Processing method and device of flicker pulse, equipment and storage medium

Abstract

The application discloses a processing method, device and equipment of a flicker pulse and a storage medium. The processing method comprises the following steps: presetting a plurality of reference threshold values for a working device used for multi-threshold sampling, and acquiring a threshold correction function model; presetting a plurality of reference working temperatures, and performing multi-threshold sampling on an auxiliary correction pulse at each reference working temperature to determine a plurality of reference pulse widths corresponding to the plurality of reference threshold values at the reference working temperatures; performing contrast sampling on the auxiliary correction pulse to determine a conversion relationship between the threshold value and the pulse width of the auxiliary correction pulse; determining a plurality of actual working threshold values related to the plurality of reference pulse widths at each reference working temperature based on the conversion relationship; determining a function expression of the threshold correction function model; and setting a plurality of actual preset threshold values for the working device based on the function expression. The application is especially suitable for threshold correction of a threshold comparison working device in a wide temperature range.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of data processing, and in particular to a method and device for processing a scintillation pulse, an apparatus and a storage medium. BACKGROUND

[0002] In a series of applications of high-energy rays, such as positron emission tomography (PET) and radiation detection such as geological exploration and security inspection, high-energy rays such as gamma rays are converted into visible light signals by a scintillation crystal, the visible light signals are further converted into scintillation pulse signals by a photoelectric conversion device, and then a series of application images or spectral information can be obtained by sampling and processing the scintillation pulse signals. Among them, the sampling of the scintillation pulse and the processing of the sampled data are two very key processes. High-quality sampling can provide accurate raw data for the subsequent processing process, and a fast, efficient and stable processing process is the guarantee for the excellent presentation of the final result.

[0003] A new method for sampling a scintillation pulse is a multi-threshold sampling (Multi-Voltage Threshold, MVT) method. However, the detection accuracy of a digital scintillation pulse detector based on multi-threshold sampling is affected by the working state of the threshold comparison unit and the working environment temperature. For example, in geological exploration, a detection device such as a logging instrument using the MVT method needs to collect signals at different depths underground. During the entire detection process, the logging instrument will be in different temperature fields, resulting in different degrees of inconsistency between a set expected threshold and the working threshold of the digital scintillation pulse detector in actual work at different temperatures. These inconsistencies will cause the accuracy of the digital scintillation pulse to decrease, and will affect the extraction accuracy of the subsequent particle energy deposition information, causing the deterioration of energy spectrum resolution and linearity. Moreover, a single threshold correction method cannot meet the threshold correction in a wide temperature range. SUMMARY

[0004] The technical problem to be solved by the embodiments of the present application is how to accurately correct the threshold of a scintillation pulse detector at different temperatures.

[0005] To solve the above problems, the present application discloses a method and device for processing a scintillation pulse, an apparatus and a storage medium.

[0006] According to a first aspect of the present application, a method for processing flicker pulses is provided. The method comprises: presetting a plurality of reference thresholds for a working device for multi-threshold sampling, and obtaining a threshold correction function model corresponding to the working device, the threshold correction function model reflecting a correspondence between the reference thresholds and actual working thresholds of the working device at different ambient temperatures, including a non-linear function model; presetting a plurality of reference working temperatures, and performing multi-threshold sampling on an auxiliary correction pulse at each reference working temperature by the working device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference working temperatures; performing contrast sampling on the auxiliary correction pulse to determine a conversion relationship between the threshold and the pulse width for the auxiliary correction pulse; determining a plurality of actual working thresholds related to the plurality of reference pulse widths at each reference working temperature based on the conversion relationship; determining a function expression of the threshold correction function model based on the plurality of reference thresholds at each reference working temperature and the plurality of actual working thresholds; and setting a plurality of actual preset thresholds for the working device based on the function expression, so that the working device performs multi-threshold sampling on the flicker pulses based on the plurality of actual preset thresholds.

[0007] According to some embodiments of the present application, the number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference working temperatures is greater than or equal to two.

[0008] According to some embodiments of the present application, the size of the reference threshold does not exceed the maximum amplitude of the auxiliary correction pulse.

[0009] According to some embodiments of the present application, the contrast sampling includes ADC sampling, and the determination of the conversion relationship comprises: determining an actual waveform of the auxiliary correction pulse based on the ADC sampling; determining a peak-shaped pulse width of the auxiliary correction pulse higher than the threshold based on the actual waveform; and determining a mathematical expression between the threshold and the pulse width as the conversion relationship.

[0010] According to some embodiments of the present application, the contrast sampling includes pulse width detection, and the determination of the conversion relationship comprises: determining pulse widths of the auxiliary correction pulse at a plurality of thresholds based on the pulse width detection; and constructing a lookup table as the conversion relationship based on the plurality of thresholds and the corresponding plurality of pulse widths.

[0011] According to some embodiments of the present application, the determination of the function expression of the threshold correction function model comprises: for each reference working temperature, using the reference threshold and the actual working threshold corresponding to the reference threshold to form a plurality of first data pairs; determining a sub-function expression of the threshold correction function model corresponding to the reference working temperature based on the plurality of first data pairs by using a curve fitting operation; and specifying a plurality of sub-function expressions corresponding to the plurality of reference working temperatures to form the function expression of the threshold correction function model.

[0012] According to some embodiments of the present application, the function expression of the threshold correction function model is determined by: using the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold to form a plurality of second data pairs; and determining the function expression of the threshold correction function model based on the plurality of second data pairs by using a curve fitting operation.

[0013] According to some embodiments of the present application, the curve fitting operation is implemented based on a least square method, an interpolation method or a polishing method.

[0014] According to some embodiments of the present application, the plurality of actual preset thresholds for the operating device are set based on the function expression by: obtaining a target operating threshold and / or a target operating temperature of the operating device; and determining the actual preset threshold based on the target operating threshold and / or the target operating temperature and the function expression.

[0015] According to some embodiments of the present application, the target operating threshold is determined based on prior information of the flicker pulse.

[0016] According to a second aspect of the present application, a method for processing a flicker pulse is provided. The method comprises: presetting a plurality of reference thresholds and a plurality of reference operating temperatures for an operating device used for multi-threshold sampling, and performing multi-threshold sampling on an auxiliary correction pulse at each of the reference operating temperatures by using the operating device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference operating temperatures, respectively; performing comparative sampling on the auxiliary correction pulse to determine a conversion relationship between a threshold and a pulse width for the auxiliary correction pulse; determining a plurality of actual operating thresholds related to the plurality of reference pulse widths at each of the reference operating temperatures based on the conversion relationship; determining a threshold correction function based on the plurality of reference thresholds at each of the reference operating temperatures and the plurality of actual operating thresholds; the threshold correction function reflecting a corresponding relationship between an actual operating threshold and a preset reference threshold of the operating device when operating at different ambient temperatures, and comprising a nonlinear function; and setting a plurality of actual preset thresholds for the operating device based on the threshold correction function, so that the operating device performs multi-threshold sampling on the flicker pulse based on the plurality of actual preset thresholds.

[0017] According to some embodiments of the present application, the number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference operating temperatures is greater than or equal to two.

[0018] According to some embodiments of the present application, the size of the reference threshold is not greater than the maximum amplitude of the auxiliary correction pulse.

[0019] According to some embodiments of the present application, the comparative sampling comprises ADC sampling, and the conversion relationship is determined by: determining an actual waveform of the auxiliary correction pulse based on the ADC sampling; determining a peak-shaped pulse width of the auxiliary correction pulse that is higher than the threshold based on the actual waveform; and determining a mathematical expression between the threshold and the pulse width as the conversion relationship.

[0020] According to some embodiments of the present application, the comparison sampling includes pulse width detection, and determining the conversion relationship includes: determining pulse widths of the auxiliary correction pulses at multiple thresholds based on the pulse width detection; and constructing a lookup table as the conversion relationship based on the multiple thresholds and the corresponding multiple pulse widths.

[0021] According to some embodiments of the present application, determining the threshold correction function includes: for each reference operating temperature, constructing multiple first data pairs using the reference threshold and the actual operating threshold corresponding to the reference threshold; obtaining multiple first candidate functions through a curve fitting operation based on the multiple first data pairs; determining a first fitting evaluation index of each first candidate function; determining a target candidate function from the multiple first candidate functions based on the first fitting evaluation index; and specifying multiple target candidate functions corresponding to the multiple reference operating temperatures to constitute the threshold correction function.

[0022] According to some embodiments of the present application, determining the threshold correction function includes: constructing multiple second data pairs using the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold; obtaining multiple second candidate functions through a curve fitting operation based on the multiple second data pairs; determining a second fitting evaluation index of each second candidate function; and determining the threshold correction function from the multiple second candidate functions based on the second fitting evaluation index.

[0023] According to some embodiments of the present application, the curve fitting operation is implemented based on a least square method, an interpolation method, or a polishing method.

[0024] According to some embodiments of the present application, setting multiple actual preset thresholds for the operating device based on the function expression includes: obtaining a target operating threshold and / or a target operating temperature of the operating device; and determining the actual preset threshold based on the target operating threshold and / or the target operating temperature and the function expression.

[0025] According to some embodiments of the present application, the target operating threshold is determined based on prior information of the flicker pulse.

[0026] According to a third aspect of the present application, a processing device for flicker pulse is provided. The processing device comprises: an obtaining module configured to preset a plurality of reference thresholds for a working device for multi-threshold sampling, and to obtain a threshold correction function model corresponding to the working device, the threshold correction function model reflecting a correspondence between the reference thresholds and actual working thresholds corresponding to the reference thresholds when the working device works at different ambient temperatures, and comprising a non-linear function model; a first multi-threshold sampling module configured to preset a plurality of reference working temperatures, and to perform multi-threshold sampling on the auxiliary correction pulse at each reference working temperature by using the working device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference working temperatures; a first comparative sampling module configured to perform comparative sampling on the auxiliary correction pulse to determine a conversion relationship between the threshold and the pulse width for the auxiliary correction pulse; a first threshold determination module configured to determine a plurality of actual working thresholds related to the plurality of reference pulse widths at each reference working temperature based on the conversion relationship; a first function determination module configured to determine a function expression of the threshold correction function model based on the plurality of reference thresholds at each reference working temperature and the plurality of actual working thresholds; and a first threshold setting module configured to set a plurality of actual preset thresholds for the working device based on the function expression, so that the working device performs multi-threshold sampling on the flicker pulse based on the plurality of actual preset thresholds.

[0027] According to some embodiments of the present application, the number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference working temperatures is greater than or equal to two.

[0028] According to some embodiments of the present application, the size of the reference threshold is not more than the maximum amplitude of the auxiliary correction pulse.

[0029] According to some embodiments of the present application, the comparative sampling comprises ADC sampling, and to determine the conversion relationship, the first comparative sampling module is configured to: determine the actual waveform of the auxiliary correction pulse based on the ADC sampling; determine the pulse width of the peak shape of the auxiliary correction pulse higher than the threshold based on the actual waveform; and determine the mathematical expression between the threshold and the pulse width as the conversion relationship.

[0030] According to some embodiments of the present application, the comparative sampling comprises pulse width detection, and to determine the conversion relationship, the first comparative sampling module is configured to: determine the pulse width of the auxiliary correction pulse at a plurality of thresholds based on the pulse width detection; and construct a lookup table as the conversion relationship based on the plurality of thresholds and the corresponding plurality of pulse widths.

[0031] According to some embodiments of the present application, to determine the function expression of the threshold correction function model, the first function determining module is configured to: for each reference operating temperature, use the reference threshold and the actual operating threshold corresponding to the reference threshold to form a plurality of first data pairs; based on the plurality of first data pairs, determine a sub-function expression of the threshold correction function model corresponding to the reference operating temperature by using a curve fitting operation; and use the plurality of sub-function expressions corresponding to the plurality of reference operating temperatures to form the function expression of the threshold correction function model.

[0032] According to some embodiments of the present application, to determine the function expression of the threshold correction function model, the first function determining module is configured to: use the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold to form a plurality of second data pairs; and determine the function expression of the threshold correction function model based on the plurality of second data pairs by using a curve fitting operation.

[0033] According to some embodiments of the present application, the curve fitting operation is implemented based on a least square method, an interpolation method or a polishing method.

[0034] According to some embodiments of the present application, to set a plurality of actual preset thresholds for the operating device based on the function expression, the first threshold setting module is configured to: obtain a target operating threshold and / or a target operating temperature of the operating device; and determine the actual preset threshold based on the target operating threshold and / or the target operating temperature and the function expression.

[0035] According to some embodiments of the present application, the target operating threshold is determined based on prior information of the flicker pulse.

[0036] According to a fourth aspect of the present application, a processing device of flicker pulses is provided. The processing device comprises: a second multi-threshold sampling module configured to preset a plurality of reference thresholds and a plurality of reference operating temperatures for an operating device used for multi-threshold sampling, and perform multi-threshold sampling on the auxiliary correction pulses at each of the reference operating temperatures by the operating device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference operating temperatures respectively; a second contrast sampling module configured to perform contrast sampling on the auxiliary correction pulses to determine a conversion relationship between the thresholds and the pulse widths for the auxiliary correction pulses; a second threshold determining module configured to determine a plurality of actual operating thresholds related to the plurality of reference pulse widths at each of the reference operating temperatures based on the conversion relationship; a second function determining module configured to determine a threshold correction function based on the plurality of reference thresholds at each of the reference operating temperatures and the plurality of actual operating thresholds; the threshold correction function reflects a corresponding relationship between actual operating thresholds of the operating device operating at different ambient temperatures and preset reference thresholds, and comprises a nonlinear function; and a second threshold setting module configured to set a plurality of actual preset thresholds for the operating device based on the threshold correction function, so that the operating device performs multi-threshold sampling on the flicker pulses based on the plurality of actual preset thresholds.

[0037] According to a fifth aspect of the present application, a digitizing device is provided. The digitizing device comprises a memory, a processor, and a computer program stored on the memory and executable on the processor, and the computer program, when executed by the processor, implements the steps of the method as above.

[0038] According to a sixth aspect of the present application, a digitizing device is provided. The digitizing device comprises the processing device of flicker pulses as above.

[0039] According to a seventh aspect of the present application, a computer-readable storage medium is provided. The storage medium stores a computer program, and the computer program, when executed by a processor, implements the steps of the method as above.

[0040] The processing method, device, equipment and storage medium of flicker pulses disclosed in the present application can correct the thresholds of the threshold comparison operating device by the nonlinear threshold correction function, and the correction process considers the ambient temperature of the operating device, so that the correction result can cover more operating scenarios of the operating device, especially the scenarios at a wide temperature range, and implement more extensive threshold correction applications. BRIEF DESCRIPTION OF DRAWINGS

[0041] The present application will be further illustrated in the form of exemplary embodiments, which will be described in detail with reference to the accompanying drawings. These embodiments are not limiting, and in these embodiments, the same reference numbers represent the same structures, wherein:

[0042] Figure 1is an exemplary flow chart of a method of processing a flicker pulse according to some embodiments of the present application;

[0043] Figure 2 is an exemplary flow chart of another method of processing a flicker pulse according to some embodiments of the present application;

[0044] Figure 3 is an exemplary flow chart of a method of determining a threshold correction function according to some embodiments of the present application;

[0045] Figure 4 is another exemplary flow chart of a method of determining a threshold correction function according to some embodiments of the present application;

[0046] Figure 5 is an exemplary diagram of a relationship between an auxiliary correction pulse and a threshold according to some embodiments of the present application;

[0047] Figure 6 is an exemplary diagram of determining a pulse width according to some embodiments of the present application;

[0048] Figure 7 is an exemplary block diagram of a data processing system for flicker pulse processing according to some embodiments of the present application;

[0049] Figure 8 is another exemplary block diagram of a data processing system for flicker pulse sampling according to some embodiments of the present application.

[0050] Figure 9 is an exemplary functional block diagram of another data processing system for flicker pulse processing according to some embodiments of the present application. DETAILED DESCRIPTION

[0051] In order to make the above objectives, features and advantages of the present application more clear and comprehensible, specific embodiments of the present application will be described below in detail with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application can be practiced without using some or all of these specific details. In other instances, well known process steps have not been described in detail in order to avoid obscuring the present application.

[0052] It should be noted that when an element is referred to as being "on" another element, it can be directly on the other element or intervening elements can also be present. In addition, when an element is referred to as being "connected" to or "coupled" to another element, it can be directly connected to the other element or intervening elements can also be present. The terms "vertical", "horizontal", "left", "right", and the like as used herein are used for explanation purposes only.

[0053] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description herein is for describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" or "and / or" includes any and all combinations of one or more of the associated listed items.

[0054] Some preferred embodiments of the present application are described below with reference to the accompanying drawings. It should be noted that the following description is for the purpose of illustration only and is not intended to limit the scope of protection of the present application.

[0055] Figure 1 is an exemplary flowchart of a processing method of a scintillation pulse according to some embodiments of the present application. In some embodiments, the processing method of a scintillation pulse 100 can be performed by the first data processing system 700. For example, the processing method of a scintillation pulse 100 can be stored in the form of a program or instructions in a storage device (such as a self-provided storage unit of the first data processing system 700 or an external storage device), which, when executed, can implement the processing method of a scintillation pulse 100. As shown, the processing method of a scintillation pulse 100 can include the following steps. Figure 1

[0056] Step 110, presetting a plurality of reference thresholds for a working device for multi-threshold sampling, and obtaining a threshold correction function model corresponding to the working device.

[0057] Exemplary multi-threshold sampling can be to compare a to-be-measured scintillation pulse with a plurality of set thresholds, determine the time when the scintillation pulse crosses the threshold, and thus obtain sampling data composed of threshold-time pairs. The working device can include a comparator and a time-to-digital converter. The comparator is used to implement comparison between the scintillation pulse and the threshold, and output a jump signal at the moment when the scintillation pulse crosses the threshold. A typical scintillation pulse includes a rising edge that rises rapidly over time and a falling edge that falls slowly. The scintillation pulse crosses the threshold for the first time in the rising phase and for the second time in the falling phase. Therefore, the comparator can output two jump signals when performing threshold comparison of the scintillation pulse. The time-to-digital converter is used to digitally sample the time of the jump signal output by the comparator. The obtained threshold-time pair information (two threshold-time pairs) can be used to invert the waveform information of the scintillation pulse, and thus the energy spectrum energy information of the scintillation pulse can be obtained. Exemplary comparators can include a low-voltage differential signaling (LVDS) comparator.

[0058] ​In some embodiments, the reference threshold can be a threshold value assigned to the comparator for comparison with the scintillation pulse. After the comparator receives the reference threshold value assigned thereto, the comparator can compare the scintillation pulse with the reference threshold value during the multi-threshold sampling and output the jump information when the scintillation pulse crosses the reference threshold value, which is subsequently sampled by the time-to-digital converter for time digitization. In some embodiments, the reference threshold value can be set by a digital-to-time converter (DAC). After the setting is completed, the DAC can transmit the reference threshold value to the comparator for threshold comparison of the scintillation pulse. In some embodiments, the DAC can also be part of the working device.

[0059] In some embodiments, the type of the reference threshold value can be determined according to the form of the pulse to be processed. As an example, the pulse to be processed can be an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc. The energy index for representing the pulse to be processed can be voltage, current, sound intensity, heat, pressure, etc. The reference threshold value can be a voltage threshold value, a current threshold value, a sound intensity threshold value, a heat threshold value, a pressure threshold value, etc. In addition, the pulse to be processed in the present application can be extended to a continuous signal, which can be generally regarded as a pulse signal arranged in a certain period, and the present application does not make any limitation.

[0060] It can be understood that when the reference threshold value is set to be large, such as higher than the maximum amplitude of the pulse signal, the amplitude of the pulse to be processed will always fail to cross the preset reference threshold value, and thus the comparator will not output the jump information. When the reference threshold value is set to be exactly equal to the maximum amplitude of the pulse signal, the comparator will only have one state change. Therefore, generally, the person skilled in the art can reasonably set the size and number of the reference threshold values according to limited experiments, so that the size interval of the reference threshold values is reasonable. In some embodiments, the size of the reference threshold value can not exceed the maximum amplitude of the pulse to be processed. For example, the maximum amplitude of the pulse to be processed can be determined by measuring the prior information of the pulse to be processed (for example, by an oscilloscope to determine the waveform of the pulse to be processed), and then a certain setting range can be selected within the maximum amplitude to determine a plurality of reference threshold values. In some embodiments, the sizes of the plurality of reference threshold values set can form an arithmetic sequence. That is, the interval between every two adjacent reference threshold values is equal.

[0061] In some embodiments, the threshold correction function model can be a function model reflecting the correspondence between the reference threshold and the actual working threshold of the working device when working at different ambient temperatures. Ideally, the working device is to perform threshold comparison on the pulse to be processed with the set reference threshold. That is, taking the voltage threshold as an example, assuming that a certain reference threshold set for the comparator is 200 mV, the comparator will compare the pulse to be processed with 200 mV when performing multi-threshold sampling. However, due to changes in working conditions such as ambient temperature or element states such as comparator accuracy, the comparator does not compare the pulse to be processed with the set reference threshold. With the same example, the reference threshold of 200 mV is set, and in actual work, for example, sampling of scintillation pulses at room temperature, such as medical scanning, the comparator can compare the pulse to be processed with 190 mV. And in the case of high-temperature (above 170°C) environment in, for example, underground well detection applications, the comparator can compare the pulse to be processed with 180 mV or 170 mV. Thus deviating from the set reference threshold. The reference threshold is generally determined according to prior experience or prior information of the pulse to be processed when it is set, and the threshold is expected to be used for comparison with the pulse to be processed. When the comparator performs multi-threshold sampling with these expected reference thresholds, the energy deposition information of the pulse to be processed can be more accurately determined according to the obtained sampling results. Therefore, the comparator can be caused to perform multi-threshold sampling on the pulse to be processed when working by approaching or equaling to the above-mentioned expected threshold through the set reference threshold. This process can also be referred to as correction of the reference threshold, which can be performed through the solved threshold correction function model. The correspondence between the thresholds at different ambient temperatures reflected by the solved threshold correction function model can be used to deduce the reference threshold to be set at a specific environment through the actual working threshold of the working device. In some embodiments, the threshold correction function model can be a first-order function model, a second-order function model, a third-order function model, or other high-order function models. The present application does not make specific limitations.

[0062] In some embodiments, the threshold correction function model can include a nonlinear function model. The nonlinear function can cover a wider range of application scenarios, so that the threshold correction of the working device is more applicable and accurate. In the subsequent execution process of the flow 100, the data related to the set reference threshold is required to solve the threshold correction function model. In order to achieve the purposes of correct and fast solving, the number of reference thresholds can be greater than or equal to three.

[0063] Step 120, a plurality of reference working temperatures are preset, and the working device is used to perform multi-threshold sampling on the auxiliary correction pulse at each reference working temperature to determine a plurality of reference pulse widths corresponding to a plurality of reference thresholds at the reference working temperature.

[0064] In some embodiments, the reference operating temperature may be the temperature of the operating environment set for the working device. For example, depending on the actual operating scenario of the working device, such as PET scanning at room temperature or radiation logging at high temperature, the reference operating temperature may be a temperature between 20°C and 175°C. In some embodiments, a temperature range may be determined based on the actual usage scenario of the working device, and multiple reference operating temperatures may be set within this temperature range. The number of multiple reference operating temperatures may be 2, 3, 4, 5, 6, or even more. The reference operating temperature may be set based on the ambient temperature of the typical operating environment of the working device within the above temperature range. For example, assuming that the typical operating environment of the working device is underground radiation logging, the reference operating temperatures may be 20°C, 50°C, 80°C, 110°C, 140°C, and 170°C. The intervals between the multiple reference operating temperatures may be equal, for example, forming an arithmetic progression, or they may be unequal.

[0065] In some embodiments, the auxiliary correction pulse can have any pulse waveform, which can be described by a specific mathematical expression. For example, the waveform of the auxiliary correction pulse can be described by a mathematical function such as a straight line function, a straight line exponential function, a double exponential function, a triangular wave function, a sine wave function, or a cosine wave function. Exemplarily, the auxiliary correction pulse can be a triangular wave or a sine wave.

[0066] The following combination Figure 5 Explain the basic process of multi-threshold sampling. Figure 5 FIG. 1 is a schematic diagram showing an exemplary relationship between an auxiliary correction pulse and a threshold value according to some embodiments of the present application. Figure 5As shown, the auxiliary correction pulse is a triangle wave. Taking the electrical pulse signal as an example, the set reference thresholds are four voltage thresholds V1, V2, V3 and V4, and the set reference operating temperatures are T1, T2, T3 and T4. First, multi-threshold sampling of the auxiliary correction pulse is performed at the reference operating temperature T1 (the reference operating temperature can be provided by a temperature box). With time, in the rising phase, the triangle wave first crosses the voltage threshold V1 from bottom to top. At this time, the comparator outputs a jump information, and the time digital converter digitizes the jump information to obtain the corresponding time t1. Subsequently, the triangle wave crosses the voltage threshold V2 from bottom to top, and the corresponding time is t2. In this way, the triangle wave crosses the voltage threshold V3 from bottom to top at t3, and crosses the voltage threshold V4 from bottom to top at t4. In the falling phase, the triangle wave first crosses the voltage threshold V4 from top to bottom, and the corresponding time is t5. Subsequently, the triangle wave crosses the voltage threshold V3 from top to bottom, and the corresponding time is t6. In this way, the triangle wave crosses the voltage threshold V2 from top to bottom at t7, and crosses the voltage threshold V1 from top to bottom at t8. Therefore, two pieces of sampling data will be obtained for a set reference threshold. The corresponding reference pulse width can be the peak width of the auxiliary correction pulse higher than the reference threshold, that is, the duration of the auxiliary correction pulse higher than the reference threshold. In combination with the above example, the reference pulse width DOT1 corresponding to the reference threshold V1 is t8-t1, the reference pulse width DOT2 corresponding to the reference threshold V2 is t7-t2, the reference pulse width DOT3 corresponding to the reference threshold V3 is t6-t3, and the reference pulse width DOT4 corresponding to the reference threshold V1 is t5-t4. Thus, the reference pulse widths DOT1, DOT2, DOT3 and DOT4 corresponding to the reference thresholds V1, V2, V3 and V4 at the reference operating temperature T1 can be obtained. The above process is repeated for the reference operating temperatures T2, T3 and T4 to obtain the reference pulse widths corresponding to the reference thresholds V1, V2, V3 and V4 at the reference operating temperatures T2, T3 and T4.

[0067] In some embodiments, the multi-threshold sampling performed at each reference operating temperature can be performed multiple times. The reference pulse width corresponding to each reference threshold can be determined by averaging the results obtained by multiple times of multi-threshold sampling. Assuming that the above multi-threshold sampling is performed 100 times, the reference pulse width corresponding to the reference threshold V1 is

[0068] It should be understood that, in actual sampling, the waveform of some auxiliary correction pulses is not smooth as Figure 5 shown, but will have more fluctuations, which actually manifests as fluctuating up or down within the range of the waveform shown. Figure 5 Figure 5 ​The smooth waveforms are shown for the convenience of illustration. Therefore, in the actual sampling process, at the rising edge or the falling edge, the waveform can cross the same threshold value for multiple times in a very short time. In the actual sampling, the average time of crossing the threshold value in a certain time window or time period can be taken as the time of crossing the threshold value, which is easily realized by those skilled in the art according to the inspiration of the present application, and will not be described here.

[0069] At step 130, contrast sampling is performed on the auxiliary correction pulse to determine the conversion relationship between the threshold value and the pulse width of the auxiliary correction pulse.

[0070] In some embodiments, the contrast sampling can be high sampling rate ADC sampling (or called oscilloscope sampling). An exemplary contrast sampling can sample the auxiliary correction pulse once every other time interval according to the sampling rate. The higher the sampling rate, the smaller the time interval, and the more the sampling data obtained. For example, a sampling rate of 1 GS / s represents a time interval of 1 ns, and a sampling rate of 2.5 GS / s represents a time interval of 0.4 ns. Similarly, when the auxiliary correction pulse is an electrical signal pulse, the sampling data obtained can be expressed as (t n ,V n ), t n represents the sampling time, V n represents the voltage value of the auxiliary correction pulse at t n , and n represents the sampling number, which is determined according to the sampling rate.

[0071] In some embodiments, the sampling data based on high sampling rate ADC sampling can directly output the actual waveform of the auxiliary correction pulse, and then a mathematical expression for representing the actual waveform can be determined. For example, the waveform shape of the auxiliary correction waveform can be described by using mathematical functions such as linear function, linear exponential function, double exponential function, triangular wave function, sine wave function, and cosine wave function. As an example, the waveform of a triangular wave can be represented by using two linear functions, such as a linear function with a slope of k1 for the rising part and a linear function with a slope of k2 for the falling part.

[0072] In some embodiments, according to the actual waveform of the auxiliary correction pulse, the pulse width of the peak shape of the auxiliary correction pulse higher than the threshold value is determined. Referring to Figure 6 , Figure 6 is an exemplary schematic diagram for determining the pulse width according to some embodiments of the present application. As shown in Figure 6 , the auxiliary correction pulse is a triangular wave of an electrical pulse, and the pulse width of the peak shape crossing the threshold value V t is DOT t = DOT1+DOT2, V peakis the peak threshold of the triangle wave. The slope of the rising part of the triangle wave is k1, and the slope of the falling part is k2. According to the principle of similar triangles, the following relationship formula can be obtained:

[0073] k1=(V peak -V t ) / DOT1

[0074] k2=-(V peak -V t ) / DOT2

[0075] Then, according to the above two formulas, we can get:

[0076] DOT1=(V peak -V t ) / k1

[0077] DOT2=-(V peak -V t ) / k2

[0078] So we can determine DOT t =(V peak -V t ) / k1-(V peak -V t ) / k2. This mathematical expression is the conversion relationship between the threshold and its corresponding pulse width.

[0079] In some embodiments, the auxiliary correction pulse may also be a sine wave. The shape of the actual waveform determined by comparison sampling can be expressed using the following mathematical expression:

[0080]

[0081] The peak difference of the sine wave is 2k, the period is T, and the mean voltage is b. Similarly, it can be determined that the sine wave is higher than the threshold V t Pulse width DOT t =(π / 2-sin -1 [(V t -b) / k]) / π×T.

[0082] In some embodiments, the auxiliary correction pulse may also be of any waveform. The shape of the actual waveform determined by comparison sampling can be expressed using the following mathematical expression:

[0083]

[0084] Where t0 is the peak voltage V of the waveform peak The corresponding time. Then the waveform is higher than the threshold V t Pulse width DOTt =g -1 (V t )-f -1 (V t ).

[0085] In some embodiments, the comparative sampling can be performed by pulse width detection. Pulse width detection can be used to determine the duration of the auxiliary correction pulse at multiple thresholds, which can be used as the pulse width. Multiple thresholds can correspond to multiple pulse widths, and based on this data, a lookup table, also known as a mapping table, can be constructed. For example, the left column represents the threshold, and the right column represents the corresponding pulse width. The constructed lookup table can serve as a conversion relationship.

[0086] Step 140 : determining a plurality of actual operating thresholds associated with a plurality of reference pulse widths at respective reference operating temperatures based on the conversion relationship.

[0087] It can be understood that both multi-threshold sampling and comparative sampling are performed on the auxiliary correction pulse. Then, for the same sampling moment, the threshold value of the auxiliary correction pulse obtained by the two sampling methods (taking the electrical signal as an example, the threshold value is the voltage threshold value) should also be the same, and the threshold value corresponding to the same pulse width is also the same. Therefore, through the conversion relationship, a pulse width that is the same as the reference pulse width corresponding to the reference threshold value can be determined, and the threshold value corresponding to the pulse width can be the actual working threshold value of the comparator when performing multi-threshold sampling. In some embodiments, when the conversion relationship is presented in the form of a mathematical formula, the reference pulse width can be substituted for the calculation, and the result obtained is the corresponding actual working threshold value. When the conversion relationship is presented in the form of a lookup table or a mapping table, the threshold value corresponding to the same pulse width can be found as the actual working threshold value by data search. In this way, the actual working threshold value corresponding to each reference pulse width can be determined under different reference working temperatures.

[0088] Step 150 : determining a function expression of a threshold correction function model based on a plurality of reference thresholds and a plurality of actual operating thresholds at various reference operating temperatures.

[0089] In some embodiments, the threshold correction function model can be solved by using a curve fitting operation. For example, for each reference operating temperature, the reference threshold and the actual operating threshold corresponding to the reference threshold can first form a plurality of first data pairs. Taking the electric pulse signal as an example, assuming that the set reference thresholds are V1, V2, V3 and V4, at the reference operating temperature T1, the actual operating threshold corresponding to the four reference thresholds determined by process 140 is V 11 、V 12 、V 12 and V 14 Then the first data pair can be (V11 ,V1),(V 12 ,V2),(V 13 ,V3) and (V 14 , V4). The same or similar, the plurality of first data pairs at the reference operating temperature T2 may be (V 21 ,V1),(V 22 ,V2),(V 23 ,V3) and (V 24 , V4). The plurality of first data pairs at the reference operating temperature T3 may be (V 31 ,V1),(V 32 ,V2),(V 33 ,V3) and (V 34 , V4). The plurality of first data pairs at the reference operating temperature T4 may be (V 41 ,V1),(V 42 ,V2),(V 43 ,V3) and (V 44 ,V4).

[0090] In some embodiments, function fitting can be performed based on multiple first data pairs to obtain a sub-function expression of the threshold correction function model corresponding to the reference operating temperature. The fitting can be implemented based on the least squares method, the interpolation method, or the polishing method. Exemplarily, an existing calculation algorithm / software can be called to implement a curve fitting operation based on multiple data pairs. For the reference operating temperature T1, multiple first data pairs are input into the calculation algorithm / software to directly obtain the first sub-function expression of the threshold correction function model. For example, assuming that the threshold correction function model is a linear function, the first sub-function expression f(x 1 )=p1*x 1 +p2. Similarly, we can get the second subfunction expression f(x 2 )=p1*(x 2 ) 2 +p2*x 2 +p3, as the third subfunction expression of the cubic function f(x 3 )=p1*(x 2 ) 3 +p2*(x 2 ) 2 +p3*x 3 +p4. The sub-function expression corresponding to the reference operating temperature T1 is f1(x),

[0091] In some embodiments, after the sub-function expressions corresponding to each reference operating temperature are determined, the sub-function expressions can constitute the function expression of the threshold correction model. For example, assuming that the sub-function expression corresponding to the reference operating temperature T1 is f1(x), the sub-function expression corresponding to the reference operating temperature T2 is f2(x), the sub-function expression corresponding to the reference operating temperature T3 is f3(x), and the sub-function expression corresponding to the reference operating temperature T4 is f4(x), the function expression of the threshold correction model can be determined as:

[0092]

[0093] wherein T represents the ambient temperature of the environment in which the operating device is located.

[0094] In some embodiments, the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold can constitute a plurality of second data pairs. Continuing to refer to the above example, under the 4 reference operating temperatures, the 4 reference thresholds correspond to 4 actual operating thresholds, which can be combined to obtain 16 data pairs as the plurality of second data pairs. The 16 data pairs include ((V 11 , T1), (V1, T1)), ((V 12 , T1), (V2, T1)), ((V 13 , T1), (V3, T1)), ((V 14 , T1), (V4, T1)), ((V 21 , T2), (V1, T2)), ((V 22 , T2), (V2, T2)), ((V 23 , T2), (V3, T2)), ((V 24 , T2), (V4, T2)), ((V 31 , T3), (V1, T3)), ((V 32 , T3), (V2, T3)), ((V 33 , T3), (V3, T3)), ((V 34 , T3), (V4, T3)), ((V 41 , T4), (V1, T4)), ((V 42 , T4), (V2, T4)), ((V 43 , T4), (V3, T4)), ((V 44 , T4), (V4, T4)).

[0095] In some embodiments, based on the plurality of second data pairs, a threshold correction function model can be solved by a curve fitting operation to obtain a function expression. The curve fitting can be implemented based on a least square method, an interpolation method or a polishing method. Alternatively or preferably, the curve fitting can be implemented based on a least square method. The threshold correction function model with the determined parameters can be the function expression. The function expression can include a linear function, a quadratic function, a cubic function or a higher order function.

[0096] At step 160, based on the function expression, a plurality of actual preset thresholds can be set for the working device, so that the working device performs multi-threshold sampling on the flicker pulse based on the plurality of actual preset thresholds.

[0097] In some embodiments, the actual preset threshold can be a threshold set for the working device to work at a desired threshold. In combination with the foregoing description, a threshold is set for the working device such as a comparator. Due to the influence of the device state and the ambient temperature, the comparator does not perform threshold comparison with the flicker pulse at the threshold, but performs comparison at an actual threshold deviating from the threshold. In order to make the actual threshold approach or equal to the desired working threshold, the actual threshold of the working device can be adjusted by adjusting the threshold set for the working device.

[0098] In some embodiments, a target working threshold of the working device and a target working temperature can be obtained. The target working threshold can be the desired working threshold described above, and can be determined according to prior experience or prior information of the flicker pulse such as an actual waveform. By determining the function expression representing the waveform of the flicker pulse, different desired working thresholds required for different waveforms can be determined. The target working temperature can be the ambient temperature of the environment in which the working device is located, and can be obtained by a temperature sensor. After the target working threshold and the target working temperature are determined, they can be substituted into the function expression to obtain the threshold required to be set for the working device, that is, the actual preset threshold. After the setting is completed, the working device (such as the comparator) can work at the desired working threshold when working, and the sampling result can be more accurate to determine the energy deposition information of the pulse to be processed.

[0099] It should be noted that the above description of each step in Figure 1 is only for example and illustration, and does not limit the scope of the present specification. Those skilled in the art can make various modifications and changes to each step in Figure 1 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0100] It is noted that, for the purpose of convenience, the flow 100 is an illustration of the adjustment / correction of the set reference threshold value for one comparator, but does not affect the threshold adjustment of a device with multiple comparators. Each comparator can implement the correction / adjustment of the set reference threshold value in the same and / or similar method as the flow 100.

[0101] The processing method, device, equipment and storage medium of the scintillation pulse disclosed in the present application can correct the threshold value of the threshold comparison working device through a nonlinear threshold correction function. The correction process considers the environmental temperature of the working device, so that the correction result can cover more working scenarios of the working device, especially the scenarios under a wide temperature range, and implement more extensive threshold correction applications.

[0102] Figure 2 An exemplary flowchart of a processing method of a scintillation pulse according to some embodiments of the present application is shown. In some embodiments, the processing method 200 of the scintillation pulse can be executed by the second data processing system 800. For example, the processing method 200 of the scintillation pulse can be stored in the form of a program or instructions in a storage device (such as a self-contained storage unit or an external storage device of the first data processing system 700), and the program or instructions can implement the processing method 200 of the scintillation pulse when executed. As shown in the figure, the processing method 200 of the scintillation pulse can include the following steps. Figure 2

[0103] Step 210, multiple reference threshold values and multiple reference working temperatures are preset for a working device for multi-threshold sampling, and the working device is used to perform multi-threshold sampling on the auxiliary correction pulse at each reference working temperature to determine multiple reference pulse widths corresponding to the multiple reference threshold values at the reference working temperatures.

[0104] In some embodiments, step 210 and part of steps 110 and 120 in flow 100 are the same or similar, and the description of steps 110 and 120 can be referred to. In step 210, a threshold correction function model is not set.

[0105] Step 220, contrast sampling is performed on the auxiliary correction pulse to determine the conversion relationship between the threshold value and the pulse width of the auxiliary correction pulse.

[0106] In some embodiments, step 220 can be the same as or similar to step 130 in flow 100, and the description of step 130 can be referred to.

[0107] Step 230, based on the conversion relationship, multiple actual working threshold values related to the multiple reference pulse widths at each reference working temperature are determined.

[0108] ​In some embodiments, step 230 can be the same as or similar to step 140 in flow 100, and reference can be made to the description of step 140.

[0109] Step 240, determining a threshold correction function based on the plurality of reference threshold values at the plurality of reference operating temperatures and the plurality of actual operating threshold values.

[0110] In some embodiments, the threshold correction function can reflect the correspondence between the actual operating threshold values and the reference threshold values of the operating device operating at different ambient temperatures, which can be a non-linear function. For example, the threshold correction function can be a linear function, a quadratic function, a cubic function, or other higher order functions. The threshold correction function can be a widely adaptive correction function that can correct the threshold values of the operating device operating at various temperatures. The threshold correction function can also be a piecewise function composed of a plurality of sub-functions, each sub-function corresponding to a threshold correction in a temperature or temperature range. In some embodiments, the determination of the threshold correction function can be obtained by curve fitting from a plurality of data pairs composed of the plurality of reference threshold values at the plurality of reference operating temperatures and the plurality of actual operating threshold values. For example, a plurality of non-linear functions can be fitted from the plurality of data pairs, and the goodness of fit of each non-linear function can be evaluated. The best fitting result is selected as the threshold correction function according to the goodness of fit. The determination of the threshold correction function can be referred to the description of the determination of the threshold correction function in the Figure 3 and Figure 4 part of the present specification, which will not be repeated here.

[0111] Step 250, setting a plurality of actual preset threshold values for the operating device based on the threshold correction function, so that the operating device performs multi-threshold sampling on the flicker pulse based on the plurality of actual preset threshold values.

[0112] In some embodiments, step 250 can be the same as or similar to step 160 in flow 100, and reference can be made to the description of step 160.

[0113] It should be noted that the above description of each step in Figure 2 is only for example and illustration, and does not limit the scope of the present specification. Those skilled in the art can make various modifications and changes to each step in Figure 2 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0114] Figure 3 is an exemplary flowchart of a threshold correction function determination method according to some embodiments of the present application. In some embodiments, the threshold correction function determination method 300 can be performed by the second function determination module 840 of the second data processing system 800. As shown in Figure 3 , the threshold correction function determination method 300 can include the following steps.

[0115] At step 310, for each reference operating temperature, a plurality of first data pairs are constructed using the reference threshold and the actual operating threshold corresponding to the reference threshold.

[0116] In some embodiments, step 310 can be the same as or similar to part of step 150 in flow 100. For example, regarding the construction of the first data pairs. By way of the same example, taking the electrical pulse signal as an example, assuming that the set reference thresholds are V1, V2, V3 and V4, the first data pairs under the reference operating temperature T1 can include (V 11 ,V1), (V 12 ,V2), (V 13 ,V3) and (V 14 ,V4). Similarly or analogously, the first data pairs under the reference operating temperature T2 can be (V 21 ,V1), (V 22 ,V2), (V 23 ,V3) and (V 24 ,V4). The first data pairs under the reference operating temperature T3 can be (V 31 ,V1), (V 32 ,V2), (V 33 ,V3) and (V 34 ,V4). The first data pairs under the reference operating temperature T4 can be (V 41 ,V1), (V 42 ,V2), (V 43 ,V3) and (V 44 ,V4).

[0117] At step 320, based on the plurality of first data pairs, a plurality of first candidate functions are obtained through a curve fitting operation.

[0118] In some embodiments, the plurality of first data pairs can be used for multiple curve fitting to obtain a plurality of first candidate functions. For example, the plurality of data pairs can be used for a fitting process based on a linear function, a fitting process based on a quadratic function, a fitting process based on a cubic function, a fitting process based on a higher order function (greater than or equal to four), etc. to obtain a linear function, a quadratic function, a cubic function, a higher order function, etc. as the first candidate function. In some embodiments, the curve fitting process can be implemented based on a least square method, an interpolation method or a smoothing method. For example, for a certain reference operating temperature, the plurality of first data pairs corresponding thereto can be input into a calculation algorithm / software, a fitting based on a linear function is performed, and the fitted function model is f(x) = pi * x + p2, and the values of pi and p2 can be obtained through the fitting. The linear function model with the determined pi and p2 can be used as a first candidate function corresponding to the reference operating temperature. Similarly, a fitting based on a quadratic function is performed to obtain a quadratic function model f(x) = pi * x 2 + p2 * x + p3 with the determined pi, p2 and p3 as another candidate function corresponding to the reference operating temperature. A fitting based on a cubic function is performed to obtain a cubic function model f(x) = pi * x 3 + p2 * x 2 + p3 * x + p4 as another candidate function corresponding to the reference operating temperature. In some embodiments, the plurality of first data pairs at each reference operating temperature can be used for the above curve fitting operation to obtain a plurality of first candidate functions corresponding to each reference operating temperature.

[0119] Step 330, determining a first fitting evaluation index of each first candidate function.

[0120] In some embodiments, the first fitting evaluation index can be a parameter used to evaluate the effect of curve fitting. For example, the fitting evaluation index can include a mean absolute error (MAE), a mean square error (MSE), a root mean square error (RMSE), a mean absolute percentage error (MAPE), a symmetric mean absolute percentage error (SMAPE), a determination coefficient (R Square), etc. In some embodiments, the first fitting evaluation index can be the determination coefficient. The value range of the determination coefficient can be 0-1. The closer to 1, the better the fitting effect. In each curve fitting process, the determination coefficient corresponding to the first candidate function can be output at the same time.

[0121] Step 340, determining the target correction function from the multiple first candidate functions based on the first fitting evaluation index.

[0122] In some embodiments, based on the characteristics of the first fitting evaluation index, the first candidate function corresponding to the optimal index can be selected from the first fitting evaluation index as the target correction function. For example, when the first fitting evaluation index is the determination coefficient, the first candidate function corresponding to the determination coefficient closest to 1 can be determined as the target correction function. In some embodiments, based on the first fitting evaluation index, for each reference operating temperature, a corresponding target correction function can be determined.

[0123] Step 350, specifying that the multiple target candidate functions corresponding to the multiple reference operating temperatures constitute the threshold correction function.

[0124] In some embodiments, after the target candidate function corresponding to each reference operating temperature is determined, these target candidate functions can constitute the threshold correction function. For example, assuming that the target candidate function corresponding to the reference operating temperature T1 is g1(x), the target candidate function corresponding to the reference operating temperature T2 is g2(x), the target candidate function corresponding to the reference operating temperature T3 is g3(x), and the target candidate function corresponding to the reference operating temperature T4 is g4(x), the threshold correction function can be determined as:

[0125]

[0126] Wherein, T represents the ambient temperature of the environment in which the operating device is located.

[0127] It should be noted that the above description of each step in Figure 3 is only for example and illustration, and does not limit the scope of application of the present specification. Those skilled in the art can make various modifications and changes to each step in Figure 3 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0128] Figure 4 is another exemplary flowchart of a threshold correction function determination method according to some embodiments of the present application. In some embodiments, the threshold correction function determination method 400 can be executed by the second function determination module 840 of the second data processing system 800. As shown in Figure 4 , the threshold correction function determination method 400 can include the following steps.

[0129] Step 410, using the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold to construct multiple second data pairs.

[0130] In some embodiments, step 410 can be the same or similar to part of step 150 in flow 100. For example, regarding the construction of the second data pairs. The same example, taking the electrical pulse signal as an example, assuming that the set reference operating temperature is T1, T2, T3 and T4, and the set reference threshold is V1, V2, V3 and V4, then 4 reference thresholds and corresponding 4 actual operating thresholds, combined with 4 reference operating temperatures, can be combined to obtain 16 second data pairs, including ((V 11 ,T1),(V1,T1))、((V 12 ,T1),(V2,T1))、((V 13 ,T1),(V3,T1))、((V 14 ,T1),(V4,T1))、((V 21 ,T2),(V1,T2))、((V 22 ,T2),(V2,T2))、((V 23 ,T2),(V3,T2))、((V 24 ,T2),(V4,T2))、((V 31 ,T3),(V1,T3))、((V 32 ,T3),(V2,T3))、((V 33 ,T3),(V3,T3))、((V 34 ,T3),(V4,T3))、((V 41 ,T4),(V1,T4))、((V 42 ,T4),(V2,T4))、((V 43 ,T4),(V3,T4))、((V 44 ,T4),(V4,T4))。

[0131] Step 420, based on the plurality of second data pairs, obtaining a plurality of second candidate functions through a curve fitting operation.

[0132] In some embodiments, the plurality of second data pairs can be used for multiple curve fitting to obtain the plurality of second candidate functions. For example, the plurality of second data pairs can be used for a linear function fitting process, a quadratic function fitting process, a cubic function fitting process, a high order function (greater than or equal to four) fitting process, etc. to obtain a linear function, a quadratic function, a cubic function, a high order function, etc. as the second candidate functions. In some embodiments, the curve fitting process can be implemented based on a least square method, an interpolation method or a polishing method, and the obtained second candidate functions can be a correction function with a wide adaptability. Since the influence of temperature is considered in the fitting, the second candidate functions can be adapted to different working temperatures. That is, a single second candidate function can be applied to threshold correction of a working device in a temperature range.

[0133] In step 430, a second fitting evaluation index of each second candidate function is determined.

[0134] In some embodiments, the second fitting evaluation index can be the same as or similar to the first fitting evaluation index, or can be a parameter for evaluating the effect of curve fitting. For example, MAE, MSE, RMSE, MAPE, SMAPE, RSquare, etc. In some embodiments, the second fitting evaluation index can also be a determination coefficient. In each curve fitting process, the determination coefficient corresponding to the second candidate function can be output at the same time.

[0135] In step 440, the threshold correction function is determined from the plurality of second candidate functions based on the second fitting evaluation index.

[0136] In some embodiments, based on the characteristics of the fitting evaluation index, the second candidate function corresponding to the optimal index can be selected from the second fitting evaluation index as the threshold correction function. For example, when the second fitting evaluation index is a determination coefficient, the second candidate function corresponding to the determination coefficient closest to 1 can be determined as the threshold correction function.

[0137] It should be noted that the above description of each step in Figure 4 is only for example and illustration, and does not limit the scope of the present specification. Those skilled in the art can make various modifications and changes to each step in Figure 4 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0138] Figure 7is an exemplary block diagram of a data processing system according to some embodiments shown in the present specification. The data processing system can implement threshold correction of a scintillation pulse detector. As shown in Figure 7 The first data processing system 700 can include an acquisition module 710, a first multi-threshold sampling module 720, a first comparison sampling module 730, a first threshold determination module 740, a first function determination module 750, and a first threshold setting module 760.

[0139] The acquisition module 710 can be configured to preset a plurality of reference thresholds for a working device used for multi-threshold sampling, and acquire a threshold correction function model corresponding to the working device, as described in step 110. Exemplary multi-threshold sampling can include comparing a to-be-measured scintillation pulse with a plurality of set thresholds, determining the time when the scintillation pulse crosses the threshold, and obtaining sampling data composed of threshold-time pairs. The working device can include a comparator and a time-to-digital converter. The comparator can be configured to implement comparison between the scintillation pulse and the threshold, and output a jump signal at the time when the scintillation pulse crosses the threshold. The time-to-digital converter can be configured to digitally sample the time of the jump signal output by the comparator. The acquired threshold-time pair information (two threshold-time pairs) can be used to inverse the waveform information of the scintillation pulse, and then the energy information of the energy spectrum of the scintillation pulse can be acquired. Exemplary comparator can include a low-voltage differential signaling (LVDS) comparator. The reference threshold can be a threshold assigned to the comparator for comparison with the scintillation pulse, and can be set by a digital-to-time converter (DAC). After setting, the DAC can transmit the reference threshold to the comparator for threshold comparison of the scintillation pulse. In some embodiments, the DAC can also be part of the working device. The threshold correction function model can be a function model reflecting the correspondence between the reference threshold and the actual working threshold corresponding to the reference threshold when the working device works at different environmental temperatures, and can include a nonlinear function model. The threshold correction function model can be a first-order function model, a second-order function model, a third-order function model, or other high-order function models. The present application does not make specific limitations.

[0140] The first multi-threshold sampling module 720 can be configured to perform multi-threshold sampling on the auxiliary correction pulse at each of the plurality of reference operating temperatures, to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the plurality of reference operating temperatures, respectively. The auxiliary correction pulse can have any pulse shape, which can be described by a determined mathematical expression. For example, the auxiliary correction pulse can be a triangular wave or a sinusoidal wave. The reference pulse width can be the peak width of the auxiliary correction pulse above the reference threshold, i.e., the time duration of the auxiliary correction pulse above the reference threshold. At each reference temperature, for any reference threshold, the reference pulse width can be determined by the difference between the times at which the auxiliary correction pulse crosses the reference threshold twice.

[0141] The first contrast sampling module 730 can be configured to perform contrast sampling on the auxiliary correction pulse, to determine the conversion relationship between the threshold and the pulse width of the auxiliary correction pulse. The contrast sampling can be high-rate ADC sampling. For example, the contrast sampling can sample the auxiliary correction pulse once every other time interval according to a sampling rate. The higher the sampling rate, the smaller the time interval, and the more the sampling data. The sampling data based on high-rate ADC sampling can directly output the actual waveform of the auxiliary correction pulse, and then determine the conversion relationship between the threshold and the pulse width according to the actual waveform.

[0142] The first threshold determination module 740 can be configured to determine a plurality of actual operating thresholds corresponding to the plurality of reference pulse widths at each of the plurality of reference operating temperatures, based on the conversion relationship. Both the threshold sampling and the contrast sampling are performed on the auxiliary correction pulse. Therefore, for the same sampling time, the threshold (e.g., the voltage threshold) of the auxiliary correction pulse obtained by the two sampling methods should be the same, and the threshold corresponding to the same pulse width should also be the same. Therefore, by the conversion relationship, a pulse width corresponding to the same reference pulse width as the reference threshold can be determined, and the threshold corresponding to the pulse width can be the actual operating threshold of the comparator during the multi-threshold sampling. In some embodiments, when the conversion relationship is in the form of a mathematical formula, the first threshold determination module 640 can substitute the reference pulse width into the formula to obtain the actual operating threshold corresponding to the reference pulse width. When the conversion relationship is in the form of a lookup table or a mapping table, the first threshold determination module 640 can find the threshold corresponding to the same pulse width as the reference pulse width by data lookup, as the actual operating threshold. In this way, the actual operating threshold corresponding to each reference pulse width at different reference operating temperatures can be determined.

[0143] The first function determination module 750 can be used to determine the functional expression of the threshold correction function model based on multiple reference thresholds and multiple actual operating thresholds at various reference operating temperatures, as described in step 150 above. The threshold correction function model can be solved using a curve fitting operation. For each reference operating temperature, the reference threshold and the actual operating threshold corresponding to the reference threshold can first constitute multiple first data pairs. The first function determination module 750 can perform function fitting based on these multiple first data pairs to obtain sub-function expressions of the threshold correction function model corresponding to the reference operating temperature. The fitting can be performed using the least squares method, interpolation, or polishing method. After determining the sub-function expressions corresponding to each reference operating temperature, these sub-function expressions can constitute the functional expression of the threshold correction model. The reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold can constitute multiple second data pairs. The first function determination module 750 can solve the threshold correction function model using a curve fitting operation based on these multiple second data pairs to obtain the functional expression. The curve fitting can also be performed using the least squares method, interpolation, or polishing method.

[0144] The first threshold setting module 760 can be used to set multiple actual preset thresholds for the working device based on the function expression as described in step 160 above, so that the working device performs multi-threshold sampling on the flicker pulse based on the multiple actual preset thresholds. The actual preset threshold can be a threshold set to make the working device work under the desired threshold. In combination with the above description, when a threshold is set for a working device such as a comparator, the comparator will not compare the threshold with the flicker pulse based on the threshold, but will compare it with an actual threshold that deviates from the threshold. In order to make the actual threshold approach or be equal to the desired working threshold, the actual threshold of the working device can be adjusted by adjusting the threshold set for the working device.

[0145] For other descriptions of the above modules, please refer to the flowchart of this application, such as Figure 1 .

[0146] Figure 8 FIG. 1 is an exemplary block diagram of another data processing system according to some embodiments of this specification. The data processing system can implement threshold correction of a scintillation pulse detector. Figure 8 As shown, the second data processing system 800 may include a second multi-threshold sampling module 810 , a second comparison sampling module 820 , a second threshold determination module 830 , a second function determination module 840 and a second threshold setting module 850 .

[0147] The second multi-threshold sampling module 810 can be configured to preset a plurality of reference thresholds and a plurality of reference operating temperatures for a work device for multi-threshold sampling, and perform multi-threshold sampling on the auxiliary calibration pulse at each of the reference operating temperatures using the work device, to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference operating temperatures, as described in step 210 above. The second multi-threshold sampling module 810 can perform the same or similar operations as the first multi-threshold sampling module 720.

[0148] The second contrast sampling module 820 can be configured to perform contrast sampling on the auxiliary calibration pulse to determine a conversion relationship between the threshold and the pulse width of the auxiliary calibration pulse, as described in step 220 above. The second contrast sampling module 820 can perform the same or similar operations as the first contrast sampling module 730.

[0149] The second threshold determination module 830 can be configured to determine a plurality of actual operating thresholds related to the plurality of reference pulse widths based on the conversion relationship, as described in step 230 above. The second threshold determination module 830 can perform the same or similar operations as the first threshold determination module 740.

[0150] The second function determination module 840 can be configured to determine a threshold correction function based on the plurality of reference thresholds at each of the reference operating temperatures and the plurality of actual operating thresholds, as described in step 240 above. The threshold correction function can reflect the correspondence between the actual operating thresholds of the work device operating at different ambient temperatures and the reference thresholds, which can be a nonlinear function. For example, the threshold correction function can be a linear function, a quadratic function, a cubic function, or other high-order functions. The threshold correction function can be a widely adaptive correction function that can correct the thresholds of work devices operating at various temperatures. The threshold correction function can also be a piecewise function composed of a plurality of sub-functions, each sub-function corresponding to a threshold correction in a temperature or temperature range.

[0151] The second function determining module 840 can perform the flow 300 to determine the threshold correction function. For each reference operating temperature, the second function determining module 840 can construct a plurality of first data pairs by using the reference threshold and the actual operating threshold corresponding to the reference threshold. Based on the plurality of first data pairs, the second function determining module 840 can obtain a plurality of first candidate functions by a curve fitting operation. The plurality of first data pairs can be used for a plurality of times of curve fitting to obtain the plurality of first candidate functions. For example, the plurality of data pairs can be used for a fitting process based on a linear function, a fitting process based on a quadratic function, a fitting process based on a cubic function, a fitting process based on a high-order function (greater than or equal to four), etc., to obtain a linear function, a quadratic function, a cubic function, a high-order function, etc. as the first candidate functions. In some embodiments, the curve fitting process can be implemented based on a least square method, an interpolation method, or a polishing method. The plurality of first data pairs at each reference operating temperature can be used for the above-mentioned curve fitting operation to obtain a plurality of first candidate functions corresponding to each reference operating temperature. The second function determining module 840 can determine a first fitting evaluation index of each first candidate function. The first fitting evaluation index can be a parameter for evaluating the effect of curve fitting. For example, the fitting evaluation index can include a mean absolute error (MAE), a mean square error (MSE), a root mean square error (RMSE), a mean absolute percentage error (MAPE), a symmetric mean absolute percentage error (SMAPE), a determination coefficient (R Square), etc. In some embodiments, the first fitting evaluation index can be a determination coefficient. The determination coefficient can have a value range of 0-1. The closer to 1, the better the fitting effect. In each curve fitting process, the determination coefficient corresponding to the first candidate function can be output at the same time as the first candidate function. The second function determining module 840 can determine a target correction function from the plurality of first candidate functions based on the first fitting evaluation index. The second function determining module 840 can select a first candidate function corresponding to an optimal index in the first fitting evaluation index as the target correction function. The second function determining module 840 can construct a plurality of target candidate functions corresponding to the plurality of reference operating temperatures as the threshold correction function. When the target candidate function corresponding to each reference operating temperature is determined, the target candidate functions can constitute the threshold correction function.

[0152] The second function determining module 840 can perform the flow 400 to determine the threshold correction function. The second function determining module 840 can construct a plurality of second data pairs using the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold, and obtain a plurality of second candidate functions through a curve fitting operation based on the plurality of second data pairs. The plurality of second data pairs can be used for a plurality of times of curve fitting to obtain the plurality of second candidate functions. For example, the plurality of second data pairs can be used for a fitting process based on a linear function, a fitting process based on a quadratic function, a fitting process based on a cubic function, a fitting process based on a high-order function (greater than or equal to four), and the like, to obtain a linear function, a quadratic function, a cubic function, a high-order function, and the like, which can be used as the second candidate function. In some embodiments, the curve fitting process can be implemented based on a least square method, an interpolation method, or a polishing method, and the obtained second candidate function can be a correction function with a wide adaptability. Since the influence of temperature is considered in the fitting, the second candidate function can be adapted to different operating temperatures. That is, a single second candidate function can be used for threshold correction of a device operating in a temperature range. The second function determining module 840 can determine a second fitting evaluation index of each second candidate function. The second fitting evaluation index can be the same as or similar to the first fitting evaluation index, or can be a parameter for evaluating the effect of curve fitting. For example, MAE, MSE, RMSE, MAPE, SMAPE, RSquare, and the like. In some embodiments, the second fitting evaluation index can also be a determination coefficient. Each time the curve fitting process is performed, the corresponding determination coefficient of the second candidate function can be output. The second function determining module 840 can determine the threshold correction function from the plurality of second candidate functions based on the second fitting evaluation index. The second function determining module 840 can select the second candidate function corresponding to the optimal index in the second fitting evaluation index as the threshold correction function.

[0153] Other descriptions of the above modules can be referred to the flowchart part of the present application, for example, Figures 2-4 .

[0154] It should be understood that, Figure 7 and Figure 8The illustrated system and its modules can be implemented in various ways. For instance, in some embodiments, the system and its modules can be implemented in hardware, software, or a combination of software and hardware. The hardware components can be implemented with special logic, while the software components can be stored in memory and executed by a suitable instruction execution system, such as a microprocessor or a dedicated design hardware. Those skilled in the art can understand that the above-described methods and systems can be implemented using computer-executable instructions and / or in processor control code, which can be provided on a carrier medium such as a carrier wave transmittable over a wired or wireless network, a magnetic or optical storage media, a memory, etc. The system and its modules of the present specification can be implemented not only in hardware circuitry such as very large scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, etc., or programmable hardware devices such as field programmable gate arrays, programmable logic devices, etc., but also in software, e.g., executed by various types of processors, or a combination of the above (e.g., firmware).

[0155] It should be noted that the above description of the modules is for the convenience of description only, and does not limit the present specification to the embodiments described. It can be understood by those skilled in the art that, after understanding the principles of the system, the modules can be combined in any way, or connected with other modules to form a subsystem, without departing from the principles. For example, the modules can share a storage module, or each module can have its own storage module. Such variations are within the scope of the present specification.

[0156] Figure 9 is an exemplary block diagram of a processing device according to some embodiments of the present application. The processing device 900 can include any components to implement the system described in the embodiments of the present application. For example, the processing device 900 can be implemented by hardware, software program, firmware, or a combination thereof. For example, the processing device 900 can implement the first data processing system 700 and the second data processing system 800. For the sake of convenience, only one processing device is drawn in the figure, but the computing functions described in the embodiments of the present application can be implemented in a distributed manner, by a group of similar platforms, to distribute the processing load of the system.

[0157] In some embodiments, the processing device 900 can include a processor 910, a memory 920, an input / output component 930, and a communication port 940. In some embodiments, the processor (e.g., CPU) 910 can execute program instructions in the form of one or more processors. In some embodiments, the memory 920 includes different forms of program memory and data memory, such as hard disks, read-only memory (ROM), random access memory (RAM), etc., for storing a variety of data files processed and / or transmitted by the computer. In some embodiments, the input / output component 930 can be used to support input / output between the processing device 900 and other components. In some embodiments, the communication port 940 can be connected with a network for enabling data communication. An exemplary processing device can include program instructions stored in read-only memory (ROM), random access memory (RAM), and / or other types of non-transitory storage media that are executed by the processor 910. The methods and / or processes of the embodiments of the present specification can be implemented in the form of program instructions. The processing device 900 can also receive programs and data disclosed in the present application through network communication.

[0158] For the sake of convenience, Figure 9 Only one processor is shown in the processing device 900 in the embodiments of the present specification. However, it should be noted that the processing device 900 in the embodiments of the present specification can include multiple processors, and thus the operations and / or methods described in the embodiments of the present specification as being implemented by one processor can also be implemented by multiple processors collectively or independently. For example, if in the present specification the processor of the processing device 900 executes step 1 and step 2, it should be understood that step 1 and step 2 can also be executed collectively or independently by two different processors of the processing device 900 (for example, the first processor executes step 1, the second processor executes step 2, or the first and second processors collectively execute step 1 and step 2).

[0159] The method for processing scintillation pulses provided in the present application can be specifically used in photon detection, and can be applied to various fields, such as medical imaging technology, high-energy physics, laser radar, automatic driving, precision analysis, optical communication, and the like. In a specific example, the method for processing scintillation pulses, device, equipment and storage medium provided in the present application can be applied to radiation detection, and the detector for collecting pulse information can be threshold corrected by using the scheme according to the embodiments of the present application to obtain more accurate collected data. In other specific examples of the present application, the method for processing scintillation pulses, device, equipment and storage medium provided in the present application can be applied to various digital devices, such as CT equipment, MRI equipment, PET equipment, oil detection equipment, weak light detection equipment, SPECT equipment, security inspection equipment, gamma camera, X-ray equipment, DR equipment and other equipment using high-energy ray conversion principle, and other photoelectric conversion application equipment.

[0160] The basic concepts have been described herein, and it is obvious that the above detailed disclosure is only used as an example and does not limit the present specification. Although it is not explicitly stated herein, those skilled in the art can make various modifications, improvements and corrections to the present specification. Such modifications, improvements and corrections are suggested in the present specification, so such modifications, improvements and corrections still belong to the spirit and scope of the exemplary embodiments of the present specification.

[0161] Meanwhile, specific words are used in the present specification to describe the embodiments of the present specification. As "one embodiment", "an embodiment", and / or "some embodiments" means a certain feature, structure or characteristic related to at least one embodiment of the present specification. Therefore, it should be emphasized and noted that "an embodiment" or "one embodiment" or "one alternative embodiment" mentioned in different positions in the present specification does not necessarily mean the same embodiment. In addition, some features, structures or characteristics in one or more embodiments of the present specification can be properly combined.

[0162] In addition, those skilled in the art can understand that aspects of the present specification can be described and claimed in a broadest form, including any new and useful processes, machines, products or compositions of matter, or any new and useful improvements thereof. Accordingly, various aspects of the present specification can be performed entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. The above hardware or software can be referred to as "data blocks", "modules", "engines", "units", "components" or "systems". In addition, aspects of the present specification can be embodied as a computer product located in one or more computer readable media, including computer readable program code.

[0163] A computer storage medium may include a propagated data signal embodying the computer program code, for example, in baseband or as part of a carrier wave. The propagated signal may be in a variety of forms, including electromagnetic, optical, or any suitable combination thereof. A computer storage medium may be any computer-readable medium other than a computer-readable storage medium that can be connected to an instruction execution system, apparatus, or device to communicate, propagate, or transfer the program for use. The program code on the computer storage medium may be transmitted via any suitable medium, including radio, cable, fiber optic cable, RF, or similar media, or any combination of these.

[0164] The computer program code required for the operation of the various parts of this specification can be written in any one or more programming languages, including object-oriented programming languages ​​such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB.NET, Python, etc., conventional procedural programming languages ​​such as C, Visual Basic, Fortran 3003, Perl, COBOL 3002, PHP, ABAP, dynamic programming languages ​​such as Python, Ruby and Groovy, or other programming languages. The program code can be run entirely on the user's computer, or as a stand-alone software package on the user's computer, or partly on the user's computer and partly on a remote computer, or entirely on a remote computer or server. In the latter case, the remote computer can be connected to the user's computer through any network form, such as a local area network (LAN) or a wide area network (WAN), or connected to an external computer (e.g., via the Internet), or in a cloud computing environment, or used as a service such as software as a service (SaaS).

[0165] In addition, unless expressly stated in the claims, the order of the processing elements and sequences, the use of alphanumeric characters, or the use of other names described in this specification are not intended to limit the order of the processes and methods of this specification. Although the above disclosure discusses some of the invention embodiments currently considered useful through various examples, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments. On the contrary, the claims are intended to cover all modifications and equivalent combinations that are consistent with the spirit and scope of the embodiments of this specification. For example, although the system components described above can be implemented by hardware devices, they can also be implemented only by software solutions, such as installing the described system on an existing server or mobile device.

[0166] For simplicity and to facilitate understanding of one or more embodiments, a description of an embodiment sometimes refers to a plurality of features in a single embodiment, drawing, or description of an embodiment. However, this does not imply that a greater number of features is necessary to practice the embodiments disclosed in this specification. In fact, features fewer than those disclosed in a single embodiment described above are within the scope of the embodiments.

[0167] Some embodiments use numerical values to describe components, quantities of attributes. It should be understood that such numerical values used in the description of embodiments are in some examples modified by the adjectives "about," "approximately," or "substantially." Unless otherwise stated, "about," "approximately," or "substantially" indicate that the described value allows for a ±20% variation. Accordingly, numerical parameters in the description and claims are approximations, and can vary depending upon the desired characteristics set forth in each instance. In some embodiments, numerical parameters are determined by the limitations inherent in the measurement systems used to determine the values. Although the numerical ranges and parameters setting forth the broadest scope of the embodiments recited in this specification are approximations, the numerical values set forth in the specific examples are reported as precisely as possible. The numerical values set forth in the specific examples are provided to be as precise as reasonably possible. However, some variations may occur depending on the standard variation encountered in making basic measurements.

[0168] Each patent, patent application, patent publication, and other material, such as articles, books, specifications, publications, documents, and the like, referenced herein are hereby incorporated by reference in their entirety for the teachings relevant to the sentence and / or paragraph in which the reference is made. Discrepancies between applications history documents and the present specification, other than limitations on the scope of the present claims, are excepted. It is specifically intended that the description, definitions, and / or terminology used herein be interpreted liberally and used merely for the purpose of the present disclosure. Accordingly, except as they can be

[0169] Finally, it should be understood that the embodiments described herein are merely examples of embodiments of the application. Other variations having essentially the same structure and function but different values for parameters can also be within the scope of the application. Accordingly, although specific configurations and arrangements have been described herein, other configurations and arrangements can be devised that are within the scope of the application. Furthermore, the aforementioned examples are to be regarded as illustrative only and not restrictive on the scope of the application.

Claims

1. A method of processing a flicker pulse, characterized by, The processing method comprises: presetting a plurality of reference thresholds for a working device for multi-threshold sampling, and acquiring a threshold correction function model corresponding to the working device, the threshold correction function model reflecting a correspondence between the reference thresholds and actual working thresholds of the working device at different ambient temperatures, including a nonlinear function model; presetting a plurality of reference working temperatures, and performing multi-threshold sampling on an auxiliary correction pulse at each reference working temperature by the working device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference working temperatures; performing contrast sampling on the auxiliary correction pulse to determine a conversion relationship between a threshold and a pulse width of the auxiliary correction pulse; based on the conversion relationship, determining a plurality of actual working thresholds related to the plurality of reference pulse widths at each reference working temperature; based on the plurality of reference thresholds and the plurality of actual working thresholds at each reference working temperature, adjusting a function expression of the threshold correction function model; based on the function expression, setting a plurality of actual preset thresholds for the working device, so that the working device performs multi-threshold sampling on a flicker pulse based on the plurality of actual preset thresholds.

2. The method of processing flicker pulses according to claim 1, characterized in that, The number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference working temperatures is greater than or equal to two.

3. The method of processing flicker pulses according to claim 1, wherein, The size of the reference threshold does not exceed the maximum amplitude of the auxiliary correction pulse.

4. The method of processing flicker pulses according to claim 1, wherein, The contrast sampling comprises ADC sampling, and the determination of the conversion relationship comprises: based on the ADC sampling, determining an actual waveform of the auxiliary correction pulse; based on the actual waveform, determining a pulse width of a peak shape of the auxiliary correction pulse higher than the threshold; determining a mathematical expression between the threshold and the pulse width as the conversion relationship.

5. The method of processing flicker pulses according to claim 1, wherein, The contrast sampling comprises pulse width detection, and the determination of the conversion relationship comprises: based on the pulse width detection, determining pulse widths of the auxiliary correction pulse at a plurality of thresholds; based on the plurality of thresholds and the corresponding plurality of pulse widths, constructing a lookup table as the conversion relationship.

6. The method of processing flicker pulses according to claim 1, wherein, The determination of the function expression of the threshold correction function model comprises: for each reference working temperature, using the reference threshold and the actual working threshold corresponding to the reference threshold to form a plurality of first data pairs; based on the plurality of first data pairs, determining a sub-function expression of the threshold correction function model corresponding to the reference working temperature by a curve fitting operation; designating a plurality of sub-function expressions corresponding to the plurality of reference working temperatures to form a function expression of the threshold correction function model.

7. The method of processing a scintillation pulse according to claim 1, wherein, The determination of the function expression of the threshold correction function model comprises: using the reference threshold at the reference working temperature and the actual working threshold corresponding to the reference threshold to form a plurality of second data pairs; based on the plurality of second data pairs, determining a function expression of the threshold correction function model by a curve fitting operation.

8. The method of processing a scintillation pulse according to claim 6 or 7, characterized in that, The curve fitting operation is implemented based on a least square method, an interpolation method or a polishing method.

9. The method of processing a flicker pulse according to claim 1, wherein, The function expression is used to set a plurality of actual preset thresholds for the working device, including: obtaining a target working threshold and / or a target working temperature of the working device; determining the actual preset threshold based on the target working threshold and / or the target working temperature and the function expression.

10. The method of processing flicker pulses according to claim 9, characterized in that, The target working threshold is determined based on prior information of the flicker pulse.

11. A method of processing a flicker pulse, characterized by, The processing method includes: presetting a plurality of reference thresholds and a plurality of reference working temperatures for the working device for multi-threshold sampling, and performing multi-threshold sampling on the auxiliary correction pulse at each reference working temperature by using the working device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference working temperature; performing contrast sampling on the auxiliary correction pulse to determine the conversion relationship between the threshold and the pulse width of the auxiliary correction pulse; determining a plurality of actual working thresholds related to the plurality of reference pulse widths at each reference working temperature based on the conversion relationship; determining a threshold correction function based on the plurality of reference thresholds and the plurality of actual working thresholds at each reference working temperature; the threshold correction function reflects the corresponding relationship between the actual working threshold and the preset reference threshold of the working device at different environmental temperatures, including a nonlinear function; based on the threshold correction function, a plurality of actual preset thresholds are set for the working device, so that the working device performs multi-threshold sampling on the flicker pulse based on the plurality of actual preset thresholds.

12. The method of processing flicker pulses according to claim 11, characterized in that, The number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference working temperatures is greater than or equal to two.

13. The method of processing flicker pulses according to claim 11, wherein, The size of the reference threshold does not exceed the maximum amplitude of the auxiliary correction pulse.

14. The method of processing flicker pulses according to claim 11, wherein, The contrast sampling includes ADC sampling, and the determination of the conversion relationship includes: determining the actual waveform of the auxiliary correction pulse based on the ADC sampling; determining the pulse width of the peak-shaped pulse of the auxiliary correction pulse above the threshold based on the actual waveform; determining the mathematical expression between the threshold and the pulse width as the conversion relationship.

15. The method of processing flicker pulses according to claim 11, wherein, The contrast sampling includes pulse width detection, and the determination of the conversion relationship includes: determining the pulse width of the auxiliary correction pulse at a plurality of thresholds based on the pulse width detection; constructing a lookup table as the conversion relationship based on the plurality of thresholds and the corresponding plurality of pulse widths.

16. The method of processing flicker pulses according to claim 11, wherein, The determination of the threshold correction function includes: for each reference working temperature, using the reference threshold and the actual working threshold corresponding to the reference threshold to form a plurality of first data pairs; obtaining a plurality of first candidate functions through curve fitting operation based on the plurality of first data pairs; determining a first fitting evaluation index of each first candidate function; determining a target candidate function from the plurality of first candidate functions based on the first fitting evaluation index; designating a plurality of target candidate functions corresponding to the plurality of reference working temperatures to constitute the threshold correction function.

17. The method of processing a scintillation pulse according to claim 11, wherein, The determination of the threshold correction function includes: constructing a plurality of second data pairs by using the reference threshold at the reference operating temperature and the actual operating threshold corresponding to the reference threshold; obtaining a plurality of second candidate functions by curve fitting operation based on the plurality of second data pairs; determining a second fitting evaluation index of each second candidate function; determining the threshold correction function from the plurality of second candidate functions based on the second fitting evaluation index.

18. The method of processing a scintillation pulse according to claim 16 or 17, wherein, The curve fitting operation is implemented based on a least square method, an interpolation method or a polishing method.

19. The method of processing flicker pulses according to claim 11, wherein, The threshold correction function is used to set a plurality of actual preset thresholds for the operating device, including: obtaining a target operating threshold and / or a target operating temperature of the operating device; determining the actual preset threshold based on the target operating threshold and / or the target operating temperature and the expression of the function.

20. The method of processing flicker pulses according to claim 19, wherein, The target operating threshold is determined based on prior information of the flicker pulse.

21. A processing device for processing flicker pulses, characterized by The processing device includes: an obtaining module configured to preset a plurality of reference thresholds for a multi-threshold sampling operating device and obtain a threshold correction function model corresponding to the operating device, the threshold correction function model reflecting a corresponding relationship between the reference thresholds and actual operating thresholds of the operating device at different environmental temperatures, including a nonlinear function model; a first multi-threshold sampling module configured to preset a plurality of reference operating temperatures and perform multi-threshold sampling on an auxiliary correction pulse at each reference operating temperature by using the operating device to determine a plurality of reference pulse widths corresponding to the plurality of reference thresholds at the reference operating temperatures; a first comparative sampling module configured to perform comparative sampling on the auxiliary correction pulse to determine a conversion relationship between a threshold and a pulse width of the auxiliary correction pulse; a first threshold determination module configured to determine a plurality of actual operating thresholds related to the plurality of reference pulse widths at each reference operating temperature based on the conversion relationship; a first function determination module configured to adjust a function expression of the threshold correction function model based on the plurality of reference thresholds and the plurality of actual operating thresholds at each reference operating temperature; a first threshold setting module configured to set a plurality of actual preset thresholds for the operating device based on the function expression, so that the operating device performs multi-threshold sampling on a flicker pulse based on the plurality of actual preset thresholds.

22. The scintillation pulse processing apparatus of claim 21, wherein, The number of the plurality of reference thresholds is greater than or equal to three, and the number of the plurality of reference operating temperatures is greater than or equal to two.

23. The scintillation pulse processing apparatus of claim 21, wherein, The size of the reference threshold does not exceed the maximum amplitude of the auxiliary correction pulse.

24. The scintillation pulse processing apparatus of claim 21, wherein, The comparative sampling includes ADC sampling, and to determine the conversion relationship, the first comparative sampling module is configured to: determine an actual waveform of the auxiliary correction pulse based on the ADC sampling; determine a pulse width of a peak shape of the auxiliary correction pulse higher than the threshold based on the actual waveform; determine a mathematical expression between the threshold and the pulse width as the conversion relationship.

25. The scintillation pulse processing apparatus of claim 21, wherein, The comparative sampling includes pulse width detection, and to determine the conversion relationship, the first comparative sampling module is configured to: determining, based on the pulse width detection, pulse widths of the auxiliary correction pulse at a plurality of threshold values; constructing, based on the plurality of threshold values and the corresponding plurality of pulse widths, a lookup table as the conversion relationship.

26. The scintillation pulse processing apparatus of claim 21, wherein, To determine the function expression of the threshold correction function model, the first function determination module is configured to: for each reference operating temperature, using the reference threshold value and the actual operating threshold value corresponding to the reference threshold value, a plurality of first data pairs are formed; based on the plurality of first data pairs, a curve fitting operation is used to determine a sub-function expression of the threshold correction function model corresponding to the reference operating temperature; the plurality of sub-function expressions corresponding to the plurality of reference operating temperatures constitute the function expression of the threshold correction function model.

27. The scintillation pulse processing apparatus of claim 21, wherein, To determine the function expression of the threshold correction function model, the first function determination module is configured to: using the reference threshold value at the reference operating temperature and the actual operating threshold value corresponding to the reference threshold value, a plurality of second data pairs are formed; based on the plurality of second data pairs, a curve fitting operation is used to determine the function expression of the threshold correction function model.

28. The scintillation pulse processing apparatus of claim 26 or 27, wherein, The curve fitting operation is implemented based on the least squares method, interpolation method or polishing method.

29. The scintillation pulse processing apparatus of claim 21, wherein, To set a plurality of actual preset threshold values for the operating device based on the function expression, the first threshold setting module is configured to: obtain a target operating threshold value and / or a target operating temperature of the operating device; based on the target operating threshold value and / or the target operating temperature, and the function expression, determine the actual preset threshold value.

30. The scintillation pulse processing apparatus of claim 29, wherein, The target operating threshold value is determined based on prior information of the flicker pulse.

31. A processing device for processing flicker pulses, characterized by The processing device comprises: a second multi-threshold sampling module configured to preset a plurality of reference threshold values and a plurality of reference operating temperatures for a multi-threshold sampling operating device, and perform multi-threshold sampling on an auxiliary correction pulse at each reference operating temperature using the operating device to determine a plurality of reference pulse widths corresponding to the plurality of reference threshold values at the reference operating temperatures; a second comparative sampling module configured to perform comparative sampling on the auxiliary correction pulse to determine a conversion relationship between the threshold value and the pulse width of the auxiliary correction pulse; a second threshold determination module configured to determine a plurality of actual operating threshold values related to the plurality of reference pulse widths at each reference operating temperature based on the conversion relationship; a second function determination module configured to determine a threshold correction function based on the plurality of reference threshold values at each reference operating temperature and the plurality of actual operating threshold values; the threshold correction function reflects the corresponding relationship between the actual operating threshold value of the operating device at different environmental temperatures and the preset reference threshold value, including a nonlinear function; a second threshold setting module configured to set a plurality of actual preset threshold values for the operating device based on the threshold correction function, so that the operating device performs multi-threshold sampling on a flicker pulse based on the plurality of actual preset threshold values.

32. A digitizer device, comprising: comprises: A memory, a processor, and a computer program stored on the memory and executable on the processor, which, when executed by the processor, implement the steps of the processing method according to any one of claims 1-20.

33. A digitizer device, comprising: comprising: The processing device of the scintillation pulses according to any one of claims 21-31.

34. A computer-readable storage medium, characterized in that, A computer program is stored on the storage medium, which, when executed by a processor, implements the steps of the processing method according to any one of claims 1-20.

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