Invalid Card Screening Method, Card Making Terminal Device, and Computer Readable Storage Medium

Abstract

The present invention provides a method for screening invalid cards, a card production terminal device, and a storage medium. The method for screening invalid cards includes: when entering the pre-personalization process, obtaining the chip type information of the current card; sending an installation instruction for a preset application to the current card according to the chip type information, and obtaining the instruction execution duration of the installation instruction; if the instruction execution duration is greater than a preset duration, marking the current card as an invalid card. By applying the method for screening invalid cards of the present invention, card invalidity screening can be carried out in the pre-personalization stage of card production, reducing the transfer of problematic cards to the personalization production process.

Description

Technical Field

[0001] The present invention relates to the technical field of smart cards. Specifically, it relates to a method for screening failed cards, and also relates to a card-making terminal device applying the method for screening failed cards, and further relates to a computer-readable storage medium applying the method for screening failed cards. Background Art

[0002] At present, the production process of financial IC cards involves normal physical card-making processes such as card design, plate-making, printing, lamination, and encapsulation to produce blank cards, also called semi-finished cards (without initialization, pre-personalization, and personalization processes). After the semi-finished cards are made, the cards are initialized through APDU instructions, the card operating system (COS) is written, pre-personalization is performed, and project prefabricated information is written to make the "finished card" substrate. Finally, the card is personalized using relevant programs written according to customer requirements. This personalization includes operations such as card surface personalization, chip personalization, key writing, and disk return to complete the project personalization customization requirements. The personalization stage has strict requirements. When personalizing a failed card, the personalization will fail midway and cannot completely execute the personalization instruction stream. This process is called card skipping. When re-making a card after card skipping, it is necessary to manually find the corresponding data, re-import the personalized data, use a spare card substrate to re-generate the data, and perform personalization. It is also necessary to re-arrange the card order manually. If there are chip-level operating system problems, it will cause a large number of card skips, and at the same time, it will produce a high number of defective products, and the production capacity will decrease. When the reserved finished card substrates are not enough for card replacement, it is necessary to arrange for re-production of the card substrates, which will affect the order delivery. Re-producing cards greatly wastes manpower, material resources, and production resources, causes delivery delays, and results in customer complaints.

[0003] Due to reasons such as individual differences in chips, different abilities to erase and write EEPROM, which cause the production personalization program to time out, the chip incoming materials are abnormal and the module unique identification number (UID) is not written, and the encapsulation process may cause damage to the internal processor of the chip, etc., card skipping occurs. The personalization stage cannot identify the reasons and problems of card skipping, or the same type of card skipping problems occur repeatedly in different orders. Therefore, it is very necessary to complete the card failure screening in the pre-personalization stage. Summary of the Invention

[0004] The first object of the present invention is to provide a method for screening card failures in the pre-personalization stage of card making, which can reduce the flow of problem cards to the personalization production process.

[0005] The second object of the present invention is to provide a card-making terminal device that can screen card failures in the pre-personalization stage of card making, which can reduce the flow of problem cards to the personalization production process.

[0006] The third object of the present invention is to provide a computer-readable storage medium that can screen for card failures during the pre-personalization stage of card production, reducing the flow of problematic cards to the personalization production process.

[0007] To achieve the above first object, the method for screening failed cards provided by the present invention includes: when entering the pre-personalization process, obtaining the chip type information of the current card; sending an installation instruction for a preset application to the current card according to the chip type information, and obtaining the instruction execution duration of the installation instruction; if the instruction execution duration is greater than the preset duration, marking the current card as a failed card.

[0008] As can be seen from the above solution, in the method for screening failed cards of the present invention, when entering the pre-personalization process, by sending an installation instruction for a preset application, the EEPROM and RAM of the chip will be applied during the execution of the installation instruction. When the instruction execution duration of this instruction times out, the problematic chip with too long chip erasure time can be found, thereby screening for card failures and reducing the flow of problematic cards to the personalization production process.

[0009] In a further solution, the preset duration is determined according to the chip type information.

[0010] It can be seen therefrom that since different chips require different execution durations when executing the installation instruction of the preset application, determining the preset duration according to the chip type information can improve the accuracy of judgment.

[0011] In a further solution, after the step of obtaining the chip type information of the current card, it further includes: sending a self-check instruction to the current card and obtaining the feedback information of the current card; confirming whether the current card is abnormal according to the feedback information, and if so, marking the current card as a failed card.

[0012] It can be seen therefrom that by sending a self-check instruction to the current card, the current card can perform self-checking, thereby determining whether it is abnormal itself, and thus realizing the screening of failed cards.

[0013] In a further solution, the step of sending a self-check instruction to the current card and obtaining the feedback information of the current card includes: determining whether there is a negative problem list corresponding to the current card according to the chip type information, and if so, sending a self-check instruction according to the negative problem list.

[0014] It can be seen therefrom that by setting a negative problem list, the cards can be detected through the negative problem list, avoiding repeated quality accidents.

[0015] In a further solution, the negative problem list is set according to the chip type.

[0016] It can be seen that, due to the different failure situations of different types of chips, setting a negative problem list according to the chip type can improve the detection efficiency of the same type of chips.

[0017] In a further solution, after the step of marking the current card as a failed card, it further includes: determining whether the cause of the card failure corresponding to the self-check instruction exists in the negative problem list. If not, adding the cause of the card failure to the negative problem list.

[0018] It can be seen that when a new problem appears in the chip, adding it to the negative problem list is convenient for the detection of the next same type of chip.

[0019] To achieve the second object of the present invention, the present invention provides a card-making terminal device including a processor and a memory. The memory stores a computer program, and when the computer program is executed by the processor, the steps of the above-mentioned failed card screening method are implemented.

[0020] To achieve the third object of the present invention, the present invention provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a controller, the steps of the above-mentioned failed card screening method are implemented. Description of the Drawings

[0021] Figure 1 is a flowchart of an embodiment of the failed card screening method of the present invention.

[0022] The present invention will be further described below with reference to the drawings and embodiments. Detailed Embodiment

[0023] The failed card screening method of the present invention is an application program applied in a card-making terminal device, and is used to implement the screening of failed cards in the pre-personalization stage.

[0024] Embodiment of the failed card screening method:

[0025] As Figure 1 shown, in this embodiment, when the failed card screening method works, it first executes step S1 to determine whether to enter the pre-personalization process. When it is necessary to enter the pre-personalization process, it can be entered by sending an instruction. For example, an instruction is sent through the control button of the card-making terminal device to enter.

[0026] When entering the pre-personalization process, step S2 is executed to obtain the chip type information of the current card. Obtaining the chip type information of the current card can determine the type of the chip, which is used to distinguish chips from different suppliers, or different models of chips, or chips with different operating systems. The uniqueness of the chip can be identified by reading the ATR, CPLC, COS version number or private instruction of the chip, which is well-known to those skilled in the art and will not be elaborated here.

[0027] After obtaining the chip type information of the current card, step S3 is executed. According to the chip type information, an installation instruction for a preset application is sent to the current card, and the instruction execution duration of the installation instruction is obtained. The instruction for installing the application is a standard instruction defined by the GlobalPlatform specification. Installing an application on the operating system takes the longest time with this instruction. The installation instruction includes an erasure action. During the execution of the installation instruction, the EEPROM and RAM of the chip are applied for. When this instruction times out, the problematic chip with an overly long chip writing time can be found. When sending the installation instance instruction, the APDU command "80E60C00LCdata LE" is sent, where the data data includes: the length of the loaded file AID, the length of the loaded file AID + the executable module AID, the executable module AID, the length of the application AID, the application AID, the length of the application permission, the application permission, the length of the installation parameter, the installation parameter, the length of the loading flag, and the loading flag. Since the loaded file AID and the executable module AID of different chips are different, it is necessary to determine the chip type by judging the chip information, and according to the chip type, an installation instruction for a preset application is sent to the current card, and the instruction execution duration of the installation instruction is obtained.

[0028] After obtaining the instruction execution duration of the installation instruction, step S4 is executed to determine whether the instruction execution duration is greater than the preset duration. In this embodiment, the preset duration is determined according to the chip type information. When each type of chip executes the installation instruction of the preset application, there are differences in the instruction execution duration. Therefore, determining the preset duration according to the chip type information can improve the accuracy of the judgment.

[0029] If the instruction execution duration is greater than the preset duration, step S9 is executed to mark the current card as a failed card. If the instruction execution duration is greater than the preset duration, it indicates that the chip writing time is too long and it is a problematic card. Therefore, the current card is marked as a failed card so that the user can know and it is convenient for screening.

[0030] If the instruction execution duration is less than or equal to the preset duration, step S5 is executed to send a self-check instruction to the current card and obtain the feedback information of the current card. If the instruction execution duration is less than or equal to the preset duration, it indicates that the chip writing time is normal and the next step of inspection can be carried out. In this embodiment, by sending a self-check instruction to the current card, the chip operating system will perform its own hardware inspection according to this instruction and calculate the data field of its own functional module, which is well-known to those skilled in the art and will not be elaborated here.

[0031] In this embodiment, the steps of sending a self-check instruction to the current card and obtaining the feedback information of the current card include: determining whether there is a negative problem list corresponding to the current card according to the chip type information. If so, sending a self-check instruction according to the negative problem list. Among them, the negative problem list is set corresponding to the chip type. Since different types of chips have different failure situations, setting the negative problem list corresponding to the chip type can improve the detection efficiency of the same type of chips. The negative problem list can be summarized according to the card failure problems encountered in the pre-personalization and personalization stages. When confirming the chip type, the negative problem list corresponding to this type of chip can be retrieved and detected one by one according to the negative problem list. For example, in chip A, there is a UID abnormality in the negative list. Then, when the chip type is confirmed as chip A in the pre-personalization stage, the UID of this chip will be automatically checked for abnormality.

[0032] After obtaining the feedback information of the current card, step S6 is executed to confirm whether the current card is abnormal according to the feedback information. Each bit in the feedback information is defined. For example, there are identification bits such as the DES processor, RSA processor, and SM4 processor. Through different return values, it can be judged whether the corresponding processor fails. For example: if each bit of the return value is 0, it means the function is intact; if the bit of the defined RSA processor returns 1, it means the RSA processor fails. By sending a self-check instruction to the current card, the failed cards can be screened out.

[0033] If it is confirmed that the current card is a failed card, step S9 is executed to mark the current card as a failed card. If it is confirmed that the current card is not a failed card, step S7 is executed to write the project general prefabricated information. If it is confirmed that the current card is not a failed card, the pre-personalization data can be written. Therefore, the project general prefabricated information of the pre-personalization can be written. Writing the project general prefabricated information is a well-known technology to those skilled in the art and will not be elaborated here.

[0034] After writing the project general prefabricated information, step S8 is executed to judge whether the writing is successful. After the chip writes the project general prefabricated information, it will feedback the feedback information on whether the writing is successful. Through the feedback information, it can be confirmed whether the writing is successful. If the writing is successful, it means the pre-personalization is completed, and the pre-personalization can be exited and the personalization operation can be entered. If the writing is not successful, step S9 is executed to mark the current card as a failed card.

[0035] In this embodiment, after the step of executing step S9 to mark the current card as a failed card, it further includes: judging whether the cause of the card failure corresponding to the self-check instruction exists in the negative problem list. If not, adding the cause of the card failure to the negative problem list. When a new problem appears in the same type of chip, it is added to the negative problem list for the detection of the next same type of chip.

[0036] As can be seen from the above, in the method for screening invalid cards of the present invention, when entering the pre-personalization process, by sending an installation instruction for a preset application, the execution process of the installation instruction will apply for the EEPROM and RAM of the chip. When the execution duration of this instruction times out, the problem chip with too long chip erasure time can be found, so as to screen for invalid cards and reduce the transfer of problem cards to the personalization production process. In addition, by sending a chip self-check instruction, invalid cards can be screened out. A negative list database is established and matched through the chip to prevent repeated quality accidents from occurring.

[0037] Example of a card-making terminal device:

[0038] The card-making terminal device of this embodiment includes a controller, and when the controller executes a computer program, it implements the steps in the embodiment of the method for screening invalid cards described above.

[0039] For example, the computer program can be divided into one or more modules, and one or more modules are stored in the memory and executed by the controller to complete the present invention. One or more modules can be a series of computer program instruction segments capable of completing specific functions, and these instruction segments are used to describe the execution process of the computer program in the card-making terminal device.

[0040] The card-making terminal device may include, but is not limited to, a controller and a memory. Those skilled in the art can understand that the card-making terminal device may include more or fewer components, or combine certain components, or different components. For example, the card-making terminal device may also include input / output devices, network access devices, buses, etc.

[0041] For example, the controller can be a Central Processing Unit (CPU), or other general-purpose controllers, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose controller can be a microcontroller or the controller can also be any conventional controller, etc. The controller is the control center of the card-making terminal device, and uses various interfaces and lines to connect all parts of the entire card-making terminal device.

[0042] The memory can be used to store computer programs and / or modules. By running or executing the computer programs and / or modules stored in the memory and invoking the data stored in the memory, the controller realizes various functions of the card-making terminal device. For example, the memory mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system, application programs required for at least one function (such as a voice reception function, a voice-to-text conversion function, etc.); the data storage area can store data created according to the use of the mobile phone (such as audio data, text data, etc.). In addition, the memory can include high-speed random access memory and can also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a FlashCard, at least one magnetic disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0043] Embodiment of computer-readable storage medium:

[0044] If the modules integrated in the card-making terminal device in the above embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, to implement all or part of the processes in the above embodiments of the invalid card screening method, it can also be completed by instructing relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the controller, the steps of the above embodiments of the invalid card screening method can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The storage medium can include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a mobile hard disk, a magnetic disk, an optical disc, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc. It should be noted that the content included in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable medium does not include electrical carrier signals and telecommunication signals.

[0045] It should be noted that the above are only the preferred embodiments of the present invention, but the design concept of the invention is not limited thereto. Any non-substantive modifications made to the present invention using this concept also fall within the protection scope of the present invention.

Claims

1. A method for screening failed cards, characterized in that: Including: When entering the pre-personalization process, obtain the chip type information of the current card; Send an installation instruction for a preset application to the current card according to the chip type information, and obtain the instruction execution duration of the installation instruction; If the instruction execution duration is greater than a preset duration, mark the current card as a failed card.

2. The failed card screening method according to claim 1, wherein: The preset duration is determined according to the chip type information.

3. The failed card screening method according to claim 1 or 2, wherein: After the step of obtaining the chip type information of the current card, it further includes: Send a self-check instruction to the current card and obtain the feedback information of the current card; Confirm whether the current card is abnormal according to the feedback information. If so, mark the current card as a failed card.

4. The failed card screening method according to claim 3, wherein: The step of sending a self-check instruction to the current card and obtaining the feedback information of the current card includes: Determine whether there is a negative problem list corresponding to the current card according to the chip type information. If so, send the self-check instruction according to the negative problem list.

5. The failed card screening method according to claim 4, wherein: The negative problem list is set according to the chip type.

6. The failed card screening method according to claim 4, wherein: After the step of marking the current card as a failed card, it further includes: Judge whether the card failure reason corresponding to the self-check instruction exists in the negative problem list. If not, add the card failure reason to the negative problem list.

7. A card-making terminal device, comprising a processor and a memory, characterized in that: The memory stores a computer program, and when the computer program is executed by the processor, the steps of the failed card screening method according to any one of claims 1 to 6 are implemented.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by the controller, the steps of the failed card screening method according to any one of claims 1 to 6 are implemented.

Images