Semiconductor Right Angle Test Probes

Abstract

The invention discloses a semiconductor right-angle test probe, comprising a right-angle needle tube, a transmission needle slidably arranged at one end of the right-angle needle tube, a test needle slidably arranged at the other end of the right-angle needle tube, and the test needle and the transmission needle are hinged together through a guide rod. The semiconductor right-angle test probe solves the problem that it is difficult to complete the connection between the contact points of the test element and the contact points of the detection instrument when the contact points are arranged at 90 degrees using the existing probe for testing.

Description

Technical Field

[0001] The invention belongs to the technical field of semiconductor testing, and in particular relates to a semiconductor right-angle testing probe. Background Art

[0002] With the development of science and technology, consumers are constantly moving towards smaller, lighter and thinner electronic products, and the requirements for performance testing of electronic products are becoming higher and higher. Probes have been widely used in the instrumentation and testing industry and are the most commonly used sampling method for precise measurement of resistance or other electrical signals.

[0003] The main types of probes can be divided into double-ended probes and single-ended probes. Both double-ended probes and single-ended probes currently on the market basically adopt a straight line design. When working, the contacts of the test component and the contacts of the detection instrument generally need to be on the same straight line to complete the test. However, for some special occasions, such as when the contacts of the test component and the contacts of the detection instrument need to be arranged at 90°, it is difficult to complete the connection between the two using existing probes for testing. Summary of the invention

[0004] The purpose of the present invention is to provide a semiconductor right-angle test probe to solve the problem that it is difficult to complete the connection between the contacts of the test element and the contacts of the detection instrument when the contacts are arranged at 90° using the existing probe for testing.

[0005] In order to solve the above technical problems, the present invention discloses a semiconductor right-angle test probe, including a right-angle needle tube, a transmission needle is slidably provided at one end of the right-angle needle tube, and a test needle is slidably provided at the other end of the right-angle needle tube, and the test needle and the transmission needle are hinged together by a guide rod.

[0006] The technical solution of the present invention also has the following characteristics:

[0007] As a preferred embodiment of the present invention, the test needle includes a needle seat, a first needle head is arranged at the upper end of the needle seat, the outer sleeve of the first needle head is provided with a first spring and a fixing sleeve, and the first spring is located between the fixing sleeve and the needle seat; a first leading hole is arranged in the needle seat, and a plurality of first guide holes are arranged on the outer wall of one end of the right-angle needle tube, and one end of the guide rod passes through the first guide hole and extends into the first through hole and is connected by a rivet.

[0008] As a preferred solution of the present invention, the transmission needle includes a second needle head and a second spring, a second through hole is arranged in the second needle head, and a plurality of second guide holes are arranged on the outer wall of the other end of the right-angle needle tube; the other end of the guide rod passes through the second guide hole and extends into the second through hole and is connected by a rivet; the second spring is located between the tail of the second needle head and the bottom of the other end of the right-angle needle tube.

[0009] As a preferred solution of the present invention, the right-angle needle tube is a square right-angle needle tube.

[0010] As a preferred solution of the present invention, the first spring is a compression spring and the second spring is a tension spring.

[0011] Compared with the prior art: the semiconductor right-angle test probe of the present invention is designed for the scenario where the contacts of the test element and the contacts of the detection instrument are arranged at 90°, which can ensure a quick connection between the two so as to complete the detection task according to the special task requirements; its overall structural design is ingenious, the manufacturing cost is low, and it has a good prospect for market promotion and use. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0013] Figure 1 It is a schematic structural diagram of a semiconductor right-angle test probe of the present invention;

[0014] Figure 2 The figure is an exploded view of a semiconductor right-angle test probe of the present invention.

[0015] In the figure: 1. right-angle needle tube, 2. needle seat, 3. fixing sleeve, 4. first needle, 5. first spring, 6. rivet, 7. guide rod, 8. second needle, 9. second spring. DETAILED DESCRIPTION

[0016] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0017] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific content of the technical solution.

[0018] Example 1

[0019] like Figure 1 As shown, a semiconductor right-angle test probe of the present invention comprises a right-angle needle tube 1, a transmission needle is slidably provided at one end of the right-angle needle tube 1, a test needle is slidably provided at the other end of the right-angle needle tube 1, and the test needle and the transmission needle are hinged together by a guide rod 7.

[0020] During assembly, the test needle and the transmission needle are first assembled at the two ends of the right-angle needle tube 1 respectively, and then the guide rod is used to hinge the test needle and the transmission needle together.

[0021] During the test, the test needle contacts the pin of the test element, and the transmission needle contacts the contact of the test instrument. When the test needle contacts the pin of the test element, the test needle is compressed and retracted, and the transmission needle is pushed outward by the guide rod 7 to contact the contact of the test instrument, so as to achieve the connection between the test element and the test instrument.

[0022] Example 2

[0023] Combination Figure 2 , different from Example 1, in a semiconductor right-angle test probe of the present invention, the test needle includes a needle seat 2, a first needle head 4 is arranged at the upper end of the needle seat 2, a first spring 5 and a fixing sleeve 3 are arranged on the outer sleeve of the first needle head 4, and the first spring 5 is located between the fixing sleeve 3 and the needle seat 2; a first leading hole is arranged in the needle seat 2, a plurality of first guide holes are arranged on the outer wall of one end of the right-angle needle tube 1, and one end of the guide rod 7 passes through the first guide hole and extends into the first through hole and is connected by a rivet 6.

[0024] During assembly, first insert the first needle 4 from one end of the right-angle needle tube 1, then put the first spring 5 on the first needle 4, and put the fixing sleeve 3 on the first needle 4. The fixing sleeve 3 is finally buckled on the port at one end of the right-angle needle tube 1. Finally, one end of the guide rod 7 is passed through the first guide hole and extended into the first through hole and connected by the rivet 6. The guide rod 7 and the needle seat 2 can be hinged together, which is more convenient to operate.

[0025] When the first needle 4 contacts the contact point of the test element, the first needle 4 retracts and the first spring 5 contracts. When the first needle 4 does not contact the contact point, the first needle 4 extends and resets under the action of the elastic force.

[0026] Example 3

[0027] Combination Figure 2 , different from Example 1, in a semiconductor right-angle test probe of the present invention, the transmission needle includes a second needle head 8 and a second spring 9, a second through hole is arranged in the second needle head 8, and a plurality of second guide holes are arranged on the outer wall of the other end of the right-angle needle tube 1; the other end of the guide rod 7 passes through the second guide hole and extends into the second through hole and is connected by a rivet 6; the second spring 9 is located between the tail of the second needle head 8 and the bottom of the other end of the right-angle needle tube 1.

[0028] During assembly, first install the second spring 9 from the other end of the right-angle needle tube 1, and then install the second needle 6. At this time, the second spring 9 will be located between the second needle 8 and the bottom of the other end of the right-angle needle tube 1. Finally, the other end of the guide rod 7 passes through the second guide hole and extends into the second through hole and is connected by the rivet 6. The guide rod 7 and the second needle 8 can be hinged together, which is more convenient to operate.

[0029] When the guide rod 7 pushes the second needle 8 to contact the contact point of the testing instrument, the second spring 9 is stretched. After the test is completed, it can be ensured that the second needle 8 is pulled back by the elastic force and quickly reset.

[0030] Example 4

[0031] Combination Figure 2 , which is different from Example 1, in a semiconductor right-angle test probe of the present invention, the right-angle needle tube 1 is a square right-angle needle tube.

[0032] The four faces of the square right-angle needle tube are provided with first guide holes and second guide holes, wherein one pair of the first guide holes and the second guide holes are convenient for inserting one end of the guide rod 7, and the other pair of the first guide holes and the second guide holes are convenient for tightening the rivet 6, and operating space is reserved for its assembly.

[0033] Example 5

[0034] In the semiconductor right-angle test probe of the present invention, the first spring 5 is a compression spring, and the second spring 9 is a tension spring.

[0035] Such a design can ensure that the first needle 4 and the second needle 8 respectively select more suitable springs to work according to the different forces they bear, thereby ensuring the stability of elastic force transmission.

[0036] Therefore, compared with the prior art, the semiconductor right-angle test probe of the present invention is designed for the scenario where the contacts of the test element and the contacts of the detection instrument are arranged at 90°, which can ensure a quick connection between the two so as to complete the detection task according to the special task requirements; its overall structural design is ingenious, the manufacturing cost is low, and it has a good prospect for market promotion and use.

[0037] The above description shows and describes several preferred embodiments of the invention, but as mentioned above, it should be understood that the invention is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the invention concept described herein through the above teachings or the technology or knowledge of the relevant field. Changes and modifications made by those skilled in the art should be within the scope of protection of the claims attached to the invention without departing from the spirit and scope of the invention.

Claims

1. A semiconductor right-angle test probe, characterized in that: The invention comprises a right-angle needle tube (1), a transmission needle is slidably arranged at one end of the right-angle needle tube (1), and a test needle is slidably arranged at the other end of the right-angle needle tube (1); the test needle comprises a needle seat (2), a first needle head (4) is arranged at the upper end of the needle seat (2), a first spring (5) and a fixing sleeve (3) are arranged on the outer sleeve of the first needle head (4), and the first spring (5) is located between the fixing sleeve (3) and the needle seat (2); a first leading hole is arranged in the needle seat (2), a plurality of first guide holes are arranged on the outer wall of one end of the right-angle needle tube (1), and the guide rod (7) is arranged on the outer wall of the first end of the right-angle needle tube (1), and the guide rod (7) is arranged on the outer wall of the first end of the right-angle needle tube (1). ) passes through the first guide hole and then extends into the first through hole and is connected by a rivet (6); the transmission needle comprises a second needle head (8) and a second spring (9), the second needle head (8) is provided with a second through hole, and the outer wall of the other end of the right-angle needle tube (1) is provided with a plurality of second guide holes; the other end of the guide rod (7) passes through the second guide hole and then extends into the second through hole and is connected by a rivet (6); the second spring (9) is located between the tail of the second needle head (8) and the bottom of the other end of the right-angle needle tube (1); the right-angle needle tube (1) is a square right-angle needle tube.

2. The semiconductor right-angle test probe according to claim 1, characterized in that: The first spring (5) is a compression spring, and the second spring (9) is a tension spring.

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