A test apparatus and method for a COM Express computer module

Abstract

The application provides a test device of a distributed COM Express computer module, which comprises a double COM Express connector and an FPGA module connection, an FPGA module peripheral interface circuit module, a specification selection circuit module and a start-up circuit module; the double COM Express connector receives a start-up signal; the FPGA module performs pin adaptation according to the configuration state of an external dial switch, and the double COM Express connector outputs the start-up signal to the COM Express computer; the specification selection circuit module determines the pin distribution specification of the COM Express computer module by state selection; the start-up circuit module inputs the start-up signal into the FPGA module by a self-recovery switch button; the peripheral interface circuit module outputs a signal after pin adaptation of the FPGA module, converts a standard interface by mounting an interface controller of different buses, verifies the functional characteristics of the standard interface, and thus obtains test data of the COM Express computer module. The application is powered by an ATX power supply + 5VStandBy for each module, and realizes pin adaptation before the start of the COM Express computer module and the peripheral interface circuit.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of testing COM Express computer modules, and in particular to a testing device for COM Express computer modules. The present application also relates to a testing method for COM Express computer modules. BACKGROUND

[0002] COM Express is a computer module standard defined by PICMG (PCI Industry Computer Manufacture Group). COM Express modules are highly integrated computer modules that implement functional interface extensions through custom carrier boards. COM Express modules are particularly suitable for implementing custom industrial computer solutions and are suitable for use when standard single-board computers are not suitable due to structure or lack of extensibility. COM Express computer modules have various pin assignment specifications, such as Type1- Type10.

[0003] Because the power supply simultaneously supplies power to all circuits on the COM Express computer module and the testing device of the present application, the COM Express computer module may complete the initialization process before the FPGA module completes pin adaptation. This may result in the COM Express computer module failing to recognize the peripheral interface circuit, and may even cause a short circuit and damage the COM Express computer module and the testing device circuit due to the default pin specification of the FPGA module and the non-identical specification of the COM Express computer module being tested. SUMMARY

[0004] To solve one or more problems presented in the background, the present application provides a testing device for COM Express computer modules. The present application also relates to a testing method for COM Express computer modules.

[0005] The testing device for COM Express computer modules provided by the present application includes a dual COM Express connector, an FPGA module, a specification selection circuit module, a power-on circuit module, and a peripheral interface circuit module.

[0006] The dual COM Express connector and the FPGA module are bidirectionally connected, and the FPGA module is connected to the peripheral interface circuit module, the specification selection circuit module, and the power-on circuit module.

[0007] The dual COM Express connector is configured to receive a power-on signal.

[0008] The FPGA module is configured to monitor a start-up signal, perform pin adaptation according to a configuration state of an external dial switch, and output the start-up signal to a COM Express computer through a double COM Express connector after the pin adaptation.

[0009] The specification selection circuit module is configured to determine a pin distribution specification of the COM Express computer module through state selection.

[0010] The start-up circuit module is configured to input the start-up signal into the FPGA module through a self-recovery switch button.

[0011] The peripheral interface circuit module is configured to receive an output signal after the pin adaptation of the FPGA module, convert a standard interface through an interface controller mounted with different buses, and obtain test data of the COM Express computer module by verifying the functional characteristics of the standard interface.

[0012] Optionally, the application further comprises an ATX power supply.

[0013] The ATX power supply is configured to provide a +12V voltage for a main circuit of the COM Express computer module, provide a +5V standby voltage for the FPGA module, the specification selection circuit module, the start-up circuit module and a start-up circuit of the COM Express computer module, and provide +12V, +5V and +3.3V voltages for the peripheral interface circuit module.

[0014] Optionally, the double COM Express connector adopts a high-density 2*110Pin connector.

[0015] Optionally, the double COM Express connector comprises:

[0016] A connector comprises COM Express computer Row A and Row B signal definitions.

[0017] A B connector comprises COM Express computer Row C and Row D signal definitions.

[0018] Optionally, the FPGA module is connected with the peripheral interface circuit module, the specification selection circuit module and the start-up circuit module, and the FPGA module is unidirectionally connected with the peripheral interface circuit module, the specification selection circuit module and the start-up circuit module.

[0019] Optionally, the FPGA module comprises an FPGA chip.

[0020] The FPGA chip contains a specification distinguishing unit and a pin adaptation unit, which is used to distinguish the collected configuration data of the specification selection circuit module, and then start the pin adaptation mechanism corresponding to the configuration data.

[0021] Optionally, the FPGA module further comprises a clock circuit and a reset circuit.

[0022] Optionally, the specification selection circuit module is used to realize 16 state selections through a 4-way DIP switch, and determine 16 COM Express computer module pin assignment specifications.

[0023] The application also provides a test method of the assigned COM Express computer module, comprising:

[0024] receiving a boot signal;

[0025] According to the configuration state of the external DIP switch, the pin adaptation is performed, and the boot signal is output to the COM Express computer;

[0026] Through state selection, the pin assignment specification is determined;

[0027] According to the lead-out signal, a standard interface is converted through an interface controller mounted with different buses, and test data of the COM Express computer module is obtained by verifying the functional characteristics of the standard interface.

[0028] Optionally, the pin assignment specification comprises distinguishing the collected configuration data, and then starting the pin adaptation mechanism corresponding to the configuration data.

[0029] Compared with the prior art, the application has the following advantages:

[0030] The application provides a test device of a distributed COM Express computer module, which comprises a double COM Express connector, an FPGA module, a specification selection circuit module, a starting circuit module and a peripheral interface circuit module; the double COM Express connector is bidirectionally connected with the FPGA module; the FPGA module is connected with the peripheral interface circuit module, the specification selection circuit module and the starting circuit module; the double COM Express connector is used for receiving a starting signal; the FPGA module is used for monitoring the starting signal, performing pin adaptation according to the configuration state of an external dial switch, and outputting the starting signal to the COM Express computer through the double COM Express connector after the pin adaptation; the specification selection circuit module is used for determining the pin distribution specification of the COM Express computer module through state selection; the starting circuit module is used for inputting the starting signal into the FPGA module through a self-recovery switch button; and the peripheral interface circuit module is used for receiving the signal led out after the pin adaptation of the FPGA module, converting a standard interface through a mounted interface controller of different buses, and obtaining the test data of the COM Express computer module by verifying the functional characteristics of the standard interface. The application realizes the pin adaptation before the start of the COM Express computer module and the peripheral interface circuit by using an ATX power supply + 5V StandBy to supply power to the FPGA module, the specification selection circuit module and the starting circuit module. BRIEF DESCRIPTION OF DRAWINGS

[0031] Figure 1 Fig. 1 is a schematic diagram of a test device of a distributed COM Express computer module in the application.

[0032] Figure 2 Fig. 2 is a schematic diagram of a test principle of a distributed COM Express computer module in the application.

[0033] Figure 3 Fig. 3 is a schematic diagram of a test flow of a distributed COM Express computer module in the application. DETAILED DESCRIPTION

[0034] The following are examples of the specific implementation process provided for the technical solution to be protected in the application, but the application can also be implemented in other ways different from the description, and those skilled in the art can implement the application by using different technical means under the guidance of the concept of the application, so the application is not limited by the following specific examples.

[0035] The application provides a test device of a distributed COM Express computer module, which comprises a double COM Express connector, an FPGA module, a specification selection circuit module, a starting circuit module and a peripheral interface circuit module.

[0036] Figure 1 Figure 1 is a schematic diagram of the test device of the distributed COM Express computer module in the application.

[0037] Please refer to Figure 1 Figure 1, the test device comprises a double COM Express connector 101, an ATX power supply 102, an FPGA module 103, a specification selection circuit module 104, a starting circuit module 105 and a peripheral interface circuit module 106.

[0038] The COM Express connector 101 and the FPGA module 103 are bidirectionally connected, the COM Express computer module leads all buses and signals to the FPGA module 103 through the COM Express connector 101, and the FPGA module 103 outputs the computer starting signal to the COM Express computer module through the COM Express connector 101.

[0039] The FPGA module 103 and the peripheral interface circuit module 106 are unidirectionally connected, and the FPGA module 103 leads buses and signals to the peripheral interface circuit module 106 after pin adaptation.

[0040] FPGA module 103 is connected with specification selection circuit module 104 unidirectionally, FPGA module 103 reads the state of specification selection circuit module 104.

[0041] FPGA module 103 is connected with start-up circuit module 105 unidirectionally, FPGA module 103 monitors the start-up signal of start-up circuit module 105.

[0042] COM Express connector 101 adopts high-density 2*110Pin connector, determines COM.0Rev3.0 standard, A connector contains COM Express computer Row A and Row B signal definition, B connector contains COM Express computer Row C and Row D signal definition.

[0043] ATX power supply 102 determines ATX standard, provides +12V voltage for COM Express computer module main circuit respectively, provides +5V standby voltage for FPGA module 103, specification selection circuit module 104, start-up circuit module 105 and COM Express computer module start-up circuit, and provides +12V, +5V, +3.3V voltage for peripheral interface circuit module 106. COM Express computer module provides PS-ON signal for ATX power supply 102.

[0044] The application adopts the sub-module power supply mode, effectively solves the following problems: the power supply simultaneously supplies power for COM Express computer module and all circuits on the test device of the application, and COM Express computer module completes initialization process in the case that FPGA module 103 has not completed pin adaptation. This will cause COM Express computer module to be unable to identify the result of peripheral interface circuit, and even cause short circuit and damage COM Express computer module and test device circuit due to the default configuration of pin specification of FPGA module 103 and the non-same specification of the COM Express computer module currently tested. Because of the ATX standard power supply characteristics: +5V StandBy voltage is output in advance of other voltages (12V, 5V, 3.3V), the application adopts ATX power supply 102 +5V StandBy to supply power for FPGA module 103, specification selection circuit module 104 and start-up circuit module 105, and realizes the completion of pin adaptation before the start of COM Express computer module and peripheral interface circuit.

[0045] FPGA module 103 contains FPGA chip, clock circuit and reset circuit. FPGA chip mainly contains specification identification module and pin adaptation module, which is responsible for identifying the configuration data collected by specification selection circuit module 104, and then starting the corresponding pin adaptation mechanism.

[0046] Specification selection circuit module 104 realizes 16 state selection through 4-way DIP switch, which can determine 16 COM Express computer module pin assignment specifications.

[0047] Boot circuit module 105 inputs the Power Button boot signal into FPGA module 103 by using a self-recovery switch button.

[0048] Peripheral interface circuit module 106 receives the bus and signal output by the pin adaptation of FPGA module 103, converts the standard interface through the interface controller mounted with different buses, and the operator obtains the test data of COM Express computer module by verifying the functional characteristics of the standard interface.

[0049] As shown in Figure 2 The working principle block diagram of FPGA chip includes the following contents, and is further described as follows:

[0050] After the FPGA chip monitors the Power Button boot signal of the external boot circuit, the specification identification module reads the configuration state of the external specification selection circuit module 104, the specification identification module sends the read configuration state to the pin adaptation module, and the pin adaptation module starts the corresponding pin assignment mechanism according to the configuration state. The above process realizes that the bus and signal output from COMExpress connector 101 are led to peripheral interface circuit module 106 according to the specification of COM Express computer.

[0051] The working process of the test device includes the following contents:

[0052] First step: the operator installs the COM Express computer module to be tested on the test device, and connects the ATX power supply 102. The +5V StandBy voltage of ATX power supply 102 supplies power to FPGA module 103, specification selection circuit module 104 and boot circuit module 105;

[0053] Second step: the operator selects the configuration mode of the dial switch of the specification selection circuit module 104 according to the pin assignment specification of the COM Express computer module to be tested. Taking the selection of four dial switches as an example, the configuration mode of 0001 can be set in the FPGA module 103 to start the COM Express computer module Type2 pin assignment specification mechanism, and the configuration mode of 0002 can be set in the FPGA module 103 to start the COM Express computer module Type6 pin assignment specification mechanism. After the specification selection is completed, press the power-on button switch;

[0054] Third step: the FPGA module 103 monitors the power-on signal and performs pin adaptation according to the configuration state of the external dial switch.

[0055] Fourth step: after the pin adaptation, the FPGA module 103 outputs the power-on signal to the COM Express computer through the COM Express connector 101;

[0056] Fifth step: after receiving the power-on signal, the COM Express computer starts the computer power-on mechanism, outputs the PS-ON low-level signal to the ATX power supply 102 through the COM Express connector 101, and the ATX power supply 102 outputs +12V, 5V and 3.3V voltages after receiving the PS-ON low-level signal. The +12V, 5V and 3.3V voltages supply power to the COM Express computer module and the peripheral interface circuit module 106, and the COM Express computer module works normally. After the computer is started, the operator performs test work under the operating system.

[0057] The device described in the present application is suitable for the test device and method of the COM Express computer module with different pin assignment specifications, which can effectively realize the debugging and testing work of COM Express computers with different pin assignments, support software upgrading, and determine the pin specifications of newly released COM Express computer modules in the later stage, thereby reducing the time and cost of building different test environments for hardware developers and testers.

[0058] The present application also relates to a test method of a COM Express computer module with different pin assignments, which realizes pin adaptation before the start of the COM Express computer module and the peripheral interface circuit by using the ATX power supply +5V StandBy to supply power to the FPGA module, the specification selection circuit module and the power-on circuit module.

[0059] Figure 3 FIG. 1 is a schematic diagram of the test process of the COM Express computer module with different pin assignments in the present application.

[0060] Please refer toFigure 3 S201 receives a start-up signal, as shown in the figure;

[0061] S202, according to the configuration state of the external dial switch, performs pin adaptation and outputs the start-up signal to the COM Express computer;

[0062] S203 determines the pin assignment specification through state selection;

[0063] S204, according to the lead-out signal, converts a standard interface through an interface controller mounted with different buses, and obtains the test data of the COM Express computer module by verifying the functional characteristics of the standard interface.

[0064] Further, the pin assignment specification includes discriminating the collected configuration data and then starting the pin adaptation mechanism corresponding to the configuration data.

[0065] Obviously, the above embodiments are merely examples for clear illustration, and are not intended to limit the embodiments. Based on the above description, other different forms of changes or variations can be made by those skilled in the art. Here, it is not necessary and impossible to enumerate all the embodiments. The obvious changes or variations derived therefrom are still within the protection scope of the present application.

Claims

1. A test apparatus for a COM Express computer module under test, characterized by, The application relates to a COM Express computer module and a peripheral interface circuit module. The ATX power supply is used for providing +12V voltage for a COM Express computer module main circuit, +5V standby voltage for an FPGA module, a specification selection circuit module, a startup circuit module and a COM Express computer module startup circuit, and +12V, +5V and +3.3V voltage for a peripheral interface circuit module. The double COM Express connector and the FPGA module are bidirectionally connected, the FPGA module is connected with the peripheral interface circuit module, the specification selection circuit module and the startup circuit module. The double COM Express connector is used for receiving a startup signal. The FPGA module is used for monitoring the startup signal, carrying out pin adaptation according to the configuration state of an external dial switch, and outputting the startup signal to the COM Express computer through the double COM Express connector after the pin adaptation. The startup circuit module is used for inputting the startup signal into the FPGA module through a self-recovery switch button. The specification selection circuit module is used for determining the pin distribution specification of the COM Express computer module through state selection. After the COM Express computer receives the startup signal, the computer startup mechanism is started, a PS-ON low-level signal is output to the ATX power supply through the COM Express connector, the ATX power supply receives the PS-ON low-level signal and outputs +12V, +5V and +3.3V voltage to supply power for the COM Express computer module and the peripheral interface circuit module. The FPGA module comprises an FPGA chip. The FPGA chip comprises a specification distinguishing unit and a pin adaptation unit, which are used for distinguishing the collected configuration data of the specification selection circuit module and then starting the pin adaptation mechanism corresponding to the configuration data.

2. The test apparatus for a COM Express computer module as recited in claim 1, wherein, The dual COM Express connector employs high density connectors.

3. The test apparatus for a COM Express computer module as recited in claim 1, wherein, The peripheral interface circuit module is used for receiving the output signal after the pin adaptation of the FPGA module, converting a standard interface through a mounted interface controller of different buses, verifying the function characteristics of the standard interface and thus obtaining the test data of the COM Express computer module. The double COM Express connector comprises: An A connector comprising COM Express computer RowA and RowB signal definitions; 4. The test apparatus for a COM Express computer module as recited in claim 1, wherein, A B connector comprising COM Express computer RowC and RowD signal definitions. The FPGA module is connected with the peripheral interface circuit module, the specification selection circuit module and the startup circuit module.

5. The test apparatus for a COM Express computer module as recited in claim 1, wherein, The FPGA module is unidirectionally connected with the peripheral interface circuit module, the specification selection circuit module and the startup circuit module. The FPGA module further comprises a clock circuit and a reset circuit.

6. The test apparatus for a COM Express computer module as recited in claim 1, wherein, The specification selection circuit module is used for realizing 16 state selections through a 4-way DIP switch and determining 16 COM Express computer module pin assignment specifications.

7. A method of testing a COM Express computer module under test, applied to the testing apparatus of any one of claims 1 to 6, characterized in that, The method comprises the following steps: receiving a start-up signal; according to the configuration state of an external DIP switch, performing pin adaptation and outputting the start-up signal to a COM Express computer; determining a pin assignment specification through state selection; according to the output signal, converting a standard interface through an interface controller mounted with different buses, and obtaining test data of the COM Express computer module by verifying the functional characteristics of the standard interface.

8. The method of testing a COM Express computer module as recited in claim 7, wherein, The method further comprises the following steps: discriminating the collected configuration data, and then starting a pin adaptation mechanism corresponding to the configuration data.

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