Fault injection analysis method, device, equipment, storage medium and program product

Abstract

The present invention relates to the field of security analysis technology, and provides a fault injection analysis method, apparatus, device, storage medium, and program product. The method comprises: obtaining a link signal between a device to be analyzed and at least one target device, the target device being in communication with the device to be analyzed; determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter; injecting the fault signal into the device to be analyzed based on an injection time indicated by the fault injection parameter; obtaining first operating data of the device to be analyzed in a fault injection state, and performing fault injection analysis on the device to be analyzed based on the first operating data. The present invention can more accurately adjust the fault injection parameter, thereby improving the accuracy and effectiveness of the fault injection, and thereby improving the accuracy of the security analysis.

Description

Technical Field

[0001] The present invention relates to the field of security analysis technology, and in particular to a fault injection analysis method, apparatus, device, storage medium, and program product. Background Art

[0002] With the rapid development of IoT technology, the application scope of IoT devices is becoming increasingly widespread. IoT devices integrate with the internet through various wired and wireless networks, enabling real-time and accurate data transmission across the network. During data transmission, security design is required to ensure the confidentiality, integrity, and validity of data. Therefore, security analysis of IoT devices is necessary to test their security.

[0003] Currently, IoT device security analysis is mostly performed through fault injection analysis. However, IoT devices contain various radio frequency signals, internal electromagnetic signals, and environmental interference signals, resulting in high signal complexity. This makes accurate fault injection difficult, and consequently, effective fault injection analysis of IoT devices is impossible, resulting in low security analysis accuracy. Summary of the Invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention proposes a fault injection analysis method that can more accurately adjust fault injection parameters, thereby improving the accuracy and effectiveness of fault injection and further improving the accuracy of security analysis.

[0005] The present invention also provides a fault injection analysis device, electronic equipment, storage medium and program product.

[0006] The fault injection analysis method according to the first embodiment of the present invention includes:

[0007] Acquiring a link signal between a device to be analyzed and at least one target device, wherein the target device is in communication with the device to be analyzed;

[0008] determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter;

[0009] Injecting the fault signal into the device to be analyzed based on the injection time point indicated by the fault injection parameter;

[0010] First operating data of the device to be analyzed in a fault injection state is acquired, and fault injection analysis is performed on the device to be analyzed based on the first operating data.

[0011] According to the fault injection analysis method of an embodiment of the present invention, a link signal between a device to be analyzed and at least one target device is obtained to determine a fault injection parameter based on the link signal. Compared with determining the fault injection parameter based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can adjust the fault injection parameter more accurately, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; at the same time, the injection time point can be determined more accurately, so that based on the injection time point indicated by the fault injection parameter, the fault signal can be more accurately injected into the device to be analyzed, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; in addition, by performing fault injection analysis on the device to be analyzed based on the first operating data of the device to be analyzed in the fault injection state, compared with performing safety analysis based on the second operating data of the device to be analyzed in the non-fault injection state, the embodiment of the present invention can reduce complex signal interference of the device to be analyzed, thereby improving the accuracy of the safety analysis.

[0012] According to one embodiment of the present invention, performing fault injection analysis on the device to be analyzed based on the first operating data includes:

[0013] Determining that the first operating data does not meet the preset requirements, returning to the step of obtaining a link signal between the device to be analyzed and at least one target device;

[0014] It is determined that the first operating data meets preset requirements, and a fault injection analysis is performed on the device to be analyzed based on the first operating data that meets the preset requirements.

[0015] According to one embodiment of the present invention, performing fault injection analysis on the device to be analyzed based on the first operating data that meets the preset requirements includes:

[0016] Based on the injection time point, determining data to be analyzed from the first operating data that meets the preset requirements;

[0017] Based on the data to be analyzed, a fault injection analysis is performed on the device to be analyzed.

[0018] According to an embodiment of the present invention, when the data to be analyzed is ciphertext data, performing fault injection analysis on the device to be analyzed based on the data to be analyzed includes:

[0019] Acquire second operating data of the device to be analyzed in a non-fault injection state, where the second operating data and the first operating data are data corresponding to the same operating content at different times;

[0020] Based on the data to be analyzed and the second operating data, a fault injection analysis is performed on the device to be analyzed.

[0021] According to one embodiment of the present invention, the at least one target device includes a control terminal device, and the control terminal device is used to control the device to be analyzed;

[0022] The determining of a fault injection parameter based on the link signal includes:

[0023] Obtaining an operation signal of the control terminal device;

[0024] A fault injection parameter is determined based on the link signal and the operation signal.

[0025] According to one embodiment of the present invention, the injection time point is determined based on the following steps:

[0026] Acquire third operating data of the device to be analyzed, where the third operating data and the first operating data are data corresponding to the same operating content at different times;

[0027] The injection time point is determined based on the link signal and the third operating data.

[0028] According to one embodiment of the present invention, the at least one target device includes a control terminal device and a cloud device, and the control terminal device is used to control the device to be analyzed;

[0029] The link signals include a link signal between the device to be analyzed and the control end device, a link signal between the device to be analyzed and the cloud device, and a link signal between the control end device and the cloud device.

[0030] A fault injection analysis device according to an embodiment of the second aspect of the present invention includes:

[0031] a signal acquisition module, configured to acquire a link signal between the device to be analyzed and at least one target device, the target device being in communication with the device to be analyzed;

[0032] a signal determination module, configured to determine a fault injection parameter based on the link signal, and determine a fault signal based on the fault injection parameter;

[0033] A signal injection module, configured to inject the fault signal into the device to be analyzed based on an injection time point indicated by the fault injection parameter;

[0034] The fault analysis module is configured to obtain first operating data of the device to be analyzed in a fault injection state, and perform fault injection analysis on the device to be analyzed based on the first operating data.

[0035] According to an embodiment of the third aspect of the present invention, an electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, any one of the above-described fault injection analysis methods is implemented.

[0036] According to a fourth aspect of an embodiment of the present invention, a non-transitory computer-readable storage medium stores a computer program, which, when executed by a processor, implements any of the above-described fault injection analysis methods.

[0037] A computer program product according to an embodiment of the fifth aspect of the present invention includes a computer program, which implements any of the above-mentioned fault injection analysis methods when executed by a processor.

[0038] The above one or more technical solutions in the embodiments of the present invention have at least one of the following technical effects:

[0039] A link signal between the device to be analyzed and at least one target device is obtained to determine a fault injection parameter based on the link signal. Compared with determining the fault injection parameter based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can adjust the fault injection parameter more accurately, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; at the same time, the injection time point can be determined more accurately, so that the fault signal can be more accurately injected into the device to be analyzed based on the injection time point indicated by the fault injection parameter, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; in addition, based on the first operating data of the device to be analyzed in the fault injection state, the fault injection analysis of the device to be analyzed can be performed. Compared with performing a safety analysis based on the second operating data of the device to be analyzed in the non-fault injection state, the embodiment of the present invention can reduce the complex signal interference of the device to be analyzed, thereby improving the accuracy of the safety analysis.

[0040] Additional aspects and advantages of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description which follows, or may be learned by practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0042] Figure 1 This is one of the flow diagrams of the fault injection analysis method provided by an embodiment of the present invention;

[0043] Figure 2 This is the second flow chart of the fault injection analysis method provided by an embodiment of the present invention;

[0044] Figure 3 Schematic diagram of the structure of the fault injection analysis device provided by an embodiment of the present invention;

[0045] Figure 4 It is a structural diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0046] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0047] With the rapid development of IoT technology, the application scope of IoT devices is becoming increasingly broad. The IoT is a crucial component of next-generation information technology, representing the advanced fusion of the internet and embedded systems. IoT devices integrate with the internet through various wired and wireless networks, enabling real-time and accurate transmission of IoT device data. For example, information collected by object sensors can be accurately transmitted over the network in real time. During data transmission, security design is required to ensure data confidentiality, integrity, and validity. Therefore, security analysis of IoT devices is necessary to test security.

[0048] IoT devices can be subjected to security analysis through side-channel attacks. These attacks include non-invasive, semi-invasive, and invasive methods. Non-invasive methods achieve security analysis through bypass monitoring without disrupting the normal operation of IoT devices. However, these methods require monitoring of clean signals. IoT devices contain various radio frequency signals, internal electromagnetic signals, and environmental interference signals, resulting in high signal complexity and significant obstacles to security analysis. Accurate security analysis requires eliminating various interference signals from IoT devices, which is not easy to do. Invasive methods, on the other hand, require destructive analysis of IoT devices, potentially causing irreversible damage and increasing costs.

[0049] Based on the above, most current security analysis of IoT devices uses fault injection analysis, which avoids concerns about signal purity and irreversible device damage. However, IoT devices contain various radio frequency signals, internal electromagnetic signals, and environmental interference signals, resulting in high signal complexity and difficulty in accurately locating IoT device signals. Consequently, the timing of fault injection cannot be accurately determined, making it impossible to accurately perform fault injection. Consequently, effective fault injection analysis of IoT devices is impossible, resulting in low security analysis accuracy.

[0050] To address the above issues, the present invention proposes the following embodiments. The following describes a fault injection analysis method provided by an embodiment of the present invention, with reference to the accompanying drawings. The method can be executed by a fault injection analysis device, a server, or a user terminal, including but not limited to mobile phones, tablets, PCs, in-vehicle terminals, and smart home appliances.

[0051] Figure 1 This is one of the flow charts of the fault injection analysis method provided by the embodiment of the present invention. Figure 1 As shown, the fault injection analysis method includes:

[0052] Step 110: Acquire a link signal between the device to be analyzed and at least one target device, wherein the target device is in communication with the device to be analyzed.

[0053] Here, the device to be analyzed is a device to be subjected to fault injection analysis. Furthermore, the device to be analyzed is a device to be subjected to security analysis.

[0054] In one embodiment, the device to be analyzed is an IoT device, and further, an embedded device. It should be noted that embedded devices typically utilize an integrated circuit architecture with a microcontroller or microprocessor as the primary control component, along with peripheral auxiliary components, resistors, capacitors, and the like. Consequently, the signal analysis process inevitably involves various interfering signals (such as various radio frequency signals, communication signals, and so on). Consequently, the high signal complexity of embedded devices significantly hinders security analysis.

[0055] Here, the target device is a device that has a communication connection with the device to be analyzed. The communication connection can be a wireless connection or a wired connection.

[0056] The number of target devices is set based on actual conditions. If there are multiple target devices, multi-point sniffing can be achieved, so that when a problem occurs on a single target device, the link signal can still be obtained, thus ensuring that fault injection analysis can still be performed.

[0057] The target device may include, but is not limited to, at least one of the following: a control device, a cloud device, an IoT device, and so on. The control device is used to control the device to be analyzed; for example, the control device is a smartphone with a control app (Application) corresponding to the device to be analyzed installed on the smartphone. The cloud device may be the cloud server corresponding to the device to be analyzed.

[0058] In one embodiment, the target device is determined based on the characteristics of the IoT system. Specifically, other devices that cooperate with the device to be analyzed are determined as target devices.

[0059] Here, the link signal is a signal on the communication link between the target device and the device to be analyzed. The number of the link signals is the same as the number of the target devices. Specifically, the link signal between the device to be analyzed and at least one target device is detected.

[0060] In a specific embodiment, the link signal is a signal corresponding to an operation to be analyzed, for example, a signal transmission of a device switching operation to be analyzed. Based on this, the link signal is a signal related to the device switching operation.

[0061] Step 120: Determine a fault injection parameter based on the link signal, and determine a fault signal based on the fault injection parameter.

[0062] Here, the fault injection parameters include the injection time point and signal adjustment parameters. The signal adjustment parameters may include, but are not limited to, at least one of the following: signal energy intensity, signal duration, and the like. The signal adjustment parameters are used to adjust the fault signal. Signal energy intensity is used to determine the energy intensity of the fault signal. Signal duration is used to determine the duration of the fault signal.

[0063] Specifically, the fault injection parameters are adjusted based on the link signal. More specifically, the link signal is analyzed, and the fault injection parameters are adjusted based on the analysis result.

[0064] In one embodiment, a combined analysis is performed on the link signals, and a trigger signal is determined based on the analysis result; and a fault injection parameter is adjusted based on the trigger signal.

[0065] In one embodiment, if there is only one target device and a problem exists with that target device, such as an insurmountable obstacle, then the link signal cannot be acquired, and thus the fault injection parameters cannot be determined. Based on this, the number of target devices can be multiple. This allows the link signal to be acquired even when a problem exists with a single target device, thus achieving multi-point sniffing and ensuring that fault injection analysis can still be performed. Furthermore, if there are multiple link signals, a combined analysis of the link signals is performed to determine the fault injection parameters based on the combined analysis results.

[0066] Here, the fault signal is used to change the operating data of the device to be analyzed to achieve the desired analysis purpose as much as possible. In one embodiment, the fault signal is used to change the operating environment parameters of the device to be analyzed; the operating environment parameters may include but are not limited to: voltage, current, temperature, electromagnetic, light, etc.

[0067] Specifically, a signal adjustment parameter indicated by a fault injection parameter is used to determine a fault signal.

[0068] In one embodiment, the fault signal is an electromagnetic signal, that is, an electromagnetic fault injection analysis method is used to perform fault analysis on the device to be analyzed.

[0069] Step 130: Inject the fault signal into the device to be analyzed based on the injection time point indicated by the fault injection parameter.

[0070] Here, the injection time point is used to represent the injection time of the fault signal.

[0071] Specifically, the fault signal is applied to the device to be analyzed, thereby affecting the output operating data of the device to be analyzed. In other words, the fault signal is applied to the device to be analyzed to change the operating data of the device to be analyzed so as to achieve the expected analysis purpose as much as possible.

[0072] Step 140: Acquire first operating data of the device to be analyzed in a fault injection state, and perform fault injection analysis on the device to be analyzed based on the first operating data.

[0073] Here, the first operating data is operating data affected by the fault signal. The first operating data may include, but is not limited to, voltage, current, temperature, electromagnetic, light, etc. An operating curve, such as a power consumption curve, may be determined based on the first operating data.

[0074] In a specific embodiment, in order to obtain the first operating data, it is necessary to connect the device to be analyzed to the target device. For example, if the device to be analyzed is an IoT device, such as an air purifier, and at least one target device includes a control terminal device, such as a smartphone, then after connecting the air purifier to the smartphone, the smartphone can send an encrypted instruction of the humidity setting instruction to the air purifier, and the air purifier can decrypt the received encrypted instruction, thereby executing the operation corresponding to the decrypted humidity setting instruction, encrypting the feedback information to obtain an encrypted feedback instruction, and then sending the encrypted feedback instruction to the smartphone. Based on this, the first operating data can be obtained, including the operating data of the decrypted instruction of the humidity setting instruction, the operating data of executing the humidity setting instruction, and the operating data of the encrypted feedback information.

[0075] In one embodiment, considering that not all data in the first operating data need to be subjected to security analysis, based on this, the data to be analyzed is determined from the first operating data based on the injection time point; and based on the data to be analyzed, a fault injection analysis is performed on the device to be analyzed. The data to be analyzed is the data to be subjected to fault injection analysis, that is, the data to be subjected to security analysis. It should be noted that the fault signal only affects the operating data after the injection time point in the first operating data, and the affected operating data is the data to be analyzed. It can be understood that based on the injection time point, the data to be analyzed can be accurately determined, thereby improving the accuracy of the security analysis; at the same time, there is no need to perform security analysis on all data in the first operating data, thereby improving the efficiency of the security analysis.

[0076] It is understandable that performing fault injection analysis on the device to be analyzed based on the first operating data can reduce complex signal interference of the device to be analyzed compared to performing safety analysis based on the second operating data of the device to be analyzed in a state without fault injection.

[0077] In one embodiment, if it is determined that the first operating data does not meet the preset requirement, the process returns to step 110 .

[0078] In another embodiment, it is determined that the first operating data does not meet the preset requirement, the fault injection parameters are adjusted, and the process returns to step 130 .

[0079] The fault injection analysis method provided by the embodiment of the present invention obtains a link signal between the device to be analyzed and at least one target device to determine a fault injection parameter based on the link signal. Compared with determining the fault injection parameter based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can adjust the fault injection parameter more accurately, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; at the same time, the injection time point can be determined more accurately, so that based on the injection time point indicated by the fault injection parameter, the fault signal can be more accurately injected into the device to be analyzed, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; in addition, by performing fault injection analysis on the device to be analyzed based on the first operating data of the device to be analyzed in the fault injection state, compared with performing safety analysis based on the second operating data of the device to be analyzed in the non-fault injection state, the embodiment of the present invention can reduce complex signal interference of the device to be analyzed, thereby improving the accuracy of the safety analysis.

[0080] Based on the above embodiment, in the method, in the above step 140, performing fault injection analysis on the device to be analyzed based on the first operating data includes:

[0081] Determining that the first operating data does not meet the preset requirements, returning to the step of obtaining a link signal between the device to be analyzed and at least one target device;

[0082] It is determined that the first operating data meets preset requirements, and a fault injection analysis is performed on the device to be analyzed based on the first operating data that meets the preset requirements.

[0083] Here, the preset requirements are used to characterize whether the fault injection is effective. Specifically, the first operating data is analyzed, and based on the analysis results, it is determined whether it meets the preset requirements. It is understood that the first operating data that meets the preset requirements has typical data characteristics.

[0084] It should be noted that if the first operating data does not meet the preset requirements, the process returns to step 110, and the above steps 110, 120, 130, and 140 are continuously executed to continuously implement fault injection, and the fault injection parameters are continuously adjusted in sequence until the first operating data meets the preset requirements, that is, until an effective fault injection effect is obtained.

[0085] In a specific embodiment, if it is determined that the first operating data does not meet the preset requirement, the process returns to step 110 and causes the device to be analyzed to execute the same operating content as the previous fault injection process.

[0086] The fault injection analysis method provided by the embodiment of the present invention, through the above-mentioned method, can continuously implement fault injection and continuously adjust fault injection parameters until the first operating data meets the preset requirements if the first operating data does not meet the preset requirements, thereby more accurately adjusting the fault injection parameters, further improving the accuracy and effectiveness of fault injection, and thus further improving the accuracy of safety analysis; at the same time, the injection time point can be more accurately determined to ultimately obtain the optimal injection time point, thereby further improving the accuracy and effectiveness of fault injection, and thus further improving the accuracy of safety analysis; in addition, by performing fault injection analysis on the device to be analyzed based on the first operating data that meets the preset requirements, the embodiment of the present invention can further improve the accuracy of safety analysis compared to performing a single fault injection analysis.

[0087] Based on any of the above embodiments, considering that not all data in the first operating data requires security analysis, in this method, performing fault injection analysis on the device to be analyzed based on the first operating data that meets the preset requirements includes:

[0088] Based on the injection time point, determining data to be analyzed from the first operating data that meets the preset requirements;

[0089] Based on the data to be analyzed, a fault injection analysis is performed on the device to be analyzed.

[0090] Here, the data to be analyzed is data to be subjected to fault injection analysis, that is, data to be subjected to security analysis, and is a portion of the first operating data that meets preset requirements.

[0091] It should be noted that the fault signal only affects the operating data after the injection time point in the first operating data, and the affected operating data is the data to be analyzed.

[0092] The fault injection analysis method provided by the embodiment of the present invention can accurately determine the data to be analyzed based on the injection time point through the above-mentioned method, thereby further improving the accuracy of the security analysis; at the same time, there is no need to perform security analysis on all data of the first operating data, thereby improving the efficiency of the security analysis.

[0093] Based on any of the foregoing embodiments, when the data to be analyzed is ciphertext data, performing fault injection analysis on the device to be analyzed based on the data to be analyzed includes:

[0094] Acquire second operating data of the device to be analyzed in a non-fault injection state, where the second operating data and the first operating data are data corresponding to the same operating content at different times;

[0095] Based on the data to be analyzed and the second operating data, a fault injection analysis is performed on the device to be analyzed.

[0096] Here, the second operating data is operating data not affected by the fault signal. The second operating data may include, but is not limited to, voltage, current, temperature, electromagnetic, light, etc. An operating curve, such as a power consumption curve, may be determined based on the second operating data.

[0097] Specifically, a mathematical model analysis is performed on the data to be analyzed and the second operating data, and a key of the ciphertext data is determined based on the analysis result to implement fault injection analysis and security analysis.

[0098] In a specific embodiment, the data to be analyzed and the second running data are analyzed by using a differential fault injection analysis method, and the key of the ciphertext data can be cracked.

[0099] It should be noted that in the field of cryptography, the purpose of security analysis is to analyze the cryptographic operation process of the device to be analyzed and, by cracking the cryptographic operation key, to crack the protocol, algorithm, and transmitted information. However, the signal complexity of the device to be analyzed is high, and it is impossible to accurately locate the signal of the device to be analyzed, which poses a significant obstacle to cryptographic security analysis. At the same time, when the execution time of the cryptographic operation is very short, it is difficult to locate relatively accurate interval data in its second operation data, which poses a significant obstacle to cryptographic security analysis. Based on this, the fault signal only affects the ciphertext data in the first operation data after the injection time point, and the affected ciphertext data is the data to be analyzed, that is, the data to be cracked.

[0100] The fault injection analysis method provided by the embodiment of the present invention obtains the link signal between the device to be analyzed and at least one target device in the field of cryptography through the above-mentioned method, and determines the fault injection parameter based on the link signal. Compared with determining the fault injection parameter based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can more accurately adjust the fault injection parameter, thereby improving the accuracy and effectiveness of the fault injection, thereby improving the accuracy of the security analysis; at the same time, the injection time point can be more accurately determined, so that based on the injection time point indicated by the fault injection parameter, the fault signal can be more accurately injected into the device to be analyzed, thereby improving the accuracy and effectiveness of the fault injection, thereby improving the accuracy of the security analysis; in addition, the fault injection analysis of the device to be analyzed based on the first operating data of the device to be analyzed in the fault injection state can reduce the complex signal interference of the device to be analyzed, thereby improving the accuracy of the security analysis, compared with performing security analysis based on the second operating data of the device to be analyzed in the non-fault injection state. In summary, the embodiment of the present invention can solve the problem that the signal complexity of the device to be analyzed is high and the signal of the device to be analyzed cannot be accurately located, thereby causing a great obstacle to the security analysis of cryptography.

[0101] Based on any of the above embodiments, the at least one target device includes a control end device, and the control end device is used to control the device to be analyzed. In the above step 120, determining the fault injection parameter based on the link signal includes:

[0102] Obtaining an operation signal of the control terminal device;

[0103] A fault injection parameter is determined based on the link signal and the operation signal.

[0104] Here, the operation signal is a signal corresponding to the operation to be analyzed, for example, the signal transmission of the device switching operation needs to be analyzed. Based on this, the operation signal is a signal related to the device switching operation.

[0105] Specifically, the fault injection parameters are adjusted based on the link signal and the operation signal. More specifically, the link signal and the operation signal are analyzed, and the fault injection parameters are adjusted based on the analysis results.

[0106] In one embodiment, a combined analysis is performed on the link signal and the operation signal, and a trigger signal is determined based on the analysis result; and a fault injection parameter is adjusted based on the trigger signal.

[0107] In one embodiment, the control terminal device is a smart phone, and a control APP corresponding to the device to be analyzed is deployed on the smart phone.

[0108] The fault injection analysis method provided by an embodiment of the present invention obtains an operating signal of the control-end device when at least one target device includes a control-end device, so as to determine fault injection parameters based on the link signal and the operating signal. Compared with determining the fault injection parameters based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can more accurately adjust the fault injection parameters, thereby further improving the accuracy and effectiveness of the fault injection, and further improving the accuracy of the security analysis.

[0109] Based on any of the above embodiments, Figure 2 This is a second flow chart of the fault injection analysis method provided by an embodiment of the present invention. Figure 2 As shown, the injection time point is determined based on the following steps:

[0110] Step 210: Acquire third operating data of the device to be analyzed, where the third operating data and the first operating data are data corresponding to the same operating content at different times.

[0111] Here, the third operating data is the operating data at the current moment. The third operating data can be operating data in a non-fault injection state, i.e., the current fault injection round is the first round; the third operating data can also be operating data in a fault injection state, i.e., operating data in a previous fault injection round under the fault injection state.

[0112] The third operating data may include, but is not limited to, voltage, current, temperature, electromagnetic, light, etc. An operating curve, such as a power consumption curve, may be determined based on the third operating data.

[0113] Step 220: Determine the injection time point based on the link signal and the third operation data.

[0114] Specifically, the third operating data is located based on the link signal, and the injection time point is determined based on the location results. It is understandable that the third operating data at this time contains a large amount of interference signals, making it relatively ambiguous. Based on this, fuzzy location is first performed, and then fault injection is continuously performed to achieve precise location, thereby more accurately determining the injection time point.

[0115] In one embodiment, if there is only one target device and it encounters a problem, such as an insurmountable obstacle, then the link signal cannot be obtained, and thus the fault injection parameters cannot be determined. Therefore, the number of target devices can be multiple. This allows the link signal to be obtained even when a problem exists on a single target device, thus achieving multi-point sniffing and ensuring that the injection time point can still be determined.

[0116] In one embodiment, at least one target device includes a control device, which is used to control the device to be analyzed. Based on this, an operating signal of the control device can also be obtained; and the injection time point can be determined based on the link signal, the operating signal, and the third operating data.

[0117] The operation signal is a signal corresponding to the operation to be analyzed, for example, the signal transmission of the device switch operation needs to be analyzed. Based on this, the operation signal is a signal related to the device switch operation.

[0118] Specifically, the third operation data is positioned based on the link signal and the operation signal, and the injection time point is determined based on the positioning result.

[0119] In one embodiment, the control terminal device is a smart phone, and a control APP corresponding to the device to be analyzed is deployed on the smart phone.

[0120] It can be understood that when at least one target device includes a control-end device, the operating signal of the control-end device is obtained to determine the injection time point based on the link signal and the operating signal. Compared with determining the injection time point based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can adjust the injection time point more accurately, thereby further improving the accuracy and effectiveness of fault injection, and further improving the accuracy of security analysis.

[0121] The fault injection analysis method provided by an embodiment of the present invention obtains third operating data of the device to be analyzed to determine the injection time point based on the link signal and the third operating data. Compared with determining the injection time point based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can more accurately adjust the injection time point, thereby improving the accuracy and effectiveness of fault injection, and further improving the accuracy of safety analysis.

[0122] Based on any of the above embodiments, the at least one target device includes a control terminal device and a cloud device, and the control terminal device is used to control the device to be analyzed;

[0123] The link signals include a link signal between the device to be analyzed and the control end device, a link signal between the device to be analyzed and the cloud device, and a link signal between the control end device and the cloud device.

[0124] Here, there is a communication link between the device to be analyzed and the control end device, a communication link between the device to be analyzed and the cloud device, and a communication link between the control end device and the cloud device.

[0125] In one embodiment, the control terminal device is a smart phone, and a control APP corresponding to the device to be analyzed is deployed on the smart phone.

[0126] Here, the cloud device is the cloud server corresponding to the device to be analyzed.

[0127] The fault injection analysis method provided by the embodiment of the present invention comprises link signals including link signals between the device to be analyzed and the control-end device, link signals between the device to be analyzed and the cloud device, and link signals between the control-end device and the cloud device, thereby realizing multi-point sniffing. Compared with determining the fault injection parameters based solely on the operating signals of the device to be analyzed, the embodiment of the present invention can adjust the fault injection parameters more accurately, thereby further improving the accuracy and effectiveness of the fault injection, thereby further improving the accuracy of the security analysis; at the same time, the injection time point can be determined more accurately, so that based on the injection time point indicated by the fault injection parameters, the fault signal can be more accurately injected into the device to be analyzed, thereby further improving the accuracy and effectiveness of the fault injection, thereby further improving the accuracy of the security analysis.

[0128] The fault injection analysis device provided by the present invention is described below. The fault injection analysis device described below and the fault injection analysis method described above can be referenced to each other.

[0129] Figure 3 FIG. 1 is a schematic diagram of the structure of a fault injection analysis device provided by an embodiment of the present invention. Figure 3 As shown, the fault injection analysis device includes:

[0130] A signal acquisition module 310 is configured to acquire a link signal between the device to be analyzed and at least one target device, the target device being in communication with the device to be analyzed;

[0131] a signal determination module 320, configured to determine a fault injection parameter based on the link signal, and determine a fault signal based on the fault injection parameter;

[0132] A signal injection module 330 is configured to inject the fault signal into the device to be analyzed based on the injection time point indicated by the fault injection parameter;

[0133] The fault analysis module 340 is configured to obtain first operating data of the device to be analyzed in a fault injection state, and perform fault injection analysis on the device to be analyzed based on the first operating data.

[0134] The fault injection analysis device provided by the embodiment of the present invention obtains a link signal between a device to be analyzed and at least one target device to determine a fault injection parameter based on the link signal. Compared with determining the fault injection parameter based solely on the operating signal of the device to be analyzed, the embodiment of the present invention can adjust the fault injection parameter more accurately, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; at the same time, the injection time point can be determined more accurately, so that based on the injection time point indicated by the fault injection parameter, the fault signal can be more accurately injected into the device to be analyzed, thereby improving the accuracy and effectiveness of the fault injection, and thus improving the accuracy of the safety analysis; in addition, by performing fault injection analysis on the device to be analyzed based on the first operating data of the device to be analyzed in a fault injection state, compared with performing safety analysis based on the second operating data of the device to be analyzed in a non-fault injection state, the embodiment of the present invention can reduce complex signal interference of the device to be analyzed, thereby improving the accuracy of the safety analysis.

[0135] Based on any of the above embodiments, the fault analysis module 340 includes:

[0136] a step returning unit, configured to determine that the first operating data does not meet a preset requirement and return to the step of obtaining a link signal between the device to be analyzed and at least one target device;

[0137] The fault analysis unit is configured to determine whether the first operating data meets preset requirements, and perform fault injection analysis on the device to be analyzed based on the first operating data meeting the preset requirements.

[0138] Based on any of the above embodiments, the fault analysis unit is further configured to:

[0139] Based on the injection time point, determining data to be analyzed from the first operating data that meets the preset requirements;

[0140] Based on the data to be analyzed, a fault injection analysis is performed on the device to be analyzed.

[0141] Based on any of the above embodiments, when the data to be analyzed is ciphertext data, the fault analysis unit is further configured to:

[0142] Acquire second operating data of the device to be analyzed in a non-fault injection state, where the second operating data and the first operating data are data corresponding to the same operating content at different times;

[0143] Based on the data to be analyzed and the second operating data, a fault injection analysis is performed on the device to be analyzed.

[0144] Based on any of the above embodiments, the at least one target device includes a control terminal device, and the control terminal device is used to control the device to be analyzed; the signal determination module 320 includes:

[0145] A signal acquisition unit, configured to acquire an operation signal of the control terminal device;

[0146] A parameter determination unit is configured to determine a fault injection parameter based on the link signal and the operation signal.

[0147] Based on any of the above embodiments, the signal determination module 320 includes:

[0148] a data acquisition unit, configured to acquire third operating data of the device to be analyzed, wherein the third operating data and the first operating data are data corresponding to the same operating content at different times;

[0149] A time determination unit is used to determine the injection time point based on the link signal and the third operation data.

[0150] Based on any of the above embodiments, the at least one target device includes a control terminal device and a cloud device, and the control terminal device is used to control the device to be analyzed;

[0151] The link signals include a link signal between the device to be analyzed and the control end device, a link signal between the device to be analyzed and the cloud device, and a link signal between the control end device and the cloud device.

[0152] Figure 4 An example of a physical structure diagram of an electronic device is shown below. Figure 4As shown, the electronic device may include: a processor 410, a communication interface 420, a memory 430, and a communication bus 440, wherein the processor 410, the communication interface 420, and the memory 430 communicate with each other via the communication bus 440. The processor 410 may call the logic instructions in the memory 430 to execute a fault injection analysis method, which includes: obtaining a link signal between a device to be analyzed and at least one target device, wherein the target device is in communication connection with the device to be analyzed; determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter; injecting the fault signal into the device to be analyzed based on an injection time point indicated by the fault injection parameter; obtaining first operating data of the device to be analyzed in a fault injection state, and performing fault injection analysis on the device to be analyzed based on the first operating data.

[0153] In addition, the logic instructions in the above-mentioned memory 430 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0154] On the other hand, the present invention also provides a computer program product, which includes a computer program, which can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the fault injection analysis method provided by the above methods, which includes: obtaining a link signal between the device to be analyzed and at least one target device, wherein the target device is communicatively connected to the device to be analyzed; determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter; injecting the fault signal into the device to be analyzed based on the injection time point indicated by the fault injection parameter; obtaining first operating data of the device to be analyzed in the fault injection state, and performing fault injection analysis on the device to be analyzed based on the first operating data.

[0155] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the fault injection analysis method provided by the above-mentioned methods, the method comprising: obtaining a link signal between a device to be analyzed and at least one target device, the target device being communicatively connected to the device to be analyzed; determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter; injecting the fault signal into the device to be analyzed based on an injection time point indicated by the fault injection parameter; obtaining first operating data of the device to be analyzed in a fault injection state, and performing fault injection analysis on the device to be analyzed based on the first operating data.

[0156] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0157] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, or of course, by hardware. Based on this understanding, the essence of the above technical solution or the part that contributes to the existing technology can be embodied in the form of a software product. The computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or certain parts of the embodiments.

[0158] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

[0159] The above embodiments are intended to illustrate the present invention only and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the embodiments, it should be understood by those skilled in the art that various combinations, modifications, or equivalent substitutions of the technical solutions of the present invention do not depart from the spirit and scope of the technical solutions of the present invention and should be encompassed by the scope of the claims of the present invention.

Claims

1. A fault injection analysis method, characterized in that: include: Acquiring a link signal between the device to be analyzed and at least one target device, the target device being in communication with the device to be analyzed; determining a fault injection parameter based on the link signal, and determining a fault signal based on the fault injection parameter; Injecting the fault signal into the device to be analyzed based on the injection time point indicated by the fault injection parameter; Acquiring first operating data of the device to be analyzed in a fault injection state, and performing fault injection analysis on the device to be analyzed based on the first operating data; The performing fault injection analysis on the device to be analyzed based on the first operating data includes: determining data to be analyzed from the first operating data based on the injection time point; Performing fault injection analysis on the device to be analyzed based on the data to be analyzed; In a case where the data to be analyzed is ciphertext data, the performing fault injection analysis on the device to be analyzed based on the data to be analyzed includes: Acquire second operating data of the device to be analyzed in a non-fault injection state, where the second operating data and the first operating data are data corresponding to the same operating content at different times; Based on the data to be analyzed and the second operating data, a fault injection analysis is performed on the device to be analyzed.

2. The fault injection analysis method according to claim 1, characterized in that: The performing fault injection analysis on the device to be analyzed based on the first operating data includes: Determining that the first operating data does not meet the preset requirements, returning to the step of obtaining a link signal between the device to be analyzed and at least one target device; It is determined that the first operating data meets preset requirements, and a fault injection analysis is performed on the device to be analyzed based on the first operating data that meets the preset requirements.

3. The fault injection analysis method according to claim 2, characterized in that: The performing fault injection analysis on the device to be analyzed based on the first operating data that meets the preset requirements includes: Based on the injection time point, determining data to be analyzed from the first operating data that meets the preset requirements; Based on the data to be analyzed, a fault injection analysis is performed on the device to be analyzed.

4. The fault injection analysis method according to claim 1, characterized in that: The at least one target device includes a control terminal device, and the control terminal device is used to control the device to be analyzed; The determining of a fault injection parameter based on the link signal includes: Obtaining an operation signal of the control terminal device; A fault injection parameter is determined based on the link signal and the operation signal.

5. The fault injection analysis method according to claim 1, characterized in that: The injection time point is determined based on the following steps: Acquire third operating data of the device to be analyzed, where the third operating data and the first operating data are data corresponding to the same operating content at different times; The injection time point is determined based on the link signal and the third operating data.

6. The fault injection analysis method according to claim 1, characterized in that: The at least one target device includes a control terminal device and a cloud device, and the control terminal device is used to control the device to be analyzed; The link signals include a link signal between the device to be analyzed and the control end device, a link signal between the device to be analyzed and the cloud device, and a link signal between the control end device and the cloud device.

7. A fault injection analysis device, characterized in that: include: a signal acquisition module, configured to acquire a link signal between the device to be analyzed and at least one target device, the target device being in communication with the device to be analyzed; a signal determination module, configured to determine a fault injection parameter based on the link signal, and determine a fault signal based on the fault injection parameter; A signal injection module, configured to inject the fault signal into the device to be analyzed based on an injection time point indicated by the fault injection parameter; a fault analysis module, configured to obtain first operating data of the device to be analyzed in a fault injection state, and perform fault injection analysis on the device to be analyzed based on the first operating data; The performing fault injection analysis on the device to be analyzed based on the first operating data includes: determining data to be analyzed from the first operating data based on the injection time point; Performing fault injection analysis on the device to be analyzed based on the data to be analyzed; In a case where the data to be analyzed is ciphertext data, the performing fault injection analysis on the device to be analyzed based on the data to be analyzed includes: Acquire second operating data of the device to be analyzed in a non-fault injection state, where the second operating data and the first operating data are data corresponding to the same operating content at different times; Based on the data to be analyzed and the second operating data, a fault injection analysis is performed on the device to be analyzed.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the fault injection analysis method according to any one of claims 1 to 6 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the fault injection analysis method according to any one of claims 1 to 6 is implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the fault injection analysis method according to any one of claims 1 to 6 is implemented.

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