A multi-stage rocket timing test channel multiplexing system
By designing a multi-stage rocket timing test channel multiplexing system, which utilizes diodes and isolation optocouplers to achieve channel multiplexing and isolation, the problem of insufficient acquisition channels caused by increased rocket load is solved, reducing equipment modification costs and time, and ensuring test independence.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING ZHONGKE AEROSPACE TECH CO LTD
- Filing Date
- 2022-12-23
- Publication Date
- 2026-06-30
AI Technical Summary
The increased rocket payload has led to insufficient data acquisition channels for ground testing equipment. Modifying existing equipment is costly and time-consuming, and cannot meet the increased timing channel requirements.
Design a multi-stage rocket timing test channel reuse system. Through the circuit connection between the onboard system and the ground system, diodes and isolation optocouplers are used to achieve channel reuse and isolation, ensuring that the timing tests of each stage do not affect each other.
It enables the reuse of timing sequences for different rocket classes, meets the increased payload requirements, reduces equipment modification costs and time, and ensures the independence of the testing process.
Smart Images
Figure CN115962068B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of aerospace systems technology, and in particular to a multi-stage rocket timing test channel reuse system. Background Technology
[0002] Each rocket payload is different. However, in the early stages of design, the ground test equipment has a limited number of acquisition channels for the test sequence. Therefore, as the number of payloads increases and the corresponding number of timing channels increases, the ground test equipment will have insufficient acquisition channels. Changing the ground test equipment is costly and time-consuming. In some cases, it may be impossible to change it and a new system may be developed to meet the required number of acquisition channels for the timing sequence.
[0003] Based on this, the present invention proposes a method for reusing timing test channels for multi-stage rockets. Summary of the Invention
[0004] This invention provides a multi-stage rocket timing test channel reuse system, comprising: an onboard system and a ground system; the onboard system includes first- and second-stage onboard timing recovery channel circuits and additional multi-stage onboard timing recovery channel circuits, while the ground system includes first- and second-stage ground-based timing test channel circuits. The first- and second-stage onboard timing recovery channel circuits of the onboard system are connected to the first- and second-stage ground-based timing test channel circuits of the ground system via diodes one and two, and the multi-stage onboard timing recovery channel circuits of the onboard system are connected to the first- and second-stage ground-based timing test channel circuits of the ground system via diodes three and four.
[0005] As described above, in a multi-stage rocket timing test channel multiplexing system, the on-board timing retrieval circuit for the third and fourth stages includes an isolation optocoupler U1, with a diode D1 connected in parallel to the isolation optocoupler U1. The isolation optocoupler U1 consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R2, and the emitter is grounded. The negative terminal of the diode in the isolation optocoupler U1 is connected to the low level of the separation timing, and the positive terminal is connected to the high level of the separation timing through a resistor R1. The on-board satellite-rocket separation timing switch S1 is connected to the high level of the separation timing.
[0006] As described above, in a multi-stage rocket timing test channel multiplexing system, the first and second stage rocket on-board timing retrieval circuit includes an isolation optocoupler U2. The collector of the transistor is connected to a 5V power supply through a resistor R4. The isolation optocoupler U2 consists of a transistor and a diode, with the emitter grounded. The negative terminal of the diode in the isolation optocoupler U2 is connected to the separation timing low level, and the positive terminal is connected to the separation timing high level through a resistor R3. The on-board satellite-rocket separation timing switch S2 is connected to the separation timing high level.
[0007] As described above, a multi-stage rocket timing test channel multiplexing system includes a first and second stage timing ground test channel circuit comprising an isolation optocoupler U3. The isolation optocoupler U3 consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R6, and the emitter is grounded.
[0008] In the multi-stage rocket timing test channel multiplexing system described above, a diode D3 is connected in parallel with the isolation optocoupler U3. The positive terminal of diode D3 is connected to the separation timing low level of the timing retrieval circuit on the third and fourth stages of the rocket through diode D4, and the positive terminal of diode D3 is connected to the positive terminal of diode D4.
[0009] In the multi-stage rocket timing test channel multiplexing system described above, the positive terminal of diode D3 is connected to the separation timing low level of the timing retrieval circuit on the first and second stage rockets through diode D7, and the positive terminal of diode D3 is connected to the positive terminal of diode D7.
[0010] In the multi-stage rocket timing test channel multiplexing system described above, the negative terminal of diode D3 is first connected to resistor R5, and then connected to the separation timing high level of the timing retrieval circuit on the third and fourth stages of the rocket through diode D5. The negative terminal of diode D3 is connected to resistor R5 and then to the negative terminal of diode D5.
[0011] In the multi-stage rocket timing test channel multiplexing system described above, the negative terminal of diode D3 is connected to resistor R5 and then to the separation timing high level of the timing retrieval circuit on the first and second stage rockets via diode D6, and the negative terminal of diode D3 is connected to resistor R5 and then to the negative terminal of diode D6.
[0012] The beneficial effects achieved by this invention are as follows: This invention reuses the same timing acquisition channel for timing at different levels and time periods through multiplexing circuits to meet the testing requirements of rocket timing; and it isolates different timing channels that reuse the same test path by designing isolation circuits to ensure that each timing test process does not affect each other. Attached Figure Description
[0013] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For those skilled in the art, other drawings can be obtained based on these drawings.
[0014] Figure 1 This is a schematic diagram of a multi-stage rocket timing test channel reuse system provided in Embodiment 1 of the present invention. Detailed Implementation
[0015] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0016] Example 1
[0017] like Figure 1 As shown, Embodiment 1 of the present invention provides a multi-stage rocket timing test channel reuse system, including an onboard system and a ground system. The onboard system includes first- and second-stage onboard timing recovery channel circuits and additional multi-stage onboard timing recovery channel circuits. The ground system includes first- and second-stage time-series ground test channel circuits. The first- and second-stage onboard timing recovery channel circuits of the onboard system are connected to the first- and second-stage time-series ground test channel circuits of the ground system via diodes one and two. The multi-stage onboard timing recovery channel circuits of the onboard system are connected to the first- and second-stage time-series ground test channel circuits of the ground system via diodes three and four.
[0018] The multi-stage on-rocket timing feedback circuit includes an isolation optocoupler with a diode connected in parallel. The isolation optocoupler consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R2, and the emitter is grounded. The negative terminal of the diode in the isolation optocoupler is connected to the separation timing low level (i.e., separation timing-), and the positive terminal is connected to the separation timing high level (i.e., separation timing+) through a resistor. The on-rocket star-rocket separation timing switch is connected to the separation timing high level.
[0019] For example Figure 1 Taking the timing recovery channel circuit of the fourth-stage rocket as an example, the timing recovery channel circuits of other multi-stage rockets are the same as those of the fourth-stage rocket, and will not be described in detail here. In the figure, the timing recovery circuit of the third and fourth stage rockets includes an isolation optocoupler U1, with a diode D1 connected in parallel with the isolation optocoupler U1; the isolation optocoupler U1 consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R2, and the emitter is grounded. The negative terminal of the diode in the isolation optocoupler U1 is connected to the separation timing low level (i.e., separation timing -), and the positive terminal is connected to the separation timing high level (i.e., separation timing +) through a resistor R1. The rocket-satellite separation timing switch S1 is connected to the separation timing high level.
[0020] The timing feedback circuit on the first and second stage rockets includes an isolation optocoupler U2. The collector of the transistor is connected to a 5V power supply through a resistor R4. The isolation optocoupler U2 consists of a transistor and a diode, with the emitter grounded. The negative terminal of the diode in the isolation optocoupler U2 is connected to the separation timing low level (i.e., separation timing-), and the positive terminal is connected to the separation timing high level (i.e., separation timing+) through a resistor R3. The on-board star-rocket separation timing switch S2 is connected to the separation timing high level.
[0021] The first and second level timing ground test channel circuit includes an isolation optocoupler U3, which consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R6, and the emitter is grounded.
[0022] A diode D3 is connected in parallel with the isolation optocoupler U3. The anode of diode D3 is connected to the low-level separation timing of the multi-stage arrow timing feedback circuit via diode D4, and the anode of diode D3 is connected to the anode of diode D4. The anode of diode D3 is connected to the low-level separation timing of the first and second stage arrow timing feedback circuit via diode D7, and the anode of diode D3 is connected to the anode of diode D7. The cathode of diode D3 is first connected to resistor R5, and then to the high-level separation timing of the multi-stage arrow timing feedback circuit via diode D5, and the cathode of diode D3 is connected to the cathode of diode D5 after resistor R5. The cathode of diode D3 is connected to resistor R5, and then to the high-level separation timing of the first and second stage arrow timing feedback circuit via diode D6, and the cathode of diode D3 is connected to the cathode of diode D6 after resistor R5.
[0023] For example, such as Figure 1 The four-stage rocket timing test channel multiplexing system shown has a diode D3 connected in parallel with the isolation optocoupler U3. The anode of diode D3 is connected to the low-level separation timing of the third and fourth stage rocket timing retrieval circuit via diode D4, and the anode of diode D3 is also connected to the anode of diode D4. The anode of diode D3 is connected to the low-level separation timing of the first and second stage rocket timing retrieval circuit via diode D7, and the anode of diode D3 is also connected to the anode of diode D7. The cathode of diode D3 is first connected to resistor R5, and then to the high-level separation timing of the third and fourth stage rocket timing retrieval circuit via diode D5, with the cathode of diode D3 connected to resistor R5 and then to the cathode of diode D5. The cathode of diode D3 is then connected to resistor R5, and then to the high-level separation timing of the first and second stage rocket timing retrieval circuit via diode D6, with the cathode of diode D3 connected to resistor R5 and then to the cathode of diode D6.
[0024] Based on the timing sequence characteristics of each stage of a rocket, this invention designs a ground test channel for multiplexing timing sequences at each stage. Thus, when there are too many satellite payloads and additional timing sequences are needed, the extra onboard timing recovery circuits for the third and fourth stages are led to the first and second stage timing ground test channel via diodes D4 and D5. Similarly, the onboard timing recovery circuits for the first and second stages are also led to the first and second stage timing ground test channel via diodes D6 and D7. Furthermore, by isolating the different onboard timing output interfaces of the multiplexed channel, the timing outputs and recovery of different onboard stages using the same ground test channel do not interfere with each other.
[0025] During simulated flight testing, when the first and second stage flight sequence timings are activated, diodes D4 and D5 isolate the first and second stage timing levels from the third and fourth stage timings. Therefore, the on-board sampling circuit for the third and fourth stages cannot capture the changes in the first and second stage timing levels. Conversely, if the third and fourth stage satellite-rocket separation timings are activated during simulated flight testing, diodes D6 and D7 isolate the first and second stage timings from the third and fourth stage satellite-rocket separation timing levels. Therefore, the on-board sampling circuit for the first and second stages cannot capture the changes in the third and fourth stage satellite-rocket separation timing levels.
[0026] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made on the basis of the technical solution of the present invention should be included within the scope of protection of the present invention.
Claims
1. A multi-stage rocket timing test channel multiplexing system, characterized by, include: The rocket system and the ground system are equipped with primary and secondary rocket timing data acquisition channel circuits and additional multi-stage rocket timing data acquisition channel circuits. The ground system is equipped with primary and secondary timing ground test channel circuits. The first and second stage timing ground test channel circuit includes an isolation optocoupler U3; a diode D3 is connected in parallel with the isolation optocoupler U3. The anode of diode D3 is connected to the separation timing low level of the added multi-stage on-rocket timing backtracking channel circuit through diode D4, and the anode of diode D3 is connected to the anode of diode D4; the anode of diode D3 is connected to the separation timing low level of the first and second stage on-rocket timing backtracking channel circuit through diode D7, and the anode of diode D3 is connected to the anode of diode D7; the cathode of diode D3 is first connected to resistor R5, and then connected to the separation timing high level of the added multi-stage on-rocket timing backtracking channel circuit through diode D5, and the cathode of diode D3 is connected to resistor R5 and then to the cathode of diode D5; the cathode of diode D3 is connected to resistor R5 and then to the separation timing high level of the first and second stage on-rocket timing backtracking channel circuit through diode D6, and the cathode of diode D3 is connected to resistor R5 and then to diode D6. The negative electrode.
2. A multi-stage rocket time sequence test path multiplexing system as recited in claim 1, wherein, The added multi-stage on-rocket timing recovery channel circuit includes: a third- and fourth-stage on-rocket timing recovery channel circuit, which includes an isolation optocoupler U1 with a diode D1 connected in parallel to it; the isolation optocoupler U1 consists of a transistor and a diode, the collector of the transistor is connected to a 5V power supply through a resistor R2, and the emitter is grounded; the negative terminal of the diode in the isolation optocoupler U1 is connected to the separation timing low level of the third- and fourth-stage on-rocket timing recovery channel circuit, and the positive terminal is connected to the separation timing high level of the third- and fourth-stage on-rocket timing recovery channel circuit through a resistor R1; the on-rocket star-rocket separation timing switch S1 is connected to the separation timing high level of the third- and fourth-stage on-rocket timing recovery channel circuit.
3. The multi-stage rocket timing test channel reuse system as described in claim 1, characterized in that, The timing feedback channel circuit for the first and second stage rockets includes an isolation optocoupler U2, which consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through a resistor R4, and the emitter is grounded. The cathode of the diode in the isolation optocoupler U2 is connected to the low level of the separation timing of the first and second stage rocket timing feedback channel circuit, and the anode is connected to the high level of the separation timing of the first and second stage rocket timing feedback channel circuit through a resistor R3. The on-board satellite-rocket separation timing switch S2 is connected to the high level of the separation timing of the first and second stage rocket timing feedback channel circuit.
4. The multi-stage rocket timing test channel reuse system as described in claim 1, characterized in that, The isolation optocoupler U3 consists of a transistor and a diode. The collector of the transistor is connected to a 5V power supply through resistor R6, and the emitter is grounded.
5. A multi-stage rocket timing test channel reuse system as described in claim 4, characterized in that, The added multi-stage on-rocket timing retrieval channel circuit includes: a third- and fourth-stage on-rocket timing retrieval channel circuit, wherein the positive terminal of diode D3 is connected to the separation timing low level of the third- and fourth-stage on-rocket timing retrieval channel circuit through diode D4, and the positive terminal of diode D3 is connected to the positive terminal of diode D4.
6. The multi-stage rocket timing test channel reuse system as described in claim 5, characterized in that, The cathode of diode D3 is first connected to resistor R5, and then connected to the separation timing high level of the timing backtracking channel circuit on the third and fourth stage arrows through diode D5. The cathode of diode D3 is connected to resistor R5 and then to the cathode of diode D5.