A fast-scan polychromatic schlieren system for measuring mixed transparent media and a method of measuring the same

Abstract

The present application belongs to the technical field of transparent medium measurement, and particularly relates to a fast-scan polychromatic schlieren system for measuring mixed transparent medium and a measurement method thereof, comprising a fast-scan polychromatic wave source, a slit, a half-mirror, a schlieren mirror, a knife edge, a true-color high-speed camera, a mixed gas source, a mixed gas measurement system and a control computer; wherein the light-emitting side of the fast-scan polychromatic wave source is sequentially provided with the slit, the half-mirror and the schlieren mirror, the true-color high-speed camera is arranged directly below the half-mirror, and the knife edge is arranged between the half-mirror and the true-color high-speed camera; the schlieren mirror and the half-mirror are a test area, the mixed gas measurement system is arranged in the area, the control computer is connected with the fast-scan polychromatic wave source and the true-color high-speed camera respectively, and the mixed gas source is connected with one end of the mixed gas measurement system. The present application can distinguish the system of different gas component beam current properties, and can meet the measurement of different component beam current properties under the injection of mixed gas such as controlled nuclear fusion and combustion science.

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