A power isolation hybrid integrated module reliability test method and circuit thereof

Abstract

A power isolation hybrid integrated module reliability test method and its circuit belong to the field of power isolation module. The single product is subjected to aging unit design; the adjustable current circuit is connected in parallel at both ends of each aging unit to eliminate the influence of the slight difference between components and devices on the current difference of each aging unit; the current test circuit is connected in series between the aging unit circuit and the power isolation module to detect the size of the current of each aging unit during the product aging process; the input end control signal of the power isolation module adopts the dual-source design of the linear adjustable voltage source and the adjustable frequency signal source, the linear adjustable voltage source is used for the analog-digital conversion function of the test module, and the adjustable frequency signal source is used for the digital-analog conversion speed of the test module; the module measurement method integrates the power isolation module output end voltage drop and the minimum aging unit current test point into the corresponding rotary switch respectively. The reliability test problem of the power isolation module is solved. It is widely used in the feasibility test and test of the power isolation module.

Description

TECHNICAL FIELD

[0001] The present application belongs to the field of power isolation module, further to the field of power photoelectric isolation module, in particular to a reliability test method and circuit of a power isolation hybrid integrated module. BACKGROUND

[0002] The power isolation module is a circuit module, the input signal loop and the output signal loop are physically isolated, the working power of the input signal loop and the output signal loop do not affect each other, the interference is small, the reliability is high, and the electromagnetic compatibility is good. From the development direction of modularization, integration and miniaturization, the isolation is mainly achieved by using the photoelectric isolation mode, and the conduction and shutdown of the channel are controlled by using the photoelectric isolation function, such as a photoelectric isolation voltage regulation controller module, which has strong load capacity and can directly drive the load to work, and is widely used in the fields of aviation, aerospace and the like. In the product research and development and production process, the product parameter test and aging screening of the power isolation module need to be carried out, and the test and aging device of the product is designed according to the characteristics of the power isolation module.

[0003] The optocoupler device is applied to a place where physical isolation is needed to transmit signals, and the transmission process is that the input end converts the electrical signal into an optical signal, the output end receives the optical signal and converts it into an electrical signal, and the input end and the output end are physically isolated.

[0004] Based on the characteristics of the power isolation module product, the main targets of the product test and aging circuit are:

[0005] (1) Test and aging of the product input end: analog quantity input is carried out on the product input control end to test the analog-digital conversion function and threshold voltage identification function of the product input end;

[0006] (2) Test and aging of the product output end: the power aging method is used to test the output load capacity of the product.

[0007] Technical problems to be solved:

[0008] (1) The power isolation module product aging board needs to consider parameter test and aging screening at the same time.

[0009] (2) The product aging screening needs to be carried out at high temperature, and since the power isolation module product aging board has large working current and many signal lines, it is easy to appear unstable under high temperature, so the reliability test method and circuit of the power isolation module product need to be solved.

[0010] In the prior art, there is no reliability test method and circuit of the power isolation module that can be used for reference.

[0011] Therefore, the present application is proposed. SUMMARY

[0012] The technical problem to be solved by the present application is to solve the reliability test problem of the power isolation module.

[0013] The present application provides a power isolation hybrid integrated module reliability test method, comprising the following methods:

[0014] (1) Aging unit design

[0015] For batch product aging, defective products are screened, and a single product clamp is used as an aging site. The number of products installed in each aging site is determined by the number of products that can be installed in a single product clamp. The aging unit is designed for a single product, the peripheral circuit is built according to the working circuit of the module product, and then each aging unit circuit is integrated onto the aging circuit board.

[0016] (2) Aging circuit design

[0017] The power isolation module is aged and screened by overcurrent, and is powered by a low voltage method to reduce the power of the overall aging circuit.

[0018] Parallel adjustable current circuits are connected between each aging unit to make the current of each aging unit consistent and eliminate the influence of the slight differences between components on the current of each aging unit.

[0019] A current test circuit is connected in series between the aging unit circuit and the power isolation module to detect the current of each aging unit during product aging.

[0020] (3) Control module

[0021] The power isolation module input control signal adopts a double-source design: one is a linear adjustable voltage source (voltage analog quantity), and the other is a adjustable frequency signal source (voltage digital quantity) realized by a PWM circuit.

[0022] The control signal input port is selected by a toggle switch. The control signal is distributed to each aging unit as a control signal in a bus manner to ensure that each channel can work when the product is aged or tested.

[0023] When the linear adjustable voltage source is selected for aging and testing, the product input control end is input with an analog quantity. The product identifies the input voltage according to the threshold voltage set internally, completes the analog-to-digital conversion function, verifies the function implemented by the product, and tests the output load capacity of the product.

[0024] When the adjustable frequency signal source is selected for aging and testing, the product digital-to-analog conversion speed is aged, and the stability and timeliness of the product are verified.

[0025] (4) Measurement module

[0026] When the test burn-in circuit works, two types of signals, such as output end voltage drop of the power isolation module and minimum burn-in unit current, are tested and monitored. Two groups of measurement data, such as output end voltage drop of each burn-in unit power isolation module and burn-in unit current, need to be tested, and the measurement for each burn-in unit is time-consuming and labor-intensive.

[0027] Therefore, the same type of test data is integrated on one test point, a rotary switch is used, and a plurality of test points are integrated on the rotary switch in a corresponding order, one parameter of one burn-in unit is tested by one rotation, time and labor are saved, the operation is simple, efficient and low in cost.

[0028] Two rotary switches are used to integrate the output end voltage drop of the power isolation module and the minimum burn-in unit current test point into the corresponding rotary switch (as shown in FIG. Figure 2 The rotary switch is controlled to select different burn-in unit test points, thereby improving the work efficiency of the tester and improving the degree of automation.

[0029] The present application provides a test circuit of the reliability test method, as shown in FIG. Figures 1-2 The test circuit comprises a measured power isolation module N1, fixed resistors R1, R2, R4, R5, R6, R7, R8 and R10, adjustable resistors R3 and R9, LED light emitting diodes D1 and D2, DC power supplies P1 and P2, and rotary switches S1 and S2.

[0030] One end of R1, R2 and R3 is connected with P1, one end of R5 is connected with A17 pin of S2, the other end of R1 is connected with D1 negative electrode and one end of R4, the positive electrode of D1 is connected with the other end of R2, the other end of R4 is connected with the other end of R3, and the other end of R5 is connected with B17 pin of S1 and 8 pin of N1.

[0031] One end of R6, R7 and R9 is connected with P2, one end of R10 is connected with A18 pin of S2, the other end of R6 is connected with D2 negative electrode and one end of R8, the positive electrode of D2 is connected with the other end of R7, the other end of R9 is connected with the other end of R8, and the other end of R10 is connected with B18 pin of S1 and 16 pin of N1.

[0032] R1 and R6 are current branches; R2 and D1 are connected in series, and R7 and D2 are connected in series, which are display circuits; R3 and R4 are connected in series, and R8 and R9 are connected in series, which are current fine adjustment branches; R5 and R10 are low resistance, high precision and low temperature drift resistors, which are used for unit current sampling detection of the unit burn-in circuit.

[0033] The technical scheme of the present application has the following technical effects:

[0034] The power isolation module test and the burn-in circuit have the following functions:

[0035] (1)Old burn indication function: the LED is bright to indicate that the product is normal.

[0036] (2)Current fine adjustment function: a potentiometer and a fixed resistor are connected in parallel in the burn-in circuit, and the voltage across the burn-in circuit is adjusted by adjusting the potentiometer, thereby realizing the current fine adjustment function.

[0037] (3)Test function: the voltage drop at the output end of the power isolation module in the burn-in circuit and the minimum burn-in unit current test point are integrated into two multi-way rotary switches, and the test point is selected by controlling the rotary switch.

[0038] (4)Real-time monitoring function: the size of the product burn-in current is obtained in real time by measuring the voltage across the low resistance, high precision, low temperature drift resistor connected in series at the output end of the product, and the size of the product burn-in current is adjusted in time through the current fine adjustment function.

[0039] The product burn-in circuit of the power isolation module product is used to burn-in and screen the function and product output load of the power isolation module product. The related electrical parameter test can be performed immediately while the product is being burned-in, and the product burn-in state is verified.

[0040] The technical scheme of the present application designs the test and burn-in circuit board of the product according to the characteristics of the power isolation module, and is widely used in the feasibility test and experiment of the power isolation module. BRIEF DESCRIPTION OF DRAWINGS

[0041] Figure 1 It is a schematic diagram of the minimum burn-in unit circuit structure.

[0042] Figure 2 It is a schematic diagram of the integrated connection circuit structure of the voltage drop and current test point rotary switch.

[0043] In the figure: N1 is the measured power isolation module, R1, R2, R4, R5, R6, R7, R8 and R10 are fixed resistors, R3 and R9 are adjustable resistors, D1 and D2 are LED light emitting diodes, P1 and P2 are DC power supplies, and S1 and S2 are rotary switches. DETAILED DESCRIPTION

[0044] As shown in Figures 1-2 , taking the BTX2021 power isolation module product as an example, the specific implementation of the reliability test method of the power isolation hybrid integrated module is as follows:

[0045] (1) The minimum burn-in unit design is adopted for the isolation module burn-in circuit

[0046] It is designed to determine that there are 10 burn-in positions in the burn-in circuit, and one burn-in position can install 2 products, that is, a total of 20 minimum burn-in units are designed.

[0047] Peripheral circuit is built according to the working circuit of the module product, so that the module product is in a working state, the product working current is set to 360mA, and an LED and a 1.5KΩ resistor are connected in series as a normal aging working indicator.

[0048] (2) Aging circuit design

[0049] The power isolation module is aged and screened by overcurrent, and a small voltage of 4V is used for power supply in order to reduce the overall aging power.

[0050] In order to ensure that the current of each aging unit is consistent and eliminate the influence of the slight difference between resistors, LEDs and other components on the current difference of each aging unit, a 1KΩ potentiometer and a 100Ω fixed resistor are connected in series at each aging unit to realize the current trimming function of the aging circuit.

[0051] In order to facilitate the detection of the current of each aging unit during the aging process of the product, a 1Ω high-precision low-temperature drift resistor is connected in series as a sampling function, which has small working power and a voltage-current value ratio of 1:1 for easy reading. The aging current of the product is obtained by measuring the voltage across the resistor, which is convenient for intuitive adjustment of the current.

[0052] The specific aging unit circuit is shown in Figure 1 .

[0053] (3) Control module

[0054] The input end of the power isolation module adopts double source design. A toggle switch design is adopted, and the control signal input port is selected by the toggle switch. The control signal is distributed to each aging unit as a control signal in a bus manner.

[0055] (4) Measurement module

[0056] A SW-24 rotary switch is used to integrate the test points on the switch. Each rotation corresponds to testing the parameters of one aging unit, so that the same type of test data can be integrated on one test point, saving time and effort and facilitating personnel operation.

[0057] The model specification of R5 and R10 is 1Ω / 0.25W / 0.1%.

[0058] Based on the actual aging situation, the aging design circuit of the power isolation module is reasonably designed from the aspects of heat dissipation, wiring, and various use conditions. The following structure optimization design is made, and the main advantages of the design are:

[0059] (1) Since the total power of the single-chip test burn-in circuit board is large (20 burn-in units in total, and the maximum design total current is 8A), considering the heat dissipation problem of the whole board, the power resistor of each burn-in unit is designed on the back of the board, and a certain height is left during soldering to facilitate heat dissipation.

[0060] (2) Since there are many relatively concentrated traces on the whole board, considering the convenience of the traces, the knob switch is designed to the middle of the board, and the burn-in positions are divided into upper and lower parts.

[0061] (3) Since the total current of the whole board is too large, the power supply trace adopts the mode of one bus in the upper half and one bus in the lower half to preferentially ensure sufficient line width. The ground trace is similar to the power supply trace.

[0062] (4) Considering the situation that the burn-in circuit board is used in a high-temperature box, a circle of holes is punched around the board, a base is installed to support and raise the board to facilitate heat dissipation of the bottom resistor, and the whole board is pulled in the high-temperature environment to prevent deformation.

[0063] (5) In order to ensure the reliability of the power terminal, two other types of power supply interfaces are reserved on the board, and the actual assembly is selected.

[0064] Finally, it should be noted that the above examples are only examples for the purpose of clarity, and the present application includes but is not limited to the above examples, and all implementation manners do not need to be exhausted here. For ordinary skilled persons in the art, other different forms of changes or variations can be made on the basis of the above description. Any implementation scheme meeting the requirements of the present application falls within the protection scope of the present application.

Claims

1. A reliability testing method for a power-isolated hybrid integrated module, characterized in that, The experimental method is based on the following circuit: Includes the power isolation module under test N1, fixed resistors R1, R2, R4, R5, R6, R7, R8, R10, adjustable resistors R3, R9, LEDs D1, D2, DC power supplies P1, P2, and rotary switches S1, S2. One end of R1, R2, and R3 is connected to P1; one end of R5 is connected to pin A17 of S2; the other end of R1 is connected to the negative terminal of D1; one end of R4 is connected to the positive terminal of D1; the other end of R2 is connected to the other end of R4; and the other end of R5 is connected to pin B17 of S1 and pin 8 of N1. One end of R6, R7, and R9 is connected to P2; one end of R10 is connected to pin A18 of S2; the other end of R6 is connected to the negative terminal of D2; one end of R8 is connected to the positive terminal of D2; the other end of R9 is connected to the other end of R8; and the other end of R10 is connected to pin B18 of S1 and pin 16 of N1. R1 and R6 form the current branch; R2 and D1 are connected in series, and R7 and D2 are connected in series to form the display circuit; R3 and R4 are connected in series, and R8 and R9 are connected in series to form the current fine-tuning branch; R5 and R10 form the unit current detection branch of the unit aging circuit. The experimental method is as follows: (1) Aging Unit Design Method Using a single product fixture as the aging station, the number of products installed in each aging station is determined by the number of products that can be installed in a single product fixture. An aging unit is designed for a single product, and the peripheral circuit is built according to the working circuit of the module product. Then, the circuit of each aging unit is integrated into the aging circuit board. (2) Old circuit design method Overcurrent aging screening is performed on the power isolation module, and low voltage power supply is used to reduce the power of the overall aging circuit. An adjustable current circuit is connected in parallel across each aging unit to ensure that the current of each aging unit is consistent, thus eliminating the influence of the current difference between each aging unit caused by the slight differences between components. A current test circuit is connected in series between the aging unit circuit and the power isolation module to detect the magnitude of the current in each aging unit during the product aging process. (3) Test method for control module The power isolation module's input control signal adopts a dual-source design: a linearly adjustable voltage source and an adjustable frequency signal source; The system uses a toggle switch connection to select the control signal input port. The control signal is distributed to each aging unit via a bus to ensure that each channel can work when the product is aging or being tested. When using a linear adjustable voltage source for aging and testing, analog input is given to the product's input control terminal. The product identifies the input voltage based on the internally set threshold voltage, completes the analog-to-digital conversion function, verifies the product's functionality, and tests the product's output load capacity. When using a selectable frequency signal source for curing and testing, the digital-to-analog conversion speed of the product is curated to verify the stability and timeliness of the product's operation. (4) Measurement module measurement method A rotary switch is used to integrate the same type of test data into one test point. Several test points are integrated into the rotary switch in a corresponding order. Each rotation corresponds to testing one aging unit parameter. Two rotary switches are used to integrate the voltage drop at the output of the power isolation module and the minimum aging unit current test point into the corresponding rotary switches. Different aging unit test points are selected by controlling the rotary switches.

2. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The linearly adjustable voltage source is an analog voltage quantity.

3. The reliability testing method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The adjustable frequency signal source is a digital voltage quantity.

4. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The adjustable frequency signal source is implemented using a PWM circuit.

5. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, N1 is a BTX2021 power isolation module.

6. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The specifications for R5 and R10 are 1Ω / 0.25W / 0.1%.

7. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The voltage values ​​of the DC power supplies P1 and P2 are 4V.

8. The reliability test method for a power isolation hybrid integrated module as described in claim 1, characterized in that, The rotary switches S1 and S2 are model number SW-24.

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