Itemized testing method and device based on dynamic adjustment of test time cost

Abstract

The present invention discloses a sub-item testing method and device based on dynamic adjustment of test time cost, the method comprising: predicting the total test time of all test units and the order of test units in the next batch of tests based on the total test time of all test units in the current batch and the order of test units; if the predicted total test time of all test units in the next batch is greater than or equal to the total test time of the current batch, the order of the current test units remains unchanged; if the predicted total test time of all test units in the next batch is less than the total test time of the current batch, all test units are reordered using the predicted order of the test units in the next batch; the advantages of the present invention are: reducing test time and improving test efficiency.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit testing, and in particular to a sub-item testing method and device based on dynamic adjustment of test time cost. Background Art

[0002] Semiconductor lasers are considered humanity's greatest invention of the 20th century. With advances in semiconductor laser manufacturing technology, they are widely used in materials processing, medical treatment, optical communications, sensing, national defense, and other fields. Semiconductor lasers boast the best energy conversion efficiency among all types of lasers and can serve as the core pump for a variety of optically pumped lasers, including fiber lasers and solid-state lasers. Semiconductor lasers have applications across the entire optoelectronics field and have become a core technology in today's optoelectronics science.

[0003] The contact test method is widely used in the industry for characteristic testing of semiconductor lasers. This method mainly uses a laser driver to contact the semiconductor laser electrode through a probe to energize it, thereby performing relevant parameter tests. However, in the LED field, non-contact test methods that energize the device under test through the inductive effect have been widely used. During the non-contact test process, multiple different types of test item units can be set, and each test item unit can be set with multiple identical test items, so that multiple devices under test can be tested simultaneously, which can greatly improve the test efficiency. For example, Chinese patent application No. 202310139214.6, entitled "A Semiconductor Optoelectronic Device Non-contact Characteristic Item Test Equipment and Method", adopts the above-mentioned method of parallel testing of multiple test item units, but does not take into account the test time cost of the device under test in different test batches, and does not adopt the test plan with the lowest test time cost, so the test efficiency is not high enough. Summary of the Invention

[0004] The technical problem to be solved by the present invention is how to provide a sub-item testing method and device based on dynamic adjustment of test time cost, dynamically adjust the order of different types of test items according to the changes in test time cost of different batches, reduce test time cost, and greatly improve test efficiency.

[0005] The present invention solves the above technical problems through the following technical means: a sub-item testing method based on dynamic adjustment of test time cost, the method comprising: predicting the total test time and the order of all test units in the next batch of tests based on the total test time of all test units in the current batch and the order of the test units; if the predicted total test time of all test units in the next batch is greater than or equal to the total test time of the current batch, the order of the current test units remains unchanged; if the predicted total test time of all test units in the next batch is less than the total test time of the current batch, all test units are reordered using the predicted order of the test units in the next batch.

[0006] Furthermore, the method further comprises:

[0007] Calculate the The total test time of all test units in the test , record the The order of test units during the test;

[0008] The predicted The total test time of all test units in the test And set relevant constraints;

[0009] The relevant constraints are combined in various ways and the first The number of test failures of all test units in the test, and the test units are sorted in descending order according to the number of test failures; if Greater than or equal to , then the order of the current test unit remains unchanged, if Less than , then the predicted The reordering of the test units reorders all the test units.

[0010] Furthermore, the The total test time for all test units in this test is ,in, Indicates the test time of a single test item in the test unit. Indicates the The first test The number of test failures for each test unit;

[0011] The predicted The total test time for all test units in this test is

[0012] Set relevant constraints:

[0013]

[0014]

[0015] in, Indicates the total number of tests for all test units. Indicates the The total number of failures under the total number of tests for each test unit; Indicates the number of test items in the test unit.

[0016] Furthermore, the relevant constraints also include:

[0017]

[0018]

[0019]

[0020]

[0021]

[0022] in, Indicates the The total number of qualified units under the total number of tests.

[0023] The present invention also provides a device for applying the sub-item testing method based on dynamic adjustment of test time cost as described in any of the above items, including a test unit, a conveyor belt, an induction coil and a short-circuiting device. There are multiple types of test units, each test unit has multiple test items arranged in series with equal intervals, each test unit is arranged on one side of the conveyor belt and parallel to its running direction, and the conveyor belts corresponding to different types of test units run independently. An induction coil is set on the opposite side of each test item relative to the conveyor belt, and a short-circuiting device is placed on the conveyor belt. The short-circuiting device includes a metal plate and a piece to be tested placed above the metal plate. When the short-circuiting device is facing the test item, the light-emitting surface of the piece to be tested is facing the light-receiving direction of the test item, and the induction coil corresponding to each test unit is connected in series with the pulse power supply.

[0024] Furthermore, a waiting area is set at the end of the running direction of the conveyor belt corresponding to each test unit, and the waiting area is used to bin the short-circuiting devices and eliminate unqualified test pieces; a robotic arm is set at the head and end of the running direction of the conveyor belt corresponding to each test unit, the robotic arm at the head end is used to pick up the short-circuiting device from the waiting area and place it on the conveyor belt, and the robotic arm at the end is used to remove the short-circuiting device from the conveyor belt and place it in the waiting area.

[0025] Furthermore, the conveyor belt corresponding to each test unit and the corresponding robotic arm are started and stopped synchronously. When the robotic arm is running, the corresponding conveyor belt is running, and when the robotic arm stops running, the conveyor belt stops running. By setting the running speed of the conveyor belt and the execution speed of the robotic arm, the time it takes for the conveyor belt to transfer the short-circuit device from the current test item to the next test item, the time it takes for the robotic arm at the head end to pick up the short-circuit device from the waiting area, place it on the conveyor belt and return to the waiting area, and the time it takes for the robotic arm at the end to remove the short-circuit device from the conveyor belt, place it on the waiting area and return to the waiting area are all the same.

[0026] Furthermore, the first test item of each test unit receives a pulse signal from the short-circuiting device passing in front of the corresponding conveyor belt from the start to the stop of the operation, and numbers the short-circuiting device, wherein the short-circuiting device includes a short-circuiting device that eliminates unqualified test pieces after binning. During the entire test process, the first short-circuiting device number corresponds to the last test item in the test unit, and the second short-circuiting device number corresponds to the second to last test item in the test unit. According to this rule, after the robotic arm sends up the short-circuiting devices with the number of test items in the test unit, it determines whether to turn on the corresponding test item based on whether each short-circuiting device triggers a pulse signal. The robotic arm stops running and starts testing. After the test is completed, the robotic arm runs and continues to transport the short-circuiting device. Among them, the first test item is the first test item of each test unit in the direction of the conveyor belt.

[0027] Furthermore, the method for counting the short-circuit devices passing in front of the first test item of each test unit is as follows:

[0028] At the beginning of each test, the short-circuiting devices that pass through the first test item are numbered sequentially. When the short-circuiting device that has eliminated the DUT passes through the first test item, no signal will be triggered. At this time, the first test item will not receive a pulse signal. When a qualified short-circuiting device passes through the first test item, the DUT placed on the metal plate forms a short-circuiting loop. The DUT of the short-circuiting device is facing the induction coil. The pulse power supply excites the short-circuiting loop at the corresponding position of the induction coil to generate an induced current, thereby energizing the DUT and lighting up the DUT. The light emitted by the DUT is detected by the first test item at its corresponding position, so the first test item receives a pulse signal at this time.

[0029] Furthermore, the device to be tested is one of a semiconductor laser, an LED chip, a light pipe, a photocell, a photodiode, and a phototransistor.

[0030] The advantages of the present invention are:

[0031] (1) The present invention predicts the total test time and the order of all test units in the next batch of tests based on the total test time of all test units in the current batch and the order of the test units. When the total test time of the current batch is short, the order of the current test units is kept unchanged. When the total test time of all test units in the next batch is short, all test units are reordered using the order of all test units in the next batch predicted to be short, thereby always minimizing the total test time, reducing the test time cost, and greatly improving the test efficiency.

[0032] (2) The present invention sends both the short-circuit device that has eliminated the DUT and the qualified short-circuit device to the next test unit for testing. Whether there is a DUT is determined based on whether a pulse signal is triggered when the short-circuit device passes the first test item. The test item corresponding to the position of the short-circuit device with the DUT is turned on, while the test item corresponding to the position of the short-circuit device that has eliminated the DUT is not turned on. This avoids turning on all the test items of the test unit at the same time, resulting in some test items having no DUT in front of them, thereby wasting resources.

[0033] (3) In the present invention, a robotic arm is provided at the head end and the tail end of the running direction of the conveyor belt corresponding to each test unit. The robotic arm at the head end is used to pick up the short-circuit device from the waiting area and place it on the conveyor belt, and the robotic arm at the tail end is used to remove the short-circuit device from the conveyor belt and place it in the waiting area. After each test is completed, the robotic arm at the head end continues to send up the short-circuit device that has not been tested, and the robotic arm at the tail end removes the test item that has been tested, thereby realizing rapid assembly line testing and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic structural diagram of a device for performing sub-item testing based on dynamic adjustment of test time cost disclosed in an embodiment of the present invention;

[0035] Figure 2 This is a schematic diagram of a short-circuit device in a device for sub-item testing based on dynamic adjustment of test time cost disclosed in an embodiment of the present invention. DETAILED DESCRIPTION

[0036] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0037] Example 1

[0038] like Figure 1 and Figure 2As shown, the present invention provides a device for performing sub-item testing based on dynamic adjustment of test time cost, comprising a test unit 1 and a shorting device 2. There are multiple types of test units 1, each of which has multiple test items 101 arranged in series at equal intervals. Each test unit 1 is positioned on one side of a conveyor belt 102 and parallel to its running direction. The conveyor belt 102 corresponding to different types of test units 1 operates independently. An induction coil 103 is positioned on the opposite side of each test item 101 from the conveyor belt 102. The shorting device 2 is positioned on the conveyor belt 102 and comprises a metal plate 201 and a device under test 202 positioned above the metal plate 201. When the shorting device 2 is facing the test item 101, the light-emitting surface of the device under test 202 faces the light-receiving direction of the test item 101. The induction coil 103 corresponding to each test unit 1 is connected in series with a pulse power supply 3. The device under test 202 in the present invention is selected from the group consisting of a semiconductor laser, an LED chip, a light pipe, a photocell, a photodiode, and a phototransistor.

[0039] Continue reading Figure 1 A waiting area 4 is set at the end of the running direction of the conveyor belt 102 corresponding to each test unit 1. The waiting area 4 is used to bin the short-circuit devices 2 and eliminate unqualified test pieces 202; a robotic arm 5 is set at the head end and the end of the running direction of the conveyor belt 102 corresponding to each test unit 1. The robotic arm 5 at the head end is used to pick up the short-circuit device 2 from the waiting area 4 and place it on the conveyor belt 102, and the robotic arm 5 at the end is used to remove the short-circuit device 2 from the conveyor belt 102 and place it in the waiting area 4.

[0040] It should be noted that the conveyor belt 102 corresponding to each test unit 1 is synchronously started and stopped with the corresponding robotic arm 5. When the robotic arm 5 is running, the corresponding conveyor belt 102 is running, and when the robotic arm 5 stops running, the conveyor belt 102 stops running. By setting the running speed of the conveyor belt 102 and the execution speed of the robotic arm 5, the time it takes for the conveyor belt 102 to transfer the short-circuit device 2 from the current test item 101 to the next test item 101, the time it takes for the robotic arm 5 at the head end to pick up the short-circuit device 2 from the waiting area 4, place it on the conveyor belt 102 and return to the waiting area 4, and the time it takes for the robotic arm 5 at the end to remove the short-circuit device 2 from the conveyor belt 102, place it in the waiting area 4 and return to its position are all the same. This allows the robot arm 5 to transfer a shorting device 2 to the first test item 101, then rotate back to remove the next shorting device 2. The previous shorting device 2 is already at the second test item 101, so the current shorting device 2 is still at the first test item 101. This continuously uploads shorting devices 2, ensuring that the shorting device 2 is facing the test item 101 when the robot arm 5 stops. Similarly, the robot arm 5 at the end of the conveyor belt 102 removes the shorting device 2 at the last test item 101. Each time a shorting device 2 is removed, the next shorting device 2 arrives at the last test item 101. This achieves pipeline operation and improves testing efficiency.

[0041] Each test unit 1 has multiple test items 101. In actual testing, not all test items 101 are turned on. Instead, it is necessary to control which test items 101 are turned on and which are not turned on according to actual conditions. Therefore, the first test item 101 of each test unit 1 of the present invention receives a pulse signal from the short-circuit device 2 passing in front of the corresponding conveyor belt 102 from the start of operation to the stop of operation, and numbers the short-circuit device 2. The short-circuit device 2 includes a short-circuit device 2 that eliminates unqualified test pieces 202 after binning. During the entire test process, the first short-circuit device 2 numbered It is the last test item 101 in the test unit 1. The number of the second short-circuiting device 2 corresponds to the second-to-last test item 101 in the test unit 1. According to this rule, after the robot arm 5 sends the short-circuiting devices 2 of the number of test items 101 in the test unit 1, it determines whether to turn on the corresponding test item 101 based on whether each short-circuiting device 2 triggers a pulse signal. The robot arm 5 stops running and starts testing. After the test is completed, the robot arm 5 runs and continues to transport the short-circuiting device 2. Among them, the first test item 101 is the first test item 101 of each test unit 1 in the running direction of the conveyor belt 102.

[0042] The principle of the pulse signal reception by the first test item 101 is as follows: at the beginning of each test, the short-circuiting devices 2 passing through the first test item 101 are sequentially numbered. When the short-circuiting devices 2 that have excluded the device under test 202 pass through the first test item 101, no signal will be triggered. At this time, the first test item 101 will not receive the pulse signal. When a qualified short-circuiting device 2 passes through the first test item 101, the device under test 202 placed on the metal plate 201 forms a short-circuit circuit. The device under test 202 of the short-circuiting device 2 is facing the induction coil 103. The pulse power supply 3 excites the short-circuit circuit at the corresponding position of the induction coil 103 to generate an induced current, thereby energizing the device under test 202 and lighting up the device under test 202. The light emitted by the device under test 202 is detected by the first test item 101 at its corresponding position. Therefore, the first test item 101 receives the pulse signal. It should be emphasized that the same principle applies during testing, except that the short-circuiting device 2 does not stop during the process of passing through the first test item 101, resulting in insufficient testing time. Therefore, the data measured by the first test item 101 cannot be used. However, this unusable data can be used to determine whether the short-circuiting device 2 has the DUT 202. The principle of testing the DUT 202 by test item 101 is as follows: the DUT 202 placed on the metal plate 201 forms a short-circuit circuit. The DUT 202 of the short-circuiting device 2 faces the induction coil 103. The pulse power supply 3 excites the short-circuit circuit at the corresponding position of the induction coil 103 to generate an induced current, thereby energizing the DUT 202 and lighting it up. The light emitted by the DUT 202 is detected by the test item 101 at its corresponding position, and thus the test item 101 begins testing the DUT 202.

[0043] In the above, the short-circuiting device 2 that has eliminated the DUT 202 and the qualified short-circuiting device 2 are sent to the next test unit 1 for testing. According to whether the pulse signal is triggered when the short-circuiting device 2 passes the first test item 101, it is determined whether there is a DUT 202, so that the test item 101 at the corresponding position of the short-circuiting device 2 with the DUT 202 is turned on, while the test item 101 at the corresponding position of the short-circuiting device 2 with the eliminated DUT 202 is not turned on, so as to avoid turning on all the test items 101 of the test unit 1 at the same time, resulting in some test items 101 having no DUT 202 in front of them, thereby wasting resources. For example, the robot arm 5 located at the head end of the conveyor belt 102 will convey 10 short-circuiting devices 2 to the conveyor belt 102 in the next period of time, and the total number of test items 101 of the corresponding test unit 1 is also 10. The short-circuiting devices 2 are numbered 1-10 respectively. If the 1st, 3rd, and 5th short-circuiting devices 2 are short-circuiting devices 2 that have rejected the test piece 202, and the other short-circuiting devices 2 are qualified short-circuiting devices 2 that have not rejected the test piece 202, when the first short-circuiting device 2 is sent to the position of the first test item 101, the first test item 101 does not receive a signal, and thus it is determined that there is no test piece 202, and there is no need to open the test item 101 at the corresponding position, that is, there is no need to open the last test item 101, and the second short-circuiting device 2 is sent to the first test item 101. 01, the first test item 101 receives the signal, thereby determining that there is a device to be tested 202, and the test item 101 at the corresponding position needs to be turned on, that is, the second to last test item 101 needs to be turned on, and the same applies to the other short-circuiting devices 2. In this way, it can be determined which test items 101 at which positions need to be turned on and which test items 101 at which positions do not need to be turned on. In actual applications, the test items 101 of each test unit 1 can be numbered in the opposite direction of the transmission direction of the conveyor belt 102. In this way, the last test item 101 in the transmission direction is numbered 1, which just corresponds to the number of the first short-circuiting device 2. In this way, the number of the test item 101 can be directly matched according to the number of the short-circuiting device 2, so that it is very convenient to determine which test items 101 need to be turned on.

[0044] Continue reading Figure 1As a further improvement, the present invention further provides a conveying mechanism 6 for loading and unloading. The conveying mechanism 6 is an endless conveyor belt, and is provided with a loading area 601 and a unloading area 602. The short-circuiting device 2 passes through the loading area 601 to the location of the first test unit 1. A baffle 7 is provided at the entrance of the conveyor belt 102 of the first test unit 1 to prevent the conveying mechanism 6 from directly transferring the short-circuiting device 2 to the conveyor belt 102 corresponding to the first test unit 1. The robotic arm 5 corresponding to the front end of the first test unit 1 picks up the short-circuiting device 2 from the conveyor belt 102 and places it on the conveyor belt 102. The conveying mechanism 6 can be considered as the waiting area 4 at the front end of the first test unit 1. After the short-circuiting device 2 is tested on the last test unit 1, the robotic arm 5 at the end of the last test unit 1 removes the short-circuiting device 2 from its conveyor belt 102 and places it on the conveying mechanism 6. The short-circuiting device 2 that has completed the test then runs to the unloading area 602. Therefore, the conveying mechanism 6 can also be considered as the waiting area 4 at the end of the last test unit 1.

[0045] Through the above technical solution, a robotic arm 5 is provided at the head and the end of the running direction of the conveyor belt 102 corresponding to each test unit 1 of the present invention. The robotic arm 5 located at the head end is used to pick up the short-circuit device 2 from the waiting area 4 and place it on the conveyor belt 102, and the robotic arm 5 located at the end is used to remove the short-circuit device 2 from the conveyor belt 102 and place it in the waiting area 4. Therefore, after each test is completed, the robotic arm 5 located at the head end continues to send up the short-circuit device 2 that has not been tested, and the robotic arm 5 located at the tail end removes the test item 101 that has been tested, thereby realizing fast pipeline testing and improving test efficiency. Moreover, according to whether a pulse signal is triggered when the short-circuit device 2 passes the first test item 101, it is determined whether there is a test piece 202, thereby determining which test items 101 need to be turned on, thereby avoiding turning on all test items 101 of the test unit 1 at the same time, resulting in no test piece 202 in front of some test items 101, thereby wasting resources.

[0046] Example 2

[0047] The present invention also provides an itemized testing method based on dynamic adjustment of test time cost, which is applied to Example 1 and includes:

[0048] Based on the total test time of all test units 1 in the current batch and the order of test units 1, the total test time and order of all test units 1 in the next batch of tests are predicted. If the predicted total test time of all test units 1 in the next batch is greater than or equal to the total test time of the current batch, the order of the current test unit 1 remains unchanged. If the predicted total test time of all test units 1 in the next batch is less than the total test time of the current batch, all test units 1 are reordered using the predicted order of test units 1 in the next batch. The specific process is as follows:

[0049] No. The total test time for all test units 1 in this test is ,in, Indicates the test time of single test item 101 in test unit 1. Indicates the The first test The number of test failures of test unit 1; and record the The order of test unit 1 in the second test;

[0050] The predicted The total test time for all test units 1 in this test is

[0051] Set relevant constraints:

[0052]

[0053]

[0054]

[0055] in, Indicates the total number of tests for all test units 1, Indicates the The total number of failures under the total number of tests for each test unit 1; Indicates the number of test items in the test unit.

[0056]

[0057]

[0058]

[0059]

[0060]

[0061] in, Indicates the The total number of qualified units under the total number of tests.

[0062] The relevant constraints are combined in various ways and the first The number of test failures of all test units 1 during the test, and sort the test units 1 in descending order according to the number of test failures; if Greater than or equal to , then the order of the current test unit 1 remains unchanged, if Less than , then the predicted The reordering of the secondary test unit 1 reorders all test units 1.

[0063] The above method is described below with a specific example. The test data of the first test and the second test are shown in Table 1 below.

[0064] Table 1 Test data

[0065]

[0066]

[0067]

[0068]

[0069]

[0070]

[0071]

[0072]

[0073]

[0074] Sort by , the corresponding test unit 1 is sorted as A, E, B, C, D.

[0075] After calculation, 487, , That is, adopt Correspondingly, adjust the order of test unit 1 to A, E, B, C, D.

[0076] Through the above technical solution, the present invention predicts the total test time and the order of all test units 1 in the next batch of tests based on the total test time of all test units 1 in the current batch and the order of test units 1. When the total test time of the current batch is small, the order of the current test unit 1 is kept unchanged. When the predicted total test time of all test units 1 in the next batch is small, all test units 1 are reordered using the predicted order of all test units 1 in the next batch, thereby always minimizing the total test time, reducing the test time cost, and greatly improving the test efficiency.

[0077] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. The sub-item testing method based on dynamic adjustment of test time cost is characterized by: The method includes: predicting the total test time and the order of all test units in the next batch of tests based on the total test time of all test units in the current batch and the order of the test units; if the predicted total test time of all test units in the next batch is greater than or equal to the total test time of the current batch, the order of the current test units remains unchanged; if the predicted total test time of all test units in the next batch is less than the total test time of the current batch, all test units are reordered using the predicted order of the test units in the next batch; Calculate the The total test time of all test units in the test , record the The order of test units during the test; The predicted The total test time of all test units in the test And set relevant constraints; The relevant constraints are combined in various ways and the first The number of test failures of all test units in the test, and the test units are sorted in descending order according to the number of test failures; if Greater than or equal to , then the order of the current test unit remains unchanged, if Less than , then the predicted The sorting of the sub-test units re-sorts all the test units; The said The total test time for all test units in this test is ,in, Indicates the test time of a single test item in the test unit. Indicates the The first test The number of test failures for each test unit; The predicted The total test time for all test units in this test is Set relevant constraints: in, Indicates the total number of tests for all test units. Indicates the The total number of failures under the total number of tests for each test unit; Indicates the number of test items in the test unit; The relevant constraints also include: in, Indicates the The total number of qualified units under the total number of tests.

2. A device applying the item-by-item testing method based on dynamic adjustment of test time cost according to claim 1, characterized in that: It includes a test unit, a conveyor belt, an induction coil and a short-circuit device. There are multiple types of test units. Each test unit has multiple test items arranged in series with equal intervals. Each test unit is set on one side of the conveyor belt and parallel to its running direction. The conveyor belts corresponding to different types of test units run independently. An induction coil is set on the opposite side of each test item relative to the conveyor belt. A short-circuit device is placed on the conveyor belt. The short-circuit device includes a metal plate and a piece to be tested placed above the metal plate. When the short-circuit device is facing the test item, the light-emitting surface of the piece to be tested is facing the light-receiving direction of the test item. The induction coil corresponding to each test unit is connected in series with the pulse power supply.

3. The device for the item-by-item testing method based on dynamic adjustment of test time cost according to claim 2, characterized in that: A waiting area is set at the end of the running direction of the conveyor belt corresponding to each test unit. The waiting area is used to bin the short-circuit devices and eliminate unqualified test pieces; a robotic arm is set at the head and end of the running direction of the conveyor belt corresponding to each test unit. The robotic arm at the head end is used to pick up the short-circuit device from the waiting area and place it on the conveyor belt, and the robotic arm at the end is used to remove the short-circuit device from the conveyor belt and place it in the waiting area.

4. The device for the item-by-item testing method based on dynamic adjustment of test time cost according to claim 3, characterized in that: The conveyor belt corresponding to each test unit is synchronously started and stopped with the corresponding robotic arm. When the robotic arm is running, the corresponding conveyor belt is running, and when the robotic arm stops running, the conveyor belt stops running. By setting the running speed of the conveyor belt and the execution speed of the robotic arm, the time it takes for the conveyor belt to transfer the short-circuit device from the current test item to the next test item, the time it takes for the robotic arm at the head end to pick up the short-circuit device from the waiting area, place it on the conveyor belt and return to the waiting area, and the time it takes for the robotic arm at the end to remove the short-circuit device from the conveyor belt, place it on the waiting area and return to its position are all the same.

5. The device for the item-by-item testing method based on dynamic adjustment of test time cost according to claim 4, characterized in that: The first test item of each test unit receives pulse signals from the short-circuiting device passing in front of the corresponding conveyor belt from the start to the stop of the operation, and numbers the short-circuiting device, wherein the short-circuiting device includes a short-circuiting device that eliminates unqualified test pieces after binning. During the entire test process, the first short-circuiting device number corresponds to the last test item in the test unit, and the second short-circuiting device number corresponds to the second to last test item in the test unit. According to this rule, after the robotic arm sends the short-circuiting devices with the number of test items in the test unit, it determines whether to turn on the corresponding test item based on whether each short-circuiting device triggers a pulse signal. The robotic arm stops running and starts testing. After the test is completed, the robotic arm runs and continues to transport the short-circuiting device. Among them, the first test item is the first test item of each test unit in the direction of the conveyor belt.

6. The device for the item-by-item testing method based on dynamic adjustment of test time cost according to claim 5, characterized in that: The first test item of each test unit is to receive pulse signals from the short-circuit devices passing in front of the corresponding conveyor belt from the start to the stop of the conveyor belt and number the short-circuit devices as follows: At the beginning of each test, the short-circuiting devices that pass through the first test item are numbered sequentially. When the short-circuiting device that has eliminated the DUT passes through the first test item, no signal will be triggered. At this time, the first test item will not receive a pulse signal. When a qualified short-circuiting device passes through the first test item, the DUT placed on the metal plate forms a short-circuiting loop. The DUT of the short-circuiting device is facing the induction coil. The pulse power supply excites the short-circuiting loop at the corresponding position of the induction coil to generate an induced current, thereby energizing the DUT and lighting up the DUT. The light emitted by the DUT is detected by the first test item at its corresponding position, so the first test item receives a pulse signal at this time.

7. The device for the item-by-item testing method based on dynamic adjustment of test time cost according to claim 2, characterized in that: The device to be tested is one of a semiconductor laser, an LED chip, a light pipe, a photocell, a photodiode, and a phototransistor.

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