A method, device, medium and electronic device for extracting short-circuit test parameters

Abstract

The present invention discloses a method, device, medium and electronic device for extracting short-circuit test parameters. The method includes: determining a sampling sequence according to a current waveform read by an oscilloscope; converting the sampling sequence into a form of superposition of multiple complex exponential functions, determining a discrete function, and constructing a first Hankel matrix and a second Hankel matrix according to the sampling sequence; determining characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix and the second Hankel matrix, and determining short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for performing a short-circuit test.

Description

Technical Field

[0001] The present invention relates to the technical field of analysis and calculation of transformer short-circuit test current, and more specifically, to a method, device, medium and electronic device for extracting short-circuit test parameters. Background Art

[0002] The effective value of the symmetric short-circuit test current and the peak value of the asymmetric short-circuit current are two key indicators of the short-circuit test. It is of great significance to correctly extract parameters such as the peak value, effective value and DC component of the waveform. At present, the International Short-Circuit Test Liaison (STL) recommends using the three-peak method to calculate the effective value and the percentage of the DC component of the current waveform, which is adopted by each high-voltage and large-capacity test laboratory. This method requires at least three peak points. When the number of half-waves is less than 3, it is difficult to calculate accurate waveform characteristic parameters. The time resolution of the improved Fourier filtering algorithm is poor and it is only applicable to analyzing waveforms with a constant effective value of the fundamental component. When the AC component decays, it will cause certain errors in the calculation. At the same time, waveform analysis methods represented by the three-peak method and the Fourier filtering algorithm are also vulnerable to noise. When the short-circuit waveform contains Gaussian white noise, its analysis accuracy will be further reduced. Summary of the Invention

[0003] Aiming at the deficiencies of the prior art, the present invention provides a method, device, medium and electronic device for extracting short-circuit test parameters.

[0004] According to one aspect of the present invention, a method for extracting short-circuit test parameters is provided, including:

[0005] Determine a sampling sequence according to the current waveform read by an oscilloscope;

[0006] Convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine a discrete function, and construct a first Hankel matrix and a second Hankel matrix according to the sampling sequence;

[0007] Determine the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix and the second Hankel matrix, and determine the short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for conducting a short-circuit test.

[0008] Optionally, the operation of constructing the first Hankel matrix and the second Hankel matrix according to the sampling sequence includes:

[0009] Construct a first Hankel matrix according to the sampling sequence;

[0010] Replace each element in the first Hankel matrix with the next element of the element to determine the second Hankel matrix.

[0011] Optionally, the operation of determining the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix includes:

[0012] Determine the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix;

[0013] Determine the residue information of the sampling sequence according to the discrete function and the extreme points;

[0014] Determine the characteristic parameter information of the sampling sequence according to the extreme points and the residue information, and determine the characteristic parameter information of the sampling sequence.

[0015] Optionally, the calculation formula for determining the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix is as follows:

[0016] z i = Y1 + Y2

[0017] where Z i is the extreme point, Y1 + is the pseudo-inverse matrix of the first Hankel matrix, and Y2 is the second Hankel matrix.

[0018] Optionally, the operation of determining the residue information of the sampling sequence according to the discrete function and the extreme points includes:

[0019] Determine the modal order according to the constant threshold estimation method;

[0020] Determine the residue information according to the modal order, the extreme points, and the discrete function.

[0021] Optionally, the operation of determining the characteristic parameter information of the sampling sequence according to the extreme points and the residue information includes:

[0022] Determine the amplitude and phase according to the residue information;

[0023] Determine the attenuation factor and frequency according to the extreme points.

[0024] Optionally, the operation of determining the short-circuit test parameters of the short-circuit test according to the characteristic parameter information includes:

[0025] Determine the peak value and the effective value of the short-circuit test parameters according to the amplitude;

[0026] Determine the attenuation coefficient of the short-circuit test parameters according to the attenuation factor;

[0027] Determine the DC component of the short-circuit test parameters according to the frequency, the amplitude, and the phase.

[0028] According to another aspect of the present invention, there is provided an extraction device for short-circuit test parameters, including:

[0029] A first determination module, configured to determine a sampling sequence according to a current waveform read by an oscilloscope;

[0030] A second determination module, configured to convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine a discrete function, and construct a first Hankel matrix and a second Hankel matrix according to the sampling sequence;

[0031] A third determination module, configured to determine characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix, and determine short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for performing a short-circuit test.

[0032] According to another aspect of the present invention, there is provided a computer-readable storage medium storing a computer program for executing the method described in any of the above aspects of the present invention.

[0033] According to another aspect of the present invention, there is provided an electronic device including: a processor; a memory for storing executable instructions of the processor; the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method described in any of the above aspects of the present invention.

[0034] Therefore, in the method provided in this application, the sampling sequence is converted into a form of superposition of multiple complex exponential functions, a discrete function is determined, and a first Hankel matrix and a second Hankel matrix are constructed according to the sampling sequence; then, according to the discrete function, the first Hankel matrix, and the second Hankel matrix, the characteristic parameter information of the sampling sequence is determined. Thus, the characteristic parameter extraction method provided by the present invention is not affected by the number of half-waves and whether the effective value of the AC component is constant, and since the matrix pencil algorithm itself has the ability to denoise, the accuracy of the analysis result of the short-circuit waveform containing noise is relatively high, and it can adapt to various complex test environments. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] By referring to the following drawings, the exemplary embodiments of the present invention can be more fully understood:

[0036] Figure 1 is a schematic flowchart of a method for extracting short-circuit test parameters provided by an exemplary embodiment of the present invention;

[0037] Figure 2 is a comparison diagram of the analysis of the effective value of the AC component of an ideal short-circuit waveform by different methods provided by an exemplary embodiment of the present invention;

[0038] Figure 3 is a comparison diagram of the analysis of the effective value of the AC component of a short-circuit waveform with different signal-to-noise ratios by different methods provided by an exemplary embodiment of the present invention;

[0039] Figure 4 It is a diagram showing the influence of different short - circuit times on the analysis results of the matrix pencil algorithm provided by an exemplary embodiment of the present invention;

[0040] Figure 5 It is a schematic structural diagram of an extraction device for short - circuit test parameters provided by an exemplary embodiment of the present invention;

[0041] Figure 6 It is the structure of an electronic device provided by an exemplary embodiment of the present invention. Detailed implementation manners

[0042] Next, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments of the present invention. It should be understood that the present invention is not limited by the exemplary embodiments described herein.

[0043] It should be noted that: unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions and values set forth in these embodiments do not limit the scope of the present invention.

[0044] Those skilled in the art can understand that terms such as "first", "second", etc. in the embodiments of the present invention are only used to distinguish different steps, devices or modules, etc., and neither represent any specific technical meaning nor indicate an inevitable logical order between them.

[0045] It should also be understood that in the embodiments of the present invention, "a plurality of" may refer to two or more, and "at least one" may refer to one, two or more.

[0046] It should also be understood that for any component, data or structure mentioned in the embodiments of the present invention, in the absence of a clear definition or contrary indication in the context, it can generally be understood as one or more.

[0047] In addition, the term "and / or" in the present invention is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in the present invention generally represents an "or" relationship between the associated objects before and after.

[0048] It should also be understood that the present invention emphasizes the differences between the embodiments, and their similarities or similarities can be referred to each other. For the sake of brevity, they will not be described one by one.

[0049] At the same time, it should be understood that for the sake of description, the dimensions of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0050] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way a limitation on the present invention, its application, or its use.

[0051] Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and devices should be regarded as part of the specification.

[0052] It should be noted that like reference numerals and letters denote like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.

[0053] Embodiments of the present invention can be applied to electronic devices such as terminal devices, computer systems, servers, etc., which can operate with many other general-purpose or special-purpose computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments, and / or configurations suitable for use with terminal devices, computer systems, servers, etc. include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, minicomputer systems, mainframe computer systems, and distributed cloud computing technology environments including any of the above systems, and so on.

[0054] Terminal devices, computer systems, servers, etc. can be described in the general context of computer system-executable instructions (such as program modules) executed by a computer system. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc., which perform specific tasks or implement specific abstract data types. The computer system / server can be implemented in a distributed cloud computing environment, where tasks are executed by remote processing devices linked through a communication network. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0055] Exemplary method

[0056] Figure 1 is a flowchart of a method for extracting short-circuit test parameters provided by an exemplary embodiment of the present invention. This embodiment can be applied to an electronic device, such as Figure 1 As shown, the method 100 for extracting short-circuit test parameters includes the following steps:

[0057] Step 101, determine a sampling sequence according to the current waveform read by an oscilloscope.

[0058] Step 102: Convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine the discrete function, and construct the first Hankel matrix and the second Hankel matrix according to the sampling sequence.

[0059] The formula for the linear superposition of complex exponential functions of the discrete function y(n) is as follows:

[0060]

[0061] where N is the number of signal sampling points; P is the model order; ε(n) is the noise sequence; is the residue of the signal; is the pole of the signal; in the formula, A i is the amplitude, i is the initial phase, i is the attenuation factor, f i is the frequency, T is the sampling period, and n = 1, 2…, N.

[0062] Optionally, the operation of constructing the first Hankel matrix and the second Hankel matrix according to the sampling sequence includes:

[0063] Construct the first Hankel matrix according to the sampling sequence;

[0064] Replace each element in the first Hankel matrix with the next element to determine the second Hankel matrix.

[0065] Specifically, construct the Hankel matrix, that is, the first Hankel matrix, for the sampling sequence, where.

[0066]

[0067] In the formula: L is the state space parameter. Replace each element in Y1 with the next sampling point to obtain another Hankel matrix, that is, the second Hankel matrix:

[0068]

[0069] Step 103: Determine the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix, and determine the short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for the short-circuit test.

[0070] Optionally, the operation of determining the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix includes:

[0071] Determine the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix;

[0072] Determine the residue information of the sampling sequence according to the discrete function and the extreme points;

[0073] Determine the characteristic parameter information of the sampling sequence according to the extreme points and residue information, and determine the characteristic parameter information of the sampling sequence.

[0074] Optionally, according to the first Hankel matrix and the second Hankel matrix, the calculation formula for the extreme points of the sampling sequence is as follows:

[0075] z i = Y1 + Y2

[0076] where Z i is the extreme point, Y1 + is the pseudo-inverse matrix of the first Hankel matrix, and Y2 is the second Hankel matrix.

[0077] Optionally, the operations for determining the residue information of the sampling sequence according to the discrete function and the extreme points include:

[0078] Determine the modal order according to the constant threshold estimation method;

[0079] Determine the residue information according to the modal order, extreme points, and discrete function.

[0080] Specifically, solve the signal pole information. According to the matrix correlation principle, the pole z i of the sampling sequence y(n) is the generalized eigenvalue of the matrix pencil Y1 - λY2:

[0081] z i = Y1 + Y2 (4)

[0082] In the formula: Y1 + is the pseudo-inverse matrix of Y1.

[0083] Furthermore, solve the signal residue information. Use a constant threshold

[0084] estimation to determine the system modal order P. After obtaining the modal order and the pole z i , combine Equation (1) to obtain the residue h i by the least squares method:

[0085]

[0086] Furthermore, solve the characteristic parameters of each modal component of the signal through the following formula.

[0087]

[0088] where A is the amplitude, θ is the phase, α is the attenuation factor, f is the frequency, and T is the sampling period.

[0089] Optionally, the operation of determining the characteristic parameter information of the sampling sequence according to the extreme points and residue information includes:

[0090] Determine the amplitude and phase according to the residue information;

[0091] Determine the attenuation factor and frequency according to the extreme points.

[0092] Optionally, the operation of determining the short-circuit test parameters of the short-circuit test according to the characteristic parameter information includes:

[0093] Determine the peak value and effective value of the short-circuit test parameters according to the amplitude;

[0094] Determine the attenuation coefficient of the short-circuit test parameters according to the attenuation factor;

[0095] Determine the DC component of the short-circuit test parameters according to the frequency, amplitude and phase.

[0096] Specifically, the analytical results shown in Table 1 are as follows:

[0097] Table 1

[0098] Ai αi <![CDATA[f i > <![CDATA[θ i > 15.67488 -632.9065 0 -2.58E-14 54.17476 0.019108 49.98911 2.681298 25.16335 -147673.1 1066.849 2.38E-14

[0099] For example, select the power frequency f i = 50Hz, and other DC components can be obtained. Among them, for example, the peak value is numerically equal to the amplitude value at the solved frequency, the effective value is numerically equal to the peak value divided by the square root of 2, and the attenuation factor is the attenuation coefficient.

[0100] In addition, in order to evaluate the fitting degree between the fitting signal data and the original signal, the fitting accuracy (Accuracy of Fitting Index, AFI) of the signal is used in this paper to characterize the accuracy of the fitting signal:

[0101]

[0102] In the formula: x1(n) is the fitting signal; x(n) is the original signal; rms (Root Mean Square, RMS) is the symbol for calculating the root mean square, and the unit is dB. Generally, it is considered that when the AFI is greater than 20dB, the fitting accuracy meets the preset requirements.

[0103] This method can still accurately extract key short-circuit test parameters such as peak value, effective value, DC component and attenuation coefficient under complex working conditions where the measured waveform data series is less than 3 half-waves and contains noise, thus laying a foundation for the smooth development of laboratory short-circuit tests and short-circuit fault analysis.

[0104] In addition, Figure 2 is the comparison diagram of the effective value analysis of the AC component of the ideal short-circuit waveform by different methods;Figure 3 It is a comparison diagram of the effective values of the AC components of short - circuit waveforms with different signal - to - noise ratios analyzed by different methods; Figure 4 It is a diagram showing the influence of different short - circuit times on the analysis results of the matrix pencil algorithm. Refer to Figures 2 to 4 As shown, the matrix pencil method proposed by the present invention can effectively extract short - circuit experimental data.

[0105] Therefore, the present invention is a matrix - based spatial system identification algorithm. In a short - circuit test, it can quickly extract the characteristic parameters of a large number of short - circuit waveforms, facilitating subsequent quantitative analysis and processing; compared with the standard recommended three - peak method, the present invention is not affected by the number of half - waves and whether the effective value of the AC component is constant, and because the matrix pencil algorithm itself has the ability to denoise, the accuracy of the analysis results for short - circuit waveforms containing noise is relatively high, and it can adapt to various complex test environments.

[0106] Exemplary device

[0107] Figure 5 It is a schematic structural diagram of an extraction device for short - circuit test parameters provided by an exemplary embodiment of the present invention. As Figure 5 shown, the device 500 includes:

[0108] A first determination module 510, configured to determine a sampling sequence according to the current waveform read by an oscilloscope;

[0109] A second determination module 520, configured to convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine a discrete function, and construct a first Hankel matrix and a second Hankel matrix according to the sampling sequence;

[0110] A third determination module 530, configured to determine the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix, where the characteristic parameter information is used to determine the short - circuit test parameters, and the short - circuit test parameters are used for conducting short - circuit tests.

[0111] Optionally, the second determination module includes:

[0112] A construction sub - module, configured to construct a first Hankel matrix according to the sampling sequence;

[0113] A first determination sub - module, configured to replace each element in the first Hankel matrix with the next element thereof to determine the second Hankel matrix.

[0114] Optionally, the third determination module includes:

[0115] A second determination sub - module, configured to determine the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix;

[0116] The third determination sub-module is used to determine the residue information of the sampling sequence according to the discrete function and the extreme points;

[0117] The fourth determination sub-module is used to determine the characteristic parameter information of the sampling sequence according to the extreme points and the residue information, and determine the characteristic parameter information of the sampling sequence.

[0118] Optionally, the calculation formula for determining the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix is as follows:

[0119] z i = Y1 + Y2

[0120] where Z i is the extreme point, Y1 + is the pseudo-inverse matrix of the first Hankel matrix, and Y2 is the second Hankel matrix.

[0121] Optionally, the third determination sub-module includes:

[0122] The first determination unit is used to determine the modal order according to the constant threshold estimation method;

[0123] The second determination unit is used to determine the residue information according to the modal order, the extreme points and the discrete function.

[0124] Optionally, the fourth determination sub-module includes:

[0125] The third determination unit is used to determine the amplitude and phase according to the residue information;

[0126] The fourth determination unit is used to determine the attenuation factor and frequency according to the extreme points.

[0127] Optionally, the third determination module includes:

[0128] The fifth determination sub-module is used to determine the peak value and the effective value of the short-circuit test parameters according to the amplitude;

[0129] The sixth determination sub-module is used to determine the attenuation coefficient of the short-circuit test parameters according to the attenuation factor;

[0130] The seventh determination sub-module is used to determine the DC component of the short-circuit test parameters according to the frequency, the amplitude and the phase.

[0131] Exemplary electronic device

[0132] Figure 6It is the structure of an electronic device provided by an exemplary embodiment of the present invention. The electronic device can be either the first device and / or the second device, or a stand-alone device independent of them, and the stand-alone device can communicate with the first device and the second device to receive the input signals collected from them. Figure 6 It illustrates a block diagram of an electronic device according to an embodiment of the present invention. As Figure 6 shown, the electronic device 600 includes one or more processors 601 and a memory 602.

[0133] The processor 601 can be a central processing unit (CPU) or other forms of processing units with data processing capabilities and / or instruction execution capabilities, and can control other components in the electronic device to perform desired functions.

[0134] The memory 602 can include one or more computer program products, and the computer program products can include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory can include, for example, random access memory (RAM) and / or cache memory, etc. The non-volatile memory can include, for example, read-only memory (ROM), hard disk, flash memory, etc. One or more computer program instructions can be stored on the computer-readable storage media, and the processor 601 can run the program instructions to implement the method of information mining for historical change records of the software programs of various embodiments of the present invention described above and / or other desired functions. In one example, the electronic device may further include: an input device 603 and an output device 604, and these components are interconnected through a bus system and / or other forms of connection mechanisms (not shown).

[0135] In addition, the input device 603 can also include, for example, a keyboard, a mouse, and so on.

[0136] The output device 604 can output various information to the outside. The output device 604 can include, for example, a display, a speaker, a printer, and a communication network and its connected remote output devices, and so on.

[0137] Of course, for simplicity, Figure 6 only some of the components related to the present invention in the electronic device are shown in, and components such as buses, input / output interfaces, and so on are omitted. In addition, according to specific application scenarios, the electronic device may further include any other appropriate components.

[0138] Exemplary computer program product and computer-readable storage medium

[0139] In addition to the above methods and devices, an embodiment of the present invention may also be a computer program product, which includes computer program instructions that, when run on a processor, cause the processor to execute the steps in the method of information mining on historical change records according to various embodiments of the present invention described in the above "Exemplary Method" section of this specification.

[0140] The computer program product may be written in any combination of one or more programming languages for programming code to perform the operations of the embodiments of the present invention. The programming languages include object-oriented programming languages such as Java, C++, etc., and also include conventional procedural programming languages such as the "C" language or similar programming languages. The programming code may be executed entirely on the user's computing device, partially on the user's device, executed as an independent software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0141] In addition, an embodiment of the present invention may also be a computer-readable storage medium, on which computer program instructions are stored, and the computer program instructions, when run on a processor, cause the processor to execute the steps in the method of information mining on historical change records according to various embodiments of the present invention described in the above "Exemplary Method" section of this specification.

[0142] The computer-readable storage medium may adopt any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may, for example, include but not be limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or any combination of the above. More specific examples (non-exhaustive list) of the readable storage medium include: an electrical connection having one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0143] The basic principles of the present invention have been described above in conjunction with specific embodiments. However, it should be noted that the advantages, advantages, effects, etc. mentioned in the present invention are only examples and not limitations, and it cannot be considered that these advantages, advantages, effects, etc. are essential for each embodiment of the present invention. In addition, the above-disclosed specific details are only for the purpose of illustration and facilitating understanding, rather than limitations. The above details do not limit the present invention to necessarily adopt the above specific details to implement.

[0144] In the embodiments described in this specification, a progressive approach is adopted. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the embodiments, reference can be made to each other. For system embodiments, since they basically correspond to method embodiments, they are described relatively simply. For related parts, reference can be made to the partial description of the method embodiments.

[0145] The block diagrams of the devices, systems, equipment, and systems involved in the present invention are only illustrative examples and do not intend to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagrams. As those skilled in the art will recognize, these devices, systems, equipment, and systems can be connected, arranged, and configured in any way. Words such as "including", "comprising", "having", etc. are open-ended terms, meaning "including but not limited to", and can be used interchangeably with each other. The word "or" and "and" used herein refer to the word "and / or", and can be used interchangeably with it, unless the context clearly indicates otherwise. The word "such as" used herein refers to the phrase "such as but not limited to", and can be used interchangeably with it.

[0146] The methods and systems of the present invention can be implemented in many ways. For example, the methods and systems of the present invention can be implemented by software, hardware, firmware, or any combination of software, hardware, and firmware. The above order of the steps for the method is only for illustration. The steps of the method of the present invention are not limited to the specific order described above, unless otherwise specifically stated. In addition, in some embodiments, the present invention can also be implemented as a program recorded in a recording medium, and these programs include machine-readable instructions for implementing the method according to the present invention. Therefore, the present invention also covers the recording medium storing the program for executing the method according to the present invention.

[0147] It should also be pointed out that in the systems, equipment, and methods of the present invention, each component or each step can be decomposed and / or recombined. These decompositions and / or recombinations should be regarded as equivalent solutions of the present invention. The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these aspects are very obvious to those skilled in the art, and the general principles defined herein can be applied to other aspects without departing from the scope of the present invention. Therefore, the present invention is not intended to be limited to the aspects shown herein, but rather to the broadest scope consistent with the principles and novel features disclosed herein.

[0148] The above description has been given for purposes of illustration and description. In addition, this description does not intend to limit the embodiments of the present invention to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions, and sub-combinations thereof.

Claims

1. A method for extracting short-circuit test parameters, characterized in that, Including: Determine a sampling sequence according to a current waveform read by an oscilloscope; Convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine a discrete function, and construct a first Hankel matrix and a second Hankel matrix according to the sampling sequence; Determine characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix, and determine short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for a short-circuit test; The operation of determining the characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix includes: Determine extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix; Determine residue information of the sampling sequence according to the discrete function and the extreme points; Determine the characteristic parameter information of the sampling sequence according to the extreme points and the residue information.

2. The method according to claim 1, characterized in that, The operation of constructing the first Hankel matrix and the second Hankel matrix according to the sampling sequence includes: Construct the first Hankel matrix according to the sampling sequence; Replace each element in the first Hankel matrix with the next element thereof to determine the second Hankel matrix.

3. The method according to claim 1, wherein The calculation formula for determining the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix is as follows: z i = Y1 + Y2 where Z i is an extreme point, Y1 + is the pseudo-inverse matrix of the first Hankel matrix, and Y2 is the second Hankel matrix.

4. The method according to claim 1, wherein The operation of determining the residue information of the sampling sequence according to the discrete function and the extreme points includes: Determine a modal order according to a constant threshold estimation method; Determine the residue information according to the modal order, the extreme points, and the discrete function.

5. The method according to claim 1, characterized in that, The operation of determining the characteristic parameter information of the sampling sequence according to the extreme points and the residue information includes: Determine an amplitude and a phase according to the residue information; Determine an attenuation factor and a frequency according to the extreme points.

6. The method according to claim 5, wherein The operation of determining the short-circuit test parameters according to the characteristic parameter information includes: Determine a peak value and an effective value of the short-circuit test parameters according to the amplitude; Determine an attenuation coefficient of the short-circuit test parameters according to the attenuation factor; Determine a DC component of the short-circuit test parameters according to the frequency, the amplitude, and the phase.

7. An extraction device for short-circuit test parameters, characterized in that Including: A first determination module, configured to determine a sampling sequence according to a current waveform read by an oscilloscope; A second determination module, configured to convert the sampling sequence into a form of superposition of multiple complex exponential functions, determine a discrete function, and construct a first Hankel matrix and a second Hankel matrix according to the sampling sequence; A third determination module, configured to determine characteristic parameter information of the sampling sequence according to the discrete function, the first Hankel matrix, and the second Hankel matrix, and determine short-circuit test parameters according to the characteristic parameter information, where the short-circuit test parameters are used for a short-circuit test; The third determination module includes: A second determination sub-module, configured to determine extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix; A third determination sub-module, configured to determine the residue information of the sampling sequence according to the discrete function and the extreme points; A fourth determination sub-module, configured to determine the characteristic parameter information of the sampling sequence according to the extreme points and the residue information.

8. The device according to claim 7, characterized in that, A second determination module, including: A construction sub-module, configured to construct the first Hankel matrix according to the sampling sequence; A first determination sub-module, configured to replace each element in the first Hankel matrix with the next element thereof to determine the second Hankel matrix.

9. The device according to claim 7, characterized in that The calculation formula for determining the extreme points of the sampling sequence according to the first Hankel matrix and the second Hankel matrix is as follows: z i = Y1 + Y2 where Z i is an extreme point, Y1 + is the pseudo-inverse matrix of the first Hankel matrix, and Y2 is the second Hankel matrix.

10. The device according to claim 7, characterized in that, A third determination sub-module, including: A first determination unit, configured to determine the modal order according to a constant threshold estimation method; A second determination unit, configured to determine the residue information according to the modal order, the extreme points, and the discrete function.

11. The device according to claim 7, characterized in that, A fourth determination sub-module, including: A third determination unit, configured to determine the amplitude and the phase according to the residue information; A fourth determination unit, configured to determine the attenuation factor and the frequency according to the extreme points.

12. The device according to claim 11, characterized in that, Further included: A fourth determination module, configured to determine the short-circuit test parameters of the short-circuit test according to the characteristic parameter information.

13. The device according to claim 12, characterized in that, A fourth determination module, including: A fifth determination sub-module, configured to determine the peak value and the effective value of the short-circuit test parameters according to the amplitude; A sixth determination sub-module, configured to determine the attenuation coefficient of the short-circuit test parameters according to the attenuation factor; A seventh determination sub-module, configured to determine the DC component of the short-circuit test parameters according to the frequency, the amplitude, and the phase.

14. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, and the computer program is used to execute the method according to any one of claims 1-6 above.

15. An electronic device, characterized in that, The electronic device includes: A processor; A memory for storing executable instructions of the processor; The processor is configured to read the executable instructions from the memory and execute the instructions to implement the method according to any one of claims 1-6 above.

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