A probe cleaning jig

Abstract

The present invention aims to provide a probe cleaning jig with high cleaning efficiency and convenient cleaning. The present invention includes a jig cover and a probe cleaning assembly, the probe cleaning assembly includes a cleaning upper cover, a power supply module, a button module, a vibration motor and a foam block, the cleaning upper cover is arranged on the jig cover, the vibration motor and the foam block are arranged at the bottom of the cleaning upper cover, the jig cover is provided with a probe test slot, the foam block is located above the probe cleaning slot, the cleaning upper cover is provided with a drip hole that penetrates the foam block, the power supply module and the button module are both arranged on the jig cover, the power supply module is electrically connected to the button module, and the power supply module is electrically connected to the vibration motor. The present application relates to the technical field of cleaning needle block module test probes.

Description

Technical Field

[0001] The present application relates to the technical field of cleaning a needle block module test probe, and in particular to a probe cleaning jig. Background Art

[0002] When using the test needle block module of some test equipment, the surface of the test probe is prone to dirt as the use time and frequency increase. When the probe is dirty, it is easy to have poor contact, increased and unstable contact impedance, etc., which affects the accuracy of the test results. Therefore, it is often necessary to clean it in time.

[0003] In order to clean the probe in time, most existing solutions adopt the method of disassembling the probe or making a spare needle block module for quick replacement to clean and replace the probe. Such solutions are prone to damage the needle block module and the probe during the disassembly process, and the position needs to be re-adjusted after reinstallation, which takes a long time and is time-consuming and labor-intensive. Therefore, the cleaning efficiency is low and the labor cost is also high.

[0004] For example, a Chinese patent with publication number CN110465512A discloses a probe cleaning device. This solution places the mounting portion on the main body into the battery detection slot of the battery detection cabinet and moves along the axial direction of the battery detection slot so that the cleaning brush is close to the probe on the side wall of the battery until the probe is fully inserted into the cleaning brush. The rotating drive member is then driven to drive the cleaning brush to rotate 360°, thereby cleaning the probe. However, this solution is not suitable for directly cleaning the undisassembled probe on the equipment. Before cleaning, the probe module needs to be replaced for separate cleaning. Therefore, the position needs to be re-adjusted during the disassembly and assembly process, which takes a long time, is time-consuming and labor-intensive, and will also increase labor costs. Summary of the invention

[0005] The technical problem to be solved by the present application is to overcome the deficiencies of the prior art and provide a probe cleaning jig with high cleaning efficiency and convenient cleaning, so as to solve the problems of low cleaning efficiency, inconvenient disassembly and assembly of the probe module, and easy damage to the probe in the existing cleaning scheme.

[0006] The technical solution adopted in the present application is: the present application includes a jig cover and a probe cleaning assembly, the probe cleaning assembly includes a cleaning upper cover, a power supply module, a button module, a vibration motor and a foam block, the cleaning upper cover is arranged on the jig cover, the vibration motor and the foam block are arranged at the bottom of the cleaning upper cover, the jig cover is provided with a probe cleaning groove, the foam block is located above the probe cleaning groove, the cleaning upper cover is provided with a drip hole penetrating to the foam block, the power supply module and the button module are both arranged on the jig cover, the power supply module is electrically connected to the button module, and the power supply module is electrically connected to the vibration motor.

[0007] A preferred solution is that the foam block includes a first buffer foam layer, a second buffer foam layer and a cleaning foam layer, the first buffer foam layer is arranged at the bottom of the cleaning upper cover, the first buffer foam layer is provided with a notch complementary to the vibration motor, the second buffer foam layer is located below the first buffer foam layer, the second buffer foam layer is provided with a convex edge covering the vibration motor, and the cleaning foam layer is located below the second buffer foam layer. During testing, the cleaning foam layer is in contact with the probe.

[0008] A preferred solution is that the fixture cover is provided with a plurality of positioning pins that cooperate with the reference plate during testing.

[0009] A preferred solution is that the fixture cover is provided with a plurality of positioning holes that cooperate with the probe modules during testing.

[0010] A preferred solution is that a plurality of contoured circuit grooves and a plurality of fixing blocks are further provided inside the jig cover, the power supply module and the button module are both arranged in the contoured circuit grooves, the fixing blocks are both provided with screws fixed to the jig cover, and the power supply module and the button module are both fixed in the jig cover by the fixing blocks.

[0011] Beneficial effects of the present invention:

[0012] The present application has a simple and compact structure and is very suitable for quick cleaning of the probe, especially for equipment where some probes are difficult to disassemble and assemble. The present application can be directly cleaned after quick positioning using the positioning pin or the positioning hole, or it can be directly grasped by the machine clamp and then the probe cleaning procedure can be executed to perform accurate and stable cleaning work.

[0013] During normal use of the present application, it is necessary to first pour the cleaning liquid into the drip hole, and the cleaning liquid flows into the foam block and is absorbed and stored by the foam block, and then the entire jig is placed in a position that cooperates with the probe module or the machine jig placement position, and the machine executes the probe cleaning program to lift the jig to the reference plate. At this time, the button module will be pressed under the action of the reference plate, and the electrical signal will be transmitted to the power supply module, and release current to the vibration motor, and the vibration motor will start to vibrate. Since the vibration motor is placed on the same layer of the first buffer foam layer and is covered by the second buffer foam layer, the vibration motor will not directly contact the probe during vibration, so the vibration motor will not cause damage to the probe, and the vibration motor will drive the cleaning foam layer to clean the probe when vibrating. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 is a schematic diagram of the three-dimensional structure of the present invention from a first viewing angle;

[0015] Figure 2 is a second viewing angle schematic diagram of the three-dimensional structure of the present invention;

[0016] Figure 3 It is a three-dimensional structural schematic diagram of the internal structure of the present invention;

[0017] Figure 4 It is a structural explosion diagram of the vibration motor and the foam block. DETAILED DESCRIPTION

[0018] In order to more clearly understand the features and advantages of the present application, the following examples are given in conjunction with the attached Figure 1 To Attachment Figure 4 The present application is further described. In the present embodiment, the present application includes a jig cover 1 and a probe cleaning assembly, the probe cleaning assembly includes a cleaning cover 2, a power supply module 3, a button module 4, a vibration motor 5 and a foam block 6, the cleaning cover 2 is arranged on the jig cover 1, the vibration motor 5 and the foam block 6 are arranged at the bottom of the cleaning cover 2, the jig cover 1 is provided with a probe cleaning slot 11, the foam block 6 is located above the probe cleaning slot 11, the cleaning cover 2 is provided with a drip hole 21 that penetrates the foam block 6, the power supply module 3 and the button module 4 are both arranged on the jig cover 1, the power supply module 3 is electrically connected to the button module 4, the power supply module 3 is electrically connected to the vibration motor 5, the vibration motor 5 drives the foam block 6 to vibrate continuously, so that the foam block 6 with the cleaning liquid repeatedly rubs the probe, thereby achieving effective cleaning of the probe, and the probe can be directly cleaned without removing it from the equipment, which plays a role of convenience, practicality and good cleaning effect.

[0019] In this embodiment, the foam block 6 includes a first buffer foam layer 61, a second buffer foam layer 62 and a cleaning foam layer 63. The first buffer foam layer 61 is arranged at the bottom of the cleaning cover 2. The first buffer foam layer 61 is provided with a notch complementary to the vibration motor 5. The second buffer foam layer 62 is located below the first buffer foam layer 61. The second buffer foam layer 62 is provided with a convex edge covering the vibration motor 5. The cleaning foam layer 63 is located below the second buffer foam layer 62. During testing, the cleaning foam layer 63 contacts the probe, and the convex edge facilitates the covering of the vibration motor 5, which can not only ensure the beautiful appearance, but also increase the friction between the second buffer foam layer 62 and the vibration motor 5. When the vibration motor 5 vibrates, the second buffer foam layer 62 can better drive the cleaning foam layer 63 to vibrate, thereby improving the cleaning effect.

[0020] In this embodiment, the fixture cover 1 is provided with a plurality of positioning pins 12 that cooperate with the reference plate 7 during testing, thereby improving the positioning effect of the present application.

[0021] In this embodiment, the fixture cover 1 is provided with a plurality of positioning holes 13 that cooperate with the probe module 8 during testing, thereby improving the positioning effect of the present application.

[0022] In this embodiment, a plurality of contoured line grooves 14 and a plurality of fixing blocks 15 are further provided inside the jig cover 1. The power supply module 3 and the button module 4 are both arranged in the contoured line grooves 14. The fixing blocks 15 are both provided with screws fixed to the jig cover 1. The power supply module 3 and the button module 4 are both fixed in the jig cover 1 by the fixing blocks 15, which facilitates assembly and wiring, thereby improving the aesthetics of the present application.

[0023] How this application works:

[0024] The present application has a simple and compact structure and is very suitable for quick cleaning of the probe, especially for equipment where some probes are difficult to disassemble and assemble. The present application can be directly cleaned after quick positioning using the positioning pin or the positioning hole, or it can be directly grasped by the machine clamp and then the probe cleaning procedure can be executed to perform accurate and stable cleaning work.

[0025] During normal use of the present application, it is necessary to first pour the cleaning liquid into the drip hole 21, and the cleaning liquid flows into the foam block 6, and is absorbed and stored by the foam block 6, and then the entire fixture is placed in a position that cooperates with the probe module 8 or a machine fixture placement position, and the machine executes the probe cleaning program to lift the fixture to the reference plate 7. At this time, the button module 4 will be pressed under the action of the reference plate 7, and the electrical signal is transmitted to the power supply module 3, and the current is released to the vibration motor 5, and the vibration motor 5 starts to vibrate. Since the vibration motor 5 is placed on the same layer of the first buffer foam layer 61 and is covered by the second buffer foam layer 62, the vibration motor 5 will not directly contact the probe module 8 during vibration, so the vibration motor 5 will not cause damage to the probe, and the vibration motor 5 will drive the cleaning foam layer 63 to clean the probe when it vibrates.

[0026] Although the embodiments of the present application are described with practical solutions, they do not constitute limitations on the meaning of the present application. For those skilled in the art, it is obvious to modify the implementation scheme and combine it with other solutions based on this specification.

Claims

1. A probe cleaning jig, It is characterized in that The invention comprises a jig cover (1) and a probe cleaning assembly, wherein the probe cleaning assembly comprises a cleaning upper cover (2), a power supply module (3), a button module (4), a vibration motor (5) and a foam block (6), wherein the cleaning upper cover (2) is arranged on the jig cover (1), the vibration motor (5) and the foam block (6) are arranged at the bottom of the cleaning upper cover (2), the jig cover (1) is provided with a probe cleaning groove (11), the foam block (6) is located above the probe cleaning groove (11), the cleaning upper cover (2) is provided with a drip hole (21) penetrating to the foam block (6), the power supply module (3) and the button module (4) are both arranged on the jig cover (1), and the power supply module (3) and the button module (4) are connected to each other. 4) electrical connection, the power supply module (3) is electrically connected to the vibration motor (5); the foam block (6) comprises a first buffer foam layer (61), a second buffer foam layer (62) and a cleaning foam layer (63), the first buffer foam layer (61) is arranged at the bottom of the cleaning upper cover (2), the first buffer foam layer (61) is provided with a notch complementary to the vibration motor (5), the second buffer foam layer (62) is located below the first buffer foam layer (61), the second buffer foam layer (62) is provided with a convex edge covering the vibration motor (5), the cleaning foam layer (63) is located below the second buffer foam layer (62), and during testing, the cleaning foam layer (63) is in contact with the probe.

2. A probe cleaning jig according to claim 1, It is characterized in that The jig cover (1) is provided with a plurality of positioning pins (12) which cooperate with the reference plate (7) during testing.

3. A probe cleaning jig according to claim 1, It is characterized in that The jig cover (1) is provided with a plurality of positioning holes (13) which cooperate with the probe module (8) during testing.

4. A probe cleaning jig according to claim 1, It is characterized in that The jig cover (1) is further provided with a plurality of contoured line grooves (14) and a plurality of fixing blocks (15); the power supply module (3) and the button module (4) are both arranged in the contoured line grooves (14); the fixing blocks (15) are both provided with screws for fixing to the jig cover (1); the power supply module (3) and the button module (4) are both fixed in position in the jig cover (1) by the fixing blocks (15).

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