Support and support unit

Abstract

The support (100) of the present application includes a support portion (200) that supports a pin (D10) that supports a scribing wheel (C10). The support portion (200) includes a lower support portion (400) that supports a lower portion of the pin (D10) to restrict the pin (D10) from moving downward, and an upper support portion (300) that supports an upper portion of the pin (D10) to restrict the pin (D10) from moving downward in a state where the pin (D10) is separated from the lower support portion (400).

Description

Technical Field

[0001] This invention relates to brackets and bracket units. Background Technology

[0002] A scribing apparatus is used in the scribing process of workpieces such as brittle material substrates. The scribing apparatus uses a scribing wheel to scan the workpiece and form scribing lines on it. Patent Document 1 describes an example of a conventional scribing apparatus.

[0003] Existing technical documents

[0004] Patent documents

[0005] Patent Document 1: Japanese Patent Application Publication No. 2002-234748 Summary of the Invention

[0006] The technical problem that the invention aims to solve

[0007] If the position of the scribing wheel relative to the support is unstable during scribing, the quality of the workpiece after scribing may be reduced.

[0008] The purpose of this invention is to provide a support and support unit that improves the stability of the position of the marking wheel relative to the support.

[0009] Technical solutions for solving the problem

[0010] The bracket of the present invention includes a support portion for a support pin, the pin supporting a marking wheel, the support portion including a lower support portion and an upper support portion, the lower support portion supporting the lower part of the pin to restrict the pin from moving downward, and the upper support portion supporting the upper part of the pin to restrict the pin from moving downward when the pin is separated from the lower support portion.

[0011] According to the aforementioned bracket, when the scribing wheel is in contact with the workpiece and a load acts upward on the scribing wheel and the pin, the pin is supported by the upper support portion. With the pin supported by the upper support portion, the position of the pin relative to the bracket is less prone to change, thus improving the stability of the scribing wheel's posture relative to the bracket.

[0012] In one example of the bracket, the upper support portion includes an upper support surface that clamps the pin when the pin is separated from the lower support portion.

[0013] According to the aforementioned bracket, the pin is properly supported by the upper support portion.

[0014] In one example of the bracket, the upper support surface includes an inclined surface.

[0015] According to the aforementioned bracket, the pin is properly supported by the upper support portion.

[0016] In one example of the bracket, the inclination angle of the upper support surface is within the range of 20° or more and 80° or less.

[0017] According to the aforementioned bracket, the pin is properly supported by the upper support portion.

[0018] In one example of the bracket, the contact angle between the upper part of the pin and the upper support portion is within the range of 100° or more and less than 180°.

[0019] According to the aforementioned bracket, the pin is properly supported by the upper support portion.

[0020] In one example of the bracket, the contact angle is within the range of 120° or more and 150° or less.

[0021] According to the aforementioned bracket, the pin is properly supported by the upper support portion.

[0022] In one example of the bracket, the support portion further includes a recessed portion disposed above the pin, the recessed portion being configured such that, when the pin is supported on the upper support portion, a space is formed between the portion of the upper part of the pin that is higher than the portion that contacts the upper support portion.

[0023] According to the above bracket, the upper part of the pin, which is further upward than the part that contacts the support, is less likely to come into contact with the bracket.

[0024] In one example of the bracket, the distance between the pin supported on the upper support portion and the retractable portion is wider than the distance between the pin supported on the upper support portion and the lower support portion.

[0025] According to the above bracket, the upper part of the pin, which is further upward than the part that contacts the support, is less likely to come into contact with the bracket.

[0026] The support unit of the present invention includes a support, a marking wheel, and a pin. The support includes a support portion for supporting the pin. The pin supports the marking wheel. The support portion includes a lower support portion and an upper support portion. The lower support portion supports the lower part of the pin to restrict the pin from moving downward. The upper support portion supports the upper part of the pin to restrict the pin from moving downward when the pin is separated from the lower support portion.

[0027] According to the aforementioned support unit, when the scribing wheel is in contact with the workpiece and a load acts upward on the scribing wheel and the pin, the pin is supported by the upper support portion. With the pin supported by the upper support portion, the position of the pin relative to the support is less prone to change, thus improving the stability of the scribing wheel's posture relative to the support.

[0028] Invention Effects

[0029] According to the bracket and bracket unit of the present invention, the stability of the marking wheel's posture relative to the bracket is improved. Attached Figure Description

[0030] Figure 1 This is a side view of the scribed line.

[0031] Figure 2 This is the main view of the line header.

[0032] Figure 3 This is a side view of the marking wheel.

[0033] Figure 4 This is a cross-sectional view of the scribing wheel.

[0034] Figure 5 This is a diagram showing the support structure as viewed from the front.

[0035] Figure 6 Figure (1) shows the relationship between the support and the pin.

[0036] Figure 7 Figure (2) shows the relationship between the support and the pin.

[0037] Figure 8 This is a side view (1) showing the support portion.

[0038] Figure 9 Figure (3) shows the relationship between the support and the pin.

[0039] Figure 10 Figure (4) shows the relationship between the support and the pin.

[0040] Figure 11 This is a side view (2) showing the support portion.

[0041] Figure 12 This is a side view showing the support portion (3).

[0042] Figure 13 This is a side view showing the support portion (4).

[0043] Figure 14 This is a side view showing the support portion (5).

[0044] Figure 15 This is a side view showing the support portion (6).

[0045] Figure 16 This is a side view showing the support portion (7).

[0046] Figure 17 This is a side view (8) showing the support portion.

[0047] Figure 18 This is a side view (9) showing the support portion.

[0048] Figure 19 This is a side view (10) showing the support portion.

[0049] Figure 20 This is a side view (11) showing the support portion.

[0050] Figure 21 This is a side view (1) showing the support assembly.

[0051] Figure 22 This is a side view (2) showing the support assembly.

[0052] Figure 23 This is a side view (3) showing the support assembly. Detailed Implementation

[0053] (First Implementation)

[0054] Figure 1 , Figure 2 The scribing head A10 shown is used for scribing workpieces. Examples of workpieces include substrates. Examples of substrates include brittle material substrates. Examples of brittle material substrates include glass substrates, ceramic substrates, silicon substrates, compound semiconductor substrates, sapphire substrates, and quartz substrates. Examples of ceramic substrates include low-temperature sintered ceramics and high-temperature sintered ceramics.

[0055] A scribing head A10 is assembled into a scribing apparatus for scribing a workpiece. In one example, the scribing apparatus includes a scanning device and a scribing head A10. The scribing head A10 is mounted on the scanning device. The scanning device is configured to arbitrarily change the position of the scribing head A10 relative to the workpiece. In one example, the scanning device includes at least one first scanning unit and a second scanning unit. The first scanning unit changes the position of the scribing head A10 in a direction parallel to the workpiece's surface. The second scanning unit changes the position of the scribing head A10 in a direction perpendicular to the workpiece's surface.

[0056] The scribing head A10 includes a base A11, a connecting structure A20, a bracket connector holder A12, and a bracket assembly A30. The base A11 is mounted on a scanning device. An example of the relationship between the base A11 and the scanning device is given. In a first example, the base A11 is mounted on the first scanning section of the scanning device. In a second example, the base A11 is mounted on the second scanning section of the scanning device. The bracket connector holder A12 is mounted on the base A11 via the connecting structure A20. An example of the configuration of the connecting structure A20 is given. In the first example, the connecting structure A20 connects the bracket connector holder A12 to the base A11 in a manner that allows the bracket connector holder A12 to move relative to the base A11 in a predetermined direction. The predetermined direction includes, for example, at least one of a direction perpendicular to the workpiece surface and a direction parallel to the workpiece surface. In the second example, the connecting structure A20 connects the bracket joint retainer A12 to the base A11 in such a way that the bracket joint retainer A12 cannot move relative to the base A11.

[0057] Figure 1 , Figure 2 The diagram illustrates a first example of a connecting structure A20. Connecting structure A20 includes a track A21 and a slider A22. The track A21 is mounted on one side of the base A11 and the support joint holder A12. The slider A22 is mounted on the other side of the base A11 and the support joint holder A12. In the illustrated example, the track A21 is mounted on the base A11, and the slider A22 is mounted on the support joint holder A12. Connecting structure A20, for example, allows relative movement between the base A11 and the support joint holder A12 in a direction perpendicular to the workpiece surface.

[0058] The bracket connector retainer A12 is configured to selectively retain the bracket assembly A30 in a state where it is held in place or not. The bracket assembly A30 includes a bracket connector B10 and a bracket unit 10. The bracket connector B10 is configured to support the bracket unit 10 and is detachable from the bracket connector retainer A12. The bracket unit 10 includes a bracket 100, a marking wheel C10, and a pin D10. The bracket 100 is engaged with the bracket connector B10. The pin D10 is supported on the bracket 100. The marking wheel C10 is supported on the pin D10 in a manner rotatable relative to the bracket 100. The bracket unit 10 is connected to the bracket connector retainer A12 via the bracket connector B10.

[0059] The scribing head A10 also includes a load adjustment unit A40. The load adjustment unit A40 adjusts the force that presses the scribing wheel C10 onto the workpiece. The load adjustment unit A40 includes an actuator A41 and a bracket A42. The bracket A42 is mounted on the base A11. The actuator A41 is mounted on the bracket A42. The actuator A41 pushes toward the workpiece, for example, a support joint retainer A12, a track A21 mounted on the support joint retainer A12, or a slider A22 mounted on the support joint retainer A12. Examples of actuators A41 include a power cylinder, a solenoid, an electric motor, a servo motor, and a linear actuator. Examples of power cylinders include hydraulic cylinders, pneumatic cylinders, water cylinders, and electric cylinders.

[0060] like Figure 3 and Figure 4 As shown, the scribing wheel C10 includes an inner circumference C20 and a cutting edge C30. Examples of the basic structure of the scribing wheel C10 include a first structure and a second structure. In the first structure, the scribing wheel C10, including the inner circumference C20 and the cutting edge C30, is formed entirely of a single high-hardness material. In the second structure, the scribing wheel C10 includes an inner circumference C20 formed of a high-hardness material and a cutting edge C30 formed of a different high-hardness material than the inner circumference C20. Examples of high-hardness materials include, for example, superhard alloys, polycrystalline diamond, and single-crystal diamond. Polycrystalline diamond is, for example, poly-crystalline diamond (PCD) or nano-polycrystalline diamond (NPD).

[0061] The inner circumference C20 is provided around the central axis LW of the scribing wheel C10. Hereinafter, the direction along the central axis LW will be referred to as the axial direction of the scribing wheel C10. The central plane C11, which is the central surface of the scribing wheel C10, is defined as passing through the center of the scribing wheel C10 along its axial direction and orthogonal to the central axis LW. The scribing wheel C10 may be symmetrical or asymmetrical with respect to the central plane C11. Figure 3 In the example shown, the scribing wheel C10 is symmetrical with respect to the center plane C11.

[0062] exist Figure 3 In the side view of the scribing wheel C10 shown, the inner circumference C20 is ring-shaped. The cutting edge C30 is located radially outward of the scribing wheel C10 relative to the inner circumference C20. The cutting edge C30 constitutes the cutting edge of the scribing wheel C10. In the side view of the scribing wheel C10, the cutting edge C30 is ring-shaped. The thickness of the cutting edge C30 decreases towards the radially outward side of the scribing wheel C10. The front end of the cutting edge C30 has a ridge 31 corresponding to the circumference of the scribing wheel C10.

[0063] The inner peripheral portion C20 includes a side surface C21, an inner peripheral surface C22, a through hole C23, and a chamfer C24. The side surface C21 is parallel to the center surface C11. A boundary portion 40 is formed between the outer periphery of the side surface C21 and the cutting edge portion C30. The boundary portion 40 is the edge formed between the outer surface of the side surface C21 and the outer surface of the cutting edge portion C30, or a portion corresponding to it. The inner peripheral surface C22 defines the through hole C23. The through hole C23 penetrates the inner peripheral portion C20 in a direction along the axial direction of the scribing wheel C10. The through hole C23 is circular. The chamfer C24 is formed around the through hole C23.

[0064] Figure 5 An example of bracket 100 is shown. In the description of bracket 100, for example, an orthogonal coordinate system is used. The X-axis is parallel to the width direction of bracket 100. The Y-axis is parallel to the front-back direction of bracket 100. The Z-axis is parallel to the vertical direction of bracket 100. The X and Y axes define a first reference plane. The X and Z axes define a second reference plane. The Y and Z axes define a third reference plane.

[0065] The bracket 100 includes a main body 110 and a support 200. The main body 110 is connected to the bracket joint retainer A12 via a bracket joint B10. The support 200 supports the marking wheel C10 in such a way that the marking wheel C10 rotates relative to the bracket 100.

[0066] The support portion 200 includes a first support portion 200A and a second support portion 200B. The first support portion 200A is disposed in the width direction of the bracket 100 at a position separated from the central axis LH of the bracket 100 in one direction. The second support portion 200B is disposed in the width direction of the bracket 100 at a position separated from the central axis LH of the bracket 100 in the other direction.

[0067] In the width direction of the bracket 100, the first support portion 200A and the second support portion 200B are provided at a distance. A wheel arrangement space 101 is formed between the first support portion 200A and the second support portion 200B. The wheel arrangement space 101 is formed so that a marking wheel C10 can be arranged.

[0068] The pin D10 is, for example, cylindrical. The pin D10 includes a first end D11, a second end D12, and a middle portion D13. The first end D11 and the second end D12 are supported by the support portion 200. The middle portion D13 is disposed between the first end D11 and the second end D12 along the central axis of the pin D10. The middle portion D13 supports the marking wheel C10. The fit between the pin D10 and the marking wheel C10 is, for example, a clearance fit. The outer peripheral surface D14 of the pin D10 contacts the support portion 200 and the marking wheel C10.

[0069] The support portion 200 is positioned below the main body portion 110 in the vertical direction relative to the bracket 100. An example illustrating the relationship between the main body portion 110 and the support portion 200 will be provided. In a first example, the main body portion 110 and the support portion 200 constitute a single object. In a second example, the separately constructed main body portion 110 is combined with the support portion 200.

[0070] The surface 210 of the support portion 200 includes, for example, an inner side 211, an outer side 212, and a bottom surface 213. The inner side 211 faces the center side in the width direction of the bracket 100. The inner side 211 is parallel to or inclined relative to the third reference plane. The outer side 212 faces the outer side in the width direction of the bracket 100. The bottom surface 213 faces downward in the vertical direction of the bracket 100. The inner side 211, outer side 212, and bottom surface 213 are provided in each support portion 200A, 200B. The wheel arrangement space 101 is formed between the inner side 211 of the first support portion 200A and the inner side 211 of the second support portion 200B. A gap is formed between the inner side 211 of the support portion 200 and the side surface C21 of the marking wheel C10.

[0071] The support portion 200 includes a pin placement space 201 and a placement surface F10. The pin placement space 201 is formed to accommodate a pin D10. The pin placement space 201 is formed coaxially with each support portion 200A, 200B. The pin placement space 201 of the first support portion 200A is formed to accommodate a first end D11 of the pin D10. The pin placement space 201 of the second support portion 200B is formed to accommodate a second end D12 of the pin D10. The placement surface F10 is disposed around the pin placement space 201. The placement surface F10 defines the pin placement space 201.

[0072] The pin configuration space 201 opens on the inner side 211 of the support portion 200. At least one of the support portions 200A and 200B has a pin configuration space 201 opening on the outer side 212. The pin D10 is inserted into the pin configuration space 201 through the opening of the pin configuration space 201 provided on the outer side 212.

[0073] The pin configuration space 201 is parallel to or inclined relative to the first reference plane. The pin configuration space 201 is also parallel to or inclined relative to the second reference plane. An example is given of the relationship between the pin configuration space 201 and the inner surface 211. In the first example, the central axis of the pin configuration space 201 is perpendicular to the inner surface 211. In the second example, the central axis of the pin configuration space 201 is inclined relative to the inner surface 211.

[0074] The support portion 200 includes an anti-detachment portion 220. The anti-detachment portion 220 is configured such that the pin D10 disposed in the pin configuration space 201 will not move outward from the support portion 200 through the opening of the pin configuration space 201. The anti-detachment portion 220 is provided in at least one of the support portions 200A, 200B.

[0075] The configuration of the anti-detachment part 220 is illustrated. In a first example, the anti-detachment part 220 is provided on the outside of the support part 200. In a second example, the anti-detachment part 220 is provided in the pin arrangement space 201. The relationship between the anti-detachment part 220 and each support part 200A, 200B is illustrated. In the first example, the anti-detachment part 220 is configured to be detachable from the support part 200. In the second example, the anti-detachment part 220 is fixed to the support part 200 by a fixing means. The fixing means include at least one of, for example, riveting, bonding, and welding.

[0076] Figure 6 , Figure 7 The diagram shows a side view of the support portion 200. A first reference line L1 and a second reference line L2 are defined on the third reference plane. The first reference line L1 is the central axis LH of the support 100 projected onto the third reference plane. The second reference line L2 is parallel to the front-rear direction of the support 100 and passes through the central axis LP of the pin D10.

[0077] Pin D10 includes an upper part D20 and a lower part D30. The upper part D20 is located above the second reference line L2 in the vertical direction of the bracket 100. The lower part D30 is located below the second reference line L2 in the vertical direction of the bracket 100.

[0078] The upper part D20 of pin D10 includes an upper front part D20F and an upper rear part D20R. The upper front part D20F is located in front of the first reference line L1 in the front-rear direction of the bracket 100. The upper rear part D20R is located behind the first reference line L1 in the front-rear direction of the bracket 100.

[0079] The lower part D30 of pin D10 includes a lower front part D30F and a lower rear part D30R. The lower front part D30F is located in front of the first reference line L1 in the front-rear direction of the bracket 100. The lower rear part D30R is located behind the first reference line L1 in the front-rear direction of the bracket 100.

[0080] The support portion 200 includes an upper support portion 300 and a lower support portion 400. The upper support portion 300 and the lower support portion 400 are arranged along the vertical direction of the bracket 100. The upper support portion 300 is positioned above the lower support portion 400 in the vertical direction of the bracket 100. The upper support portion 300 is configured as the upper portion D20 of the support pin D10. The lower support portion 400 is configured as the lower portion D30 of the support pin D10. The upper support portion 300 and the lower support portion 400 are provided in at least one of each support portion 200A and 200B. In a first example, the upper support portion 300 and the lower support portion 400 are provided in one of each support portion 200A and 200B. In a second example, the upper support portion 300 and the lower support portion 400 are provided in both of each support portion 200A and 200B.

[0081] The upper support portion 300 supports the upper portion D20 of the pin D10 to restrict the downward movement of the pin D10 when it is separated from the lower support portion 400. The upper support portion 300 includes an upper support surface F20. The upper support surface F20 is contained within the mounting surface F10. The upper support surface F20 is located at the top of the mounting surface F10. The upper support surface F20 contacts the outer peripheral surface D14 of the upper portion D20 of the pin D10. The portion of the outer peripheral surface D14 of the upper portion D20 that contacts the upper support surface F20 is called the upper contact portion D20T.

[0082] The upper support surface F20 is configured, for example, to hold the upper part D20 of the pin D10. The upper support surface F20 includes an upper front support surface F20F and an upper rear support surface F20R. The upper front support surface F20F is located in front of the bracket 100 relative to its central axis LH in the front-rear direction. The upper front support surface F20F is, for example, an inclined surface or a curved surface. The upper rear support surface F20R is located rearward relative to the central axis LH of the bracket 100 in the front-rear direction. The upper rear support surface F20R is, for example, an inclined surface or a curved surface. The upper front support surface F20F contacts the upper contact portion D20T of the upper front part D20F of the pin D10. The upper rear support surface F20R contacts the upper contact portion D20T of the upper rear part D20R of the pin D10. The upper front support surface F20F and the upper rear support surface F20R clamp the upper part D20 of the pin D10 in the front-rear direction of the bracket 100.

[0083] The lower support portion 400 supports the lower portion D30 of the pin D10 to restrict the downward movement of the pin D10 when it is separated from the upper support portion 300. The lower support portion 400 includes a lower support surface F30. The lower support surface F30 is contained within the mounting surface F10. The lower support surface F30 is located at the lower part of the mounting surface F10. The lower support surface F30 contacts the outer peripheral surface D14 of the lower portion D30 of the pin D10. The portion of the outer peripheral surface D14 of the lower portion D30 that contacts the lower support surface F30 is called the lower contact portion D30T.

[0084] The lower support surface F30 is configured, for example, to hold the lower part D30 of the pin D10. The lower support surface F30 includes a lower front support surface F30F and a lower rear support surface F30R. The lower front support surface F30F is located in front of the support 100 relative to its central axis LH in the front-rear direction. The lower front support surface F30F is, for example, an inclined surface or a curved surface. The lower rear support surface F30R is located rearward relative to the support 100's central axis LH in the front-rear direction. The lower rear support surface F30R is, for example, an inclined surface or a curved surface. The lower front support surface F30F contacts the lower contact portion D30T of the lower front part D30F of the pin D10. The lower rear support surface F30R contacts the lower contact portion D30T of the lower rear part D30R of the pin D10. The lower front support surface F30F and the lower rear support surface F30R clamp the lower part D30 of the pin D10 in the front-rear direction of the bracket 100.

[0085] The support portion 200 includes a recessed portion 230 corresponding to the upper support portion 300. The recessed portion 230 is positioned above the pin D10 in the vertical direction of the bracket 100. The recessed portion 230 is positioned above the upper support portion 300 in the vertical direction of the bracket 100. The recessed portion 230 is configured such that, when the pin D10 is supported on the upper support portion 300, a space is formed between it and a portion of the pin D10 that is higher than the upper contact portion D20T. The recessed portion 230 includes an opposing surface F40. The opposing surface F40 is contained within the arrangement surface F10. The opposing surface F40 is, for example, a plane or a curved surface. The recessed portion 230 is configured such that, when the pin D10 is supported on the upper support portion 300, a space is formed between the portion of the pin D10 that is higher than the upper contact portion D20T and the opposing surface F40.

[0086] The support state of the support portion 200 for the pin D10 (hereinafter referred to as the "pin support state") includes, for example, a first pin support state and a second pin support state. The first pin support state is when the pin D10 is supported by the upper support portion 300. The second pin support state is when the pin D10 is supported by the lower support portion 400.

[0087] Figure 6An example of the first pin-supported state is shown. In the first pin-supported state, the upper support surface F20 contacts the upper part D20 of the pin D10. The upper front support surface F20F contacts the upper contact portion D20T of the upper front part D20F of the pin D10. The upper rear support surface F20R contacts the upper contact portion D20T of the upper rear part D20R of the pin D10. Friction is generated between the upper contact portion D20T of the pin D10 and the upper support portion 300. The upper part D20 of the pin D10 is supported by the upper support portion 300. A gap GB is formed between the lower part D30 of the pin D10 and the lower support portion 400.

[0088] In the first pin-supported state, the movement of pin D10 relative to bracket 100 is restricted. In the vertical direction of bracket 100, the movement of pin D10 upwards or downwards relative to bracket 100 is restricted. In the longitudinal direction of bracket 100, the movement of pin D10 forwards or backwards relative to bracket 100 is restricted. When a load is applied to pin D10, pin D10 is not easily moved relative to bracket 100.

[0089] The distance between the support portion 200 and the pin D10 in the vertical direction of the bracket 100 in the first pin-supported state is illustrated. In the first example, the distance between the recessed portion 230 and the upper part D20 of the pin D10 is wider than the distance between the lower support portion 400 and the lower part D30 of the pin D10. In the second example, the distance between the recessed portion 230 and the upper part D20 of the pin D10 is narrower than the distance between the lower support portion 400 and the lower part D30 of the pin D10. In the third example, the distance between the recessed portion 230 and the upper part D20 of the pin D10 and the distance between the lower support portion 400 and the lower part D30 of the pin D10 are equal.

[0090] The distance between the recessed portion 230 and the upper portion D20 of the pin D10 in the vertical direction of the bracket 100 is, for example, the distance between the portion of the pin D10 that is higher than the upper contact portion D20T and the opposing surface F40. The distance between the lower support portion 400 and the lower portion D30 of the pin D10 in the vertical direction of the bracket 100 is, for example, the distance between the portion of the pin D10 that is lower than the lower contact portion D30T and the lower support surface F30.

[0091] During scribing, the scribing wheel C10 travels relative to the workpiece while being pressed against it, and a load acts on the scribing wheel C10. The load acting upwards in the vertical direction toward the support 100 is transmitted to the pin D10 via the scribing wheel C10. When the load is transmitted to the pin D10 in the first pin support state, the upper part D20 of the pin D10 is pressed against the upper support surface F20. The frictional force acting between the upper part D20 of the pin D10 and the upper support surface F20 increases. The upper part D20 of the pin D10 is strongly supported by the upper support portion 300.

[0092] Figure 7 An example of the second pin-supported state is shown. In the second pin-supported state, the lower support surface F30 contacts the lower part D30 of pin D10. The lower front support surface F30F contacts the lower front part D30F. The lower rear support surface F30R contacts the lower rear part D30R. Friction is generated between the lower contact portion D30T of pin D10 and the lower support portion 400. The lower part D30 of pin D10 is supported by the lower support portion 400. A gap GA is formed between the upper part D20 of pin D10 and the upper support portion 300.

[0093] In the second pin-supported state, the movement of pin D10 relative to bracket 100 is restricted. In the vertical direction of bracket 100, the downward movement of pin D10 relative to bracket 100 is restricted. In the longitudinal direction of bracket 100, the forward or backward movement of pin D10 relative to bracket 100 is restricted.

[0094] In the first pin-supported state and the second pin-supported state, the motion state of pin D10 may sometimes change. Examples of this change in motion state include the first motion state and the second motion state.

[0095] In the first movement state, pin D10 moves downward or upward relative to bracket 100 in the vertical direction. When the first movement state occurs in the first pin support state, pin D10 moves downward relative to bracket 100. The pin support state changes from the first pin support state to the second pin support state. When the first movement state occurs in the second pin support state, pin D10 moves upward relative to bracket 100. The pin support state changes from the second pin support state to the first pin support state. Sometimes the position of the upper contact portion D20T or the lower contact portion D30T in pin D10 changes as the pin support state changes between the first and second pin support states.

[0096] In the second motion state, pin D10 rotates with its support portion 200. In the first pin-supported state, when the second motion state arises due to the first pin-supported state, pin D10 rotates. In the second pin-supported state, when the second motion state arises, pin D10 rotates with its lower portion D30 supported by the lower support portion 400. Sometimes the position of the upper contact portion D20T or the lower contact portion D30T in pin D10 changes with the rotation of pin D10.

[0097] Figure 5The support unit 10 shown is assembled as follows: The marking wheel C10 is disposed in the wheel placement space 101 of the support portion 200. The pin D10 is inserted into the pin placement space 201 of the support portion 200 and the through hole C23 of the marking wheel C10. An anti-detachment part 220 is provided in the support portion 200.

[0098] In the state immediately after the support unit 10 is assembled, the pin support state is, for example, the second pin support state. When the support unit 10 is used for scribing, the pin support state is configured to the first pin support state before the scribing wheel C10 begins to travel relative to the workpiece.

[0099] In one example, the pin support state is configured as the first pin support state as follows. The scribing wheel C10 of the support unit 10 in the second pin support state is pressed against a specified object. The specified object is the workpiece or an object different from the workpiece. With the scribing wheel C10 pressed against the specified object, a load acting upwards in the vertical direction toward the support 100 acts on the scribing wheel C10 and the pin D10. The pin D10 moves upwards relative to the support 100 in the vertical direction, pressing the upper part D20 of the pin D10 against the upper support surface F20. The pin support state changes from the second pin support state to the first pin support state.

[0100] When the specified object is a different object from the workpiece, after configuring the pin support state to the first pin support state, the position of the scribing head A10 is set so as to perform scribing processing.

[0101] (Second Implementation)

[0102] The support 100 of the second embodiment is constructed based on the first embodiment. Figure 8 An example of stent 100 is shown.

[0103] The lower support portion 400 includes a groove 410. The groove 410 is disposed between the front portion and the rear portion of the lower support portion 400 in the front-rear direction of the bracket 100. The groove 410 opens on the inner side 211, outer side 212, and bottom surface 213 of the support portion 200, respectively. The groove 410 includes a front surface 411 and a rear surface 412. The front surface 411 is located in front of the bracket 100 relative to the central axis LH of the bracket 100 in the front-rear direction. The rear surface 412 is located behind the bracket 100 relative to the central axis LH of the bracket 100 in the front-rear direction. The front surface 411 and the rear surface 412 define the space of the groove 410. In one example, the interval between the front surface 411 and the rear surface 412 of the groove in the front-rear direction of the bracket 100 is fixed.

[0104] The upper support surface F20 is a plane. The upper support surface F20 is also an inclined plane. In a side view of the bracket 100, the upper support surface F20 is inclined relative to the vertical and longitudinal directions of the bracket 100. The upper front support surface F20F is inclined such that its upper portion is located behind the lower portion of the bracket 100 in the longitudinal direction. The upper rear support surface F20R is inclined such that its upper portion is located in front of the bracket 100 in the longitudinal direction, compared to its lower portion. In one example, the upper front support surface F20F and the upper rear support surface F20R are symmetrical with respect to a second reference plane containing the central axis LH of the bracket 100.

[0105] The lower support surface F30 is a curved surface. On the third reference surface, the curved surface is a portion of a circle of curvature defined on the third reference surface. The center of the circle of curvature is the intersection of the first reference line L1 and the third reference line L3. The third reference line L3 is parallel to the front-rear direction of the support 100. The third reference line L3 passes through the boundary between the upper support surface F20 and the lower support surface F30.

[0106] A lower front support surface F30F is disposed between the front surface 411 of the groove 410 and the upper front support surface F20F. A lower rear support surface F30R is disposed between the rear surface 412 of the groove 410 and the upper rear support surface F20R. An example is given regarding the relationship between the radius of curvature of the lower support surface F30 and the radius of the pin D10. In the first example, the radius of curvature of the lower support surface F30 is equal to the radius of the pin D10. In the second example, the radius of curvature of the lower support surface F30 is longer than the radius of the pin D10.

[0107] The opposing surface F40 of the recessed portion 230 is a plane parallel to the front-rear direction of the bracket 100. The opposing surface F40 is disposed between the upper front support surface F20F and the upper rear support surface F20R in the front-rear direction of the bracket 100. The opposing surface F40 and the upper support surface F20 are connected by a curved surface.

[0108] The distance between the recessed portion 230 and the upper portion D20 of the pin D10 in the vertical direction of the bracket 100 is greater than the distance between the lower support portion 400 and the lower portion D30 of the pin D10 in the vertical direction of the bracket 100. The distance between the recessed portion 230 and the upper portion D20 of the pin D10 is, for example, the distance between the opposing surface F40 and the outer peripheral surface D14 of the upper portion D20 of the pin D10 on the first reference line L1. The distance between the lower support portion 400 and the lower portion D30 of the pin D10 is, for example, the distance between the lower edge of the lower support surface F30 and the outer peripheral surface D14 of the lower portion D30 of the pin D10.

[0109] The tilt angle of the upper support surface F20 (hereinafter referred to as "upper tilt angle PA") is explained. A first straight line M1 and a second straight line M2 are defined on the third reference plane. The first straight line M1 is parallel to the upper front support surface F20F. The second straight line M2 is parallel to the upper rear support surface F20R. The upper tilt angle PA is the angle formed by the first straight line M1 and the second straight line M2. The intersection of the first straight line M1 and the second straight line M2 is located above the third reference line L3 in the vertical direction of the bracket 100. The upper tilt angle PA is, for example, greater than 0°.

[0110] The upper tilt angle PA includes the tilt angle of the upper front support surface F20F (hereinafter referred to as the "upper front tilt angle PAF") and the tilt angle of the upper rear support surface F20R (hereinafter referred to as the "upper rear tilt angle PAR"). The upper tilt angle PA is the sum of the upper front tilt angle PAF and the upper rear tilt angle PAR. The upper front tilt angle PAF is the angle formed by the first reference line L1 and the first straight line M1. The upper rear tilt angle PAR is the angle formed by the first reference line L1 and the second straight line M2. The intersection of the first reference line L1 with the first straight line M1 and the second straight line M2 is located higher than the third reference line L3 in the vertical direction of the bracket 100.

[0111] When the upper front support surface F20F is parallel to the second reference surface, the upper front tilt angle PAF is 0°. The larger the upper front tilt angle PAF, the larger the upper tilt angle PA. When the upper rear support surface F20R is parallel to the second reference surface, the upper rear tilt angle PAR is 0°. The larger the upper rear tilt angle PAR, the larger the upper tilt angle PA.

[0112] Examples illustrating the relationship between the upper forward tilt angle PAF and the upper rear tilt angle PAR are provided. In the first example, the upper forward tilt angle PAF and the upper rear tilt angle PAR are equal. In the second example, the upper forward tilt angle PAF is larger than the upper rear tilt angle PAR. In the third example, the upper forward tilt angle PAF is smaller than the upper rear tilt angle PAR.

[0113] The contact angle (hereinafter referred to as "upper contact angle QA") between the upper part D20 of pin D10 and the upper support part 300 is explained. A third straight line M3 and a fourth straight line M4 are defined on the third reference plane. The third straight line M3 passes through the upper contact part D20T of the central axis LP of pin D10 and the upper front part D20F. The fourth straight line M4 passes through the upper contact part D20T of the central axis LP of pin D10 and the upper rear part D20R. The upper contact angle QA is the angle formed by the third straight line M3 and the fourth straight line M4. The upper contact angle QA is, for example, less than 180°.

[0114] The upper contact angle QA includes the upper contact angle corresponding to the upper front support surface F20F (hereinafter referred to as the "upper front contact angle QAF") and the upper contact angle corresponding to the upper rear support surface F20R (hereinafter referred to as the "upper rear contact angle QAR"). The upper contact angle QA is the sum of the upper front contact angle QAF and the upper rear contact angle QAR. The upper front contact angle QAF is the angle formed by the first straight line M1 and the third straight line M3. The upper rear contact angle QAR is the angle formed by the first straight line M1 and the fourth straight line M4.

[0115] When the upper contact portion D20T of the upper front portion D20F in the outer peripheral surface D14 of the upper part D20 of pin D10 is located on the third reference line L3, the upper front contact angle QAF is 90°. The closer the position of the upper contact portion D20T of the upper front portion D20F in the outer peripheral surface D14 of the upper part D20 of pin D10 is to the first reference line L1, the smaller the upper front contact angle QAF is.

[0116] When the upper contact portion D20T of the upper rear portion D20R in the outer peripheral surface D14 of the upper part D20 of pin D10 is located on the third reference line L3, the upper rear contact angle QAR is 90°. The closer the position of the upper contact portion D20T of the upper rear portion D20R in the outer peripheral surface D14 of the upper part D20 of pin D10 is to the first reference line L1, the smaller the upper rear contact angle QAR is.

[0117] Figure 9 An example of the first pin support state is shown. The portion of the upper support surface F20 near the boundary with the lower support surface F30 contacts the upper part D20 of the pin D10. The portion of the upper support surface F20 that separates upward in the vertical direction of the bracket 100 relative to the boundary with the lower support surface F30 does not contact the pin D10.

[0118] Figure 10 An example of the second pin support configuration is shown. The lower support surface F30 is in contact with the lower part D30 of the pin D10.

[0119] (Third Implementation)

[0120] The support 100 of the third embodiment is constructed based on the second embodiment. Figure 8 An example of stent 100 is shown.

[0121] An example of an upper tilt angle PA is given. The upper tilt angle PA is selected from a range above the first upper tilt angle. The first upper tilt angle is selected, for example, from 20°, 30°, and 40°. The upper tilt angle PA is selected from a range below the second upper tilt angle. The second upper tilt angle is selected, for example, from 50°, 60°, 70°, and 80°. The second upper tilt angle is larger than the first upper tilt angle. In one example, the upper tilt angle PA is selected from a range above the first upper tilt angle and below the second upper tilt angle. The upper tilt angle PA is selected, for example, from a range of 20° and below 80°. The upper tilt angle PA is, for example, 30°.

[0122] An example of the upper forward tilt angle (PAF) is given. The upper forward tilt angle (PAF) is selected from a range above the first upper forward tilt angle. The first upper forward tilt angle is selected, for example, from 10°, 15°, and 20°. The upper forward tilt angle (PAF) is selected from a range below the second upper forward tilt angle. The second upper forward tilt angle is selected, for example, from 25°, 30°, 35°, and 40°. The second upper forward tilt angle is larger than the first upper forward tilt angle. In one example, the upper forward tilt angle (PAF) is selected from a range above the first upper forward tilt angle and below the second upper forward tilt angle. The upper forward tilt angle (PAF) is selected, for example, from a range of 10° and below 40°. The upper forward tilt angle (PAF) is, for example, 15°.

[0123] An example of the upper rearward tilt angle PAR is given. The upper rearward tilt angle PAR is selected from a range above the first upper rearward tilt angle. The first upper rearward tilt angle is selected, for example, from 10°, 15°, and 20°. The upper rearward tilt angle PAR is selected from a range below the second upper rearward tilt angle. The second upper rearward tilt angle is selected, for example, from 25°, 30°, 35°, and 40°. The second upper rearward tilt angle is larger than the first upper rearward tilt angle. In one example, the upper rearward tilt angle PAR is selected from a range above the first upper rearward tilt angle and below the second upper rearward tilt angle. The upper rearward tilt angle PAR is selected, for example, from a range of 10° and below 40°. The upper rearward tilt angle PAR is, for example, 15°.

[0124] (Fourth Implementation)

[0125] The support 100 of the fourth embodiment is constructed based on the second or third embodiment. Figure 8 An example of stent 100 is shown.

[0126] An example of the upper contact angle QA is given. The upper contact angle QA is selected from a range above the first upper contact angle. The first upper contact angle is selected, for example, from 100°, 110°, and 120°. The upper contact angle QA is selected from a range below the second upper contact angle. The second upper contact angle is selected, for example, from 140°, 150°, 160°, and 170°. The second upper contact angle is larger than the first upper contact angle. In one example, the upper contact angle QA is selected from a range above the first upper contact angle and below the second upper contact angle. The upper contact angle QA is selected, for example, from a range of 100° and less than 180°. The upper contact angle QA is, for example, 150°.

[0127] An example of the upper front contact angle QAF is given. The upper front contact angle QAF is selected from a range above the first upper front contact angle. The first upper front contact angle is selected, for example, from 50°, 55°, and 60°. The upper front contact angle QAF is selected from a range below the second upper front contact angle. The second upper front contact angle is selected, for example, from 70°, 75°, and 80°. The second upper front contact angle is larger than the first upper front contact angle. In one example, the upper front contact angle QAF is selected from a range above the first upper front contact angle and below the second upper front contact angle. The upper front contact angle QAF is selected, for example, from a range of 50° and below 80°. The upper front contact angle QAF is, for example, 75°.

[0128] An example of the upper rear contact angle QAR is given. The upper rear contact angle QAR is selected from a range above the first upper rear contact angle. The first upper rear contact angle is selected, for example, from 50°, 55°, and 60°. The upper rear contact angle QAR is selected from a range below the second upper rear contact angle. The second upper rear contact angle is selected, for example, from 70°, 75°, and 80°. The second upper rear contact angle is larger than the first upper rear contact angle. In one example, the upper rear contact angle QAR is selected from a range above the first upper rear contact angle and below the second upper rear contact angle. The upper rear tilt angle QAR is selected, for example, from a range of 50° and below 80°. The upper rear tilt angle QAR is, for example, 75°.

[0129] (Fifth Implementation)

[0130] The support 100 of the fifth embodiment is constructed based on at least one of the second to fourth embodiments. Figure 11 , Figure 12 An example of stent 100 is shown.

[0131] Figure 11The side view of the first support portion 200A is shown. One of the upper front support surface F20F and the upper rear support surface F20R of the first support portion 200A is an inclined surface or a curved surface. In the illustrated example, one of the upper front support surface F20F and the upper rear support surface F20R is an inclined surface. The other side of the upper front support surface F20F and the upper rear support surface F20R of the first support portion 200A is a plane parallel to the second reference plane.

[0132] Figure 12 The side view of the second support portion 200B is shown. One of the upper front support surface F20F and the upper rear support surface F20R of the second support portion 200B is an inclined surface or a curved surface. In the illustrated example, one of the upper front support surface F20F and the upper rear support surface F20R is an inclined surface. The other of the upper front support surface F20F and the upper rear support surface F20R of the second support portion 200B is a plane parallel to the second reference plane.

[0133] In the front-rear direction of the bracket 100, the inclined surfaces of the first support portion 200A and the second support portion 200B are positioned opposite to each other. In the first example, the upper front support surface F20F of the first support portion 200A is an inclined surface, and the upper rear support surface F20R of the second support portion 200B is a flat surface. In the second example, the upper front support surface F20F of the first support portion 200A is a flat surface, and the upper rear support surface F20R of the second support portion 200B is an inclined surface.

[0134] (Sixth Implementation Method)

[0135] The support 100 of the sixth embodiment is constructed based on at least one of the second to fifth embodiments. Figure 13 An example of stent 100 is shown.

[0136] The lower support portion 400 does not include the groove portion 410. Instead of the groove portion 410, the lower support portion 400 includes a middle portion 420. In the front-rear direction of the bracket 100, the middle portion 420 connects the front portion and the rear portion of the lower support portion 400.

[0137] (Seventh Implementation)

[0138] The bracket 100 of the seventh embodiment is constructed based on the sixth embodiment. Figure 14 An example of stent 100 is shown.

[0139] The lower support surface F30 is configured, for example, to clamp the lower part D30 of pin D10. The lower front support surface F30F is flat. The lower rear support surface F30R is flat. The lower front support surface F30F contacts the lower contact portion D30T of the lower front portion D30F of pin D10. The lower rear support surface F30R contacts the lower contact portion D30T of the lower rear portion D30R of pin D10. The lower front support surface F30F and the lower rear support surface F30R clamp the lower part D30 of pin D10 in the front-rear direction of the bracket 100.

[0140] The upper support surface F20 and the lower support surface F30 are connected, for example, via a curved surface. In one example, the upper support surface F20 and the lower support surface F30 are symmetrical with respect to a first reference surface containing the third reference line L3.

[0141] The support portion 200 includes a recessed portion 230 corresponding to the lower support portion 400. The recessed portion 230 is disposed below the pin D10 in the vertical direction of the bracket 100. The recessed portion 230 is disposed below the lower support portion 400 in the vertical direction of the bracket 100. The recessed portion 230 is configured such that, when the pin D10 is supported by the lower support portion 400, a space is formed between it and a portion of the pin D10 that is lower than the lower contact portion D30T. The recessed portion 230 includes an opposing surface F40. The opposing surface F40 is contained within the arrangement surface F10. The opposing surface F40 is, for example, a plane or a curved surface. The recessed portion 230 is configured such that, when the pin D10 is supported by the lower support portion 400, a space is formed between the portion of the pin D10 that is lower than the lower contact portion D30T and the opposing surface F40.

[0142] The tilt angle of the lower support surface F30 (hereinafter referred to as "lower tilt angle PB") is explained. A fifth straight line M5 and a sixth straight line M6 are defined on the third reference surface. The fifth straight line M5 is parallel to the lower front support surface F30F. The sixth straight line M6 is parallel to the lower rear support surface F30R. The lower tilt angle PB is the angle formed by the fifth straight line M5 and the sixth straight line M6. The intersection of the fifth straight line M5 and the sixth straight line M6 is located lower than the third reference line L3 in the vertical direction of the bracket 100. The lower tilt angle PB is, for example, greater than 0°.

[0143] The lower tilt angle PB includes the tilt angle of the lower front support surface F30F (hereinafter referred to as the "lower front tilt angle PBF") and the tilt angle of the lower rear support surface F30R (hereinafter referred to as the "lower rear tilt angle PBR"). The lower tilt angle PB is the sum of the lower front tilt angle PBF and the lower rear tilt angle PBR. The lower front tilt angle PBF is the angle formed by the first reference line L1 and the fifth straight line M5. The lower rear tilt angle PBR is the angle formed by the first reference line L1 and the sixth straight line M6. The intersection of the first reference line L1 with the fifth straight line M5 and the sixth straight line M6 is located lower than the third reference line L3 in the vertical direction of the support 100.

[0144] When the lower front support surface F30F is parallel to the second reference surface, the lower front tilt angle PBF is 0°. The larger the lower front tilt angle PBF, the larger the lower tilt angle PB. When the lower rear support surface F30R is parallel to the second reference surface, the lower rear tilt angle PBR is 0°. The larger the lower rear tilt angle PBR, the larger the lower tilt angle PB.

[0145] The relationship between the lower forward tilt angle PBF and the lower rear tilt angle PBR is illustrated below. In the first example, the lower forward tilt angle PBF and the lower rear tilt angle PBR are equal. In the second example, the lower forward tilt angle PBF is larger than the lower rear tilt angle PBR. In the third example, the lower forward tilt angle PBF is smaller than the lower rear tilt angle PBR.

[0146] The support state of the lower support portion 400 for pin D10 varies depending on the lower tilt angle PB. The lower portion D30 of pin D10 is supported on the lower support surface F30 or the opposing surface F40.

[0147] (Eighth Implementation Method)

[0148] The support 100 of the eighth embodiment is constructed based on the sixth embodiment. Figure 15 An example of stent 100 is shown.

[0149] The lower front support surface F30F and the lower rear support surface F30R are planes parallel to the second reference plane. The lower front tilt angle PBF is 0°. The lower rear tilt angle PBR is 0°. In the second pin support state, the opposing surface F40 contacts the lower part D30 of the pin D10.

[0150] (Ninth Implementation)

[0151] The support 100 of the ninth embodiment is constructed based on the sixth embodiment. Figure 16 An example of stent 100 is shown.

[0152] The upper front support surface F20F and the lower front support surface F30F form an inclined plane. The upper rear support surface F20R and the lower rear support surface F30R form an inclined plane. In the second pin support state, the opposing surface F40 contacts the lower part D30 of the pin D10.

[0153] (Tenth Implementation)

[0154] The bracket 100 of the tenth embodiment is constructed based on the seventh embodiment. Figure 17 An example of stent 100 is shown.

[0155] The upper tilt angle PA is different from the lower tilt angle PB. The upper tilt angle PA is smaller than the lower tilt angle PB.

[0156] (Eleventh Implementation Method)

[0157] The support 100 of the eleventh embodiment is constructed based on the second embodiment. Figure 18 An example of stent 100 is shown.

[0158] An ellipse N is defined on the third datum plane. The major axis of ellipse N is the first datum line L1. The minor axis of ellipse N is the third datum line L3. The center of ellipse N is the intersection of the first datum line L1 and the third datum line L3. Within the third datum plane, a configuration surface F10 is defined by ellipse N. Configuration surface F10 is a part of ellipse N.

[0159] (Twelfth Implementation)

[0160] The support 100 of the twelfth embodiment is constructed based on the eleventh embodiment. Figure 19 An example of stent 100 is shown.

[0161] The lower support portion 400 does not include the groove portion 410. Instead of the groove portion 410, the lower support portion 400 includes a middle portion 420. In the front-rear direction of the bracket 100, the middle portion 420 connects the front portion and the rear portion of the lower support portion 400.

[0162] (Thirteenth Implementation Method)

[0163] The support 100 of the thirteenth embodiment is constructed based on the second embodiment. Figure 20 An example of stent 100 is shown.

[0164] The upper support surface F20 is curved. On the third reference plane, the curved surface is a portion of a circle of curvature defined on the third reference plane. The center of the circle of curvature corresponding to the upper front support surface F20F is located in front of the upper front support surface F20F in the front-rear direction of the bracket 100. The center of the circle of curvature corresponding to the upper rear support surface F20R is located in front of the upper rear support surface F20R in the front-rear direction of the bracket 100.

[0165] (Fourteenth Implementation)

[0166] The support unit 10 of the fourteenth embodiment is configured based on at least one of the first to thirteenth embodiments. Figures 21 to 23 An example of support unit 10 is shown.

[0167] Examples of the structural relationship between the stent 100 and the stent connector B10 include a first form and a second form. In the first form, the stent 100 and the stent connector B10 are integrally formed in a way that they cannot be separated. Figure 21 This represents an example of the first configuration. In the second configuration, the support 100 and the support connector B10 are separately configured in a detachable manner. Figure 22 This represents the first example of the second form. Figure 23 This represents the second example of the second form.

[0168] exist Figure 21 In the first embodiment shown, the bracket joint B10 includes a base B11. The base B11 is mounted on the bracket joint retainer A12. The base B11 includes a bearing portion B20 and a shaft B12. The bearing portion B20 supports the shaft B12. The center axis LJ of the shaft B12 defines the center axis LJ of the bracket joint B10. The shaft B12 is disposed in the main body portion 110 of the bracket 100. The relationship between the shaft B12 and the main body portion 110 is illustrated. In the first example, the shaft B12 and the main body portion 110 constitute a single object. In the second example, the separately constructed shaft B12 is combined with the main body portion 110.

[0169] The configuration of bearing section B20 is illustrated. In a first example, bearing section B20 includes one or more radial bearings B30. In a second example, in addition to the configuration of the first example, bearing section B20 also includes a housing B21, a stop member B40, and at least one spacer member. Figure 21The diagram shows a second example of a bearing section B20, comprising two radial bearings B30, a housing B21, and a stop member B40. The inner ring B31 of the radial bearing B30 is fixed to the shaft B12. The housing B21 houses the radial bearing B30. The outer ring B32 of the radial bearing B30 is fixed to the housing B21. The shaft B12, the inner ring B31, and the support 100 rotate relative to the outer ring B32 and the housing B21 about the central axis LJ of the shaft B12. In an example where the bearing section B20 includes a spacer, a spacer is provided between one radial bearing B30 and the other radial bearing B30. The spacer is fixed to the shaft B12.

[0170] The stop B40 includes, for example, a first stop B41 and a second stop B42. The first stop B41 is located at the front end of the shaft B12. The first stop B41 includes a first limiting surface B41A that restricts the movement of the radial bearing B30. The second stop B42 is located at the root of the shaft B12. The second stop B42 includes a second limiting surface B42A that restricts the movement of the radial bearing B30.

[0171] The configuration of the first stop B41 is illustrated. The first stop B41 includes a threaded fastener that engages with the female thread of the shaft B12. The threaded fastener includes, for example, a screw or bolt. The head of the threaded fastener forms a first limiting surface B41A. The end face of the inner ring B31 of one radial bearing B30 contacts the first limiting surface B41A. The configuration of the second stop B42 is illustrated. The second stop B42 includes a flange disposed around the shaft B12. The end face of the flange forms a second limiting surface B42A. The end face of the inner ring B31 of the other radial bearing B30 contacts the second limiting surface B42A.

[0172] exist Figure 22 In the first example of the second embodiment shown, the bracket joint B10 includes a base B11 and a bracket mounting portion B50. The bracket mounting portion B50 includes a base B60. The base B60 includes, for example, a first plate B61 and a second plate B62. The first plate B61 determines the position of the bracket 100 in the direction along the central axis LJ of the shaft B12. The second plate B62 determines the position of the bracket 100 in a direction orthogonal to the central axis LJ of the shaft B12. The shaft B12 is disposed on the base B60. The relationship between the shaft B12 and the base B60 is illustrated. In the first example, the shaft B12 and the base B60 constitute a single object. In the second example, the separately constructed shaft B12 is combined with the base B60. The shaft B12 and the base B60 can be in a form that is inseparable or in a form that is separable. The shaft B12 is disposed, for example, on the first plate B61.

[0173] exist Figure 23In the second example of the second embodiment shown, the bracket connector B10 includes a base B11 and a bracket mounting portion B50. The bracket mounting portion B50 includes a sleeve B70. The sleeve B70 includes, for example, a placement space B71. The placement space B71 is formed such that the main body portion 110 of the bracket 100 can be placed there. A shaft B12 is provided on the sleeve B70. The relationship between the shaft B12 and the sleeve B70 is illustrated. In the first example, the shaft B12 and the sleeve B70 constitute a single object. In the second example, the separately constructed shaft B12 is combined with the sleeve B70. The shaft B12 and the sleeve B70 can be either inseparable or separable.

[0174] Figure 22 , Figure 23 The bearing portion B20 included in the second-form bracket 100 and bracket joint B10 is constructed in the same manner as the bearing portion B20 included in the first-form bracket 100 and bracket joint B10. The shaft B12, inner ring B31, bracket mounting portion B50, and bracket 100 rotate about the central axis LJ of shaft B12 relative to outer ring B32 and housing B21.

[0175] In one example, in a side view of the support assembly A30, the central axis LW of the scribing wheel C10 and the contact point between the scribing wheel C10 and the machined surface are located on the central axis LH of the support 100. The relationship between the central axis LJ of shaft B12 and the central axis LW of the scribing wheel C10 is illustrated. In the first example, a trail is provided between the central axis LJ of shaft B12 and the central axis LW of the scribing wheel C10. In the second example, no trail is provided between the central axis LJ of shaft B12 and the central axis LW of the scribing wheel C10.

[0176] The drag distance is the distance between the intersection of the central axis LJ of shaft B12 and the machined surface, and between the contact point between the scribing wheel C10 and the workpiece. Figures 21 to 23 In the side view of the bracket assembly A30 shown, the central axis LJ of axis B12 is parallel to the central axis LH of bracket 100. The distance between the central axis LJ of axis B12 and the central axis LH of bracket 100 is equivalent to the drag distance. In the configuration where the drag distance is set, when the central axis LW of scribing wheel C10 is located further back than the central axis LJ of axis B12 in the scanning direction, the straight-line performance of scribing wheel C10 is improved.

[0177] When the support assembly A30 includes the second-form support 100 and support connector B10, the support assembly A30 further includes a connecting structure A31. The connecting structure A31 connects the support connector B10 to the support 100. The connecting structure A31 includes at least one mechanically coupled portion A31A that connects the support connector B10 and the support 100 by a mechanical coupling method, and a magnetically coupled portion A31B that connects the support connector B10 and the support 100 by a magnetic coupling method.

[0178] exist Figure 22 In the example shown, the connecting structure A31 includes a mechanical connection portion A31A. The configuration of the mechanical connection portion A31A is illustrated. In the first example, the mechanical connection portion A31A connects the bracket mounting portion B50 and the main body portion 110 of the bracket 100 via a threaded fastener. The threaded fastener includes a screw or bolt. In the second example, the mechanical connection portion A31A connects the bracket mounting portion B50 and the main body portion 110 of the bracket 100 via a fitting portion. The fitting portion includes a first fitting portion disposed on one side of the bracket mounting portion B50 and the main body portion 110 of the bracket 100, and a second fitting portion disposed on the other side of the bracket mounting portion B50 and the main body portion 110 of the bracket 100. Figure 21 The mechanical connection A31A of the first example is shown. The mechanical connection A31A includes a female threaded portion provided in the bracket mounting portion B50, a through hole provided in the main body portion 110 of the bracket 100, and a threaded fastener. The threaded fastener is inserted into the through hole of the main body portion 110 of the bracket 100 and engages with the female threaded portion of the bracket mounting portion B50. The main body portion 110 of the bracket 100 is fixed to the bracket mounting portion B50 by the threaded fastener.

[0179] exist Figure 23 In the example shown, the connecting structure A31 includes a magnetic coupling portion A31B. The configuration of the magnetic coupling portion A31B is illustrated below. In the first example, the magnetic coupling portion A31B includes a permanent magnet disposed in the sleeve B70 and a magnetic body disposed in the main body portion 110 of the support 100. In the second example, the magnetic coupling portion A31B includes a magnetic body disposed in the sleeve B70 and a permanent magnet disposed in the main body portion 110 of the support 100. In the third example, the magnetic coupling portion A31B includes a permanent magnet disposed in the sleeve B70 and a permanent magnet disposed in the main body portion 110 of the support 100. The support 100 is held in the sleeve B70 by a magnetic force acting between the permanent magnet and the magnetic body, or by a magnetic force acting between the permanent magnets.

[0180] In the case where the connecting structure A31 includes a magnetic coupling portion A31B, in one example, the bracket mounting portion B50 also includes a bracket limiting portion B80. The bracket limiting portion B80 contacts the bracket 100 to stabilize the position of the bracket 100 relative to the sleeve B70. The bracket limiting portion B80 includes, for example, a pin B81. The pin B81 is disposed in the configuration space B71. The pin B81 is supported by the sleeve B70. The bracket 100 also includes an inclined portion 120 and a flat portion 130. The inclined portion 120 includes a sloped surface that is inclined relative to the central axis LH of the bracket 100 in a side view of the bracket 100. The sloped surface of the inclined portion 120 includes a first end 121 and a second end 122 in the direction along the central axis LH of the bracket 100. The first end 121 is farther from the marking wheel C10 than the second end 122. The sloped surface of the inclined portion 120 is inclined such that the first end 121 is closer to the central axis LH of the bracket 100 than the second end 122. The flat portion 130 is disposed above the inclined portion 120. The flat portion 130 includes a surface parallel to the central axis LH of the support 100.

[0181] With the bracket 100 held in place by the sleeve B70 via the magnetic coupling A31B, the inclined portion 120 contacts the pin B81. The contact between the inclined portion 120 and the pin B81 determines the position of the bracket 100 relative to the sleeve B70 along the central axis LH of the bracket 100. In a side view of the bracket assembly A30, a force orthogonal to the central axis LJ of axis B12 acts on the bracket 100. This force presses a portion of the outer peripheral surface of the main body 110 against the inner peripheral surface of the sleeve B70.

[0182] (Effect 1)

[0183] In one example of the bracket 100, the bracket 100 includes a support portion 200 for a support pin D10, which supports the marking wheel C10. The support portion 200 includes an upper support portion 300 and a lower support portion 400. The upper support portion 300 supports the upper portion D20 of the pin D10 to restrict downward movement of the pin D10 when it is separated from the lower support portion 400. The lower support portion 400 supports the lower portion D30 of the pin D10 in a manner that restricts downward movement of the pin D10.

[0184] When the scribing wheel C10 is in contact with the workpiece and the load acts upward on the scribing wheel C10 and the pin D10, the pin D10 is supported by the upper support portion 300. With the pin D10 supported by the upper support portion 300, the position of the pin D10 relative to the bracket 100 is less likely to change, and the stability of the posture of the scribing wheel C10 relative to the bracket 100 is improved.

[0185] In one example of bracket 100, the upper support portion 300 includes an upper support surface F20 that clamps the pin D10 when the pin D10 is separated from the lower support portion 400.

[0186] Pin D10 is properly supported on the upper support portion 300.

[0187] In one example of the bracket 100, the upper support surface F20 includes an inclined surface.

[0188] Pin D10 is properly supported on the upper support portion 300.

[0189] In one example of bracket 100, the tilt angle of the upper support surface F20 is within the range of 20° or more and 80° or less.

[0190] Pin D10 is properly supported on the upper support portion 300.

[0191] In one example of bracket 100, the contact angle between the upper part D20 of pin D10 and the upper support part 300, i.e., the upper contact angle QA, is within the range of 100° or more and less than 180°.

[0192] Pin D10 is properly supported on the upper support portion 300.

[0193] In one example of the bracket 100, the upper contact angle QA is within the range of 120° or more and 150° or less.

[0194] Pin D10 is properly supported on the upper support portion 300.

[0195] In one example of the bracket 100, the support portion 200 further includes a recessed portion 230 disposed above the pin D10. The recessed portion 230 is configured such that, when the pin D10 is supported on the upper support portion 300, a space is formed between it and a portion of the pin D10 that is higher than the upper contact portion D20T, which is the portion of the upper part D20 of the pin D10 that contacts the upper support portion 300.

[0196] The part of pin D10 that is higher than the upper contact part D20T is less likely to come into contact with the bracket 100.

[0197] In one example of the bracket 100, the distance between the pin D10 supported on the upper support portion 300 and the retractable portion 230 is wider than the distance between the pin D10 supported on the upper support portion 300 and the lower support portion 400.

[0198] The part of pin D10 that is higher than the upper contact part D20T is less likely to come into contact with the bracket 100.

[0199] In one example of the support unit 10, the support unit 10 includes a support 100, a marking wheel C10, and a pin D10.

[0200] With pin D10 supported by the upper support 300, the position of pin D10 relative to the bracket 100 is not easily changed, and the stability of the marking wheel C10 relative to the bracket 100 is improved.

[0201] (Effect 2)

[0202] In one example of the bracket 100, the upper support portion 300 is configured such that, in the first pin support state, the limiting pin D10 moves forward or backward relative to the bracket 100 in the front-rear direction.

[0203] In the front-rear direction of the bracket 100, the position of pin D10 relative to the bracket 100 is not easily changed, and the position stability of the scribing wheel C10 is improved.

[0204] In one example of the bracket 100, the lower support portion 400 is configured such that, in the second pin support state, the limiting pin D10 moves forward or backward relative to the bracket 100 in the front-rear direction.

[0205] In the front-rear direction of the bracket 100, the position of pin D10 relative to the bracket 100 is not easily changed, and the position stability of the scribing wheel C10 is improved.

[0206] In one example of the bracket 100, the pin support state is configured as the first pin support state before the scribing wheel C10 begins to travel relative to the workpiece.

[0207] After the scribing wheel C10 has just started moving relative to the workpiece, the stability of the position of the scribing wheel C10 is improved.

[0208] In one example of the bracket 100, the scribing wheel C10 is pressed against an object different from the workpiece, and the pin support state is configured as the first pin support state.

[0209] When the scribing wheel C10 is pressed against the workpiece for scribing, the position of the pin D10 relative to the bracket 100 is less likely to change with the pressing. This improves the accuracy associated with the initial position configuration of the scribing wheel C10 relative to the workpiece.

[0210] The support 100 is compared with a support having a different configuration (hereinafter referred to as "other supports"). Other supports do not include the upper support portion 300 of the support 100.

[0211] In scribing operations using a support unit that includes other supports, during the period when the scribing wheel travels a specified distance relative to the workpiece, the pin moves relative to the support more times in the vertical direction than a specified number of times. The specified number of times is a value greater than 0. This makes it difficult to maintain a stable position of the scribing wheel relative to the support in the vertical direction.

[0212] In scribing operations using the support unit 10 including the support 100, the number of times the pin D10 moves relative to the support 100 in the vertical direction during the period until the scribing wheel C10 travels a predetermined distance relative to the workpiece is less than a predetermined number. This predetermined number includes zero. Compared to other supports, the positional stability of the scribing wheel C10 relative to the support 100 in the vertical direction is higher.

[0213] Furthermore, the descriptions of the above embodiments are not intended to limit the possible arrangements of the support and support unit involved in this invention. The support and support unit involved in this invention can be arranged in ways different from those exemplified in each embodiment. One example is by replacing, modifying, or omitting a portion of the configuration of each embodiment, or by adding new configurations to each embodiment.

[0214] Explanation of reference numerals in the attached figures

[0215] 10: Support Unit

[0216] C10: Marking wheel

[0217] D10: Sales

[0218] 100: Bracket

[0219] 200: Support section

[0220] 230: Retreat Department

[0221] 300: Upper support section

[0222] F20: Upper support surface

[0223] 400: Lower support section.

Claims

1. A bracket comprising a support portion of a support pin, said pin supporting a marking wheel, The support portion includes a lower support portion and an upper support portion. The lower support portion supports the lower part of the pin to restrict the pin from moving downward, and the upper support portion supports the upper part of the pin to restrict the pin from moving downward when the pin is separated from the lower support portion. The support portion further includes a retractable portion, which is positioned above the pin. The retraction portion is configured such that, with the pin supported on the upper support portion, a space is formed between the retraction portion and the upper portion of the pin, which is located higher than the portion that contacts the upper support portion.

2. The stent according to claim 1, wherein, The upper support portion includes an upper support surface, which clamps the pin when the pin is separated from the lower support portion.

3. The stent according to claim 2, wherein, The upper support surface includes an inclined surface.

4. The stent according to claim 3, wherein, The inclination angle of the upper support surface is within the range of 20° or more and 80° or less.

5. The stent according to any one of claims 1 to 4, wherein, The contact angle between the upper part of the pin and the upper support portion is within the range of 100° or more and less than 180°.

6. The stent according to claim 5, wherein, The contact angle between the upper part of the pin and the upper support portion is within the range of 120° or more and 150° or less.

7. The stent according to claim 1, wherein, The distance between the pin supported on the upper support portion and the retractable portion is wider than the distance between the pin supported on the upper support portion and the lower support portion.

8. A support unit, comprising: support; Marking wheel; as well as pin, The bracket includes a support portion for a support pin, the pin supporting the marking wheel. The support portion includes a lower support portion and an upper support portion. The lower support portion supports the lower part of the pin to restrict the pin from moving downward, and the upper support portion supports the upper part of the pin to restrict the pin from moving downward when the pin is separated from the lower support portion. The support portion further includes a retractable portion, which is positioned above the pin. The retraction portion is configured such that, with the pin supported on the upper support portion, a space is formed between the retraction portion and the upper portion of the pin, which is located higher than the portion that contacts the upper support portion.

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