Test apparatus and test method

Abstract

The application provides a test device and a test method, wherein the test device comprises a test load board and a start protection circuit arranged in the test load board, and the start protection circuit comprises: a current clamping circuit and a current regulating circuit which are connected; the current clamping circuit is used for clamping input current entering the test load board; and the current regulating circuit is used for controlling the clamped input current to gradually rise at a preset slope and output to a product to be tested. The application can be used for safe test power supply of the product to be tested.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electronic product testing, and more particularly to a testing device and a testing method using the same. BACKGROUND

[0002] With the continuous development of SIP (System In a Package) technology and process and the continuous improvement of production capacity, more and more products begin to use SIP process for packaging, such as chips, zero components, true wireless stereo products, smart watches, and AR, VR and other wearable smart devices. In view of the differences of the packaged products, the complexity of the corresponding SIP system varies, and in the testing process, the current required for product testing is about 100 mA, and the current required for product testing is about 1000 mA.

[0003] It can be seen that if the product is directly powered on for testing, there is a risk of large current surges when the product is powered on for the first time, which brings hazards including: the test points of the product will be quickly oxidized, and even damaged, and due to the rapid charging of the capacitor, the inrush current exists, which may cause damage to the product IC, and may cause the product protection circuit to fail.

[0004] Therefore, there is an urgent need for a testing device that can be used for safe and reliable power-on testing of a wide range of power-on products. SUMMARY

[0005] In view of the above problems, the purpose of the present application is to provide a testing device and method to solve the problem of direct power supply leading to current surges in existing product testing.

[0006] The testing device provided by the present application comprises a test load board and a start protection circuit arranged in the test load board, and the start protection circuit comprises: a current clamping circuit and a current regulating circuit connected and arranged; wherein the current clamping circuit is used for clamping the input current entering the test load board; and the current regulating circuit is used for controlling the input current after clamping to gradually rise according to a preset slope and output to the product to be tested.

[0007] In addition, the optional technical solution is that the test load board is arranged between the product to be tested and the testing machine; and the power supply unit of the testing machine is connected to the product to be tested through the start protection circuit.

[0008] In addition, the optional technical solution is that the current clamping circuit comprises at least two first adjustable resistors and a triode arranged in parallel; when the input current is greater than a preset value, the triode is turned on to clamp the input current at a set value.

[0009] Furthermore, the optional technical solution is that the triode is a PNP triode; and the emitter E of the PNP triode is connected with the power supply unit, the base B is connected with the first adjustable resistor, and the collector C is connected with the current regulating circuit.

[0010] Furthermore, the optional technical solution is that the current regulating circuit comprises a charging capacitor, a second adjustable resistor, a field effect tube and a series resonance circuit arranged in parallel; wherein the series resonance circuit is provided with at least one, and each series resonance circuit is composed of a capacitor and an inductor.

[0011] Furthermore, the optional technical solution is that the current regulating circuit comprises a charging capacitor, a second adjustable resistor, a field effect tube and a series resonance circuit arranged in parallel; wherein the series resonance circuit is provided with at least one, and each series resonance circuit is composed of a capacitor and an inductor.

[0012] Furthermore, the optional technical solution is that the field effect tube is a P-channel enhancement mode field effect tube; and the gate G of the P-channel enhancement mode field effect tube is connected with the series resonance circuit, the source S is connected with the current clamping circuit, and the drain D is connected with the power supply unit.

[0013] Furthermore, the optional technical solution is that a diode is connected between the source S and the drain D; during the charging of the charging capacitor, when the voltage across the second adjustable resistor is greater than the threshold value of the field effect tube, the field effect tube is gradually turned on.

[0014] Furthermore, the optional technical solution is that the to-be-tested product and the test load board are connected in conduction through spring probes.

[0015] On the other hand, the application also provides a test method, which utilizes the above test device to perform power supply testing on a to-be-tested product; wherein the method comprises: placing the to-be-tested product on the test load board and connecting it in conduction with the test load board; the external test machine is connected with the test load board through wireless or wired connection; the power supply unit of the test machine is output to the to-be-tested product through the current clamping circuit and the current regulating circuit in the test load board, and the start-up protection of the to-be-tested product is completed.

[0016] By utilizing the above test device and test method, the test load board and the start-up protection circuit located in the test load board are provided; the start-up protection circuit further comprises a connected current clamping circuit and a current regulating circuit; wherein the input current entering the test load board can be preliminarily clamped through the current clamping circuit, and then the clamped input current is gradually increased according to a preset slope through the current regulating circuit, so that the power supply current can be slowly increased to ensure the safety of the test power-on.

[0017] To achieve the foregoing and related objectives, one or more aspects of the invention include the features that will be described in detail below. The following description and accompanying drawings illustrate certain exemplary aspects of the invention. However, these aspects indicate only a few of the various ways in which the principles of the invention can be used. Furthermore, the invention is intended to encompass all such aspects and their equivalents. Attached Figure Description

[0018] Other objects and results of the invention will become more apparent and readily understood with reference to the following description taken in conjunction with the accompanying drawings. In the drawings:

[0019] Figure 1 This is a schematic diagram of the structure of the testing device according to an embodiment of the present invention;

[0020] Figure 2 A schematic diagram of the startup protection circuit according to an embodiment of the present invention.

[0021] In all the accompanying drawings, the same reference numerals indicate similar or corresponding features or functions. Detailed Implementation

[0022] In the following description, numerous specific details are set forth for illustrative purposes and to provide a thorough understanding of one or more embodiments. However, it will be apparent that these embodiments may also be implemented without these specific details. In other instances, well-known structures and devices are shown in block diagram form for ease of description of one or more embodiments.

[0023] In the description of this invention, it should be understood that the following terms, such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the content or structure of this invention.

[0024] To address the risks of high current surges during product testing when directly connecting the product to the testing machine, which can lead to rapid oxidation or even damage to test points, and surge currents caused by rapid capacitor charging that could damage ICs or even cause product protection circuits to fail, this invention provides a testing device with a test load board and a startup protection circuit within it. The startup protection circuit further includes a current clamping circuit and a current regulating circuit. The current clamping circuit initially clamps the input current entering the test load board, and the current regulating circuit controls the clamped input current to gradually increase at a preset slope, ensuring a slow and safe power-on process. This invention is applicable to testing various products with wide current requirements.

[0025] To describe the structure of the testing device of the present invention in detail, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0026] Figure 1 A schematic structure of a test apparatus according to an embodiment of the present invention is shown.

[0027] like Figure 1 As shown, the testing device of this embodiment includes a test load board disposed between the product under test and the testing machine, and a startup protection circuit disposed within the test load board. The startup protection circuit further includes a current clamping circuit and a current regulating circuit connected together. The current clamping circuit is used to clamp the input current entering the test load board through the testing machine. The current regulating circuit is used to control the clamped input current to gradually increase according to a preset slope and gradually output to the product under test, so as to achieve safe power-on of the product under test and avoid the occurrence of large current surge.

[0028] As can be seen, the present invention realizes the signal connection between the product under test and the test machine through the test load board. At the same time, the start-up protection circuit in the test load board ensures the safe and reliable start-up of the product under test. It is applicable to the testing of products with a current requirement of about 100mA to 1000mA, and the product performance is stable during the test process, and the chip and test points will not be damaged.

[0029] Specifically, Figure 2 A schematic structure of a startup protection circuit according to an embodiment of the present invention is shown.

[0030] like Figure 2As shown, the startup protection circuit of this embodiment mainly includes two parts: a current clamping circuit and a current regulating circuit. The current clamping circuit further includes at least two first adjustable resistors and a transistor connected in parallel. When the input current at the PP_HV terminal is greater than a preset value, the transistor will be turned on to clamp the input current at the set value.

[0031] As a specific example, the first adjustable resistor may include R1063 and R1062 connected in parallel. A transistor Q6 is connected in parallel across the first adjustable resistor. By adjusting R1063 and R1062, the current entering the startup protection circuit can be forcibly clamped. When the current exceeds a preset value, the transistor Q6 will be turned on, causing Q1 to be turned off, thus avoiding the direct output of large current.

[0032] Among them, transistor Q6 can be a PNP transistor; and the emitter E of the PNP transistor is connected to the power supply unit of the tester, the base B is connected to the first adjustable resistor, and the collector C is connected to the current adjustment circuit. It can be seen that transistor Q6 can also be replaced by other structural components with equivalent functions, and is not limited to the specific structure and model shown in the figure.

[0033] In one specific embodiment of the present invention, the current regulating circuit may include a charging capacitor, a second adjustable resistor, a field-effect transistor, and a series resonant circuit arranged in parallel; wherein, at least one series resonant circuit is provided, and each series resonant circuit is composed of a capacitor and an inductor. Furthermore, it may also include a third capacitor and a third adjustable resistor; wherein, the charging capacitor, the second adjustable resistor, the third capacitor, and the third adjustable resistor cooperate to adjust a preset slope.

[0034] The current regulation circuit may include a charging capacitor C1087, a second adjustable resistor R1053, a field-effect transistor Q1, and C1086, R1064, C1088, R1061, and R1050 connected in parallel. By adjusting C1087, R1053, R1061, and C1088, the slope of the current or voltage rise, i.e., the preset frequency mentioned above, can be adjusted to ensure the initial power-on safety of the detected components.

[0035] Specifically, the aforementioned field-effect transistor can be a P-channel enhancement-mode field-effect transistor; and the gate G of the P-channel enhancement-mode field-effect transistor is connected to a series resonant circuit, the source S is connected to a current clamping circuit, and the diode D is connected to the power supply unit PP_HV of the tester. Furthermore, a diode is connected between the source S and the diode D; during the charging process of the charging capacitor C1087, when the voltage across the second adjustable resistor R1053 is greater than the threshold voltage of the field-effect transistor Q1, the field-effect transistor will gradually turn on, thus achieving a gradual and slow power-on effect.

[0036] In another specific embodiment of the present invention, the product under test and the test load board can be connected and conductive through a spring-type probe, such as a Pogo pin. The Pogo pin includes three basic components: a needle shaft, a spring, and a needle tube. These three basic components are pre-pressed by riveting to form a spring-type probe. In addition, the surface plating of the Pogo pin can be gold-plated, which can better improve its corrosion resistance, mechanical properties, electrical properties, etc., extend its service life, and ensure the testing accuracy of the product under test.

[0037] Furthermore, the aforementioned drive protection circuit of this application can also undergo structural modifications and component replacements to achieve the power supply protection of this invention, and is not limited to the specific structure shown in the accompanying drawings.

[0038] Corresponding to the above-mentioned testing device, the present invention also provides a testing method for performing power supply testing on the product under test using the above-mentioned testing device.

[0039] Specifically, the testing method of this embodiment of the invention includes:

[0040] Step 1: Place the product to be inspected on the test load board and connect it to the test load board for electrical connection;

[0041] Step 2: The external test unit and the test load board are connected wirelessly or via wired connection; for example, the test unit and the test load board are connected via cable.

[0042] Step 3: The power supply unit of the test machine outputs to the product under test after passing through the current clamping circuit and current regulation circuit in the test load board, thus completing the start-up protection of the product under test.

[0043] It should be noted that the embodiments of the test method can be referred to the descriptions in the above test device embodiments, and will not be repeated here.

[0044] Using the aforementioned testing device and method, a test load board is set between the product under test and the testing machine. A startup protection circuit is installed within the test load board. The startup protection circuit further includes a current clamping circuit and a current regulating circuit that are interconnected. The current clamping circuit can initially clamp the input current entering the test load board. Then, the current regulating circuit controls the clamped input current to gradually increase according to a preset slope, thereby allowing the startup current of the product under test to rise slowly, avoiding the occurrence of large current surges, and ensuring the safe power-on of the product under test. This method is applicable to a wide range of product testing needs.

[0045] The testing apparatus and method according to the present invention have been described above by way of example with reference to the accompanying drawings. However, those skilled in the art should understand that various modifications can be made to the testing apparatus and method proposed in the present invention without departing from the scope of the invention. Therefore, the scope of protection of the present invention should be determined by the contents of the appended claims.

Claims

1. A testing device, characterized in that, The test load board includes a test load board and a startup protection circuit disposed within the test load board. The startup protection circuit includes a current clamping circuit and a current regulating circuit connected together. The current clamping circuit is used to clamp the input current entering the test load board; The current regulation circuit is used to control the input current after clamping to gradually increase according to a preset slope and output it to the product under test. The test load board is positioned between the product under test and the test machine, and the test machine and the test load board are wirelessly connected. The current regulation circuit includes a charging capacitor, a second adjustable resistor, a field-effect transistor, a series resonant circuit, a third capacitor, and a third adjustable resistor connected in parallel; wherein, The charging capacitor, the second adjustable resistor, the third capacitor, and the third adjustable resistor work together to adjust the preset slope.

2. The testing apparatus as described in claim 1, characterized in that, The power supply unit of the test machine is connected to the product under test through the startup protection circuit.

3. The testing apparatus as described in claim 2, characterized in that, The current clamping circuit includes at least two first adjustable resistors and a transistor connected in parallel. When the input current is greater than a preset value, the transistor turns on to clamp the input current at the set value.

4. The testing apparatus as described in claim 3, characterized in that, The transistor is a PNP type transistor; and... The emitter E of the PNP transistor is connected to the power supply unit, the base B is connected to the first adjustable resistor, and the collector C is connected to the current regulation circuit.

5. The testing apparatus as described in claim 2, characterized in that, The series resonant circuit is provided in at least one form, and each series resonant circuit is composed of a capacitor and an inductor.

6. The testing apparatus as described in claim 2, characterized in that, The field-effect transistor is a P-channel enhancement-mode field-effect transistor; and... The gate G of the P-channel enhancement-mode MOSFET is connected to the series resonant circuit, the source S is connected to the current clamping circuit, and the D is connected to the power supply unit.

7. The testing apparatus as described in claim 6, characterized in that, A diode is connected between the source S and the leaked record D; During the charging process of the charging capacitor, when the voltage across the second adjustable resistor is greater than the threshold of the field-effect transistor, the field-effect transistor gradually turns on.

8. The testing apparatus as described in claim 1, characterized in that, The product under test and the test load board are connected by a spring-loaded probe.

9. A testing method, characterized in that, The test apparatus as described in any one of claims 1 to 8 is used to perform a power supply test on the product under test; wherein the method includes: Place the product to be inspected on the test load board and connect it to the test load board for electrical communication. The external tester is wirelessly connected to the test load board; The power supply unit of the test machine outputs power to the product under test after passing through the current clamping circuit and current regulation circuit in the test load board, thus completing the start-up protection of the product under test. The current regulation circuit includes a charging capacitor, a second adjustable resistor, a field-effect transistor, a series resonant circuit, a third capacitor, and a third adjustable resistor connected in parallel; wherein, The charging capacitor, the second adjustable resistor, the third capacitor, and the third adjustable resistor work together to adjust the preset slope.

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