Methods, apparatus and computer-readable storage media for cutting display units

Abstract

This application relates to the field of laser processing technology, and provides a method, apparatus, and storage medium for cutting a display unit. The cutting method includes obtaining a first cutting pulse width and a second cutting pulse width; controlling a laser to emit a laser beam with a pulse width equal to the first cutting pulse width to cut a target cutting path on the display unit; controlling a laser to emit a laser beam with a pulse width equal to the second cutting pulse width to cut the target cutting path; both the first and second cutting pulse widths are less than the anode layer damage threshold pulse width and both are greater than the polarizer damage threshold pulse width; the second cutting pulse width is less than the first cutting pulse width. Embodiments of this application can avoid energy superposition between the first and second cuttings from damaging the anode layer by reducing the pulse width and performing multiple cuts, thereby reducing damage to the anode layer while further cutting the polarizer of the display unit during the second cutting.

Description

Technical Field

[0001] This application relates to the field of laser processing technology, and in particular to a method, apparatus and computer-readable storage medium for cutting a display unit. Background Technology

[0002] A liquid crystal display (LCD) is an active-matrix liquid crystal display driven by thin-film transistors. It mainly uses electric current to stimulate liquid crystal molecules to produce dots, lines, and surfaces, which, together with backlight tubes, form an image.

[0003] The display unit in a liquid crystal display includes a polarizer, an anode layer, and a substrate, which are stacked sequentially. Because the polarizer is larger than the anode layer during the manufacturing process, it needs to be cut to remove excess polarizer, ensuring the remaining polarizer meets the required size.

[0004] Currently, laser beams are generally used for cutting polarizers. However, due to the difficulty in determining the pulse width threshold for laser beam cutting of polarizers and the difficulty in stabilizing the pulse width of the laser beam, this method of directly cutting the polarizer with a laser beam can easily damage the anode layer. Summary of the Invention

[0005] This application provides a method, apparatus, and computer-readable storage medium for cutting a display unit, which can reduce damage to the anode layer.

[0006] To achieve the above objectives, in a first aspect, embodiments of this application provide a method for cutting a display unit, the display unit comprising a substrate, an anode layer, and a polarizer stacked sequentially; the method for cutting the display unit includes the following steps:

[0007] Obtain the pulse width of the first cut and the pulse width of the second cut;

[0008] The laser emits a laser beam with a pulse width equal to the first cutting pulse width to cut the target cutting path on the display unit;

[0009] The laser is controlled to emit a laser beam with a pulse width equal to the second cutting pulse width to cut the target cut path;

[0010] The pulse width of the first cut and the pulse width of the second cut are both less than the pulse width of the anode layer damage threshold and both greater than the pulse width of the polarizer damage threshold; the pulse width of the second cut is less than the pulse width of the first cut.

[0011] In some possible implementations of the first aspect, the step of obtaining the first cutting pulse width includes:

[0012] The laser is controlled to emit laser beams with different pulse widths to cut different test cutting tracks on the test display unit, and the laser beam corresponding to each pulse width cuts the same test cutting track at least twice;

[0013] When the anode layer of the test display unit is damaged for the first time, the first cutting pulse width is determined according to the pulse width corresponding to the first damage to the anode layer.

[0014] In some possible implementations of the first aspect, the step of obtaining the second cutting pulse width includes:

[0015] The laser beam, whose pulse width is controlled to be the pulse width of the first cut, cuts the test cut track on the test display unit.

[0016] The laser is controlled to emit laser beams with different pulse widths, each with a pulse width smaller than the pulse width of the first cut, to cut different positions of the test cut path.

[0017] When the anode layer of the test display unit is damaged for the first time, the second cutting pulse width is determined based on the pulse width corresponding to the first damage to the anode layer.

[0018] In some possible implementations of the first aspect, the first damage to the anode layer of the test display unit is determined when the size of the damage spot on the anode layer is less than or equal to 5 μm and the damage spot is discontinuous.

[0019] In some possible implementations of the first aspect, after the step of controlling the laser to emit laser beams with different pulse widths, each smaller than the pulse width of the first cut, to cut different positions of the test cut path, the method further includes:

[0020] When adhesion occurs in the test cut channel, the second cutting pulse width is determined based on the pulse width corresponding to the adhesion of the test cut channel and the pulse width corresponding to the first damage to the anode layer.

[0021] In some possible implementations of the first aspect, adhesion is determined to have occurred in the test cut path when the size of the adhesion is less than 35 μm.

[0022] In some possible implementations of the first aspect, the step of determining the second cutting pulse width based on the pulse width corresponding to when adhesion occurs in the test cut and the pulse width corresponding to when the anode layer first shows damage includes:

[0023] The pulse width range that is greater than or equal to the pulse width corresponding to the occurrence of adhesion in the test cut path, and less than or equal to the pulse width corresponding to the first occurrence of damage in the anode layer, is determined as the second cut pulse width.

[0024] In some possible implementations of the first aspect, after the step of controlling the laser to emit a laser beam with a pulse width equal to the second cutting pulse width to cut the target cut, the method further includes:

[0025] Obtain the width of the third cutting pulse;

[0026] The laser is controlled to emit a laser beam with a pulse width equal to the third cutting pulse width to cut the target cut at least once;

[0027] The third cutting pulse width is smaller than the second cutting pulse width.

[0028] In some possible implementations of the first aspect, the step of obtaining the third cutting pulse width includes:

[0029] The laser is controlled to emit laser beams with different pulse widths to cut different test cuts on the test substrate, and the laser beam corresponding to each pulse width cuts the same test cut at least twice;

[0030] When the test substrate is damaged for the first time, the pulse width of the third cutting is determined according to the pulse width corresponding to the first damage to the test substrate.

[0031] Secondly, embodiments of this application provide a cutting apparatus for a display unit, the cutting apparatus for the display unit comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the cutting method for the display unit as described in any of the above technical solutions.

[0032] Thirdly, embodiments of this application provide a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the display unit cutting method as described in any of the above technical solutions.

[0033] The display unit cutting method, apparatus, and computer-readable storage medium provided in this application embodiment first acquire the first cutting pulse width and the second cutting pulse width, then control the laser to emit a laser beam with a pulse width of the first cutting pulse width to cut the target cutting path on the display unit, and then control the laser to emit a laser beam with a pulse width of the second cutting pulse width to cut the target cutting path. Since both the first and second cutting pulse widths are less than the damage threshold pulse width of the anode layer of the display unit and greater than the damage threshold pulse width of the polarizer, damage to the anode layer can be reduced when cutting the display unit. After the polarizer of the display unit is cut to a certain depth in the first cutting, the polarizer is cut off by the second cutting of the display unit. In addition, since the second cutting pulse width is less than the first cutting pulse width, by reducing the pulse width and cutting multiple times, the energy superposition of the first and second cuttings can be avoided to prevent damage to the anode layer. Thus, while the second cutting further cuts off the polarizer of the display unit, the damage to the anode layer is reduced. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram of the terminal structure of the hardware operating environment involved in the embodiments of this application;

[0036] Figure 2 This is a schematic diagram of the structure of a display unit according to an embodiment of this application;

[0037] Figure 3 This is a flowchart of an embodiment of the cutting method for the display unit of this application;

[0038] Figure 4 This is a flowchart of another embodiment of the cutting method for the display unit in this application.

[0039] Explanation of icon numbers:

[0040] 1. Polarizer; 2. Anode layer; 3. Substrate.

[0041] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0042] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0043] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0044] It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0045] It should be understood that the term "and / or" as used in this application specification and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0046] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0047] like Figure 1 As shown, Figure 1 This is a schematic diagram of the terminal structure of the hardware operating environment involved in the embodiments of this application. In the embodiments of this application, the terminal may be a cutting device for a display unit.

[0048] like Figure 1As shown, the terminal may include: a processor 1001, such as a CPU; a network interface 1004; a user interface 1003; a memory 1005; and a communication bus 1002. The communication bus 1002 is used to enable communication between these components. The user interface 1003 may include a display screen and an input unit such as a keyboard. Optionally, the user interface 1003 may also include a standard wired interface or a wireless interface. The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 1005 may be high-speed RAM or non-volatile memory, such as a disk drive. Optionally, the memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0049] Those skilled in the art will understand that Figure 1 The terminal structure shown does not constitute a limitation on the terminal and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0050] like Figure 1 As shown, the memory 1005, which serves as a computer storage medium, may include an operating system, a network communication module, a user interface module, and a network operation control application.

[0051] like Figure 2 As shown, Figure 2 The display unit to be cut according to the embodiment of this application includes a substrate 3, an anode layer 2, and a polarizer 1 stacked sequentially. The substrate 3 may be a glass layer, and the anode layer 2 may be an ITO film layer.

[0052] like Figure 3 As shown in the figure, this application embodiment provides a method for cutting a display unit, which includes the following steps:

[0053] Step S10: Obtain the first cutting pulse width and the second cutting pulse width;

[0054] Step S20: Control the laser to emit a laser beam with a pulse width equal to the first cutting pulse width to cut the target cutting path on the display unit:

[0055] Step S30: Control the laser to emit a laser beam with a pulse width equal to the second cutting pulse width to cut the target cutting path.

[0056] Before performing step S20, the cooling device for cooling the laser is monitored and adjusted to improve the stability of the cooling device's ability to cool the laser.

[0057] Before performing step S20, the internal optical path of the laser can be adjusted to ensure that the shape and size of the laser beam emitted by the laser are the same or similar at the near and far ends, and to control the difference in shape and size between the near and far ends within the micrometer level. Adjusting the internal optical path of the laser can be achieved by adjusting the magnification and divergence angle of the beam expander to extend the collimation distance and reduce the difference in shape and size between the near and far ends of the laser beam.

[0058] In this embodiment, both the first and second cutting pulse widths are less than the damage threshold pulse width of the anode layer, and both are greater than the damage threshold pulse width of the polarizer. The second cutting pulse width is also less than the first cutting pulse width.

[0059] Since the pulse width of the first cut is less than the damage threshold pulse width of the anode layer, the anode layer will not be damaged when the laser beam with a pulse width equal to the first cut pulse width cuts the display unit. However, the pulse width of the first cut is also greater than the damage threshold pulse width of the polarizer. Therefore, when the laser beam with a pulse width equal to the first cut pulse width cuts the display unit, it will inevitably cut the polarizer to a certain depth.

[0060] Based on the initial cutting of the display unit using a laser beam with a pulse width equal to the first cutting pulse width, a second cutting laser beam with a pulse width equal to the second cutting pulse width is used to cut the display unit a second time. Since both the first and second cutting of the display unit follow the target cutting path, the trajectories of the two cuts overlap. The cutting path is the planned cutting trajectory of the laser beam on the display unit.

[0061] Because the pulse width of the second cut is less than the damage threshold pulse width of the anode layer, the anode layer will not be damaged when the laser beam with the pulse width of the second cut is emitted to cut the display unit. Furthermore, since the second cut pulse width is less than the first cut pulse width, the damage to the anode layer can be further reduced during the second cut, avoiding damage caused by energy superposition during the two cuts. And because the second cut pulse width is greater than the damage threshold pulse width of the polarizer, the second cut to the display unit can further sever the polarizer.

[0062] This embodiment first obtains the first and second cutting pulse widths, then controls the laser to emit a laser beam with a pulse width equal to the first cutting pulse width to cut the target cutting path on the display unit, and then controls the laser to emit a laser beam with a pulse width equal to the second cutting pulse width to cut the target cutting path. Since both the first and second cutting pulse widths are less than the damage threshold pulse width of the anode layer of the display unit and greater than the damage threshold pulse width of the polarizer, damage to the anode layer can be reduced when cutting the display unit. After the first cutting of the polarizer of the display unit to a certain depth, the polarizer is cut off by the second cutting of the display unit. In addition, since the second cutting pulse width is less than the first cutting pulse width, by reducing the pulse width and cutting multiple times, the energy superposition of the first and second cuttings can be avoided to prevent damage to the anode layer. This allows the second cutting to further cut off the polarizer of the display unit while reducing damage to the anode layer.

[0063] In one embodiment, when obtaining the first cutting pulse width, the laser can be controlled to emit laser beams with different pulse widths to cut different test cutting paths on the test display unit, and the laser beam corresponding to each pulse width cuts the same test cutting path at least twice; then, when the anode layer of the test display unit is damaged for the first time, the first cutting pulse width is determined according to the pulse width corresponding to the first damage to the anode layer.

[0064] Understandably, the structure of the test display unit is the same as that of the display unit to be cut in this application. The test display unit is used to obtain the required parameters through experimentation; while the display unit is the product to be mass-produced in this application, and the purpose of cutting the display unit is to produce qualified products. Therefore, the test display unit and the display unit should be distinguished.

[0065] First, a relatively large test pulse width can be determined. Then, the laser is controlled to emit a laser beam with a pulse width equal to this test pulse width to cut the test display unit, making multiple cuts on the same test cut path. Next, the pulse width is decreased based on this test pulse width, and the laser beam with the decreased pulse width is used to cut another test cut path multiple times. This decreasing process is repeated multiple times. When the anode layer of the test display unit first shows damage, the first cutting pulse width is determined based on the pulse width corresponding to the first damage to the anode layer. Alternatively, different test pulse widths can be randomly selected to perform cutting tests on the test display unit, thereby determining the first cutting pulse width.

[0066] Specifically, the test slit can be cut twice with a laser beam with a pulse width of 38 μs; then, another test slit can be cut twice with a laser beam with a pulse width of 37.8 μs; and then yet another test slit can be cut twice with a laser beam with a pulse width of 37.6 μs. When the anode layer of the test display unit is damaged for the first time, the pulse width at this moment is determined as the first cutting pulse width.

[0067] Because each test kerf is cut multiple times by a laser beam of the same pulse width, the initial damage to the anode layer of the test display unit is the result of multiple overlapping cuts. In other words, the laser beam of the same pulse width cuts multiple times on the same test kerf so that the energy is superimposed to precisely damage the anode layer of the test display unit. Therefore, when the pulse width corresponding to the initial damage to the anode layer of the test display unit is used as the first cutting pulse width, this first cutting pulse width will inevitably be less than the damage threshold pulse width of the anode layer of the display unit. Since the laser beam of the first cutting pulse width only cuts the display unit once, it will not damage the anode layer of the display unit.

[0068] In one embodiment, when obtaining the second cutting pulse width, the laser is first controlled to emit a laser beam with a pulse width equal to that of the first cutting pulse width to cut the test cutting path on the test display unit. Then, the laser is controlled to emit laser beams with different pulse widths, each with a pulse width smaller than that of the first cutting pulse width, to cut different positions of the test cutting path. Then, when the anode layer of the test display unit is damaged for the first time, the second cutting pulse width is determined based on the pulse width corresponding to the first damage to the anode layer.

[0069] Understandably, the test display unit cut when acquiring the second cut pulse width is not the same as the test display unit cut when acquiring the first cut pulse width.

[0070] First, the laser emits a laser beam with a pulse width equal to the first cutting pulse width to cut the test cut path of the test display unit. Based on this, the pulse width is sequentially decreased using the first cutting pulse width as a reference, and the laser emits laser beams with decreasing pulse widths to cut the test cut path, with the two cutting trajectories overlapping. If the anode layer of the test display unit shows no significant change, the pulse width continues to decrease to cut another test cut path cut by a laser beam with a pulse width equal to the first cutting pulse width. When the anode layer of the test display unit shows damage for the first time, the second cutting pulse width is determined based on the pulse width corresponding to the first damage. Of course, after using a laser beam with a pulse width equal to the first cutting pulse width to cut the test cut path, laser beams with different pulse widths but smaller than the first cutting pulse width can also be randomly selected to cut the test cut path; this embodiment does not impose such limitations.

[0071] When determining the second cutting pulse width based on the pulse width corresponding to the first occurrence of damage to the anode layer of the test display unit, the pulse width corresponding to the first occurrence of damage to the anode layer of the test display unit can be used as the second cutting pulse width.

[0072] Since the pulse width corresponding to the first damage to the anode layer of the display unit was measured by cutting with a laser beam of the same pulse width as the first cut, using a laser beam with a second cut pulse width to cut the display unit a second time can sever the polarizer, thus achieving the purpose of cutting the display unit. Furthermore, the second cut pulse width is smaller than the first cut pulse width, which reduces the damage to the anode layer of the display unit during cutting.

[0073] When the size of the damage spot on the anode layer of the test display unit is less than or equal to 5 μm and the damage spot is discontinuous, it is determined that the anode layer of the test display unit has suffered its first damage. At this time, the corresponding pulse width is within the allowable damage range for the anode layer of the display unit and will not affect the function of the anode layer of the display unit.

[0074] In one embodiment, after controlling the laser to emit laser beams with different pulse widths, all shorter than the pulse width of the first cut, to cut different positions of the test cut path, when adhesion occurs on the test cut path of the test display unit, the pulse width for the second cut is determined based on the pulse width corresponding to when adhesion occurs and the pulse width corresponding to when the anode layer first shows damage. The adhesion phenomenon on the test cut path refers to the phenomenon where the cut fracture surfaces partially connect after the laser beam cuts the test cut path.

[0075] When the adhesion dimension of the test cut track is less than 35 μm, adhesion can be confirmed to have occurred in the test cut track. The adhesion dimension refers to the local connection length of the fracture surface after laser beam cutting of the test cut track.

[0076] When determining the pulse width for the second cut based on the pulse width corresponding to the occurrence of adhesion in the test cut path and the pulse width corresponding to the first damage to the anode layer, the pulse width range that is greater than or equal to the pulse width corresponding to the occurrence of adhesion in the test cut path and less than or equal to the pulse width corresponding to the first damage to the anode layer can be defined as the second cut pulse width. In other words, the pulse width corresponding to the occurrence of adhesion in the test cut path is used as the lower limit of the second cut pulse width, and the pulse width corresponding to the first damage to the anode layer of the test display unit is used as the upper limit of the second cut pulse width. This reduces damage to the anode layer of the display unit while cutting the polarizer, and also reduces the requirements for the second cut pulse width, thus lowering cutting costs.

[0077] In one embodiment, such as Figure 4 As shown, after step S30, the following steps are also included:

[0078] Step S40: Obtain the width of the third cutting pulse;

[0079] Step S50: Control the laser to emit a laser beam with a pulse width equal to the third cutting pulse width to cut the target cutting path at least once.

[0080] In this embodiment, the third cutting pulse width is smaller than the second cutting pulse width, so as to further reduce damage to the anode layer of the display unit while cutting the polarizer of the display unit. Specifically, controlling the laser to emit a laser beam with a pulse width equal to the third cutting pulse width to cut the target cutting path constitutes the third cutting of the target cutting path.

[0081] After a laser beam with a pulse width equal to the second cutting pulse width cuts the target kerf, adhesion may exist on the cut surface of the target kerf, and the polarizer of the display unit may not be completely severed. Therefore, by controlling the laser beam with a pulse width equal to the third cutting pulse width to cut the target kerf at least once, the adhesion that exists after the second cutting of the target kerf can be severed, ensuring that the polarizer of the display unit is completely severed.

[0082] When obtaining the third cutting pulse width, the laser is first controlled to emit laser beams with different pulse widths to cut different test cutting paths on the test substrate, and the laser beam corresponding to each pulse width cuts the same test cutting path at least twice; then, when the test substrate is damaged for the first time, the third cutting pulse width is determined according to the pulse width corresponding to the first damage on the test substrate.

[0083] Understandably, the test substrate in this embodiment refers to a bare substrate, that is, the anode layer and polarizer on the substrate have been removed, leaving only the substrate.

[0084] First, a test pulse width smaller than the second cutting pulse width can be selected to cut the test substrate, and the laser beam corresponding to each pulse width cuts the same test kerf multiple times. If no obvious changes are observed on the surface of the test substrate, the test pulse width is changed to cut another test substrate or another part of the test substrate. When the test substrate is damaged for the first time, the third cutting pulse width is determined based on the pulse width corresponding to the first damage.

[0085] Specifically, the test substrate can be cut twice with a laser beam with a pulse width of 30 μs; then another test slit can be cut twice with a laser beam with a pulse width of 29.8 μs; and then yet another test slit can be cut twice with a laser beam with a pulse width of 29.6 μs. When the test substrate is damaged for the first time, the pulse width at this point is determined as the pulse width for the third cut.

[0086] Since each test kerf is cut multiple times by a laser beam of the same pulse width, the initial damage to the test substrate is the result of multiple overlapping cuts. In other words, the laser beam of the same pulse width cuts the same test kerf multiple times, ensuring that the energy is superimposed to precisely damage the test substrate. Therefore, using the pulse width corresponding to the initial damage to the test substrate as the pulse width for the third cut reduces damage to the anode layer of the display unit and also cuts off adhesions on the target kerf, further ensuring that the polarizer of the display unit can be cut.

[0087] Understandably, in this embodiment, the method of obtaining the first, second, and third cutting pulse widths is only applicable to the first cutting of the display unit. In subsequent cuttings of the display unit, the first, second, and third cutting pulse widths can be directly called without testing, thus improving cutting efficiency. Alternatively, the first, second, and third cutting pulse widths obtained after testing can be directly stored in memory and called directly when cutting the display unit. This embodiment does not limit this approach.

[0088] Furthermore, this application also provides a display unit cutting device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the steps of the display unit cutting method as described in any of the above embodiments.

[0089] Furthermore, embodiments of this application also provide a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the display unit cutting method as described in any of the above embodiments.

[0090] The above description is merely a preferred embodiment of this application and does not limit the patent scope of this application. Any equivalent structural transformations made based on the inventive concept of this application and the contents of the specification and drawings of this application, or direct / indirect applications in other related technical fields, are included within the patent protection scope of this application.

Claims

1. A cutting method of a display unit, characterized by, The display unit comprises a substrate, an anode layer and a polarizer which are sequentially stacked; and a cutting method of the display unit comprises the following steps: acquiring a first cutting pulse width and a second cutting pulse width; controlling the laser to emit a laser beam with the first cutting pulse width to cut a target cutting path on the display unit; controlling the laser to emit a laser beam with the second cutting pulse width to cut the target cutting path; the step of acquiring the second cutting pulse width comprises: controlling the laser to emit a laser beam with the first cutting pulse width to cut a test cutting path on a test display unit; controlling the laser to emit laser beams with different pulse widths smaller than the first cutting pulse width to cut different positions of the test cutting path respectively; when the anode layer of the test display unit first appears damage, determining the second cutting pulse width according to the pulse width corresponding to the first appearance of damage of the anode layer; wherein the first cutting pulse width and the second cutting pulse width are both smaller than the anode layer damage threshold pulse width and both larger than the polarizer damage threshold pulse width; and the second cutting pulse width is smaller than the first cutting pulse width.

2. The cutting method of a display unit according to claim 1, wherein the step of acquiring the first cutting pulse width comprises: controlling the laser to emit laser beams with different pulse widths to cut different test cutting paths on a test display unit respectively, and each pulse width corresponding to the laser beam cutting the same test cutting path at least twice; when the anode layer of the test display unit first appears damage, determining the first cutting pulse width according to the pulse width corresponding to the first appearance of damage of the anode layer.

3. The cutting method of a display unit according to claim 1, wherein when the size of the damage spot of the anode layer of the test display unit is smaller than or equal to 5 μm and the damage spot is discontinuous, determining that the anode layer of the test display unit first appears damage.

4. The cutting method of a display unit according to claim 1, wherein the step of controlling the laser to emit laser beams with different pulse widths smaller than the first cutting pulse width to cut different positions of the test cutting path respectively, further comprises: when the test cutting path appears adhesion, determining the second cutting pulse width according to the pulse width corresponding to the appearance of adhesion of the test cutting path and the pulse width corresponding to the first appearance of damage of the anode layer.

5. The cutting method of a display unit according to claim 4, wherein when the size of the adhesion of the test cutting path is smaller than 35 μm, determining that the test cutting path appears adhesion.

6. The cutting method of a display unit according to claim 4, wherein the step of determining the second cutting pulse width according to the pulse width corresponding to the appearance of adhesion of the test cutting path and the pulse width corresponding to the first appearance of damage of the anode layer comprises: determining a pulse width interval larger than or equal to the pulse width corresponding to the appearance of adhesion of the test cutting path and smaller than or equal to the pulse width corresponding to the first appearance of damage of the anode layer as the second cutting pulse width.

7. The cutting method of a display unit according to claim 1, wherein the step of controlling the laser to emit a laser beam with the second cutting pulse width to cut the target cutting path, further comprises: acquiring a third cutting pulse width; controlling the laser to emit a laser beam with the third cutting pulse width to cut the target cutting path at least once; wherein the third cutting pulse width is smaller than the second cutting pulse width.

8. The cutting method of a display unit according to claim 7, wherein the step of acquiring the third cutting pulse width comprises: The laser emits laser beams with different pulse widths to cut different test cutting paths on the test substrate respectively, and each pulse width corresponds to cutting the same test cutting path at least twice; When the test substrate first appears damage, the third cutting pulse width is determined according to the pulse width corresponding to the first damage of the test substrate.

9. A cutting apparatus for display units, characterized by The cutting device of the display unit comprises a memory, a processor and a computer program stored in the memory and executable on the processor, and the computer program, when executed by the processor, implements the steps of the cutting method of the display unit according to any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, and the computer program, when executed by the processor, implements the steps of the cutting method of the display unit according to any one of claims 1 to 8.

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