Method for testing light storage body luminous performance and service life

Abstract

The application is suitable for the technical field of light-storing materials, and provides a light-storing body light-emitting performance and service life testing method.The method comprises the following steps: placing the light-storing body to be tested in a dark environment for 36-72 hours before testing, so as to prepare for subsequent testing and keep the initial state of the light-storing body sample to be tested the same; placing the light-storing body to be tested on a placing table in a testing box; turning on a 295nm ultraviolet light source to irradiate the light-storing body for n seconds, wherein n=5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, and the irradiation time is increased by 5 seconds successively; after the ultraviolet light source is turned off, a brightness testing sensor is automatically turned on, and the initial brightness maximum value of the light-storing body after being irradiated for n seconds and the irradiation time m seconds corresponding to the maximum value are detected immediately; and the light-storing body is taken out after m seconds.The application can test the light-emitting performance stability of the light-storing body in an extreme environment and the service life of the light-storing body.

Description

Technical Field

[0001] This invention belongs to the field of light-generating materials technology, and in particular relates to a method for testing the luminescence performance and lifetime of a light-generating material. Background Technology

[0002] Photoluminescent materials, also known as long-afterglow luminescent materials, are currently a hot research topic. In recent years, a number of new photoluminescent materials, including photoluminescent ceramics, photoluminescent glass, photoluminescent fibers, and photoluminescent buttons, have been developed.

[0003] The luminous brightness, afterglow time, and lifespan are the three main evaluation criteria for the luminous performance of phosphors. However, the current methods for studying the performance of phosphors are not perfect. Regarding this technical problem, although Chinese patent "A Test Device for the Phosphorescent Performance of Textiles" (CN208537411U) designed a test device for the performance of phosphorescent textiles, it is only applicable to phosphorescent textiles and is not suitable for the performance testing of other phosphors. Moreover, the method only designs a brightness test and does not include a test method for afterglow time and lifespan. Therefore, it is necessary to design a reliable and integrated test method to address the lack of a unified evaluation method for the performance testing of phosphors. Summary of the Invention

[0004] The purpose of this invention is to provide a method for testing the luminescence performance and lifetime of a photoluminescent material, aiming to solve the problems identified in the prior art.

[0005] The present invention is implemented as follows: a method for testing the luminescence performance and lifetime of a photoluminescent material, the method comprising: S1: placing the photoluminescent material to be tested in a dark environment for 36-72 hours before testing to prepare for subsequent testing, keeping the initial state of the photoluminescent material sample to be tested the same.

[0006] S2: Place the phosphor to be tested on the stage in the test chamber;

[0007] S3: Irradiate the phosphogenetic material with a 295nm ultraviolet light source for n seconds, n=5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, increasing the irradiation time by 5 seconds each time; after the ultraviolet light source is turned off, the brightness test sensor automatically turns on and immediately detects the initial maximum brightness of the phosphogenetic material after n seconds of irradiation and the irradiation time m seconds corresponding to the maximum brightness, then removes the phosphogenetic material;

[0008] S4: Place the phosphor to be tested taken out in S3 into the stage of the test chamber, and turn on the 295nm ultraviolet light source to irradiate the phosphor for m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in sequence; This step is to further accurately test the initial brightness X of the phosphor to be tested and the irradiation time M seconds corresponding to the initial brightness in the previous step S3. Then take out the phosphor after testing, where M is one of the values ​​of m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in S4;

[0009] S5: Place the phosphor under test in the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the phosphor for M seconds. After M seconds of irradiation, the ultraviolet light source will automatically turn off, and the afterglow detection sensor will turn on to detect the afterglow time of the phosphor for 400-1000 seconds and record the afterglow data automatically in real time. After the test, take the phosphor under test out of the test chamber.

[0010] S6: Place the photoluminescence to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescence for M seconds, and after the ultraviolet light source is turned off at the same time as the brightness sensor and the afterglow detection sensor are turned on immediately to automatically record the initial brightness and afterglow reduction rate of the photoluminescence. After that, the system stops working for 0.5-2 hours to allow the light energy absorbed by the photoluminescence to dissipate naturally.

[0011] S7: Following the detection method described in S6, set the program to automatically turn the ultraviolet light source and brightness sensor on and off, cycling L times until the initial brightness of the photogenerator drops to X*β. The larger the value of L, the longer the lifespan of the photogenerator is, where 50% < β < 1.

[0012] S8: Based on the data obtained by this test method: the initial brightness X of the luminescent material, the irradiation time M seconds corresponding to the initial brightness, and the number of cycles L required for the initial brightness of the luminescent material to drop to X*β. Finally, the overall luminous performance and service life of the luminescent material can be judged.

[0013] Preferably, the light-emitting element is a device with light-emitting properties, including: light-emitting ceramic, light-emitting glass, light-emitting film, light-emitting fiber, and light-emitting button.

[0014] Preferably, the entire interior of the test chamber is coated with an ultra-black coating.

[0015] Preferably, the accuracy of the brightness sensor is at least 0.32 mcd / m2.

[0016] Preferably, in steps S2 and S3, the phosphor to be tested needs to be replaced with a new phosphor sample before each new test.

[0017] Preferably, the testing environment inside the testing chamber can be changed according to experimental needs to simulate different extreme environments, including: high temperature, low temperature, high humidity and high salinity.

[0018] Preferably, β = 75%.

[0019] This invention provides a method for testing the luminescence performance and lifespan of a photoluminescent material. It employs an integrated automatic control method, effectively solving the problem of inconsistent standards and imperfect methods in the detection of photoluminescence performance due to the lack of integrated and efficient testing. This method achieves integrated and efficient testing of the initial brightness, afterglow time, and lifespan of the photoluminescent material. The entire interior of the test chamber is coated with an ultra-black coating, which absorbs over 99% of light waves and can withstand certain high and low temperatures, maximizing the protection of a stable dark environment inside the test chamber. Furthermore, the test environment can be modified according to experimental needs, simulating different extreme environments such as high temperature, low temperature, high humidity, and high salinity to obtain the stability of the photoluminescence performance and the lifespan of the photoluminescent material under extreme conditions. Attached Figure Description

[0020] Figure 1 A flowchart of a method for testing the luminescence performance and lifetime of a photocell provided in an embodiment of the present invention;

[0021] Figure 2 This is a comparison of the initial brightness of a photoluminescent button and a photoluminescent material over irradiation time in a photoluminescent performance and lifespan testing method provided in an embodiment of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0023] The specific implementation of the present invention will be described in detail below with reference to specific embodiments.

[0024] like Figure 1 and Figure 2 The diagram shows a flowchart of a method for testing the luminescence performance and lifetime of a photoluminescent material, as well as a comparison of the initial brightness of a photoluminescent button and a photoluminescent material over irradiation time, according to an embodiment of the present invention. The method includes:

[0025] S1: Place the phosphor to be tested in a dark environment for 36-72 hours before the test to prepare for the subsequent test and keep the phosphor sample to be tested in the same initial state.

[0026] S2: Place the phosphor to be tested on the stage in the test chamber;

[0027] S3: Irradiate the phosphogenetic material with a 295nm ultraviolet light source for n seconds, n=5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, increasing the irradiation time by 5 seconds each time; after the ultraviolet light source is turned off, the brightness test sensor automatically turns on and immediately detects the initial maximum brightness of the phosphogenetic material after n seconds of irradiation and the irradiation time m seconds corresponding to the maximum brightness, then removes the phosphogenetic material;

[0028] S4: Place the phosphor to be tested taken out in S3 into the stage of the test chamber, and turn on the 295nm ultraviolet light source to irradiate the phosphor for m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in sequence; This step is to further accurately test the initial brightness X of the phosphor to be tested and the irradiation time M seconds corresponding to the initial brightness in the previous step S3. Then take out the phosphor after testing, where M is one of the values ​​of m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in S4;

[0029] S5: Place the phosphor under test in the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the phosphor for M seconds. After M seconds of irradiation, the ultraviolet light source will be automatically turned off, and the afterglow detection sensor will be turned on to detect the afterglow time of the phosphor for 400-1000 seconds and record the afterglow data in real time. After the test, take the phosphor under test out of the test chamber.

[0030] S6: Place the photoluminescence to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescence for M seconds, and after the ultraviolet light source is turned off at the same time as the brightness sensor and the afterglow detection sensor are turned on immediately to automatically record the initial brightness and afterglow reduction rate of the photoluminescence. After that, the system stops working for 0.5-2 hours to allow the light energy absorbed by the photoluminescence to dissipate naturally.

[0031] S7: Following the detection method described in S6, set the program to automatically turn the ultraviolet light source and brightness sensor on and off, cycling L times until the initial brightness of the photogenerator drops to X*β. The larger the value of L, the longer the lifespan of the photogenerator is, where 50% < β < 1.

[0032] S8: Based on the data obtained by this test method: the initial brightness X of the luminescent material, the irradiation time M seconds corresponding to the initial brightness, and the number of cycles L required for the initial brightness of the luminescent material to drop to X*β. Finally, the overall luminous performance and service life of the luminescent material can be judged.

[0033] In a preferred embodiment of the present invention, the light-emitting element is a device with light-emitting properties, including: light-emitting ceramic, light-emitting glass, light-emitting thin film, light-emitting fiber, and light-emitting button.

[0034] In another preferred embodiment of the present invention, the entire interior of the test chamber is coated with an ultra-black coating.

[0035] In another preferred embodiment of the present invention, the accuracy of the brightness sensor is at least 0.32 mcd / m2.

[0036] In another preferred embodiment of the present invention, in steps S2 and S3, the photoluminescence to be tested needs to be replaced with a new photoluminescence sample before each new test.

[0037] As another preferred embodiment of the present invention, the testing environment inside the testing chamber can be changed according to experimental needs to simulate different extreme environments, including: high temperature, low temperature, high humidity and high salinity.

[0038] In another preferred embodiment of the present invention, β = 75%.

[0039] The above technical solution will be verified below with reference to specific embodiments.

[0040] Example 1

[0041] A method for testing the luminescence performance and lifetime of phosphorescent ceramics is as follows:

[0042] S1. Place the phosphorescent ceramic to be tested in a dark environment for 72 hours before the test to prepare for the subsequent test and ensure that the initial state of the phosphorescent button samples to be tested is the same.

[0043] S2. Place the phosphorescent ceramic to be tested in the shelf in the test chamber;

[0044] S3. Irradiate the photoluminescent ceramic with a 295nm ultraviolet light source for n seconds, n=5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, increasing the irradiation time by 5 seconds each time. After the ultraviolet light source is turned off, the brightness test sensor automatically turns on and immediately detects the initial maximum brightness of the photoluminescent ceramic after n seconds of irradiation, which is 1030mcd / m2, and the irradiation time corresponding to the maximum value of 25 seconds before removing the photoluminescent ceramic.

[0045] S4. Place the phosphorescent ceramic to be tested on the stage of the test chamber, and sequentially irradiate the phosphorescent ceramic with a 295nm ultraviolet light source for 21 seconds, 22 seconds, 23 seconds, 24 seconds, 25 seconds, 26 seconds, 27 seconds, 28 seconds, and 29 seconds. This step further refines the initial brightness (1063 mcd / m2) of the phosphorescent ceramic to be tested, as well as the corresponding irradiation time of 22 seconds, obtained in the previous step S3. Then, remove the tested phosphorescent ceramic.

[0046] S5. Place the photoluminescent ceramic to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescent ceramic for 22 seconds. After irradiation for 22 seconds, the ultraviolet light source will be automatically turned off, and the afterglow detection sensor will be turned on to detect the afterglow time of the photoluminescent ceramic for 1000 seconds and record the afterglow data automatically in real time. After the test, take the photoluminescent ceramic out of the test chamber.

[0047] S6. Place the photoluminescent ceramic to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescent ceramic for 22 seconds. After 22 seconds of irradiation, turn off the ultraviolet light source and immediately turn on the brightness sensor and afterglow detection sensor at the same time to automatically record the initial brightness and afterglow reduction rate of the photoluminescent ceramic. Then the system stops working for 2 hours to allow the light energy absorbed by the photoluminescent ceramic to dissipate naturally.

[0048] S7. Following the detection method described in S6, set the program to automatically turn the ultraviolet light source and brightness sensor on and off, cycling 543 times until the initial brightness of the photoluminescent ceramic drops to 1063*75%=797.25mcd / m2.

[0049] S8. Data obtained according to the test method: initial brightness X of the photoluminescent ceramic, irradiation time of 22 seconds corresponding to the initial brightness, and the number of cycles (543) required for the initial brightness of the photoluminescent ceramic to drop to 797.25 mcd / m2. Finally, the overall luminous performance and service life of the photoluminescent ceramic can be judged. That is, after being irradiated by a light source with a wavelength of 295 nm for 22 seconds, the maximum initial brightness of the photoluminescent ceramic is 1063 mcd / m2, and the maximum service life under this condition is 543 cycles.

[0050] Example 2

[0051] A method for testing the luminous performance and lifespan of a photoluminescent button is as follows:

[0052] S1. Place the phosphorescent buttons to be tested in a dark environment for 48 hours before testing to prepare for subsequent testing and ensure that the initial state of the phosphorescent button samples to be tested is the same.

[0053] S2. Place the photoluminescent button to be tested on the shelf in the test box;

[0054] S3. Irradiate the photoluminescent button with a 295nm ultraviolet light source for n seconds, n=5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, increasing the irradiation time by 5 seconds each time. After the ultraviolet light source is turned off, the brightness test sensor automatically turns on and immediately detects the initial maximum brightness of the photoluminescent button after n seconds of irradiation (3216 mcd / m2) and the irradiation time corresponding to the maximum value (45 seconds). Then, the photoluminescent element is removed.

[0055] S4. Place the phosphorescent button to be tested on the stage of the test chamber, and sequentially irradiate the phosphorescent ceramic with a 295nm ultraviolet light source for 41 seconds, 42 seconds, 43 seconds, 44 seconds, 45 seconds, 46 seconds, 47 seconds, 48 ​​seconds, and 49 seconds. This step further refines the initial brightness (3216 mcd / m2) of the phosphorescent button to be tested, as well as the corresponding irradiation time of 47 seconds, obtained in the previous step S3. Then, remove the tested phosphorescent ceramic.

[0056] S5. Place the phosphorescent button to be tested on the platform of the test chamber, turn on the 295nm ultraviolet light source to irradiate the phosphorescent button for 47 seconds. After irradiation for 47 seconds, the ultraviolet light source will automatically turn off, and the afterglow detection sensor will turn on to detect the afterglow time of the phosphorescent button for 1000 seconds and record the afterglow data in real time. After the test, take the phosphorescent button out of the test chamber.

[0057] S6. Place the photoluminescent button to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescent button for 47 seconds. After 47 seconds of irradiation, turn off the ultraviolet light source and immediately turn on the brightness sensor and afterglow detection sensor to automatically record the initial brightness and afterglow reduction rate of the photoluminescent button. Then the system stops working for 1.5 hours to allow the light energy absorbed by the photoluminescent button to dissipate naturally.

[0058] S7. Following the detection method described in S6, set the program to automatically turn the ultraviolet light source and brightness sensor on and off, cycling 754 times until the initial brightness of the photoluminescent button drops to 3216*75%=2412mcd / m2.

[0059] S8. Data obtained according to the test method: the initial brightness of the photoluminescent button is 3216 mcd / m2, the irradiation time corresponding to the initial brightness is 47 seconds, and the number of cycles required for the initial brightness of the photoluminescent button to drop to 2412 mcd / m2 is 754. Finally, the overall luminous performance and service life of the photoluminescent button can be judged. That is, after being irradiated by a light source with a wavelength of 295nm for 47 seconds, the maximum initial brightness of the photoluminescent button is 3216 mcd / m2, and the maximum service life under this condition is 754 cycles.

[0060] Observations showed that the main luminescent properties of the photoluminescent button tested in Example 2 were similar to those in Example 1.

[0061] The technical solutions in the above embodiments of this application have at least the following technical effects or advantages: An integrated automatic control method is adopted, thus effectively solving the problem of inconsistent standards and imperfect methods in detecting the luminescence performance of photocells due to the lack of integrated and efficient detection. This achieves integrated and efficient detection of the initial brightness, afterglow time, and lifespan of the photocell. Furthermore, by coating the entire interior of the test chamber with an ultra-black coating, more than 99% of light waves can be absorbed, while also withstanding certain high and low temperatures, maximizing the protection of a stable dark environment inside the test chamber. Finally, the test environment can be changed according to experimental needs within the test chamber, simulating different extreme environments such as high temperature, low temperature, high humidity, and high salinity, to obtain the stability of the photocell's luminescence performance and its lifespan under extreme conditions.

[0062] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for testing the luminescence performance and lifetime of a photoluminescent material, characterized in that, The method includes: S1: Place the phosphor to be tested in a dark environment for 36-72 hours before the test to prepare for the subsequent test and keep the phosphor sample to be tested in the same initial state. S2: Place the phosphor to be tested on the stage in the test chamber; S3: Irradiate the phosphogenetic material with a 295nm ultraviolet light source for n seconds, n = 5 seconds, 10 seconds, 15 seconds, 20 seconds, 25 seconds, 30 seconds, 35 seconds, 40 seconds, 45 seconds, 55 seconds, 60 seconds, increasing the irradiation time by 5 seconds each time; after the ultraviolet light source is turned off, the brightness test sensor automatically turns on and immediately detects the initial maximum brightness of the phosphogenetic material after n seconds of irradiation and the irradiation time m seconds corresponding to the maximum brightness, then removes the phosphogenetic material; S4: Place the phosphor to be tested taken out in S3 into the stage of the test chamber, and turn on the 295nm ultraviolet light source to irradiate the phosphor for m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in sequence; This step is to further accurately test the initial brightness X of the phosphor to be tested and the irradiation time M seconds corresponding to the initial brightness in the previous step S3. Then take out the phosphor after testing, where M is one of the values ​​of m-4 seconds, m-3 seconds, m-2 seconds, m-1 seconds, m seconds, m+1 seconds, m+2 seconds, m+3 seconds, and m+4 seconds in S4; S5: Place the phosphor under test in the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the phosphor for M seconds. After M seconds of irradiation, the ultraviolet light source will automatically turn off, and the afterglow detection sensor will turn on to detect the afterglow time of the phosphor for 400-1000 seconds and record the afterglow data automatically in real time. After the test, take the phosphor under test out of the test chamber. S6: Place the photoluminescence to be tested on the stage of the test chamber, turn on the 295nm ultraviolet light source to irradiate the photoluminescence for M seconds, and after the ultraviolet light source is turned off at the same time as the brightness sensor and afterglow detection sensor are turned on immediately to automatically record the initial brightness and afterglow reduction rate of the photoluminescence. After that, the system stops working for 0.5-2 hours to allow the light energy absorbed by the photoluminescence to dissipate naturally. S7: Following the detection method described in S6, set the program to automatically turn the ultraviolet light source and brightness sensor on and off, cycling L times until the initial brightness of the photogenerator drops to X*β. The larger the value of L, the longer the lifespan of the photogenerator is, where 50% < β < 1. S8: Based on the data obtained by this test method: the initial brightness X of the luminescent material, the irradiation time M seconds corresponding to the initial brightness, and the number of cycles L required for the initial brightness of the luminescent material to drop to X*β. Finally, the overall luminous performance and service life of the luminescent material can be judged.

2. The method for testing the luminescence performance and lifetime of a photocell according to claim 1, characterized in that, The light-emitting element is a device with light-emitting properties, including: light-emitting ceramics, light-emitting glass, light-emitting thin film, light-emitting fiber, and light-emitting button.

3. The method for testing the luminescence performance and lifetime of a photocell according to claim 1, characterized in that, The entire interior of the test chamber is coated with an ultra-black coating.

4. The method for testing the luminescence performance and lifetime of a photocell according to claim 1, characterized in that, The accuracy of the brightness sensor is at least 0.32 mcd / m2.

5. The method for testing the luminescence performance and lifetime of a photocell according to claim 2, characterized in that, In steps S2 and S3, the phosphors to be tested need to be replaced with new phosphor samples before each new test.

6. The method for testing the luminescence performance and lifetime of a photocell according to claim 1, characterized in that, The test chamber can be modified to simulate different extreme environments according to experimental needs. The extreme environments that can be simulated include: high temperature, low temperature, high humidity and high salinity.

7. The method for testing the luminescence performance and lifetime of a photoluminescent material according to any one of claims 1-6, characterized in that, The β = 75%.

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