Methods and apparatus for measuring the deflection angle and deflection accuracy of high-speed acousto-optic deflectors
By constructing current-time and deflection angle-time curves, and using a photodetector and a horizontal displacement stage to determine the deflection angle of the acousto-optic deflector, the problems of low deflection accuracy and complex devices at high speeds in existing technologies are solved, and high-precision, low-cost deflection angle measurement is achieved.
CN117147109BActive Publication Date: 2026-06-02HUAZHONG UNIV OF SCI & TECH
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HUAZHONG UNIV OF SCI & TECH
- Filing Date
- 2023-08-30
- Publication Date
- 2026-06-02
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Figure CN117147109B_ABST
Abstract
This invention discloses a method and apparatus for measuring the deflection angle and deflection accuracy of a high-speed acousto-optic deflector. The method includes: acquiring current change data of a photodetector and constructing a current-time curve; moving the photodetector and observing its current change to determine the scanning start and end points of the high-speed acousto-optic deflector; determining the deflection angles at the scanning start and end points respectively, constructing a deflection angle-time curve, and obtaining the deflection accuracy of the high-speed acousto-optic deflector; constructing a current-deflection angle relationship curve based on the current-time curve and the deflection angle-time curve; acquiring real-time current data of the photodetector and obtaining real-time deflection angle data by referring to the relationship curve. By detecting the high-frequency deflection of the high-speed acousto-optic deflector using a photodetector, interference from low-frequency noise is reduced, the deflection accuracy of the high-speed acousto-optic deflector is obtained, and real-time deflection angle data of the photodetector is acquired, simplifying the measurement device structure and measurement steps.
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Citation Information
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