A method and apparatus for self-temperature control in spacecraft thermal vacuum experiments

Abstract

This application discloses a self-temperature control method and apparatus for spacecraft thermal vacuum experiments. The method includes: dividing the initial temperature control region into multiple sub-regions based on the maximum temperature difference within the initial temperature control region of the spacecraft; determining a first target temperature and a second target temperature for each sub-region; the first target temperature being the target temperature for the spacecraft during the heating and high-temperature phases, and the second target temperature being the target temperature for the spacecraft during the cooling and low-temperature phases; for each sub-region, acquiring the spacecraft's performance parameters under high-temperature conditions based on the first target temperature and under low-temperature conditions based on the second target temperature, and determining the spacecraft's performance based on the acquired performance parameters. This method can improve the temperature control accuracy within each temperature control region during thermal vacuum experiments.

Description

Technical Field

[0001] This application relates to the field of spacecraft ground testing technology, and in particular to a self-temperature control method and device for spacecraft thermal vacuum experiments. Background Technology

[0002] Thermal vacuum testing is an important test before a spacecraft launch. It mainly involves applying a relatively harsh temperature environment to the spacecraft in a simulated vacuum environment to test its operational capabilities and expose design and manufacturing defects.

[0003] Currently, thermal vacuum tests on spacecraft are often conducted using automatic temperature control. However, with the development of aerospace technology, the types of individual payloads on spacecraft are increasing, and the requirements for temperature control accuracy are becoming more stringent. Existing automatic temperature control methods can no longer meet the high-precision temperature control requirements of thermal vacuum tests on spacecraft. Summary of the Invention

[0004] In view of the above-mentioned defects or deficiencies in the prior art, it is desirable to provide a self-temperature control method and device for spacecraft thermal vacuum experiments, which can improve the temperature control accuracy in each temperature control zone during thermal vacuum experiments.

[0005] Firstly, this application provides a method for self-temperature control in spacecraft thermal vacuum experiments. The method includes:

[0006] The initial temperature control region is divided based on the maximum temperature difference of the initial temperature control region of the spacecraft, resulting in multiple temperature control sub-regions;

[0007] Determine the first target temperature and the second target temperature for each temperature control sub-region; the first target temperature is the target temperature of the spacecraft during the heating and high temperature phases, and the second target temperature is the target temperature of the spacecraft during the cooling and low temperature phases.

[0008] For each temperature-controlled sub-region, the performance parameters of the spacecraft in a high-temperature environment based on a first target temperature and the performance parameters of the spacecraft in a low-temperature environment based on a second target temperature are obtained, and the performance of the spacecraft is determined based on the obtained performance parameters.

[0009] In one embodiment, the initial temperature control region is divided based on the maximum temperature difference of the initial temperature control region of the spacecraft to obtain multiple temperature control sub-regions, including: if the maximum temperature difference of the initial temperature control region of the spacecraft is greater than a preset threshold, the initial temperature control region is divided to obtain multiple temperature control sub-regions.

[0010] In one embodiment, determining a first target temperature and a second target temperature for each temperature-controlled sub-region includes: determining a high-temperature characteristic temperature and a low-temperature characteristic temperature for the temperature-controlled sub-region; the high-temperature characteristic temperature is the average temperature inside the temperature-controlled sub-region under a high-temperature environment, and the low-temperature characteristic temperature is the average temperature or minimum temperature inside the temperature-controlled sub-region under a low-temperature environment; determining the first target temperature based on the high-temperature characteristic temperature; and determining the second target temperature based on the low-temperature characteristic temperature.

[0011] In one embodiment, determining the first target temperature based on the high-temperature characteristic temperature includes: determining the lower limit of the first target temperature based on the high-temperature characteristic temperature and the high-temperature temperature deviation value; determining the upper limit of the first target temperature based on the spacecraft's maximum allowable temperature and the high-temperature temperature safety value; and determining the first target temperature based on the upper limit of the first target temperature and the lower limit of the first target temperature.

[0012] In one embodiment, determining the second target temperature based on the cryogenic characteristic temperature includes: determining an upper limit value for the second target temperature based on the cryogenic characteristic temperature and the cryogenic temperature deviation value; determining a lower limit value for the second target temperature based on the spacecraft's minimum allowable temperature and the cryogenic temperature safety value; and determining the second target temperature based on the upper limit value and the lower limit value of the second target temperature.

[0013] In one embodiment, determining the high-temperature characteristic temperature and low-temperature characteristic temperature of the temperature-controlled sub-region includes: after heating the temperature-controlled sub-region for a first preset time, determining the average temperature inside the temperature-controlled sub-region to obtain the high-temperature characteristic temperature; and after stopping heating the temperature-controlled sub-region for a second preset time, determining the average temperature or the lowest temperature inside the temperature-controlled sub-region to obtain the low-temperature characteristic temperature.

[0014] Secondly, this application also provides a self-temperature controlled device for spacecraft thermal vacuum experiments. The device includes:

[0015] The partitioning module is used to divide the initial temperature control region based on the maximum temperature difference of the initial temperature control region of the spacecraft, thereby obtaining multiple temperature control sub-regions;

[0016] The target temperature determination module is used to determine the first target temperature and the second target temperature of each temperature control sub-region; the first target temperature is the target temperature of the spacecraft during the heating phase and the high temperature phase, and the second target temperature is the target temperature of the spacecraft during the cooling phase and the cooling phase.

[0017] The performance determination module is used to acquire the performance parameters of the spacecraft in a high-temperature environment based on a first target temperature and the performance parameters of the spacecraft in a low-temperature environment based on a second target temperature for each temperature control sub-region, and determine the performance of the spacecraft based on the acquired performance parameters.

[0018] Thirdly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps described in the first aspect.

[0019] Fourthly, this application also provides a computer-readable storage medium. This computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the steps described in the first aspect.

[0020] Fifthly, this application also provides a computer program product. This computer program product includes a computer program that, when executed by a processor, performs the steps described in the first aspect.

[0021] This application provides a self-controlled temperature control method and apparatus for spacecraft thermal vacuum experiments. Before conducting thermal vacuum tests on a spacecraft, the initial temperature control region is further divided based on the maximum temperature difference within each initial temperature control region, resulting in multiple sub-regions. For each of these sub-regions, a temperature control process is automatically executed based on a first and second target temperature, thus conducting the thermal vacuum test. The spacecraft's performance is determined based on its performance parameters during the thermal vacuum test. By further dividing the initial temperature control region before the thermal vacuum test, this application reduces the temperature variation differences at different locations within each sub-region, thereby improving the temperature control accuracy within each region and achieving high-precision temperature control for spacecraft thermal vacuum tests, while also avoiding undertesting. Attached Figure Description

[0022] Other features, objects, and advantages of this application will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0023] Figure 1 This is a schematic diagram illustrating the division of the temperature control zone in one embodiment;

[0024] Figure 2 This is a schematic diagram illustrating the division of another temperature control zone in one embodiment;

[0025] Figure 3 This is a flowchart illustrating a self-temperature control method for a spacecraft thermal vacuum experiment in one embodiment.

[0026] Figure 4 This is another flowchart illustrating the self-temperature control method for a spacecraft thermal vacuum experiment in one embodiment.

[0027] Figure 5 This is another flowchart illustrating the self-temperature control method for a spacecraft thermal vacuum experiment in one embodiment.

[0028] Figure 6 This is another flowchart illustrating the self-temperature control method for a spacecraft thermal vacuum experiment in one embodiment.

[0029] Figure 7 This is another flowchart illustrating the self-temperature control method for a spacecraft thermal vacuum experiment in one embodiment.

[0030] Figure 8 This is a structural block diagram of a self-temperature control device for a spacecraft thermal vacuum experiment in one embodiment.

[0031] Figure 9 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0032] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, only the parts relevant to the invention are shown in the accompanying drawings.

[0033] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0034] Thermal vacuum testing is a crucial pre-launch test for spacecraft. It involves applying harsh temperatures to the spacecraft in a simulated vacuum environment to verify its operational capabilities and expose design and manufacturing defects. During thermal vacuum testing, automatic temperature control is typically used for each temperature-controlled zone.

[0035] Before conducting thermal vacuum tests, spacecraft decks are typically divided into multiple test zones (i.e., temperature-controlled zones). For each temperature-controlled zone, multiple temperature measurement points are set up, and a temperature measuring instrument is installed at each point to measure the temperature at that point. For example, ... Figure 1 As shown, the spacecraft cabin is divided into m temperature control zones, D1, D2, ..., Dm. For each temperature control zone Di, n temperature measurement points are set, Ti1, Ti1, ..., Tij, ..., Tin.

[0036] The spacecraft deck has multiple payloads distributed on it; the multiple temperature measuring points in each temperature control area can be uniformly distributed or non-uniformly distributed. For example, a temperature measuring point can be set at each payload location.

[0037] Furthermore, let's take the satellite's south side as an example for explanation, such as... Figure 2As shown, the satellite's south panel is divided into seven regions: A1-A6 and C1. Regions A1-A6 are temperature-controlled areas where automatic temperature control tests are conducted. Region C1 is a region with more complex temperature characteristics, such as the solar array drive assembly (SADA), which requires manual intervention and is not used for automatic temperature control tests.

[0038] In areas A1-A6, the triangles represent temperature measuring points with temperature measuring instruments installed on them; the slender rectangles represent heating devices used to heat the temperature-controlled area; and the pipes formed by the dashed lines are heat pipes, which conduct heat and make the temperature distribution within the temperature-controlled area more uniform.

[0039] However, existing thermal vacuum tests suffer from undertesting. Specifically, for each temperature-controlled region of a spacecraft, when heating is applied using multiple heating devices within that region, the temperature near the heating devices rises rapidly, while the temperature at locations farther from the heating devices rises more slowly. When the temperature at some locations within the temperature-controlled region has already reached the target temperature and heating is stopped, some locations farther from the heating devices are still far from reaching the target temperature, resulting in undertesting.

[0040] Furthermore, with the development of aerospace technology, the types of individual payloads on spacecraft are increasing, and the requirements for temperature control accuracy are becoming increasingly stringent. Existing automatic temperature control methods can no longer meet the high-precision temperature control requirements of spacecraft thermal vacuum experiments. Therefore, this application provides a self-temperature control method and apparatus for spacecraft thermal vacuum experiments, which can improve the temperature control accuracy of the temperature control area during spacecraft thermal vacuum experiments.

[0041] In one embodiment, such as Figure 3 As shown, a self-temperature control method for spacecraft thermal vacuum experiments is provided. This embodiment illustrates the method by applying it to a terminal. It is understood that this method can also be applied to a server, and further to a system including both a terminal and a server, and implemented through interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0042] Step 101: Divide the initial temperature control region into multiple temperature control sub-regions based on the maximum temperature difference of the initial temperature control region of the spacecraft.

[0043] The initial temperature control zone is a temperature control area defined by staff based on their experience.

[0044] In this embodiment, a thermal balance test is required before conducting a thermal vacuum test on the spacecraft. During the thermal balance test, the test conditions are determined based on the mission scenario, generally including at least high-temperature and low-temperature conditions. The high-temperature condition includes a heating phase and a high-temperature stabilization phase, while the low-temperature condition includes a cooling phase and a low-temperature stabilization phase. During the thermal balance test, temperature measuring instruments acquire the temperature at each temperature measuring point within the initial temperature control area during the high-temperature and low-temperature stabilization phases of the spacecraft.

[0045] It should be noted that both the thermal equilibrium test and the thermal vacuum test are conducted in a simulated vacuum environment. For example, a spacecraft can be placed in a vacuum container to simulate the space environment.

[0046] In this embodiment, after the thermal balance test is completed, the temperatures of each temperature measuring point in the initial temperature control area during the high-temperature stable phase are obtained, and the maximum temperature difference between multiple temperature measuring points is determined. If the maximum temperature difference is greater than a preset threshold, it indicates that the temperature change difference at different locations within the initial temperature control area is large. This means that the initial temperature control area is prone to undertesting during the thermal vacuum test, and the large temperature change difference also leads to poor temperature control accuracy. Therefore, the initial temperature control area can be further divided to obtain multiple temperature control sub-regions.

[0047] Step 102: Determine the first target temperature and the second target temperature for each temperature control sub-region; the first target temperature is the target temperature of the spacecraft during the heating and high temperature phases, and the second target temperature is the target temperature of the spacecraft during the cooling and low temperature phases.

[0048] In this embodiment of the application, after the area is divided, a thermal vacuum test is carried out, and the test equipment independently controls the temperature of each temperature control area.

[0049] This explanation focuses on a specific temperature-controlled sub-region:

[0050] The thermal vacuum test involves: activating the temperature control device within the temperature-controlled sub-region to raise the temperature of that sub-region until the first target temperature is reached (i.e., the heating phase); maintaining the temperature-controlled sub-region at the first target temperature (i.e., the high-temperature phase) after the temperature conditions are met, and conducting spacecraft performance tests; after completing the high-temperature phase performance tests, the temperature control device cools the spacecraft until the second target temperature is reached (i.e., the cooling phase), and then maintaining the temperature-controlled sub-region at the second target temperature (i.e., the low-temperature phase), and conducting low-temperature phase performance tests.

[0051] It should be noted that the above process can be one cycle of the entire heat balance test. The heat balance test can include multiple cycles, and the number of cycles can be set as needed.

[0052] Therefore, before conducting a thermal vacuum test, it is necessary to determine the first and second target temperatures of the temperature-controlled sub-region. Since a thermal vacuum test involves testing a spacecraft under relatively harsh temperature conditions, the first and second target temperatures are more stringent than the highest and lowest temperatures during a thermal equilibrium test. For example, the first target temperature is higher than the highest temperature during a thermal equilibrium test, and the second target temperature is lower than the lowest temperature during a thermal equilibrium test.

[0053] In this embodiment of the application, the first target temperature and the second target temperature can be determined based on the above conditions, according to the highest and lowest temperatures of the initial temperature control region corresponding to the temperature control sub-region during the thermal balance test.

[0054] Step 103: For each temperature-controlled sub-region, obtain the spacecraft's performance parameters in a high-temperature environment based on a first target temperature and the spacecraft's performance parameters in a low-temperature environment based on a second target temperature, and determine the spacecraft's performance based on the obtained performance parameters.

[0055] In the embodiments of this application, each temperature cycle of the thermal vacuum test is divided into four temperature stages: a heating stage, a high-temperature stage where the temperature is maintained at the first target temperature, a cooling stage, and a low-temperature stage where the temperature is maintained at the second target temperature.

[0056] During the thermal vacuum test, performance parameters of the temperature-controlled sub-region when maintained at the first target temperature (high-temperature environment) and performance parameters of the temperature-controlled sub-region when maintained at the second target temperature (low-temperature environment) can be obtained. The spacecraft's performance can then be determined based on these obtained performance parameters.

[0057] The method provided in this application can further divide the initial temperature control region based on the maximum temperature difference within each initial temperature control region before conducting a thermal vacuum test on the spacecraft, obtaining multiple temperature control sub-regions. For each of the further divided temperature control regions, a temperature control process is automatically executed based on a first target temperature and a second target temperature to conduct the thermal vacuum test. By further dividing the initial temperature control region before the thermal vacuum test, this application reduces the temperature variation differences at different locations within each divided temperature control region, thereby improving the temperature control accuracy within each region and achieving high-precision temperature control for the spacecraft's thermal vacuum test, while avoiding undertesting.

[0058] The embodiments described above introduced a scheme for dividing the initial temperature control zone. In another embodiment of this application, the division can be based on a comparison between the maximum temperature difference within the initial temperature control zone and a preset threshold, including the following steps:

[0059] If the maximum temperature difference in the initial temperature control region of the spacecraft exceeds a preset threshold, the initial temperature control region is divided into multiple temperature control sub-regions.

[0060] In this embodiment, if the maximum temperature difference exceeds a preset threshold, it indicates a significant difference in temperature variation at different locations within the initial temperature control area. This results in low temperature control accuracy for the initial temperature control area and a higher likelihood of undertesting during thermal vacuum testing. Therefore, the initial temperature control area can be further divided into multiple smaller temperature control sub-regions. The preset threshold can be 5°C.

[0061] In one embodiment, to ensure the accuracy of the area division, the maximum temperature difference of each temperature-controlled sub-region can be measured and determined again. If the maximum temperature difference is greater than a preset threshold, the temperature-controlled sub-region can be further divided until the maximum temperature difference within each divided temperature-controlled sub-region is less than or equal to the preset threshold.

[0062] In one embodiment, the initial temperature control region can also be divided using the standard deviation of the temperatures at each temperature measuring point within the initial temperature control region. For example, if the standard deviation is greater than a preset standard deviation threshold, the initial temperature control region is divided into multiple temperature control sub-regions. The preset standard deviation threshold can be 2°C.

[0063] refer to Figure 2 Let's take the aforementioned satellite south plate as an example for illustration:

[0064] Through the thermal balance test in this embodiment, the temperature parameters of each temperature control zone of the south plate during the high-temperature stage were obtained, as shown in Table 1 below:

[0065] Table 1

[0066]

[0067]

[0068] Through the thermal balance test in this embodiment, the temperature parameters of each temperature control zone of the south plate in the low-temperature stage were obtained, as shown in Table 2 below:

[0069] Table 2

[0070]

[0071]

[0072] The method provided in this application embodiment can divide the initial temperature control area by a preset threshold, so that the temperature change difference at different locations within each divided temperature control area is small, thereby improving the temperature control accuracy within each temperature control area and avoiding the occurrence of undertesting.

[0073] The embodiments described above introduced a scheme for determining the first target temperature and the second target temperature of each temperature-controlled sub-region. In another embodiment of this application, the first target temperature and the second target temperature can be determined based on the temperature of the initial temperature-controlled region corresponding to the temperature-controlled sub-region during the thermal equilibrium test. This embodiment includes, as follows: Figure 4 The steps shown are as follows:

[0074] Step 201: Determine the high-temperature characteristic temperature and low-temperature characteristic temperature of the temperature-controlled sub-region.

[0075] Among them, the high-temperature characteristic temperature is the average temperature inside the temperature-controlled sub-region during the high-temperature stable phase of the high-temperature condition during the heat balance test; the low-temperature characteristic temperature is the average temperature or minimum temperature inside the temperature-controlled sub-region during the low-temperature stable phase of the low-temperature condition during the heat balance test.

[0076] The following explanation uses the aforementioned satellite south plate as an example:

[0077] Using the method of this embodiment, the characteristic temperature-related parameters of each temperature control zone of the south plate during the high-temperature stable stage are obtained, as shown in Table 3 below:

[0078] Table 3

[0079]

[0080]

[0081] Using the method described in this embodiment, characteristic temperature-related parameters of each temperature control zone of the south plate during the low-temperature stable phase were obtained, as shown in Table 4 below:

[0082] Table 4

[0083]

[0084] Step 202: Determine the first target temperature based on the high temperature characteristic temperature.

[0085] In this embodiment of the application, a certain temperature value can be added to the high-temperature characteristic temperature as the first target temperature of the temperature-controlled sub-region during the thermal vacuum test.

[0086] Step 203: Determine the second target temperature based on the low-temperature characteristic temperature.

[0087] In this embodiment, a certain temperature value can be lowered from the low-temperature characteristic temperature to serve as the second target temperature of the temperature-controlled sub-region during the thermal vacuum test.

[0088] The method provided in this application determines the high-temperature characteristic temperature of the temperature-controlled sub-region based on the average temperature of the high-temperature stable phase during a thermal equilibrium test, thereby determining a first target temperature; and determines the low-temperature characteristic temperature of the temperature-controlled sub-region based on the average temperature or minimum temperature of the low-temperature stable phase during a thermal equilibrium test, thereby determining a second target temperature. This application takes into account the temperature differences within the temperature-controlled sub-region during the high-temperature phase, determining the first and second target temperatures through average temperatures, thus eliminating temperature differences within the temperature-controlled sub-region to a certain extent, thereby improving the temperature control accuracy of the thermal vacuum test based on the first and second target temperatures.

[0089] The embodiments described above provide a scheme for determining a first target temperature based on a high-temperature characteristic temperature. In another embodiment of this application, the first target temperature can be determined based on a high-temperature characteristic temperature and a high-temperature temperature deviation value. This embodiment includes, for example: Figure 5 The steps shown are as follows:

[0090] Step 301: Determine the lower limit of the first target temperature based on the high temperature characteristic temperature and the high temperature pull value.

[0091] In this embodiment of the application, in order to achieve the harsh high-temperature environment during the thermal vacuum test, a high-temperature pull value is set, and the sum of the high-temperature characteristic temperature and the high-temperature pull value is determined as the lower limit of the first target temperature.

[0092] Among them, the high-temperature temperature deviation value is in the range of 5℃-10℃.

[0093] Step 302: Determine the upper limit of the first target temperature based on the spacecraft's maximum allowable temperature and the safe value of high temperature.

[0094] In this embodiment, the harsh high-temperature environment applied to the spacecraft cannot exceed the maximum temperature the spacecraft can withstand, i.e., the maximum permissible temperature. To avoid damage to the spacecraft, a certain temperature can be lowered from the maximum permissible temperature as a first target temperature upper limit. That is, the difference between the maximum permissible temperature and the safe high-temperature value is determined as the upper limit of the first target temperature. The safe temperature value is typically 5°C.

[0095] Step 303: Determine the first target temperature based on the upper limit of the first target temperature and the lower limit of the first target temperature.

[0096] In the embodiments of this application, the first target temperature is within the range between the lower and upper limits of the first target temperature, and can be any temperature value within the range. For example, it can be either the lower limit of the first target temperature or the upper limit of the first target temperature.

[0097] The embodiments described above provide a scheme for determining a second target temperature based on a low-temperature characteristic temperature. In another embodiment of this application, the second target temperature can be determined based on the low-temperature characteristic temperature and the low-temperature bias value. This embodiment includes, for example... Figure 6 The steps shown are as follows:

[0098] Step 401: Determine the upper limit of the second target temperature based on the low temperature characteristic temperature and the low temperature deviation value.

[0099] In this embodiment of the application, in order to achieve the harsh low-temperature environment during the thermal vacuum test, a low-temperature pull value can be set, and the difference between the low-temperature characteristic temperature and the low-temperature pull value can be determined as the upper limit of the second target temperature.

[0100] Among them, the low-temperature temperature deviation value is in the range of 5℃-10℃.

[0101] Step 402: Determine the lower limit of the second target temperature based on the spacecraft's minimum allowable temperature and the safe value of the cryogenic temperature.

[0102] In this embodiment, the harsh cryogenic environment imposed on the spacecraft must not exceed the minimum temperature the spacecraft can withstand, i.e., the minimum permissible temperature. To avoid damage to the spacecraft, a certain temperature can be added to the minimum permissible temperature as a second target lower limit. That is, the sum of the minimum permissible temperature and the cryogenic temperature safety value is determined as the lower limit of the second target temperature.

[0103] The safe temperature for low temperatures is generally 5℃.

[0104] Step 403: Determine the second target temperature based on the upper limit of the second target temperature and the lower limit of the second target temperature.

[0105] In the embodiments of this application, the second target temperature is within the range between the lower limit of the second target temperature and the upper limit of the second target temperature, and can be any temperature value within the range. For example, it can be either the lower limit of the second target temperature or the upper limit of the second target temperature.

[0106] The embodiments described above introduce a scheme for determining the characteristic temperature of a temperature-controlled sub-region. In another embodiment of this application, the characteristic temperature of the temperature-controlled region is determined through a thermal balance test. This embodiment includes, for example: Figure 7 The steps shown are as follows:

[0107] Step 501: After heating the temperature-controlled sub-region for a first preset time, determine the average temperature inside the temperature-controlled sub-region to obtain the high-temperature characteristic temperature.

[0108] Since the thermal balance test is conducted under normal temperature conditions, its purpose is to test the temperature that the spacecraft can reach during normal heating and cooling processes. Therefore, the thermal balance test process is not guided by a target temperature, but rather carried out over a set time.

[0109] In this embodiment, the spacecraft is heated for a first preset time, such as 12 hours, to ensure that each temperature-controlled area of ​​the spacecraft reaches its corresponding maximum temperature. The average temperature within the temperature-controlled area is determined as the high-temperature characteristic temperature corresponding to that area.

[0110] Step 502: After the second preset time has elapsed since the heating in the temperature-controlled sub-region was stopped, determine the average temperature or the lowest temperature inside the temperature-controlled sub-region to obtain the low-temperature characteristic temperature.

[0111] In this embodiment, heating is stopped for a second preset time, or until the temperature no longer decreases, ensuring that each temperature-controlled area of ​​the spacecraft reaches its corresponding minimum temperature. The average temperature or minimum temperature within the temperature-controlled area is determined as the low-temperature characteristic temperature corresponding to that area.

[0112] The method provided in this application can determine the high-temperature characteristic temperature of a temperature-controlled sub-region based on the average value of the temperature-controlled region during the high-temperature stage in a thermal equilibrium test; and determine the low-temperature characteristic temperature of the temperature-controlled sub-region based on the average or minimum value of the temperature-controlled region during the low-temperature stage in an initial temperature-controlled region. Considering the temperature differences at different locations within the temperature-controlled region, determining the characteristic temperature through the average temperature eliminates temperature differences within the temperature-controlled region to a certain extent, making the first and second target temperatures determined based on the characteristic temperatures more reasonable, thereby improving the temperature control accuracy of the thermal vacuum test based on the first and second target temperatures.

[0113] It should be noted that although the operations of the method of the present invention are described in a specific order in the accompanying drawings, this does not require or imply that these operations must be performed in that specific order, or that all of the operations shown must be performed to achieve the desired result. On the contrary, the steps depicted in the flowchart may be performed in a different order. Additionally or alternatively, certain steps may be omitted, multiple steps may be combined into one step, and / or one step may be broken down into multiple steps.

[0114] Further reference Figure 8 The diagram illustrates an exemplary structural block diagram of a self-temperature control device for spacecraft thermal vacuum experiments according to an embodiment of this application.

[0115] In one embodiment, a spacecraft thermal vacuum experiment self-temperature control device includes: a partitioning module 601, a target temperature determination module 602, and a performance determination module 603, wherein:

[0116] The partitioning module 601 is used to partition the initial temperature control region based on the maximum temperature difference of the initial temperature control region of the spacecraft, thereby obtaining multiple temperature control sub-regions;

[0117] The target temperature determination module 602 is used to determine the first target temperature and the second target temperature of each temperature control sub-region; the first target temperature is the target temperature of the spacecraft during the heating phase and the high temperature phase, and the second target temperature is the target temperature of the spacecraft during the cooling phase and the low temperature phase.

[0118] The performance determination module 603 is used to acquire the performance parameters of the spacecraft in a high-temperature environment based on a first target temperature and the performance parameters of the spacecraft in a low-temperature environment based on a second target temperature for each temperature control sub-region, and to determine the performance of the spacecraft based on the acquired performance parameters.

[0119] In one embodiment, the partitioning module 601 is specifically used to partition the initial temperature control region to obtain multiple temperature control sub-regions if the maximum temperature difference of the initial temperature control region of the spacecraft is greater than a preset threshold.

[0120] In one embodiment, the target temperature determination module 602 is specifically used to determine the high-temperature characteristic temperature and the low-temperature characteristic temperature of the temperature-controlled sub-region; the high-temperature characteristic temperature is the average temperature inside the temperature-controlled sub-region under high-temperature conditions, and the low-temperature characteristic temperature is the average temperature or minimum temperature inside the temperature-controlled sub-region under low-temperature conditions; a first target temperature is determined based on the high-temperature characteristic temperature; and a second target temperature is determined based on the low-temperature characteristic temperature.

[0121] In one embodiment, the target temperature determination module 602 is further configured to determine a lower limit of the first target temperature based on the high temperature characteristic temperature and the high temperature pull-off value; determine an upper limit of the first target temperature based on the spacecraft's maximum allowable temperature and the high temperature safety value; and determine a first target temperature based on the upper limit of the first target temperature and the lower limit of the first target temperature.

[0122] In one embodiment, the target temperature determination module 602 is further configured to determine a second target temperature upper limit value based on the cryogenic characteristic temperature and the cryogenic temperature bias value; determine a second target temperature lower limit value based on the spacecraft's minimum allowable temperature and the cryogenic temperature safety value; and determine a second target temperature based on the second target temperature upper limit value and the second target temperature lower limit value.

[0123] In one embodiment, the target temperature determination module 602 is further configured to determine the average temperature inside the temperature-controlled sub-region after heating the temperature-controlled sub-region for a first preset time, thereby obtaining a high-temperature characteristic temperature; and to determine the average temperature or minimum temperature inside the temperature-controlled sub-region after stopping heating the temperature-controlled sub-region for a second preset time, thereby obtaining a low-temperature characteristic temperature.

[0124] It should be understood that the units or modules recorded in the self-temperature control device of the spacecraft thermal vacuum experiment are related to the reference. Figure 3 The steps in the described method correspond accordingly. Therefore, the operations and features described above for the method are also applicable to the self-regulating temperature control device for spacecraft thermal vacuum experiments and the units contained therein, and will not be repeated here. The self-regulating temperature control device for spacecraft thermal vacuum experiments can be pre-implemented in the browser or other secure applications of electronic devices, or it can be loaded into the browser or other secure applications of electronic devices through downloading or other means. The corresponding units in the self-regulating temperature control device for spacecraft thermal vacuum experiments can cooperate with the units in the electronic device to implement the scheme of the embodiments of this application.

[0125] The following is for reference. Figure 9 It shows a schematic diagram of the structure of a computer system 700 suitable for implementing terminal devices or servers in the embodiments of this application.

[0126] like Figure 9 As shown, the computer system 700 includes a central processing unit (CPU) 701, which can perform various appropriate actions and processes based on programs stored in read-only memory (ROM) 702 or programs loaded from storage section 708 into random access memory (RAM) 703. The RAM 703 also stores various programs and data required for the operation of the system 700. The CPU 701, ROM 702, and RAM 703 are interconnected via a bus 704. An input / output (I / O) interface 705 is also connected to the bus 704.

[0127] The following components are connected to the I / O interface 705: an input section 706 including a keyboard, mouse, etc.; an output section 707 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 708 including a hard disk, etc.; and a communication section 709 including a network interface card such as a LAN card, modem, etc. The communication section 709 performs communication processing via a network such as the Internet. A drive 710 is also connected to the I / O interface 705 as needed. A removable medium 711, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed on the drive 710 as needed so that computer programs read from it can be installed into the storage section 708 as needed.

[0128] In particular, according to embodiments of this disclosure, the above references Figure 3-7 The described process can be implemented as a computer software program. For example, embodiments of this disclosure include a computer program product comprising a computer program tangibly embodied on a machine-readable medium, the computer program containing instructions for performing... Figure 3-7The program code for the method. In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 709, and / or installed from the removable medium 711.

[0129] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0130] The units or modules described in the embodiments of this application can be implemented in software or hardware. The described units or modules can also be located in a processor. The names of these units or modules do not, in certain circumstances, constitute a limitation on the unit or module itself.

[0131] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0132] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps in the above method embodiments.

[0133] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0134] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0135] The above description is merely a preferred embodiment of this application and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of the invention involved in this application is not limited to technical solutions formed by specific combinations of the above-described technical features, but should also cover other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the inventive concept. For example, technical solutions formed by substituting the above features with (but not limited to) technical features with similar functions disclosed in this application.

Claims

1. A method for automatically controlling temperature in a spacecraft thermal vacuum experiment, characterized in that, The method comprises: obtaining temperatures of multiple temperature measuring points of an initial temperature control region of a spacecraft in a high-temperature stable stage of a thermal balance test, and calculating a maximum temperature difference between the multiple temperature measuring points; if the maximum temperature difference is greater than a preset threshold, dividing the initial temperature control region to obtain multiple temperature control sub-regions; determining a first target temperature and a second target temperature of each temperature control sub-region; the first target temperature is a target temperature of the spacecraft in a temperature rising stage and a high-temperature stage, and the second target temperature is a target temperature of the spacecraft in a temperature falling stage and a low-temperature stage; for each temperature control sub-region, obtaining a performance parameter of the spacecraft in a high-temperature environment based on the first target temperature and a performance parameter of the spacecraft in a low-temperature environment based on the second target temperature, and determining the performance of the spacecraft according to the obtained performance parameters.

2. The method of claim 1, wherein, The preset threshold is 5 DEG C.

3. The method of claim 1, wherein, After the initial temperature control region is divided, the method further comprises: obtaining temperatures of multiple temperature measuring points of the divided temperature control sub-region in the high-temperature stable stage of the thermal balance test, and calculating a maximum temperature difference; if the maximum temperature difference is greater than the preset threshold, the temperature control sub-region is continuously divided until the maximum temperature difference of all the divided temperature control sub-regions is not greater than the preset threshold.

4. The method of claim 1, wherein, The method further comprises: determining a high-temperature characteristic temperature and a low-temperature characteristic temperature of the temperature control sub-region; the high-temperature characteristic temperature is an average temperature inside the temperature control sub-region in a high-temperature environment, and the low-temperature characteristic temperature is an average temperature or a minimum temperature inside the temperature control sub-region in a low-temperature environment; determining the first target temperature according to the high-temperature characteristic temperature; and determining the second target temperature according to the low-temperature characteristic temperature.

5. The method of claim 4, wherein, The method further comprises: determining a first target temperature lower limit value according to the high-temperature characteristic temperature and a high-temperature temperature deviation value; determining a first target temperature upper limit value according to a maximum allowable temperature of the spacecraft and a high-temperature temperature safety value; and determining the first target temperature according to the first target temperature upper limit value and the first target temperature lower limit value.

6. The method of claim 4, wherein, The method further comprises: determining a second target temperature upper limit value according to the low-temperature characteristic temperature and a low-temperature temperature deviation value; determining a second target temperature lower limit value according to a minimum allowable temperature of the spacecraft and a low-temperature temperature safety value; and determining the second target temperature according to the second target temperature upper limit value and the second target temperature lower limit value.

7. The method of claim 4, wherein, The method further comprises: determining an average temperature inside the temperature control sub-region after the temperature control sub-region is heated for a first preset time to obtain the high-temperature characteristic temperature; and determining an average temperature or a minimum temperature inside the temperature control sub-region after the temperature control sub-region stops heating for a second preset time to obtain the low-temperature characteristic temperature.

8. A self-temperature-controlling device for a spacecraft thermal vacuum experiment, characterized in that, The device comprises: a temperature measuring instrument, configured to acquire temperatures of multiple temperature measuring points in an initial temperature control region of a spacecraft in a high-temperature stable stage of a thermal balance test; after the thermal balance test is completed, acquire temperatures of the multiple temperature measuring points in the high-temperature stable stage, and determine a maximum temperature difference between the multiple temperature measuring points; a division module, configured to, if the maximum temperature difference is greater than a preset threshold, divide the initial temperature control region to obtain multiple temperature control sub-regions; a target temperature determination module, configured to determine a first target temperature and a second target temperature of each temperature control sub-region; the first target temperature is a target temperature of the spacecraft in a temperature rising stage and a high-temperature stage, and the second target temperature is a target temperature of the spacecraft in a temperature falling stage and a low-temperature stage; and a performance determination module, configured to, for each temperature control sub-region, acquire a performance parameter of the spacecraft in a high-temperature environment based on the first target temperature and a performance parameter of the spacecraft in a low-temperature environment based on the second target temperature, and determine a performance of the spacecraft according to the acquired performance parameters. 9.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-8 when the computer program is executed by the processor. The computer program, when executed by the processor, implements the steps of the method of any one of claims 1 to 7.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program, when executed by the processor, implements the steps of the method of any one of claims 1 to 7.

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