane. Simultaneously, because the test piece 52 extends in the same direction as the fourth guide member 31, the test motion structure 51 and the second motion structure 3 cooperate to achieve the movement of the test piece 52 relative to the second detection component within a spatial range, thereby enabling precise adjustment of the second detection component within the detection space 322. Furthermore, this configuration optimizes the distribution of the second test structure 5 and the second detection component, reducing the space occupied by the equipment.

[0083] As a variable implementation, the motion structure 51 under test may also include a third telescopic motion component. The third telescopic motion component includes a second telescopic support platform and a seventh guide member. The seventh guide member is connected to the second lifting support platform 513 and is arranged in the same direction as the fourth guide member 31. The second telescopic support platform is connected to the second test piece and is movably connected to the seventh guide member, and is suitable for reciprocating motion along the seventh guide member under the action of external force.

[0084] In this embodiment, each guide member is arranged as a linear guide rail, and each support or movable slider 321 that is movably connected to it is arranged as a slider structure. As a variable implementation method, the guide member can also be arranged as a lead screw, rack, or long groove structure.

[0085] The connecting platform 271 and the adjusting elongated hole 326 are provided with adjustment scales. Specifically, the scales on the connecting platform 271 are arranged in a ring or partially ring shape, and a pointer is connected to the adjusting shaft for cooperation. Adjusting knobs are provided on the first horizontal support 21, the first lifting support 23, the first telescopic support 25, the movable slider 321, the second horizontal support 511, the second lifting support 513, and the second telescopic support. The adjusting knobs have circumferential adjustment scales. Furthermore, each support or movable slider 321 has a built-in adjusting component. The adjusting component is connected to the adjusting knob, and the adjusting knob can drive each support or movable slider 321 to move relative to the guide member through the adjusting component. The movement stroke corresponds to the rotation stroke of the adjusting knob. Further, the adjusting component can specifically be a gear and rack structure or a lead screw structure, etc.

[0086] Specifically, in this embodiment, the external force can be a manually applied turning force on the adjustment knob or a pushing force on each support, movable slider 321, or adjustment end. As an alternative implementation, the external force can also be provided by adding a motor or push rod, etc. As an alternative implementation, the connecting platform 271 and the adjustment elongated hole 326 may only have adjustment scales on one of them, or neither may have them. As another alternative implementation, the first horizontal support 21, the first lifting support 23, the first telescopic support 25, the movable slider 321, the second horizontal support 511, the second lifting support 513, and the second telescopic support may only have adjustment knobs on one or a portion of them.

[0087] By setting adjustment scales at positions such as the connecting platform 271, the adjusting elongated hole 326, and each support or movable slider 321, users can accurately locate, identify, and record the required position data, thereby improving the accuracy and convenience of optical inspection.

[0088] The limiting test piece 52 includes: a connecting part 521 and a limiting component.

[0089] The connecting portion 521 is L-shaped, with its short side detachably connected to the second lifting platform 513 or the second telescopic platform. A limiting assembly is located on the long side of the connecting portion 521, including a first limiting portion 522 and a second limiting portion 523, which are arranged adjacent to each other. The first limiting portion 522 is adapted to accommodate and limit the first test piece along a first preset direction, and the second limiting portion 523 is adapted to accommodate and limit the second test piece along a second preset direction. In this embodiment, the first preset direction is the width direction of the first test piece, and the second preset direction is the thickness direction of the first test piece.

[0090] The first limiting part 522 includes a first limiting groove and a plurality of first limiting members. The first limiting groove is disposed on the connecting part 521 to clamp a horizontally placed second test piece, and the clamped and limited second test piece is positioned towards the second detection component. In this embodiment, the first limiting groove is a through groove, and its lateral opening direction faces the second detection component. As a variable implementation, the first limiting groove can also be a non-through groove, with its opening direction facing the second detection component. The first limiting members are distributed along the inner sidewall of the first limiting groove and are suitable for abutting and limiting the second test piece. The second limiting part 523 includes a second limiting groove and a second limiting member. The second limiting groove is disposed on the connecting part 521 to clamp a vertically placed second test piece, and the clamped and limited second test piece is positioned towards the second detection component. In this embodiment, the second limiting groove is a through groove, and its lateral opening direction faces the second detection component. As a variable implementation, the second limiting groove can also be a non-through groove, with its opening direction facing the second detection component. The second limiting member is distributed along the inner wall of the second limiting groove and is suitable for abutting and limiting the second test piece.

[0091] As a possible implementation, only one of the first limiting part 522 and the second limiting part 523 may be provided.

[0092] Specifically, both the first and second limiting members are provided with glass ball screws. As an alternative implementation, only one of the first and second limiting members may be provided with a glass ball screw. As another alternative implementation, the first and / or second limiting members may also be frosted structures or elastic protrusions, etc.

[0093] In this embodiment, the first limiting groove is a through groove, and a limiting baffle 524 is provided at the end of the first limiting groove away from the second detection component. The limiting baffle 524 is detachably connected to the connecting part 521. In this embodiment, the limiting baffle 524 is an elongated plate and includes a protruding folded plate structure, which is provided at the end away from the second detection component.

[0094] In this embodiment, an end baffle integrally formed with the second limiting groove is provided on the second limiting groove, and is disposed along the end of the second limiting groove away from the second detection component, and is integrally formed with the second limiting groove. As a variable implementation, the limiting baffle 524 can be integrally formed with the first limiting groove, and the end baffle can be detachably connected to the second limiting groove.

[0095] The optical inspection device also includes a supplementary lighting structure, which is disposed on the base 1 and distributed between the first test structure 4 and the second test structure 5, and is suitable for supplementing light for optical inspection. As an alternative implementation, the supplementary lighting structure may be omitted.

[0096] The supplementary lighting structure includes: several supplementary lighting plates 11 and several magnetic attraction structures 12.

[0097] The fill light plate 11 includes a bright surface and a dark surface arranged opposite to each other. Specifically, the fill light plate 11 is made of ferromagnetic metal. The magnetic attraction structure 12 is a magnet, which is set on the base 1 and evenly distributed between the first test structure 4 and the test structure. It is magnetically connected to the fill light plate 11. The fill light plate 11 has a fill light state with the bright surface facing up and the dark surface facing down, and a backlight state with the bright surface facing down and the dark surface facing up when manually flipped.

[0098] As an alternative implementation, the fill light plates 11 can also be stacked, with the dark side of the upper fill light plate 11 facing upwards and the bright side of the lower fill light plate 11 facing upwards. By moving the fill light plates 11, the size of the bright surface can be precisely adjusted. As another alternative implementation, the magnetic structure 12 can be a detachable connection structure such as an adhesive plate or a snap-fit.

[0099] In addition, in this embodiment, a spare optical detection unit mounting platform 7 is provided on the base to support the spare first optical detection unit 28 and second optical detection unit 33.

[0100] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this invention.

Claims

1. An optical inspection apparatus, characterized by, include: A base (1) on which the component to be tested is mounted, suitable for accommodating the component to be tested; A first detection component is disposed on the base (1). The first detection component is provided with a first optical detection unit (28) and a first motion structure (2). The first optical detection unit (28) is disposed toward the component to be tested. The first optical detection unit (28) is adapted to move under the action of the first motion structure (2) and detect the first feature of the component to be tested. The second detection component is disposed on the base (1). The second detection component is provided with a second optical detection unit (33), a second motion structure (3) and several auxiliary detection units (6). The auxiliary detection units (6) are disposed adjacent to the second optical detection unit (33). The auxiliary detection units (6) and the second optical detection unit (33) form a reflection detection optical path. The second optical detection unit (33) is adapted to move under the action of the second motion structure (3) and detect the second feature of the component under test by reflection. The component under test includes a first test piece and / or a second test piece; the structural component under test includes a first structure under test (4) and / or a second structure under test (5), the first structure under test (4) is disposed on the base (1) for accommodating and limiting the first test piece, the top side of the first structure under test (4) is provided with a detection opening (41), the second structure under test (5) is disposed on the base (1), the second structure under test (5) includes a test motion structure (51) and a limiting test piece (52) connected to each other, the limiting test piece (52) is adapted to accommodate and limit the second test piece, and moves in the direction toward or away from the second detection component under the action of the test motion structure (51); The second motion structure (3) includes: The second horizontal motion component includes a fourth guide (31), which is disposed on the base (1) and is disposed adjacent to the structure component to be tested; The second clamping motion assembly is movably connected to the fourth guide (31). The second clamping motion assembly includes a detection space (322). The detection space (322) contains the second optical detection unit (33) and a plurality of auxiliary detection units (6) arranged opposite to it. The detection space (322) is adapted to accommodate the second test piece. The second optical detection unit (33) is positioned toward the second test piece and acquires a first detection state of imaging the second test piece in the detection space (322). The second optical detection unit (33) is also positioned toward the auxiliary detection units (6) and acquires a second detection state of imaging the second test piece reflected by the auxiliary detection units (6).

2. The optical inspection apparatus of claim 1, wherein, The first motion structure (2) includes: The first horizontal motion component includes a first horizontal support (21) and a first guide (22). The first guide (22) is disposed on the base (1). The first guide (22) is disposed adjacent to the first structure to be tested (4). The first guide (22) is disposed at intervals from the first structure to be tested (4) along the extension line of the first direction. The first horizontal support (21) is movably connected to the first guide (22) and is adapted to reciprocate along the first guide (22) under the action of external force. The first lifting motion assembly includes a first lifting platform (23) and a second guide (24). The second guide (24) extends in a direction away from the base (1) and is connected to the first horizontal platform (21). The first lifting platform (23) is movably connected to the second guide (24). The first lifting platform (23) is adapted to move upward along the second guide (24) in a third direction. The first telescopic motion assembly includes a first telescopic platform (25) and a third guide (26). The third guide (26) is connected to the first lifting platform (23). The third guide (26) extends in a direction toward the first structure to be tested (4). The first telescopic platform (25) is connected to the first optical detection unit (28). The first telescopic platform (25) is movably connected to the third guide (26). The first telescopic platform (25) is adapted to move along the third guide (26) in a second direction.

3. The optical inspection apparatus of claim 2, wherein, The first motion structure (2) further includes: The first angle adjustment unit (27) is connected between the first guide (22) and the second guide (24), and / or connected between the second guide (24) and the third guide (26), and / or connected between the first telescopic support (25) and the first optical detection unit (28). The first angle adjustment unit (27) is adapted to adjust the angle of the first optical detection unit (28) toward the first structure to be tested (4).

4. The optical inspection apparatus of claim 3, wherein, The first angle adjustment unit (27) includes: A connecting platform (271) is connected to the first telescopic support platform (25); The first adjustment part (272) includes a first adjustment end and an adjustment shaft connected together. The adjustment shaft passes through the connecting platform (271) and is movably connected to the connecting platform (271). The two ends of the adjustment shaft are respectively connected to the first optical detection unit (28) and the first adjustment end. The adjustment shaft is adapted to rotate around its own circumference under the action of the first adjustment end.

5. The optical inspection apparatus of claim 1, wherein, The second clamping motion component further includes: At least two clamping components (32) are arranged in pairs. The clamping components (32) are movably connected to the fourth guide (31). The detection space (322) is formed by clamping the two clamping components (32) together. The auxiliary detection unit (6) is arranged on the opposite side of the two clamping components (32), and at least one of them is provided with the second optical detection unit (33). The pair of clamping components (32) are adapted to move towards each other or away from each other.

6. The optical inspection apparatus of claim 5, wherein, The clamping assembly (32) includes: The movable slider (321) is disposed on the fourth guide (31) and is movably connected to the fourth guide (31); An adjustment platform is connected to the movable slider (321), and a detection space (322) is formed between the adjustment platform on the adjacent clamping assembly (32). The adjustment platform includes a reflective part (323) and an imaging part (324). The reflective part (323) and the imaging part (324) are arranged adjacent to each other in a third direction. The second optical detection unit (33) is detachably connected to the periphery of the imaging part (324). The reflective part (323) is inclined toward the adjustment platform on the adjacent clamping assembly (32), and the auxiliary detection unit (6) is arranged on its inner side. The second adjustment part (325) includes a second adjustment end and an adjustment rod connected together. The reflective part (323) is provided with an adjustment elongated hole (326). One end of the adjustment rod away from the second adjustment end passes through the adjustment elongated hole (326) and is connected to the auxiliary detection unit (6). The second adjustment end is adapted to move along the adjustment elongated hole (326).

7. The optical inspection apparatus of claim 1, wherein, The motion structure to be tested (51) includes: The third horizontal motion component includes a second horizontal support (511) and a fifth guide (512). The fifth guide (512) is disposed on the base (1) and extends toward the second detection component. The second horizontal support (511) is movably connected to the fifth guide (512). The second horizontal support (511) is adapted to move along the extending direction of the fifth guide (512). The third lifting motion assembly includes a second lifting platform (513) and a sixth guide member (514). The sixth guide member (514) extends away from the base (1) and is connected to the second horizontal platform (511). The second lifting platform (513) is movably connected to the sixth guide member (514). The second lifting platform (513) is adapted to move along the extension direction of the sixth guide member (514). The sixth guide member (514) is connected to the limiting test member (52). The limiting test member (52) extends in the same direction as the fourth guide member (31).

8. The optical inspection apparatus according to any one of claims 2-7, characterized in that, The connecting platform (271) and the adjusting elongated hole (326) are provided with adjustment scales; Adjustment knobs are provided on the first horizontal support (21), the first lifting support (23), the first telescopic support (25), the movable slider (321), the second horizontal support (511), and the second lifting support (513) to adjust the movement stroke of the corresponding structure. The adjustment knobs are provided with adjustment scales along the circumference.

9. The optical inspection apparatus of any of claims 1-7, wherein, The limiting test component (52) includes: The connecting part (521) is detachably connected to the second lifting platform (513); A limiting component is disposed on the connecting part (521) and includes a first limiting part (522) and / or a second limiting part (523). The first limiting part (522) is adapted to accommodate and limit the second test piece along a first preset direction of the second test piece, and the second limiting part (523) is adapted to accommodate and limit the second test piece along a second preset direction of the second test piece.

10. The optical inspection apparatus according to claim 9, characterized in that, The first limiting part (522) includes a first limiting groove and a plurality of first limiting members. The first limiting groove is disposed on the connecting part (521) and is disposed toward the second detection component. The first limiting members are distributed along the inner sidewall of the first limiting groove and are suitable for abutting and limiting the second test component. And / or, The second limiting part (523) includes a second limiting groove and a second limiting member. The second limiting groove is disposed on the connecting part (521) and is disposed toward the second detection component. The second limiting member is distributed along the inner sidewall of the second limiting groove and is suitable for abutting and limiting the second test component.

11. The optical inspection apparatus of claim 10, wherein, The first limiting member and / or the second limiting member are configured as glass ball screws.

12. The optical inspection apparatus according to claim 10 or 11, characterized in that, The first limiting groove is a through groove, and a limiting baffle (524) is provided at one end of the first limiting groove away from the second detection component. The limiting baffle (524) is detachably connected to the connecting part (521).

13. The optical inspection apparatus of claim 1, wherein, Also includes: The supplementary lighting structure is disposed on the base (1) and distributed between the first test structure (4) and the second test structure (5).

14. The optical inspection apparatus of claim 13, wherein, The supplementary lighting structure includes: Several filler plates (11) include a filler bright surface and a dark surface arranged opposite to each other; Several magnetic structures (12) are disposed on the base (1) and distributed between the first test structure (4) and the test structure. They are magnetically connected to the fill light plate (11). The fill light plate (11) has a fill light state with the bright surface facing up and the dark surface facing down, and a backlight state with the bright surface facing down and the dark surface facing up when flipped under the action of external force.

15. The optical inspection apparatus of any of claims 1-7, 10-11, 13-14, wherein, The first optical detection unit (28) includes: First optical detection body (281); The receiving seat (282) includes a first receiving cavity and an optical seat hole (283) disposed on the bottom side of the first receiving cavity. The first receiving cavity houses the first optical detection body (281). The optical seat hole (283) is disposed toward the component under test. The first optical detection body (281) is adapted to detect the component under test through the optical seat hole (283).

16. The optical inspection apparatus of claim 15, wherein, The receiving seat (282) also includes: The second receiving cavity contains a distance detection unit (29). A ranging hole (284) is provided on the bottom side of the second receiving cavity. The ranging hole (284) is arranged towards the component to be tested. The ranging hole (284) is adjacent to and spaced apart from the optical seat hole (283). The distance detection unit (29) is adapted to detect the distance between itself and the component to be tested through the ranging hole (284).

Images