Femtosecond pump-probe micro measurement system and method using a two-beam perturbation laser

Abstract

The application discloses a femtosecond pump-probe micro area measurement system and method using secondary disturbance laser, which comprises a femtosecond laser, a beam splitter, an acousto-optic modulator, a full reflection mirror, an ultrabroadband spectrum generating kit, a continuous laser, an electrically controlled displacement table, a dichroic mirror, a reflective objective, a convex lens, a monochromator, a photomultiplier, a lock-in amplifier, a filter, a fiber spectrometer and a computer and the like components. In the detection part, the convex lens is replaced by a reflective objective to converge excitation light and collect signal light, so that the spatial resolution precision of the femtosecond pump-probe technology is improved. The femtosecond pump-probe system using secondary disturbance laser is used for analyzing the influence of continuous laser on the excited state relaxation process of a sample, providing further understanding of complex ultrafast optical physical behavior, and further optimizing a material design scheme.

Description

Technical Field

[0001] This invention relates to the field of ultrafast time-resolved measurement technology, and in particular to a femtosecond pump-probe micro-area measurement system and method using a secondary perturbation laser. Background Technology

[0002] Since the successful development of the ruby ​​laser in 1960, which achieved pulsed laser oscillation, the study of short-pulse lasers has steadily progressed as a field of fundamental physics. Breakthroughs have been made in ultrashort pulse lasers, which can provide femtosecond-level ultrashort pulses as optical probes for ultrafast process research. Femtosecond pump-probe spectroscopy is a powerful time-resolved spectroscopy technique with high temporal resolution. It can be used to characterize excited-state dynamics and related information of various materials, study the evolution of non-emission and dark states in a system, track energy transfer processes within the system in real time, and monitor the formation of new transient species. This allows it to study the structural-functional properties of different systems and materials (biological complexes, inorganic compounds, and organic materials) in a complementary manner to other steady-state techniques. Pulsed lasers have repetition frequencies ranging from megahertz to kilohertz, meaning there is a time interval between each pulse ranging from nanoseconds to milliseconds, much larger than that of ultrafast processes on the femtosecond scale. Therefore, the pump-probe signal can be viewed as a superposition of signals obtained from repeated excitation and detection of the sample over many pulse cycles.

[0003] Femtosecond laser spectroscopy, including pump-probe spectroscopy and fluorescence upconversion spectroscopy, has become an indispensable tool for understanding the behavior of excitons in migration and dissociation to form charge carriers. In femtosecond pump-probe spectroscopy, the pump pulse excites the system under study, while the probe pulse detects the effect of the pump excitation. By modulating the optical delay between the pump and probe pulses, the change in transmittance is measured as a function of time. Traditional ultrafast pump-probe spectroscopy is mainly focused on characterizing macroscopic samples (such as large-area thin films and solutions), and its low spatial resolution limits its application to the study of physical problems in nanoscale systems. Other optical spectroscopy techniques, such as micro Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), although having relatively low spatial resolution (approximately 10–300 nm), can only provide information about crystal structure, lattice vibrations, layer number, strain, etc. Therefore, it is necessary to find a suitable spectroscopic technique that is low-cost, saves detection time, is non-destructive to samples, and is quantifiable to characterize material quality and related dynamic properties. Summary of the Invention

[0004] To overcome the above problems, the present invention provides a femtosecond pump-probe micro-area measurement system and method using a secondary perturbation laser.

[0005] The first aspect of the present invention provides a femtosecond pump-probe micro-area measurement system using a secondary perturbation laser, comprising a laser generation and modulation section (Ⅰ), a detection section (Ⅱ), and a receiving section (Ⅲ);

[0006] The laser generation and adjustment section (Ⅰ) includes a femtosecond laser (1) and a continuous laser (6); the laser beam emitted by the femtosecond laser (1) is split into two beams by a beam splitter I (2), wherein the reflected beam is the first beam (B1) and the transmitted beam is the second beam (B2); the third beam (B3) emitted by the continuous laser (6) passes through an acousto-optic modulator II (7), an electrically controlled displacement stage I (8), and a total reflection mirror II (9), and is combined with the first beam (B1) passed through the acousto-optic modulator I (3) at a dichroic mirror I (10) to form the fourth beam (B4); the second beam (B2) passes through a supercontinuum generation kit (5), and is combined with the fourth beam (B4) passed through an electrically controlled displacement stage II (12) and a total reflection mirror III (11) at a dichroic mirror II (13) to form the fifth beam (B5);

[0007] The detection section (II) includes a fifth beam (B5), which is converged by a total reflection mirror IV (14), a dichroic mirror III (15), and a reflecting objective lens (16) onto a sample placed on a sample stage (17), and the resulting signal light is a sixth beam (B6); the sixth beam (B6) is collected by the reflecting objective lens (16), reflected by the dichroic mirror III (15), and enters the receiving section (III);

[0008] The receiving section (Ⅲ) includes a sixth beam (B6), which is split into a seventh beam (B7) and an eighth beam (B8) by a beam splitter II (18); the seventh beam (B7) is connected to the computer (27) port via a convex lens I (19), a monochromator (20), a photodetector (21), and a lock-in amplifier (22); the eighth beam (B8) is connected to the computer (27) port via a filter (24), a convex lens II (25), and a fiber optic spectrometer (26).

[0009] Furthermore, the first beam (B1) is temporally modulated by an acousto-optic modulator to serve as the pump light.

[0010] Furthermore, the second beam (B2) generates a supercontinuum as a probe beam via a continuous spectrum generation kit.

[0011] Furthermore, the third beam (B3) is temporally modulated by an acousto-optic modulator to serve as a secondary perturbation laser.

[0012] Furthermore, the modulated pump light is focused through a reflective objective lens to excite the sample under test, causing the sample molecules to be excited from the ground state to the excited state.

[0013] Furthermore, the secondary perturbation laser beam is combined with the pump beam, and the excited-state molecules are perturbed a second time to obtain the secondary perturbation femtosecond pump-probe signal beam.

[0014] Furthermore, the relative delay between the probe light and the pump light is achieved by an electrically controlled displacement stage, which is used to detect the change in sample absorbance with or without pump light; the signal light is collected and converted into an electrical signal by a photomultiplier tube, and a lock-in amplifier is used to extract the signal components from the electrical signal. The signal is input into a computer to generate dynamic result curves at different wavelengths; the signal light is focused into a fiber optic spectrometer, and the computer calculates and generates transient absorption spectra at different delay times.

[0015] A second aspect of the present invention provides a measurement method for a femtosecond pump-probe micro-area measurement system utilizing a secondary perturbation laser, comprising the following steps:

[0016] Step 1: Adjust the center height of each optical device so that the femtosecond laser (1), beam splitter I (2), acousto-optic modulator I (3), total reflection mirror I (4), supercontinuum generation kit (5), continuous laser (6), acousto-optic modulator II (7), electrically controlled displacement stage I (8), total reflection mirror II (9), dichroic mirror I (10), total reflection mirror III (11), electrically controlled displacement stage II (12), dichroic mirror II (13), total reflection mirror IV (14), and dichroic mirror III (15) are on the same horizontal plane;

[0017] Step 2: The laser emitted by the femtosecond laser (1) is split into a first beam (B1) and a second beam (B2) by the beam splitter I (2);

[0018] Step 3: The third beam (B3) emitted by the continuous laser (6) is a secondary perturbation laser. After the frequency is modulated in the time domain by the acousto-optic modulator II (7), the time delay with the first beam (B1) is adjusted by the electronically controlled displacement stage I (8).

[0019] Step 4: The first beam (B1) is used as pump light after being modulated in the time domain by the acousto-optic modulator I (3). It is then combined with the third beam (B3) reflected by the total reflection mirror II (9) at the dichroic mirror I (10) to form the fourth beam (B4). The time delay between the first beam (B1) and the second beam (B2) is then adjusted by the electronically controlled displacement stage II (12).

[0020] Step 5: The second beam (B2) generates a supercontinuum as a probe beam through the supercontinuum generation kit (5), and combines with the fourth beam (B4) reflected by the total reflection mirror III (11) at the dichroic mirror II (13) to form the fifth beam (B5).

[0021] Step 6: The fifth beam (B5) enters the detection section (II), is reflected by the total reflection mirror IV (14), enters the reflective objective (16), and is focused onto the sample held by the sample stage (17). The signal light generated by the sample is collected by the reflective objective (16) as the sixth beam (B6).

[0022] Step 7: The sixth beam (B6) is reflected by the dichroic mirror III (15) and enters the receiving part (III). The beam splitter II (18) splits the sixth beam (B6) into the seventh beam (B7) and the eighth beam (B8).

[0023] Step 8: After the seventh beam (B7) is focused by the convex lens I (19), the wavelength is filtered by the monochromator (20) and incident on the photomultiplier tube (21). The photomultiplier tube (21) converts the obtained optical signal into an electrical signal and inputs it into the lock-in amplifier (22) to extract the signal components. The signal is input into the computer (27) to form a dynamic result curve.

[0024] Step 9: After the pump light and disturbance light are filtered by the filter (24), the eighth beam (B8) is focused by the convex lens II (25) and enters the fiber optic spectrometer (26). The spectral signal is collected and input into the computer 27 to form pump-probe spectral data.

[0025] Furthermore, in step 2, the energy ratio of the incident beam reflected and transmitted after passing through beam splitter I (2) is 9:1.

[0026] Furthermore, in step 7, the energy ratio of the incident beam reflected and transmitted after passing through beam splitter II (18) is 1:1.

[0027] The beneficial effects of this invention are: by combining femtosecond pump-probe spectroscopy with micro-area measurement, a microscopic ultrafast optical pump-probe system is constructed, improving spatial resolution accuracy and enabling nanoscale nanostructure localization and in-situ spectral collection. This ensures the consistency and stability of optical measurement conditions for nanostructures, laying the foundation for subsequent research in micro / nano optics and quantum optics. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the structure of the present invention.

[0029] Figure 2 This is a schematic diagram of the laser generation and adjustment part in this invention.

[0030] Figure 3 This is a schematic diagram of the detection part in this invention.

[0031] Figure 4 This is a schematic diagram of the receiving part in this invention.

[0032] Figure 5This is a schematic diagram of the energy levels of fluorescent molecules and their absorption, spontaneous emission, ground-state bleaching (GSB), stimulated emission (SE), and excited-state absorption (ESA).

[0033] Figure 6 This is a system synchronization timing diagram.

[0034] Explanation of reference numerals in the attached figures: Ⅰ. Laser generation and adjustment section, Ⅱ. Detection section, Ⅲ. Receiving section, 1. Femtosecond laser, 2. Beam splitter Ⅰ, 3. Acousto-optic modulator Ⅰ, 4. Total reflection mirror Ⅰ, 5. Supercontinuum generation kit, 6. Continuous laser, 7. Acousto-optic modulator Ⅱ, 8. Electrically controlled displacement stage Ⅰ, 9. Total reflection mirror Ⅱ, 10. Dichroic mirror Ⅰ, 11. Total reflection mirror Ⅲ, 12. Electrically controlled displacement stage Ⅱ, 13. Dichroic mirror Ⅱ, 14. Total reflection mirror Ⅳ, 15. Dichroic mirror Ⅲ, 16. Reflective objective lens, 17. Sample stage, 18. Beam splitter Ⅱ, 19. Convex lens Ⅰ, 20. Monochromator, 21. Photomultiplier tube, 22. Lock-in amplifier, 23. Total reflection mirror Ⅴ, 24. Filter, 25. Convex lens Ⅱ, 26. Fiber optic spectrometer, 27. Computer. Detailed Implementation

[0035] The technical solution of this invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this invention, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without inventive effort are within the scope of protection of this invention.

[0036] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are used only for the convenience of describing the invention and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as limiting the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0037] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0038] Example 1

[0039] like Figure 1 As shown, this invention provides a femtosecond pump-probe micro-area measurement system utilizing a secondary perturbation laser, consisting of... Figure 2 The laser generation and adjustment section I shown is... Figure 3 The detection section II shown and Figure 4 The receiver section III shown is composed of laser generating and regulating section I, detection section II, and receiver section III, which are placed on the same optical platform and arranged from left to right.

[0040] The laser generation and modulation section I includes a femtosecond laser 1 and a continuous laser 6. The laser beam emitted from the femtosecond laser 1 is split into two beams by a beam splitter I2, wherein the reflected beam is the first beam B1 and the transmitted beam is the second beam B2. The third beam B3 emitted from the continuous laser 6 passes through an acousto-optic modulator II7, an electrically controlled displacement stage I8, and a total reflection mirror II9, and is combined with the first beam B1 passed through the acousto-optic modulator I3 at a dichroic mirror I10 to form a fourth beam B4. The second beam B2 passes through a supercontinuum generation kit 5, and is combined with the fourth beam B4 passed through an electrically controlled displacement stage II12 and a total reflection mirror III11 at a dichroic mirror II13 to form a fifth beam B5.

[0041] The detection section II includes a fifth beam B5, which is converged onto the sample held by the sample stage 17 by the total reflection mirror IV 14, the dichroic mirror III 15, and the reflecting objective lens 16, and the resulting signal light is the sixth beam B6; the sixth beam B6 is collected by the reflecting objective lens 16 and reflected by the dichroic mirror III 15 into the receiving section III.

[0042] The receiving section III includes a sixth beam B6, which is split into a seventh beam B7 and an eighth beam B8 by a beam splitter II 18. The seventh beam B7 is connected to the computer port 27 via a convex lens I 19, a monochromator 20, a photomultiplier tube 21, and a lock-in amplifier 22. The eighth beam B8 is connected to the computer port 27 via a filter 24, a convex lens II 25, and a fiber optic spectrometer 26.

[0043] In this embodiment, the first beam B1 is temporally modulated by an acousto-optic modulator to serve as the pump light. The second beam B2 generates a supercontinuum using a continuous spectrum generation kit to serve as the probe light. The third beam B3 is temporally modulated by an acousto-optic modulator to serve as the secondary perturbation laser.

[0044] Modulated pump light is focused through a reflective objective lens to excite the sample, causing the sample molecules to be excited from the ground state to the excited state. The secondary perturbation laser beam is combined with the pump light to further perturb the excited-state molecules, resulting in a secondary perturbation femtosecond pump-probe signal light. The relative delay between the probe and pump lights is achieved using an electrically controlled displacement stage, used to detect changes in sample absorbance with and without pump light. The signal light is collected and converted into an electrical signal by a photomultiplier tube. A lock-in amplifier extracts the signal components from the electrical signal, which is then input into a computer to generate dynamic result curves at different wavelengths. The signal light then enters a fiber optic spectrometer, where it is input into a computer to calculate transient absorption spectra at different delay times.

[0045] The principles underlying the above invention are as follows:

[0046] In femtosecond pump-probe spectroscopy, a pump pulse excites some particles from the ground state to an excited state. A weaker probe pulse is sent through the sample with a time delay relative to the pump pulse. The changes in absorbance or transmittance of the probe light with and without the pump pulse are then calculated. By using an electrically controlled displacement stage to change the optical path distance between the pump and probe light, the relative delay between them is controlled, and the spectrum at each delay time is recorded, ultimately obtaining the femtosecond pump-probe spectrum with delay time and wavelength response. The spectral data detected by femtosecond pump-probe technology includes contributions from ground-state bleaching (GSB), stimulated emission (SE), and excited-state absorption (ESA) processes, with corresponding energy level diagrams as shown below. Figure 5 As shown.

[0047] Based on traditional femtosecond pump-probe spectroscopy, a reflective objective lens is used in the detection section to replace the convex lens for focusing the excitation and signal light, improving the spatial resolution of femtosecond pump-probe technology and enabling nanoscale nanostructure localization and in-situ spectral collection. Stimulated emission loss microscopy requires two light sources: an excitation beam and a loss beam. The excitation beam excites the fluorescently labeled sample, causing electrons to transition to the excited state; the loss beam forms a hollow, bread-like aperture, allowing some electrons around the excitation spot to return to the ground state via stimulated emission. This quenches excited-state fluorescent molecules around the excitation spot, reducing the effective fluorescence emission area and obtaining emission points smaller than the diffraction limit. Using a femtosecond pump-probe system with a secondary perturbation laser, stimulated emission loss is simulated, and the influence of continuous laser light on the sample's excited-state relaxation process is analyzed, providing further understanding of complex photophysical behavior and thus optimizing material design schemes.

[0048] like Figure 6As shown, the pump light frequency is first modulated using an acousto-optic modulator to detect changes in the probe light when there is no pump light. The secondary perturbation laser in the continuous light system is modulated to the same frequency as the pump light using the acousto-optic modulator. A timing control system is then used to adjust the time delay between the continuous light and the pump light illuminating the sample.

[0049] Example 2

[0050] The measurement method based on the femtosecond pump-probe micro-area measurement system using a secondary perturbation laser as described in Embodiment 1 includes the following steps:

[0051] Step 1: Adjust the center height of each optical device so that the femtosecond laser 1, beam splitter I 2, acousto-optic modulator I 3, total reflection mirror I 4, supercontinuum generation kit 5, continuous laser 6, acousto-optic modulator II 7, electrically controlled displacement stage I 8, total reflection mirror II 9, dichroic mirror I 10, total reflection mirror III 11, electrically controlled displacement stage II 12, dichroic mirror II 13, total reflection mirror IV 14, and dichroic mirror III 15 are on the same horizontal plane;

[0052] Step 2: The laser emitted by the femtosecond laser 1 is split into a first beam B1 and a second beam B2 by the beam splitter I2; the energy ratio of the incident beam reflected and transmitted after passing through the beam splitter I2 is 9:1.

[0053] Step 3: The third beam B3 emitted by the continuous laser 6 is a secondary perturbation laser. After the frequency is modulated in the time domain by the acousto-optic modulator II7, the time delay between the laser beam B3 and the first beam B1 is adjusted by the electronically controlled displacement stage I8.

[0054] Step 4: The first beam B1 is used as pump light after being modulated in the time domain by the acousto-optic modulator I3. It is then combined with the third beam B3, which is reflected by the total reflection mirror II9, at the dichroic mirror I10 to form the fourth beam B4. The time delay between the first beam B1 and the second beam B2 is then adjusted by the electrically controlled displacement stage II12.

[0055] Step 5: The second beam B2 generates a supercontinuum as a probe light through the supercontinuum generation kit 5, and combines with the fourth beam B4 reflected by the total reflection mirror III 11 at the dichroic mirror II 13 to form the fifth beam B5.

[0056] Step 6: The fifth beam B5 enters the detection section II, is reflected by the total reflection mirror IV14, enters the reflective objective lens 16, and is focused onto the sample held by the sample stage 17. The signal light generated by the sample is collected by the reflective objective lens 16 as the sixth beam B6.

[0057] Step 7: The sixth beam B6 is reflected by the dichroic mirror Ⅲ15 and enters the receiving part Ⅲ. The beam splitter Ⅱ18 splits the sixth beam B6 into the seventh beam B7 and the eighth beam B8. After passing through the beam splitter Ⅱ18, the energy ratio of the incident beam reflected and transmitted is 1:1.

[0058] Step 8: After the seventh beam B7 is focused by the convex lens I19, the wavelength is filtered by the monochromator 20 and incident on the photomultiplier tube 21. The photomultiplier tube 21 converts the obtained optical signal into an electrical signal and inputs it into the lock-in amplifier 22 to extract the signal components. The signal is input into the computer 27 to form a dynamic result curve.

[0059] Step 9: After the pump light and disturbance light are filtered by filter 24, the eighth beam B8 is focused by convex lens II 25 and enters fiber optic spectrometer 26. The spectral signal is collected and input into computer 27 to form pump-probe spectral data.

[0060] Step 10: Precisely adjust the multi-dimensional positions of the centers of each optical component, and adjust the positions of each lens and the reflecting objective 16 in the laser generation and adjustment section I to form stable fluorescence within the detection section. Fine-tune the height, left-right and front-back positions, tilt angle, and pitch of all equipment and the frame to ensure a spectrum with uniform intensity distribution in the vertical and horizontal directions, while controlling the experimental energy pulse laser emitted from the femtosecond laser 1. The reflecting objective 16 in the detection section II detects the femtosecond pump-probe micro-region spectra of each species on the sample stage 17. After data processing in the main program of the receiving section III, the femtosecond pump-probe spectrum and corresponding dynamic process under these experimental conditions are finally output.

[0061] The embodiments described in this specification are merely examples of implementations of the inventive concept. The scope of protection of this invention should not be considered as limited to the specific forms stated in the embodiments. The scope of protection of this invention also extends to equivalent technical means that can be conceived by those skilled in the art based on the inventive concept.

Claims

1. A femtosecond pump-probe micro-area measurement system utilizing a secondary perturbation laser, characterized in that: It includes a laser generation and modulation section (Ⅰ), a detection section (Ⅱ), and a receiving section (Ⅲ); The laser generation and adjustment section (Ⅰ) includes a femtosecond laser (1) and a continuous laser (6); the laser beam emitted by the femtosecond laser (1) is split into two beams by a beam splitter I (2), wherein the reflected beam is the first beam (B1) and the transmitted beam is the second beam (B2); the third beam (B3) emitted by the continuous laser (6) passes through an acousto-optic modulator II (7), an electrically controlled displacement stage I (8), and a total reflection mirror II (9), and is combined with the first beam (B1) passed through the acousto-optic modulator I (3) at a dichroic mirror I (10) to form the fourth beam (B4); the second beam (B2) passes through a total reflection mirror I (4) and a supercontinuum generation kit (5), and is combined with the fourth beam (B4) passed through an electrically controlled displacement stage II (12) and a total reflection mirror III (11) at a dichroic mirror II (13) to form the fifth beam (B5); The detection section (II) includes a fifth beam (B5), which is converged by a total reflection mirror IV (14), a dichroic mirror III (15), and a reflecting objective lens (16) onto the sample held by the sample stage (17), and the resulting signal light is a sixth beam (B6); the sixth beam (B6) is collected by the reflecting objective lens (16), reflected by the dichroic mirror III (15), and enters the receiving section (III); The receiving section (Ⅲ) includes a sixth beam (B6), which is split into a seventh beam (B7) and an eighth beam (B8) by a beam splitter II (18); the seventh beam (B7) is connected to the computer (27) port via a convex lens I (19), a monochromator (20), a photomultiplier tube (21), and a lock-in amplifier (22); the eighth beam (B8) is connected to the computer (27) port via a filter (24), a convex lens II (25), and a fiber optic spectrometer (26); The first beam (B1) is time-domain modulated by the acousto-optic modulator I (3) to serve as the pump light; The second beam (B2) generates a supercontinuum as a probe beam via the supercontinuum generation kit (5); The third beam (B3) is temporally modulated by acousto-optic modulator II (7) to serve as a secondary perturbation laser; The modulated pump light is focused through a reflective objective lens to excite the sample to be tested, causing the sample molecules to be excited from the ground state to the excited state. The secondary perturbation laser beam is combined with the pump beam, and then the excited-state molecules are perturbed a second time to obtain the secondary perturbation femtosecond pump-probe signal beam.

2. The femtosecond pump-probe micro-area measurement system utilizing a secondary perturbation laser as described in claim 1, characterized in that: The relative delay between the probe light and the pump light is achieved by electrically controlled displacement stage I (8) and electrically controlled displacement stage II (12), which are used to detect the change in sample absorbance when there is no pump light; the signal light is collected and then converted into an electrical signal by a photomultiplier tube, and a lock-in amplifier is used to extract the signal components from the electrical signal. The signal is input into a computer to generate dynamic result curves of different wavelengths. The signal light enters the fiber optic spectrometer, and the computer calculates and generates transient absorption spectra at different delay times.

3. The measurement method based on the femtosecond pump-probe micro-area measurement system using a secondary perturbation laser as described in claim 2, characterized in that, Includes the following steps: Step 1: Adjust the center height of each optical device so that the femtosecond laser (1), beam splitter I (2), acousto-optic modulator I (3), total reflection mirror I (4), supercontinuum generation kit (5), continuous laser (6), acousto-optic modulator II (7), electrically controlled displacement stage I (8), total reflection mirror II (9), dichroic mirror I (10), total reflection mirror III (11), electrically controlled displacement stage II (12), dichroic mirror II (13), total reflection mirror IV (14), and dichroic mirror III (15) are on the same horizontal plane; Step 2: The laser emitted by the femtosecond laser (1) is split into a first beam (B1) and a second beam (B2) by the beam splitter I (2). Step 3: The third beam (B3) emitted by the continuous laser (6) is a secondary perturbation laser. After being time-domain modulated by the acousto-optic modulator II (7), it is then adjusted by the electronically controlled displacement stage I (8) to reduce the time delay with the first beam (B1). Step 4: The first beam (B1) is used as pump light after being modulated in the time domain by the acousto-optic modulator I (3). It is then combined with the third beam (B3) reflected by the total reflection mirror II (9) at the dichroic mirror I (10) to form the fourth beam (B4). The time delay between the first beam (B1) and the second beam (B2) is then adjusted by the electronically controlled displacement stage II (12). Step 5: The second beam (B2) generates a supercontinuum as a probe light through the supercontinuum generation kit (5), and combines with the fourth beam (B4) reflected by the total reflection mirror III (11) at the dichroic mirror II (13) to form the fifth beam (B5). Step 6: The fifth beam (B5) enters the detection section (II), is reflected by the total reflection mirror IV (14), and then passes through the dichroic mirror III (15) before entering the reflecting objective (16) and being focused onto the sample held by the sample stage (17). The signal light generated by the sample is collected by the reflecting objective (16) as the sixth beam (B6). Step 7: The sixth beam (B6) is reflected by the dichroic mirror III (15) and enters the receiving part (III). The beam splitter II (18) splits the sixth beam (B6) into the seventh beam (B7) and the eighth beam (B8). Step 8: After the seventh beam (B7) is focused by the convex lens I (19), the wavelength is filtered by the monochromator (20) and incident on the photomultiplier tube (21). The photomultiplier tube (21) converts the obtained optical signal into an electrical signal and inputs it into the lock-in amplifier (22) to extract the signal components. The signal is input into the computer (27) to form a dynamic result curve. Step 9: The eighth beam (B8) is filtered by the filter (24) to remove the pump light and the disturbance light, and then converged by the convex lens II (25) into the fiber optic spectrometer (26). The spectral signal is collected and input into the computer (27) to form pump-probe spectral data.

4. The measurement method as described in claim 3, characterized in that: In step 2, the energy ratio of the incident beam reflected and transmitted after passing through beam splitter I (2) is 9:

1.

5. The measurement method as described in claim 3, characterized in that: In step 7, the energy ratio of the incident beam reflected and transmitted after passing through beam splitter II (18) is 1:1.

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