A fully automatic temperature measuring and sampling system and a temperature measuring and sampling method

Abstract

The present application relates to a kind of full-automatic temperature measurement sampling system and temperature measurement sampling method, mainly applied to the ladle refining field of metallurgical industry.The present application includes probe blanking device, its structural features are that: it further includes probe clamping and overturning device, temperature measurement sampling gun device and probe unloading device, the probe blanking device is cooperated with probe clamping and overturning device, the probe clamping and overturning device is cooperated with temperature measurement sampling gun device, the temperature measurement sampling gun device is cooperated with probe unloading device, the temperature measurement sampling gun device exists probe installation station, temperature measurement sampling station and probe disassembly station in rotating process, the probe clamping and overturning device is located probe installation station, the probe unloading device is located probe disassembly station.Probe is pushed out by probe blanking device, when temperature measurement sampling gun device is located probe installation station, the pushed-out probe is installed on temperature measurement gun or sampling gun by probe clamping and overturning device.

Description

Technical Field

[0001] This invention relates to a fully automatic temperature measurement and sampling system and method, which is mainly applied in the ladle refining field of the metallurgical industry. Background Technology

[0002] Currently, most steel mills require manual temperature measurement and sampling, while some use semi-automated equipment. While the temperature measurement or sampling process is automated, the installation and removal of the temperature or sampling probes require manual operation. Manual operation is inefficient and poses safety risks. Existing technologies lack proper guiding structures for probe insertion, leading to inaccurate installation. Furthermore, probe replacement requires going to the furnace for temperature measurement and sampling, which is inconvenient for both manual and machine operations. The high furnace temperature poses significant safety hazards and could easily cause accidents if probes are replaced manually. If machines are used for replacement, the reliability of the machine drops drastically under high-temperature baking, leading to frequent machine failures and severely impacting steelmaking efficiency.

[0003] In view of this, patent document application number 202010722369.9 discloses an automatic temperature measurement and sampling device and its temperature measurement and sampling method for steelmaking. The above-mentioned prior art uses a robot gripper to grab the temperature measurement and sampling sleeve and install it on the temperature measurement and sampling gun. Patent document application number 201810229602.2 discloses an automatic temperature measurement and / or sampling method for molten steel in front of a steelmaking converter. The above-mentioned prior art requires tilting the steelmaking converter to the process angle when measuring temperature and / or sampling. Summary of the Invention

[0004] The purpose of this invention is to overcome the above-mentioned shortcomings in the prior art and to provide a fully automatic temperature measurement and sampling system and method with a reasonable structural design.

[0005] The technical solution adopted by this invention to solve the above problems is as follows: The fully automatic temperature measurement and sampling system includes a probe feeding device, which comprises a sampling probe feeding mechanism and a temperature measuring probe feeding mechanism, symmetrically arranged. The sampling probe feeding mechanism includes a sampling probe hopper, a dispensing mechanism, a pushing mechanism, and a photoelectric sensor, arranged sequentially from top to bottom at the lower part of the sampling probe hopper. The temperature measuring probe feeding mechanism includes a temperature measuring probe hopper, a dispensing mechanism, a pushing mechanism, and a photoelectric sensor, arranged sequentially from top to bottom at the lower part of the temperature measuring probe hopper. Its structural feature is that the fully automatic temperature measurement and sampling system also includes a probe clamping and flipping device. The device includes a temperature sampling gun assembly and a probe unloading assembly. The probe gripping and flipping device is located in the middle of the sampling probe unloading mechanism and the temperature probe unloading mechanism. The probe unloading device cooperates with the probe gripping and flipping device, the probe gripping and flipping device cooperates with the temperature sampling gun assembly, and the temperature sampling gun assembly cooperates with the probe unloading device. During rotation, the temperature sampling gun assembly has a probe installation position, a temperature sampling position, and a probe disassembly position. The probe gripping and flipping device is located at the probe installation position, and the probe unloading device is located at the probe disassembly position. The probe gripping and flipping device includes a gripping mechanism, a translation mechanism, a lifting mechanism, and a flipping mechanism. The gripping mechanism is mounted on the translation mechanism, the translation mechanism is mounted on the lifting mechanism, and the lifting mechanism is mounted on the flipping mechanism. The probe is pushed out by the probe feeding device. When the temperature sampling gun device is in the probe installation position, the probe is installed on the temperature gun or sampling gun by the probe clamping and flipping device. When the sampling gun device is in the temperature sampling position, the probe on the temperature gun or sampling gun can be used for temperature measurement or sampling. When the sampling gun device is in the probe disassembly position, the probe on the temperature gun or sampling gun can be disassembled by the probe unloading device. The sampling probe and temperature measuring probe are fed into the sampling probe hopper and temperature measuring probe hopper respectively, which facilitates the subsequent clamping of the probe. The flipping device can be used to adjust the position of the probe for easy installation on the sampling gun or temperature gun.

[0006] Furthermore, the gripping mechanism includes a gun head guide gripper, a probe gripping gripper, a first linear bearing, a guide rod, a probe bracket, a mounting frame, and a push-pull cylinder. The mounting frame is mounted on a translation mechanism. The gun head guide gripper and the probe bracket are respectively fixedly mounted at both ends of the mounting frame. The probe gripping gripper is slidably mounted on the mounting frame. The guide rod is mounted on the mounting frame. The probe gripping gripper is mounted on the guide rod via the first linear bearing. The cylinder of the push-pull cylinder is mounted on the mounting frame, and the piston rod of the push-pull cylinder is connected to the probe gripping gripper. The probe is gripped by the gripping mechanism, and the probe is moved by driving the gripping mechanism to move via the translation mechanism. The probe is lifted by driving the translation mechanism to lift via the lifting mechanism, and the probe is flipped by driving the lifting mechanism to flip via the flipping mechanism. The main bodies of the gun head guide gripper and the probe gripping gripper are driven by two dual-axis cylinders. The first linear bearing and the guide rod allow the gripping mechanism to move on the translation mechanism, and the push-pull cylinder drives the probe gripping gripper to move.

[0007] Furthermore, the translation mechanism includes an electric cylinder slide, a slide mounting base, and a movable slider. The slide mounting base is mounted on the lifting mechanism, the electric cylinder slide is mounted on the slide mounting base, the movable slider is mounted on the electric cylinder slide, and the gripping mechanism is mounted on the movable slider. The movement of the mounting frame can then be achieved via the movable slider on the electric cylinder slide.

[0008] Furthermore, the lifting mechanism includes a lifting cylinder, a guide column, a second linear bearing, a floating joint, and a rotating bracket. The rotating bracket is mounted on the tilting mechanism, the cylinder barrel of the lifting cylinder is disposed on the rotating bracket, the piston rod of the lifting cylinder is connected to the translation mechanism via the floating joint, the guide column is disposed on the translation mechanism, and the second linear bearing is disposed on the rotating bracket, with the guide column and the second linear bearing passing through each other. The lifting cylinder controls the raising and lowering of the slide mounting base, and the guide column and second linear bearing allow the slide mounting base to rise and fall along the guide column.

[0009] Furthermore, the tilting mechanism includes a baffle, a self-aligning roller bearing, an equipment support frame, a tilting shaft, a synchronous belt, a driven synchronous pulley, and a servo motor. The tilting shaft is mounted on the equipment support frame via the self-aligning roller bearing. The lifting mechanism is mounted on the tilting shaft. A baffle is mounted at one end of the tilting shaft, and a driven synchronous pulley is mounted at the other end. The driven synchronous pulley and the driving synchronous pulley of the servo motor are driven by a synchronous belt. A dust cover is provided on the outer side of the synchronous belt, and the synchronous belt contacts the synchronous belt tensioner. The tilting mechanism allows the rotating bracket to tilt on the tilting shaft. The servo motor drives the driving synchronous pulley to rotate, which in turn drives the driven synchronous pulley to rotate via the synchronous belt, thus driving the tilting shaft to rotate. The dust cover serves to prevent dust accumulation. The synchronous belt tensioner is mounted on a synchronous belt tensioner bracket, which is tensioned by a tension spring to tighten the synchronous belt and prevent it from becoming loose.

[0010] Furthermore, the temperature sampling gun device includes a moving mechanism, a rotating mechanism, a swinging mechanism, and a fixed column. The rotating mechanism is mounted on the fixed column, the swinging mechanism is mounted on the rotating mechanism, and the moving mechanism is mounted on the swinging mechanism.

[0011] Furthermore, the moving mechanism includes a sampling gun, a sampling carriage, a temperature measuring gun, a temperature measuring carriage, a guide rail frame, a parallel shaft reduction motor, a driven sprocket, a tension sprocket, a driving sprocket, and a chain. The guide rail frame is mounted on the swing mechanism. The driving sprocket is connected to the output shaft of the parallel shaft reduction motor. The sampling carriage, temperature measuring carriage, driven sprocket, and tension sprocket are all mounted on the guide rail frame. The sampling gun and temperature measuring gun are respectively mounted on the sampling carriage and the temperature measuring carriage. The driven sprocket, tension sprocket, and driving sprocket are driven by a chain. The sampling carriage and the temperature measuring carriage are each connected to a chain. Limit stops are provided on the guide rail frame. The rotating mechanism drives the swing mechanism to rotate, which in turn drives the moving mechanism to swing. The moving mechanism then drives the sampling gun or temperature measuring gun to move, thereby achieving the sampling or temperature measuring function. The parallel shaft geared motor drives the chain drive, which pulls the sampling trolley or temperature measuring trolley to move. Limit stops are used to restrict the movement of the sampling trolley or temperature measuring trolley to a certain position.

[0012] Furthermore, the rotating mechanism includes a rotating base, a dust cover, a slewing bearing, a gear, and a cycloidal reducer. The gear is connected to the output shaft of the cycloidal reducer. The slewing bearing is mounted on a fixed column, and the gear meshes with the slewing bearing. The rotating base is mounted on the slewing bearing, and the swinging mechanism is mounted on the rotating base. The dust cover covers the slewing bearing and the gear. A limit switch is installed on the fixed column. The cycloidal reducer drives the gear to rotate, and the meshing of the gear with the slewing bearing enables the rotating base to rotate. The dust cover prevents dust from entering. The limit switch limits the rotational position of the probe gripping and flipping device.

[0013] Furthermore, the swing mechanism includes a support shaft and a servo cylinder. The tilting bracket is mounted on the rotating mechanism via the support shaft, and the two ends of the servo cylinder are connected to the rotating mechanism and the tilting bracket, respectively. The servo cylinder drives the tilting bracket to swing along the support shaft on the rotating base.

[0014] Furthermore, the probe unloading device includes unloading grippers, an unloading bracket, and a storage box. The unloading grippers are mounted on the unloading bracket, and the storage box is located below the unloading grippers. The unloading grippers hold the probe, allowing the probe, after temperature measurement or sampling, to fall into the storage box.

[0015] Furthermore, another technical objective of the present invention is to provide a temperature sampling method for a fully automated temperature sampling system.

[0016] The above-mentioned technical objective of the present invention is achieved through the following technical solution.

[0017] A temperature sampling method for a fully automated temperature measurement and sampling system, characterized in that the temperature sampling method is as follows:

[0018] During temperature measurement, temperature probes are placed into the probe hopper in the same direction. The temperature sampling gun device rotates from the standby position to the probe installation position, aligning the temperature gun with the probe installation position. The probe feeding device pushes out one temperature probe from the probe hopper. Then, the probe clamping and flipping device installs the pushed-out probe onto the tip of the temperature gun. Next, the temperature sampling gun device rotates to the temperature sampling position, and the servo cylinder tilts the temperature gun to align with the furnace door. Then, the temperature measuring trolley moves the temperature gun into the molten steel to be measured, achieving... After the temperature measurement requirement is met, the temperature measurement trolley pulls the temperature measuring gun out of the molten steel and returns to the highest position. Then, the servo electric cylinder pulls the tilting bracket back to its original vertical position. After another rotation, the temperature sampling gun device is rotated to the probe disassembly station. The temperature measuring gun is lowered by the temperature measurement trolley, and the unloading jaws clamp the temperature measuring probe. The temperature measuring gun is raised by the temperature measurement trolley to the highest position. At this time, the temperature measuring probe is separated from the head of the temperature measuring gun. The unloading jaws release the probe, and the probe falls into the storage box. Finally, the temperature sampling gun device is rotated to the standby position. The entire temperature measurement process is now complete.

[0019] During sampling, the sampling probes are placed into the sampling probe hopper in the same direction. The temperature-measuring sampling gun device rotates from the standby position to the probe installation position, aligning the sampling gun with the probe installation position. The probe feeding device pushes out one sampling probe from the sampling probe hopper. Then, the probe clamping and flipping device installs the pushed-out probe onto the head of the sampling gun. The temperature-measuring sampling gun device then rotates to the temperature-measuring sampling position, and the servo electric cylinder tilts the sampling gun to align with the furnace door. The sampling trolley then moves the sampling gun into the molten steel to be sampled, achieving... After sampling, the sampling trolley pulls the sampling gun out of the molten steel and returns it to the highest position. Then, the servo cylinder pulls the tilting bracket back to its original vertical position. After rotating again, the temperature measuring sampling gun device is rotated to the probe disassembly station. The sampling gun is lowered by the sampling trolley, and the unloading jaws clamp the sampling probe. The sampling gun is raised by the sampling trolley to the highest position. At this time, the sampling probe is separated from the head of the sampling gun. The unloading jaws release the probe, and the probe falls into the storage box. Finally, the temperature measuring sampling gun device rotates to the standby position. The entire sampling process is now complete.

[0020] Compared with existing technologies, the present invention has the following advantages: the fully automatic temperature measurement and sampling system allows workers to simply place the temperature measurement or sampling probes into their respective hoppers in the same direction; when sampling is required (temperature measurement), the operator can remotely click the sampling button (temperature measurement button), and the fully automatic temperature measurement and sampling device can automatically perform the sampling (temperature measurement) process. This process is fully automated and requires no human intervention, improving the stability and reliability of the system; and it improves the overall production efficiency of the system in temperature measurement and sampling.

[0021] The nozzle guide gripper in the clamping and flipping device aligns the nozzle with the probe, acting as a guide. One end of the nozzle guide gripper is flared, while the other end is slightly larger than the probe's outer diameter, allowing the probe to be inserted into it. The flared opening facilitates nozzle insertion, ensuring that the probe and nozzle docking is completed entirely within the nozzle guide gripper, eliminating the need for manual installation and further increasing the success rate of nozzle insertion. The rotating mechanism, swing mechanism, and moving mechanism control the sampling gun or temperature measuring gun to flexibly switch between probe installation, temperature sampling, and probe unloading positions, eliminating the need for manual installation and removal of the probe from the furnace, thus improving work efficiency and safety. Attached Figure Description

[0022] Figure 1 This is a top view of the fully automated temperature measurement and sampling system according to an embodiment of the present invention.

[0023] Figure 2 This is a schematic diagram of the probe installation station according to an embodiment of the present invention.

[0024] Figure 3 This is a schematic diagram of the temperature measurement and sampling station in an embodiment of the present invention.

[0025] Figure 4 This is a schematic diagram of the probe disassembly station according to an embodiment of the present invention.

[0026] Figure 5 This is a front view structural diagram of the probe feeding device according to an embodiment of the present invention.

[0027] Figure 6 This is a three-dimensional structural schematic diagram of the probe feeding device according to an embodiment of the present invention.

[0028] Figure 7 This is a three-dimensional structural schematic diagram of the probe feeding device according to an embodiment of the present invention.

[0029] Figure 8 This is a front view structural diagram of the probe feeding device according to an embodiment of the present invention.

[0030] Figure 9 This is a schematic diagram of the left-side structure of the probe feeding device according to an embodiment of the present invention.

[0031] Figure 10 This is a three-dimensional structural diagram of the feeding mechanism according to an embodiment of the present invention.

[0032] Figure 11 This is a front view structural schematic diagram of the feeding mechanism according to an embodiment of the present invention.

[0033] Figure 12 yes Figure 11 A schematic diagram of the AA cross-sectional structure.

[0034] Figure 13 This is a three-dimensional structural diagram of the probe clamping and flipping device in an embodiment of the present invention when picking up the probe.

[0035] Figure 14 This is a three-dimensional structural diagram of the probe clamping and flipping device in an embodiment of the present invention when the probe is being mounted.

[0036] Figure 15 This is a front view schematic diagram of the probe clamping and flipping device in an embodiment of the present invention when picking up the probe.

[0037] Figure 16 This is a three-dimensional structural diagram of the gripping mechanism according to an embodiment of the present invention.

[0038] Figure 17 This is a schematic diagram of the temperature sampling gun device in an inclined state according to an embodiment of the present invention.

[0039] Figure 18 yes Figure 17Schematic diagram of the BB cross-section structure.

[0040] Figure 19 This is a schematic diagram of the temperature sampling gun device in the vertical state according to an embodiment of the present invention.

[0041] Figure 20 This is a three-dimensional structural schematic diagram of the probe unloading device according to an embodiment of the present invention.

[0042] In the diagram: 1. Probe feeding device; 2. Probe gripping and flipping device; 3. Temperature sampling gun device; 4. Probe unloading device; 5. Furnace body.

[0043] Sampling probe hopper 11, material dispensing mechanism 12, material pushing mechanism 13, temperature measuring probe hopper 14, photoelectric sensor 15.

[0044] Material dispensing cylinder bracket 121, material dispensing cylinder 122, material dispensing baffle 123

[0045] Pusher cylinder bracket 131, pusher cylinder 132, pusher support 133, pusher slider 134, pusher slide rail 135, connecting bracket 136, probe slot 137.

[0046] 21. Grabbing mechanism; 22. Translation mechanism; 23. Lifting mechanism; 24. Tilting mechanism.

[0047] 211, probe guide gripper; 212, probe gripper; 213, first linear bearing; 214, guide rod; 215, probe bracket; 216, mounting bracket; 217, push-pull cylinder.

[0048] Electric cylinder slide 221, slide mounting base 222, movable slider 223

[0049] Lifting cylinder 231, guide column 232, second linear bearing 233, floating joint 234, rotating bracket 235.

[0050] 241. Baffle plate; 242. Self-aligning roller bearing; 243. Equipment support frame; 244. Tilting shaft; 245. Synchronous belt; 246. Driven synchronous belt pulley; 247. Dust cover; 248. Servo motor; 249. Synchronous belt tensioner.

[0051] 31. Moving mechanism; 32. Tilting bracket; 33. Bracket shaft; 34. Rotary seat; 35. Fixed column; 36. Dust cover; 37. Slewing bearing; 38. Gear; 39. Cycloidal reducer; 310. Servo electric cylinder

[0052] Sampling gun 311, sampling carriage 312, temperature measuring gun 313, temperature measuring carriage 314, guide rail frame 315, parallel shaft geared motor 316, driven sprocket 317, tension sprocket 318, drive sprocket 319, chain 3110, limit stop 3111

[0053] 41. Unloading gripper; 42. Unloading bracket; 43. Storage box. Detailed Implementation

[0054] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments. The following embodiments are explanations of the present invention, but the present invention is not limited to the following embodiments.

[0055] Example

[0056] See Figures 1 to 20 As shown in the accompanying drawings, the structures, proportions, sizes, etc., depicted are merely for illustrative purposes to aid those skilled in the art and to facilitate understanding. They are not intended to limit the scope of the invention and therefore have no substantial technical significance. Any modifications to the structure, changes in proportions, or adjustments to size, without affecting the effectiveness or purpose of the invention, should still fall within the scope of the disclosed technical content. Furthermore, the use of terms such as "upper," "lower," "left," "right," "middle," and "one" in this specification is merely for clarity and not intended to limit the scope of the invention. Changes or adjustments to their relative relationships, without substantially altering the technical content, should also be considered within the scope of the invention.

[0057] The fully automatic temperature measurement and sampling system in this embodiment includes a probe feeding device 1, a probe clamping and flipping device 2, a temperature sampling gun device 3, and a probe unloading device 4. The probe feeding device 1 cooperates with the probe clamping and flipping device 2, the probe clamping and flipping device 2 cooperates with the temperature sampling gun device 3, and the temperature sampling gun device 3 cooperates with the probe unloading device 4. During the rotation process, the temperature sampling gun device 3 has a probe installation station, a temperature sampling station, and a probe disassembly station. The probe clamping and flipping device 2 is located at the probe installation station, and the probe unloading device 4 is located at the probe disassembly station.

[0058] The probe feeding device 1 in this embodiment includes a sampling probe feeding mechanism and a temperature measuring probe feeding mechanism. The sampling probe feeding mechanism and the temperature measuring probe feeding mechanism are symmetrically arranged. The probe clamping and flipping device 2 is located in the middle of the sampling probe feeding mechanism and the temperature measuring probe feeding mechanism.

[0059] The sampling probe feeding mechanism in this embodiment includes a sampling probe hopper 11, a dispensing mechanism 12, a pushing mechanism 13, and a photoelectric sensor 15. The dispensing mechanism 12, the pushing mechanism 13, and the photoelectric sensor 15 are arranged sequentially from top to bottom at the lower part of the sampling probe hopper 11. The dispensing mechanism 12 and the pushing mechanism 13 are both arranged on the sampling probe hopper 11, with the dispensing mechanism 12 located above the pushing mechanism 13. The photoelectric sensor 15 is arranged at the bottom of the sampling probe hopper 11.

[0060] The temperature probe feeding mechanism in this embodiment includes a temperature probe hopper 14, a dispensing mechanism 12, a pushing mechanism 13, and a photoelectric sensor 15. The dispensing mechanism 12, the pushing mechanism 13, and the photoelectric sensor 15 are arranged sequentially from top to bottom at the lower part of the temperature probe hopper 14. The dispensing mechanism 12 and the pushing mechanism 13 are both arranged on the temperature probe hopper 14, with the dispensing mechanism 12 located above the pushing mechanism 13. The photoelectric sensor 15 is arranged at the bottom of the temperature probe hopper 14.

[0061] The material distribution mechanism 12 in this embodiment includes a material distribution cylinder support 121, a material distribution cylinder 122, and a material distribution baffle 123. The material distribution cylinder support 121 is mounted on the sampling probe hopper 11 or the temperature probe hopper 14. The cylinder barrel of the material distribution cylinder 122 is mounted on the material distribution cylinder support 121. The piston rod of the material distribution cylinder 122 is connected to the material distribution baffle 123. The material distribution baffle 123 is located inside the sampling probe hopper 11 or the temperature probe hopper 14, and its end is inclined. The material distribution mechanism 12 can be used to separate the guiding section and the discharge section, preventing excessive probe accumulation in the discharge section from causing the pushing mechanism 13 to be unable to push the material.

[0062] The feeding mechanism 13 in this embodiment includes a feeding cylinder support 131, a feeding cylinder 132, a feeding bracket 133, a feeding slider 134, a feeding slide rail 135, and a connecting frame 136. The feeding cylinder support 131 is mounted on the sampling probe hopper 11 or the temperature probe hopper 14. The cylinder of the feeding cylinder 132 is mounted on the feeding cylinder support 131. The piston rod of the feeding cylinder 132 is connected to the feeding bracket 133. The feeding bracket 133 is located at the bottom of the sampling probe hopper 11 or the temperature probe hopper 14. Normally, the connecting frame 136 is mounted at the bottom of the sampling probe hopper 11 or the temperature probe hopper 14. Each end of the connecting frame 136 is provided with a feeding slider 134. The feeding slider 134 is provided with a feeding slide rail 135. The feeding bracket 133 is mounted on the feeding slide rail 135. The feeding bracket 133 is provided with a U-shaped probe slot 137. The pusher mechanism 13 can be used to push out the probe located at the bottom of the discharge section.

[0063] In this embodiment, the sampling probe hopper 11 and the temperature probe hopper 14 are arranged from top to bottom as a dropping section, a guiding section and a discharging section. The sides of the dropping section and the guiding section are inclined, the discharging section is vertical, the material distribution mechanism 12 is located at the junction of the guiding section and the discharging section, and the material pushing mechanism 13 is located at the bottom of the discharging section 13.

[0064] The probe gripping and flipping device 2 in this embodiment includes a gripping mechanism 21, a translation mechanism 22, a lifting mechanism 23 and a flipping mechanism 24. The gripping mechanism 21 is mounted on the translation mechanism 22, the translation mechanism 22 is mounted on the lifting mechanism 23, and the lifting mechanism 23 is mounted on the flipping mechanism 24.

[0065] The gripping mechanism 21 in this embodiment includes a gun head guide gripper 211, a probe gripper 212, a first linear bearing 213, a guide rod 214, a probe bracket 215, a mounting frame 216, and a push-pull cylinder 217. The mounting frame 216 is mounted on the translation mechanism 22. The gun head guide gripper 211 and the probe bracket 215 are respectively fixedly mounted at both ends of the mounting frame 216. The probe gripper 212 is slidably mounted on the mounting frame 216. The guide rod 214 is mounted on the mounting frame 216. The probe gripper 212 is mounted on the guide rod 214 through the first linear bearing 213. The cylinder of the push-pull cylinder 217 is set on the mounting frame 216. The piston rod of the push-pull cylinder 217 is connected to the probe gripper 212.

[0066] The translation mechanism 22 in this embodiment includes an electric cylinder slide 221, a slide mounting base 222, and a movable slider 223. The slide mounting base 222 is mounted on the lifting mechanism 23, the electric cylinder slide 221 is mounted on the slide mounting base 222, the movable slider 223 is mounted on the electric cylinder slide 221, and the gripping mechanism 21 is mounted on the movable slider 223.

[0067] The lifting mechanism 23 in this embodiment includes a lifting cylinder 231, a guide column 232, a second linear bearing 233, a floating joint 234, and a rotating bracket 235. The rotating bracket 235 is mounted on the tilting mechanism 24. The cylinder of the lifting cylinder 231 is mounted on the rotating bracket 235. The piston rod of the lifting cylinder 231 is connected to the translation mechanism 22 through the floating joint 234. The guide column 232 is mounted on the translation mechanism 22. The second linear bearing 233 is mounted on the rotating bracket 235. The guide column 232 and the second linear bearing 233 pass through each other.

[0068] The flipping mechanism 24 in this embodiment includes a baffle 241, a self-aligning roller bearing 242, an equipment support frame 243, a flipping shaft 244, a synchronous belt 245, a driven synchronous pulley 246, and a servo motor 248. The flipping shaft 244 is mounted on the equipment support frame 243 via the self-aligning roller bearing 242. The lifting mechanism 23 is mounted on the flipping shaft 244. A baffle 241 is installed at one end of the flipping shaft 244, and a driven synchronous pulley 246 is installed at the other end of the flipping shaft 244. The driven synchronous pulley 246 and the driving synchronous pulley of the servo motor 248 are driven by the synchronous belt 245. A dust cover 247 is provided on the outside of the synchronous belt 245, and the synchronous belt 245 is in contact with the synchronous belt tensioner 249.

[0069] The temperature sampling gun device 3 in this embodiment includes a moving mechanism 31, a rotating mechanism, a swinging mechanism, and a fixed column 35. The rotating mechanism is mounted on the fixed column 35, the swinging mechanism is mounted on the rotating mechanism, and the moving mechanism 31 is mounted on the swinging mechanism.

[0070] In this embodiment, the moving mechanism 31 includes a sampling gun 311, a sampling carriage 312, a temperature measuring gun 313, a temperature measuring carriage 314, a guide rail frame 315, a parallel shaft reduction motor 316, a driven sprocket 317, a tension sprocket 318, a driving sprocket 319, and a chain 3110. The guide rail frame 315 is mounted on the swing mechanism. The driving sprocket 319 is connected to the output shaft of the parallel shaft reduction motor 316. The sampling carriage 312 and the temperature measuring carriage 314... 14. The driven sprocket 317 and the tension sprocket 318 are both mounted on the guide rail frame 315. The sampling gun 311 and the temperature measuring gun 313 are mounted on the sampling carriage 312 and the temperature measuring carriage 314, respectively. The driven sprocket 317, the tension sprocket 318 and the driving sprocket 319 are driven by the chain 3110. The sampling carriage 312 and the temperature measuring carriage 314 are each connected to a chain 3110. The guide rail frame 315 is equipped with limit stops 3111.

[0071] The rotating mechanism in this embodiment includes a rotating seat 34, a dust cover 36, a slewing bearing 37, a gear 38, and a cycloidal reducer 39. The gear 38 is connected to the output shaft of the cycloidal reducer 39. The slewing bearing 37 is mounted on a fixed column 35, and the gear 38 meshes with the slewing bearing 37. The rotating seat 34 is mounted on the slewing bearing 37, and the swing mechanism is mounted on the rotating seat 34. The dust cover 36 covers the slewing bearing 37 and the gear 38. A limit switch is installed on the fixed column 35.

[0072] The swing mechanism in this embodiment includes a support shaft 33 and a servo electric cylinder 310. The tilt support 32 is mounted on the rotation mechanism via the support shaft 33. The two ends of the servo electric cylinder 310 are connected to the rotation mechanism and the tilt support 32, respectively.

[0073] The probe unloading device 4 in this embodiment includes an unloading gripper 41, an unloading bracket 42, and a storage box 43. The unloading gripper 41 is mounted on the unloading bracket 42, and the storage box 43 is located below the unloading gripper 41.

[0074] The temperature measurement method of the fully automatic temperature measurement and sampling system in this embodiment is as follows: Workers place temperature probes into the temperature probe hopper 14 in the same direction. Temperature measurement and sampling cannot be performed simultaneously. For two types of probes with the same outer diameter but different lengths, the subsequent temperature measurement or sampling actions are basically the same. The temperature sampling gun device 3 rotates from the standby position to the probe installation position, aligning the temperature gun 313 with the probe installation position. The probe feeding device 1 pushes out a temperature probe from the temperature probe hopper 14. Then, through the probe clamping and flipping device 2, the pushed-out probe undergoes actions such as pushing, clamping, pulling down, moving, flipping, pushing again, and moving before being installed onto the head of the temperature gun 313. Then, the temperature sampling gun device 3 rotates to the temperature measurement and sampling position, and the servo cylinder 310 tilts the temperature gun 313. The furnace door of the furnace body 5 is aligned diagonally. Then, the temperature measuring carriage 314 drives the temperature measuring gun 313 to be inserted into the molten steel to be measured. After the temperature measurement requirement is met, the temperature measuring carriage 314 drives the temperature measuring gun 313 to pull out the molten steel and return to the highest position. Then, the servo electric cylinder 310 pulls the tilting bracket 32 ​​back to the original vertical state. After rotating again, the temperature measuring sampling gun device 3 is rotated to the probe disassembly position. The temperature measuring gun 313 is lowered 1.2m by the temperature measuring carriage 314. The unloading claw 41 clamps the temperature measuring probe. The temperature measuring gun 313 is raised to the highest position by the temperature measuring carriage 314. At this time, the temperature measuring probe is separated from the head of the temperature measuring gun 313. The unloading claw 41 releases the probe, and the probe falls into the storage box 43. Finally, the temperature measuring sampling gun device 3 rotates to the standby position. The entire temperature measurement process is now complete.

[0075] The sampling method of the fully automatic temperature measurement and sampling system in this embodiment is as follows: The worker places the sampling probes into the sampling probe hopper 11 in the same direction. Temperature measurement and sampling cannot be performed simultaneously. Since the two probes have the same outer diameter but different lengths, the subsequent temperature measurement or sampling actions are basically the same. The temperature measurement and sampling gun device 3 rotates from the standby position to the probe installation position, aligning the sampling gun 311 with the probe installation position. The probe feeding device 1 pushes out one sampling probe from the sampling probe hopper 11. Then, through the probe clamping and flipping device 2, the pushed-out probe undergoes actions such as pushing, clamping, pulling down, moving, flipping, pushing again, and moving before being installed onto the head of the sampling gun 311. Then, the temperature measurement and sampling gun device 3 rotates to the temperature measurement and sampling position, and the servo cylinder 310 tilts the sampling gun 311. The sampling trolley 312 is aligned with the furnace door of the furnace body 5. Then, the sampling trolley 312 drives the sampling gun 311 to be inserted into the molten steel to be sampled. After the sampling requirements are met, the sampling trolley 312 drives the sampling gun 311 to pull out the molten steel and return to the highest position. Then, the servo cylinder 310 pulls the tilting bracket 32 ​​back to the original vertical state. After rotating again, the temperature measuring sampling gun device 3 is rotated to the probe disassembly position. The sampling gun 311 is lowered 1.2m by the sampling trolley 312. The unloading claw 41 clamps the sampling probe. The sampling gun 311 is raised to the highest position by the sampling trolley 312. At this time, the sampling probe is separated from the head of the sampling gun 311. The unloading claw 41 releases the probe, and the probe falls into the storage box 43. Finally, the temperature measuring sampling gun device 3 rotates to the standby position. The entire sampling process is now complete.

[0076] Specifically: In the probe feeding device 1, the sampling probe bin 11 and the temperature measuring probe bin 14 have slightly different lengths depending on the length of the two types of probes. They are arranged symmetrically to ensure that after the two pushing mechanisms 13 push the probes out, the probes are in the same position and the probe holes are aligned. This allows the probe clamping and flipping device 2 to clamp two different probes in the same position. The device has a simple structure, low cost, and good flexibility.

[0077] Workers place multiple temperature measuring or sampling probes into the probe hopper in the same direction at once; this eliminates the need to repeatedly load individual probes, freeing up manpower. When unloading is required, the distributing cylinder 122 pushes out the distributing baffle 123, lifting the upper probe and separating it from the lower probe. This prevents the upper probe from being too heavy and pressing down on the lower probe, allowing it to fall into the probe slot 137 of the pusher bracket 133. Then, the pusher cylinder 132 pushes the probe out of the probe slot 137. During the push-out process, the photoelectric sensors 15 on both sides detect whether the probe has passed by, thus completing the unloading process. If the probe is not detected, the unloading operation is repeated. If only one of the two photoelectric sensors 15 detects the probe, or if the probe is still not detected after two unloading operations, the equipment will alarm, requiring manual troubleshooting and resetting. The seamless feeding process solves the problems of frequent feeding and maintenance, improving maintenance efficiency; the probe feeding device eliminates the need for repeated feeding one by one, and can feed multiple probes at once, reducing labor costs and improving work efficiency; the probes are temperature measuring or sampling probes.

[0078] Both the sampling probe hopper 11 and the temperature probe hopper 14 are welded from stainless steel plates. The width of the sampling probe hopper 11 or the temperature probe hopper 14 is 5mm wider than the length of the temperature probe or sampling probe for easy material unloading. The hopper legs are welded from ordinary carbon steel pipes. The upper part of the hopper legs is bolted to the sampling probe hopper 11 and the temperature probe hopper 14 for easy disassembly. The lower part of the hopper legs is bolted to a base plate, which can be welded to other equipment. A material distribution baffle is also included. 123 is a stainless steel bar with a portion cut off on one side and then polished smooth for easy insertion into the stacked material. The distributing cylinder 122 and distributing baffle 123 are mounted on the sides of the sampling probe hopper 11 and the temperature probe hopper 14 via the distributing cylinder bracket 121. The pushing slider 134 is mounted on the connecting frame 136, which is fixed to the sampling probe hopper 11 and the temperature probe hopper 14. The pushing slide rail 135 is fixed to the pushing bracket 133, and the pushing bracket 133 is connected to the pushing... The piston rod of cylinder 132 is connected, and the cylinder barrel of push cylinder 132 is fixed on the sampling probe hopper 11 and the temperature probe hopper 14 through push cylinder bracket 131; the probe is pushed out by pushing and pulling back of push cylinder 132; the probe slot 137 of push bracket 133 is set with an arc-shaped structure and a certain angle, and is polished smooth to prevent material jamming during discharge; push slider 134 and push rail 135 form a linear guide, which is a dustproof guide to increase stability in the steel plant environment; photoelectric sensor 15 is installed at the bottom of sampling probe hopper 11 and temperature probe hopper 14, close to the push side of push mechanism 13. When the probe is pushed out, it passes through photoelectric sensor 15, and photoelectric sensor 15 will transmit the positioning signal to photoelectric sensor 15. The photoelectric sensor 15 is a cylindrical diffuse reflection photoelectric sensor [PSPR18S-BC10DPO-E2]1.

[0079] In the probe gripping and flipping device 2, the probe gripping claw 212 of the gripping mechanism 21 has a spiral groove structure inside to increase the friction of the probe gripping claw 212 in gripping the probe. One side of the gun head guide claw 211 has a large flared mouth to facilitate the insertion of the gun head, and the other side of the gun head guide claw 211 has a small flared mouth to facilitate the insertion of the probe hole. The probe gripping claw 212 is fixed on the slider, which is mounted on the guide rod 214 through the first linear bearing 213 and moves back and forth by the drive of the push-pull cylinder 217. The gun head guide claw 211 is fixed to the head of the mounting bracket 216. The mounting bracket 216 is fixed to the moving slider 223 of the translation mechanism 22 by bolts.

[0080] The bottom of the electric cylinder slide 221 is fixed on the slide mounting base 222. The movable slider 223 of the electric cylinder slide 221 can move back and forth under the drive of the servo electric cylinder. At the same time, there are several limit switches on the electric cylinder slide 221 for obtaining the position signal of the movable slider 223. The movement of the movable slider 223 drives the movement of the gripping mechanism 21.

[0081] The guide column 232 and the piston rod of the lifting cylinder 231 are connected to the translation mechanism 22 through the floating joint 234. The second linear bearing 233 and the cylinder body of the lifting cylinder 231 are fixed on the rotating bracket 235. The translation mechanism 22 is driven to move up and down on the rotating bracket 235 by the lifting cylinder 231.

[0082] The translation mechanism 22 retracts as the lifting cylinder 231 is pushed out, and the retraction mechanism 22 performs the pushing out and retraction actions; the rotating bracket 235 is connected to the flipping shaft 244 of the flipping mechanism 24 by a key, and one end of the flipping shaft 244 is stretched and fixed by a baffle 241 and bolts.

[0083] The tilting shaft 244 is connected to the equipment support frame 243 via two self-aligning roller bearings 242 to form a hollow shaft. The other end of the tilting shaft 244 is connected to the driven synchronous pulley 246 via a key. The servo motor 248 is fixed on the equipment support frame 243. The driving synchronous pulley is connected to the output shaft of the servo motor 248. The servo motor 248 transmits power to the driven synchronous pulley 246 and the tilting shaft 244 via the synchronous belt 245. A synchronous belt tensioner 249 is installed on the outside of the synchronous belt 245 to prevent the synchronous belt 245 from loosening and affecting the transmission efficiency and accuracy.

[0084] When the probe gripping and flipping device 2 is reset, the flipping mechanism 24 makes the translation mechanism 22 horizontal; the electric cylinder slide 221 is away from the drive end; the probe gripping claw 212 and the gun head guide claw 211 in the gripping mechanism 21 are open and far apart; the lifting mechanism 23 is retracted. The probe gripping and flipping device 2 is compact, low in cost and easy to maintain.

[0085] In the temperature sampling gun device 3, the moving mechanism 31 is fixed on the tilting bracket 32. The tilting bracket 32 ​​is connected to the rotating seat 34 through the bracket shaft 33. One end of the servo cylinder 310 is connected to the rotating seat 34, and the other end of the servo cylinder 310 is connected to the tilting bracket 32 ​​to form a crank guide rod mechanism. The oscillation of the moving mechanism 31 is achieved by driving the servo cylinder 310.

[0086] The rotating base 34 is connected to the fixed column 35 via the slewing bearing 37. The slewing bearing 37 is fixed on the fixed column 35. The output shaft of the cycloidal reducer 39 is connected to the gear 38 via a key. The gear 38 meshes with the external teeth of the slewing bearing 37. Both the slewing bearing 37 and the gear 38 are protected by dust covers 36 to prevent dust from entering. A limit switch is installed on the fixed column 35 to provide the positioning signal of the temperature sampling gun device 3.

[0087] The gripper cylinder clamp is fixed on the two grippers of the gripper cylinder to realize the probe gripping function. The cylinder body of the gripper cylinder is fixed on the gripper cylinder mounting bracket, which is fixed on the probe unloading device of the fully automatic temperature measurement and sampling device. A used probe storage box is placed at the bottom of the bracket. This design is simple in structure, easy to install and maintain.

[0088] In the probe unloading device 4, the unloading gripper 41 is fixed on the two grippers of the gripper cylinder to realize the probe gripping function. The cylinder body of the gripper cylinder is fixed on the unloading bracket 42. The unloading bracket 42 is fixed at the probe disassembly station. A storage box 43 is placed below the unloading gripper 41 to store the probe after use. This design has a simple structure, is easy to install and maintain.

[0089] The working principle of this fully automated temperature measurement and sampling system is as follows: when sampling or temperature measurement is required, such as... Figure 1 and Figure 2 As shown, the temperature sampling gun device 3 rotates to the probe installation position; as Figure 5 As shown, the pushing mechanism 13 pushes the sampling probe or temperature probe out of the corresponding probe hopper, and then... Figure 15 As shown, the lifting mechanism 23 lifts the probe, the pushing mechanism 13 retracts, and then the gripping mechanism 21 clamps the probe. The lifting mechanism 23 retracts, and the entire material handling process is completed before the probe is installed.

[0090] The translation mechanism 22 moves the gripping mechanism 21, which holds the probe, to the drive end of the translation mechanism 22. Then, the flipping mechanism 24 flips the translation mechanism 22 to a vertical position, causing the probe held by the gripping mechanism 21 to flip to a vertical position. Then, the lifting mechanism 23 lifts the translation mechanism 22, causing the gripping mechanism 21 to move to a position collinear with the sampling gun 311 or the temperature measuring gun 313. The gun head guide gripper 211 clamps the gun head. Figure 16 As shown, the push-pull cylinder 217 drives the probe gripper 212 to insert the probe into the gun head guide gripper 211, thereby realizing the insertion of the gun head into the probe. Then the gun head guide gripper 211 is released, and the translation mechanism 22 drives the gripping mechanism 21 to completely insert the probe into the gun until the gripping mechanism 21 touches the positioning switch. The probe installation is completed, and the probe gripping and flipping device 2 returns to the reset state.

[0091] Temperature sampling gun device 3 rotates to the temperature sampling station; such as Figure 17 As shown, the servo cylinder 310 drives the moving mechanism 31 to tilt, then the sampling carriage 312 drives the sampling gun 311 to descend, or the temperature measuring carriage 314 drives the temperature measuring gun 313 to descend, so that the gun head with the probe is inserted into the ladle to complete the sampling or temperature measurement. After that, it is raised to the highest position, and then the servo cylinder 310 drives the moving mechanism 31 to return to the vertical state. Figure 19As shown, the cycloidal reducer 39 drives the temperature sampling gun device 3 to rotate to the probe unloading position. The sampling trolley 312 drives the sampling gun 311 or the temperature measuring trolley 314 drives the temperature measuring gun 313 to descend 1.2m. The probe unloading device 4 clamps the probe. The sampling trolley 312 drives the sampling gun 311 or the temperature measuring trolley 314 drives the temperature measuring gun 313 to rise to the highest position. At this time, the probe has been removed. Then the probe unloading device 4 releases the unloading jaw 41, and the probe falls into the storage box 43. Finally, all devices return to the reset state, and one sampling or temperature measurement operation is completed.

[0092] The top probe in the sampling probe bin 11 or temperature probe bin 14 is lifted by the material distribution mechanism 12, and the bottom probe is pushed out by the material pushing mechanism 13. The photoelectric sensor 15 detects whether the probe has been pushed out, thus completing the entire unloading process. Workers place the temperature probe or sampling probe into the corresponding probe bin in the same direction. The process of unloading is labor-saving, low-cost, and reliable, eliminating the need for repeated feeding.

[0093] After the probe is picked up, it is moved to the drive position of the translation mechanism 22, flipped to a vertical state by the flipping mechanism 24, and then the translation mechanism 22 is used to insert the probe into the gun. In this structure, the probe movement and the probe installation use the same mechanism to reduce equipment costs. Both the flipping mechanism 24 and the translation mechanism 22 are controlled by servo motors to make the positioning more accurate. Both the translation mechanism 22 and the flipping mechanism 24 are driven by synchronous belts 245 and are equipped with dust covers 247 to increase the reliability of the mechanism in dusty environments.

[0094] When the gripping mechanism 21 needs to grip the probe, the probe gripping jaw 212 is on the side away from the gun head guide jaw 211. When the gun head moves to the side of the gun head guide jaw 211, the probe can be inserted into the gun head guide jaw 211. When the probe needs to be installed on the gun head, the gun head guide jaw 211 first clamps and fixes the gun head, and then the probe gripping jaw 212 moves the probe to the side of the gun head guide jaw 211 and fully inserts the gun head into the probe hole to complete the docking. This process is similar to threading a needle, which greatly improves the success rate of inserting the gun head into the probe and makes the mechanism more reliable and stable in operation.

[0095] One end of the nozzle guide gripper 211 is made into a flared opening, and the other end of the nozzle guide gripper 211 is 5mm larger than the outer diameter of the probe, so that the probe can be inserted into the nozzle guide gripper 211. The flared opening facilitates the insertion of the nozzle, so the docking of the probe and the nozzle is completed entirely in the nozzle guide gripper 211, which further improves the success rate of inserting the nozzle into the probe.

[0096] The moving mechanism 31 in the temperature sampling gun device 3 uses a frequency-controlled parallel shaft geared motor 316 (with encoder) to drive a chain 3110 to pull the temperature measuring carriage 314 or sampling carriage 312 up and down. The encoder effectively controls the descent and ascent distance of the temperature measuring carriage 314 or sampling carriage 312, increasing positioning accuracy. The frequency-controlled ascent and descent speed of the temperature measuring carriage 314 or sampling carriage 312 makes it easier to control the depth of the temperature measuring gun 313 or sampling gun 311 inserted into the molten steel. The chain 3110 transmission increases stability in harsh environments. At the same time, the parallel shaft geared motor 316 is located at the lower end of the mechanism at a height of about 1m, which facilitates inspection and maintenance. The rotating mechanism in the temperature sampling gun device 3 uses a cycloidal reducer 39 (with encoder at the tail) to drive a gear 38, which makes the rotational switching positioning between the probe installation position, temperature sampling position, probe disassembly position, and standby position more accurate.

[0097] Furthermore, it should be noted that the specific embodiments described in this specification may differ in the shape and name of their components, etc. The above description is merely illustrative of the structure of the present invention. All equivalent or simple variations made based on the structure, features, and principles described in this patent concept are included within the protection scope of this patent. Those skilled in the art can make various modifications or additions to the described specific embodiments or use similar methods to substitute them, as long as they do not deviate from the structure of the present invention or exceed the scope defined by the claims, all of which should fall within the protection scope of this invention.

Claims

1. A full-automatic temperature measurement sampling system, comprising a probe blanking device (1), the probe blanking device (1) comprising a sampling probe blanking mechanism and a temperature measurement probe blanking mechanism, the sampling probe blanking mechanism and the temperature measurement probe blanking mechanism being symmetrically arranged; characterized in that: The full-automatic temperature measuring and sampling system further comprises a probe clamping and overturning device (2), a temperature measuring and sampling gun device (3), and a probe unloading device (4). The probe clamping and overturning device (2) is arranged at the middle part of the sampling probe unloading mechanism and the temperature measuring probe unloading mechanism. The probe unloading device (1) cooperates with the probe clamping and overturning device (2). The probe clamping and overturning device (2) cooperates with the temperature measuring and sampling gun device (3). The temperature measuring and sampling gun device (3) cooperates with the probe unloading device (4). The temperature measuring and sampling gun device (3) has a probe mounting station, a temperature measuring and sampling station, and a probe dismounting station in the rotating process. The probe clamping and overturning device (2) is located at the probe mounting station. The probe unloading device (4) is located at the probe dismounting station. The probe clamping and overturning device (2) comprises a grabbing mechanism (21), a translation mechanism (22), a jacking mechanism (23), and a overturning mechanism (24). The grabbing mechanism (21) is mounted on the translation mechanism (22). The translation mechanism (22) is mounted on the jacking mechanism (23). The jacking mechanism (23) is mounted on the overturning mechanism (24). The grabbing mechanism (21) comprises a gun head guide clamp jaw (211), a probe grabbing clamp jaw (212), a first linear bearing (213), a guide rod (214), a probe bracket (215), a mounting rack (216), and a push-pull cylinder (217). The mounting rack (216) is mounted on the translation mechanism (22). The gun head guide clamp jaw (211) and the probe bracket (215) are fixedly mounted at the two ends of the mounting rack (216), respectively. The guide rod (214) is mounted on the mounting rack (216). The probe grabbing clamp jaw (212) is mounted on the guide rod (214) through the first linear bearing (213). The cylinder barrel of the push-pull cylinder (217) is arranged on the mounting rack (216). The piston rod of the push-pull cylinder (217) is connected with the probe grabbing clamp jaw (212). The translation mechanism (22) comprises an electric cylinder sliding table (221), a sliding table mounting seat (222), and a moving sliding block (223). The sliding table mounting seat (222) is mounted on the jacking mechanism (23). The electric cylinder sliding table (221) is mounted on the sliding table mounting seat (222). The moving sliding block (223) is mounted on the electric cylinder sliding table (221). The grabbing mechanism (21) is mounted on the moving sliding block (223). The jacking mechanism (23) comprises a jacking cylinder (231), a guide column (232), a second linear bearing (233), a floating joint (234) and a rotating bracket (235), the rotating bracket (235) is installed on the turnover mechanism (24), the cylinder barrel of the jacking cylinder (231) is arranged on the rotating bracket (235), the piston rod of the jacking cylinder (231) is connected with the translation mechanism (22) through the floating joint (234), the guide column (232) is arranged on the translation mechanism (22), and the second linear bearing (233) is arranged on the rotating bracket (235); the guide column (232) penetrates through the second linear bearing (233); The turnover mechanism (24) comprises a baffle (241), a self-aligning roller bearing (242), a device support frame (243), a turnover shaft (244), a synchronous belt (245), a driven synchronous pulley (246) and a servo motor (248), the turnover shaft (244) is installed on the device support frame (243) through the self-aligning roller bearing (242), the jacking mechanism (23) is installed on the turnover shaft (244), one end of the turnover shaft (244) is provided with the baffle (241), the other end of the turnover shaft (244) is provided with the driven synchronous pulley (246), and the driven synchronous pulley (246) is driven by the synchronous belt (245) and the driving synchronous pulley of the servo motor (248).

2. The full-automatic temperature measuring and sampling system according to claim 1, characterized in that: The temperature measuring sampling gun device (3) comprises a moving mechanism (31), a rotating mechanism, a swinging mechanism and a fixed stand (35), the rotating mechanism is arranged on the fixed stand (35), the swinging mechanism is arranged on the rotating mechanism, and the moving mechanism (31) is arranged on the swinging mechanism.

3. The fully automatic temperature measuring and sampling system according to claim 2, characterized in that: The moving mechanism (31) comprises a sampling gun (311), a sampling trolley (312), a temperature measuring gun (313), a temperature measuring trolley (314), a guide rail frame (315), a parallel shaft reduction motor (316), a driven sprocket (317), a tension sprocket (318), a driving sprocket (319) and a chain (3110), the guide rail frame (315) is arranged on the swinging mechanism, the driving sprocket (319) is connected with the output shaft of the parallel shaft reduction motor (316), the sampling trolley (312), the temperature measuring trolley (314), the driven sprocket (317) and the tension sprocket (318) are arranged on the guide rail frame (315), the sampling gun (311) and the temperature measuring gun (313) are arranged on the sampling trolley (312) and the temperature measuring trolley (314) respectively, the driven sprocket (317), the tension sprocket (318) and the driving sprocket (319) are driven through the chain (3110), and the sampling trolley (312) and the temperature measuring trolley (314) are connected with a chain (3110) respectively.

4. The fully automatic temperature measuring and sampling system according to claim 2, characterized in that: The rotating mechanism comprises a rotating seat (34), a slewing bearing (37), a gear (38) and a cycloidal speed reducer (39), the gear (38) is connected with an output shaft of the cycloidal speed reducer (39), the slewing bearing (37) is arranged on a fixed stand (35), the gear (38) is engaged with the slewing bearing (37), the rotating seat (34) is arranged on the slewing bearing (37), and the swinging mechanism is arranged on the rotating seat (34).

5. The fully automatic temperature measuring and sampling system according to claim 2, characterized in that: The swinging mechanism comprises a bracket shaft (33) and a servo cylinder (310), an inclination bracket (32) is arranged on the rotating mechanism through the bracket shaft (33), and two ends of the servo cylinder (310) are connected with the rotating mechanism and the inclination bracket (32) respectively.

6. A method for measuring temperature and sampling according to any one of claims 1-5, characterized in that: The temperature measuring and sampling method is as follows: When temperature measurement is performed, the temperature measuring probe is placed in the temperature measuring probe warehouse (14) in the same direction, the temperature measuring and sampling gun device (3) is rotated from the standby station to the probe mounting station to align the temperature measuring gun (313) with the probe mounting station; the probe unloading device (1) pushes out a temperature measuring probe in the temperature measuring probe warehouse (14); then the probe clamping and overturning device (2) is used to mount the pushed-out probe on the gun head of the temperature measuring gun (313); then the temperature measuring and sampling gun device (3) is rotated to the temperature measuring and sampling station, the servo cylinder (310) is used to tilt the temperature measuring gun (313) to align with the furnace door of the furnace body (5), then the temperature measuring trolley (314) drives the temperature measuring gun (313) to insert into the molten steel to be measured, after the temperature measurement requirement is met, the temperature measuring trolley (314) drives the temperature measuring gun (313) to pull out the molten steel to return to the highest position; then the servo cylinder (310) pulls the inclination bracket (32) back to the original vertical state, the temperature measuring and sampling gun device (3) is rotated to the probe dismounting station again, the temperature measuring gun (313) is lowered through the temperature measuring trolley (314), the unloading clamping jaw (41) clamps the temperature measuring probe, the temperature measuring gun (313) is raised to the highest position through the temperature measuring trolley (314), at this time, the temperature measuring probe is separated from the gun head of the temperature measuring gun (313), the unloading clamping jaw (41) releases the probe, the probe falls into the storage box (43), and finally the temperature measuring and sampling gun device (3) is rotated to the standby station, and thus the whole temperature measurement process operation is completed. When sampling, the sampling probe is put into the sampling probe warehouse (11) in the same direction, the temperature sampling gun device (3) rotates from the standby station to the probe installation station to aim the sampling gun (311) at the probe installation station; the probe unloading device (1) pushes out a sampling probe in the sampling probe warehouse (11); then the probe is installed on the gun head of the sampling gun (311) through the probe clamping and overturning device (2); then the temperature sampling gun device (3) rotates to the temperature sampling station, the sampling gun (311) is inclined to aim at the furnace door of the furnace body (5) through the servo cylinder (310), then the sampling trolley (312) drives the sampling gun (311) to insert into the molten steel to be sampled, after reaching the sampling requirement, the sampling trolley (312) drives the sampling gun (311) to pull out the molten steel back to the highest position; then the servo cylinder (310) pulls the inclined support (32) back to the original vertical state, and the temperature sampling gun device (3) is rotated to the probe dismounting station again, the sampling gun (311) is lowered through the sampling trolley (312), the unloading clamp jaw (41) clamps the sampling probe, the sampling gun (311) is raised to the highest position through the sampling trolley (312), at this time the sampling probe is separated from the gun head of the sampling gun (311), the unloading clamp jaw (41) releases the probe, the probe falls into the storage box (43), finally the temperature sampling gun device (3) rotates to the standby station, and the whole sampling process operation is completed.

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