An insulation material performance testing device and method in a switchgear cabinet

Abstract

The present invention relates to the technical field of electrical equipment testing, and particularly relates to a device and method for testing the performance of insulating materials inside a switchgear. Among them: the high-voltage electrode and the low-voltage electrode are respectively connected to the high-voltage test electrode and the low-voltage test electrode of the insulating material inside the switchgear; the voltage control module is connected to the high-voltage electrode; the heating module is arranged on the inner side of the bottom of the test container; the temperature control module is connected to the heating module; the current monitoring module is connected to the low-voltage electrode; the data acquisition module is respectively connected to the temperature monitoring module and the current monitoring module; the upper computer is respectively connected to the data acquisition module, the voltage control module and the temperature control module; the present invention can simulate the ambient temperature inside the switchgear through the heating module, and evaluate the performance of the insulating material inside the switchgear by the relationship between the ambient temperature and the working current.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical equipment insulation, and particularly to a device and method for testing the performance of insulating materials inside a switchgear cabinet. Background Art

[0002] A switchgear cabinet is a module that, according to the requirements of the electrical primary main wiring diagram, assembles relevant electrical equipment (including control devices, protection devices, and measuring devices), as well as busbars, current-carrying conductors, insulating materials, etc. in a closed or open metal cabinet to receive and distribute electric energy. It is an important electrical equipment indispensable in the power system, and its safety is closely related to the safety of the entire power transmission and distribution system.

[0003] The switchgear cabinet is mainly divided into a busbar chamber, a circuit breaker chamber, a secondary control chamber (instrument chamber), and a feeder chamber. Generally, each chamber is isolated by steel plates and protected and supported by insulating materials. During actual operation, as the operating time increases, the insulation performance of the insulating materials inside the switchgear cabinet gradually decreases due to the temperature change inside the cabinet, greatly increasing the possibility of the switchgear cabinet malfunctioning.

[0004] Currently, there is a lack of testing on the influence of the temperature inside the cabinet on the performance of the insulating materials of the switchgear cabinet under long-term live operation conditions both at home and abroad. This leads to inaccurate judgment of the performance of the insulating materials inside the switchgear cabinet by testers, and further causes accidents such as through breakdown during the operation of the switchgear cabinet, threatening people's lives and property safety. Summary of the Invention

[0005] The present invention provides a device and method for testing the performance of insulating materials inside a switchgear cabinet to solve the problem of inaccurate performance testing of the insulating materials inside the switchgear cabinet currently.

[0006] In a first aspect of the present invention, a device for testing the performance of insulating materials inside a switchgear cabinet is provided. The insulating materials inside the switchgear cabinet include: a host computer, a voltage control module, a high-voltage electrode, a low-voltage electrode, a temperature control module, a heating module, a temperature monitoring module, a current monitoring module, a data acquisition module, and a test container.

[0007] The high-voltage electrode and the low-voltage electrode are arranged at intervals inside the test container, forming a test station for setting the insulating materials inside the switchgear cabinet in the middle.

[0008] The high-voltage electrode and the low-voltage electrode are respectively connected to the high-voltage test electrode and the low-voltage test electrode of the insulating materials inside the switchgear cabinet.

[0009] The voltage control module is connected to the high-voltage electrode and is used to generate the working voltage for testing.

[0010] The heating module is arranged on the inner bottom of the test container and is used to increase the internal temperature of the test container;

[0011] The temperature control module is connected to the heating module and is used to control the temperature generated by the heating module;

[0012] The temperature monitoring module is arranged on the inner side wall of the test container and is used to monitor the internal temperature of the test container in real time;

[0013] The current monitoring module is connected to the low-voltage electrode and is used to monitor the output current of the low-voltage electrode in real time;

[0014] The data acquisition module is respectively connected to the temperature monitoring module and the current monitoring module and is used to acquire the temperature data monitored by the temperature monitoring module and the current data monitored by the current monitoring module;

[0015] The upper computer is respectively connected to the data acquisition module, the voltage control module and the temperature control module and is used to obtain the temperature data and current data acquired by the data acquisition module, send a voltage control signal to the voltage control module according to a preset voltage value, and send a temperature control signal to the temperature control module according to a preset temperature value.

[0016] Specifically, sending the temperature control signal to the temperature control module according to the preset temperature value is specifically:

[0017] Sending a temperature signal to the temperature control module according to the preset temperature value, and when the temperature value in the acquired temperature data is greater than the preset temperature value, sending a stop temperature adjustment signal to the control module.

[0018] Specifically, the heating module is composed of four heating units with equal power, and the four heating units are symmetrically arranged at the bottom of the test container.

[0019] Specifically, the temperature monitoring module includes: a first temperature sensor and a second temperature sensor;

[0020] The first temperature sensor and the second temperature sensor are respectively symmetrically arranged on the inner side wall of the test container.

[0021] Specifically, after the upper computer obtains the temperature data monitored by the first temperature sensor and the second temperature sensor acquired by the data acquisition module, it first takes the arithmetic mean of the obtained temperature data and then stores it.

[0022] On the other hand, the present invention also provides a method for testing the performance of the insulating material in the switch cabinet, including the following steps:

[0023] S10: Control the voltage control module to apply voltage to the insulating material in the switch cabinet according to a preset voltage value, and monitor the temperature in the test container and the first working current of the insulating material in the switch cabinet through the temperature monitoring module and the current monitoring module;

[0024] S20: Send a temperature control signal to the temperature control module according to a preset temperature value to control the internal temperature of the test container to rise through the temperature control module. When the internal temperature changes to the preset temperature and maintains the heating duration, stop heating and end a test;

[0025] S30: Increase the preset temperature value at a preset temperature interval and repeat step S20 until the temperature rises to the highest preset temperature value and stop the test;

[0026] S40: Obtain the starting temperature in the test container and the internal temperature of the test container after each stop of heating, and establish a first functional relationship between the second working current and the linear error factor;

[0027] S50: Establish a second functional relationship between the first working current, the second working current, the number of tests, and the error factor. Substitute the values of the first working current and the second working current corresponding to each test into the second functional relationship for iterative calculation until the value of the corrected error factor that minimizes the error between the first and second working currents is obtained;

[0028] S60: Substitute the value of the corrected error factor into the first functional relationship described above to obtain the value of the corrected working current;

[0029] S70: Calculate the performance evaluation factor based on the corrected working current and the value of the first working current, and judge the performance of the insulating material in the switch cabinet according to the performance evaluation factor.

[0030] Specifically, step S50 specifically includes the following steps:

[0031] S51: Establish a functional relationship between the first working current, the second working current, and the error factor x;

[0032] S52: Execute the annealing algorithm, randomly generate an initial solution of the error factor, calculate the objective function f(x), and set the number of iterations;

[0033] S53: Generate a perturbed new solution x', and calculate the objective function Δf = f(x) - f(x'); if Δf ≥ 0, accept the perturbed new solution x', otherwise, accept the new solution according to the probability acceptance criterion;

[0034] S54: Judge whether the number of iterations is reached. If the number of iterations is reached, enter step S54, otherwise, re-enter step S52;

[0035] S55: Determine whether the termination condition is satisfied. If it is satisfied, the operation ends, and x' is output as the correction error factor. Otherwise, reset the iteration count and proceed to step S52.

[0036] Specifically, when the performance evaluation factor σ ∈ (0, 0.04], it indicates that the insulation performance of the switchgear is normal; when the performance evaluation factor σ ∈ (0.04, 0.06], it indicates that the insulation performance of the switchgear deteriorates; when the performance evaluation factor σ ∈ (0.06, 1], it indicates that the insulation performance of the switchgear fails.

[0037] Specifically, the perturbed new solution x' is obtained by multiplying the initial solution of the error factor x by the attenuation coefficient, and the value range of the attenuation coefficient is 0.95 - 0.99.

[0038] Specifically, the probability acceptance criterion is the Metropolis criterion.

[0039] The beneficial effects of the present invention are as follows. In the first aspect of the present invention, a device for testing the performance of the internal insulation material of a switchgear is provided, including: a host computer, a voltage control module, a high-voltage electrode, a low-voltage electrode, a temperature control module, a heating module, a temperature monitoring module, a current monitoring module, a data acquisition module, and a test container; the high-voltage electrode and the low-voltage electrode are arranged at intervals in the test container, and a test station for arranging the internal insulation material of the switchgear is formed in the middle; the high-voltage electrode and the low-voltage electrode are respectively connected to the high-voltage test electrode and the low-voltage test electrode of the internal insulation material of the switchgear; the voltage control module is connected to the high-voltage electrode and is used to generate the working voltage for testing; the heating module is arranged on the inner side of the bottom of the test container and is used to increase the internal temperature of the test container; the temperature control module is connected to the heating module and is used to control the temperature generated by the heating module; the temperature monitoring module is arranged on the inner side wall of the test container and is used to monitor the internal temperature of the test container in real time; the current monitoring module is connected to the low-voltage electrode and is used to monitor the output current of the low-voltage electrode in real time; the data acquisition module is respectively connected to the temperature monitoring module and the current monitoring module and is used to collect the temperature data monitored by the temperature monitoring module and the current data monitored by the current monitoring module; the host computer is respectively connected to the data acquisition module, the voltage control module, and the temperature control module and is used to obtain the temperature data and current data collected by the data acquisition module, send a voltage control signal to the voltage control module according to a preset voltage value, and send a temperature control signal to the temperature control module according to a preset temperature value.

[0040] The performance testing device for the insulating material inside the switchgear provided by the present invention can apply a voltage of the same level as that of the switchgear to the insulating material inside the switchgear and simulate the temperature inside the switchgear, so that the insulating material to be tested inside the switchgear can be in the same working environment as that inside the switchgear. Furthermore, by detecting the working current of the insulating material and uploading it to the host computer for storage, it provides a basis for the performance evaluation of the insulating material inside the switchgear.

[0041] On the other hand, the present invention also provides a method for testing the performance of the insulating material of the switchgear, which specifically includes the following steps: S10: Control the voltage control module to apply a voltage to the insulating material inside the switchgear according to a preset voltage value, and monitor the temperature inside the test container and the first working current of the insulating material inside the switchgear through the temperature monitoring module and the current monitoring module; S20: Send a temperature control signal to the temperature control module according to a preset temperature value to control the temperature control module to increase the internal temperature of the test container. When the internal temperature changes to the preset temperature and maintains the heating duration, stop heating and end one test; S30: Increase the preset temperature value according to a preset temperature interval, and repeat step S20 until the temperature rises to the highest preset temperature value and stop the test; S40: Obtain the starting temperature inside the test container and the internal temperature of the test container after each stop of heating, and establish a first functional relationship between the second working current and the linear error factor;

[0042] S50: Establish a second functional relationship between the first working current, the second working current, the number of tests, and the error factor. Substitute the values of the first working current and the second working current corresponding to each test into the second functional relationship for iterative calculation until the value of the corrected error factor that minimizes the error between the first and second working currents is obtained; S60: Substitute the value of the corrected error factor into the first functional relationship to obtain the value of the corrected working current; S70: Calculate the performance evaluation factor according to the corrected working current and the value of the first working current, and judge the performance of the insulating material inside the switchgear according to the performance evaluation factor.

[0043] The method for testing the performance of the insulating material of the switchgear provided by the present invention can obtain the first working current of the performance testing device for the insulating material of the switchgear stored in the host computer, obtain the second working current of the performance testing device for the insulating material of the switchgear through the starting temperature inside the test container, the internal temperature of the test container after each stop of heating, and the aging time in each test, and obtain the corrected working current closest to the actual performance degradation degree of the insulating material inside the switchgear by iteratively correcting the error relationship between the first and second working currents, and finally effectively determine the performance degradation degree of the insulating material inside the switchgear. Description of the Drawings

[0044] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0045] Figure 1 It is a schematic structural diagram of a performance testing device for insulating materials inside a switchgear cabinet;

[0046] Figure 2 It is a flowchart of a method for testing the performance of insulating materials inside a switchgear cabinet;

[0047] Reference signs in the drawings: 1 - host computer; 2 - voltage control module; 3 - high - voltage electrode; 4 - low - voltage electrode; 5 - temperature control module; 6 - heating module; 7 - temperature monitoring module; 8 - current monitoring module; 9 - data acquisition module; 10 - test container. Detailed implementation manners

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0049] The first aspect of the present invention provides a performance testing device for insulating materials inside a switchgear cabinet. Please refer to Figure 1 , Figure 1 It is a schematic structural diagram of a performance testing device for insulating materials inside a switchgear cabinet;

[0050] A performance testing device for insulating materials inside a switchgear cabinet includes: a host computer 1, a voltage control module 2, a high - voltage electrode 3, a low - voltage electrode 4, a temperature control module 5, a heating module 6, a temperature monitoring module 7, a current monitoring module 8, a data acquisition module 9, and a test container 10;

[0051] The high - voltage electrode 3 and the low - voltage electrode 4 are arranged at intervals inside the test container 10, forming a test station for setting the insulating materials inside the switchgear cabinet in the middle, and are respectively connected to the high - voltage test electrode and the low - voltage test electrode of the insulating materials inside the switchgear cabinet;

[0052] The voltage control module 2 is connected to the high - voltage electrode 3 and is used to generate the working voltage for testing;

[0053] The heating module 6 is arranged inside the bottom of the test container 10 and is used to increase the internal temperature of the test container 10;

[0054] The temperature control module 5 is connected to the temperature rising module 6 and is used to control the temperature generated by the temperature rising module;

[0055] The temperature monitoring module 7 is arranged on the inner side wall of the test container 10 and is used to monitor the internal temperature of the test container 10 in real time;

[0056] The current monitoring module 8 is connected to the low-voltage electrode 4 and is used to detect the output current of the low-voltage electrode 4 in real time;

[0057] The data acquisition module 9 is respectively connected to the temperature monitoring module 7 and the current monitoring module 8 and is used to acquire the temperature data monitored by the temperature monitoring module 7 and the current data monitored by the current monitoring module 8;

[0058] The host computer 1 is respectively connected to the voltage control module 2, the temperature control module 5 and the data acquisition module 9 and is used to send a voltage control signal to the voltage control module 2 according to a preset voltage value, send a temperature control signal to the temperature control module 5 according to a preset temperature value, and acquire the temperature data and current data acquired by the data acquisition module 9.

[0059] In the specific implementation process, the host computer 1 sends a control signal to the voltage control module 2 according to a preset voltage value, and then applies a voltage to the high-voltage electrode 3 through the voltage control module 2. Under the action of the applied voltage, the current passes through the high-voltage electrode 3 and flows through the insulating material in the switch cabinet to the low-voltage electrode 4;

[0060] The current flowing through the low-voltage electrode 4 is monitored in real time through the current monitoring module 8, the temperature in the test container 10 is detected in real time through the temperature monitoring module 7, and is collected by the data acquisition module 9 and then sent to the host computer 1 for storage;

[0061] The host computer 1 sends a temperature adjustment signal to the temperature control module 5 according to a preset temperature value to control the temperature rise in the test container 10. When the temperature rises to the preset range, the host computer 1 sends a signal to stop adjusting the temperature to the temperature control module 5 to control the temperature rising module 6 to stop rising temperature and end a test;

[0062] The preset temperature value is increased according to a preset temperature interval until the preset temperature interval is increased to the maximum preset temperature value.

[0063] In another embodiment of the present invention, the temperature rising module 6 is composed of four heating units with equal power, and the four heating units are symmetrically arranged at the bottom of the test container 10, so that the test container 10 is heated more evenly.

[0064] In another embodiment of the present invention, the temperature monitoring module includes: a first temperature sensor and a second temperature sensor, which are symmetrically arranged on the inner side wall of the test container 10 respectively.

[0065] In another more specific embodiment of the present invention, after the host computer 1 obtains the temperatures monitored by the first temperature sensor and the second temperature sensor collected by the data acquisition module 9, it first takes the arithmetic mean of the obtained temperature data and then stores it.

[0066] In another embodiment of the present invention, the insulation material performance test device for switchgear provided by the present invention further includes a grounding grid, which is connected to the current monitoring module 8 and is used to conduct current into the ground.

[0067] In another embodiment of the present invention, the insulation material performance test device for switchgear provided by the present invention further includes a first grounding body and a second grounding body;

[0068] The first grounding body is connected to the voltage control module 2, and the second grounding body is connected to the outer shell of the insulation material in the switchgear, and is used to conduct the fault current into the ground to ensure the life and property safety of the staff.

[0069] On the other hand, the present invention also provides an embodiment of a method for testing the performance of insulation materials in switchgear. Please refer to Figure 2 , which specifically includes the following steps:

[0070] S10: Control the voltage control module to apply voltage to the insulation material in the switchgear according to the preset voltage value U, and monitor the temperature T in the test container and the first working current I of the insulation material in the switchgear through the temperature monitoring module and the current monitoring module b ;

[0071] S20: Send a temperature control signal to the temperature control module according to the preset temperature value, so as to control the temperature control module to raise the internal temperature T of the test container. When the internal temperature changes to the preset temperature and maintains the heating duration t, stop heating and end a test;

[0072] S30: Increase the preset temperature value according to the preset temperature interval, and repeat step S20 until the temperature rises to the highest preset temperature value, and then stop the test;

[0073] S40: Obtain the starting temperature in the test container and the internal temperature T of the test container after each stop of heating, and establish the following first functional relationship between the second working current I i and the linear error factor x:

[0074]

[0075] In the formula, t is the electrical aging time, ξ is the integration variable, λ is the environmental temperature influence coefficient, T j is the environmental temperature of the jth test, T b is the reference environmental temperature, and m is the number of experiments;

[0076] S50: Establish a second functional relationship among the first working current I b , the second working current I i , the number of tests m, and the error factor x. Substitute the first working current I bj and the second working current I ij corresponding to the j-th test into the second functional relationship for iterative calculation until the value of the corrected error factor x' that minimizes the error between the first and second working currents is obtained;

[0077] S60: Substitute the value of the corrected error factor x' into formula (1) to obtain the value of the corrected working current I i ';

[0078]

[0079] S70: According to the corrected working current I i ' and the first working current I b , calculate the performance degradation evaluation factor σ, and the formula is as follows:

[0080]

[0081] When σ ∈ (0, 0.04], it indicates that the insulation performance of the switchgear is normal; when σ ∈ (0.04, 0.06], it indicates that the insulation performance of the switchgear is degraded; when σ ∈ (0.06, 1], it indicates that the insulation performance of the switchgear fails.

[0082] In another more specific method embodiment of the present invention, step S50 is specifically:

[0083] S51: Establish a functional relationship among the first working current I b , the second working current I i and the error factor x, and the formula is as follows:

[0084]

[0085] Where: I bj is the value of the first working current of the insulating material in the switchgear for the j-th test, I ij is the value of the second working current of the insulating material in the switchgear for the j-th test, and m is the total number of tests;

[0086] S52: Execute the annealing algorithm, randomly generate an initial solution of the error factor, calculate the objective function f(x), and set the number of iterations;

[0087] S53: Generate a perturbed new solution x', and calculate the objective function Δf = f(x) - f(x'); if Δf ≥ 0, then accept the perturbed new solution x', otherwise, accept the new solution according to the probability acceptance criterion;

[0088] S54: Determine whether the iteration count is reached. If the iteration count is reached, proceed to step S54; otherwise, re-enter step S52.

[0089] S55: Determine whether the termination condition is satisfied. If it is satisfied, the operation ends and x' is output as the correction error factor; otherwise, reset the iteration count and enter step S52.

[0090] In another specific embodiment of the present invention, the perturbed new solution y' is obtained by multiplying the initial solution of the error factor y by a decay coefficient, and the value range of the decay coefficient is 0.95 - 0.99.

[0091] In another specific embodiment of the present invention, the probability acceptance criterion is the Metropolis criterion.

[0092] The terms "first", "second", "third", "fourth", etc. (if any) in the description of the present application and the above-mentioned drawings are used to distinguish similar objects and do not necessarily need to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products, or devices.

[0093] It should be understood that in the present application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects and indicates that three relationships can exist. For example, "A and / or B" can represent: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally represents an "or" relationship between the associated objects before and after. "At least one (one) of the following" or a similar expression means any combination of these items, including any combination of single item (one) or plural items (ones). For example, at least one (one) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0094] In several embodiments provided by the present application, it should be understood that the disclosed modules and methods can be implemented in other ways. For example, the module embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces. The indirect coupling or communication connection of the modules or units can be in electrical, mechanical or other forms.

[0095] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0096] In addition, in each embodiment of the present application, the functional units can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

Claims

1. A method for testing the performance of insulating materials inside a switchgear cabinet, using a device for testing the performance of insulating materials inside a switchgear cabinet, characterized in that the device for testing the performance of insulating materials inside a switchgear cabinet includes: a host computer, a voltage control module, a high-voltage electrode, a low-voltage electrode, a temperature control module, a heating module, a temperature monitoring module, a current monitoring module, a data acquisition module, and a test container; the high-voltage electrode and the low-voltage electrode are arranged at intervals inside the test container, and a test station for arranging insulating materials inside the switchgear cabinet is formed in the middle; the high-voltage electrode and the low-voltage electrode are respectively connected to the high-voltage test electrode and the low-voltage test electrode of the insulating materials inside the switchgear cabinet; the voltage control module is connected to the high-voltage electrode and is used to generate a working voltage for testing; the heating module is arranged on the inner side of the bottom of the test container and is used to increase the internal temperature of the test container; the temperature control module is connected to the heating module and is used to control the temperature generated by the heating module; the temperature monitoring module is arranged on the inner side wall of the test container and is used to monitor the internal temperature of the test container in real time; the current monitoring module is connected to the low-voltage electrode and is used to monitor the output current of the low-voltage electrode in real time; the data acquisition module is respectively connected to the temperature monitoring module and the current monitoring module and is used to collect the temperature data monitored by the temperature monitoring module and the current data monitored by the current monitoring module; the host computer is respectively connected to the data acquisition module, the voltage control module, and the temperature control module, and is used to obtain the temperature data and current data collected by the data acquisition module, send a voltage control signal to the voltage control module according to a preset voltage value, and send a temperature control signal to the temperature control module according to a preset temperature value; the test method includes the following steps: S10: Control the voltage control module to apply a voltage to the insulating materials inside the switchgear cabinet according to a preset voltage value, and monitor the temperature inside the test container and the first working current of the insulating materials inside the switchgear cabinet through the temperature monitoring module and the current monitoring module; S20: Send a temperature control signal to the temperature control module according to a preset temperature value to control the internal temperature of the test container to rise through the temperature control module. When the internal temperature changes to the preset temperature and maintains the heating duration, stop heating and end one test; S30: Increase the preset temperature value at a preset temperature interval and repeat step S20 until the temperature rises to the highest preset temperature value and stop the test; S40: Obtain the starting temperature inside the test container and the internal temperature of the test container after each heating stop, and establish a first functional relationship between the second working current and the linear error factor; S50: Establish a second functional relationship between the first working current, the second working current, the number of tests, and the error factor. Substitute the values of the first working current and the second working current corresponding to each test into the second functional relationship for iterative calculation until the value of the corrected error factor that minimizes the error between the first and second working currents is obtained; S60: Substitute the value of the correction error factor into the first functional relationship described above to obtain the value of the corrected working current; S70: Calculate the performance evaluation factor based on the corrected working current and the value of the first working current, and determine the performance of the insulating material inside the switchgear according to the performance evaluation factor.

2. The method for testing the performance of the insulating material inside the switchgear according to claim 1, characterized in that The step of sending a temperature control signal to the temperature control module according to a preset temperature value specifically includes: Send a temperature signal to the temperature control module according to a preset temperature value. When the temperature value in the collected temperature data is greater than the preset temperature value, send a stop temperature adjustment signal to the control module.

3. The method for testing the performance of the insulating material inside the switchgear according to claim 1, characterized in that, The heating-up module consists of four heating units with equal power, and the four heating units are symmetrically arranged at the bottom of the test container.

4. The method for testing the performance of the insulating material inside the switchgear according to claim 1, wherein The temperature monitoring module includes: a first temperature sensor and a second temperature sensor; The first temperature sensor and the second temperature sensor are symmetrically arranged on the inner side walls of the test container respectively.

5. The method for testing the performance of the insulating material inside the switchgear according to claim 4, wherein After the host computer obtains the temperature data monitored by the first temperature sensor and the second temperature sensor collected by the data acquisition module, it first takes the arithmetic mean of the obtained temperature data and then stores it.

6. The method for testing the performance of the insulating material inside the switchgear according to claim 1, wherein Step S50 specifically includes the following steps: S51: Establish a functional relationship among the first working current, the second working current, and the error factor x; S52: Execute the annealing algorithm, randomly generate an initial solution of the error factor, calculate the objective function f(x), and set the number of iterations; S53: Generate a perturbed new solution x , calculate the objective function ; If , then accept the perturbed new solution x , otherwise, accept the new solution according to the probability acceptance criterion; S54: Determine whether the number of iterations has been reached. If the number of iterations has been reached, enter step S54; otherwise, re-enter step S52; S55: Determine whether the termination condition is satisfied. If it is satisfied, the operation ends, and x is output as the correction error factor; otherwise, reset the iteration count and go to step S52.

7. The method for testing the performance of the insulating material inside the switchgear according to claim 1, characterized in that When the performance evaluation factor σ ∈ (0, 0.04], it indicates that the insulation performance of the switchgear is normal; when the performance evaluation factor σ ∈ (0.04, 0.06], it indicates that the insulation performance of the switchgear deteriorates; when the performance evaluation factor σ ∈ (0.06, 1], it indicates that the insulation performance of the switchgear fails.

8. The method for testing the performance of the insulating material in the switch cabinet according to claim 6, wherein, The new solution x of the perturbation is obtained by multiplying the initial solution of the error factor y by the attenuation coefficient, and the value range of the attenuation coefficient is 0.95 - 0.

99.

9. The method for testing the performance of the insulating material inside the switchgear according to claim 6, characterized in that, The probability acceptance criterion is the Metropolis criterion.

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