Particle defect inspection system using multi-tone control and method of controlling the same

Abstract

The present invention relates to a granule defect inspection system using multi-tone control and a method of controlling the same, which continuously conveys a plurality of granules to detect a color of the granules to determine whether the granules are defective. The granule defect inspection system includes a granule defect inspection device including a sorter configured to photograph a first surface and a second surface of each of the granules while conveying the plurality of granules to inspect the granules so as to separate and remove the granules determined to be defective and convey and load the granules determined to be good to a designated location, and a multi-tone granule inspection controller configured to photograph the first surface (top surface) and the second surface (bottom surface) of each of the granules conveyed along a lane while controlling the granule conveyance and changing an RGBW irradiation section so as to analyze and determine an image.

Description

Technical Field

[0001] This invention relates to particle inspection and sorting, and more specifically, to a particle defect inspection system using multi-tone control, which continuously feeds multiple particles to inspect their color to determine whether the particles are defective, and a method for controlling said system. Background Technology

[0002] Granules are solid particles representing synthetic resins used in petrochemical products, widely applied in various fields such as films, pipes, and automotive interior materials. Because granules, as raw materials, significantly impact the quality of the final product, quality control and impurity control are crucial. In particular, during manufacturing, defective granules may appear due to undesirable colors such as black, yellow, red, or other colors; foreign matter or non-particulate matter may be present; irregular shapes or sizes may be out of range; or black spots may be present due to carbonization of raw materials or excipients or foreign matter. Therefore, it is necessary to sort and remove these foreign particles.

[0003] According to relevant technologies, when producing granules as raw materials for synthetic resin injection molding, a granule sorting device capable of sorting only standard granules is used to manufacture synthetic resin injection molded products requiring precision. The granule sorting device according to relevant technologies is designed such that granules are formed by an extruder and supplied to a hopper via a discharge line, a screen is installed at the bottom of the hopper, and low-frequency vibration is applied to sort only standard granules.

[0004] However, in the sorting method using sieves, the sorting accuracy deteriorates because particles are sorted according to the shape and size of the sieve. Furthermore, particles containing defects such as different colors, foreign objects, abnormal shapes, and black spots cannot be sorted; therefore, additional methods are needed to measure the particles. Moreover, due to the small size of each particle and the processing capacity of 1,200 kg per hour, more than 4 million defects need to be inspected. Additionally, the production speed of each particle is only 40 mm / sec, which is too fast, thus limiting the ability to resolve quality issues.

[0005] In addition, Korean Patent Registration No. 10-2009757 discloses a "foreign object sorting device based on artificial intelligence program", which uses a camera to acquire original images while conveying an object containing multiple particles, converts the original images to a preset size, and uses the converted images to distinguish between normal particles and abnormal particles.

[0006] However, particle sorting devices, including conventional foreign object sorting devices, are designed for large, round objects such as beans, not for color and foreign object sorting devices for hexahedral shapes like particles. For round objects, even with cameras arranged for viewing from both sides, there are advantages due to the minimization of the image mapping range; however, due to depth limitations, there are limitations in inspecting defects beyond the innermost part. Therefore, defect detection is restricted because color information from both sides of the particle cannot be obtained.

[0007] Therefore, there is a need to develop new technologies that can improve the accuracy and efficiency of particle inspection and sorting operations. Summary of the Invention

[0008] Technical issues

[0009] One object of the present invention for addressing problems with particle inspection and sorting techniques according to related technologies is to provide a particle defect inspection system using multi-tone control and a method for controlling the system, the system being able to detect the color of particles while continuously conveying multiple particles to determine whether the particles are defective.

[0010] One object of the present invention for solving the above problems is to provide a particle defect inspection system using multi-tone control and a method for controlling the system, wherein the system acquires the color and image on two surfaces of the particles while continuously conveying them at high speed to detect different colors, foreign objects, abnormal shapes, black spots, etc., and effectively removes particles identified as defective while conveying the particles, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0011] One object of the present invention is to provide a particle defect inspection system using multi-tone control and a method for controlling the system, the system being able to represent brightness and color with parameters, thereby enabling optimized imaging of products, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0012] One object of the present invention is to provide a particle defect inspection system using multi-tone control and a method for controlling the system, the system being able to receive particles determined to be good at regular intervals to manufacture plate-shaped samples of molded products and inspect the manufactured samples of molded products for defects, thereby checking for defects inside the particles.

[0013] The purpose of this invention is not limited to the above-described purposes, but those skilled in the art will clearly understand from the following description other purposes not described in this specification.

[0014] Technical solution

[0015] The particle defect inspection system according to the invention, which uses multi-tone control to achieve the above objectives, comprises: a particle defect inspection apparatus including a sorting machine configured to inspect the particles by photographing a first surface and a second surface of each particle while conveying a plurality of particles, so as to remove particles determined to be defective and convey and load particles determined to be good to a designated location; and a multi-tone particle inspection controller configured to photograph the first surface (top surface) and the second surface (bottom surface) of each particle conveyed along a channel while controlling particle conveying and changing the RGBW irradiation segment, so as to analyze and determine the images.

[0016] The multi-tone particle inspection controller may include a particle conveying controller configured to control: a first particle conveying unit that conveys particles supplied from a particle supply unit from rear to front; a particle transport unit disposed at the front end of the first particle conveying unit to transport particles transported by the first particle conveying unit downward; and a second particle conveying unit disposed below the first particle conveying unit to receive particles transported downward by the particle transport unit, so as to transport the particles from front to back in an inverted state, thereby capturing the particles to be inspected in a stable state.

[0017] The multi-tone particle inspection controller may include a vision inspection controller configured to control: a first vision inspection unit disposed above the first particle conveying unit to photograph the first surface (top surface) of the particles in order to inspect the particles for defects; and a second vision inspection unit disposed above the second particle conveying unit to photograph the second surface of the particles and inspect the particles for defects, so as to reflect the particle reference color, photograph the particles while changing the RGBW irradiation segment, and analyze and determine the image to sort the particles.

[0018] Under the control of the visual inspection controller, the first visual inspection unit and the second visual inspection unit can use a 12M / 8Hz camera to acquire the color, shape, size, etc. of particles through R / G / B / W illumination in order to inspect defects such as different colors, foreign objects, abnormal shapes, black spots, etc.

[0019] When the particle defect inspection device is set up before inspecting new particles to be inspected, all RGBW can be used to supply the device with a certain number of good products and a certain number of defective products and a 100% repeatability inspection process in order to find the optimal color matching conditions and classification criteria to be reflected in the actual particle inspection.

[0020] The visual inspection controller may include: a multi-tone control irradiation unit configured to reflect a reference color, such that the size and intensity of the RGBW irradiation segment are adjusted based on the unique color information of the particle to be inspected, and to capture images of the particle to be inspected while changing the size and intensity of the RGBW irradiation segment; a reflective image acquisition unit configured to acquire particle images based on the RGBW irradiation of the multi-tone control irradiation unit; an image acquisition object position tracking unit configured to track the transport position of the particle to be inspected through the reflective image acquisition unit; and an image analysis and determination unit configured to analyze the acquired images of the reflective image acquisition unit to determine good and defective products, thereby sorting the particles.

[0021] The multi-tone control illumination unit can be configured to provide red / green / blue light sources as a control lamp, and the PWM form is digitally encoded from 0 to 255 to illuminate the set segment with R / G / B / W.

[0022] The multi-tone control irradiation unit may include: a particle reference color reflection unit configured to reflect a reference color, thereby adjusting the size setting and irradiation intensity of the RGBW irradiation segment based on the unique color information of the particle to be inspected; an RGBW irradiation segment changing unit configured to adaptively change the size of the R irradiation segment, the size of the G irradiation segment, the size of the B irradiation segment, and the size of the W irradiation segment based on the deviation between the unique color information of the particle to be inspected and the defect inspection result; and an accumulated defect value calculation unit configured to accumulate the defect values ​​of each RGBW irradiation segment to output a final defect value.

[0023] The sorting machine of the particle defect inspection device may include: a particle supply unit configured to supply a plurality of particles; a first particle conveying unit configured to convey the particles supplied from the particle supply unit from rear to front; a particle transport unit disposed at the front end of the first particle conveying unit to transport the particles transported by the first particle conveying unit downward; a second particle conveying unit disposed below the first particle conveying unit to receive the particles transported downward by the particle transport unit and to invert the particles at a 180° angle to transport the particles from front to rear; and a first visual inspection unit disposed above the first particle conveying unit to photograph the first surface of each particle to inspect the particles for defects. A first distribution unit, disposed in front of the first visual inspection unit, picks up particles identified as defective by the first visual inspection unit to separate the defective particles from the first particle conveying unit; a second visual inspection unit, disposed above the second particle conveying unit, photographs the second surface of each particle to check for defects; a second distribution unit, disposed behind the second visual inspection unit, picks up particles identified as defective by the second visual inspection unit to separate the defective particles from the second particle conveying unit; and an unloading unit, disposed at the rear end of the second particle conveying unit, receives particles conveyed by the second particle conveying unit to transport the particles to a designated unloading position.

[0024] A method according to the invention for controlling a particle defect inspection system using multi-tone control for another purpose includes: when particle P is placed into a sorting machine, distributing the particles to be accommodated in a channel of a first conveyor plate and conveying them from rear to front at a predetermined speed; simultaneously changing the RGBW irradiation section, photographing the first surface (top surface) of each particle conveyed along the channel; analyzing and determining the image while tracking the position of the object to be imaged, so as to discharge particles determined to be defective; conveying the particles whose first surface (top surface) has been inspected to a channel of a second conveyor plate to invert the particles such that the second surface (bottom surface) faces upward; simultaneously changing the RGBW irradiation section, photographing the second surface (bottom surface) of each particle conveyed along the channel; and simultaneously analyzing and determining the image while tracking the position of the object to be imaged, so as to discharge particles determined to be defective.

[0025] When photographing particles while changing the RGBW illumination band, the reference color can be reflected, allowing the size setting and illumination intensity of the RGBW illumination band to be adjusted based on the unique color information of the particles to be inspected.

[0026] While capturing particles by changing the RGBW irradiation segments, the sizes of the R, G, B, and W irradiation segments can be adaptively adjusted based on the deviation between the unique color information of the particles to be inspected and the defect inspection results.

[0027] Beneficial effects

[0028] As described above, the particle defect inspection system using multi-tone control and the method for controlling the system according to the present invention have the following effects.

[0029] First, the color of the particles can be detected while multiple particles are being continuously conveyed, in order to detect whether the particles are defective.

[0030] Secondly, it can acquire the color and image on both surfaces of the particles while they are being transported at high speed and continuously to detect different colors, foreign objects, abnormal shapes, black spots, etc., and effectively remove particles identified as defective while they are being transported, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0031] Third, brightness and color can be parameterized, enabling optimized imaging of the product, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0032] Fourth, it can supply granules that have been determined to be good at regular intervals to manufacture plate-shaped samples of molded products, and can check whether the samples of the manufactured molded products have defects, in order to check whether there are defects inside the granules. Attached Figure Description

[0033] Figure 1 This is a front view illustrating a particle defect inspection system using multi-tone control according to an embodiment of the present invention.

[0034] Figure 2 This is a perspective view illustrating the configuration of a particle defect inspection system using multi-tone control according to an embodiment of the present invention.

[0035] Figure 3 This shows what happens when viewed from different directions. Figure 2 The image shows a perspective view of the sorting machine.

[0036] Figure 4 It is shown Figure 2 The diagram shows a plan view of the sorting machine.

[0037] Figure 5 It is shown Figure 2 The cross-sectional view of the sorting machine shown.

[0038] Figure 6This is a front view illustrating the configuration of a sample inspector for a particle defect inspection system using deep learning-based multi-tone control according to an embodiment of the present invention.

[0039] Figure 7 It is shown Figure 6 The diagram shows a plan view of the sample inspector.

[0040] Figure 8 It is shown Figure 6 The cross-sectional view of the sample forming section of the sample inspector shown.

[0041] Figure 9 It is shown Figure 6 A perspective view of a portion of the configuration of the sample inspector shown.

[0042] Figure 10 It is shown Figure 6 A perspective view of another part of the configuration of the sample inspector shown.

[0043] Figure 11 This is a block diagram illustrating the configuration of the control device for a particle defect inspection system using multi-tone control according to the present invention.

[0044] Figure 12 This is a detailed view showing the configuration of the visual inspection controller.

[0045] Figure 13 This is a detailed view showing the configuration of the multi-tone control inspection unit.

[0046] Figure 14 This is a control chart illustrating the process of inspecting particle defects using a multi-tone method according to the present invention.

[0047] Figure 15 This is a flowchart illustrating a method for controlling a particle defect inspection system using multi-tone control according to the present invention. Detailed Implementation

[0048] The preferred embodiments of the particle defect inspection system using multi-tone control and the method for controlling the system according to the present invention will be described in detail below.

[0049] The features and advantages of the particle defect inspection system using multi-tone control and the method for controlling the system according to the present invention will become clear from the following detailed description of various embodiments.

[0050] Figure 1 This is a front view illustrating a particle defect inspection system using multi-tone control according to an embodiment of the present invention.

[0051] The particle defect inspection system and method for controlling the system according to the present invention are configured to detect the color of particles while continuously conveying multiple particles to determine whether a defect has occurred.

[0052] Therefore, according to the present invention, while the particles are being conveyed at high speed and continuously, the colors and images of both sides of the particles can be acquired to detect defects such as different colors, foreign objects, abnormal shapes and black spots, thereby effectively removing particles identified as defective while conveying the particles.

[0053] In particular, brightness and color can be parameterized, enabling more optimized imaging of products, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0054] The following describes an example of the configuration of a system that applies the particle defect inspection control technique using multi-tone control according to the present invention.

[0055] like Figure 1 As shown, the particle defect inspection system using multi-tone control according to the present invention includes: a sorting machine 100, which photographs and inspects the first and second surfaces of each particle while conveying a plurality of particles P to separate and remove particles P determined to be defective, and conveys and loads particles P with good quality to a designated location; and a sample inspector 200, which receives at regular intervals a plurality of particles determined to be good quality from the particles sorted in the sorting machine 100 to manufacture a sample S of a molded product, and then photographs the first and second surfaces of the manufactured sample S of the molded product to inspect whether the sample S of the molded product is defective.

[0056] The sorting machine 100 is configured to acquire the size, shape, color, etc., of multiple particles and determine whether the multiple particles are defective, so as to sort the particles into defective products and good products, and discharge the particles determined to be defective products. The particles are manufactured by cutting the thermoplastic resin into a certain size after extruding and molding it into a thin rod shape. The types of defects of the particles inspected by the sorting machine 100 include: different colors that deviate from the production quality standards, foreign matter attached or mixed with non-particulate matter, abnormal shapes that are larger and shaped than the size range to be produced, black spots caused by carbonization of raw materials or auxiliary materials or foreign matter, etc.

[0057] Figure 2 This is a perspective view illustrating the configuration of a particle defect inspection system using multi-tone control according to an embodiment of the present invention.

[0058] in addition, Figure 3 This shows what happens when viewed from different directions. Figure 2 The perspective view of the sorting machine shown. Figure 4 It is shown Figure 2The plan view of the sorting machine shown is as follows. Figure 5 It is shown Figure 2 The cross-sectional view of the sorting machine shown.

[0059] Reference Figures 2 to 5 The sorting machine 100 includes: a particle supply unit 110 for supplying a plurality of particles; a first particle conveying unit 120 for conveying the particles supplied from the particle supply unit 110 from rear to front; a particle transport unit 140 disposed at the front end of the first particle conveying unit 120 for conveying the particles transported by the first particle conveying unit 120 downward; a second particle conveying unit 130 disposed below the first particle conveying unit 120 for receiving the particles P conveyed downward by the particle transport unit 140, and inverting the particles at a 180° angle to convey the particles from front to rear; and a first visual inspection unit 150 disposed above the first particle conveying unit 120 for photographing the first surface of each particle P. (Top surface) for inspecting particle P for defects; a first distribution unit 160, disposed in front of the first visual inspection unit 150, for absorbing and discharging particles inspected by the first visual inspection unit 150; a second visual inspection unit 170, disposed above the second particle conveying unit 130 for photographing the second surface of each particle for inspecting the particle for defects; a second distribution unit 180, disposed behind the second visual inspection unit 170, for absorbing and discharging particles P inspected by the second visual inspection unit 170; and an unloading unit, disposed at the rear end of the second particle conveying unit 130, for receiving particles P conveyed by the second particle conveying unit 130, thereby conveying particles P to a designated unloading position.

[0060] The pellet supply unit 110 has upper and lower narrow hoppers 111, which are configured such that the inlet 111a for introducing pellets P opens at the upper end and is spaced a certain distance from the lower part of the hopper 111. It also includes multiple distribution plates 112, which are configured such that multiple pellet distribution holes 113 through which the pellets (P) pass perpendicularly penetrate. Therefore, when multiple manufactured pellets P are added through the inlet 111a of the hopper 111, the pellets P are evenly distributed to both sides through the pellet distribution holes 113 of the distribution plates 112, so that they fall onto the rear end of the first pellet conveying unit 120 and are thus supplied.

[0061] The first particle conveying unit 120 includes: a first conveying plate 121, mounted to be inclined downward at an angle θ1 of approximately 2° to 4° from rear to front; and a first vibration generator 125, which vibrates the first conveying plate 121 at a predetermined frequency to convey particles P. A plurality of channels 122 are formed on the top surface of the first conveying plate 121, extending in a front-rear direction along which particles P move. Each channel 122 has a groove extending in the front-rear direction of the first conveying plate 121, and the plurality of channels 122 are arranged continuously in the left-right width direction of the first conveying plate 121. The size of each channel 122 is slightly larger than the size of each particle P, therefore, particles P are conveyed in rows through the channels 122.

[0062] The first vibration generator 125 includes: a plurality of support rods 127 having an inverted "U" shape, which support the first conveyor plate 121 at the lower part of the rear end of the first conveyor plate 121; and a vibration module 126 that causes the support rods 127 to vibrate in the Z-axis direction, i.e., in the vertical direction, so that the first conveyor plate 121 vibrates in the Z-axis direction at a frequency of 40Hz to 440Hz, so that the particles P are conveyed along the channel 122 at a predetermined speed.

[0063] The second particle conveying unit 130 includes: a second conveying plate 131, which is installed on the lower side of the first conveying plate 121 and tilted downward from the front to the rear at an angle θ2 of about 2° to 4°, and is provided with a plurality of channels 122 for accommodating particles P; and a second vibration generator 135, which causes the second conveying plate 131 to vibrate at a predetermined frequency.

[0064] The number of channels 122 of the second conveyor plate 131 is the same as the number of channels 122 of the first conveyor plate 121, and the second vibration generator 135 is basically the same as the first vibration generator 125. Therefore, the second conveyor plate 131 vibrates in the Z-axis direction at a frequency of 40Hz to 440Hz, so that the particles P are conveyed from the front to the back along the channel 122 at a predetermined speed.

[0065] The top surfaces of the first conveyor plate 121 and the second conveyor plate 131 may be coated with a light-absorbing resin such as Teflon to prevent irregular reflections during the imaging process of the first visual inspection unit 150 and the second visual inspection unit 170.

[0066] The first visual inspection unit 150 and the second visual inspection unit 170 are respectively positioned above the first conveyor plate 121 and the second conveyor plate 131 at predetermined distances to photograph particles P conveyed by 122 passing through the first conveyor plate 121 and the second conveyor plate 131, so as to detect whether particles P have defects. The first visual inspection unit 150 and the second visual inspection unit 170, for example, use a 12M / 8Hz camera to acquire the color, shape, size, etc. of particles P through R / G / B / W illumination, so as to check for defects such as different colors, foreign objects, abnormal shapes, black spots, etc., and perform image tracking until particles P reach the first distribution unit 160 or the second distribution unit 180.

[0067] The first distribution section 160 and the second distribution section 180 are respectively disposed in front of the first visual inspection section 150 and behind the second visual inspection section 170. The first distribution section 160 and the second distribution section 180 include a plurality of vacuum nozzles 161 and 181 arranged in the left-right lateral direction above the first conveyor plate 121 and the second conveyor plate 131. The vacuum nozzles 161 and 181 vacuum suck up particles P that are determined to be defective or good as moving along the channel 122 of the first conveyor plate 121 and the second conveyor plate 131, so that the particles determined to be defective are discharged into a separate defective product collection container, and the particles determined to be good are discharged into the sample inspector 200.

[0068] Here, since vacuum nozzles 161 and 181 are each configured to traverse multiple channels 122, particles P identified as defective, along with particles P passing through channels 122 surrounding the defective particles P, are vacuum-suctioned and discharged. Vacuum nozzles 161 and 181 are connected to a vacuum generator, such as a known vacuum pump, to generate suction power, and particles P suctioned by vacuum nozzles 161 and 181 are discharged through a flow control valve (not shown), such as a three-way valve, to a defective product collection container (not shown) or a sample inspector 200, where they are then collected.

[0069] When the first distribution section 160 and the second distribution section 180 pick up particles P from the first conveyor plate 121 and the second conveyor plate 131, in order to prevent particles P from not separating from the channel 122, a plurality of fine ventilation holes 124 with a size smaller than that of each particle P are formed so as to pass vertically through the first conveyor plate 121 and the second conveyor plate 131 at positions corresponding to the vacuum nozzles 161 and 181 of the first distribution section 160 and the second distribution section 180. An auxiliary discharge blower 162 is installed below the first conveyor plate 121 and the second conveyor plate 131 to blow air through the fine ventilation holes 124. Thus, when the process of discharging defective particles is carried out through the vacuum nozzles 161 and 181, the auxiliary discharge blower 162 works to blow air upward through the fine ventilation holes 124 to help discharge particles P.

[0070] The particle conveying unit 140 is installed substantially vertically relative to the ground between the front end of the first conveying plate 121 and the front end of the second conveying plate 131 to convey the particles P conveyed by the first conveying plate 121 downwards, thereby inverting the particles at a 180° angle while conveying them to the front end of the second conveying plate 131.

[0071] In this embodiment, the particle conveying unit 140 includes: a first guide plate 141, which is mounted to extend downward at the front end of the first conveying plate 121; a second guide plate 142, which is mounted in front of the first guide plate 141 and spaced apart by a certain amount greater than the thickness of the particle P; and a plurality of guide channels 143, which are formed to extend vertically between the first guide plate 141 and the second guide plate 142 to guide the particle S.

[0072] The guide channel 143 is formed to correspond one-to-one with the channel 122 of the first conveyor plate 121 and the channel 122 of the second conveyor plate 131, so as to transport the particles S conveyed through the channel of the first conveyor plate 121 to the channel of the second conveyor plate 131.

[0073] When particle P is conveyed to channel 122 of second conveyor plate 131 via guide channel 143, in order to ensure that particle P is conveyed in an inverted state at an angle of 180°, first guide plate 141 and second guide plate 142 are preferably installed at an angle θ3 of 2° to 4° relative to an axis perpendicular to the ground.

[0074] In addition, in order to smoothly transport particles P from the front end of each channel 122 of the first conveyor plate 121 to the guide channel 143, and from the lower end of the guide channel 143 to the channel 122 of the second conveyor plate 131, an upper conveying auxiliary blower 144 that blows air between the upper ends of the first guide plate 141 and the second guide plate 142 can be installed on the upper side of the front end of the first guide plate 141, and a lower conveying auxiliary blower 145 that blows air from the front to the rear can be installed on the lower end of the second guide plate 142 to push the particles conveyed from the lower end of the guide channel 143 to the channel 122 of the second conveyor plate 131.

[0075] The unloading unit is configured to receive particles P discharged through the rear end of the second conveyor plate 141 of the second particle conveying unit 130, so as to convey particles P to a designated unloading position. In this embodiment, the unloading unit includes: a good product conveyor 191 that conveys particles determined to be good products discharged through the rear end of the second conveyor plate 131; an emergency discharge conveyor 192 that conveys particles determined to be defective discharged through the rear end of the second conveyor plate 131; and a conveyor moving unit 193 that conveys the good product conveyor 191 and the emergency discharge conveyor 192 to a position corresponding to the rear end of the second conveyor plate 131.

[0076] The conveyor moving unit 193 includes: a movable plate 194 on which a good product conveyor 191 and an emergency discharge conveyor 192 are mounted; and an actuator that causes the movable plate 194 to move linearly over a certain distance, and the movable plate 194 moves linearly by the actuator to align the good product conveyor 191 or the emergency discharge conveyor 192 with the lower side of the rear end of the second conveyor plate 131 so as to receive and convey particles discharged through the rear end of the second conveyor plate 131.

[0077] The emergency discharge conveyor 192 is configured to process all items as defects and discharge them if an emergency occurs, i.e., if the cumulative sum of the scores designated as defective based on the inspection results of the first visual inspection unit 150 and the second visual inspection unit 170 exceeds a certain value.

[0078] During the process of sorting defective particles by the sorter 100, a certain number of high-quality particles can be periodically separated and transported to the sample inspector 200 to produce a sample S of a disc-shaped sample. Then, the sample S of the molded product can be inspected for defects in order to minimize the possibility of defects in the final molded product using the particles.

[0079] The detailed configuration of the sample inspector 200 is as follows.

[0080] Figure 6 This is a front view illustrating the configuration of a sample inspector for a particle defect inspection system using deep learning-based multi-tone control according to an embodiment of the present invention. Figure 7 It is shown Figure 6 The diagram shows a plan view of the sample inspector.

[0081] The sample inspector 200 includes: a particle storage section 210 for receiving and storing high-quality particles from the first distribution section 160 or the second distribution section 180 of the sorter 100; a sample forming section 220 for manufacturing a sample of a disc-shaped product by heating and pressing a certain amount of particles supplied by the particle storage section 210; a cooling section 230 for cooling the sample S of the formed product manufactured in the sample forming section 220; a sample inspection section 250 for photographing the top and bottom surfaces of the sample S of the formed product transported by the sample transport robot 240 after being cooled by the cooling section 230 to check whether the sample S has defects; a marking section 260 for marking predetermined marks on the surface of the sample inspected by the sample inspection section 250; and a sample unloading stacker 270 for loading the marked sample S of the formed product in the marking section 260.

[0082] Figure 8 It is shown Figure 6 The cross-sectional view of the sample forming section of the sample inspector shown. Figure 9 It is shown Figure 6A perspective view of a portion of the configuration of the sample inspector shown.

[0083] also, Figure 10 It is shown Figure 6 A perspective view of another part of the configuration of the sample inspector shown.

[0084] The particle storage unit 210 is connected to the first distribution unit 160 or the second distribution unit 180 of the sorter 100 to receive and store particles, and is configured such that a sensor is mounted on one side thereon, automatically supplying particles to the lower mold 221 of the sample forming unit 220 when a certain amount (weight) of particles is reached.

[0085] The sample forming section 220 includes: a lower mold 221 having a cavity for receiving a certain amount of particles from the particle storage section 210; an upper mold 222 for manufacturing a sample of a disc-shaped product by pressing the particles placed into the cavity of the lower mold 221; and a heater for melting the particles by transferring heat to the particles through the lower mold 221 and the upper mold 222. The heater can be installed separately in the lower mold 221 and the upper mold 222.

[0086] Multiple lower molds 221 and upper molds 222 of the sample forming section 220 can be provided and arranged in a circle on an index table 225 that can rotate at a predetermined angle, thereby producing multiple molded product samples S at regular intervals.

[0087] The heaters located in the lower mold 221 and the upper mold 222 respectively can be configured by applying thin-plate ceramic heaters made of PTFE. The upper mold 222 is mounted to rotate vertically about a hinge axis 223 outside one side of the indexing table 225 and is rotated by an actuator such as a pneumatic or hydraulic cylinder to press and shape the particulate material placed into the cavity of the lower mold 221.

[0088] An indexing vibration unit (not shown) is installed to vibrate the lower mold 221, so that when particles are placed from the particle storage section 210 into the lower mold 221, the particles are evenly spread throughout the cavity of the lower mold 221.

[0089] In addition, when the particles are placed from the particle storage section 210 into the lower mold 221, in order to increase the melting rate of the particles by preheating them, a hot air supply (not shown) that supplies hot air to the lower mold 221 can be additionally installed on one side of the sample forming section 220.

[0090] The cooling section 230 of the lower mold 221 is disposed below one side of the indexing table 225 of the sample forming section 220. The cooling section 230 is configured to supply a cooling fluid, such as air or cooling water, to the bottom surface of the lower mold 221 in order to rapidly cool the sample S of the formed product on the lower mold 221.

[0091] A sample transport robot 240 is mounted on one side of the sample forming section 220 to vacuum-pick up a sample S of a molded product formed on the lower mold 221, so as to transport the sample S to the sample inspection section 250. The sample inspection section 250 includes: an inspection table 251, wherein a circular opening 252 is formed at its center, and the edge portion of the sample S of the molded product is located on the edge portion of the opening 252; and an upper vision inspection camera 253 and a lower vision inspection camera 254 disposed above and below the opening 252 of the inspection table 251, so as to photograph the top and bottom surfaces of the molded product sample S in order to inspect the sample S for defects.

[0092] The marking section 260 is installed on one side of the sample inspection section 250, and its markings specify the location of defects in the inspected sample S of the molded product, the batch number of the sample S of the molded product, and production data and time.

[0093] The sample unloading stacker 270 can be located below one side of the sample forming section 220, but its position is not particularly limited. For example, the sample unloading stacker 270 is configured as a cylindrical housing with an open top surface to hold multiple samples S of formed products. The sample S of formed products can be transported from the marking section 260 to the sample unloading stacker 270 by the sample transport robot 240.

[0094] The particle defect inspection system described below will be described in detail with a focus on the multi-tone control according to the present invention.

[0095] Figure 11 This is a block diagram illustrating the configuration of the control device for a particle defect inspection system using multi-tone control according to the present invention.

[0096] The particle defect inspection system using multi-tone control according to the present invention includes: a particle defect inspection device 300, comprising a sorter and a sample inspector, wherein the sorter, while conveying multiple particles P, photographs the first and second surfaces of each particle to inspect the particles, then removes particles P determined to be defective and conveys and loads particles P determined to be good to a designated position; the sample inspector, during the process of sorting defective particles by the sorter, periodically separates a certain number of high-quality particles to check whether a sample S of the molded product is defective, thereby minimizing the possibility of defects in the final molded product using the particles; and a multi-tone particle inspection controller 400, which controls particle conveying, reflects particle reference colors, and photographs the first (top) and second (bottom) surfaces of the particles conveyed along the channel while changing the RGBW irradiation segment, to analyze and determine the images.

[0097] Here, the multi-tone particle inspection controller 400 includes: a particle conveying controller 61, which controls a first particle conveying section 120, a particle transport section 140, and a second particle conveying section 130. The first particle conveying section 120 conveys particles P supplied from the particle supply section 110 from the rear to the front. The particle transport section 140 is disposed at the front end of the first particle conveying section 120 to transport the particles conveyed by the first particle conveying section 120 downwards. The second particle conveying section 130 is disposed below the first particle conveying section 120 to receive particles P transported downwards by the particle transport section 140, so that the particles P are conveyed from the front to the rear in an inverted state, allowing the particle P to be inspected to be photographed in a stable state; and a visual inspection controller 62, which controls a first visual inspection section 150 and a second visual inspection section 170. The first visual inspection section 150 is disposed above the first particle conveying section 120 to photograph the first surface (top surface) of the particle P. The system includes a second visual inspection unit 170 positioned above the second particle conveying unit 130 to photograph the second surface of the particles and inspect them for defects, reflecting the particle reference color, photographing the particles while changing the RGBW irradiation segment, and analyzing and determining the images to sort the particles; a distribution controller 63 that controls a first distribution unit 160 and a second distribution unit 180, the first distribution unit 160 being positioned in front of the first visual inspection unit 150 to pick up and discharge particles inspected by the first visual inspection unit 150, and the second distribution unit 180 being positioned behind the second visual inspection unit 170 to pick up and discharge particles P inspected by the second visual inspection unit 170; and an unloading controller 64 that controls an unloading unit positioned at the rear end of the second particle conveying unit 130 to receive particles P conveyed by the second particle conveying unit 130 to transport particles P to a designated unloading position.

[0098] Here, under the control of the visual inspection controller 62, the first visual inspection unit 150 and the second visual inspection unit 170, for example, use a 12M / 8Hz camera to acquire the color, shape, size, etc. of the particle P through R / G / B / W illumination, so as to inspect for defects such as different colors, foreign objects, abnormal shapes, black spots, etc., and perform image tracking until the particle P reaches the first distribution unit 160 or the second distribution unit 180.

[0099] In addition, in the visual inspection controller 62, when the particle defect inspection device is set up before inspecting new particles to be inspected, all RGBW can be used to supply a certain number of good products and a certain number of defective products to the device and the inspection process with a repeatability of 100% in order to find the optimal color matching conditions and classification criteria to be reflected in the actual particle inspection.

[0100] The detailed configuration of the visual inspection controller 62 is as follows.

[0101] Figure 12 This is a detailed view showing the configuration of the visual inspection controller.

[0102] like Figure 12 As shown, the visual inspection controller 62 includes: a multi-tone control irradiation unit 71 that reflects a reference color, thereby adjusting the size and intensity of the RGBW irradiation segment based on the unique color information of the particle to be inspected, and capturing images of the particle to be inspected while changing the size and intensity of the irradiation segment; a reflective image acquisition unit 72 that acquires particle images based on the RGBW irradiation of the multi-tone control irradiation unit 71; an image acquisition object position tracking unit 73 that tracks the transport position of the particles inspected by the reflective image acquisition unit 72; and an image analysis and determination unit 74 that analyzes the acquired images of the reflective image acquisition unit 72 to determine good and defective products, thereby sorting the particles.

[0103] In addition, the multi-tone control illumination unit 71 can be implemented to provide red / green / blue light sources as a control lamp, and the PWM form is digitally encoded from 0 to 255 to illuminate the set segment with R / G / B / W, but is not limited to this.

[0104] In addition, the multi-tone control irradiation unit 71 reflects the unique color information of the particles to be inspected into the size setting and irradiation intensity setting of the RGBW irradiation section to improve the resolution of the acquired image, thereby improving the analysis accuracy.

[0105] In addition, the multi-tone control irradiation unit 71 can accumulate the defect values ​​of each RGBW irradiation segment to output the final defect value.

[0106] The detailed configuration of the multi-tone control irradiation unit 71 is as follows.

[0107] Figure 13 This is a detailed view showing the configuration of the multi-tone control inspection unit.

[0108] The multi-tone control irradiation unit 71 includes: a particle reference color reflection unit 81, which reflects a reference color to adjust the size setting and irradiation intensity of the RGBW irradiation segment based on the unique color information of the particle to be inspected; an RGBW irradiation segment changing unit 82, which adaptively changes the size of the R irradiation segment, the G irradiation segment, the B irradiation segment, and the W irradiation segment based on the deviation between the unique color information of the particle to be inspected and the defect inspection result; and an accumulated defect value calculation unit 83, which accumulates the defect values ​​of each RGBW irradiation segment to output a final defect value.

[0109] Here, when the RGBW irradiation segment is changed, the size of the irradiation segment causes a difference in the size of the RGBW irradiation segment, thereby eliminating the influence of the unique color of the particle to be inspected on the particle inspection.

[0110] In addition, when changing the RGBW irradiation segment, if the deviation of the defect detection results is used as a reference value, for example, if no particle defects are detected in any specific irradiation segment of RGBW, or if too many defective particles are detected in any specific irradiation segment of RGBW, then the size of the RGBW irradiation segment can be changed for inspection and optimization.

[0111] Figure 14 This is a control chart illustrating the process of inspecting particle defects using multi-tone methods according to the present invention.

[0112] In particle defect inspection using multi-tone control, accuracy can be improved because particle defects are detected by delivering light more directly to the surface of the particles to analyze the reflection image compared to S / W color processing.

[0113] Figure 15 This is a flowchart illustrating a method for controlling a particle defect inspection system using multi-tone control according to the present invention.

[0114] First, when particle P is placed into the sorter, the particle is allocated to be contained in the channel of the first conveyor plate and conveyed from the rear to the front at a predetermined speed (S1001), and the first surface (top surface) of each particle conveyed along the channel is photographed while reflecting the particle reference color and changing the RGBW irradiation segment (S1002).

[0115] Subsequently, image analysis and determination are performed while tracking the location of the object in the image to be acquired, so as to exclude particles P (S1003) that are identified as defective.

[0116] Then, the particle P whose first surface (top surface) has been inspected is conveyed to the channel of the second conveyor plate and inverted so that the second surface (bottom surface) faces upward (S1004). Then, the second surface (bottom surface) of the particle conveyed along the channel is photographed while the RGBW irradiation segment is changed (S1005).

[0117] Subsequently, image analysis and determination are performed while tracking the location of the object to be captured in order to exclude particles P (S1006) that are identified as defective.

[0118] In the method of the particle defect inspection system using multi-tone control according to the present invention, during the process of photographing particles while changing the RGBW irradiation segment, the reference color can be reflected, so that the size setting and irradiation intensity of the RGBW irradiation segment can be adjusted based on the unique color information of the particle to be inspected.

[0119] In addition, while photographing particles by changing the RGBW irradiation segments, the size of the R irradiation segment, the size of the G irradiation segment, the size of the B irradiation segment, and the size of the W irradiation segment can be adaptively changed based on the deviation between the unique color information of the particle to be inspected and the defect detection results.

[0120] In the particle defect inspection system and method for controlling the system according to the present invention, the color and image on both surfaces of the particles can be acquired while the particles are being conveyed at high speed and continuously to detect different colors, foreign objects, abnormal shapes, black spots, etc., and particles identified as defective can be effectively removed while the particles are being conveyed, thereby improving the accuracy and efficiency of particle inspection and sorting operations.

[0121] As described above, it should be understood that the present invention is implemented in modified forms without departing from the essential characteristics of the invention.

[0122] Therefore, it should be understood that the specific embodiments are considered from a descriptive rather than restrictive perspective, and the scope of the invention is shown in the claims rather than in the foregoing description, and all differences within the equivalent scope are considered to be included in the invention.

[0123] Industrial applicability

[0124] This invention relates to particle inspection and sorting, and more specifically, to a particle defect inspection system using multi-tone control and a method for controlling the system, the system continuously feeding multiple particles to detect the color of the particles, thereby determining whether the particles are defective.

Claims

1. A particle defect inspection system using multi-tone control, comprising: A particle defect inspection device includes a sorting machine configured to inspect a first and second surface of each particle while conveying a plurality of particles, in order to remove particles determined to be defective and to convey and load particles determined to be good to a designated location; and A multi-tone particle inspection controller is configured to capture images of the first and second surfaces of individual particles transported along the channel while controlling particle delivery and varying the RGBW irradiation segment, in order to analyze and determine the images. Specifically, when the particle defect inspection device is set up before inspecting new particles to be inspected, all RGBW are used to supply a certain number of good products and a certain number of defective products to the device, and the inspection process has a 100% repeatability rate, in order to find the optimal color matching conditions and classification criteria to be reflected in the actual particle inspection. While photographing the particles by changing the RGBW irradiation segments, the sizes of the R, G, B, and W irradiation segments are adaptively changed based on the deviation between the unique color information of the particles to be inspected and the defect inspection results.

2. The particle defect inspection system according to claim 1, wherein, The multi-tone particle inspection controller includes a particle conveying controller configured to control: a first particle conveying section for conveying particles supplied from a particle supply section from rear to front; a particle transport section disposed at the front end of the first particle conveying section for transporting particles transported by the first particle conveying section downward; and a second particle conveying section disposed below the first particle conveying section for receiving particles transported downward by the particle transport section, so as to convey the particles from front to back in an inverted state, thereby capturing the particles to be inspected in a stable state.

3. The particle defect inspection system according to claim 1, wherein, The multi-tone particle inspection controller includes a vision inspection controller configured to control: a first vision inspection unit disposed above the first particle conveying unit to photograph the first surface of the particles in order to inspect the particles for defects; and a second vision inspection unit disposed above the second particle conveying unit to photograph the second surface of the particles and inspect the particles for defects, so as to reflect the particle reference color, photograph the particles while changing the RGBW irradiation segment, and analyze and determine the image to sort the particles.

4. The particle defect inspection system according to claim 3, wherein, Under the control of the visual inspection controller, the first visual inspection unit and the second visual inspection unit use a 12M / 8Hz camera to acquire the color, shape and size of the particles through R / G / B / W illumination in order to inspect for defects such as different colors, foreign objects, abnormal shapes and black spots.

5. The particle defect inspection system according to claim 3, wherein, The visual inspection controller includes: The multi-tone control irradiation section is configured with a reflective reference color, so that the size and irradiation intensity of the RGBW irradiation section are adjusted based on the unique color information of the particle to be inspected, and the particle to be inspected is photographed while the size and irradiation intensity of the RGBW irradiation section are changed. The reflective image acquisition unit is configured to acquire particle images based on RGBW illumination from the multi-tone control irradiation unit; An image acquisition object position tracking unit is configured to track the transport position of the particles to be inspected via the reflected image acquisition unit; and The image analysis and determination unit is configured to analyze the images acquired by the reflective image acquisition unit in order to determine good and defective products, thereby sorting the particles.

6. The particle defect inspection system according to claim 5, wherein, The multi-tone control illumination unit is configured to provide red / green / blue light sources as a control lamp, and the PWM form is digitally encoded from 0 to 255 to illuminate the set segment with R / G / B / W.

7. The particle defect inspection system according to claim 5, wherein, The multi-tone controlled irradiation unit includes: The particle reference color reflector is configured to reflect a reference color, so that the size setting and irradiation intensity of the RGBW irradiation segment can be adjusted based on the unique color information of the particle to be inspected. The RGBW irradiation segment changing unit is configured to adaptively change the sizes of the R irradiation segment, G irradiation segment, B irradiation segment, and W irradiation segment based on the deviation between the unique color information of the particle to be inspected and the defect inspection results; and The cumulative defect value calculation unit is configured to accumulate the defect values ​​of each RGBW irradiation segment to output the final defect value.

8. The particle defect inspection system according to claim 1, wherein, The sorting machine of the particle defect inspection device includes: The pellet supply department is configured to supply multiple pellets; The first particle conveying unit is configured to convey particles supplied from the particle supply unit from the rear to the front. A particle conveying unit is provided at the front end of the first particle conveying unit to convey particles conveyed by the first particle conveying unit downwards. The second particle conveying unit is disposed below the first particle conveying unit to receive particles conveyed downward through the particle conveying unit, and at a 180° angle. o The particles are inverted at an angle to convey them from front to back; A first visual inspection unit is positioned above the first particle conveying unit to photograph the first surface of each particle in order to inspect whether the particles have defects. A first distribution unit is disposed in front of the first visual inspection unit to pick up particles identified as defective by the first visual inspection unit so as to separate the defective particles from the first particle conveying unit. A second visual inspection unit is disposed above the second particle conveying unit to photograph the second surface of each particle in order to inspect the particles for defects. A second distribution unit, located behind the second visual inspection unit, picks up particles identified as defective by the second visual inspection unit, so as to separate the defective particles from the second particle conveying unit; and An unloading unit is provided at the rear end of the second particle conveying unit to receive particles conveyed by the second particle conveying unit, so as to convey the particles to a designated unloading position.

9. A method for controlling a particle defect inspection system using multi-tone control, the method comprising: When particle P is put into the sorter, the particle is distributed to be contained in the channel of the first conveyor plate and conveyed from the rear to the front at a predetermined speed. While changing the RGBW irradiation section, the first surface of each particle being transported along the channel of the first conveyor plate is photographed. While tracking the position of the object to be imaged, the image of the first surface is analyzed and determined in order to remove particles identified as defective. Particles with the first surface inspected are conveyed to the channel of the second conveyor plate to invert the particles so that the second surface faces upward. While changing the RGBW irradiation section, the second surface of each particle being transported along the channel of the second conveyor plate is photographed. and While tracking the location of the object to be imaged, the image of the second surface is analyzed and determined in order to remove particles identified as defective. In this process, when a particle defect inspection device is set up before inspecting new particles, all RGBW components are used to supply the device with a certain number of good products and a certain number of defective products, with a 100% repeatability rate, in order to find the optimal color matching conditions and classification criteria to be reflected in the actual particle inspection. While photographing particles by changing the RGBW irradiation segments, the sizes of the R, G, B, and W irradiation segments are adaptively changed based on the deviation between the unique color information of the particles to be inspected and the defect inspection results.

10. The method according to claim 9, wherein, When photographing particles while changing the RGBW illumination band, the reference color is reflected, allowing the size setting and illumination intensity of the RGBW illumination band to be adjusted based on the unique color information of the particles to be inspected.

Images