Automatic sampling circuit, device, method, medium and terminal

By introducing conductive and resistive strips into the automated sample feeding device, combined with analog-to-digital conversion circuits and processors, and monitoring voltage values ​​in real time, the problem of the test tube rack failing to accurately align with the sampling needle was solved. This enabled precise positioning of the test tube rack and automated sample feeding, avoiding needle collisions and ensuring a smooth sampling process.

CN116203266BActive Publication Date: 2025-11-18SHENZHEN COMEN MEDICAL INSTR
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Patent Information

Application Number
CN202310196100.5
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-02-24
Publication Date
2025-11-18
Estimated Expiration
2043-02-24

AI Technical Summary

Technical Problem

Existing automated sample feeding equipment has a problem where test tubes on the tube rack are not accurately aligned with the sampling needle, which can easily lead to needle collisions during sampling.

Method used

By incorporating conductive and resistive strips into the automatic sample feeding circuit, the different connection states of the resistive strips are used to determine the sample feeding state. Combined with an analog-to-digital converter circuit and a processor, the voltage value is monitored in real time, enabling precise positioning and movement of the test tube rack and avoiding sampling needle collisions.

Benefits of technology

It achieves precise positioning of the test tube rack and automatic sample injection, avoiding the situation of sampling needle collision and ensuring the smooth progress of the sampling process.

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Abstract

The application discloses an automatic sampling circuit, equipment, method, medium and terminal, and first determines whether it is in a non-sampling state or a sampling state based on the connection relationship of a conductive strip. The third end of the resistance strip is not fixed, so that automatic sampling and positioning of automatic sampling can be achieved, thereby avoiding the situation that the sampling needle is stuck. Further, the automatic sampling equipment is based on the automatic sampling circuit, and the feeding assembly drives the test tube rack to move towards the unloading starting area based on the real-time voltage value output by the digital-to-analog conversion circuit, thereby realizing automatic sampling and positioning of automatic sampling. Further, the automatic sampling equipment is based on the automatic sampling equipment, and whether the target test tube is accurately positioned is determined based on the comparison between the real-time voltage value and the preset voltage value.
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Description

Technical Field

[0001] This invention relates to the field of sample sampling technology, and in particular to an automatic sample introduction circuit, device, method, medium and terminal. Background Technology

[0002] In the field of sample collection, in order to free up user manpower and improve testing efficiency, automated sample loading is often used to achieve autonomous testing, and automated sample loading equipment can just meet the purpose of autonomous testing. Automated sample loading equipment has rows of test tube racks containing test tube samples, which pass through the testing points in sequence under the action of internal feeding components.

[0003] However, commonly used feeding components often have insufficient precision, which may lead to incomplete movement, such as the test tubes on the test tube rack not being aligned with the sampling needle, resulting in the sampling needle colliding with the needle during sampling. Summary of the Invention

[0004] Therefore, it is necessary to provide automatic sampling circuits, equipment, methods, media, and terminals to solve the problem of test tubes on the test tube rack not being aligned with the sampling needle, which in turn causes the sampling needle to collide during sampling.

[0005] An automatic sample feeding circuit includes a fixed resistor, a resistance strip, a conductive strip, a support assembly, an analog-to-digital converter circuit, a processor, and a host computer. The conductive strip includes a connected access portion and a non-access portion.

[0006] The first end of the fixed resistor is connected to the power supply, the second end of the fixed resistor is connected to the first end of the resistor bar, and is connected to the analog-to-digital converter circuit, processor and host computer connected in series, and the second end of the resistor bar is grounded;

[0007] When the conductive strip is grounded only through the support component, the automatic sampling circuit is in a non-sampling state;

[0008] When the access portion of the conductive strip is connected to the third end of the resistor strip, and the non-access portion of the conductive strip is grounded through the support component, the automatic sampling circuit is in the sampling state; wherein, the first end and the second end of the resistor strip are the two ends of the resistor strip, and the third end of the resistor strip is not fixed and is located between the first end and the second end of the resistor strip.

[0009] An automatic sample feeding device, wherein the support component is a tray, the resistor strip is located non-contactly above the tray, and the automatic sample feeding device further includes: a test tube rack for holding at least one test tube, and a feeding component disposed on the tray;

[0010] The conductive strip is attached to the bottom of the test tube rack;

[0011] The second end of the resistor strip is located in the loading start area of ​​the tray. When the test tube rack is located in the loading start area of ​​the tray, the access part of the conductive strip is connected to the third end of the resistor strip, and the non-access part of the conductive strip is grounded through the tray. The automatic sample injection circuit is in the sample injection state.

[0012] The first end of the resistor bar is located in the unloading start area of ​​the tray. After the automatic sample feeding circuit is in the sample feeding state, the feeding component drives the test tube rack to move towards the unloading start area according to the real-time voltage value output by the digital-to-analog conversion circuit.

[0013] In one embodiment, the automated sample feeding device further includes a loading assembly and a loading position sensor disposed on the tray;

[0014] When the test tube rack is located at the position of the loading component, the conductive strip is grounded only through the tray, and the automatic sample feeding circuit is in a non-sample feeding state;

[0015] The loading position sensor is located in the loading start area of ​​the tray. The loading assembly drives the test tube rack to move closer to the loading position sensor. When the loading position sensor is triggered by the test tube rack, the access part of the conductive strip is connected to the third end of the resistor strip, and the non-access part of the conductive strip is grounded through the tray. The automatic sample injection circuit is in the sample injection state.

[0016] In one embodiment, the automated sample feeding device further includes an unloading component and an unloading positioning sensor disposed on the tray;

[0017] The unloading component is located in the unloading start area of ​​the tray. The unloading component drives the test tube rack to move towards the unloading position sensor until the unloading position sensor is triggered by the test tube rack. When the test tube rack leaves the unloading start area, the conductive strip is grounded only through the tray, and the automatic sample feeding circuit is in a non-sample feeding state.

[0018] An automated sample introduction method, the method comprising:

[0019] After the automatic sample feeding circuit is in the sample feeding state, the preset voltage value of the target test tube is obtained; wherein, the target test tube is a test tube placed at any position in the test tube rack;

[0020] The feed assembly is driven to move the test tube rack and the real-time voltage value output by the digital-to-analog converter circuit is obtained.

[0021] Determine whether the real-time voltage value is consistent with the preset voltage value;

[0022] If the real-time voltage value is inconsistent with the preset voltage value, the feeding component is driven to move the test tube rack according to the real-time voltage value and the preset voltage value until the real-time voltage value is consistent with the preset voltage value.

[0023] In one embodiment, before obtaining the preset voltage value of the target test tube, the method further includes:

[0024] Whenever a sampling permission command is received for the test tube, the real-time voltage value output by the current digital-to-analog converter circuit is recorded as the preset voltage value of the test tube; wherein, the sampling permission command indicates that the test tube is within the sampling range of the sampling needle, allowing sampling of the test tube.

[0025] In one embodiment, driving the feed assembly to move the test tube rack according to the real-time voltage value and the preset voltage value includes:

[0026] When the real-time voltage value is greater than the preset voltage value, the feeding component is driven to move the test tube rack toward the direction of the unloading start area;

[0027] When the real-time voltage value is less than the preset voltage value, the feed component is driven to move the test tube rack away from the unloading starting area.

[0028] A computer-readable storage medium storing a computer program that, when executed by a processor, causes the processor to perform the steps of the above-described automatic sampling method.

[0029] A control terminal includes a memory and a processor, the memory storing a computer program that, when executed by the processor, causes the processor to perform the steps of the above-described automatic sampling method.

[0030] This invention provides an automatic sample introduction circuit, device, method, medium, and terminal. In this automatic sample introduction circuit, the connection relationship of the conductive strips can first determine whether it is in a non-sample introduction state or in a sample introduction state. Specifically, if the operating voltage provided by the power supply is VCC, in the sample introduction state, the portion of the resistor strip from the first end to the third end belongs to the resistor connected to the automatic sample introduction circuit, denoted as R1, and the portion of the resistor strip from the second end to the third end belongs to the resistor not connected to the automatic sample introduction circuit, denoted as R2. The total resistance of the resistor strip is R0, which satisfies R0 = R1 + R2. The real-time voltage value Vx output by the analog-to-digital converter circuit is Vx = (R2 / (R2 + R1)) * VCC. As can be seen, since the resistance values ​​of R1 and R2 affect the real-time voltage value Vx, by detecting the real-time voltage value Vx, the resistance values ​​of R1 and R2 can be calculated based on the formulas Vx = (R2 / (R2+R1))*VCC and R0 = R1+R2. Then, based on the relationship between the resistance values ​​of R1 and R2, the specific position of the third terminal on the resistor bar RX can be determined. Furthermore, the third terminal of the resistor bar is not fixed; it is located between the first and second terminals of the resistor bar. This allows for automatic sample introduction and positioning, thus preventing the sampling needle from colliding with the sample during subsequent sampling. Further, based on this automatic sample introduction circuit, the feeding component can move the test tube rack towards the unloading starting area based on the real-time voltage value output by the digital-to-analog converter circuit, thereby achieving automatic sample introduction and positioning. Furthermore, based on this automatic sample introduction device, the accuracy of the target test tube's positioning can be determined by comparing the real-time voltage value with a preset voltage value. Attached Figure Description

[0031] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0032] in:

[0033] Figure 1 This is a first schematic diagram of the automatic sample injection circuit in a non-sample injection state;

[0034] Figure 2 This is a first schematic diagram of the automatic sample injection circuit under sample injection conditions;

[0035] Figure 3 This is a first schematic diagram of an automated sample dispenser;

[0036] Figure 4 This is a second schematic diagram of an automated sample dispenser;

[0037] Figure 5 This is a second schematic diagram of the automatic sample injection circuit under sample injection conditions;

[0038] Figure 6 This is the third schematic diagram of the automatic sample injection circuit in the sample injection state;

[0039] Figure 7 This is a second schematic diagram of the autosampler circuit in a non-sample-injection state;

[0040] Figure 8 This is a flowchart illustrating an automated sample introduction method in one embodiment;

[0041] Figure 9 This is a block diagram of the control terminal in one embodiment. Detailed Implementation

[0042] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0043] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0044] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0045] like Figure 1 and Figure 2 As shown, Figure 1 This is a schematic diagram of an autosampler circuit in a non-sample-injection state in one embodiment. Figure 2This is a schematic diagram of an autosampler circuit in one embodiment under sample injection conditions. The autosampler circuit includes a fixed resistor R1, a resistor bar RX, a conductive bar 10, a support assembly 20, an analog-to-digital converter circuit 30, a processor 40, and a host computer 50. The conductive bar 10 includes a connection portion 11 and a non-connection portion 12. The connection relationships of the autosampler circuit differ between the two states. Specifically:

[0046] Corresponding to Figure 1 and Figure 2 The first end of the fixed resistor R1 is connected to the power supply, and the second end of the fixed resistor R1 is connected to the first end of the resistor strip RX, and also connected to the analog-to-digital converter circuit 30, the processor 40, and the host computer 50 connected in series. The second end of the resistor strip RX is grounded. The host computer 50 is used to issue commands, the processor 40 is used to respond to commands and process data, and the analog-to-digital converter circuit 30 can acquire and convert the real-time voltage values ​​across the resistor strip RX. It is worth noting that the resistor strip RX is located non-contactly above the tray, meaning there is a distance between the resistor strip RX and the tray.

[0047] Corresponding to Figure 1 When the conductive strip 10 is grounded only through the support component 20, the automatic sampling circuit is in a non-sampling state. In this non-sampling state, the resistance value of the resistor strip RX connected to the automatic sampling circuit is at its maximum, denoted as R0. At this time, the real-time voltage value output by the digital-to-analog converter circuit is also at its maximum.

[0048] Corresponding to Figure 2 When the access portion 11 of the conductive strip 10 is connected to the third end of the resistor strip RX, and the non-access portion 12 of the conductive strip 10 is grounded through the support component 20, the automatic sampling circuit is in the sampling state; wherein, the first end and the second end of the resistor strip RX are the two ends of the resistor strip RX, and the third end of the resistor strip RX is not fixed and is located between the first end and the second end of the resistor strip RX.

[0049] For example, when the operating voltage supplied by the power supply is VCC and the resistance of the resistor bar RX connected to the automatic sampling circuit is R2, the real-time output voltage value Vx should satisfy Vx = (R2 / (R2+R1))*VCC.

[0050] Understandably, if the operating voltage supplied by the power supply is VCC, in the sample injection state, the portion of the resistor bar RX from the first to the third end belongs to the resistor connected to the autosampler circuit, with a resistance value of R1; the portion of the resistor bar RX from the second to the third end belongs to the resistor not connected to the autosampler circuit, with a resistance value of R2. At this time, R0 = R1 + R2 and the real-time output voltage value Vx = (R2 / (R2 + R1)) * VCC are satisfied. As can be seen, since the resistance values ​​of R1 and R2 affect the real-time voltage value Vx, by detecting the real-time voltage value Vx, the resistance values ​​of R1 and R2 can be calculated based on the formulas Vx = (R2 / (R2+R1))*VCC and R0 = R1+R2. Then, based on the relationship between the resistance values ​​of R1 and R2, the specific position of the third end on the resistor bar RX can be determined. At the same time, the third end of the resistor bar is not fixed, but is located between the first and second ends of the resistor bar. This can help to achieve automatic sampling and automatic sampling positioning, thereby avoiding the situation of the sampling needle colliding during subsequent sampling.

[0051] In one embodiment, such as Figure 3 As shown, Figure 3 This is a schematic diagram of an automated sample dispenser in one embodiment, including the above-mentioned... Figure 1 and Figure 2 The automatic sample feeding circuit includes a support component 20, specifically a tray, which can be divided into a left tray and a right tray. Its function is to support the other components placed on the tray. The resistor strip RX is located non-contactly above the tray, meaning there is a distance between the resistor strip RX and the tray. The automatic sample feeding device also includes: a test tube rack 60 for holding at least one test tube, and a feed component 70 disposed on the tray. Specifically:

[0052] The conductive strip 10 is attached to the bottom of the test tube rack 60. In the sample injection state, as long as the test tube rack 60 is above the resistor strip RX, the conductive strip 10 and the resistor strip RX can make contact. Furthermore, as the position of the test tube rack 60 changes, the resistance value of the resistor strip RX connected to the automatic sample injection circuit also changes. In the non-sample injection state, as long as the test tube rack 60 is not above the resistor strip RX, the conductive strip 10 and the resistor strip RX can be disconnected.

[0053] The second end of the resistance strip RX is located in the loading start area of ​​the tray. When the test tube rack 60 is located in the loading start area of ​​the tray, the access part 11 of the conductive strip 10 is connected to the third end of the resistance strip RX, and the non-access part 12 of the conductive strip 10 is grounded through the tray, and the automatic sample injection circuit is in the sample injection state. In this embodiment, the sample injection direction is set as follows: Figure 3 As indicated by the middle arrow, it can therefore be defined. Figure 3 The area covered by the right-side resistor bar RX on the right-side tray is the loading start area.

[0054] The first end of the resistance bar RX is located in the unloading start area of ​​the tray. After the automatic sample feeding circuit is in the sample feeding state, the feed assembly 70 drives the test tube rack 60 to move towards the unloading start area according to the real-time voltage value output by the digital-to-analog converter circuit. In this embodiment, the area covered by the resistance bar RX on the left tray is the unloading start area.

[0055] During the sample introduction process, the feed assembly 70 moves the first test tube to the sampling position based on the real-time voltage value, and the sampling needle lowers to sample. After sampling is completed, the feed assembly 70 moves the second test tube to the sampling position based on the real-time voltage value, and the sampling needle lowers to sample; and so on, until all test tubes in the test tube rack 60 have been sampled. How exactly the test tubes on the test tube rack 60 are moved to the sampling position based on the real-time voltage value will be described in detail in the method embodiments below, and will not be repeated here.

[0056] Furthermore, in one specific embodiment, such as Figure 4 As shown, the automated sample feeding device also includes a loading assembly 80 and a loading position sensor 90 mounted on a tray, specifically:

[0057] When the test tube rack 60 is located at the setting position of the loading assembly 80, the conductive strip 10 is grounded only through the tray, and the automatic sample injection circuit is in a non-sample injection state; in this embodiment, the setting position is located on the lower side of the right tray. The loading position sensor 90 is set in the loading start area of ​​the tray. The loading assembly 80 drives the test tube rack 60 to move towards the loading position sensor 90. When the loading position sensor 90 is triggered by the test tube rack 60, the access part 11 of the conductive strip 10 is connected to the third end of the resistor strip RX, and the non-access part 12 of the conductive strip 10 is grounded through the tray, and the automatic sample injection circuit is in a sample injection state.

[0058] Furthermore, in one specific embodiment, such as Figure 4 As shown, the automated sample feeding device also includes an unloading assembly 100 and an unloading positioning sensor 110 mounted on a tray, specifically:

[0059] The unloading component 100 is located in the unloading start area of ​​the tray. The unloading component 100 drives the test tube rack 60 to move towards the unloading position sensor 110 until the unloading position sensor 110 is triggered by the test tube rack 60. When the test tube rack 60 leaves the unloading start area, the conductive strip 10 is grounded only through the tray, and the automatic sample injection circuit is in a non-sample injection state.

[0060] In general, refer to Figures 1-2 , Figures 5-7The schematic diagram illustrates the entire sampling process as follows: The test tube rack 60 is placed at the designated position of the right tray loading component 80. The loading component pushes the test tube rack 60 to the loading position sensor 90, triggering the loading position sensor 90. At this point, the automatic sampling circuit is in the sampling state. Next, the feeding component 70 moves the test tube rack 60, moving the first test tube to the sampling position, and the sampling needle lowers to sample. After sampling, the feeding component 70 moves the second test tube to the sampling position, and the sampling needle lowers to sample; this continues until all test tubes in all test tube racks 60 have been sampled. Then, the unloading component 100 pushes the test tube rack 60 off the resistor bar RX, and the automatic sampling circuit is in the non-sampling state. When the test tube rack 60 is pushed to the designated position of the unloading position sensor 110, the unloading position sensor 110 is triggered, confirming the completion of one automatic sampling operation. Sampling can then be performed on the next test tube rack 60. It is evident that the entire process is fully automated, and the application of the automatic sampling circuit avoids the sampling needle from colliding during sampling.

[0061] The present invention also proposes an embodiment of an automated sample introduction method, which applies the above-described automated sample introduction device, wherein, as... Figure 8 As shown, the steps provided by the automatic sample introduction method in this embodiment specifically include:

[0062] S801, after the automatic sample injection circuit is in the sample injection state, acquires the preset voltage value of the target test tube.

[0063] The target test tube is any test tube placed at any position within the test tube rack 60. For example, if test tubes are placed at sampling positions 1-10, but only the test tube at sampling position 2 needs to be sampled, then that test tube will be the target test tube.

[0064] In one specific embodiment, the preset voltage values ​​of all test tubes on the test tube rack 60 are obtained through prior experiments. Specifically, the method is as follows: the test tubes numbered 1-10 are manually confirmed to be aligned with the sampling needle. Whenever a sampling permission instruction for a test tube is obtained, the real-time voltage value output by the current digital-to-analog converter circuit is recorded as the preset voltage value of the test tube. The sampling permission instruction indicates that the test tube is within the sampling range of the sampling needle, allowing sampling of the test tube. This instruction is issued by the tester through the host computer 50.

[0065] S802 drives the feed assembly to move the test tube rack and acquires the real-time voltage value output by the digital-to-analog converter circuit.

[0066] S803, determine whether the real-time voltage value is consistent with the preset voltage value. If the real-time voltage value is inconsistent with the preset voltage value, then execute S804; if the real-time voltage value is consistent with the preset voltage value, then execute S805.

[0067] S804 drives the feed component to move the test tube rack according to the real-time voltage value and the preset voltage value until the real-time voltage value is consistent with the preset voltage value.

[0068] Understandably, the resistance of the resistor RX is at its maximum when the test tube rack 60 has not yet reached the loading sensor 90. When the test tube rack 60 reaches the loading sensor 90, one end of the conductive strip 10 contacts the resistor RX, and simultaneously the conductive strip 10 contacts the tray, causing the resistance of the resistor RX to decrease. As the test tube rack 60 moves through the feed assembly 70, the resistance of the resistor RX gradually decreases, and when the test tube rack 60 moves to the leftmost end, the resistance of the resistor RX approaches 0.

[0069] Therefore, in a specific embodiment, the movement is controlled as follows: when the real-time voltage value is greater than the preset voltage value, the feed component 70 drives the test tube rack 60 to move towards the direction closer to the unloading start area; when the real-time voltage value is less than the preset voltage value, the feed component 70 drives the test tube rack 60 to move away from the unloading start area until the real-time voltage value is consistent with the preset voltage value.

[0070] S805, drive the feed component to wait so that the test tubes on the test tube rack are sampled at the current position.

[0071] At this point, the target test tube and the sampling needle are aligned, ensuring normal sampling.

[0072] Figure 9 An internal structural diagram of the control terminal in one embodiment is shown. Figure 9 As shown, the control terminal includes a processor, a memory, and a network interface connected via a system bus. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and may also store a computer program. When executed by the processor, this computer program enables the processor to implement a sample file management method. The internal memory may also store a computer program, which, when executed by the processor, enables the processor to implement the sample file management method. Those skilled in the art will understand that... Figure 9 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the control terminal to which the present application is applied. A specific control terminal may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0073] A computer-readable storage medium storing a computer program, which, when executed by a processor, performs the following steps: after the automatic sample feeding circuit is in the sample feeding state, acquiring a preset voltage value of the target test tube; driving the feeding component to move the test tube rack, and acquiring a real-time voltage value output by the digital-to-analog conversion circuit; determining whether the real-time voltage value is consistent with the preset voltage value; if the real-time voltage value is inconsistent with the preset voltage value, driving the feeding component to move the test tube rack according to the real-time voltage value and the preset voltage value until the real-time voltage value is consistent with the preset voltage value.

[0074] A control terminal includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it performs the following steps: after the automatic sample feeding circuit is in the sample feeding state, it acquires a preset voltage value of the target test tube; it drives the feeding component to move the test tube rack and acquires the real-time voltage value output by the digital-to-analog converter circuit; it determines whether the real-time voltage value is consistent with the preset voltage value; if the real-time voltage value is inconsistent with the preset voltage value, it drives the feeding component to move the test tube rack according to the real-time voltage value and the preset voltage value until the real-time voltage value is consistent with the preset voltage value.

[0075] It should be noted that the above-mentioned automatic sample introduction circuit, device, method, medium and terminal belong to a general inventive concept, and the contents of the embodiments of the automatic sample introduction circuit, device, method, medium and terminal are applicable to each other.

[0076] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. This program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0077] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0078] The above embodiments merely illustrate several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An automatic sample feeding device, characterized in that, It includes an automatic sample injection circuit, which includes a fixed resistor, a resistance strip, a conductive strip, a support assembly, an analog-to-digital converter circuit, a processor, and a host computer. The conductive strip includes a connected access part and a non-access part. The first end of the fixed resistor is connected to the power supply, the second end of the fixed resistor is connected to the first end of the resistor bar, and is connected to the analog-to-digital converter circuit, processor and host computer connected in series, and the second end of the resistor bar is grounded; When the conductive strip is grounded only through the support component, the automatic sampling circuit is in a non-sampling state; When the access portion of the conductive strip is connected to the third end of the resistor strip, and the non-access portion of the conductive strip is grounded through the support component, the automatic sampling circuit is in the sampling state; wherein, the first end and the second end of the resistor strip are the two ends of the resistor strip, and the third end of the resistor strip is not fixed and is located between the first end and the second end of the resistor strip. The support component is a tray, and the resistance strip is located non-contactly above the tray. The automatic sample feeding device also includes: a test tube rack for holding at least one test tube, and a feeding component disposed on the tray. The conductive strip is attached to the bottom of the test tube rack; The second end of the resistor strip is located in the loading start area of ​​the tray. When the test tube rack is located in the loading start area of ​​the tray, the access part of the conductive strip is connected to the third end of the resistor strip, and the non-access part of the conductive strip is grounded through the tray. The automatic sample injection circuit is in the sample injection state. The first end of the resistor bar is located in the unloading start area of ​​the tray. After the automatic sample feeding circuit is in the sample feeding state, the feeding component drives the test tube rack to move towards the unloading start area according to the real-time voltage value output by the analog-to-digital conversion circuit.

2. The automatic sample feeding device according to claim 1, characterized in that, The automated sample feeding device also includes a loading assembly and a loading positioning sensor disposed on the tray; When the test tube rack is located at the position of the loading component, the conductive strip is grounded only through the tray, and the automatic sample feeding circuit is in a non-sample feeding state; The loading position sensor is located in the loading start area of ​​the tray. The loading assembly drives the test tube rack to move closer to the loading position sensor. When the loading position sensor is triggered by the test tube rack, the access part of the conductive strip is connected to the third end of the resistor strip, and the non-access part of the conductive strip is grounded through the tray. The automatic sample injection circuit is in the sample injection state.

3. The automatic sample feeding device according to claim 1, characterized in that, The automated sample feeding device also includes an unloading assembly and an unloading positioning sensor disposed on the tray; The unloading component is located in the unloading start area of ​​the tray. The unloading component drives the test tube rack to move towards the unloading position sensor until the unloading position sensor is triggered by the test tube rack. When the test tube rack leaves the unloading start area, the conductive strip is grounded only through the tray, and the automatic sample feeding circuit is in a non-sample feeding state.

4. An automated sample introduction method, characterized in that, The method, using the automated sample dispenser as described in claim 1, comprises: After the automatic sample feeding circuit is in the sample feeding state, the preset voltage value of the target test tube is obtained; wherein, the target test tube is a test tube placed at any position in the test tube rack; The feed assembly is driven to move the test tube rack and the real-time voltage value output by the analog-to-digital conversion circuit is obtained. Determine whether the real-time voltage value is consistent with the preset voltage value; If the real-time voltage value is inconsistent with the preset voltage value, the feeding component is driven to move the test tube rack according to the real-time voltage value and the preset voltage value until the real-time voltage value is consistent with the preset voltage value.

5. The method according to claim 4, characterized in that, Before obtaining the preset voltage value of the target test tube, the method further includes: Whenever a sampling permission command is received for the test tube, the real-time voltage value output by the analog-to-digital conversion circuit is recorded as the preset voltage value of the test tube; wherein, the sampling permission command indicates that the test tube is within the sampling range of the sampling needle, allowing sampling of the test tube.

6. The method according to claim 4, characterized in that, The step of driving the feed component to move the test tube rack according to the real-time voltage value and the preset voltage value includes: When the real-time voltage value is greater than the preset voltage value, the feeding component is driven to move the test tube rack toward the direction of the unloading start area; When the real-time voltage value is less than the preset voltage value, the feed component is driven to move the test tube rack away from the unloading starting area.

7. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it causes the processor to perform the steps of the method as described in any one of claims 4 to 6.

8. A control terminal, comprising a memory and a processor, characterized in that, The memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 4 to 6.

Citation Information

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