A method, apparatus and equipment for testing equipment.

Abstract

This application discloses a device testing method, apparatus, and device. The method includes: acquiring a device to be tested and placing the device to be tested in a testing scenario; the testing scenario includes at least two first scenarios, each with different environmental parameters; testing the device to be tested in the first scenario to obtain testing data corresponding to at least two functions of the device to be tested; and determining the performance level of the device to be tested in the first scenario based on the testing data corresponding to each function.

Description

Technical Field

[0001] This application relates to, but is not limited to, the field of performance detection technology, and particularly relates to a device detection method, apparatus, and device. Background Art

[0002] Currently, most devices operate in a multi-variable usage environment, and the performance of the devices changes with different degrees of use. Therefore, it is necessary to detect the devices in different environments to evaluate the applicable environment of the devices.

[0003] In the related art, when performing performance detection on a device, only whether each performance corresponding to the device is qualified or unqualified can be obtained. The detection result is single, and the performance of the device under different environmental conditions cannot be comprehensively evaluated. The detection result cannot comprehensively reflect the various functional indicators of the device. Therefore, how to determine the comprehensive performance of the device has become an urgent problem to be solved. Summary of the Invention

[0004] Based on the problems existing in the related art, embodiments of this application provide a device detection method, apparatus, and device.

[0005] The technical solution of the embodiments of this application is implemented as follows:

[0006] Embodiments of this application provide a device detection method, and the method includes:

[0007] Obtain a device to be detected, and place the device to be detected in a detection scenario; the detection scenario includes at least two first scenarios, and each first scenario has different environmental parameters;

[0008] Detect the device to be detected in the first scenario, and obtain detection data corresponding to at least two functions in the device to be detected;

[0009] Determine the performance level of the device to be detected in the first scenario according to the detection data corresponding to each function.

[0010] In some embodiments, the device to be detected at least includes a display screen, and the detection scenario further includes a second scenario;

[0011] After obtaining the device to be detected, the method further includes:

[0012] Place the device to be detected in the second scenario, and obtain the first display brightness of the display interface at the first moment;

[0013] At the second moment, detect the display brightness of the display interface, and obtain the second display brightness, where the second moment is greater than the first moment;

[0014] Based on the first display brightness and the second display brightness, a first brightness attenuation value of the device under test in the second scenario is determined.

[0015] In some embodiments, the method further includes:

[0016] After determining the first brightness attenuation value, the device under test is powered off.

[0017] In response to the first time period after the device under test is powered off, the device under test is started.

[0018] In some embodiments, the device under test includes at least a screen display function;

[0019] After activating the device under test, the process of testing the device under test to obtain test data corresponding to at least two functions of the device under test includes:

[0020] In the first scenario, the third display brightness of the display interface at the third moment is obtained;

[0021] At the fourth moment, the display brightness of the display interface is detected to obtain a fourth display brightness, wherein the fourth moment is greater than the third moment;

[0022] Based on the third display brightness and the fourth display brightness, determine the second brightness attenuation value of the device under test in the first scenario;

[0023] Based on the first brightness attenuation value and the second brightness attenuation value, the detection data of the screen display function in the first scenario is determined.

[0024] In some embodiments, the environmental parameters include at least one of the following: temperature, humidity, atmospheric pressure, and ambient light.

[0025] In some embodiments, the method further includes:

[0026] Obtain a functional hierarchy list, which includes at least two functional levels for each function and performance requirements for each functional level.

[0027] The step of determining the performance level of the device under test in the first scenario based on the detection data corresponding to each function includes:

[0028] In the functional classification list, the functional level corresponding to each function in the first scenario is determined based on the detection data corresponding to each function in the first scenario and the performance requirements corresponding to each functional level.

[0029] The performance level of the device under test in the first scenario is determined based on the function level corresponding to each function of the device under test in the first scenario; wherein the performance level of the device under test may be the same or different in different first scenarios.

[0030] In some embodiments, determining the performance level of the device under test in each testing scenario based on the functional level corresponding to each function of the device under test in each testing scenario includes:

[0031] In the at least two functions of the device under test, the number of functions that meet the function level requirements is determined according to the function level corresponding to each function in each test scenario.

[0032] Based on the number of functions and the preset grading standards, the performance level of the device under test in each testing scenario is determined.

[0033] In some embodiments, the functions of the device under test include at least mechanical functions, operational functions, and battery life functions.

[0034] This application provides a device for testing equipment, the device comprising:

[0035] An acquisition module is used to acquire the device to be detected and place the device to be detected in a first scene;

[0036] The detection module is used to detect the device under test and obtain detection data corresponding to at least two functions of the device under test;

[0037] The determination module is used to determine the performance level of the device under test in the first scenario based on the detection data corresponding to each function.

[0038] This application provides a device testing device, including a processor and a memory. The memory stores a computer program that can run on the processor. When the processor executes the computer program, it implements the device testing method described above.

[0039] This application provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the above-described device detection method.

[0040] This application provides a computer program product, which includes executable instructions stored in a computer-readable storage medium; when the processor of a device detection device reads the executable instructions from the computer-readable storage medium and executes the executable instructions, the above-described device detection method is implemented.

[0041] The device testing method, apparatus, and equipment provided in this application have two aspects. First, by placing the device under test in testing scenarios with different environmental parameters and testing the device, the performance of the device under test in different environments can be determined. Based on the performance, the optimal operating environment for the device under test can be determined. Placing the device under test in the most suitable environment can improve its operating efficiency and extend its service life. Second, by testing the device under test, this application can obtain testing data corresponding to at least two functions of the device. Based on the testing data corresponding to each function, the performance level of the device under test in a first scenario can be determined. In this way, the testing data of each function can be combined to analyze the device under test and obtain the performance level corresponding to the comprehensive performance of the device. This avoids the problem of incomplete performance analysis due to a single testing result and improves the reliability and accuracy of the testing results.

[0042] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this application. Attached Figure Description

[0043] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with this application and, together with the specification, serve to explain the technical solutions of this application.

[0044] Figure 1 This is a schematic diagram illustrating the implementation process of a device testing method provided in an embodiment of this application;

[0045] Figure 2 This is a schematic diagram illustrating the implementation process of a device testing method provided in an embodiment of this application;

[0046] Figure 3 This is a schematic diagram illustrating the implementation process of a device testing method provided in an embodiment of this application;

[0047] Figure 4 This is a schematic diagram illustrating the implementation process of a device testing method provided in an embodiment of this application;

[0048] Figure 5 This is a schematic diagram illustrating the implementation process of a screen display function detection method provided in an embodiment of this application;

[0049] Figure 6 This is a schematic diagram of a device testing apparatus provided in an embodiment of this application;

[0050] Figure 7 This is a schematic diagram of the hardware entity of a device testing device provided in an embodiment of this application. Detailed Implementation

[0051] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations on this application. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0052] In the following description, references are made to “some embodiments,” which describe a subset of all possible embodiments. However, it is understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0053] In the following description, the terms "first, second, third" are used merely to distinguish similar objects and do not represent a specific ordering of objects. It is understood that "first, second, third" may be interchanged in a specific order or sequence where permitted, so that the embodiments of this application described herein can be implemented in an order other than that illustrated or described herein.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0055] Currently, existing performance testing standards typically award pass or fail results for high-temperature testing of equipment. This approach fails to comprehensively reflect the equipment's performance under high-temperature conditions and does not adequately represent all of the equipment's performance indicators.

[0056] To address the problems existing in related technologies, this application provides a device testing method, apparatus, and device. On one hand, this application places the device under test in testing scenarios with different environmental parameters and tests the device, determining its performance under different environments. Based on the performance, the optimal operating environment for the device is determined, improving its operating efficiency and lifespan. On the other hand, this application tests the device to obtain testing data corresponding to at least two functions of the device. Based on the testing data corresponding to each function, the performance level of the device in the first scenario is determined. Thus, by combining the testing data of each function, the device can be analyzed to obtain the overall performance level, avoiding the problem of incomplete performance analysis due to a single testing result, and improving the reliability and accuracy of the testing results.

[0057] The device detection method provided in this application embodiment can be executed by electronic devices such as device detection equipment. The device detection equipment can be various types of terminals, such as laptops, tablets, desktop computers, set-top boxes, and mobile devices (e.g., mobile phones, portable music players, personal digital assistants, dedicated messaging devices, portable gaming devices), or it can be implemented as a server. The server can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, content delivery networks (CDNs), and big data and artificial intelligence platforms.

[0058] The following will describe an exemplary application of the device detection device when it is implemented as a server. The technical solutions in the embodiments of this application will be clearly and completely described in conjunction with the accompanying drawings.

[0059] Figure 1 This is a schematic diagram illustrating the implementation flow of a device testing method provided in an embodiment of this application, as shown below. Figure 1 As shown, the method is implemented through steps S101 to S103:

[0060] Step S101: Obtain the device to be tested and place the device to be tested in the testing scenario; the testing scenario includes at least two first scenarios, each with different environmental parameters.

[0061] In some embodiments, the device under test may be an electronic device such as a portable computer or mobile phone, or some mechanical device. The testing scenario refers to the testing environment in which the performance of the device under test is performed. The testing scenario includes at least two first scenarios with different environmental parameters. Here, the environmental parameters include at least one of the following: temperature, humidity, atmospheric pressure, and ambient light. That is, the first scenario may be an environmental scenario with a temperature of (55±1) degrees Celsius and a relative humidity of (90±1)%, or it may be an environmental scenario with a temperature of (40±1)℃ and an atmospheric pressure between 86 kPa and 106 kPa.

[0062] In this embodiment of the application, after obtaining the device to be tested, the device to be tested is placed in a first scenario, and the performance of the device to be tested in the first scenario is tested.

[0063] Step S102: Detect the device under test in the first scenario to obtain detection data corresponding to at least two functions of the device under test.

[0064] In this embodiment of the application, the device under test has at least two functions, such as power on / off function, voice call function, application usage function, volume adjustment function and other basic device functions, wherein the power on / off function and other functions are sub-functions of the basic device functions; mechanical functions such as shell stress, keyboard pressing, hinge bending, interface plugging and unplugging; operational functions such as runtime delay and stuttering; battery life function and screen display function.

[0065] By testing the device under test in each first scenario, we can obtain the test data corresponding to each function of the device under test in that first scenario. Here, the test data can be the test results of all sub-functions corresponding to each function. For example, the test results may include the device under test being able to power on and off normally, the application running normally, and the keyboard being able to be pressed normally in the first scenario.

[0066] Step S103: Determine the performance level of the device under test in the first scenario based on the detection data corresponding to each function.

[0067] In this embodiment of the application, after determining the detection data of each function of the device under test in the first scenario, the function level of each function can be determined based on the detection data of the sub-functions in each function, and then the performance level of the device under test can be determined based on the function level of each function.

[0068] For example, when the device under test is a portable computer, its basic functions include nine sub-functions: power on / off, voice call, application usage, photo taking, video recording, audio playback, video playback, brightness adjustment, and volume adjustment. Based on the portable computer's test data in the first scenario, the pass / fail status of each sub-function is determined to establish the functional level of each function (e.g., if all nine sub-functions pass, the functional level of the basic device functions is Level 1; if eight sub-functions pass, the functional level of the basic device functions is Level 2).

[0069] After determining the functional level corresponding to each function of the device under test, the performance level of the device under test in the first scenario is determined based on the functional level corresponding to each function. For example, a portable computer has five functions: basic device functions, mechanical functions, operational functions, screen display functions, and battery life functions. If the functional level of the five functions is all Level 1, then the performance level of the portable computer is determined to be A. If four of the five functions are Level 1, and the functional level of the remaining function is not Level 5 (i.e., all sub-functions of that function are unqualified), then the performance level of the portable computer is determined to be B.

[0070] It should be noted that this application only provides a feasible example of functional and performance level classification, and does not imply that this example can be used to limit the scope of application of this application.

[0071] In some embodiments, the detection scenario includes multiple first scenarios with different parameters. After detecting the device under test in different first scenarios, the detection data in different first scenarios can be the same or different. Based on the detection data in different first scenarios, the suitable operating area for the device under test can be determined. For example, there are huge differences in climate between the north and south of my country, with different humidity and temperature. After detecting the device under test using the device detection method provided in this application, the suitable operating area for the device under test can be determined. For example, using high-performance equipment in environments with high humidity and high temperature in the south can improve the operating efficiency of the device under test and also extend its service life.

[0072] This application embodiment, on the one hand, places the device under test in testing scenarios with different environmental parameters and tests the device, which can determine the performance of the device under test in different environments and determine the optimal operating environment for the device under test based on the performance. Placing the device under test in the most suitable environment can improve the operating efficiency and extend the service life of the device under test. On the other hand, this application embodiment can obtain test data corresponding to at least two functions of the device under test during testing. Based on the test data corresponding to each function, the performance level of the device under test in the first scenario can be determined. In this way, the test data of each function can be combined to analyze the device under test and obtain the performance level corresponding to the comprehensive performance of the device under test. This avoids the problem of incomplete performance analysis due to single test results and improves the reliability and accuracy of the test results.

[0073] In some embodiments, environmental parameters include at least one of the following: temperature, humidity, atmospheric pressure, and ambient light. The device under test includes at least a display screen, and its functions include at least screen display functionality. This application embodiment can use the attenuation of the display screen brightness to detect the screen display function of the device under test in different scenarios. It should be noted that the brightness of the display screen of the device under test will normally attenuate during normal use. Therefore, this application embodiment can use the ratio of screen brightness attenuation in different temperature scenarios and normal temperature scenarios to detect the screen display function of the device under test in different temperature scenarios.

[0074] Here, when testing the screen display function, the ambient light in the environment will affect the screen brightness. In order to ensure the accuracy of the screen display function test, it is necessary to ensure that the ambient light of the device under test is the same in different temperature scenarios and normal temperature scenarios. For example, the device under test can be placed in the same light and the same position in different temperature scenarios and normal temperature scenarios to ensure that the ambient light is the same. Then, other environmental parameters in different temperature scenarios are changed to determine the test data of the screen display function in different first scenarios.

[0075] In some embodiments, before testing the screen display function of the device under test at different temperatures, it is necessary to test the screen brightness decay of the device under test at room temperature. Figure 2 This is a schematic diagram illustrating the implementation flow of a device testing method provided in an embodiment of this application, as shown below. Figure 2 As shown, the screen display function test at room temperature can be achieved through steps S201 to S203:

[0076] Step S201: Place the device to be tested in the second scene of the testing scenario and obtain the first display brightness of the display interface at the first moment.

[0077] Here, the second scenario can refer to a normal temperature environment, such as a scenario with a temperature of 20±5℃, a relative humidity between 45% and 75%, and an atmospheric pressure between 86kPa and 106kPa. The device to be tested is placed at a fixed position in the second scenario, and at the first moment (which can be when the device has been turned on and left to stand for 30 minutes), the first display brightness L1 of the display interface of the device to be tested is obtained.

[0078] Step S202: At the second moment, the display brightness of the display interface is detected to obtain a second display brightness, wherein the second moment is greater than the first moment.

[0079] In this embodiment of the application, after obtaining the first display brightness, the device to be tested is left to stand still, allowing the display brightness of the device to be tested to decay naturally under normal temperature conditions. After a preset time period (e.g., five hours), the display brightness of the display interface is tested again to obtain the second display brightness L2 of the display interface.

[0080] Step S203: Determine the first brightness attenuation value of the device under test in the second scenario based on the first display brightness and the second display brightness.

[0081] In some embodiments, the first brightness attenuation value Y of the device under test in a normal temperature scenario (i.e., the second scenario) can be achieved by formula (1):

[0082]

[0083] Where L1 is the first display brightness; L2 is the second display brightness; and Y is the first brightness attenuation value.

[0084] In this embodiment of the application, after determining the screen display function at room temperature, the brightness of the display screen has naturally decreased. In order to more accurately detect the brightness decrease of the display screen in different scenarios, it is necessary to let the device under test stand still and recover. Therefore, the device under test can be turned off. In response to the first time period after the device under test is turned off (for example, it can be turned off and left to stand still for 1 hour), the device under test is restarted so that the brightness of the device under test at this time is the initial display brightness of the device under test.

[0085] Based on the above embodiments, Figure 3 This is a schematic diagram illustrating the implementation flow of a device testing method provided in an embodiment of this application, as shown below. Figure 3 As shown, the detection data for determining the screen display function under different first scenarios can be achieved through steps S301 to S304:

[0086] Step S301: In the first scenario, obtain the third display brightness of the display interface at the third moment.

[0087] In this embodiment, the first scenario can be a high-temperature scenario, for example, a scenario with a temperature of (55±1)℃, a relative humidity of (90±1)%, and an atmospheric pressure between 86kPa and 106kPa. Here, the physical locations of the first and second scenarios with different environmental parameters can be the same or different. For example, the first and second scenarios can be in the same laboratory, only the environmental parameters of the laboratory are changed.

[0088] In some embodiments, the device to be tested is placed in a first scene and in the same position as the fixed position in the second scene, so as to ensure that the ambient light corresponding to the display screen of the device to be tested in the first scene is the same as the ambient light during testing in the second scene, and to avoid errors in the detection data caused by different ambient light.

[0089] In this embodiment of the application, after the device to be tested is placed in a fixed position, the third display brightness L3 of the current display interface is obtained. Here, the third moment can refer to the moment before the device to be tested has undergone high-temperature treatment.

[0090] Step S302: At the fourth moment, the display brightness of the display interface is detected to obtain the fourth display brightness, wherein the fourth moment is greater than the third moment.

[0091] In this embodiment of the application, the device to be tested is placed in a static state in the first scenario. After a preset static time period (the same as the static time in the second scenario, for example, five hours), the display brightness of the display interface is detected again at the fourth moment to obtain the fourth display brightness L4 of the display interface.

[0092] Step S303: Determine the second brightness attenuation value of the device under test in the first scenario based on the third display brightness and the fourth display brightness.

[0093] In this embodiment, the first brightness attenuation value Z of the device under test in the first scene can be achieved by formula (2):

[0094]

[0095] Where L3 is the first display brightness; L4 is the second display brightness; and Z is the second brightness attenuation value.

[0096] In the embodiments of this application, the second brightness attenuation value of the device under test obtained in the first scene under different environmental parameters may be the same or different.

[0097] Step S304: Determine the detection data of the screen display function in the first scenario based on the first brightness attenuation value and the second brightness attenuation value.

[0098] In this embodiment of the application, based on the first brightness attenuation value Y in the normal temperature scenario (i.e., the second scenario) and the second brightness attenuation value Z in the high temperature scenario (i.e., the first scenario), the detection data of the screen display function of the device under test in the high temperature scenario (i.e., the first scenario) can be obtained, that is, the screen brightness attenuation value of the device under test.

[0099] In some embodiments, the screen brightness attenuation value X of the device under test can be achieved by formula (3):

[0100]

[0101] In some embodiments, the screen brightness attenuation value X can be presented as a percentage. When the screen brightness attenuation value X is between 0% and 5%, the function level of the screen display function is Level 1; when the screen brightness attenuation value X is between 5% and 10%, the function level of the screen display function is Level 2; when the screen brightness attenuation value X is between 10% and 15%, the function level of the screen display function is Level 3; when the screen brightness attenuation value X is between 15% and 20%, the function level of the screen display function is Level 4; and when the screen brightness attenuation value X is greater than 20%, the function level of the screen display function is Level 5.

[0102] In some embodiments, after determining the test data corresponding to at least two functions in the device under test, a function classification list can be obtained. The function classification list includes at least two function levels corresponding to each function and the performance requirements corresponding to each function level. In some embodiments, the function classification list is shown in Table 1.

[0103] Table 1

[0104]

[0105] In some embodiments, the division of functional levels in the functional hierarchy list can be determined according to the actual situation and functions of the device. Table 1 only provides one example and is not intended to limit this application.

[0106] Based on the above functional classification list and the test data corresponding to each function in the device under test, the performance level of the device under test in the first scenario can be determined. Figure 4 This is a schematic diagram illustrating the implementation flow of a device testing method provided in an embodiment of this application, as shown below. Figure 4 As shown, step S103 can be achieved through steps S401 to S402:

[0107] Step S401: In the functional classification list, determine the functional level corresponding to each function in the first scenario based on the detection data corresponding to each function in the first scenario and the performance requirements corresponding to each functional level.

[0108] This application embodiment can determine the functional level of each function in the first scenario by searching the functional level list based on the test data of each function in the first scenario (i.e. whether each sub-function is qualified) and the performance requirements corresponding to each functional level in the functional level list.

[0109] Step S402: Determine the performance level of the device under test in the first scenario based on the function level corresponding to each function of the device under test in the first scenario; wherein, the performance level of the device under test may be the same or different in different first scenarios.

[0110] In some embodiments, step S402 can be implemented by steps S4021 and S4022.

[0111] Step S4021: Among the at least two functions of the device under test, determine the number of functions whose function level meets the function level requirements based on the function level corresponding to each function in each test scenario.

[0112] Here, the functional level requirements can be set by technical personnel according to the actual situation; it can be either level one or level two. This application embodiment uses level one functional level requirements as an example.

[0113] In this embodiment of the application, after determining the functional level of each function of the device under test, the number of functions that meet the first-level requirements among the multiple functions of the device under test can be determined.

[0114] Step S4022: Determine the performance level of the device under test in each testing scenario based on the number of functions and the preset grading standard.

[0115] In this embodiment of the application, after determining the number of functions in the device under test that meet the first-level requirements, the performance level of the device under test in the first scenario is determined according to a preset grading standard.

[0116] In some embodiments, the preset grading criteria can be set by technicians according to the actual situation of the device to be tested. For example, the preset grading criteria can be as shown in Table 2.

[0117] Table 2

[0118] Note: After testing the equipment, all sub-functions of the basic functions of the equipment must be normal. If any function fails, the performance level of the equipment will be Grade E.

[0119] The device testing method provided in this application has two aspects. First, the device under test is placed in testing scenarios with different environmental parameters, and the device under test is tested. This allows the performance of the device under test to be determined under different environments, and the optimal operating environment for the device under test can be determined based on the performance. Placing the device under test in the most suitable environment can improve the operating efficiency of the device under test and also extend its service life. Second, the device under test can obtain testing data corresponding to at least two functions of the device under test. Based on the testing data corresponding to each function, the performance level of the device under test in the first scenario can be determined. In this way, the testing data of each function can be combined to analyze the device under test and obtain the performance level corresponding to the comprehensive performance of the device under test. This avoids the problem of incomplete performance analysis due to a single testing result and improves the reliability and accuracy of the testing results.

[0120] This application provides another example of the application of a device testing method in a real-world scenario.

[0121] To address the issue of single-result equipment testing in related technologies, this application proposes a comprehensive equipment testing method for the device under test. In the case of a portable computer, the method involves high-temperature performance testing of the device under test.

[0122] First, the high-temperature scenarios are classified into four categories: Scenario 1 (55±1)℃ and relative humidity (90±1)%; Scenario 2 (50±1)℃ and relative humidity (85±1)%; Scenario 3 (45±1)℃ and relative humidity (80±1)%; and Scenario 4 (40±1)℃ and relative humidity (75±1)%. This approach, considering both temperature and humidity, is more suitable for China's specific conditions and can cover multiple latitude regions.

[0123] Secondly, functional tests are performed on the device under test under different high-temperature scenarios. The device under test must have at least five functions: basic functions, mechanical functions, operational functions, screen display functions, and battery life functions. Each function has different sub-functions. For example, basic functions include at least power on / off functions, voice call functions, application usage functions, photo taking functions, video recording functions, audio playback functions, video playback functions, brightness adjustment functions, and volume adjustment functions; mechanical functions include at least shell stress testing, sharp edge and sharp corner testing, keyboard pressing testing, hinge bending testing, free drop testing, and interface plugging / unplugging testing; operational functions include at least whether there are delays or stutters in device operation; battery life functions include at least that the actual battery life of the device under test should not be less than 4 hours under specified operating conditions; and screen display functions include at least whether the screen brightness of the device under test decreases under high-temperature conditions.

[0124] Among them, screen brightness decay is used as the test target for evaluating the screen display function of the device under test. Figure 5 This is a schematic diagram illustrating the implementation process of a screen display function detection method provided in an embodiment of this application, as shown below. Figure 5 As shown, the screen display function of the device under test at high temperature is implemented through steps S501 to S511:

[0125] S501. The device to be tested should be powered on and left to stand for 30 minutes.

[0126] Place the device to be tested in a normal temperature environment, which can be a temperature of 20±5℃, a relative humidity of 45% to 75%, and an atmospheric pressure of 86kPa to 106kPa.

[0127] S502, Detect the screen brightness value A of the device under test.

[0128] After the device under test has been left to stand for 30 minutes, the screen brightness value A of the device under test is measured.

[0129] S503, let the equipment to be tested stand for H+3 hours.

[0130] Here, "resting" refers to resting at room temperature. The duration of H can be set by technicians according to their needs.

[0131] S504. Detect the screen brightness value B of the device under test.

[0132] After the device under test has been left to stand for H+3 hours, the screen brightness value B of the device under test is measured.

[0133] S505. Determine the screen brightness decay value of the device under test in a normal temperature environment.

[0134] In some embodiments, the screen brightness attenuation value Y of the device under test in a normal temperature scenario is as shown in formula (4):

[0135]

[0136] S506. The device to be tested must be shut down for 1 hour.

[0137] After detecting the screen brightness decay value under normal temperature conditions, restore the device under test and let it stand for 1 hour after powering it off.

[0138] S507. The device to be tested should be powered on and left to stand for 30 minutes.

[0139] S508. Detect the screen brightness value a of the device to be tested.

[0140] Place the device under test in a high-temperature environment and measure the screen brightness value 'a' of the device under test before conducting the high-temperature test.

[0141] S509. Perform a high-temperature test on the equipment to be tested.

[0142] High-temperature testing can be conducted under any of the high-temperature scenarios mentioned above.

[0143] S510, Detect the screen brightness value b of the device to be tested.

[0144] Here, it can also be that after the device under test is left to stand in a high-temperature environment for H+3 hours, the screen brightness value b of the device under test is measured.

[0145] S511. Determine the screen brightness decay value of the device under test in a high-temperature scenario.

[0146] In some embodiments, the screen brightness attenuation value Z of the device under test in a high-temperature scenario is as shown in formula (5):

[0147]

[0148] In some embodiments, the screen brightness decay value X of the device under test at high temperature can be achieved by formula (6):

[0149]

[0150] In some embodiments, the basic functions of the device under test after high-temperature treatment can be determined by technicians to be qualified. Mechanical function testing, including shell stress testing, involves applying a constant force of 250N±10N to the top, bottom, and sides of the external protective cover of the device under test for 5 seconds. Sharp edge / angle testing can be performed by applying stress to the device under test using a sharp edge tester. Keyboard pressing testing involves pressing each of five randomly selected keys (e.g., W, E, A, O, and spacebar) at least 10 times while the product is powered on, and then checking the key functions. Shaft bending testing involves opening and closing the device under test at its maximum and minimum angles at least 10 times, followed by a functional and visual inspection of the shaft after the test.

[0151] In some embodiments, the functional testing of the device under test after high-temperature treatment can be compared with a machine with the same configuration under normal temperature conditions to check for any delays, stuttering, or other issues. Battery life testing can also be compared with a machine with the same configuration under normal temperature conditions to check if the battery life has decreased.

[0152] Finally, based on the test results of the equipment under test, Table 1, and Table 2, the test results of various functions are combined to classify the performance level of the equipment under test.

[0153] This application's embodiments consider humidity in addition to temperature, making it more suitable for national conditions and covering multiple different latitude regions; the screen brightness of the device under test naturally decreases during normal use, and using the decrease ratio for evaluation can more realistically reflect the impact of high temperature on the device under test; it allows products of different types and materials to find a performance evaluation level that suits them.

[0154] Based on the above embodiments, this application provides a device testing apparatus. Figure 6 This is a schematic diagram of a device testing apparatus provided in an embodiment of this application, as shown below. Figure 6 As shown, the device 60 includes an acquisition module 601, a detection module 602, and a second determination module 603.

[0155] The acquisition module 601 is used to acquire the device to be tested and place the device to be tested in a first scene; the detection module 602 is used to detect the device to be tested and obtain detection data corresponding to at least two functions of the device to be tested; and the determination module 603 is used to determine the performance level of the device to be tested in the first scene based on the detection data corresponding to each function.

[0156] In some embodiments, the device to be detected includes at least a display screen, and the detection scenario further includes a second scenario;

[0157] After acquiring the device to be tested, the device further includes: a placement module for placing the device to be tested in the second scene and acquiring a first display brightness of the display interface at a first moment; a first detection module for detecting the display brightness of the display interface at a second moment to obtain a second display brightness, wherein the second moment is greater than the first moment; and a first determination module for determining a first brightness attenuation value of the device to be tested in the second scene based on the first display brightness and the second display brightness.

[0158] In some embodiments, the apparatus further includes: a shutdown processing module, configured to shut down the device under test after determining the first brightness attenuation value; and a startup module, configured to start the device under test in response to a first shutdown time period of the device under test.

[0159] In some embodiments, the device under test includes at least a screen display function; after the device under test is started, the detection module 602 is further configured to: acquire a third display brightness of the display interface at a third time in the first scenario; detect the display brightness of the display interface at a fourth time to obtain a fourth display brightness, wherein the fourth time is greater than the third time; determine a second brightness attenuation value of the device under test in the first scenario based on the third display brightness and the fourth display brightness; and determine the detection data of the screen display function in the first scenario based on the first brightness attenuation value and the second brightness attenuation value.

[0160] In some embodiments, the environmental parameters include at least one of the following: temperature, humidity, atmospheric pressure, and ambient light.

[0161] In some embodiments, the apparatus further includes: an acquisition module, configured to acquire a functional grading list, the functional grading list including at least two functional levels corresponding to each function and performance requirements corresponding to each functional level; correspondingly, the determination module 603 is further configured to determine the functional level corresponding to each function in the first scenario based on the detection data corresponding to each function in the first scenario and the performance requirements corresponding to each functional level in the functional grading list; and to determine the performance level of the device under test in the first scenario based on the functional level corresponding to each function in the first scenario; wherein the performance level of the device under test may be the same or different in different first scenarios.

[0162] In some embodiments, the determining module 603 is further configured to determine, in at least two functions of the device under test, the number of functions whose function level meets the function level requirements according to the function level corresponding to each function in each test scenario; and to determine the performance level of the device under test in each test scenario according to the number of functions and a preset grading standard.

[0163] In some embodiments, the functions of the device under test include at least mechanical functions, operational functions, and battery life functions.

[0164] The descriptions of the above device embodiments are similar to those of the above method embodiments, and have similar beneficial effects. For technical details not disclosed in the device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0165] It should be noted that, in the embodiments of this application, if the above-described device detection method is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiments of this application, or the part that contributes to the related technology, can be embodied in the form of a software product. This software product is stored in a storage medium and includes several instructions to cause a device detection device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of this application are not limited to any specific hardware and software combination.

[0166] This application provides a device testing device, including a memory and a processor. The memory stores a computer program that can run on the processor. When the processor executes the computer program, it implements the above-described device testing method.

[0167] This application provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the aforementioned device detection method. The computer-readable storage medium can be transient or non-transient.

[0168] This application provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program. When the computer program is read and executed by a computer, it implements some or all of the steps in the above-described method. This computer program product can be implemented specifically through hardware, software, or a combination thereof. In one optional embodiment, the computer program product is specifically embodied as a computer storage medium; in another optional embodiment, the computer program product is specifically embodied as a software product, such as a software development kit (SDK), etc.

[0169] It should be noted that, Figure 7 This is a schematic diagram of the hardware entity of a device testing device provided in an embodiment of this application, such as... Figure 7 As shown, the hardware entity of the detection device 70 includes: a processor 701, a communication interface 702, and a memory 703, wherein:

[0170] The processor 701 typically controls the overall operation of the device detection device 70.

[0171] Communication interface 702 enables the device to communicate with other terminals or servers via a network.

[0172] The memory 703 is configured to store instructions and applications executable by the processor 701, and can also cache data to be processed or already processed (e.g., image data, audio data, voice communication data, and video communication data) from the processor 701 and various modules in the device detection device 70. It can be implemented using flash memory or random access memory (RAM). Data transfer between the processor 701, the communication interface 702, and the memory 703 can be performed via bus 704.

[0173] It should be noted that the descriptions of the storage medium and device embodiments above are similar to those of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0174] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of this application, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application. The sequence numbers of the above-described embodiments are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0175] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0176] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0177] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0178] In addition, each functional unit in the embodiments of this application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0179] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0180] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, or the part that contributes to related technologies, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a device detection device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0181] The above description is merely an embodiment of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.

Claims

1. A method for testing equipment, the method comprising: Obtain the device to be tested and place it in the testing scene; The detection scenario includes at least two first scenarios and second scenarios, each with different environmental parameters; the device under test includes at least a display screen; the second scenario is used to acquire the display brightness of the corresponding display interface of the display screen at different times, and to obtain a first brightness attenuation value of the device under test in the second scenario; In the first scenario, the device under test is tested to obtain test data corresponding to at least two functions of the device under test; the functions include at least the screen display function, and the test data includes at least the test data of the screen display function determined based on the first brightness attenuation value; Based on the detection data corresponding to each function, the performance level of the device under test in the first scenario is determined.

2. The method according to claim 1, further comprising, after acquiring the device to be tested: The device to be tested is placed in the second scene, and the first display brightness of the display interface is obtained at a first moment; At a second moment, the display brightness of the display interface is detected to obtain a second display brightness, wherein the second moment is greater than the first moment; Based on the first display brightness and the second display brightness, a first brightness attenuation value of the device under test in the second scenario is determined.

3. The method according to claim 2, further comprising: After determining the first brightness attenuation value, the device under test is powered off. In response to the first time period after the device under test is powered off, the device under test is started.

4. The method according to claim 3, wherein after activating the device under test, the step of testing the device under test to obtain test data corresponding to at least two functions of the device under test includes: In the first scenario, the third display brightness of the display interface at the third moment is obtained; At the fourth moment, the display brightness of the display interface is detected to obtain a fourth display brightness, wherein the fourth moment is greater than the third moment; Based on the third display brightness and the fourth display brightness, determine the second brightness attenuation value of the device under test in the first scenario; Based on the first brightness attenuation value and the second brightness attenuation value, the detection data of the screen display function in the first scenario is determined.

5. The method according to claim 1, wherein the environmental parameters include at least one of the following: temperature, humidity, atmospheric pressure, and ambient light.

6. The method according to claim 5, further comprising: Obtain a functional hierarchy list, which includes at least two functional levels for each function and performance requirements for each functional level. The step of determining the performance level of the device under test in the first scenario based on the detection data corresponding to each function includes: In the functional classification list, the functional level corresponding to each function in the first scenario is determined based on the detection data corresponding to each function in the first scenario and the performance requirements corresponding to each functional level. The performance level of the device under test in the first scenario is determined based on the function level corresponding to each function of the device under test in the first scenario; wherein the performance level of the device under test may be the same or different in different first scenarios.

7. The method according to claim 6, wherein determining the performance level of the device under test in each testing scenario based on the functional level corresponding to each function of the device under test in each testing scenario includes: In the at least two functions of the device under test, the number of functions that meet the function level requirements is determined according to the function level corresponding to each function in each test scenario. Based on the number of functions and the preset grading standards, the performance level of the device under test in each testing scenario is determined.

8. The method according to any one of claims 1 to 7, wherein the functions of the device under test include at least mechanical functions, operational functions, and battery life functions.

9. A device for testing equipment, the device comprising: The acquisition module is used to acquire the device to be tested and place the device to be tested in the testing scene; The detection scenario includes at least two first scenarios and second scenarios, each with different environmental parameters; the device under test includes at least a display screen; the second scenario is used to acquire the display brightness of the corresponding display interface of the display screen at different times, and to obtain a first brightness attenuation value of the device under test in the second scenario; A detection module is used to detect the device under test and obtain detection data corresponding to at least two functions of the device under test; the functions include at least a screen display function, and the detection data includes at least the detection data of the screen display function determined based on the first brightness attenuation value; The determination module is used to determine the performance level of the device under test in the first scenario based on the detection data corresponding to each function.

10. A device testing device, comprising a processor and a memory, wherein the memory stores a computer program executable on the processor, characterized in that, When the processor executes the computer program, it implements the method according to any one of claims 1 to 8.

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